SG83171A1 - Burn-in board and burn-in test equipment - Google Patents

Burn-in board and burn-in test equipment

Info

Publication number
SG83171A1
SG83171A1 SG9906621A SG1999006621A SG83171A1 SG 83171 A1 SG83171 A1 SG 83171A1 SG 9906621 A SG9906621 A SG 9906621A SG 1999006621 A SG1999006621 A SG 1999006621A SG 83171 A1 SG83171 A1 SG 83171A1
Authority
SG
Singapore
Prior art keywords
burn
board
test equipment
test
equipment
Prior art date
Application number
SG9906621A
Inventor
Hiromatsu Katsuaki
Original Assignee
Ando Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ando Electric filed Critical Ando Electric
Publication of SG83171A1 publication Critical patent/SG83171A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG9906621A 1998-12-28 1999-12-23 Burn-in board and burn-in test equipment SG83171A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP37429898A JP3446643B2 (en) 1998-12-28 1998-12-28 Burn-in board and burn-in test equipment

Publications (1)

Publication Number Publication Date
SG83171A1 true SG83171A1 (en) 2001-09-18

Family

ID=18503610

Family Applications (1)

Application Number Title Priority Date Filing Date
SG9906621A SG83171A1 (en) 1998-12-28 1999-12-23 Burn-in board and burn-in test equipment

Country Status (4)

Country Link
JP (1) JP3446643B2 (en)
DE (1) DE19962868A1 (en)
SG (1) SG83171A1 (en)
TW (1) TW507082B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100592367B1 (en) * 1999-08-13 2006-06-22 삼성전자주식회사 Combination structure of burn-in board and expansion board
US6815966B1 (en) 2002-06-27 2004-11-09 Aehr Test Systems System for burn-in testing of electronic devices
JP2012117881A (en) * 2010-11-30 2012-06-21 Nippon Eng Kk Burn-in board and burn-in system
KR101425637B1 (en) 2013-01-21 2014-08-01 주식회사디아이 Connector for connecting board
JP2024095260A (en) 2022-12-28 2024-07-10 山一電機株式会社 Connector device, connector and burn-in inspection method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5003156A (en) * 1989-03-14 1991-03-26 Time Temperature, Inc. Dual configuration connector port for burn-in systems
US5402078A (en) * 1992-10-13 1995-03-28 Micro Control Company Interconnection system for burn-in boards

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5003156A (en) * 1989-03-14 1991-03-26 Time Temperature, Inc. Dual configuration connector port for burn-in systems
US5402078A (en) * 1992-10-13 1995-03-28 Micro Control Company Interconnection system for burn-in boards

Also Published As

Publication number Publication date
DE19962868A1 (en) 2000-08-03
JP2000193712A (en) 2000-07-14
TW507082B (en) 2002-10-21
JP3446643B2 (en) 2003-09-16

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