KR960019778A - 액정표시장치용 박막 트랜지스터 및 그 제조방법 - Google Patents

액정표시장치용 박막 트랜지스터 및 그 제조방법 Download PDF

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KR960019778A
KR960019778A KR1019940031941A KR19940031941A KR960019778A KR 960019778 A KR960019778 A KR 960019778A KR 1019940031941 A KR1019940031941 A KR 1019940031941A KR 19940031941 A KR19940031941 A KR 19940031941A KR 960019778 A KR960019778 A KR 960019778A
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South Korea
Prior art keywords
thin film
film transistor
gate
forming
high concentration
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KR1019940031941A
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English (en)
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KR0151876B1 (ko
Inventor
황성연
남동현
김태곤
서영우
염선민
Original Assignee
엄길용
오리온전기 주식회사
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Priority to KR1019940031941A priority Critical patent/KR0151876B1/ko
Priority to JP8518610A priority patent/JP2835471B2/ja
Priority to EP95930048A priority patent/EP0741911A1/en
Priority to PCT/KR1995/000112 priority patent/WO1996017385A1/en
Publication of KR960019778A publication Critical patent/KR960019778A/ko
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Publication of KR0151876B1 publication Critical patent/KR0151876B1/ko

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/49Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
    • H01L29/4908Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET for thin film semiconductor, e.g. gate of TFT
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/78645Thin film transistors, i.e. transistors with a channel being at least partly a thin film with multiple gate
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/1368Active matrix addressed cells in which the switching element is a three-electrode device

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Thin Film Transistor (AREA)
  • Liquid Crystal (AREA)

Abstract

본 발명은 액정표시장치용 박막 트랜지스터 및 그 제조방법에 관한 것으로서, 다결정실리콘으로 형성되는 다중 게이트전극들중에 소오스/드레인전극과 인접하는 양측단의 게이트전극과 게이트 라인의 사이에 전압 강하를 위한 저항첼르 고농도 불순물 이온주입 공정시 이온주입을 방지하여 진성이나 저농도 다결정실리콘층이 되도록 하여 형성하였으므로, 게이트전압이 저항체에 의해 강하되어 소오스/드레인전극에서 인가되는 전압에 의한 누설잔류가 감소되어 소자동작의 신뢰성을 향상시킬 수 있다.

Description

액정표시장치용 박막 트랜지스터 및 그 제조방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제2도는 본 발명에 따른 액정표시장치용 박막 트랜지스터를 설명하기 위한 레이아웃도.

Claims (8)

  1. 투명기판상에 형성되어 있는 반도체층 패턴과, 상기 구조의 전표면에 형성되어 있는 게이트절연막과, 상기 반도체 패턴에서 채널로 예정되어 있는 부분들 상측의 게이트절연막상에 형성되어 있으며 일측이 게이트라인과 접촉되는 다중 게이트전극과, 상기 다중 게이트전극들 중에서 양단측의 게이트 전극과 게이트 라인의 사이에 형성되어 있는 저항체들과, 상기 다중 게이트전극들 양측 하부에 반도체층 패턴에 형성되어 있는 고농도 불순물층과, 상기 고농도 불순물층의 일측과 접촉되어 데이타 라인과 연결되는 소오스 전극과, 상기 고농도 불순물층의 타측과 접척되어 화소전극과 연결되는 드레인전극을 구비하는 액정표시장치용 박막 트랜지스터.
  2. 제1항에 있어서, 상기 투명기판이 석영 또는 유리재질로 형성되어 있는 것을 특징으로 하는 액정표시장치용 박막 트랜지스터.
  3. 제1항에 있어서, 상기 반도체층 패턴을 다결정실리콘으로 형성되어 있는 것을 특징으로 하는 액정표시장치용 박막 트랜지스터.
  4. 제1항에 있어서, 상기 게이트전극을 진성이나 저농도 불순물을 포함하는 다결정실리콘층으로 형성하는 것을 특징으로 하는 액정표시장치용 박막 트랜지스터.
  5. 제1항에 있어서, 상기 소오스 및 드레인전극인 Ti, Cr 또는 Al들중 어느 하나로 형성되는 것을 특징으로 하는 액정표시장치용 박막 트랜지스터.
  6. 제1항에 있어서, 상기 게이트절연막이 산화막으로 형성되어 있는 것을 특징으로 하는 액정표시장치용 박막 트랜지스터.
  7. 제1항에 있어서, 상기 고농도 불순물층이 N 또는 P형인 것을 특징으로 하는 액정표시장치용 박막 트랜지스터.
  8. 투명기판상에 반도체층 패턴을 형성하는 공정과, 상기 구조의 전표면에 게이트절연막을 형성하는 공정과, 상기 반도체층 패턴의 상측을 가로지르는 다중 게이트전극들을 형성하는 공정과, 상기 게이트전극 양측 하부의 반도체층 패턴에 고농도 불순물층을 형성하는 공정과, 상기 다중 게이트전극에 불순물 이온을 주입하되 양측단에 위치한 게이트전극에서 게이트 라인과의 사이에는 이온주입이 되지 않는 저항체를 형성하는 공정과, 상기 구조의 전표면에 필드 산화막을 형성하는 공정과, 상기 양단의 고농도 불순물층을 노출시키는 공정과, 상기 노출되어 있는 고농도 불순물층과 접촉되는 소오스/드레인전극을 형성하는 공정을 구비하는 액정표시장치용 박막 트랜지스터의 제조방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019940031941A 1994-11-30 1994-11-30 액정표시장치용 박막 트랜지스터 및 그 제조방법 KR0151876B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1019940031941A KR0151876B1 (ko) 1994-11-30 1994-11-30 액정표시장치용 박막 트랜지스터 및 그 제조방법
JP8518610A JP2835471B2 (ja) 1994-11-30 1995-08-31 液晶表示装置用薄膜トランジスタおよびその製造方法
EP95930048A EP0741911A1 (en) 1994-11-30 1995-08-31 Thin film transistor for liquid crystal display and method for fabricating the same
PCT/KR1995/000112 WO1996017385A1 (en) 1994-11-30 1995-08-31 Thin film transistor for liquid crystal display and method for fabricating the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019940031941A KR0151876B1 (ko) 1994-11-30 1994-11-30 액정표시장치용 박막 트랜지스터 및 그 제조방법

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KR960019778A true KR960019778A (ko) 1996-06-17
KR0151876B1 KR0151876B1 (ko) 1998-10-01

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KR1019940031941A KR0151876B1 (ko) 1994-11-30 1994-11-30 액정표시장치용 박막 트랜지스터 및 그 제조방법

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EP (1) EP0741911A1 (ko)
JP (1) JP2835471B2 (ko)
KR (1) KR0151876B1 (ko)
WO (1) WO1996017385A1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100769433B1 (ko) * 2006-12-04 2007-10-22 삼성에스디아이 주식회사 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를구비하는 평판 표시 장치

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2358083B (en) 2000-01-07 2004-02-18 Seiko Epson Corp Thin-film transistor and its manufacturing method
GB2358082B (en) 2000-01-07 2003-11-12 Seiko Epson Corp Semiconductor transistor
GB2358084B (en) * 2000-01-07 2004-02-18 Seiko Epson Corp Semiconductor transistor

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62229873A (ja) * 1986-03-29 1987-10-08 Hitachi Ltd 薄膜半導体装置の製造方法
JP2653099B2 (ja) * 1988-05-17 1997-09-10 セイコーエプソン株式会社 アクティブマトリクスパネル,投写型表示装置及びビューファインダー
US5179345A (en) * 1989-12-13 1993-01-12 International Business Machines Corporation Method and apparatus for analog testing
EP0731832B1 (en) * 1993-12-03 2001-09-05 Solutia Inc. Process for producing granular alkali metal nitrilotriacetate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100769433B1 (ko) * 2006-12-04 2007-10-22 삼성에스디아이 주식회사 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를구비하는 평판 표시 장치

Also Published As

Publication number Publication date
JPH09502056A (ja) 1997-02-25
KR0151876B1 (ko) 1998-10-01
JP2835471B2 (ja) 1998-12-14
EP0741911A1 (en) 1996-11-13
WO1996017385A1 (en) 1996-06-06

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