KR970053214A - 다중 레벨 스택 집적된 회러칩 어셈블리 - Google Patents
다중 레벨 스택 집적된 회러칩 어셈블리 Download PDFInfo
- Publication number
- KR970053214A KR970053214A KR1019960082426A KR19960082426A KR970053214A KR 970053214 A KR970053214 A KR 970053214A KR 1019960082426 A KR1019960082426 A KR 1019960082426A KR 19960082426 A KR19960082426 A KR 19960082426A KR 970053214 A KR970053214 A KR 970053214A
- Authority
- KR
- South Korea
- Prior art keywords
- integrated circuit
- major surface
- wiring pad
- circuit chip
- chip assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H10W72/071—
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- H10W90/00—
-
- H10W90/20—
-
- H10W90/291—
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- H10W90/722—
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- H10W90/724—
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- H10W90/732—
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- H10W90/752—
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- H10W90/754—
Landscapes
- Wire Bonding (AREA)
- Combinations Of Printed Boards (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US58022095A | 1995-12-28 | 1995-12-28 | |
| US580,220 | 1995-12-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR970053214A true KR970053214A (ko) | 1997-07-29 |
Family
ID=24320199
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019960082426A Ceased KR970053214A (ko) | 1995-12-28 | 1996-12-28 | 다중 레벨 스택 집적된 회러칩 어셈블리 |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0782191A2 (enExample) |
| JP (1) | JPH09186289A (enExample) |
| KR (1) | KR970053214A (enExample) |
| TW (1) | TW315515B (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100379608B1 (ko) * | 1999-02-17 | 2003-04-10 | 샤프 가부시키가이샤 | 반도체장치 및 그의 제조방법 |
| KR100386995B1 (ko) * | 2000-01-17 | 2003-06-12 | 미쓰비시덴키 가부시키가이샤 | 반도체 장치 및 그 배선 방법 |
| KR100464561B1 (ko) * | 2000-04-11 | 2004-12-31 | 앰코 테크놀로지 코리아 주식회사 | 반도체 패키지 및 이것의 제조방법 |
| US8907383B2 (en) | 2012-12-20 | 2014-12-09 | SK Hynix Inc. | Stack packages having token ring loops |
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0890989A4 (en) | 1997-01-24 | 2006-11-02 | Rohm Co Ltd | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD |
| DE19743264C2 (de) * | 1997-09-30 | 2002-01-17 | Infineon Technologies Ag | Verfahren zur Herstellung einer Emulationsschaltkreisanordnung sowie Emulationsschaltkreisanordnung mit zwei integrierten Schaltkreisen |
| US6413797B2 (en) | 1997-10-09 | 2002-07-02 | Rohm Co., Ltd. | Semiconductor device and method for making the same |
| CA2218307C (en) * | 1997-10-10 | 2006-01-03 | Gennum Corporation | Three dimensional packaging configuration for multi-chip module assembly |
| JP2000164796A (ja) * | 1998-11-27 | 2000-06-16 | Nec Corp | マルチチップモジュール |
| JP3512657B2 (ja) * | 1998-12-22 | 2004-03-31 | シャープ株式会社 | 半導体装置 |
| JP2001044358A (ja) * | 1999-07-28 | 2001-02-16 | Mitsubishi Electric Corp | 半導体装置およびその製造方法 |
| US6605875B2 (en) * | 1999-12-30 | 2003-08-12 | Intel Corporation | Integrated circuit die having bond pads near adjacent sides to allow stacking of dice without regard to dice size |
| US6344401B1 (en) * | 2000-03-09 | 2002-02-05 | Atmel Corporation | Method of forming a stacked-die integrated circuit chip package on a water level |
| JP2002176137A (ja) | 2000-09-28 | 2002-06-21 | Toshiba Corp | 積層型半導体デバイス |
| KR100537835B1 (ko) * | 2000-10-19 | 2005-12-19 | 앰코 테크놀로지 코리아 주식회사 | 반도체 패키지 제조방법 |
| EP1332654B1 (en) | 2000-11-10 | 2005-01-12 | Unitive Electronics, Inc. | Methods of positioning components using liquid prime movers and related structures |
| US6863209B2 (en) | 2000-12-15 | 2005-03-08 | Unitivie International Limited | Low temperature methods of bonding components |
| JP3558595B2 (ja) * | 2000-12-22 | 2004-08-25 | 松下電器産業株式会社 | 半導体チップ,半導体チップ群及びマルチチップモジュール |
| US6762122B2 (en) | 2001-09-27 | 2004-07-13 | Unitivie International Limited | Methods of forming metallurgy structures for wire and solder bonding |
| EP1367646A1 (fr) * | 2002-05-23 | 2003-12-03 | Valtronic S.A. | Module électronique |
| US7547623B2 (en) | 2002-06-25 | 2009-06-16 | Unitive International Limited | Methods of forming lead free solder bumps |
| AU2003256360A1 (en) | 2002-06-25 | 2004-01-06 | Unitive International Limited | Methods of forming electronic structures including conductive shunt layers and related structures |
| US7531898B2 (en) | 2002-06-25 | 2009-05-12 | Unitive International Limited | Non-Circular via holes for bumping pads and related structures |
| TWI225899B (en) | 2003-02-18 | 2005-01-01 | Unitive Semiconductor Taiwan C | Etching solution and method for manufacturing conductive bump using the etching solution to selectively remove barrier layer |
| JP4406300B2 (ja) * | 2004-02-13 | 2010-01-27 | 株式会社東芝 | 半導体装置及びその製造方法 |
| JP4205613B2 (ja) * | 2004-03-01 | 2009-01-07 | エルピーダメモリ株式会社 | 半導体装置 |
| US7427557B2 (en) | 2004-03-10 | 2008-09-23 | Unitive International Limited | Methods of forming bumps using barrier layers as etch masks |
| JP4061551B2 (ja) * | 2004-03-24 | 2008-03-19 | サンケン電気株式会社 | 半導体装置 |
| TW200603698A (en) | 2004-04-13 | 2006-01-16 | Unitive International Ltd | Methods of forming solder bumps on exposed metal pads and related structures |
| US7700409B2 (en) | 2004-05-24 | 2010-04-20 | Honeywell International Inc. | Method and system for stacking integrated circuits |
| US7863720B2 (en) | 2004-05-24 | 2011-01-04 | Honeywell International Inc. | Method and system for stacking integrated circuits |
| FR2873853B1 (fr) * | 2004-07-27 | 2006-12-15 | St Microelectronics Sa | Dispositif electronique comprenant plusieurs plaquettes de circuits empilees et procede de realisation d'un tel dispositif |
| JP4509052B2 (ja) | 2005-03-29 | 2010-07-21 | 三洋電機株式会社 | 回路装置 |
| SG130055A1 (en) | 2005-08-19 | 2007-03-20 | Micron Technology Inc | Microelectronic devices, stacked microelectronic devices, and methods for manufacturing microelectronic devices |
| US7674701B2 (en) | 2006-02-08 | 2010-03-09 | Amkor Technology, Inc. | Methods of forming metal layers using multi-layer lift-off patterns |
| US7932615B2 (en) | 2006-02-08 | 2011-04-26 | Amkor Technology, Inc. | Electronic devices including solder bumps on compliant dielectric layers |
| JP5559452B2 (ja) | 2006-12-20 | 2014-07-23 | 富士通セミコンダクター株式会社 | 半導体装置及びその製造方法 |
| KR102190382B1 (ko) | 2012-12-20 | 2020-12-11 | 삼성전자주식회사 | 반도체 패키지 |
| TWI799312B (zh) * | 2022-07-05 | 2023-04-11 | 瑞昱半導體股份有限公司 | 輸出入埠電路及其晶片 |
-
1996
- 1996-12-09 JP JP8328260A patent/JPH09186289A/ja active Pending
- 1996-12-10 EP EP96308958A patent/EP0782191A2/en not_active Withdrawn
- 1996-12-11 TW TW085115320A patent/TW315515B/zh active
- 1996-12-28 KR KR1019960082426A patent/KR970053214A/ko not_active Ceased
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100379608B1 (ko) * | 1999-02-17 | 2003-04-10 | 샤프 가부시키가이샤 | 반도체장치 및 그의 제조방법 |
| US7276437B2 (en) | 1999-02-17 | 2007-10-02 | Sharp Kabushiki Kaisha | Semiconductor device and manufacturing method thereof |
| US7528011B2 (en) | 1999-02-17 | 2009-05-05 | Sharp Kabushiki Kaisha | Semiconductor device and manufacturing method thereof |
| KR100386995B1 (ko) * | 2000-01-17 | 2003-06-12 | 미쓰비시덴키 가부시키가이샤 | 반도체 장치 및 그 배선 방법 |
| US7071574B1 (en) | 2000-01-17 | 2006-07-04 | Renesas Technology Corp. | Semiconductor device and its wiring method |
| US7288837B2 (en) | 2000-01-17 | 2007-10-30 | Renesas Technology Corp. | Semiconductor device and its writing method |
| US7547963B2 (en) | 2000-01-17 | 2009-06-16 | Renesas Technology Corp. | Semiconductor device and its wiring method |
| KR100464561B1 (ko) * | 2000-04-11 | 2004-12-31 | 앰코 테크놀로지 코리아 주식회사 | 반도체 패키지 및 이것의 제조방법 |
| US8907383B2 (en) | 2012-12-20 | 2014-12-09 | SK Hynix Inc. | Stack packages having token ring loops |
Also Published As
| Publication number | Publication date |
|---|---|
| TW315515B (enExample) | 1997-09-11 |
| JPH09186289A (ja) | 1997-07-15 |
| EP0782191A2 (en) | 1997-07-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |