CN208271565U - A kind of TF card memory pool testing jig - Google Patents
A kind of TF card memory pool testing jig Download PDFInfo
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- CN208271565U CN208271565U CN201820909334.4U CN201820909334U CN208271565U CN 208271565 U CN208271565 U CN 208271565U CN 201820909334 U CN201820909334 U CN 201820909334U CN 208271565 U CN208271565 U CN 208271565U
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- detection plate
- pedestal
- memory pool
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Abstract
The utility model discloses a kind of TF card memory pool testing jig, the TF card memory pool testing jig includes the detection plate for the multiple TF cards of grafting, detection plate socket for the multiple detection plates of grafting, detection pedestal for connecting the detection plate socket and being detected to TF card, the detection pedestal is located at the lower section of detection plate socket, multiple card slots for grafting TF card are provided in the detection plate, multiple slots for grafting detection plate are provided on the detection plate socket, the bottom of each slot of the multiple slot is provided with the multiple groups stitch for being connected with detection pedestal, each stitch of the multiple groups stitch uses the probe of PA100-D2 model, multiple STM32F103VCT6 chips are additionally provided in the detection plate, multiple STM32F103 VCT6 chip is corresponding with the quantity of the card slot.TF card memory pool testing jig according to the present utility model can carry out detection to multiple TF cards simultaneously and data are written.
Description
Technical field
The utility model relates to a kind of TF card memory pool testing jigs.
Background technique
TF card (Trans-flash Card) is a kind of superfine small flash memory cards, and which are mainly applied to mobile electricity
Words, but because its volume is small and the continuous improvement of storage volume, be used in GPS device, portable music player and
In some flash memory disks.Need to carry out TF card detection and data write-in in the production and factory of TF card, at this stage
Detection and data write-in to TF card can not carry out detection to multiple TF cards simultaneously and data are written, and influences efficiency.
Utility model content
The purpose of the utility model is to provide a kind of TF card memory pool testing jigs, can be simultaneously to multiple TF cards
Carry out detection and data write-in.
The utility model is achieved through the following technical solutions: providing a kind of TF card memory pool testing jig, the TF card
Memory pool testing jig includes the detection plate for the multiple TF cards of grafting, for the detection plate socket of the multiple detection plates of grafting,
Detection pedestal for connecting the detection plate socket and being detected to TF card is provided in the detection plate multiple for inserting
Connect the card slot of TF card, be provided with multiple slots for grafting detection plate on the detection plate socket, the multiple slot it is every
The bottom of a slot is provided with the multiple groups stitch for being connected with detection pedestal, and each stitch of the multiple groups stitch uses
The probe of PA100-D2 model is additionally provided with multiple STM32F103VCT6 chips in the detection plate, and described is multiple
STM32F103VCT6 chip is corresponding with the quantity of the card slot.
As a further improvement of the above technical scheme, the detection pedestal is located at the lower section of detection plate socket, the inspection
Survey the multiple groups interface being provided on pedestal for being connected with detection plate socket, the multiple groups interface and the multiple groups stitch
Match.
As a further improvement of the above technical scheme, the TF card memory pool testing jig further includes for controlling
The control piece of the lifting of detection pedestal is stated, the control piece includes the flexible handle connecting with detection pedestal.
As a further improvement of the above technical scheme, the TF card memory pool testing jig further includes testing jig shell
Body, the testing jig shell include top plate and lower case, and the receiving for detection pedestal to be arranged is provided in the lower case
Slot, the detection plate socket are fixed on top plate, and the needle for connecting the detection pedestal is provided on the detection plate socket
Foot, the stitch pass through the top plate and are arranged above detection pedestal, and the detection pedestal is located in holding tank, the movable handle
Hand is connected with detection pedestal and the side of lower case is arranged in.
As a further improvement of the above technical scheme, the slot upwardly extends setting along the direction perpendicular to top plate,
The detection plate is downwardly into along the direction perpendicular to top plate into slot.
As a further improvement of the above technical scheme, eight cards for grafting TF card are provided in the detection plate
Slot and eight STM32F103VCT6 chips, setting is described there are four the slot for being used for grafting detection plate on the detection plate socket
The bottom of each slot of four slots be provided with eight groups for the stitch that are connected of detection pedestal, on the detection pedestal
It is provided with the interface to match with the stitch.
The beneficial effects of the utility model include at least:, can in the TF card memory pool testing jig of the utility model
Detection is carried out to multiple TF cards simultaneously and data are written.
Detailed description of the invention
Fig. 1 is the stereoscopic schematic diagram according to the TF card memory pool testing jig of the utility model one embodiment；
Fig. 2 is the schematic diagram according to the detection plate of the utility model one embodiment；
Fig. 3 is the enlarged diagram of a-quadrant according to fig. 2；
Fig. 4 is the functional schematic according to the golden finger conductive contact blade of the detection plate of the utility model one embodiment；
Fig. 5 is the schematic diagram of the detection plate socket and detection pedestal according to the utility model one embodiment；
Fig. 6 is the elevational schematic view according to the detection plate socket of the utility model one embodiment；
Fig. 7 is the stereoscopic schematic diagram according to the detection pedestal of the utility model one embodiment；
Fig. 8 is the stereoscopic schematic diagram according to the lower case of the utility model one embodiment.
Specific embodiment
Below in conjunction with attached drawing in the embodiments of the present invention, the technical scheme in the embodiment of the utility model is carried out
Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole
Embodiment.The component of the utility model embodiment being usually described and illustrated herein in the accompanying drawings can be with a variety of different configurations
To arrange and design.Therefore, below the detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit
The range of claimed invention processed, but it is merely representative of the selected embodiment of the utility model.It is practical new based on this
The embodiment of type, those skilled in the art's every other embodiment obtained without making creative work,
It fall within the protection scope of the utility model.
As shown in Figure 1, the TF card memory pool testing jig 100 includes the detection plate 1 for the multiple TF cards of grafting, use
Detection in the detection plate socket 2 of the multiple detection plates 1 of grafting, for connecting the detection plate socket 2 and being detected to TF card
Pedestal 3, the detection pedestal 3 are located at the lower section of detection plate socket 2.
The TF card memory pool testing jig 100 is used to carry out TF card test and data are written, TF card
(Trans-flash Card) is a kind of superfine small flash memory cards, is formally renamed as Micro SD Card within 2004.
Refering to Fig. 8, the TF card memory pool testing jig 100 further includes testing jig shell 5, the testing jig shell 5
Including top plate 51 and lower case 52, the holding tank 521 for detection pedestal 3 to be arranged is provided in the lower case 52.It is described
On the fixed testing jig shell 5 of detection plate socket 2, passed through on the detection plate socket 2 for connecting the stitch of the detection pedestal 3
The top plate 51, the detection pedestal 3 are located in holding tank 521, and the flexible handle 4 is connected and is arranged with detection pedestal 3
In the side of lower case 52.
As shown in Fig. 2, being provided with multiple card slots 11 for grafting TF card in the detection plate 1.In the present embodiment, institute
State card slot 11 and be provided with eight, be evenly distributed on the two sides of detection plate 1, each detection plate 1 can simultaneously to eight TF cards into
Row detection, it is high-efficient.Also include and card slot 11 for being inserted on the golden finger 13 of detection plate socket 2 in the detection plate 1
Eight parts to match, it is possible thereby to detect eight TF cards while more accurate.
Refering to Fig. 3 and Fig. 4, specifically, the golden finger 13 includes 100 conductive contact blades, including conductive contact blade P1
To conductive contact blade P100.The two sides of detection plate 1 is respectively arranged with 50 conductive contact blades, and conductive contact blade P1 to conductive contact blade P50 is set
It sets in conductive contact blade P51 to the opposite side of conductive contact blade P100, wherein the reverse side of conductive contact blade P1 is conductive contact blade P100, conduction touching
The reverse side of piece P50 is conductive contact blade P51, and so on.Every 12 conductive contact blades are one group of detection unit a, such as conductive contact blade
This 12 conductive contact blades of P1 to P6 and P95 to P100 are one group of detection unit a, are provided with 8 groups of detections altogether in the detection plate 1
Unit a and four conductive contact blades for power supply, four conductive contact blades for power supply are respectively P25, P26, P75, P76.It needs
It is noted that in Fig. 41 to 100 it is corresponding be conductive contact blade P1 to conductive contact blade P100.
Multiple STM32F103VCT6 chips 12, multiple STM32F103VCT6 cores are provided in the detection plate 1
Piece 12 with it is multiple for the card slot 11 of grafting TF card it is corresponding.STM32F103VCT6 chip 12 is STMicw Electronics (ST) company
The STM32F family chip of product belongs to 32 ARM microcontrollers of low and middle-end, and kernel is Cortex-M3.It is described
STM32F103VCT6 chip 12 is used to control the input/output signal of TF card, transmission/reception volume production relevant command information,
Specific instructions information can according to demand burning into chip.
Refering to Fig. 5, multiple slots 21 for grafting detection plate 1 are provided on the detection plate socket 2.In the present embodiment
In, there are four the settings of slot 21, and the detection plate socket 2 includes socket bottom plate 22 and four slots 21, the slot 21
It is arranged in parallel on detection plate socket 2, socket bottom plate 22 is parallel with top plate 51.The slot 21 is along perpendicular to socket bottom plate 22
Direction (X-direction) upwardly extend setting, the detection plate 1 is downwardly into along the direction (X-direction) perpendicular to socket bottom plate 22
Into slot 21, plug lighter.
Refering to Fig. 6, the bottom of each slot 21 of the multiple slot 21 is provided with multiple groups and is used for and detection 3 phase of pedestal
The stitch 23 of connection.In the present embodiment, the bottom of each slot 21 is provided with eight groups and is used for and detects what pedestal 3 was connected
Stitch 23, eight groups of stitch 23 respectively correspond eight card slots 11 in detection plate 1.The stitch 23 uses Shenzhen's Huarong
The probe of the PA100-D2 model of Electronic Testing Co., Ltd production is sent out, the PA100-D2 model probe is that Huarong test is visited
Needle, diameter of needle body 1.36mm, syringe needle size are 1.5mm, probe overall length is 33.3mm.
Refering to Fig. 7, interface 31 of the multiple groups for being connected with detection plate socket 2 is provided on the detection pedestal 3, it is described
Multiple groups interface 31 match with the multiple groups stitch 23.The detection pedestal 3 is located at the holding tank 521 in lower case 52
In, the detection pedestal 3 can be controlled detection pedestal 3 by connected flexible handle 4 and rise or decline.Work as detection
When pedestal 3 rises, the interface 31 on the detection pedestal 3 can be engaged with the stitch 23 on detection plate socket 2, then pass through detection
Pedestal 3 carries out test to TF card and data are written.Upon completion of the assays, detection pedestal 3 is controlled by flexible handle 4 to decline,
The stitch 23 detected on interface 31 and detection plate socket 2 on pedestal 3 disconnects.It thus it can be prevented that the plug in energization or detection
Detection plate 1 causes TF card to be damaged.
Refering to fig. 1, the TF card memory pool testing jig 100 further includes the lifting for controlling the detection pedestal 3
Control piece, the control piece includes and the flexible handle 4 that connect of detection pedestal 3.The flexible handle 4 is by way of lever
The raising and lowering of the detection pedestal 3 is controlled, detecting pedestal 3 when being pressed downward flexible handle 4 will rise, and propose activity upwards
Pedestal 3 is detected when handle 4 to be declined, simple and practical in structure, can pass through the company of control detection plate socket 2 and detection pedestal 3
It connects and disconnects, prevent the plug detection plate 1 in energization or detection from TF card being caused to be damaged.
In the description of the present invention, it should be understood that term " first ", " second " etc. are used for description purposes only,
It is not understood to indicate or imply relative importance.For the ordinary skill in the art, it can be managed with concrete condition
Solve the concrete meaning of above-mentioned term in the present invention.In addition, in the description of the present invention, unless otherwise indicated, it is " more
It is a " it is meant that two or more.
While there has been shown and described that the embodiments of the present invention, it will be understood by those skilled in the art that:
These embodiments can be carried out with a variety of variations, modification, replacement in the case where not departing from the principles of the present invention and objective
And modification, the scope of the utility model are defined by the claims and their equivalents.
Claims (6)
1. a kind of TF card memory pool testing jig, which is characterized in that the TF card memory pool testing jig includes for inserting
The detection plate (1) of multiple TF cards is connect, the detection plate socket (2) of the multiple detection plates of grafting (1) is used for, for connecting the detection plate
Socket (2) and the detection pedestal (3) detected to TF card are provided on the detection plate (1) multiple for grafting TF card
Card slot (11) is provided with multiple slots (21) for grafting detection plate (1) on the detection plate socket (2), the multiple to insert
The bottom of each slot (21) of slot (21) is provided with the multiple groups stitch (23) for being connected with detection pedestal (3), described
Each stitch (23) of multiple groups stitch (23) uses the probe of PA100-D2 model, is additionally provided on the detection plate (1) multiple
STM32F103VCT6 chip (12), multiple STM32F103VCT6 chips (12) are opposite with the quantity of the card slot (11)
It answers.
2. TF card memory pool testing jig according to claim 1, which is characterized in that the detection pedestal (3) is located at
The lower section of detection plate socket (2), the multiple groups being provided on pedestal (3) for being connected with detection plate socket (2) that detect connect
Mouth (31), the multiple groups interface (31) match with the multiple groups stitch (23).
3. TF card memory pool testing jig according to claim 1, which is characterized in that the TF card memory pool is surveyed
Examination frame further includes the control piece for controlling the lifting of detection pedestal (3), and the control piece includes connecting with detection pedestal (3)
The flexible handle (4) connect.
4. TF card memory pool testing jig according to claim 3, which is characterized in that the TF card memory pool is surveyed
Trying frame further includes testing jig shell (5), and the testing jig shell (5) includes top plate (51) and lower case (52), the lower casing
The holding tank (521) for detection pedestal (3) to be arranged is provided on body (52), the detection plate socket (2) is fixed on top plate
(51) on, the stitch (23) for connecting detection pedestal (3), the stitch are provided on the detection plate socket (2)
(23) top plate (51) setting is passed through above detection pedestal (3), and the detection pedestal (3) is located in holding tank (521), institute
Flexible handle (4) is stated to be connected with detection pedestal (3) and the side of lower case (52) is arranged in.
5. TF card memory pool testing jig according to claim 4, which is characterized in that the slot (21) along perpendicular to
The direction of top plate (51) upwardly extends setting, and the detection plate (1) is downwardly into along the direction perpendicular to top plate (51) to slot
(21) in.
6. TF card memory pool testing jig according to claim 1, which is characterized in that be arranged on the detection plate (1)
There are eight card slots (11) and eight STM32F103VCT6 chips (12) for grafting TF card, is set on the detection plate socket (2)
It sets there are four the slot (21) for being used for grafting detection plate (1), the bottom of each slot (21) of four slots (21) is all provided with
Eight groups of stitch (23) for being connected with detection pedestal (3) are equipped with, are provided with and the stitch on the detection pedestal (3)
(23) interface (31) to match.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820909334.4U CN208271565U (en) | 2018-06-12 | 2018-06-12 | A kind of TF card memory pool testing jig |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820909334.4U CN208271565U (en) | 2018-06-12 | 2018-06-12 | A kind of TF card memory pool testing jig |
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| Publication Number | Publication Date |
|---|---|
| CN208271565U true CN208271565U (en) | 2018-12-21 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820909334.4U Active CN208271565U (en) | 2018-06-12 | 2018-06-12 | A kind of TF card memory pool testing jig |
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| Country | Link |
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| CN (1) | CN208271565U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020134036A1 (en) * | 2018-12-26 | 2020-07-02 | 深圳市江波龙电子股份有限公司 | Test board for testing memory card, and test device |
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2018
- 2018-06-12 CN CN201820909334.4U patent/CN208271565U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020134036A1 (en) * | 2018-12-26 | 2020-07-02 | 深圳市江波龙电子股份有限公司 | Test board for testing memory card, and test device |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: Room 701, 7th floor, Smart Valley Innovation Park, 1010 Bulong Road, Minzhi Street, Longhua District, Shenzhen City, Guangdong Province Patentee after: Shenzhen deminli Technology Co.,Ltd. Address before: Room 701, 7th floor, Wisdom Valley Innovation Park, Bloong Road, Minzhi Street, Longhua New District, Shenzhen City, Guangdong Province, 518000 Patentee before: SHENZHEN DEMINGLI ELECTRONICS Co.,Ltd. |
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| CP03 | Change of name, title or address | ||
| CP02 | Change in the address of a patent holder |
Address after: 2501, 2401, block a, building 1, Shenzhen new generation industrial park, 136 Zhongkang Road, Meidu community, Meilin street, Futian District, Shenzhen, Guangdong 518000 Patentee after: Shenzhen deminli Technology Co.,Ltd. Address before: 518000 room 701, 7 / F, wisdom Valley Innovation Park, 1010 Bulong Road, Minzhi street, Longhua District, Shenzhen City, Guangdong Province Patentee before: Shenzhen deminli Technology Co.,Ltd. |
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| CP02 | Change in the address of a patent holder |