SG170663A1 - Method for polishing a semiconductor wafer - Google Patents
Method for polishing a semiconductor waferInfo
- Publication number
- SG170663A1 SG170663A1 SG201006281-8A SG2010062818A SG170663A1 SG 170663 A1 SG170663 A1 SG 170663A1 SG 2010062818 A SG2010062818 A SG 2010062818A SG 170663 A1 SG170663 A1 SG 170663A1
- Authority
- SG
- Singapore
- Prior art keywords
- polishing
- semiconductor wafer
- polished
- carrier
- polishing pad
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02024—Mirror polishing
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102009051007A DE102009051007B4 (de) | 2009-10-28 | 2009-10-28 | Verfahren zum Polieren einer Halbleiterscheibe |
Publications (1)
Publication Number | Publication Date |
---|---|
SG170663A1 true SG170663A1 (en) | 2011-05-30 |
Family
ID=43828687
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG201006281-8A SG170663A1 (en) | 2009-10-28 | 2010-08-30 | Method for polishing a semiconductor wafer |
Country Status (6)
Country | Link |
---|---|
US (2) | US20110097974A1 (zh) |
JP (2) | JP2011103460A (zh) |
CN (1) | CN102049723B (zh) |
DE (1) | DE102009051007B4 (zh) |
SG (1) | SG170663A1 (zh) |
TW (1) | TWI421934B (zh) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010005904B4 (de) | 2010-01-27 | 2012-11-22 | Siltronic Ag | Verfahren zur Herstellung einer Halbleiterscheibe |
CN102294647A (zh) * | 2011-09-07 | 2011-12-28 | 清华大学 | 化学机械抛光方法 |
CN102320026A (zh) * | 2011-09-07 | 2012-01-18 | 清华大学 | 化学机械抛光方法 |
CN102294649A (zh) * | 2011-09-07 | 2011-12-28 | 清华大学 | 化学机械抛光方法 |
KR101295921B1 (ko) * | 2011-11-07 | 2013-08-13 | 주식회사 엘지실트론 | 연마패드의 표면처리방법 및 이를 이용한 웨이퍼의 연마방법 |
US20140127857A1 (en) * | 2012-11-07 | 2014-05-08 | Taiwan Semiconductor Manufacturing Company, Ltd. | Carrier Wafers, Methods of Manufacture Thereof, and Packaging Methods |
CN103203681B (zh) * | 2013-04-07 | 2015-04-29 | 大连理工大学 | 一种ii-vi族软脆晶体研磨抛光方法 |
JP6696756B2 (ja) * | 2014-11-13 | 2020-05-20 | 富士紡ホールディングス株式会社 | 保持具及びその製造方法 |
JP6447472B2 (ja) | 2015-11-26 | 2019-01-09 | 株式会社Sumco | ウェーハ研磨方法 |
CN106992112A (zh) * | 2016-01-21 | 2017-07-28 | 苏州新美光纳米科技有限公司 | 超薄晶片的抛光方法 |
CN106584227A (zh) * | 2016-12-01 | 2017-04-26 | 大连液压件有限公司 | 工件单面加工装置及工艺 |
JP7046495B2 (ja) * | 2017-03-27 | 2022-04-04 | 富士紡ホールディングス株式会社 | 保持具及び保持具の製造方法 |
CN109129028B (zh) * | 2017-06-15 | 2021-11-12 | 北京天科合达半导体股份有限公司 | 一种高效的碳化硅晶片的加工方法 |
CN107139067A (zh) * | 2017-07-14 | 2017-09-08 | 青岛嘉星晶电科技股份有限公司 | 一种控制蓝宝石晶片抛光ttv/ltv的方法及装置 |
CN107498462A (zh) * | 2017-07-31 | 2017-12-22 | 安庆市晶科电子有限公司 | 一种具有弹性限位机构的晶体生产用治具 |
JP6822432B2 (ja) * | 2018-02-23 | 2021-01-27 | 株式会社Sumco | ウェーハの片面研磨方法 |
JP6947135B2 (ja) * | 2018-04-25 | 2021-10-13 | 信越半導体株式会社 | 研磨装置、ウェーハの研磨方法、及び、ウェーハの製造方法 |
CN109397070A (zh) * | 2018-10-24 | 2019-03-01 | 中国科学院上海技术物理研究所 | 一种磷化铟晶圆片及其外延晶圆片的衬底抛光模具 |
CN114260820A (zh) * | 2021-12-30 | 2022-04-01 | 西安奕斯伟材料科技有限公司 | 一种抛光头和抛光设备 |
Family Cites Families (35)
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US5152917B1 (en) | 1991-02-06 | 1998-01-13 | Minnesota Mining & Mfg | Structured abrasive article |
US5267418A (en) | 1992-05-27 | 1993-12-07 | International Business Machines Corporation | Confined water fixture for holding wafers undergoing chemical-mechanical polishing |
US7037403B1 (en) * | 1992-12-28 | 2006-05-02 | Applied Materials Inc. | In-situ real-time monitoring technique and apparatus for detection of thin films during chemical/mechanical polishing planarization |
US5549511A (en) | 1994-12-06 | 1996-08-27 | International Business Machines Corporation | Variable travel carrier device and method for planarizing semiconductor wafers |
JPH08174411A (ja) * | 1994-12-22 | 1996-07-09 | Ebara Corp | ポリッシング装置 |
JP3129172B2 (ja) | 1995-11-14 | 2001-01-29 | 日本電気株式会社 | 研磨装置及び研磨方法 |
DE69813374T2 (de) | 1997-05-28 | 2003-10-23 | Tokyo Seimitsu Co Ltd | Halbleiterscheibe Poliervorrichtung mit Halterring |
US6241582B1 (en) | 1997-09-01 | 2001-06-05 | United Microelectronics Corp. | Chemical mechanical polish machines and fabrication process using the same |
JPH1187286A (ja) * | 1997-09-05 | 1999-03-30 | Lsi Logic Corp | 半導体ウエハの二段階式化学的機械的研磨方法及び装置 |
JPH11300607A (ja) * | 1998-04-16 | 1999-11-02 | Speedfam-Ipec Co Ltd | 研磨装置 |
US5897426A (en) * | 1998-04-24 | 1999-04-27 | Applied Materials, Inc. | Chemical mechanical polishing with multiple polishing pads |
US6117779A (en) * | 1998-12-15 | 2000-09-12 | Lsi Logic Corporation | Endpoint detection method and apparatus which utilize a chelating agent to detect a polishing endpoint |
US6422927B1 (en) | 1998-12-30 | 2002-07-23 | Applied Materials, Inc. | Carrier head with controllable pressure and loading area for chemical mechanical polishing |
KR20010039590A (ko) * | 1999-04-29 | 2001-05-15 | 마에다 시게루 | 작업대상물을 폴리싱하는 방법 및 장치 |
US6290578B1 (en) * | 1999-10-13 | 2001-09-18 | Speedfam-Ipec Corporation | Method for chemical mechanical polishing using synergistic geometric patterns |
JP2001225261A (ja) * | 2000-02-16 | 2001-08-21 | Ebara Corp | ポリッシング装置 |
US6387289B1 (en) | 2000-05-04 | 2002-05-14 | Micron Technology, Inc. | Planarizing machines and methods for mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies |
JP3791302B2 (ja) * | 2000-05-31 | 2006-06-28 | 株式会社Sumco | 両面研磨装置を用いた半導体ウェーハの研磨方法 |
US6609950B2 (en) * | 2000-07-05 | 2003-08-26 | Ebara Corporation | Method for polishing a substrate |
US6602117B1 (en) | 2000-08-30 | 2003-08-05 | Micron Technology, Inc. | Slurry for use with fixed-abrasive polishing pads in polishing semiconductor device conductive structures that include copper and tungsten and polishing methods |
KR100882389B1 (ko) | 2000-10-26 | 2009-02-05 | 신에츠 한도타이 가부시키가이샤 | 웨이퍼의 제조방법 및 연마장치 및 웨이퍼 |
JP4019349B2 (ja) | 2001-12-20 | 2007-12-12 | 株式会社Sumco | ワックスレスマウント式研磨装置 |
JP4013187B2 (ja) | 2001-12-20 | 2007-11-28 | 株式会社Sumco | ワックスレスマウント式研磨装置 |
WO2003074228A1 (en) | 2002-01-17 | 2003-09-12 | Nutool, Inc. | Advanced chemical mechanical polishing system with smart endpoint detection |
JP4493296B2 (ja) * | 2002-07-26 | 2010-06-30 | 日東電工株式会社 | 加工用粘着シートとその製造方法 |
US20050227590A1 (en) | 2004-04-09 | 2005-10-13 | Chien-Min Sung | Fixed abrasive tools and associated methods |
JP4820108B2 (ja) | 2005-04-25 | 2011-11-24 | コマツNtc株式会社 | 半導体ウエーハの製造方法およびワークのスライス方法ならびにそれらに用いられるワイヤソー |
JP2007088193A (ja) * | 2005-09-22 | 2007-04-05 | Sumitomo Metal Mining Co Ltd | サファイア基板およびその製造方法 |
JP2008023655A (ja) * | 2006-07-21 | 2008-02-07 | Toshiba Corp | 研磨方法及び研磨パッド |
JP2007274012A (ja) * | 2007-07-23 | 2007-10-18 | Sumco Corp | ワックスレスマウント式研磨方法 |
DE102007035266B4 (de) * | 2007-07-27 | 2010-03-25 | Siltronic Ag | Verfahren zum Polieren eines Substrates aus Silicium oder einer Legierung aus Silicium und Germanium |
JP4732423B2 (ja) * | 2007-11-13 | 2011-07-27 | 株式会社デンソー | 炭化珪素半導体装置の製造方法 |
DE112007003705T5 (de) * | 2007-11-21 | 2010-12-23 | Shin-Etsu Handotai Co., Ltd. | Polierkopf, Poliervorrichtung und Verfahren zum Ablösen eines Werkstücks |
JP5248127B2 (ja) * | 2008-01-30 | 2013-07-31 | 株式会社荏原製作所 | 研磨方法及び研磨装置 |
DE102008053610B4 (de) | 2008-10-29 | 2011-03-31 | Siltronic Ag | Verfahren zum beidseitigen Polieren einer Halbleiterscheibe |
-
2009
- 2009-10-28 DE DE102009051007A patent/DE102009051007B4/de not_active Expired - Fee Related
-
2010
- 2010-08-30 SG SG201006281-8A patent/SG170663A1/en unknown
- 2010-09-27 CN CN201010296792.3A patent/CN102049723B/zh not_active Expired - Fee Related
- 2010-10-04 US US12/897,063 patent/US20110097974A1/en not_active Abandoned
- 2010-10-08 TW TW099134364A patent/TWI421934B/zh not_active IP Right Cessation
- 2010-10-27 JP JP2010241303A patent/JP2011103460A/ja active Pending
-
2013
- 2013-03-11 US US13/792,295 patent/US8647173B2/en not_active Expired - Fee Related
- 2013-07-25 JP JP2013154398A patent/JP2013214784A/ja not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
CN102049723A (zh) | 2011-05-11 |
TWI421934B (zh) | 2014-01-01 |
JP2011103460A (ja) | 2011-05-26 |
JP2013214784A (ja) | 2013-10-17 |
DE102009051007B4 (de) | 2011-12-22 |
TW201117281A (en) | 2011-05-16 |
US8647173B2 (en) | 2014-02-11 |
DE102009051007A1 (de) | 2011-05-05 |
CN102049723B (zh) | 2013-08-14 |
US20130189904A1 (en) | 2013-07-25 |
US20110097974A1 (en) | 2011-04-28 |
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