SG126921A1 - Lithographic apparatus and device manufacturing method - Google Patents
Lithographic apparatus and device manufacturing methodInfo
- Publication number
- SG126921A1 SG126921A1 SG200602940A SG200602940A SG126921A1 SG 126921 A1 SG126921 A1 SG 126921A1 SG 200602940 A SG200602940 A SG 200602940A SG 200602940 A SG200602940 A SG 200602940A SG 126921 A1 SG126921 A1 SG 126921A1
- Authority
- SG
- Singapore
- Prior art keywords
- device manufacturing
- lithographic apparatus
- lithographic
- manufacturing
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2041—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/120,198 US7317507B2 (en) | 2005-05-03 | 2005-05-03 | Lithographic apparatus and device manufacturing method |
Publications (1)
Publication Number | Publication Date |
---|---|
SG126921A1 true SG126921A1 (en) | 2006-11-29 |
Family
ID=36685649
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200602940A SG126921A1 (en) | 2005-05-03 | 2006-05-02 | Lithographic apparatus and device manufacturing method |
Country Status (7)
Country | Link |
---|---|
US (1) | US7317507B2 (ja) |
EP (1) | EP1720073B1 (ja) |
JP (1) | JP4543003B2 (ja) |
KR (1) | KR100706921B1 (ja) |
CN (1) | CN1858655B (ja) |
SG (1) | SG126921A1 (ja) |
TW (1) | TWI331705B (ja) |
Families Citing this family (26)
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US7362508B2 (en) * | 2002-08-23 | 2008-04-22 | Nikon Corporation | Projection optical system and method for photolithography and exposure apparatus and method using same |
US7348575B2 (en) | 2003-05-06 | 2008-03-25 | Nikon Corporation | Projection optical system, exposure apparatus, and exposure method |
KR101647934B1 (ko) | 2003-05-06 | 2016-08-11 | 가부시키가이샤 니콘 | 투영 광학계, 노광 장치 및 노광 방법 |
US20050161644A1 (en) * | 2004-01-23 | 2005-07-28 | Peng Zhang | Immersion lithography fluids |
TWI259319B (en) * | 2004-01-23 | 2006-08-01 | Air Prod & Chem | Immersion lithography fluids |
KR20070029731A (ko) * | 2004-06-01 | 2007-03-14 | 이 아이 듀폰 디 네모아 앤드 캄파니 | 자외선-투명성 알칸 및 진공 및 원자외선 응용에서 그의사용 방법 |
EP1843387A4 (en) * | 2005-01-25 | 2010-01-13 | Jsr Corp | IMMERSION EXPOSURE SYSTEM, RECYCLING METHOD, AND LIQUID DELIVERY METHOD FOR IMMERSION EXPOSURE |
EP2506289A3 (en) | 2005-01-31 | 2013-05-22 | Nikon Corporation | Exposure apparatus and method for manufacturing device |
US8692973B2 (en) | 2005-01-31 | 2014-04-08 | Nikon Corporation | Exposure apparatus and method for producing device |
WO2006130338A1 (en) * | 2005-06-01 | 2006-12-07 | Nikon Corporation | Immersion fluid containment system and method for immersion lithography |
US20070004182A1 (en) * | 2005-06-30 | 2007-01-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Methods and system for inhibiting immersion lithography defect formation |
US20070058263A1 (en) * | 2005-09-13 | 2007-03-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Apparatus and methods for immersion lithography |
JP4804950B2 (ja) * | 2005-09-26 | 2011-11-02 | 東京応化工業株式会社 | 有機膜の液浸リソグラフィ溶解成分測定方法 |
US7986395B2 (en) * | 2005-10-24 | 2011-07-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Immersion lithography apparatus and methods |
JP5027154B2 (ja) * | 2005-12-22 | 2012-09-19 | フリースケール セミコンダクター インコーポレイテッド | 液浸露光装置及び液浸露光方法 |
US8564759B2 (en) * | 2006-06-29 | 2013-10-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | Apparatus and method for immersion lithography |
US9632425B2 (en) | 2006-12-07 | 2017-04-25 | Asml Holding N.V. | Lithographic apparatus, a dryer and a method of removing liquid from a surface |
US8004651B2 (en) | 2007-01-23 | 2011-08-23 | Nikon Corporation | Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method |
JP2008218653A (ja) * | 2007-03-02 | 2008-09-18 | Canon Inc | 露光装置及びデバイス製造方法 |
JP5055549B2 (ja) * | 2007-03-22 | 2012-10-24 | 国立大学法人宇都宮大学 | 液浸露光装置 |
NL1035757A1 (nl) | 2007-08-02 | 2009-02-03 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method. |
US9180524B2 (en) * | 2007-08-06 | 2015-11-10 | 3M Innovative Properties Company | Fly-cutting head, system and method, and tooling and sheeting produced therewith |
SG159467A1 (en) * | 2008-09-02 | 2010-03-30 | Asml Netherlands Bv | Fluid handling structure, lithographic apparatus and device manufacturing method |
CN104570618B (zh) * | 2014-12-25 | 2016-08-17 | 浙江大学 | 基于亲疏水交替表面的浸没流场密封装置 |
CN104597720B (zh) * | 2015-01-15 | 2016-08-17 | 浙江大学 | 一种用于浸没式光刻机的气液隔离装置 |
EP3460558A1 (en) * | 2017-09-20 | 2019-03-27 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Cryo-light microscope and immersion medium for cryo-light microscopy |
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2005
- 2005-05-03 US US11/120,198 patent/US7317507B2/en not_active Expired - Fee Related
-
2006
- 2006-04-20 TW TW095114173A patent/TWI331705B/zh not_active IP Right Cessation
- 2006-04-27 JP JP2006123688A patent/JP4543003B2/ja not_active Expired - Fee Related
- 2006-04-28 EP EP06252280A patent/EP1720073B1/en not_active Not-in-force
- 2006-05-02 SG SG200602940A patent/SG126921A1/en unknown
- 2006-05-03 KR KR1020060040041A patent/KR100706921B1/ko not_active IP Right Cessation
- 2006-05-08 CN CN2006100778456A patent/CN1858655B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR100706921B1 (ko) | 2007-04-13 |
KR20060115613A (ko) | 2006-11-09 |
US20060250591A1 (en) | 2006-11-09 |
CN1858655B (zh) | 2010-09-01 |
JP4543003B2 (ja) | 2010-09-15 |
EP1720073B1 (en) | 2012-01-18 |
JP2006313905A (ja) | 2006-11-16 |
US7317507B2 (en) | 2008-01-08 |
CN1858655A (zh) | 2006-11-08 |
EP1720073A1 (en) | 2006-11-08 |
TW200643650A (en) | 2006-12-16 |
TWI331705B (en) | 2010-10-11 |
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