SG110211A1 - Polishing composition - Google Patents
Polishing compositionInfo
- Publication number
- SG110211A1 SG110211A1 SG200406144A SG200406144A SG110211A1 SG 110211 A1 SG110211 A1 SG 110211A1 SG 200406144 A SG200406144 A SG 200406144A SG 200406144 A SG200406144 A SG 200406144A SG 110211 A1 SG110211 A1 SG 110211A1
- Authority
- SG
- Singapore
- Prior art keywords
- polishing composition
- measured
- particle diameter
- silicon oxide
- laser diffraction
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title abstract 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- 239000002245 particle Substances 0.000 abstract 2
- 229910052814 silicon oxide Inorganic materials 0.000 abstract 2
- 150000001370 alpha-amino acid derivatives Chemical class 0.000 abstract 1
- 235000008206 alpha-amino acids Nutrition 0.000 abstract 1
- 150000001732 carboxylic acid derivatives Chemical class 0.000 abstract 1
- 230000007797 corrosion Effects 0.000 abstract 1
- 238000005260 corrosion Methods 0.000 abstract 1
- 239000003112 inhibitor Substances 0.000 abstract 1
- 239000007800 oxidant agent Substances 0.000 abstract 1
- 230000001590 oxidative effect Effects 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
- 239000004094 surface-active agent Substances 0.000 abstract 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/7684—Smoothing; Planarisation
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/02—Silicon
- C01B33/021—Preparation
- C01B33/023—Preparation by reduction of silica or free silica-containing material
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K8/00—Compositions for drilling of boreholes or wells; Compositions for treating boreholes or wells, e.g. for completion or for remedial operations
- C09K8/52—Compositions for preventing, limiting or eliminating depositions, e.g. for cleaning
- C09K8/528—Compositions for preventing, limiting or eliminating depositions, e.g. for cleaning inorganic depositions, e.g. sulfates or carbonates
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D1/00—Detergent compositions based essentially on surface-active compounds; Use of these compounds as a detergent
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F3/00—Brightening metals by chemical means
- C23F3/04—Heavy metals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/32115—Planarisation
- H01L21/3212—Planarisation by chemical mechanical polishing [CMP]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003342530A JP4608196B2 (ja) | 2003-09-30 | 2003-09-30 | 研磨用組成物 |
JP2003342531 | 2003-09-30 | ||
JP2003352952A JP2005116987A (ja) | 2003-10-10 | 2003-10-10 | 研磨用組成物 |
JP2003394593A JP4759219B2 (ja) | 2003-11-25 | 2003-11-25 | 研磨用組成物 |
JP2003396171A JP4406554B2 (ja) | 2003-09-30 | 2003-11-26 | 研磨用組成物 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG110211A1 true SG110211A1 (en) | 2005-04-28 |
Family
ID=34317736
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200406144A SG110211A1 (en) | 2003-09-30 | 2004-09-30 | Polishing composition |
Country Status (7)
Country | Link |
---|---|
US (1) | US7485162B2 (ko) |
EP (3) | EP2418260B1 (ko) |
KR (3) | KR101110707B1 (ko) |
CN (1) | CN100393833C (ko) |
AT (1) | ATE538188T1 (ko) |
SG (1) | SG110211A1 (ko) |
TW (1) | TWI347969B (ko) |
Families Citing this family (44)
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DE602004026454D1 (de) * | 2003-09-30 | 2010-05-20 | Fujimi Inc | Polierzusammensetzung und polierverfahren |
JP2005268666A (ja) * | 2004-03-19 | 2005-09-29 | Fujimi Inc | 研磨用組成物 |
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JP4644434B2 (ja) * | 2004-03-24 | 2011-03-02 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
JP2006086462A (ja) * | 2004-09-17 | 2006-03-30 | Fujimi Inc | 研磨用組成物およびそれを用いた配線構造体の製造法 |
JP2006135072A (ja) * | 2004-11-05 | 2006-05-25 | Fujimi Inc | 研磨方法 |
US7238614B2 (en) * | 2004-11-10 | 2007-07-03 | Inopla Inc. | Methods for fabricating one or more metal damascene structures in a semiconductor wafer |
JP2006179845A (ja) * | 2004-11-26 | 2006-07-06 | Fuji Photo Film Co Ltd | 金属用研磨液及び研磨方法 |
US7790618B2 (en) * | 2004-12-22 | 2010-09-07 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Selective slurry for chemical mechanical polishing |
US7345370B2 (en) * | 2005-01-12 | 2008-03-18 | International Business Machines Corporation | Wiring patterns formed by selective metal plating |
US20060213868A1 (en) * | 2005-03-23 | 2006-09-28 | Siddiqui Junaid A | Low-dishing composition and method for chemical-mechanical planarization with branched-alkylphenol-substituted benzotriazole |
CN102863943B (zh) * | 2005-08-30 | 2015-03-25 | 花王株式会社 | 硬盘用基板用研磨液组合物、基板的研磨方法和制造方法 |
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TWI397577B (zh) * | 2005-09-02 | 2013-06-01 | Fujimi Inc | 研磨用組成物 |
JP5345397B2 (ja) * | 2005-09-26 | 2013-11-20 | プラナー ソリューションズ エルエルシー | 化学機械研磨応用で使用するための超純度コロイド状シリカ |
JP2007103514A (ja) * | 2005-09-30 | 2007-04-19 | Fujimi Inc | 研磨用組成物及び研磨方法 |
TW200738852A (en) * | 2005-12-21 | 2007-10-16 | Asahi Glass Co Ltd | Polishing composition, polishing method, and method for forming copper wiring for semiconductor integrated circuit |
EP1984467B1 (en) * | 2006-02-03 | 2012-03-21 | Freescale Semiconductor, Inc. | Barrier slurry compositions and barrier cmp methods |
US7842192B2 (en) * | 2006-02-08 | 2010-11-30 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Multi-component barrier polishing solution |
WO2007114814A1 (en) * | 2006-03-31 | 2007-10-11 | Cabot Microelectronics Corporation | Polymeric inhibitors for enhanced planarization |
SG139699A1 (en) * | 2006-08-02 | 2008-02-29 | Fujimi Inc | Polishing composition and polishing process |
CN101368070A (zh) * | 2007-08-15 | 2009-02-18 | 江苏海迅实业集团股份有限公司 | 微晶玻璃加工用的纳米二氧化硅磨料抛光液 |
JP5329786B2 (ja) * | 2007-08-31 | 2013-10-30 | 株式会社東芝 | 研磨液および半導体装置の製造方法 |
US7955520B2 (en) * | 2007-11-27 | 2011-06-07 | Cabot Microelectronics Corporation | Copper-passivating CMP compositions and methods |
JP2009164186A (ja) * | 2007-12-28 | 2009-07-23 | Fujimi Inc | 研磨用組成物 |
JP2009164188A (ja) * | 2007-12-28 | 2009-07-23 | Fujimi Inc | 研磨用組成物 |
US20100193728A1 (en) * | 2008-08-05 | 2010-08-05 | Song-Yuan Chang | Chemical Mechanical Polishing Composition |
JP5587620B2 (ja) * | 2010-01-25 | 2014-09-10 | 株式会社フジミインコーポレーテッド | 研磨用組成物及びそれを用いた研磨方法 |
CN102533118B (zh) * | 2010-12-10 | 2015-05-27 | 安集微电子(上海)有限公司 | 一种化学机械抛光浆料 |
CN103298903B (zh) * | 2011-01-11 | 2015-11-25 | 嘉柏微电子材料股份公司 | 金属钝化的化学机械抛光组合物及方法 |
EP2502969A1 (en) * | 2011-03-22 | 2012-09-26 | Basf Se | A chemical mechanical polishing (cmp) composition comprising two types of corrosion inhibitors |
US8790160B2 (en) * | 2011-04-28 | 2014-07-29 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing composition and method for polishing phase change alloys |
US8309468B1 (en) * | 2011-04-28 | 2012-11-13 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing composition and method for polishing germanium-antimony-tellurium alloys |
KR101144674B1 (ko) * | 2011-07-14 | 2012-05-24 | 에스엔티코리아 주식회사 | 웨이퍼 두께 측정장치 |
US8865013B2 (en) * | 2011-08-15 | 2014-10-21 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Method for chemical mechanical polishing tungsten |
JP6132315B2 (ja) * | 2012-04-18 | 2017-05-24 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
KR102154250B1 (ko) | 2012-11-02 | 2020-09-09 | 가부시키가이샤 후지미인코퍼레이티드 | 연마용 조성물 |
CN103865400A (zh) * | 2012-12-10 | 2014-06-18 | 安集微电子(上海)有限公司 | 一种磷酸酯表面活性剂在自停止抛光中的应用 |
US9012327B2 (en) | 2013-09-18 | 2015-04-21 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Low defect chemical mechanical polishing composition |
JP6400897B2 (ja) * | 2013-11-06 | 2018-10-03 | ニッタ・ハース株式会社 | 研磨組成物 |
US20170183537A1 (en) * | 2014-08-26 | 2017-06-29 | K.C. Tech Co., Ltd | Polishing slurry composition |
US10570313B2 (en) * | 2015-02-12 | 2020-02-25 | Versum Materials Us, Llc | Dishing reducing in tungsten chemical mechanical polishing |
CN111356747A (zh) * | 2017-11-22 | 2020-06-30 | 巴斯夫欧洲公司 | 化学机械抛光组合物 |
US10699944B2 (en) * | 2018-09-28 | 2020-06-30 | Taiwan Semiconductor Manufacturing Company, Ltd. | Surface modification layer for conductive feature formation |
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-
2004
- 2004-09-29 US US10/952,672 patent/US7485162B2/en active Active
- 2004-09-29 TW TW093129391A patent/TWI347969B/zh not_active IP Right Cessation
- 2004-09-30 EP EP11186467A patent/EP2418260B1/en not_active Not-in-force
- 2004-09-30 KR KR1020040077822A patent/KR101110707B1/ko not_active IP Right Cessation
- 2004-09-30 EP EP11186466A patent/EP2418259B1/en not_active Not-in-force
- 2004-09-30 SG SG200406144A patent/SG110211A1/en unknown
- 2004-09-30 CN CNB2004100834419A patent/CN100393833C/zh not_active Expired - Fee Related
- 2004-09-30 EP EP04023363A patent/EP1520892B1/en not_active Not-in-force
- 2004-09-30 AT AT04023363T patent/ATE538188T1/de active
-
2011
- 2011-06-14 KR KR1020110057408A patent/KR101216514B1/ko not_active IP Right Cessation
- 2011-06-14 KR KR1020110057412A patent/KR101074875B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR101074875B1 (ko) | 2011-10-19 |
KR20110084481A (ko) | 2011-07-25 |
KR101216514B1 (ko) | 2012-12-31 |
KR101110707B1 (ko) | 2012-04-16 |
KR20050031992A (ko) | 2005-04-06 |
TW200532007A (en) | 2005-10-01 |
ATE538188T1 (de) | 2012-01-15 |
EP2418259A1 (en) | 2012-02-15 |
EP2418260B1 (en) | 2013-02-13 |
TWI347969B (en) | 2011-09-01 |
EP1520892A3 (en) | 2006-06-21 |
CN100393833C (zh) | 2008-06-11 |
US7485162B2 (en) | 2009-02-03 |
EP1520892A2 (en) | 2005-04-06 |
EP2418260A1 (en) | 2012-02-15 |
CN1616575A (zh) | 2005-05-18 |
KR20110084482A (ko) | 2011-07-25 |
EP2418259B1 (en) | 2013-02-13 |
US20050108949A1 (en) | 2005-05-26 |
EP1520892B1 (en) | 2011-12-21 |
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