TW200739092A - Measuring apparatus, testing apparatus, and electronic device - Google Patents
Measuring apparatus, testing apparatus, and electronic deviceInfo
- Publication number
- TW200739092A TW200739092A TW096106773A TW96106773A TW200739092A TW 200739092 A TW200739092 A TW 200739092A TW 096106773 A TW096106773 A TW 096106773A TW 96106773 A TW96106773 A TW 96106773A TW 200739092 A TW200739092 A TW 200739092A
- Authority
- TW
- Taiwan
- Prior art keywords
- comparision
- unit
- memory
- signals
- level
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/362,536 US7398169B2 (en) | 2006-02-27 | 2006-02-27 | Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device |
US11/550,811 US7421355B2 (en) | 2006-02-27 | 2006-10-19 | Measuring apparatus, measuring method, testing apparatus, testing method, and electronic device |
US11/623,101 US7856330B2 (en) | 2006-02-27 | 2007-01-15 | Measuring apparatus, testing apparatus, and electronic device |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200739092A true TW200739092A (en) | 2007-10-16 |
Family
ID=38459024
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096106773A TW200739092A (en) | 2006-02-27 | 2007-02-27 | Measuring apparatus, testing apparatus, and electronic device |
TW096106844A TW200746708A (en) | 2006-02-27 | 2007-02-27 | Measuring device, testing device, electronic element, measuring method, program and record medium |
TW096106843A TW200739093A (en) | 2006-02-27 | 2007-02-27 | Measuring device, testing device, electronic element, program and record medium |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096106844A TW200746708A (en) | 2006-02-27 | 2007-02-27 | Measuring device, testing device, electronic element, measuring method, program and record medium |
TW096106843A TW200739093A (en) | 2006-02-27 | 2007-02-27 | Measuring device, testing device, electronic element, program and record medium |
Country Status (4)
Country | Link |
---|---|
US (1) | US7856330B2 (zh) |
JP (3) | JP4948522B2 (zh) |
TW (3) | TW200739092A (zh) |
WO (3) | WO2007099918A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI391692B (zh) * | 2007-12-13 | 2013-04-01 | Advantest Corp | 測試裝置、測試方法、量測裝置以及量測方法 |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7856330B2 (en) * | 2006-02-27 | 2010-12-21 | Advantest Corporation | Measuring apparatus, testing apparatus, and electronic device |
US7286947B1 (en) * | 2006-04-13 | 2007-10-23 | International Business Machines Corporation | Method and apparatus for determining jitter and pulse width from clock signal comparisons |
US7945405B2 (en) * | 2008-05-08 | 2011-05-17 | Advantest Corporation | Jitter measurement apparatus, jitter measurement method, recording media, communication system and test apparatus |
US7797121B2 (en) * | 2007-06-07 | 2010-09-14 | Advantest Corporation | Test apparatus, and device for calibration |
JP5426821B2 (ja) * | 2007-09-05 | 2014-02-26 | オリンパス株式会社 | 内視鏡システム |
JPWO2009034967A1 (ja) * | 2007-09-11 | 2010-12-24 | 東京エレクトロン株式会社 | 情報処理装置、情報処理方法、及びプログラム |
JP5246172B2 (ja) | 2008-02-05 | 2013-07-24 | 株式会社村田製作所 | 測定誤差の補正方法及び電子部品特性測定装置 |
US7933728B2 (en) * | 2008-05-08 | 2011-04-26 | Advantest Corporation | Skew measurement apparatus, skew measurement method, recording media and test apparatus |
US8185336B2 (en) * | 2008-10-30 | 2012-05-22 | Advantest Corporation | Test apparatus, test method, program, and recording medium reducing the influence of variations |
KR101221080B1 (ko) * | 2008-11-19 | 2013-01-11 | 가부시키가이샤 어드밴티스트 | 시험 장치, 시험 방법, 및 프로그램 |
JP2010237214A (ja) * | 2009-03-30 | 2010-10-21 | Advantest Corp | ジッタ測定装置、ジッタ算出器、ジッタ測定方法、プログラム、記録媒体、通信システム、および試験装置 |
US8312327B2 (en) * | 2009-04-24 | 2012-11-13 | Advantest Corporation | Correcting apparatus, PDF measurement apparatus, jitter measurement apparatus, jitter separation apparatus, electric device, correcting method, program, and recording medium |
JP5243340B2 (ja) * | 2009-05-08 | 2013-07-24 | 株式会社アドバンテスト | 試験装置および試験方法 |
US20120001657A1 (en) * | 2010-06-30 | 2012-01-05 | Tektronix, Inc. | Apparatus and method for improved edge triggering in a test and measurement instrument |
CN104243222A (zh) * | 2013-06-06 | 2014-12-24 | 鸿富锦精密工业(深圳)有限公司 | 网络设备性能测试方法及测试装置和测试系统 |
US8923894B1 (en) * | 2013-08-01 | 2014-12-30 | Tektronix, Inc. | Device for automated signal capture and location based on real-time analysis of signal characteristics |
WO2016082899A1 (en) * | 2014-11-28 | 2016-06-02 | Advantest Corporation | Removal of sampling clock jitter induced in an output signal of an analog-to-digital converter |
CN109884518A (zh) * | 2017-12-06 | 2019-06-14 | 爱德万测试公司 | 测试装置及测试方法 |
US11047898B2 (en) * | 2019-02-12 | 2021-06-29 | Bae Systems Information And Electronic Systems Integration Inc. | Vector processing using amplitude or power detectors |
CN111487447B (zh) * | 2020-05-09 | 2022-06-28 | 深圳市鼎阳科技股份有限公司 | 一种用于实现快速测量的数字示波器 |
JP2022094048A (ja) * | 2020-12-14 | 2022-06-24 | 国立大学法人東海国立大学機構 | 信号較正装置、信号較正方法およびプログラム |
JP7364616B2 (ja) * | 2021-04-14 | 2023-10-18 | アンリツ株式会社 | ジッタ耐力測定装置及びジッタ耐力測定方法 |
CN113608109A (zh) * | 2021-08-10 | 2021-11-05 | 山东普赛通信科技股份有限公司 | 一种无线产品分时分频测试方法及系统 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5260670A (en) * | 1992-01-16 | 1993-11-09 | Tektronix, Inc. | Equivalent time sampler using an oscillator |
JP3413342B2 (ja) | 1997-04-15 | 2003-06-03 | 株式会社アドバンテスト | ジッタ測定方法及び半導体試験装置 |
TW559668B (en) | 1999-02-08 | 2003-11-01 | Advantest Corp | Apparatus for and method of measuring a jitter |
JP3609780B2 (ja) | 1999-11-19 | 2005-01-12 | 株式会社アドバンテスト | ジッタ測定装置及び方法、並びにこのジッタ測定装置を備えた半導体集積回路試験装置 |
JP4445114B2 (ja) | 2000-01-31 | 2010-04-07 | 株式会社アドバンテスト | ジッタ測定装置及びその方法 |
US6594595B2 (en) * | 2001-04-03 | 2003-07-15 | Advantest Corporation | Apparatus for and method of measuring cross-correlation coefficient between signals |
JP2003179142A (ja) | 2001-12-10 | 2003-06-27 | Nec Microsystems Ltd | ジッタ検査回路を搭載した半導体装置およびそのジッタ検査方法 |
JP2004093345A (ja) | 2002-08-30 | 2004-03-25 | Renesas Technology Corp | ジッタ測定回路 |
JP4152710B2 (ja) | 2002-10-01 | 2008-09-17 | 株式会社アドバンテスト | ジッタ測定装置、及び試験装置 |
EP1508813B1 (en) | 2003-08-20 | 2007-01-31 | Agilent Technologies, Inc. | Spectral jitter analysis allowing jitter modulation waveform analysis |
US7136773B2 (en) * | 2003-12-16 | 2006-11-14 | Advantest Corporation | Testing apparatus and testing method |
JP2005189093A (ja) | 2003-12-25 | 2005-07-14 | Advantest Corp | 試験装置 |
JP4266350B2 (ja) * | 2004-02-12 | 2009-05-20 | 株式会社ルネサステクノロジ | テスト回路 |
US7856330B2 (en) * | 2006-02-27 | 2010-12-21 | Advantest Corporation | Measuring apparatus, testing apparatus, and electronic device |
US7970565B2 (en) * | 2006-02-27 | 2011-06-28 | Advantest Corporation | Measuring device, test device, electronic device, program, and recording medium |
-
2007
- 2007-01-15 US US11/623,101 patent/US7856330B2/en not_active Expired - Fee Related
- 2007-02-26 WO PCT/JP2007/053548 patent/WO2007099918A1/ja active Application Filing
- 2007-02-26 JP JP2008502777A patent/JP4948522B2/ja not_active Expired - Fee Related
- 2007-02-27 WO PCT/JP2007/053681 patent/WO2007099970A1/ja active Application Filing
- 2007-02-27 TW TW096106773A patent/TW200739092A/zh unknown
- 2007-02-27 JP JP2008502804A patent/JP4948523B2/ja not_active Expired - Fee Related
- 2007-02-27 TW TW096106844A patent/TW200746708A/zh unknown
- 2007-02-27 WO PCT/JP2007/053682 patent/WO2007099971A1/ja active Application Filing
- 2007-02-27 TW TW096106843A patent/TW200739093A/zh unknown
- 2007-02-27 JP JP2008502805A patent/JP4948524B2/ja not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI391692B (zh) * | 2007-12-13 | 2013-04-01 | Advantest Corp | 測試裝置、測試方法、量測裝置以及量測方法 |
Also Published As
Publication number | Publication date |
---|---|
WO2007099918A1 (ja) | 2007-09-07 |
WO2007099970A1 (ja) | 2007-09-07 |
TW200746708A (en) | 2007-12-16 |
JP4948523B2 (ja) | 2012-06-06 |
JPWO2007099971A1 (ja) | 2009-07-23 |
JPWO2007099918A1 (ja) | 2009-07-16 |
TW200739093A (en) | 2007-10-16 |
JP4948524B2 (ja) | 2012-06-06 |
WO2007099971A1 (ja) | 2007-09-07 |
JP4948522B2 (ja) | 2012-06-06 |
JPWO2007099970A1 (ja) | 2009-07-23 |
US7856330B2 (en) | 2010-12-21 |
US20080040060A1 (en) | 2008-02-14 |
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