TW200305188A - Reduced footprint tool for automated processing of microelectronic substrates - Google Patents
Reduced footprint tool for automated processing of microelectronic substrates Download PDFInfo
- Publication number
- TW200305188A TW200305188A TW091133135A TW91133135A TW200305188A TW 200305188 A TW200305188 A TW 200305188A TW 091133135 A TW091133135 A TW 091133135A TW 91133135 A TW91133135 A TW 91133135A TW 200305188 A TW200305188 A TW 200305188A
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- batch
- carrier
- area
- substrates
- Prior art date
Links
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- 238000012545 processing Methods 0.000 title claims abstract description 67
- 238000004377 microelectronic Methods 0.000 title claims abstract description 20
- 238000000034 method Methods 0.000 claims abstract description 36
- 238000012546 transfer Methods 0.000 claims description 113
- 239000000872 buffer Substances 0.000 claims description 54
- 238000003860 storage Methods 0.000 claims description 31
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67167—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers surrounding a central transfer chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67178—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers vertical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67196—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the transfer chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67769—Storage means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
- H01L21/67781—Batch transfer of wafers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/137—Associated with semiconductor wafer handling including means for charging or discharging wafer cassette
- Y10S414/138—Wafers positioned vertically within cassette
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/139—Associated with semiconductor wafer handling including wafer charging or discharging means for vacuum chamber
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/141—Associated with semiconductor wafer handling includes means for gripping wafer
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US33805701P | 2001-11-13 | 2001-11-13 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200305188A true TW200305188A (en) | 2003-10-16 |
Family
ID=23323233
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW091133135A TW200305188A (en) | 2001-11-13 | 2002-11-12 | Reduced footprint tool for automated processing of microelectronic substrates |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US6979165B2 (enExample) |
| EP (1) | EP1446828A2 (enExample) |
| JP (1) | JP2005510055A (enExample) |
| KR (1) | KR20050044434A (enExample) |
| CN (1) | CN1608308A (enExample) |
| TW (1) | TW200305188A (enExample) |
| WO (1) | WO2003043060A2 (enExample) |
Families Citing this family (80)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1608308A (zh) | 2001-11-13 | 2005-04-20 | Fsi国际公司 | 微型电子基片的自动化加工用的减少占地的工具 |
| US6822413B2 (en) | 2002-03-20 | 2004-11-23 | Fsi International, Inc. | Systems and methods incorporating an end effector with a rotatable and/or pivotable body and/or an optical sensor having a light path that extends along a length of the end effector |
| TWI262165B (en) * | 2002-10-16 | 2006-09-21 | Sez Ag | Device and method for transporting wafer-shaped articles |
| RU2005123989A (ru) | 2003-01-02 | 2006-03-20 | Лома Линда Юниверсити Медикал Сентер (Us) | Управление конфигурацией и система поиска данных для системы протонной дистанционной протонно-лучевой терапии |
| TWI290901B (en) * | 2003-06-23 | 2007-12-11 | Au Optronics Corp | Warehousing conveyor system |
| JP2007500941A (ja) * | 2003-07-31 | 2007-01-18 | エフエスアイ インターナショナル インコーポレイテッド | 高度に均一な酸化物層、とりわけ超薄層の調節された成長 |
| JP4413562B2 (ja) * | 2003-09-05 | 2010-02-10 | 東京エレクトロン株式会社 | 処理システム及び処理方法 |
| EP1663534A1 (en) * | 2003-09-11 | 2006-06-07 | FSI International, Inc. | Acoustic diffusers for acoustic field uniformity |
| WO2005027202A1 (en) * | 2003-09-11 | 2005-03-24 | Fsi International, Inc. | Semiconductor wafer immersion systems and treatments using modulated acoustic energy |
| US8696298B2 (en) * | 2003-11-10 | 2014-04-15 | Brooks Automation, Inc. | Semiconductor manufacturing process modules |
| US7458763B2 (en) | 2003-11-10 | 2008-12-02 | Blueshift Technologies, Inc. | Mid-entry load lock for semiconductor handling system |
| US20070286710A1 (en) * | 2003-11-10 | 2007-12-13 | Van Der Meulen Peter | Semiconductor manufacturing process modules |
| US10086511B2 (en) | 2003-11-10 | 2018-10-02 | Brooks Automation, Inc. | Semiconductor manufacturing systems |
| US8313277B2 (en) * | 2003-11-10 | 2012-11-20 | Brooks Automation, Inc. | Semiconductor manufacturing process modules |
| US20070269297A1 (en) * | 2003-11-10 | 2007-11-22 | Meulen Peter V D | Semiconductor wafer handling and transport |
| JP4381121B2 (ja) * | 2003-12-11 | 2009-12-09 | 大日本スクリーン製造株式会社 | 基板処理装置 |
| CN101027767A (zh) * | 2004-09-24 | 2007-08-29 | 平田机工株式会社 | 容器输送装置 |
| KR100644054B1 (ko) * | 2004-12-29 | 2006-11-10 | 동부일렉트로닉스 주식회사 | 세정 장치 및 게이트 산화막의 전세정 방법 |
| JP4208844B2 (ja) * | 2005-01-14 | 2009-01-14 | 富士通マイクロエレクトロニクス株式会社 | 露光装置及びその制御方法 |
| JP4293150B2 (ja) * | 2005-03-29 | 2009-07-08 | セイコーエプソン株式会社 | 基板移載装置、基板移載方法、および電気光学装置の製造方法 |
| US9457442B2 (en) * | 2005-06-18 | 2016-10-04 | Futrfab, Inc. | Method and apparatus to support process tool modules in a cleanspace fabricator |
| US11024527B2 (en) | 2005-06-18 | 2021-06-01 | Frederick A. Flitsch | Methods and apparatus for novel fabricators with Cleanspace |
| US7513822B2 (en) * | 2005-06-18 | 2009-04-07 | Flitsch Frederick A | Method and apparatus for a cleanspace fabricator |
| US10651063B2 (en) | 2005-06-18 | 2020-05-12 | Frederick A. Flitsch | Methods of prototyping and manufacturing with cleanspace fabricators |
| US9339900B2 (en) | 2005-08-18 | 2016-05-17 | Futrfab, Inc. | Apparatus to support a cleanspace fabricator |
| US9059227B2 (en) | 2005-06-18 | 2015-06-16 | Futrfab, Inc. | Methods and apparatus for vertically orienting substrate processing tools in a clean space |
| US9159592B2 (en) | 2005-06-18 | 2015-10-13 | Futrfab, Inc. | Method and apparatus for an automated tool handling system for a multilevel cleanspace fabricator |
| US10627809B2 (en) | 2005-06-18 | 2020-04-21 | Frederick A. Flitsch | Multilevel fabricators |
| JP4767641B2 (ja) * | 2005-09-27 | 2011-09-07 | 大日本スクリーン製造株式会社 | 基板処理装置および基板搬送方法 |
| DE102006028057B4 (de) * | 2005-10-17 | 2017-07-20 | Dynamic Microsystems Semiconductor Equipment Gmbh | Vorrichtung zum Lagern von kontaminationsempfindlichen, plattenförmigen Gegenständen, insbesondere zum Lagern von Halbleiterwafern |
| EP1988568A4 (en) * | 2006-02-22 | 2011-10-26 | Ebara Corp | SUBSTRATE PROCESSING DEVICE, SUBSTRATE TRANSPORTING DEVICE, SUBSTRATE GRIPPING DEVICE, AND CHEMICAL SOLUTION PROCESSING DEVICE |
| US20070231108A1 (en) * | 2006-04-04 | 2007-10-04 | Applied Materials, Inc. | Method and apparatus for transferring wafers |
| KR100909494B1 (ko) * | 2006-05-11 | 2009-07-27 | 도쿄엘렉트론가부시키가이샤 | 처리장치 |
| TWI452643B (zh) * | 2006-05-11 | 2014-09-11 | Tokyo Electron Ltd | Inspection device and inspection method |
| US7896602B2 (en) * | 2006-06-09 | 2011-03-01 | Lutz Rebstock | Workpiece stocker with circular configuration |
| US7764366B2 (en) * | 2006-07-11 | 2010-07-27 | Besi North America, Inc. | Robotic die sorter with optical inspection system |
| JP4215079B2 (ja) * | 2006-07-31 | 2009-01-28 | 村田機械株式会社 | クリーンストッカと物品の保管方法 |
| JP4904995B2 (ja) * | 2006-08-28 | 2012-03-28 | シンフォニアテクノロジー株式会社 | ロードポート装置 |
| US7740437B2 (en) | 2006-09-22 | 2010-06-22 | Asm International N.V. | Processing system with increased cassette storage capacity |
| JP2008100805A (ja) * | 2006-10-18 | 2008-05-01 | Ihi Corp | 基板保管庫 |
| US20080112787A1 (en) | 2006-11-15 | 2008-05-15 | Dynamic Micro Systems | Removable compartments for workpiece stocker |
| US7949425B2 (en) * | 2006-12-06 | 2011-05-24 | Axcelis Technologies, Inc. | High throughput wafer notch aligner |
| US20080138178A1 (en) * | 2006-12-06 | 2008-06-12 | Axcelis Technologies,Inc. | High throughput serial wafer handling end station |
| US7694688B2 (en) | 2007-01-05 | 2010-04-13 | Applied Materials, Inc. | Wet clean system design |
| US20080206036A1 (en) * | 2007-02-27 | 2008-08-28 | Smith John M | Magnetic media processing tool with storage bays and multi-axis robot arms |
| US8950998B2 (en) * | 2007-02-27 | 2015-02-10 | Brooks Automation, Inc. | Batch substrate handling |
| US20080206022A1 (en) * | 2007-02-27 | 2008-08-28 | Smith John M | Mult-axis robot arms in substrate vacuum processing tool |
| US20080219810A1 (en) * | 2007-03-05 | 2008-09-11 | Van Der Meulen Peter | Semiconductor manufacturing process modules |
| US7585142B2 (en) * | 2007-03-16 | 2009-09-08 | Asm America, Inc. | Substrate handling chamber with movable substrate carrier loading platform |
| US20080310939A1 (en) * | 2007-06-15 | 2008-12-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | System and method for use in a lithography tool |
| KR100887161B1 (ko) * | 2007-08-03 | 2009-03-09 | 주식회사 에이디피엔지니어링 | 플라즈마 처리장치 |
| JP4989398B2 (ja) * | 2007-09-27 | 2012-08-01 | 大日本スクリーン製造株式会社 | 基板処理装置 |
| US8070410B2 (en) | 2008-02-05 | 2011-12-06 | Lutz Rebstock | Scalable stocker with automatic handling buffer |
| EP2245656B8 (en) * | 2008-02-05 | 2020-10-28 | Brooks Automation (Germany) GmbH | Automatic handling buffer for bare stocker |
| US9633881B2 (en) * | 2008-02-05 | 2017-04-25 | Brooks Automation, Inc. | Automatic handling buffer for bare stocker |
| DE102008009090B3 (de) * | 2008-02-14 | 2009-06-04 | MAG Industrial Automation Systems, LLC., Sterling Heights | Beschickungs- und Entnahme-Anlage für Werkzeug-Maschinen |
| WO2010008929A1 (en) * | 2008-07-15 | 2010-01-21 | Ulvac, Inc. | Work-piece transfer systems and methods |
| US9048274B2 (en) * | 2008-12-08 | 2015-06-02 | Taiwan Semiconductor Manufacturing Co., Ltd. | Portable stocker and method of using same |
| JP5083221B2 (ja) * | 2009-01-05 | 2012-11-28 | パナソニック株式会社 | パレット自動交換装置 |
| JP4973675B2 (ja) * | 2009-02-26 | 2012-07-11 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理方法 |
| JP5696135B2 (ja) * | 2009-03-30 | 2015-04-08 | エーティーエス オートメーション ツーリング システムズ インコーポレイテッドAts Automation Tooling Systems Inc. | ウエハーハンドリングシステムおよびその方法 |
| US8911554B2 (en) * | 2010-01-05 | 2014-12-16 | Applied Materials, Inc. | System for batch processing of magnetic media |
| AT510516B1 (de) * | 2010-09-21 | 2013-10-15 | Trumpf Maschinen Austria Gmbh | Fertigungszelle mit einer werkteil- transfereinrichtung und transporteinrichtung für werkteile und teileträger |
| US9449862B2 (en) | 2011-06-03 | 2016-09-20 | Tel Nexx, Inc. | Parallel single substrate processing system |
| CN103295931A (zh) * | 2012-02-29 | 2013-09-11 | Lgcns株式会社 | Led晶圆的提供装置及方法 |
| US9045827B2 (en) * | 2012-03-09 | 2015-06-02 | Lg Cns Co., Ltd. | Apparatus and method for supplying light-emitting diode (LED) wafer |
| US9136149B2 (en) | 2012-11-16 | 2015-09-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Loading port, system for etching and cleaning wafers and method of use |
| KR101992660B1 (ko) | 2012-11-28 | 2019-09-30 | 에이씨엠 리서치 (상하이) 인코포레이티드 | 반도체 웨이퍼의 세정 방법 및 장치 |
| US12189828B2 (en) | 2013-01-05 | 2025-01-07 | Frederick A. Flitsch | Customized smart devices and touchscreen devices and cleanspace manufacturing methods to make them |
| KR102075528B1 (ko) * | 2013-05-16 | 2020-03-03 | 삼성디스플레이 주식회사 | 증착장치, 유기발광 디스플레이 장치 제조방법 및 유기발광 디스플레이 장치 |
| US9378992B2 (en) | 2014-06-27 | 2016-06-28 | Axcelis Technologies, Inc. | High throughput heated ion implantation system and method |
| KR102160106B1 (ko) * | 2014-07-03 | 2020-09-25 | 세메스 주식회사 | 웨이퍼 이송 장치 |
| CN105278259A (zh) * | 2015-07-27 | 2016-01-27 | 江苏影速光电技术有限公司 | 单机双台面多工位自动pcb板曝光设备及其曝光方法 |
| US9607803B2 (en) | 2015-08-04 | 2017-03-28 | Axcelis Technologies, Inc. | High throughput cooled ion implantation system and method |
| JP6705668B2 (ja) * | 2016-03-11 | 2020-06-03 | ファスフォードテクノロジ株式会社 | ダイボンディング装置および半導体装置の製造方法 |
| US10916464B1 (en) * | 2019-07-26 | 2021-02-09 | Applied Materials, Inc. | Method of pre aligning carrier, wafer and carrier-wafer combination for throughput efficiency |
| JP7255615B2 (ja) * | 2021-01-29 | 2023-04-11 | 村田機械株式会社 | コンベアシステム |
| GB2610156A (en) * | 2021-04-29 | 2023-03-01 | Edwards Ltd | Semiconductor processing system |
| KR20230111438A (ko) * | 2022-01-18 | 2023-07-25 | 삼성전자주식회사 | 반도체 기판 처리 장치 |
| JP2024047292A (ja) * | 2022-09-26 | 2024-04-05 | 株式会社Screenホールディングス | 基板処理装置 |
Family Cites Families (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4568234A (en) | 1983-05-23 | 1986-02-04 | Asq Boats, Inc. | Wafer transfer apparatus |
| JPS63303060A (ja) * | 1987-05-30 | 1988-12-09 | Tokuda Seisakusho Ltd | 真空処理装置 |
| US4851101A (en) * | 1987-09-18 | 1989-07-25 | Varian Associates, Inc. | Sputter module for modular wafer processing machine |
| US5064337A (en) | 1988-07-19 | 1991-11-12 | Tokyo Electron Limited | Handling apparatus for transferring carriers and a method of transferring carriers |
| KR0155158B1 (ko) * | 1989-07-25 | 1998-12-01 | 카자마 젠쥬 | 종형 처리 장치 및 처리방법 |
| US5505577A (en) * | 1990-11-17 | 1996-04-09 | Tokyo Electron Limited | Transfer apparatus |
| JP2986121B2 (ja) * | 1991-03-26 | 1999-12-06 | 東京エレクトロン株式会社 | ロードロック装置及び真空処理装置 |
| KR100230697B1 (ko) * | 1992-02-18 | 1999-11-15 | 이노우에 쥰이치 | 감압 처리 장치 |
| US5378145A (en) | 1992-07-15 | 1995-01-03 | Tokyo Electron Kabushiki Kaisha | Treatment system and treatment apparatus |
| TW245823B (enExample) * | 1992-10-05 | 1995-04-21 | Tokyo Electron Co Ltd | |
| US5544421A (en) | 1994-04-28 | 1996-08-13 | Semitool, Inc. | Semiconductor wafer processing system |
| EP0757844A1 (en) * | 1994-04-28 | 1997-02-12 | Semitool, Inc. | Semiconductor processing systems |
| ES2229247T3 (es) * | 1995-03-28 | 2005-04-16 | Brooks Automation Gmbh | Estacion de carga y descarga para instalaciones de tratamiento de semiconductores. |
| JP3478364B2 (ja) * | 1995-06-15 | 2003-12-15 | 株式会社日立国際電気 | 半導体製造装置 |
| US6672819B1 (en) * | 1995-07-19 | 2004-01-06 | Hitachi, Ltd. | Vacuum processing apparatus and semiconductor manufacturing line using the same |
| US6279724B1 (en) | 1997-12-19 | 2001-08-28 | Semitoll Inc. | Automated semiconductor processing system |
| US5980195A (en) * | 1996-04-24 | 1999-11-09 | Tokyo Electron, Ltd. | Positioning apparatus for substrates to be processed |
| JP2000514956A (ja) * | 1996-07-15 | 2000-11-07 | セミトゥール・インコーポレイテッド | 自動化された半導体処理システム |
| US6572320B2 (en) * | 1997-05-05 | 2003-06-03 | Semitool, Inc. | Robot for handling workpieces in an automated processing system |
| US6579052B1 (en) * | 1997-07-11 | 2003-06-17 | Asyst Technologies, Inc. | SMIF pod storage, delivery and retrieval system |
| US6235634B1 (en) * | 1997-10-08 | 2001-05-22 | Applied Komatsu Technology, Inc. | Modular substrate processing system |
| NL1008143C2 (nl) * | 1998-01-27 | 1999-07-28 | Asm Int | Stelsel voor het behandelen van wafers. |
| US6368040B1 (en) * | 1998-02-18 | 2002-04-09 | Tokyo Electron Limited | Apparatus for and method of transporting substrates to be processed |
| US6365033B1 (en) | 1999-05-03 | 2002-04-02 | Semitoof, Inc. | Methods for controlling and/or measuring additive concentration in an electroplating bath |
| EP1084509A1 (en) * | 1998-05-27 | 2001-03-21 | Varian Semiconductor Equipment Associates Inc. | Batch end effector for semiconductor wafer handling |
| JP3455458B2 (ja) * | 1999-02-01 | 2003-10-14 | 東京エレクトロン株式会社 | 塗布、現像装置及び塗布現像処理における基板再生システム |
| JP3442686B2 (ja) * | 1999-06-01 | 2003-09-02 | 東京エレクトロン株式会社 | 基板処理装置 |
| US6217727B1 (en) | 1999-08-30 | 2001-04-17 | Micron Technology, Inc. | Electroplating apparatus and method |
| US6376261B1 (en) | 2000-01-03 | 2002-04-23 | Advanced Micro Devices Inc. | Method for varying nitride strip makeup process based on field oxide loss and defect count |
| US6413356B1 (en) * | 2000-05-02 | 2002-07-02 | Applied Materials, Inc. | Substrate loader for a semiconductor processing system |
| US6444481B1 (en) | 2001-07-02 | 2002-09-03 | Advanced Micro Devices, Inc. | Method and apparatus for controlling a plating process |
| CN1608308A (zh) | 2001-11-13 | 2005-04-20 | Fsi国际公司 | 微型电子基片的自动化加工用的减少占地的工具 |
| US6852644B2 (en) * | 2002-11-25 | 2005-02-08 | The Boc Group, Inc. | Atmospheric robot handling equipment |
-
2002
- 2002-11-08 CN CNA028260678A patent/CN1608308A/zh active Pending
- 2002-11-08 JP JP2003544796A patent/JP2005510055A/ja not_active Withdrawn
- 2002-11-08 WO PCT/US2002/035998 patent/WO2003043060A2/en not_active Ceased
- 2002-11-08 EP EP02789550A patent/EP1446828A2/en not_active Withdrawn
- 2002-11-08 KR KR1020047007232A patent/KR20050044434A/ko not_active Withdrawn
- 2002-11-12 US US10/292,147 patent/US6979165B2/en not_active Expired - Fee Related
- 2002-11-12 TW TW091133135A patent/TW200305188A/zh unknown
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2004
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|---|---|
| KR20050044434A (ko) | 2005-05-12 |
| US6979165B2 (en) | 2005-12-27 |
| CN1608308A (zh) | 2005-04-20 |
| US20050063799A1 (en) | 2005-03-24 |
| US7134827B2 (en) | 2006-11-14 |
| JP2005510055A (ja) | 2005-04-14 |
| EP1446828A2 (en) | 2004-08-18 |
| WO2003043060A3 (en) | 2003-11-27 |
| WO2003043060A2 (en) | 2003-05-22 |
| US20030091410A1 (en) | 2003-05-15 |
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