KR930014992A - 하나이상의 메모리 셀을 구비한 반도체 장치 - Google Patents
하나이상의 메모리 셀을 구비한 반도체 장치 Download PDFInfo
- Publication number
- KR930014992A KR930014992A KR1019920024037A KR920024037A KR930014992A KR 930014992 A KR930014992 A KR 930014992A KR 1019920024037 A KR1019920024037 A KR 1019920024037A KR 920024037 A KR920024037 A KR 920024037A KR 930014992 A KR930014992 A KR 930014992A
- Authority
- KR
- South Korea
- Prior art keywords
- memory cells
- line
- semiconductor device
- collector
- emitter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/40—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00 with at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of IGFETs with BJTs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/10—DRAM devices comprising bipolar components
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Semiconductor Memories (AREA)
- Static Random-Access Memory (AREA)
- Read Only Memory (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP91203305 | 1991-12-16 | ||
| NL91203305.7 | 1991-12-16 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR930014992A true KR930014992A (ko) | 1993-07-23 |
Family
ID=8208074
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019920024037A Withdrawn KR930014992A (ko) | 1991-12-16 | 1992-12-12 | 하나이상의 메모리 셀을 구비한 반도체 장치 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US5329481A (enExample) |
| EP (1) | EP0547673B1 (enExample) |
| JP (1) | JPH05251670A (enExample) |
| KR (1) | KR930014992A (enExample) |
| DE (1) | DE69223495D1 (enExample) |
| TW (1) | TW289168B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100692398B1 (ko) * | 2004-03-24 | 2007-03-09 | 롬 앤드 하스 캄파니 | 전계 프로그램 가능 저장소자를 갖는 메모리 셀 및 이를동작하는 방법 |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6150687A (en) | 1997-07-08 | 2000-11-21 | Micron Technology, Inc. | Memory cell having a vertical transistor with buried source/drain and dual gates |
| US6066869A (en) | 1997-10-06 | 2000-05-23 | Micron Technology, Inc. | Circuit and method for a folded bit line memory cell with vertical transistor and trench capacitor |
| US6528837B2 (en) * | 1997-10-06 | 2003-03-04 | Micron Technology, Inc. | Circuit and method for an open bit line memory cell with a vertical transistor and trench plate trench capacitor |
| FR2770019B1 (fr) * | 1997-10-20 | 2000-01-28 | Sgs Thomson Microelectronics | Point memoire mos |
| US6025225A (en) | 1998-01-22 | 2000-02-15 | Micron Technology, Inc. | Circuits with a trench capacitor having micro-roughened semiconductor surfaces and methods for forming the same |
| US5963469A (en) | 1998-02-24 | 1999-10-05 | Micron Technology, Inc. | Vertical bipolar read access for low voltage memory cell |
| US6124729A (en) | 1998-02-27 | 2000-09-26 | Micron Technology, Inc. | Field programmable logic arrays with vertical transistors |
| US6043527A (en) | 1998-04-14 | 2000-03-28 | Micron Technology, Inc. | Circuits and methods for a memory cell with a trench plate trench capacitor and a vertical bipolar read device |
| US6208164B1 (en) | 1998-08-04 | 2001-03-27 | Micron Technology, Inc. | Programmable logic array with vertical transistors |
| US7224024B2 (en) * | 2002-08-29 | 2007-05-29 | Micron Technology, Inc. | Single transistor vertical memory gain cell |
| US6838723B2 (en) | 2002-08-29 | 2005-01-04 | Micron Technology, Inc. | Merged MOS-bipolar capacitor memory cell |
| US7030436B2 (en) | 2002-12-04 | 2006-04-18 | Micron Technology, Inc. | Embedded DRAM gain memory cell having MOS transistor body provided with a bi-polar transistor charge injecting means |
| US6956256B2 (en) * | 2003-03-04 | 2005-10-18 | Micron Technology Inc. | Vertical gain cell |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4090254A (en) * | 1976-03-01 | 1978-05-16 | International Business Machines Corporation | Charge injector transistor memory |
| NL7700880A (nl) * | 1976-12-17 | 1978-08-01 | Philips Nv | Naar willekeur toegankelijk geheugen met junctieveldeffekttransistoren. |
| JPH021162A (ja) * | 1988-01-29 | 1990-01-05 | Toshiba Corp | 半導体装置 |
| JPH02246370A (ja) * | 1989-03-20 | 1990-10-02 | Fujitsu Ltd | 半導体装置 |
| US5060194A (en) * | 1989-03-31 | 1991-10-22 | Kabushiki Kaisha Toshiba | Semiconductor memory device having a bicmos memory cell |
| JPH0383293A (ja) * | 1989-08-25 | 1991-04-09 | Mitsubishi Electric Corp | 内容参照メモリセル |
| JPH03136366A (ja) * | 1989-10-23 | 1991-06-11 | Nec Corp | 半導体装置 |
-
1992
- 1992-09-25 TW TW081107634A patent/TW289168B/zh active
- 1992-12-09 DE DE69223495T patent/DE69223495D1/de not_active Expired - Lifetime
- 1992-12-09 EP EP92203819A patent/EP0547673B1/en not_active Expired - Lifetime
- 1992-12-12 KR KR1019920024037A patent/KR930014992A/ko not_active Withdrawn
- 1992-12-14 US US07/989,629 patent/US5329481A/en not_active Expired - Fee Related
- 1992-12-15 JP JP4334231A patent/JPH05251670A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100692398B1 (ko) * | 2004-03-24 | 2007-03-09 | 롬 앤드 하스 캄파니 | 전계 프로그램 가능 저장소자를 갖는 메모리 셀 및 이를동작하는 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0547673B1 (en) | 1997-12-10 |
| EP0547673A3 (enExample) | 1994-03-02 |
| JPH05251670A (ja) | 1993-09-28 |
| DE69223495D1 (de) | 1998-01-22 |
| US5329481A (en) | 1994-07-12 |
| EP0547673A2 (en) | 1993-06-23 |
| TW289168B (enExample) | 1996-10-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
|
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid | ||
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |