TW200746708A - Measuring device, testing device, electronic element, measuring method, program and record medium - Google Patents

Measuring device, testing device, electronic element, measuring method, program and record medium

Info

Publication number
TW200746708A
TW200746708A TW096106844A TW96106844A TW200746708A TW 200746708 A TW200746708 A TW 200746708A TW 096106844 A TW096106844 A TW 096106844A TW 96106844 A TW96106844 A TW 96106844A TW 200746708 A TW200746708 A TW 200746708A
Authority
TW
Taiwan
Prior art keywords
measuring
window function
data column
measured signal
program
Prior art date
Application number
TW096106844A
Other languages
English (en)
Inventor
Harry Hou
Takahiro Yamaguchi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/362,536 external-priority patent/US7398169B2/en
Priority claimed from US11/550,811 external-priority patent/US7421355B2/en
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200746708A publication Critical patent/TW200746708A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
TW096106844A 2006-02-27 2007-02-27 Measuring device, testing device, electronic element, measuring method, program and record medium TW200746708A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/362,536 US7398169B2 (en) 2006-02-27 2006-02-27 Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device
US11/550,811 US7421355B2 (en) 2006-02-27 2006-10-19 Measuring apparatus, measuring method, testing apparatus, testing method, and electronic device
US11/623,101 US7856330B2 (en) 2006-02-27 2007-01-15 Measuring apparatus, testing apparatus, and electronic device

Publications (1)

Publication Number Publication Date
TW200746708A true TW200746708A (en) 2007-12-16

Family

ID=38459024

Family Applications (3)

Application Number Title Priority Date Filing Date
TW096106843A TW200739093A (en) 2006-02-27 2007-02-27 Measuring device, testing device, electronic element, program and record medium
TW096106773A TW200739092A (en) 2006-02-27 2007-02-27 Measuring apparatus, testing apparatus, and electronic device
TW096106844A TW200746708A (en) 2006-02-27 2007-02-27 Measuring device, testing device, electronic element, measuring method, program and record medium

Family Applications Before (2)

Application Number Title Priority Date Filing Date
TW096106843A TW200739093A (en) 2006-02-27 2007-02-27 Measuring device, testing device, electronic element, program and record medium
TW096106773A TW200739092A (en) 2006-02-27 2007-02-27 Measuring apparatus, testing apparatus, and electronic device

Country Status (4)

Country Link
US (1) US7856330B2 (zh)
JP (3) JP4948522B2 (zh)
TW (3) TW200739093A (zh)
WO (3) WO2007099918A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI392887B (zh) * 2008-10-30 2013-04-11 Advantest Corp 測試裝置、測試方法以及記錄媒體

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US7856330B2 (en) * 2006-02-27 2010-12-21 Advantest Corporation Measuring apparatus, testing apparatus, and electronic device
US7286947B1 (en) * 2006-04-13 2007-10-23 International Business Machines Corporation Method and apparatus for determining jitter and pulse width from clock signal comparisons
US7945405B2 (en) * 2008-05-08 2011-05-17 Advantest Corporation Jitter measurement apparatus, jitter measurement method, recording media, communication system and test apparatus
US7797121B2 (en) * 2007-06-07 2010-09-14 Advantest Corporation Test apparatus, and device for calibration
JP5426821B2 (ja) * 2007-09-05 2014-02-26 オリンパス株式会社 内視鏡システム
WO2009034967A1 (ja) * 2007-09-11 2009-03-19 Tokyo Electron Limited 情報処理装置、情報処理方法、及びプログラム
US7808252B2 (en) * 2007-12-13 2010-10-05 Advantest Corporation Measurement apparatus and measurement method
KR101152046B1 (ko) 2008-02-05 2012-07-03 가부시키가이샤 무라타 세이사쿠쇼 측정오차의 보정방법 및 전자부품특성 측정장치
US7933728B2 (en) * 2008-05-08 2011-04-26 Advantest Corporation Skew measurement apparatus, skew measurement method, recording media and test apparatus
WO2010058441A1 (ja) * 2008-11-19 2010-05-27 株式会社アドバンテスト 試験装置、試験方法、および、プログラム
JP2010237214A (ja) * 2009-03-30 2010-10-21 Advantest Corp ジッタ測定装置、ジッタ算出器、ジッタ測定方法、プログラム、記録媒体、通信システム、および試験装置
US8312327B2 (en) * 2009-04-24 2012-11-13 Advantest Corporation Correcting apparatus, PDF measurement apparatus, jitter measurement apparatus, jitter separation apparatus, electric device, correcting method, program, and recording medium
JP5243340B2 (ja) * 2009-05-08 2013-07-24 株式会社アドバンテスト 試験装置および試験方法
US20120001657A1 (en) * 2010-06-30 2012-01-05 Tektronix, Inc. Apparatus and method for improved edge triggering in a test and measurement instrument
CN104243222A (zh) * 2013-06-06 2014-12-24 鸿富锦精密工业（深圳）有限公司 网络设备性能测试方法及测试装置和测试系统
US8923894B1 (en) * 2013-08-01 2014-12-30 Tektronix, Inc. Device for automated signal capture and location based on real-time analysis of signal characteristics
WO2016082899A1 (en) * 2014-11-28 2016-06-02 Advantest Corporation Removal of sampling clock jitter induced in an output signal of an analog-to-digital converter
CN109884518A (zh) * 2017-12-06 2019-06-14 爱德万测试公司 测试装置及测试方法
US11047898B2 (en) * 2019-02-12 2021-06-29 Bae Systems Information And Electronic Systems Integration Inc. Vector processing using amplitude or power detectors
CN111487447B (zh) * 2020-05-09 2022-06-28 深圳市鼎阳科技股份有限公司 一种用于实现快速测量的数字示波器
JP2022094048A (ja) * 2020-12-14 2022-06-24 国立大学法人東海国立大学機構 信号較正装置、信号較正方法およびプログラム
JP7364616B2 (ja) * 2021-04-14 2023-10-18 アンリツ株式会社 ジッタ耐力測定装置及びジッタ耐力測定方法
CN113608109B (zh) * 2021-08-10 2024-06-18 山东普赛通信科技股份有限公司 一种无线产品分时分频测试方法及系统

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US5260670A (en) * 1992-01-16 1993-11-09 Tektronix, Inc. Equivalent time sampler using an oscillator
JP3413342B2 (ja) 1997-04-15 2003-06-03 株式会社アドバンテスト ジッタ測定方法及び半導体試験装置
TW559668B (en) 1999-02-08 2003-11-01 Advantest Corp Apparatus for and method of measuring a jitter
JP3609780B2 (ja) 1999-11-19 2005-01-12 株式会社アドバンテスト ジッタ測定装置及び方法、並びにこのジッタ測定装置を備えた半導体集積回路試験装置
JP4445114B2 (ja) 2000-01-31 2010-04-07 株式会社アドバンテスト ジッタ測定装置及びその方法
US6594595B2 (en) * 2001-04-03 2003-07-15 Advantest Corporation Apparatus for and method of measuring cross-correlation coefficient between signals
JP2003179142A (ja) 2001-12-10 2003-06-27 Nec Microsystems Ltd ジッタ検査回路を搭載した半導体装置およびそのジッタ検査方法
JP2004093345A (ja) 2002-08-30 2004-03-25 Renesas Technology Corp ジッタ測定回路
JP4152710B2 (ja) 2002-10-01 2008-09-17 株式会社アドバンテスト ジッタ測定装置、及び試験装置
DE60311576T2 (de) 2003-08-20 2007-08-16 Verigy (Singapore) Pte. Ltd. Spektrale Jitter-Analyse mit Jitter-Modulation-Wellenform-Analyse
US7136773B2 (en) * 2003-12-16 2006-11-14 Advantest Corporation Testing apparatus and testing method
JP2005189093A (ja) 2003-12-25 2005-07-14 Advantest Corp 試験装置
JP4266350B2 (ja) * 2004-02-12 2009-05-20 株式会社ルネサステクノロジ テスト回路
US7856330B2 (en) * 2006-02-27 2010-12-21 Advantest Corporation Measuring apparatus, testing apparatus, and electronic device
US7970565B2 (en) * 2006-02-27 2011-06-28 Advantest Corporation Measuring device, test device, electronic device, program, and recording medium

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI392887B (zh) * 2008-10-30 2013-04-11 Advantest Corp 測試裝置、測試方法以及記錄媒體

Also Published As

Publication number Publication date
US20080040060A1 (en) 2008-02-14
WO2007099971A1 (ja) 2007-09-07
TW200739092A (en) 2007-10-16
JP4948522B2 (ja) 2012-06-06
JPWO2007099970A1 (ja) 2009-07-23
WO2007099970A1 (ja) 2007-09-07
TW200739093A (en) 2007-10-16
JP4948524B2 (ja) 2012-06-06
WO2007099918A1 (ja) 2007-09-07
JP4948523B2 (ja) 2012-06-06
US7856330B2 (en) 2010-12-21
JPWO2007099971A1 (ja) 2009-07-23
JPWO2007099918A1 (ja) 2009-07-16

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