五、發明說明（） L發明領域 係本發明係關於一種老化測試板及老化測試試驗裝置， 係用於譬如A規模積體電路（下文t稱之為LSI)、積體電路 (文中稱之為iC)等半導體裝置之老化測試試驗。 2·先前技藝 口有一種用於試驗如LSI*IC半導體裝置之檢篩系統， σ 有潛在失敗或缺失之半導體裝置剔除，該試驗係利 用調用於失敗機構之試驗，以獲得具有高水準品質和可盒 度之半導體裝置。 罪 訂 使用老化測試試驗裝置作老化測試試驗，例如已知可 用檢篩系統或此類型式之試驗。老化測試試驗之目的是要 將如在具有易受熱之單元結構（cell mechanism)之1C半導 體裝置可能發生缺失或缺點者剔除，係以具有高容量之高 電壓施加於集總式半導體裝置，此等半導體裝置在高溫下 分佈從潛在發生之失敗率期間至偶發之失敗率，以此評估 半導體裝置是否達到了所須之標準。 同時，於老化測試試驗時，將半導體裝置插入並安裝 於設在老化測試板上之複數個插座上，此老化測試板係作 為預先程序之測試電路。當老化測試板連接到老化測試試 驗裝置主體時’即開始進行老化測試試驗。 明參照第3和4圖之詳細顯示，老化測試板和老化測 試試驗裝置主體之間之連接一般係將卡片邊緣3連接到設 在老化測試試驗裝置主體4之卡片邊緣連接器5，俾便提 311061 止提 2 8 凝譜#智1財1局員工消費+作社印^,. A7 B7 五、發明說明（2 ) 供至老化測試板1之信號。 然而’在習知之老化測試板和老化測試試驗裝置有下 列之缺點。 也就疋說’卡片邊緣3之接腳數目不得不隨信號量之 增加而增加，結果增加了將卡片邊緣3插入或將卡片邊緣 3從老化測試試驗裝置主體4拔出之力。 也就是說，當將卡片邊緣3插入卡片邊緣連接器5中 時，卡片邊緣3之末端插入卡片邊緣連接器5之凹槽5a 中，以使卡片邊緣3進入導引狀態，然後卡片邊緣3完全 插入卡片邊緣連接器5中。此時，需要很大的力將卡片邊 緣3之末端插入凹槽5a中或將卡片邊緣3之末端從凹槽 5a中拔出。此力稱之為插入/拔出力。也就是說，若卡片 邊緣3之接腳數目增加了，則需要大的插入/拔出力。 再者’另一個問題是，若增加了卡片邊緣3之接腳數 目，則不能不將卡片邊緣3之形狀變形，而因此習知的老 化測試板不能用於克服此種老化測試板之老化測試試驗裝 置主體。 再者，仍有另外一個問題是，因為僅有一種信號供應 機構’則不能不將不同種類之信號（於速度、電壓、電流方 面等）能由同一機構供應。 發明概沭 有鑑於習知之老化測試板和老化測試試驗裝置之缺 點’本發明提供一種老化測試板和老化測試試驗裝置能夠 增加供應至老化測試板之信號量，並可保持其本身與習知 -----------裝--------訂--------- (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準（CNS)A4規格（210 x 297公釐） 2 311061 507082V. Description of the Invention (L) Field of the Invention The present invention relates to an aging test board and an aging test test device, which are used for, for example, A-scale integrated circuits (hereinafter referred to as LSI), integrated circuits (hereinafter referred to as LSI) iC) and other semiconductor devices. 2. The previous technology has a screening system for testing such as LSI * IC semiconductor devices. Σ removes semiconductor devices that have potential failures or missing. This test is based on tests that are called from failed institutions to obtain high-quality and Boxable semiconductor device. The use of burn-in test equipment for burn-in tests, such as screening systems or tests of this type is known. The purpose of the burn-in test is to eliminate possible defects or shortcomings in 1C semiconductor devices with a susceptible cell mechanism, and apply high voltage with high capacity to the lumped semiconductor devices. The semiconductor device is distributed at a high temperature from a period of potential failure rate to an occasional failure rate to evaluate whether the semiconductor device has reached the required standard. At the same time, during the burn-in test, the semiconductor device is inserted into and mounted on a plurality of sockets provided on the burn-in test board. The burn-in test board is used as a pre-programmed test circuit. When the burn-in test board is connected to the burn-in test device main body, the burn-in test is started. It is shown in detail with reference to FIGS. 3 and 4 that the connection between the burn-in test board and the burn-in test device body is generally to connect the card edge 3 to the card-edge connector 5 provided in the burn-in test device body 4. 311061 止 提 2 8 Ningpu # Zhi1Cai 1 Staff Consumption + Job Printing ^ ,. A7 B7 V. Description of the Invention (2) Signal for aging test board 1. However, the conventional burn-in test board and burn-in test device have the following disadvantages. That is to say, the number of pins of the card edge 3 has to increase as the signal amount increases. As a result, the force of inserting or removing the card edge 3 from the main body 4 of the aging test test device is increased. That is, when the card edge 3 is inserted into the card edge connector 5, the end of the card edge 3 is inserted into the groove 5a of the card edge connector 5, so that the card edge 3 enters the guiding state, and then the card edge 3 is completely Insert into card edge connector 5. At this time, a large force is required to insert the end of the card edge 3 into the groove 5a or to pull out the end of the card edge 3 from the groove 5a. This force is called the insertion / extraction force. That is, if the number of pins of the card edge 3 is increased, a large insertion / extraction force is required. Furthermore, another problem is that if the number of pins of the card edge 3 is increased, the shape of the card edge 3 cannot be deformed, and thus the conventional aging test board cannot be used to overcome the aging test of such an aging test board. Test device body. Furthermore, there is still another problem, because there is only one type of signal supply mechanism ', and different types of signals (in terms of speed, voltage, current, etc.) cannot be supplied by the same mechanism. SUMMARY OF THE INVENTION In view of the shortcomings of the conventional aging test board and the aging test test device, the present invention provides an aging test board and the aging test test device which can increase the amount of signals supplied to the aging test board and can maintain itself and the conventional- ---------- Loading -------- Order --------- (Please read the precautions on the back before filling this page) This paper size applies Chinese national standards ( CNS) A4 size (210 x 297 mm) 2 311061 507082
si 經濟部智慧財產局員工消費合作社印製 五、發明說明（ 之老化測試板之間相容，以及能夠使用調用於實現信號供 應機構之複數種信號之各別信號之信號供應機構。 欲達到上述目的，本發明之第一#態為提供一種老化 測試板’包括有基板和卡片邊緣，此卡片邊緣從基板延伸 並可連接到老化測試試驗装置主體’其中該老化測試板進 而包括設在基板上並可連接到老化測試試驗裝置主體之擴 展連接器。 ^ 因為一種新穎之擴展連接器固定於本發明第一樣態之 老化測試板之基板，則可增加供應至老化測試板之信號 量，而不必增加卡片邊緣之接腳數量。再者，老化測試試 驗裝置能夠連接至習知之老化測試板，因此可保持本發明 之老化測試板和習知之老化測試板之間相容。 本發明之第二樣態為提供一種老化測試板，其特徵為 在基板上於特定位置設有擴展連接器，此特定位置為在卡 片邊緣後，其中特定位置為卡片邊緣之末端插入老化測試 試驗裝置主體，以使得當老化測試板連接到老化測試試驗 裝置主體時，使卡片邊緣進入導引狀態，完成老化測試板 1相關於老化測試試驗裝置主體之定位，使擴展連接器插 入老化測試試驗裝置主體。 於本發明之第二樣態之老化測試板，老化測試板能夠 連接到試驗裝置主體，而插入/拔出力分佈入卡片邊緣和擴 展連接器。 也就是說，卡片邊緣和擴展連接器連接至連接器等物 於老化測試試驗裝置主體之側邊。於此時，當卡片邊緣連 衣紙張尺度適用中國國家標準（CNS)A4規格（210 χ 297公釐） 311061 (請先閱讀背面之注音？事項再填寫本頁) •裝 訂· ’線丨 — — ΗΙ^Ί — I〜.^4^更實質内#是^^予修正。si Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, Consumer Cooperatives 5. The description of the invention is compatible with the aging test board, and a signal supply mechanism that can use each of the various signals called to implement the signal supply mechanism. To achieve the above Aim, the first aspect of the present invention is to provide a burn-in test board including a substrate and a card edge. The card edge extends from the base plate and can be connected to the burn-in test device main body. The burn-in test board further includes a burn-in test board. It can be connected to the extension connector of the main body of the aging test test device. ^ Because a novel extension connector is fixed to the base plate of the aging test board in the first state of the present invention, the amount of signal supplied to the aging test board can be increased, and It is not necessary to increase the number of pins on the edge of the card. Furthermore, the burn-in test device can be connected to the conventional burn-in test board, so the compatibility between the burn-in test board of the present invention and the burn-in test board of the present invention can be maintained. An aspect is to provide an aging test board, which is characterized in that an extension is provided on a substrate at a specific position. Connector, this specific position is behind the edge of the card, where the specific position is the end of the edge of the card inserted into the main body of the aging test test device, so that when the aging test board is connected to the main body of the aging test device, the edge of the card is brought into a guided state, The completion of the aging test board 1 is related to the positioning of the aging test test device main body, so that the extension connector is inserted into the aging test test device main body. In the second aspect of the aging test board of the present invention, the aging test board can be connected to the test device main body, and The insertion / extraction force is distributed into the card edge and the expansion connector. That is, the card edge and the expansion connector are connected to the connector and the like on the side of the main body of the aging test test device. At this time, when the card edge is coated with paper The scale is applicable to the Chinese National Standard (CNS) A4 specification (210 χ 297 mm) 311061 (Please read the phonetic on the back? Matters before filling out this page) • Binding · 'Line 丨 — — ΗΙ ^ Ί — I ~. ^ 4 ^ More substantially within # 是 ^^ 予 改。
五、發明說明（4 接至老化測試試驗裝置主體時，卡片邊緣之末端抵觸並插 入老化測試試驗裝置主體之連接器，以使卡片邊緣成為導 引狀態而完成老化測試板之定位。其後，在卡片邊緣完全 接合入連接器之前，擴展連接器亦插入相對應之連接哭。 也就是說，當卡片邊緣之末端首先插入連接器時，需 要最大之插入力，而使得當插入/拔出力分佈時，能施行老 化測試板之連接。 本發明之第三樣態為提供一種老化測試板，其特徵為 更進一步設有外殼，此外殼固定於對著正面之背面之基板 上’並有擴展連接固定於此正面，其中電子裝置係建構 在此外殼中。 於本發明之第二樣癌之老化測試板，基板係固定於外 殼’而擴展連接器係正設於此外殼上。也就是說，因為老 化測試板係由外殼用基板方式固定，因此老化測試板能插 入老化測試試驗裝置主體並從該老化測試試驗裝置主體拔 出，且當插入或拔出老化測試試驗裝置主體時，並不需要 施加外力使基板變型。 本發明之第四樣悲為提供一種老化測試板，其特徵為 老化測歲試驗裝置主體具有第一連接器，用來與卡片邊緣 接合，和第二連接器，用來與擴展連接器接合。 於本發明之第四樣態之老化測試板，習知之老化測試 板僅連接至第一連接器，而具有擴展連接器之老化測試板 係連接至第一和第二連接器。 圖式之簡單說明 Μ氏張尺度適用中國國家標準（CNS)A4規格（210 X 297公餐） I·1--------tr--------- (請先閱讀背面之注意事項再填寫本頁) 读局員4^費^^社_^提之 •必本#無變更實質内容是否准予修正。 311061 507082V. Description of the invention (4 When connected to the main body of the aging test test device, the end of the edge of the card abuts and inserts the connector of the main body of the aging test test device, so that the edge of the card becomes a guiding state to complete the positioning of the aging test board. Thereafter, Before the card edge is fully engaged into the connector, the expansion connector is also inserted into the corresponding connection. That is, when the end of the card edge is first inserted into the connector, the maximum insertion force is required, so that when the insertion / extraction force is When distributed, the connection of the aging test board can be implemented. A third aspect of the present invention is to provide an aging test board, which is further characterized by being provided with a shell, which is fixed on the substrate facing the front side and has an extension. The connection is fixed on the front side, wherein the electronic device is built in the casing. In the aging test board of the second cancer of the present invention, the substrate is fixed on the casing 'and the expansion connector is on the casing. That is to say Because the aging test board is fixed by the shell and the substrate, the aging test board can be inserted into the main body of the aging test test device and removed from the main body. The main body of the aging test test device is pulled out, and when the main body of the aging test test device is inserted or pulled out, it is not necessary to apply external force to deform the substrate. A fourth aspect of the present invention is to provide an aging test board, which is characterized by aging test. The main body of the test device has a first connector for engaging with the card edge, and a second connector for engaging with the expansion connector. In the fourth aspect of the aging test board of the present invention, the conventional aging test board is only connected To the first connector, and the aging test board with the extension connector is connected to the first and second connectors. Brief description of the diagram The M-scale standard is applicable to the Chinese National Standard (CNS) A4 specification (210 X 297 meals) ) I · 1 -------- tr --------- (Please read the notes on the back before filling out this page) Reading the Bureau 4 ^ Fees ^^ 社 _ ^ 提 之 • 必 本#No change Whether the substance is allowed to be amended. 311061 507082
五、發明說明（5 ) 第1圖為顯示使用於本發明之信號擴展連接 之老化測試板結構之圖示； 第2圖，包括第2(A)圖和第2(]5)圖，為顯示老化 板與老化測試試驗裝置主體接合狀態之圖示； 第3圖為顯示習知之老化測試板之圖示；和 第4圖為顯不於第3圖之習知之老化測試板與習知之 老化測試試驗裝置主體接合狀態之圖示。 圖號說明 為固定 測試 1 老化測試板 2 基板 3 卡片邊緣 4 主體 5 卡片邊緣連接器 5a 凹槽 6 老化測試試驗裝置 7 外殼 8 擴展連接器（公型盒狀連接器） 8a 擴展連接器之主體 8b 端子 8c 接腳 9 母型連接器 9a 孔 (請先閱讀背面之注音？事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 較佳實施例之詳細說明 現依照第1和第2圖，詳細說明本發明之老化測試板 之較佳實施例。 如第1和第2圖所顯示，老化測試板1連接至老化測 試試驗裝置主體4。老化測試板1和老化測試試驗裝置主 體4組構成老化測試試驗裝置6。老化測試板1具有外殼7 和固定於外殼7之上表面之基板2。如記憶體、控制裝置 及類似之電子裝置係建構在外殼7中。 本紙張尺度適用中國國家標準（CNS)A4規格（210 x 297公釐） 5 311061 507082^ 義 Α7 Β7 五、發明說明（6 ) 卡片邊緣3從基板2延伸，俾便從外殼7突伸出。如 第2圖所示，用於與卡片邊緣3相接合之卡片邊緣連接器 (第一連接器）5係設於老化測試試驗裝置主體4上。此等卡 片邊緣3和卡片邊緣連接器5之形狀係與習知之老化測試 板和老化測試試驗裝置主體之形狀相同。 一個用來將信號供應至老化測試試驗裝置主體4之擴 展連接器（公型盒狀連接器）8係固定於基板2上於卡片邊 緣3後的特定位置。一個母型連接器（第二連接器）9設在老 化測試試驗裝置主體4上。擴展連接器8具有固定在基板 2上之主體8a，而端子8b導接於基板2。 當老化測試板1連接至老化測試試驗裝置主體4時， 卡片邊緣3之末端插入卡片邊緣連接器5之凹槽5a，使得 卡片邊緣3成為導引狀態，俾完成老化測試板丨之定位。 其後，調整卡片邊緣3和擴展連接器8之間的位置關係， 俾便擴展連接器8之接腳8c能夠插入母型連接器 9a中0 之孔 (請先閱讀背面之注t事項再填寫本頁} 以 下將說明老化測試板1和試驗裝置主體4之間之 濟正 部韦 智看 m 財植產I 局s 員』工。 費 煩接 請 委 員 明 連 卡片邊緣3之末端插入卡片邊緣連接器$之凹槽5a， 示而當卡片邊緣3插入卡片邊緣連接器5時，卡片邊緣3抵 年觸卡片邊緣連接器5 於此時，在卡片邊緣3首先強力衝 对擠凹槽5a之狀態時，需要很大的插入力。當卡片邊緣3 4 ^插入卡片邊緣連接器5時，卡片邊緣3已經插入卡片邊緣 ||連接器5中（即’在導引狀態）’而使得完成老化測試板1 衣纸張尺度適用中國國家標準（CNS)A4規格（210 x 297公釐 311061 507082 A7 B7 A7 補先泰 η 經濟部智慧財產局員工消費合作社印製 五、發明說明（7 ) 之定位，其中擴展連接器8之接腳8c能夠由母型連接器9 之孔9a導引並接合。卡片邊緣3和接腳8e被推入卡片邊 緣連接器5之凹槽5a和母型連接器9之孔9a中，直到老 化測試板1完全插入老化測試試驗裝置主體4中為止。 也就是說，當插入/拔出力分佈入卡片邊緣3和擴展連 接器8時，老化測試板i可很容易地插入或從老化測試試 驗裝置主體4拔出，俾便老化測試板丨可很容易地連接至 老化測試試驗裝置6。 因為外殼7設在對著擴展連接器8之基板2之背面， 則不會有由於插入/拔出力而施加在基板2之負載。 再者，因為卡片邊緣3和擴展連接器8，也就是說兩 個組件提供作為信號供應機構，則可依於信號的種類，而 選擇這兩個組件之其中一個，即卡片邊緣3或擴展連接器 8之其中之一。 再者，在將習知之老化測試板丨連接至老化測試試驗 裝置主體4之情況下，僅有卡片邊緣3和卡片邊緣連接器 5彼此接合以提供信號至老化測試板1。此時，並未使用到 母型連接器9。也就是說，於連接至本發明之老化測試板^ 之老化測試試驗裝置主體4，習知之老化測試板1能夠連 接至老化測試試驗裝置主體4 ,而使得本發明之老化測試 板1能夠與習知之老化測試板1相容。 毋用贅言’擴展連接器並不限於僅使用本較佳實施例 _所使用之盒狀連接器。 I 依照如上述提出之詳細說明，本發明之老化測試板和 (請先閱讀背面之注意事項再填寫本頁) 裝 丨線· 本纸張尺度適用中國國豕標準（CNS)A4規格（210 X 297公爱） 7 311061 507082 衝 %：'η Α7 Β7 五、發明說明（8 ) (請先閱讀背面之注意事項再填寫本頁) 老化測試裝置，可抑制插入/拔出力之增加，且本發明之老 化測試板與習知之老化測試板之間保持相容時，可增加提 供至老化測試板之信號量，並且亦能選擇調適用於各種信 號（於速度、電流、容量等）之信號供應機構。 ::;濟 --Ϊ部 智 ;:;慧 -財 "Ά •員痒 .工— 消： 5如 ;合〇3 作 :社 3110615. Description of the invention (5) Figure 1 is a diagram showing the structure of an aging test board used for the signal extension connection of the present invention; Figure 2, including Figures 2 (A) and 2 () 5), is A diagram showing the joining state of the aging board and the main body of the aging test test device; FIG. 3 is a diagram showing a conventional aging test board; and FIG. 4 is a conventional aging test board and a conventional aging which are not shown in FIG. 3 Illustration of the joint state of the test device. The drawing number indicates the fixing test 1 burn-in test board 2 base board 3 card edge 4 main body 5 card edge connector 5a groove 6 burn-in test device 7 housing 8 expansion connector (male box connector) 8a main body of the expansion connector 8b Terminal 8c Pin 9 Female connector 9a Hole (Please read the phonetic on the back? Matters before filling out this page) The detailed description of the preferred embodiment printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs is now in accordance with the first and second The figure illustrates the preferred embodiment of the aging test board of the present invention in detail. As shown in Figs. 1 and 2, the burn-in test board 1 is connected to the burn-in test device body 4. The aging test board 1 and the aging test test device main body 4 constitute an aging test test device 6. The burn-in test board 1 has a case 7 and a base plate 2 fixed to the upper surface of the case 7. Electronic devices such as a memory, a control device and the like are built in the housing 7. This paper size is in accordance with China National Standard (CNS) A4 (210 x 297 mm) 5 311061 507082 ^ Meaning Α7 Β7 V. Description of the invention (6) The card edge 3 extends from the base plate 2 and then protrudes from the housing 7. As shown in FIG. 2, a card edge connector (first connector) 5 for engaging the card edge 3 is provided on the main body 4 of the burn-in test device. The shapes of the card edge 3 and the card edge connector 5 are the same as those of the conventional burn-in test board and burn-in test device body. An extended connector (male box connector) 8 for supplying a signal to the main body 4 of the burn-in test device is fixed on the base plate 2 at a specific position behind the card edge 3. A female connector (second connector) 9 is provided on the aging test test apparatus main body 4. The extension connector 8 has a main body 8a fixed to the substrate 2, and a terminal 8b is connected to the substrate 2. When the burn-in test board 1 is connected to the burn-in test device main body 4, the end of the card edge 3 is inserted into the groove 5a of the card edge connector 5, so that the card edge 3 becomes a guide state, and the positioning of the burn-in test board is completed. Then, adjust the positional relationship between the card edge 3 and the expansion connector 8 so that the pin 8c of the expansion connector 8 can be inserted into the 0 hole in the female connector 9a (please read the note t on the back before filling This page} The following is a description of the member of the Ministry of Economic Affairs, Wei Zhikan, between the burn-in test board 1 and the main body of the test device 4. The member of the Bureau of Industry and Commerce I will be troublesome. Please ask the member to insert the end of the card edge 3 into the card edge The groove 5a of the connector $ shows that when the card edge 3 is inserted into the card edge connector 5, the card edge 3 touches the card edge connector 5 at this time. At this time, the card edge 3 first strongly punches against the squeeze groove 5a. In the state, a large insertion force is required. When the card edge 3 4 ^ is inserted into the card edge connector 5, the card edge 3 has been inserted into the card edge || connector 5 (that is, 'in the guiding state)' and the aging is completed. Test board 1 The size of the paper is applicable to the Chinese National Standard (CNS) A4 (210 x 297 mm 311061 507082 A7 B7 A7) Buxiantai η Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs and Consumer Cooperatives. Where extension connector 8 Pin 8c can be guided and engaged by hole 9a of female connector 9. Card edge 3 and pin 8e are pushed into groove 5a of card edge connector 5 and hole 9a of female connector 9 until ageing The test board 1 is fully inserted into the burn-in test device body 4. That is, when the insertion / extraction force is distributed into the card edge 3 and the expansion connector 8, the burn-in test board i can be easily inserted into or removed from the burn-in test. The device main body 4 is pulled out, and the burn-in test board can be easily connected to the burn-in test device 6. Because the housing 7 is provided on the back of the substrate 2 opposite to the expansion connector 8, there will be no The force is applied to the load on the substrate 2. Furthermore, because the card edge 3 and the expansion connector 8, that is, the two components are provided as a signal supply mechanism, one of these two components can be selected according to the type of signal One is one of the card edge 3 or the extension connector 8. Furthermore, in the case where the conventional burn-in test board is connected to the burn-in test device main body 4, only the card edge 3 and the card edge connector 5 are provided. each other Bonded to provide a signal to the burn-in test board 1. At this time, the female connector 9 is not used. That is, the burn-in test device main body 4 connected to the burn-in test board of the present invention, the conventional burn-in test board 1 can be connected to the burn-in test device main body 4, so that the burn-in test board 1 of the present invention is compatible with the conventional burn-in test board 1. It goes without saying that the extension connector is not limited to using only the preferred embodiment. The box-shaped connector used. I According to the detailed description as mentioned above, the aging test board of the present invention and (please read the precautions on the back before filling this page). CNS) A4 specification (210 X 297 public love) 7 311061 507082 Charge%: 'η Α7 Β7 V. Description of the invention (8) (Please read the precautions on the back before filling this page) Aging test device, which can inhibit insertion / removal When the output is increased and the compatibility between the aging test board of the present invention and the conventional aging test board is maintained, the amount of signals provided to the aging test board can be increased, and it can also be adjusted for various signals (on Speed, current, capacity, etc.). ::; 济 --Ϊ 部 智;:; Hui -Cai " Ά • Staff itching .Work-consumption: 5 such as;