SG169933A1 - Method for polishing semiconductor wafers - Google Patents
Method for polishing semiconductor wafersInfo
- Publication number
- SG169933A1 SG169933A1 SG201005449-2A SG2010054492A SG169933A1 SG 169933 A1 SG169933 A1 SG 169933A1 SG 2010054492 A SG2010054492 A SG 2010054492A SG 169933 A1 SG169933 A1 SG 169933A1
- Authority
- SG
- Singapore
- Prior art keywords
- polishing
- semiconductor wafers
- polishing semiconductor
- agent
- polishing agent
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02024—Mirror polishing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
- B24B37/245—Pads with fixed abrasives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D15/00—Hand tools or other devices for non-rotary grinding, polishing, or stropping
- B24D15/06—Hand tools or other devices for non-rotary grinding, polishing, or stropping specially designed for sharpening cutting edges
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
A method for polishing semiconductor wafers using a polishing pad containing an abrasive substance bonded in the polishing pad, and with an alkaline polishing agent being supplied, wherein a volumetric flow rate of the polishing agent is greater than or equal to 5 liters/min and the polishing agent is circulated in a polishing agent circuit during polishing.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102009047926A DE102009047926A1 (en) | 2009-10-01 | 2009-10-01 | Process for polishing semiconductor wafers |
Publications (1)
Publication Number | Publication Date |
---|---|
SG169933A1 true SG169933A1 (en) | 2011-04-29 |
Family
ID=43734504
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG201005449-2A SG169933A1 (en) | 2009-10-01 | 2010-07-28 | Method for polishing semiconductor wafers |
Country Status (7)
Country | Link |
---|---|
US (1) | US20110081840A1 (en) |
JP (1) | JP2011077525A (en) |
KR (1) | KR20110036497A (en) |
CN (1) | CN102034697A (en) |
DE (1) | DE102009047926A1 (en) |
SG (1) | SG169933A1 (en) |
TW (1) | TW201113944A (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8739806B2 (en) | 2011-05-11 | 2014-06-03 | Nanya Technology Corp. | Chemical mechanical polishing system |
US8662963B2 (en) * | 2011-05-12 | 2014-03-04 | Nanya Technology Corp. | Chemical mechanical polishing system |
JP5716612B2 (en) * | 2011-09-01 | 2015-05-13 | 信越半導体株式会社 | Silicon wafer polishing method and polishing apparatus |
JP2013184276A (en) * | 2012-03-09 | 2013-09-19 | Disco Corp | Tool cutting method |
JP6052004B2 (en) | 2013-03-27 | 2016-12-27 | 富士通株式会社 | Terminal device and terminal control program |
KR102070452B1 (en) | 2019-06-14 | 2020-02-03 | 최재용 | Food waste processing apparatus for restaurants |
JP7236990B2 (en) * | 2019-12-09 | 2023-03-10 | 株式会社荏原製作所 | System and polishing equipment for adjusting the surface temperature of the pad |
KR20210152099A (en) | 2020-06-05 | 2021-12-15 | 박성근 | Food waste disposal equipment |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5152917B1 (en) * | 1991-02-06 | 1998-01-13 | Minnesota Mining & Mfg | Structured abrasive article |
US5310455A (en) * | 1992-07-10 | 1994-05-10 | Lsi Logic Corporation | Techniques for assembling polishing pads for chemi-mechanical polishing of silicon wafers |
JP2971714B2 (en) * | 1993-10-01 | 1999-11-08 | 住友金属工業株式会社 | Mirror polishing method for semiconductor substrate |
US5664990A (en) * | 1996-07-29 | 1997-09-09 | Integrated Process Equipment Corp. | Slurry recycling in CMP apparatus |
JP3341601B2 (en) * | 1996-10-18 | 2002-11-05 | 日本電気株式会社 | Method and apparatus for collecting and reusing abrasives |
JPH11151659A (en) * | 1997-11-20 | 1999-06-08 | Sony Corp | Polishing pad, chemomechanical polishing method, and hcemomechanical polishing device |
JPH11277434A (en) * | 1998-03-30 | 1999-10-12 | Speedfam Co Ltd | Slurry recycle system for cmp device and method therefor |
US6036586A (en) * | 1998-07-29 | 2000-03-14 | Micron Technology, Inc. | Apparatus and method for reducing removal forces for CMP pads |
JP3858462B2 (en) * | 1998-07-30 | 2006-12-13 | 株式会社日立製作所 | Manufacturing method of semiconductor device |
JP3538042B2 (en) * | 1998-11-24 | 2004-06-14 | 松下電器産業株式会社 | Slurry supply device and slurry supply method |
US6299514B1 (en) * | 1999-03-13 | 2001-10-09 | Peter Wolters Werkzeugmachinen Gmbh | Double-disk polishing machine, particularly for tooling semiconductor wafers |
DE10007390B4 (en) | 1999-03-13 | 2008-11-13 | Peter Wolters Gmbh | Two-disc polishing machine, in particular for processing semiconductor wafers |
JP2001088020A (en) * | 1999-09-22 | 2001-04-03 | Speedfam Co Ltd | Polishing method and device for workpiece |
US6558238B1 (en) * | 2000-09-19 | 2003-05-06 | Agere Systems Inc. | Apparatus and method for reclamation of used polishing slurry |
JP2002178261A (en) * | 2000-12-13 | 2002-06-25 | Ebara Corp | Abrasive fluid supply device, additive replenishing method to abrasive fluid supply device and polishing deice |
JP2002252189A (en) * | 2001-02-26 | 2002-09-06 | Mitsubishi Materials Silicon Corp | Polishing liquid for semiconductor wafer |
DE10132504C1 (en) | 2001-07-05 | 2002-10-10 | Wacker Siltronic Halbleitermat | Method for simultaneously polishing both sides of semiconductor wafer mounted on cogwheel between central cogwheel and annulus uses upper and lower polishing wheel |
JP4608856B2 (en) * | 2003-07-24 | 2011-01-12 | 信越半導体株式会社 | Wafer polishing method |
JP2005205544A (en) * | 2004-01-22 | 2005-08-04 | Ebara Corp | Method of manufacturing grinding wheel, grinding wheel and polishing device having this grinding wheel |
US20050227590A1 (en) | 2004-04-09 | 2005-10-13 | Chien-Min Sung | Fixed abrasive tools and associated methods |
JP4601445B2 (en) * | 2004-06-21 | 2010-12-22 | 富士通セミコンダクター株式会社 | Abrasive supply method |
JP5196709B2 (en) * | 2005-04-19 | 2013-05-15 | 株式会社荏原製作所 | Semiconductor wafer peripheral polishing apparatus and method |
WO2009002124A1 (en) * | 2007-06-27 | 2008-12-31 | Kolon Industries, Inc | Polishing pad and method of manufacturing the same |
DE102007035266B4 (en) * | 2007-07-27 | 2010-03-25 | Siltronic Ag | A method of polishing a substrate of silicon or an alloy of silicon and germanium |
JP5163078B2 (en) * | 2007-11-29 | 2013-03-13 | 株式会社Sumco | Polishing apparatus and method |
-
2009
- 2009-10-01 DE DE102009047926A patent/DE102009047926A1/en not_active Withdrawn
-
2010
- 2010-07-28 SG SG201005449-2A patent/SG169933A1/en unknown
- 2010-08-27 KR KR1020100083668A patent/KR20110036497A/en not_active Application Discontinuation
- 2010-08-30 CN CN201010267932.4A patent/CN102034697A/en active Pending
- 2010-09-08 TW TW099130292A patent/TW201113944A/en unknown
- 2010-09-09 US US12/878,055 patent/US20110081840A1/en not_active Abandoned
- 2010-09-29 JP JP2010218895A patent/JP2011077525A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
DE102009047926A1 (en) | 2011-04-14 |
TW201113944A (en) | 2011-04-16 |
CN102034697A (en) | 2011-04-27 |
JP2011077525A (en) | 2011-04-14 |
US20110081840A1 (en) | 2011-04-07 |
KR20110036497A (en) | 2011-04-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SG169933A1 (en) | Method for polishing semiconductor wafers | |
SG170663A1 (en) | Method for polishing a semiconductor wafer | |
SG161170A1 (en) | Method for polishing both sides of a semiconductor wafer | |
EP1930938A4 (en) | Polishing agent, method for polishing surface to be polished, and method for manufacturing semiconductor integrated circuit device | |
MY164313A (en) | Soft polishing pad for polishing a semiconductor substrate | |
MY149975A (en) | Polishing composition and method utilizing abrasive particles treated with an aminosilane | |
TW200720383A (en) | Polishing fluids and methods for CMP | |
MY146929A (en) | Polishing pad | |
EP1956642A4 (en) | Polishing agent for silicon oxide, liquid additive, and method of polishing | |
IL199549A (en) | Composition for polishing surface made of silicon dioxide | |
MY153077A (en) | Method to selectively polish silicon carbide films | |
MY155900A (en) | Cleaning and/or polishing compositions and method for use thereof | |
TW200735201A (en) | CMP method providing reduced thickness variations | |
WO2010062818A3 (en) | Two-line mixing of chemical and abrasive particles with endpoint control for chemical mechanical polishing | |
MY161744A (en) | Polishing composition containing hybrid abrasive for nickel-phosphorous coated memory disks | |
TW200617151A (en) | Polishing composition and polishing method using the same | |
SG163546A1 (en) | Use of cmp for aluminum mirror and solar cell fabrication | |
MY146591A (en) | Polishing composition containing polyether amine | |
SG148912A1 (en) | Chemical mechanical polishing slurry composition for polishing phase- change memory device and method for polishing phase-change memory device using the same | |
MY171840A (en) | Composition for polishing purposes,polishing method using same,and method for producing substrate | |
TW201130026A (en) | Semiconductor wafer re-use using chemical mechanical polishing | |
MY153685A (en) | Composition and method to polish silicon nitride | |
TW200716728A (en) | Polishing agent for semiconductor integrated circuit device, polishing method, and method for manufacturing the same | |
SG148968A1 (en) | Method for grinding semiconductor wafers | |
IL179570A0 (en) | Cmp composition for improved oxide removal rate |