IL123469A0 - Circuit board testing method and device - Google Patents

Circuit board testing method and device

Info

Publication number
IL123469A0
IL123469A0 IL12346998A IL12346998A IL123469A0 IL 123469 A0 IL123469 A0 IL 123469A0 IL 12346998 A IL12346998 A IL 12346998A IL 12346998 A IL12346998 A IL 12346998A IL 123469 A0 IL123469 A0 IL 123469A0
Authority
IL
Israel
Prior art keywords
circuit board
testing method
board testing
circuit
testing
Prior art date
Application number
IL12346998A
Original Assignee
Atg Test Systems Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atg Test Systems Gmbh filed Critical Atg Test Systems Gmbh
Publication of IL123469A0 publication Critical patent/IL123469A0/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
IL12346998A 1997-03-11 1998-02-26 Circuit board testing method and device IL123469A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19709939A DE19709939A1 (en) 1997-03-11 1997-03-11 Method and device for testing printed circuit boards

Publications (1)

Publication Number Publication Date
IL123469A0 true IL123469A0 (en) 1998-09-24

Family

ID=7822937

Family Applications (1)

Application Number Title Priority Date Filing Date
IL12346998A IL123469A0 (en) 1997-03-11 1998-02-26 Circuit board testing method and device

Country Status (3)

Country Link
EP (1) EP0864874A3 (en)
DE (1) DE19709939A1 (en)
IL (1) IL123469A0 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10025751A1 (en) 2000-05-24 2001-12-06 Atg Test Systems Gmbh Method for examining a circuit board on a predetermined area of the circuit board and device for carrying out the method
DE10043728C2 (en) * 2000-09-05 2003-12-04 Atg Test Systems Gmbh Method for testing printed circuit boards and use of a device for carrying out the method
DE10043726C2 (en) * 2000-09-05 2003-12-04 Atg Test Systems Gmbh Method for testing circuit boards with a parallel tester and apparatus for carrying out the method
DE102016111200A1 (en) 2016-06-20 2017-12-21 Noris Automation Gmbh Method and device for non-contact functional testing of electronic components in circuit arrangements with local fault localization

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2929846A1 (en) * 1979-07-23 1981-03-12 Siemens AG, 1000 Berlin und 8000 München OPTO-ELECTRONIC TESTING SYSTEM FOR AUTOMATIC CHECKING OF CHARACTERISTICS, THEIR INTERMEDIATE PRODUCTS AND PRINTING TOOLS
DE3267548D1 (en) * 1982-05-28 1986-01-02 Ibm Deutschland Process and device for an automatic optical inspection
IT1199601B (en) * 1984-07-30 1988-12-30 Circuit Line Srl EQUIPMENT FOR THE REPRESENTATION IN THE PRINT AND / OR VISUAL OF THE FAULTY POLYGONALS OF SINGLE OR MULTI-LAYER PRINTED CIRCUITS
JPS6261390A (en) * 1985-09-11 1987-03-18 興和株式会社 Method and apparatus for inspecting printed board
IL78943A (en) * 1986-05-27 1990-09-17 Ibm Israel Method and apparatus for automated optical inspection of printed circuits
JPS62285072A (en) * 1986-06-04 1987-12-10 Hitachi Ltd Wire pattern inspecting device for printed circuit board
DE3737869A1 (en) * 1987-11-09 1989-05-24 Wagner Hans Juergen Dipl Ing Method and device for the optical testing of objects
EP0687901B1 (en) * 1988-05-09 2003-08-13 Omron Corporation Apparatus for and method of displaying results of printed circuit board inspection
JPH02231510A (en) * 1989-03-02 1990-09-13 Omron Tateisi Electron Co Substrate inspection device
DE4019226A1 (en) * 1990-06-15 1991-12-19 Grundig Emv DEVICE FOR LIGHTING CIRCUITS IN CIRCUIT TESTING DEVICES
WO1992011541A1 (en) * 1990-12-21 1992-07-09 Huntron Instruments, Inc. Image acquisition system for use with a printed circuit board test apparatus
JP2600594B2 (en) * 1993-12-01 1997-04-16 日本電気株式会社 Inspection method and outline inspection device for semiconductor integrated circuit
US5543726A (en) * 1994-01-03 1996-08-06 International Business Machines Corporation Open frame gantry probing system
US5506793A (en) * 1994-01-14 1996-04-09 Gerber Systems Corporation Method and apparatus for distortion compensation in an automatic optical inspection system
DE4410603C1 (en) * 1994-03-26 1995-06-14 Jenoptik Technologie Gmbh Detecting faults during inspection of masks, LCDs, circuit boards and semiconductor wafers
DE9416526U1 (en) * 1994-05-20 1995-06-08 Luther & Maelzer Gmbh Device for testing electrical circuit boards using a test adapter with test pins
DE19503329C2 (en) * 1995-02-02 2000-05-18 Ita Ingb Testaufgaben Gmbh Test device for electronic printed circuit boards
JP3617547B2 (en) * 1995-02-14 2005-02-09 富士通株式会社 Method and processing apparatus for observing wiring pattern
JPH09203765A (en) * 1996-01-25 1997-08-05 Hioki Ee Corp Substrate inspecting device which includes visual inspection

Also Published As

Publication number Publication date
EP0864874A2 (en) 1998-09-16
DE19709939A1 (en) 1998-09-17
EP0864874A3 (en) 1999-06-02

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