CN209418157U - It is a kind of for testing the test board and test equipment of storage card - Google Patents
It is a kind of for testing the test board and test equipment of storage card Download PDFInfo
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- CN209418157U CN209418157U CN201822208602.2U CN201822208602U CN209418157U CN 209418157 U CN209418157 U CN 209418157U CN 201822208602 U CN201822208602 U CN 201822208602U CN 209418157 U CN209418157 U CN 209418157U
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- Prior art keywords
- test
- circuit
- board
- storage card
- measured
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Abstract
The application provides a kind of test board, for testing storage card.The test board includes circuit board and multiple test circuits, and plurality of test circuit is set on circuit board and is mutually independent, and each test circuit is coupled with a storage card to be measured, to provide test signal to storage card to be measured.Present invention also provides a kind of test equipments.In the application, by the way that multiple test circuits are arranged on circuit board, storage card testing efficiency is improved.
Description
Technical field
The disclosed embodiment of the application is related to technical field of memory, and more specifically, is related to one kind and deposits for testing
The test board and test equipment of card storage.
Background technique
Storage card is the independent storage medium on smart machine, for example, smart phone, digital camera, portable electric
Brain etc., the generally form of card.Storage card is put on being inserted into smart machine before use, needing to be compatible with storage card
Property test, for example, information identification, reading, hot plug etc..
Current test method is manual testing, also, once can only single storage card, testing efficiency is low.
Apply for content
According to an embodiment of the present application, the application proposes a kind of for testing the test board and test equipment of storage card, with
Improve the testing efficiency of storage card.
According to a first aspect of the present application, a kind of test board is provided, for testing storage card.The test board includes: circuit
Plate；And multiple test circuits, be set on circuit board and be mutually independent, each test circuit with a storage to be measured
Card coupling, to provide test signal to storage card to be measured.
Wherein, each test circuit includes the controller for generating test signal.
Wherein, the controller in multiple test circuits is alternately disposed at the opposite sides of circuit board.
Wherein, each test circuit further includes the first transforming circuit, input terminal and power interface coupling, output end and control
Device coupling, is converted to first voltage for external voltage and is supplied to controller.
Wherein, each test circuit further includes the second transforming circuit, third transforming circuit and selection circuit, wherein second becomes
The input terminal of volt circuit and third transforming circuit and power interface coupling, output end pass through selection circuit and storage card coupling to be measured
It connects, external voltage is respectively converted into second voltage and tertiary voltage, and second voltage or tertiary voltage are passed through into selection
Circuit is supplied to storage card to be measured.
Wherein, first voltage 1.2V, second voltage 1.8V, tertiary voltage 3.3V.
Wherein, storage card to be measured uses eMMC agreement；Each test circuit further includes eMMC I/O pin, is set to circuit
One end of plate is coupled with storage card to be measured.
Wherein, each test circuit further includes illuminating circuit, is coupled with controller.
Wherein, the illuminating circuit in multiple test circuits is arranged side by side and is set to one end of circuit board, and and controller
It is relatively arranged on the both ends of circuit board.
According to a second aspect of the present application, a kind of test equipment is provided.The test equipment includes at least one test board, with
Multiple storage card connections to be measured, to test simultaneously multiple storage cards to be measured, wherein test board is in above-mentioned first aspect
Test board.
The beneficial effect of the application has: by the way that multiple test circuits are arranged on circuit board, once testing multiple storage cards, mentions
High testing efficiency.
Detailed description of the invention
Fig. 1 is the schematic diagram of the test board of the application first embodiment.
Fig. 2 is the circuit diagram of the test circuit on the test board of the embodiment of the present application.
Fig. 3 is the top view of the test board of the application second embodiment.
Fig. 4 is the front view of the test board of the application second embodiment.
Specific embodiment
Present specification and claims in the whole text used in certain terms refer to particular elements.Such as the technology of fields
Personnel are it is understood that electronic equipment set manufacturer can refer to the same component using different names.Herein not with title
It distinguishes component, but component is distinguished with function.In following description and claims, term " comprising " is open
Restriction word, therefore it should be interpreted to mean " including but not limited to ... ".In addition, term " coupling " is intended to mean Indirect Electro
Coupling or direct electric coupling.Therefore, when a device is coupled to another device, then it is this coupling can be direct electric coupling or
The indirect electric coupling realized by other devices and couplings.
As shown in Figure 1, being the schematic diagram of the test board of the application first embodiment.The test board 10 is for testing storage
Card, wherein storage card includes but is not limited to SD (Secure Digital Memory Card) card, TF (Trans-flash
Card) card, MMC (Multi-Media Card) card, EMMC (Embedded Multi Media Card) card, EMCP
(Embedded Multi-Chip Package) card, CF (Compact Flash) card.The test board 10 includes 11 He of circuit board
Multiple test circuits 12.Multiple test circuits 12 are set on circuit board 11 and are mutually independent, and each test circuit 12 is
It is coupled with a storage card to be measured, to provide test signal to storage card to be measured.
In the present embodiment, by the way that multiple test circuits 12 are arranged on circuit board 11, multiple storage cards is once tested, are improved
Testing efficiency.
It should be noted that in this application, not limiting the physical circuit part tested in circuit 12 and its in circuit board
Therefore position on 11 tests circuit 12 in Fig. 1 and is shown as dotted line frame, also, in Fig. 1 and not specifically illustrated test is electric
Position of the physical circuit part on circuit board 11 in road 12.
In one embodiment, 8 test circuits 12 are set on circuit board 11.
It is illustrated for being provided with 8 test circuits 12 on circuit board 11 below.
As shown in Fig. 2, being the circuit diagram of the test circuit on the test board of the embodiment of the present application, each test circuit
12 include the controller 121 for generating test signal.In one example, controller 121 can be using integrated chip come real
It is existing.For example, controller 121 can be DM8371 controller.
It simultaneously as shown in Figure 3 and Figure 4, is the top view and front view of the test board of the application second embodiment, multiple surveys
Controller 121 in examination circuit 12 is alternately disposed at the opposite sides of circuit board 11.It should be noted that circuit board 11 in Fig. 2
On show 8 test circuits 12, i.e., test board 10 includes 8 test circuits 12, but those skilled in the art can manage
Other quantity test circuit 12 can be set according to the size of circuit board 11 in solution, for example, 4,4 test circuits are handed at this time
For the opposite sides for being set to circuit board 11, the size of such circuit board 11 becomes smaller.
As shown in Fig. 2, test circuit 12 further includes the first transforming circuit 122.The input terminal and electricity of first transforming circuit 122
The coupling of source interface 123, output end and controller 121 couple, and external voltage V0 is converted to first voltage V1 and is supplied to control
Device 121 processed.Effect work of the controller 121 in first voltage V1.
As shown in Fig. 2, test circuit 12 further includes the second transforming circuit 124, third transforming circuit 125 and selection circuit
126, wherein the input terminal of the second transforming circuit 124 and third transforming circuit 125 is logical with the coupling of power interface 123, output end
It crosses selection circuit 126 and storage card to be measured couples.External voltage V0 is converted to second voltage V2 by the second transforming circuit 124,
External voltage V0 is converted to tertiary voltage V3 by third transforming circuit 125, and second voltage V2 or tertiary voltage V3 pass through
Selection circuit 126 is supplied to storage card to be measured.Storage card to be measured second voltage V2 or or tertiary voltage V3 under the action of work.
By above-mentioned mode, external voltage V0 is converted into second voltage V2 and the respectively by two transforming circuits
Three voltage V3 are selected by selection circuit 126, to be supplied to storage card to be measured, so that storage card to be measured works,
The storage card of different operating voltage can be tested in this way, increase the type of storage card to be measured.
In one example, first voltage V1 is 1.2V, and second voltage V2 is 1.8V, and tertiary voltage V3 is 3.3V.
In one embodiment, storage card to be measured uses eMMC agreement, i.e., storage card to be measured is the storage card of eMMC agreement.
It is illustrated by taking the storage card of eMMC agreement as an example below, for example, NM card (multimedia storage card).When storage to be measured
When card is the storage card of eMMC agreement, which includes interface contact, is used to establish the storage card to be measured and outside
The electrical connection of equipment, for example, test board 10.
As shown in Fig. 2, test circuit 12 further includes eMMC I/O pin 127.EMMC I/O pin 127 and 121 coupling of controller
It connects, and it executes eMMC agreement.EMMC I/O pin 127 is electrically connected with the interface contact of storage card to be measured, and then storage to be measured
Clamping Acceptance Tests signal is tested.In one example, the interface contact of the storage card of eMMC agreement includes 3.3V power supply contact
(VCC), grounding wafer (GND), clock contact (CLK), order contact (CMD) and 4 data contacts (D0-D3), in this example
In, 8 interface contacts are provided that
| Sub- contact number | Definition | Sub- contact number | Definition |
| 1 | D1 | 5 | D2 |
| 2 | CMD | 6 | VCC |
| 3 | GND | 7 | D0 |
| 4 | D3 | 8 | CLK |
Wherein, 3.3V power supply contact (VCC) is used to receive the tertiary voltage V3 of the output of third transforming circuit 125.Standard
EMMC agreement needs to provide VCC (3.3V) and VCCQ (3.3V or 1.8V) two-way power input and 8 data pins, this reality
The NM card of example offer is applied in order to reduce the area of storage card, 8 interface contacts are set, wherein only VCC pin, therefore only retain
3.3V power input, and only it is provided with 4 data-interface contacts.
In the present embodiment, while as shown in figure 4, the eMMC I/O pin 127 of multiple test circuits 12 is set to circuit board
11 one end.As described above, the eMMC I/O pin 127 and storage card to be measured of test circuit 12 couple, and in one example, test
The eMMC I/O pin 127 of circuit 12 can be coupled by connector and storage card to be measured, for example, being provided with the another of inserting groove
Circuit board.Test board 10 is plugged on another circuit board by inserting groove, and storage card to be measured is placed on another circuit board, into
And test eMMC I/O pin 127 and the storage card to be measured coupling of circuit 12.
As shown in Fig. 2, test circuit 12 further includes illuminating circuit 128.Illuminating circuit 128 and controller 121 couple.It shines
Circuit 128 is used to indicate the test case of storage card to be measured.For example, testing whether normally for storage card to be measured is indicated, when luminous
It when circuit 128 shines, indicates that storage card to be measured is being tested, when illuminating circuit 128 does not shine, indicates that storage card to be measured does not have
Have tested, that is, test failure occurs.In one embodiment, illuminating circuit 128 includes LED light.Simultaneously as shown in figure 4, multiple
Illuminating circuit 128 in test circuit 12 is arranged side by side and is set to one end of circuit board 11, and is oppositely arranged with controller 121
In the both ends of circuit board 11.
It should be noted that in this application, not limiting each circuit part in test circuit 12 on circuit board 11
Position, therefore in figs. 3 and 4 and position of each circuit part on circuit board 11 in not specifically illustrated test circuit 12
It sets.
The application also provides a kind of test equipment.The test equipment includes at least one test board, at least one test board
It is connect with multiple storage cards to be measured, to test simultaneously multiple storage cards to be measured.The test board is the survey of above-described embodiment
Test plate (panel) 10.
In the present embodiment, a test board can test multiple storage cards to be measured simultaneously can by least one test board
Increased with the quantity for the storage card to be measured tested simultaneously, improves a testing efficiency.
Those skilled in the art is apparent from, and can make while keeping the teachings of the application to device and method
Many modifications and variation.Therefore, above disclosure should be considered as only being limited by the range of appended claim.
Claims (11)
1. a kind of test board, for testing storage card characterized by comprising
Circuit board；And
Multiple test circuits, are set on the circuit board and are mutually independent, each test circuit with one to
Storage card coupling is surveyed, to provide test signal to the storage card to be measured.
2. test board as described in claim 1, which is characterized in that each test circuit includes described for generating
Test the controller of signal.
3. test board as described in claim 2, which is characterized in that the controller alternating in the multiple test circuit
It is set to the opposite sides of the circuit board.
4. test board as described in claim 2, which is characterized in that each test circuit further includes the first transformation electricity
Road, input terminal and power interface coupling, output end and the controller couple, and external voltage is converted to first voltage and is mentioned
Supply the controller.
5. test board as described in claim 2, which is characterized in that each test circuit further includes the second transformation electricity
Road, third transforming circuit and selection circuit, wherein the input terminal of second transforming circuit and the third transforming circuit and electricity
Source interface coupling, output end are coupled by the selection circuit and the storage card to be measured, and external voltage is converted respectively
For second voltage and tertiary voltage, and the second voltage or the tertiary voltage be supplied to by the selection circuit described
Storage card to be measured.
6. test board as described in claim 4, which is characterized in that the first voltage is 1.2V.
7. test board as described in claim 5, which is characterized in that the second voltage is 1.8V, and the tertiary voltage is
3.3V。
8. the test board as described in claim 6 or 7, which is characterized in that the storage card to be measured uses eMMC agreement；
Each test circuit further includes eMMC I/O pin, is set to one end of the circuit board, with the storage card to be measured
Coupling.
9. test board as described in claim 2, which is characterized in that each test circuit further includes illuminating circuit, with
The controller coupling.
10. test board as described in claim 9, which is characterized in that the illuminating circuit in the multiple test circuit is side by side
It is arranged and is set to one end of the circuit board, and is relatively arranged on the both ends of the circuit board with the controller.
11. a kind of test equipment, which is characterized in that including at least one test as described at least one of claim 1-10
Plate is connect with multiple storage cards to be measured, to test simultaneously the multiple storage card to be measured.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822208602.2U CN209418157U (en) | 2018-12-26 | 2018-12-26 | It is a kind of for testing the test board and test equipment of storage card |
| PCT/CN2019/096432 WO2020134036A1 (en) | 2018-12-26 | 2019-07-17 | Test board for testing memory card, and test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822208602.2U CN209418157U (en) | 2018-12-26 | 2018-12-26 | It is a kind of for testing the test board and test equipment of storage card |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209418157U true CN209418157U (en) | 2019-09-20 |
Family
ID=67940692
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201822208602.2U Active CN209418157U (en) | 2018-12-26 | 2018-12-26 | It is a kind of for testing the test board and test equipment of storage card |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN209418157U (en) |
| WO (1) | WO2020134036A1 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111007314A (en) * | 2019-11-18 | 2020-04-14 | 晶晨半导体（深圳）有限公司 | Method for measuring SOC signal stability through afterglow mode of oscilloscope |
| CN113791333A (en) * | 2021-09-16 | 2021-12-14 | 长江存储科技有限责任公司 | Chip testing device and chip testing system |
| CN115440295A (en) * | 2022-11-09 | 2022-12-06 | 合肥康芯威存储技术有限公司 | Testing device and testing method for data loading capacity of eMMC chip |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7743292B2 (en) * | 2008-06-13 | 2010-06-22 | Silicon Motion Inc. | Apparatus and method for memory card testing |
| CN103366830A (en) * | 2012-03-30 | 2013-10-23 | 点序科技股份有限公司 | Testing device of memory card |
| CN205943469U (en) * | 2016-08-08 | 2017-02-08 | 东信和平科技股份有限公司 | TF card testing arrangement |
| CN108074624B (en) * | 2017-08-29 | 2020-11-06 | 珠海全志科技股份有限公司 | Memory card testing apparatus and method, computer device, and storage medium |
| CN208271565U (en) * | 2018-06-12 | 2018-12-21 | 深圳市德名利电子有限公司 | A kind of TF card memory pool testing jig |
-
2018
- 2018-12-26 CN CN201822208602.2U patent/CN209418157U/en active Active
-
2019
- 2019-07-17 WO PCT/CN2019/096432 patent/WO2020134036A1/en active Application Filing
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111007314A (en) * | 2019-11-18 | 2020-04-14 | 晶晨半导体（深圳）有限公司 | Method for measuring SOC signal stability through afterglow mode of oscilloscope |
| CN113791333A (en) * | 2021-09-16 | 2021-12-14 | 长江存储科技有限责任公司 | Chip testing device and chip testing system |
| CN115440295A (en) * | 2022-11-09 | 2022-12-06 | 合肥康芯威存储技术有限公司 | Testing device and testing method for data loading capacity of eMMC chip |
| CN115440295B (en) * | 2022-11-09 | 2023-02-03 | 合肥康芯威存储技术有限公司 | Device and method for testing data loading capacity of eMMC chip |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2020134036A1 (en) | 2020-07-02 |
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