TW200709896A - Polishing pad - Google Patents
Polishing padInfo
- Publication number
- TW200709896A TW200709896A TW095127529A TW95127529A TW200709896A TW 200709896 A TW200709896 A TW 200709896A TW 095127529 A TW095127529 A TW 095127529A TW 95127529 A TW95127529 A TW 95127529A TW 200709896 A TW200709896 A TW 200709896A
- Authority
- TW
- Taiwan
- Prior art keywords
- molecular weight
- polishing pad
- high molecular
- polyurethane resin
- resin foam
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title abstract 5
- 229920005862 polyol Polymers 0.000 abstract 3
- 150000003077 polyols Chemical class 0.000 abstract 3
- 239000006260 foam Substances 0.000 abstract 2
- 230000002209 hydrophobic effect Effects 0.000 abstract 2
- 229920005749 polyurethane resin Polymers 0.000 abstract 2
- 239000002994 raw material Substances 0.000 abstract 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
- B24D3/28—Resins or natural or synthetic macromolecular compounds
- B24D3/32—Resins or natural or synthetic macromolecular compounds for porous or cellular structure
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G18/00—Polymeric products of isocyanates or isothiocyanates
- C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
- C08G18/28—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the compounds used containing active hydrogen
- C08G18/30—Low-molecular-weight compounds
- C08G18/36—Hydroxylated esters of higher fatty acids
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G18/00—Polymeric products of isocyanates or isothiocyanates
- C08G18/06—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
- C08G18/28—Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the compounds used containing active hydrogen
- C08G18/65—Low-molecular-weight compounds having active hydrogen with high-molecular-weight compounds having active hydrogen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G2101/00—Manufacture of cellular products
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/249921—Web or sheet containing structurally defined element or component
- Y10T428/249953—Composite having voids in a component [e.g., porous, cellular, etc.]
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Polyurethanes Or Polyureas (AREA)
- Manufacture Of Macromolecular Shaped Articles (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005249046A JP4884725B2 (ja) | 2005-08-30 | 2005-08-30 | 研磨パッド |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200709896A true TW200709896A (en) | 2007-03-16 |
| TWI295609B TWI295609B (enExample) | 2008-04-11 |
Family
ID=37808668
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW095127529A TW200709896A (en) | 2005-08-30 | 2006-07-27 | Polishing pad |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8309466B2 (enExample) |
| JP (1) | JP4884725B2 (enExample) |
| KR (1) | KR100949561B1 (enExample) |
| CN (1) | CN101253022B (enExample) |
| TW (1) | TW200709896A (enExample) |
| WO (1) | WO2007026569A1 (enExample) |
Families Citing this family (21)
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| KR100909605B1 (ko) * | 2005-03-08 | 2009-07-27 | 도요 고무 고교 가부시키가이샤 | 연마 패드 및 그 제조 방법 |
| KR101134058B1 (ko) * | 2005-05-17 | 2012-04-16 | 도요 고무 고교 가부시키가이샤 | 연마 패드 |
| JP5031236B2 (ja) * | 2006-01-10 | 2012-09-19 | 東洋ゴム工業株式会社 | 研磨パッド |
| WO2008026451A1 (fr) | 2006-08-28 | 2008-03-06 | Toyo Tire & Rubber Co., Ltd. | Tampon de polissage |
| JP5008927B2 (ja) | 2006-08-31 | 2012-08-22 | 東洋ゴム工業株式会社 | 研磨パッド |
| JP5078000B2 (ja) | 2007-03-28 | 2012-11-21 | 東洋ゴム工業株式会社 | 研磨パッド |
| JP5590779B2 (ja) * | 2008-06-20 | 2014-09-17 | ダンロップスポーツ株式会社 | ゴルフボール |
| JP5393434B2 (ja) * | 2008-12-26 | 2014-01-22 | 東洋ゴム工業株式会社 | 研磨パッド及びその製造方法 |
| JP5634903B2 (ja) | 2010-02-25 | 2014-12-03 | 東洋ゴム工業株式会社 | 研磨パッド |
| MY164897A (en) * | 2010-10-26 | 2018-01-30 | Rohm & Haas Elect Materials Cmp Holdings Inc | Polishing pad and method for producing same |
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| JP6155018B2 (ja) * | 2011-12-16 | 2017-06-28 | ローム アンド ハース エレクトロニック マテリアルズ シーエムピー ホウルディングス インコーポレイテッド | 研磨パッド |
| JP2014111296A (ja) * | 2012-11-05 | 2014-06-19 | Toyo Tire & Rubber Co Ltd | 研磨パッド及びその製造方法 |
| JP6155019B2 (ja) * | 2012-12-10 | 2017-06-28 | ローム アンド ハース エレクトロニック マテリアルズ シーエムピー ホウルディングス インコーポレイテッド | 研磨パッド |
| JP5661129B2 (ja) | 2013-01-29 | 2015-01-28 | 東洋ゴム工業株式会社 | 研磨パッド |
| CN103862364A (zh) * | 2014-03-24 | 2014-06-18 | 上海华力微电子有限公司 | 研磨垫、研磨机台及研磨方法 |
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| KR102202076B1 (ko) * | 2018-12-26 | 2021-01-12 | 에스케이씨 주식회사 | 연마패드용 조성물, 연마패드 및 이의 제조방법 |
| CN113896856B (zh) * | 2020-06-19 | 2023-05-12 | 中国科学院微电子研究所 | 一种抛光垫材料及抛光垫 |
| CN116766049A (zh) * | 2023-07-31 | 2023-09-19 | 长鑫科技集团股份有限公司 | 一种研磨垫的制作方法 |
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| WO2008026451A1 (fr) | 2006-08-28 | 2008-03-06 | Toyo Tire & Rubber Co., Ltd. | Tampon de polissage |
| JP5008927B2 (ja) | 2006-08-31 | 2012-08-22 | 東洋ゴム工業株式会社 | 研磨パッド |
| JP5078000B2 (ja) | 2007-03-28 | 2012-11-21 | 東洋ゴム工業株式会社 | 研磨パッド |
-
2005
- 2005-08-30 JP JP2005249046A patent/JP4884725B2/ja not_active Expired - Fee Related
-
2006
- 2006-07-27 TW TW095127529A patent/TW200709896A/zh not_active IP Right Cessation
- 2006-08-22 WO PCT/JP2006/316372 patent/WO2007026569A1/ja not_active Ceased
- 2006-08-22 US US12/065,219 patent/US8309466B2/en active Active
- 2006-08-22 CN CN2006800321010A patent/CN101253022B/zh not_active Expired - Fee Related
- 2006-08-22 KR KR1020087004863A patent/KR100949561B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR100949561B1 (ko) | 2010-03-25 |
| CN101253022B (zh) | 2010-05-26 |
| US20090104850A1 (en) | 2009-04-23 |
| JP4884725B2 (ja) | 2012-02-29 |
| US8309466B2 (en) | 2012-11-13 |
| WO2007026569A1 (ja) | 2007-03-08 |
| KR20080031486A (ko) | 2008-04-08 |
| CN101253022A (zh) | 2008-08-27 |
| JP2007061928A (ja) | 2007-03-15 |
| TWI295609B (enExample) | 2008-04-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |