NL8500218A - Halfgeleiderinrichting met tweedimensionaal ladingsdragergas. - Google Patents
Halfgeleiderinrichting met tweedimensionaal ladingsdragergas. Download PDFInfo
- Publication number
- NL8500218A NL8500218A NL8500218A NL8500218A NL8500218A NL 8500218 A NL8500218 A NL 8500218A NL 8500218 A NL8500218 A NL 8500218A NL 8500218 A NL8500218 A NL 8500218A NL 8500218 A NL8500218 A NL 8500218A
- Authority
- NL
- Netherlands
- Prior art keywords
- layer
- semiconductor layer
- semiconductor
- semiconductor device
- mesa
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims description 117
- 239000002800 charge carrier Substances 0.000 claims description 47
- 239000007789 gas Substances 0.000 claims description 36
- 125000005842 heteroatom Chemical group 0.000 claims description 21
- 239000000463 material Substances 0.000 claims description 17
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 claims description 15
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 15
- 230000007704 transition Effects 0.000 claims description 13
- 239000000758 substrate Substances 0.000 claims description 8
- MDPILPRLPQYEEN-UHFFFAOYSA-N aluminium arsenide Chemical compound [As]#[Al] MDPILPRLPQYEEN-UHFFFAOYSA-N 0.000 claims description 6
- 238000009792 diffusion process Methods 0.000 claims description 3
- 239000002131 composite material Substances 0.000 claims description 2
- 239000004020 conductor Substances 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 135
- 230000005533 two-dimensional electron gas Effects 0.000 description 13
- 150000002500 ions Chemical class 0.000 description 7
- 125000004429 atom Chemical group 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 239000004047 hole gas Substances 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 239000000370 acceptor Substances 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 239000006229 carbon black Substances 0.000 description 2
- 230000008030 elimination Effects 0.000 description 2
- 238000003379 elimination reaction Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 229910052732 germanium Inorganic materials 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229910017401 Au—Ge Inorganic materials 0.000 description 1
- 229910004613 CdTe Inorganic materials 0.000 description 1
- 229910005542 GaSb Inorganic materials 0.000 description 1
- 229910000673 Indium arsenide Inorganic materials 0.000 description 1
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000012190 activator Substances 0.000 description 1
- 230000001154 acute effect Effects 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 230000000423 heterosexual effect Effects 0.000 description 1
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 1
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 230000004899 motility Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000010902 straw Substances 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/778—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface
- H01L29/7786—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with direct single heterostructure, i.e. with wide bandgap layer formed on top of active layer, e.g. direct single heterostructure MIS-like HEMT
- H01L29/7787—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with direct single heterostructure, i.e. with wide bandgap layer formed on top of active layer, e.g. direct single heterostructure MIS-like HEMT with wide bandgap charge-carrier supplying layer, e.g. direct single heterostructure MODFET
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0657—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/7606—Transistor-like structures, e.g. hot electron transistor [HET]; metal base transistor [MBT]
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Junction Field-Effect Transistors (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8500218A NL8500218A (nl) | 1985-01-28 | 1985-01-28 | Halfgeleiderinrichting met tweedimensionaal ladingsdragergas. |
DE8585202110T DE3574434D1 (en) | 1985-01-28 | 1985-12-19 | Semiconductor device with bidimensional charge carrier gas |
EP85202110A EP0191201B1 (en) | 1985-01-28 | 1985-12-19 | Semiconductor device with bidimensional charge carrier gas |
US06/819,650 US4677457A (en) | 1985-01-28 | 1986-01-17 | Semiconductor device with bidimensional charge carrier gas |
JP61013959A JPH07123164B2 (ja) | 1985-01-28 | 1986-01-27 | 半導体装置 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8500218A NL8500218A (nl) | 1985-01-28 | 1985-01-28 | Halfgeleiderinrichting met tweedimensionaal ladingsdragergas. |
NL8500218 | 1985-01-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL8500218A true NL8500218A (nl) | 1986-08-18 |
Family
ID=19845433
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL8500218A NL8500218A (nl) | 1985-01-28 | 1985-01-28 | Halfgeleiderinrichting met tweedimensionaal ladingsdragergas. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4677457A (ja) |
EP (1) | EP0191201B1 (ja) |
JP (1) | JPH07123164B2 (ja) |
DE (1) | DE3574434D1 (ja) |
NL (1) | NL8500218A (ja) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3687049T2 (de) * | 1985-04-05 | 1993-03-25 | Nippon Electric Co | Bipolare eigenschaften aufweisender transistor mit heterouebergang. |
NL8703119A (nl) * | 1987-12-23 | 1989-07-17 | Philips Nv | Element voor toepassing in een elektrische schakeling. |
US5381027A (en) * | 1988-01-26 | 1995-01-10 | Hitachi, Ltd. | Semiconductor device having a heterojunction and a two dimensional gas as an active layer |
US4839310A (en) * | 1988-01-27 | 1989-06-13 | Massachusetts Institute Of Technology | High mobility transistor with opposed-gates |
EP0366861A1 (en) * | 1988-10-20 | 1990-05-09 | International Business Machines Corporation | Semiconductor ballistic transistor |
KR910013568A (ko) * | 1989-12-31 | 1991-08-08 | 김광호 | 화합물 반도체 장치 및 그 제조방법 |
EP0517842A1 (en) * | 1990-02-26 | 1992-12-16 | Symetrix Corporation | Electronic devices and methods of constructing and utilizing same |
NL9000698A (nl) * | 1990-03-24 | 1991-10-16 | Koninkl Philips Electronics Nv | Element voor toepassing in een elektrische schakeling. |
JP2626220B2 (ja) * | 1990-09-17 | 1997-07-02 | 日本電気株式会社 | 電界効果トランジスタ及びその製造方法 |
DE4303598C2 (de) * | 1993-02-08 | 1999-04-29 | Marcus Dr Besson | Halbleiterbauelement, insbesondere Feldeffekttransistor mit vergrabenem Gate |
GB2279806B (en) * | 1993-07-05 | 1997-05-21 | Toshiba Cambridge Res Center | Semiconductor device and method of making same |
TW354411B (en) * | 1996-09-27 | 1999-03-11 | Sanyo Electric Co | Semiconductor device and its manufacturing process |
US7105868B2 (en) * | 2002-06-24 | 2006-09-12 | Cermet, Inc. | High-electron mobility transistor with zinc oxide |
US7692298B2 (en) * | 2004-09-30 | 2010-04-06 | Sanken Electric Co., Ltd. | III-V nitride semiconductor device comprising a concave shottky contact and an ohmic contact |
US7432526B2 (en) | 2005-12-20 | 2008-10-07 | Palo Alto Research Center Incorporated | Surface-passivated zinc-oxide based sensor |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2504732A1 (fr) * | 1981-04-27 | 1982-10-29 | Thomson Csf | Transistor tunnel a double heterojonction |
JPS5853863A (ja) * | 1981-09-26 | 1983-03-30 | Fujitsu Ltd | 半導体装置の製造方法 |
JPS5891682A (ja) * | 1981-11-27 | 1983-05-31 | Hitachi Ltd | 半導体装置 |
JPS58147173A (ja) * | 1982-02-26 | 1983-09-01 | Fujitsu Ltd | 半導体装置 |
US4538165A (en) * | 1982-03-08 | 1985-08-27 | International Business Machines Corporation | FET With heterojunction induced channel |
JPS58162070A (ja) * | 1982-03-19 | 1983-09-26 | Matsushita Electric Ind Co Ltd | 電界効果トランジスタ |
JPS5932174A (ja) * | 1982-08-16 | 1984-02-21 | Toshiba Corp | 電界効果トランジスタの製造方法 |
FR2543739B1 (fr) * | 1983-03-30 | 1986-04-18 | Radiotechnique Compelec | Procede de realisation d'un transistor bipolaire haute tension |
JPS59184573A (ja) * | 1983-04-05 | 1984-10-19 | Nec Corp | 電界効果トランジスタ |
JPS59218778A (ja) * | 1983-05-27 | 1984-12-10 | Fujitsu Ltd | 半導体装置及びその製造方法 |
US4550331A (en) * | 1983-07-29 | 1985-10-29 | Rockwell International Corporation | Multilayer modulation doped heterostructure charge coupled device |
-
1985
- 1985-01-28 NL NL8500218A patent/NL8500218A/nl not_active Application Discontinuation
- 1985-12-19 EP EP85202110A patent/EP0191201B1/en not_active Expired
- 1985-12-19 DE DE8585202110T patent/DE3574434D1/de not_active Expired
-
1986
- 1986-01-17 US US06/819,650 patent/US4677457A/en not_active Expired - Fee Related
- 1986-01-27 JP JP61013959A patent/JPH07123164B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US4677457A (en) | 1987-06-30 |
EP0191201B1 (en) | 1989-11-23 |
JPH07123164B2 (ja) | 1995-12-25 |
EP0191201A1 (en) | 1986-08-20 |
DE3574434D1 (en) | 1989-12-28 |
JPS61177782A (ja) | 1986-08-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A1B | A search report has been drawn up | ||
BV | The patent application has lapsed |