KR930003308A - 스택된 칩 어셈블리 및 그 제조방법 - Google Patents
스택된 칩 어셈블리 및 그 제조방법 Download PDFInfo
- Publication number
- KR930003308A KR930003308A KR1019920012113A KR920012113A KR930003308A KR 930003308 A KR930003308 A KR 930003308A KR 1019920012113 A KR1019920012113 A KR 1019920012113A KR 920012113 A KR920012113 A KR 920012113A KR 930003308 A KR930003308 A KR 930003308A
- Authority
- KR
- South Korea
- Prior art keywords
- chips
- base
- chip
- stacked
- circuits
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 8
- 238000000034 method Methods 0.000 claims description 21
- 239000002184 metal Substances 0.000 claims 2
- 230000002093 peripheral effect Effects 0.000 claims 1
- 238000005498 polishing Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 230000000977 initiatory effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/50—Multistep manufacturing processes of assemblies consisting of devices, each device being of a type provided for in group H01L27/00 or H01L29/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0657—Stacked arrangements of devices
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/36—Assembling printed circuits with other printed circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/4501—Shape
- H01L2224/45012—Cross-sectional shape
- H01L2224/45014—Ribbon connectors, e.g. rectangular cross-section
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06513—Bump or bump-like direct electrical connections between devices, e.g. flip-chip connection, solder bumps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06551—Conductive connections on the side of the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06579—TAB carriers; beam leads
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06596—Structural arrangements for testing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01014—Silicon [Si]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3011—Impedance
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
- Semiconductor Integrated Circuits (AREA)
- Dicing (AREA)
- Credit Cards Or The Like (AREA)
Abstract
내용 없음.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 포함되는 제품을 생산하는 전형적인 제조 및 어셈블리 공정의 흐름도,
제2도는 크기가 양호한 회로들보다 더 큰 각각의 칩에 포함되도록 “G”로 표시된 양호한 집적 회도들을 사용하여 본 발명의 제조 및 어셈블리 공정에서의 개시 단계를 보여 주기 위해 변형된 전형적인 전체 웨이퍼를 나타내는 도면,
제3도는 회로 기판 상에 장착되기 전에 스택된 칩 어셈블리를 포함하는 본 발명의 한 실시예의 도면,
제4도 내지 제7도는 메모리 또는 다른 칩들을 인쇄 회로 기판 상에 장착하기 위한 특별한 요건들을 만족시키기 위해 고안된 다른 제조방법을 보여주는 본 발명의 다른 실시예를 도시하는 도면.
Claims (20)
- 제조, 어셈블링 및 스택된 상위 및 하위 칩 배열에 있는 적어도 두개의 집적 회로/메모리 칩들에서 회로기판/인쇄 회로 기판 지지대에 상호접속시킴으로써 스택된 칩 어셈블리를 제조하는 방법에 있어서, 동작가능 및 동작불능 회로를 결정하기 위해 전 웨이퍼를 검사하는 단계, 개개의 크기가 회로들의 개별 크기보다 각각 큰 칩들은 규정하고 칩들의 각각을 동작가능 회로들중 하나에 위치시켜서, 웨이퍼를 상위 및 하위 칩들로 다이스하기 위한 준비로서 칩들을 선택된 회로들에 인접한 회로들중 하나 위에 오우버랩시키기 위한 다이싱법을 제공하는 단계, 스택된 칩 어셈블리의 구성 부분을 규정하는 회로 설계에 따라 유전체층 마스크를 웨이퍼에 인가하는 단계, 입력/출력 재배치 금속을 마스크를 통해 노출된 웨이퍼 부분에 인가하는 단계, 상위 칩에 대해, 리본 본딩 가능 금속을 웨이퍼 상의 주변 패드들에 인가하여 패드를 마스킹하는 단계, 웨이퍼를 상위 및 하위 칩들로 다이싱하는 단계, 칩들을 인접 칩에 접촉하여 칩들의 층진 스택에 어셈블리하여 본딩하는 단계, 상기 스택을 베이스 상에 장착하는 단계, 스택을 베이스에 리본 본딩하는 단계, 상기 스택되고 본딩된 칩들을 전기적으로 검사하는 단계, 상기 스택되고 본딩된 칩들과 베이스를 지지대에 장착하는 단계, 상기 스택되고 본딩된 칩들과 베이스를 지지대에 리본 본딩하는 단계 및 상기 스택되고 본딩된 칩들, 베이스 및 지지대 어셈블리 캡슐포장하는 단계를 포함하는 것을 특징으로 하는 방법.
- 제1항에 있어서, 칩을 스택에 어셈블링하고 본딩하는 상기 단계와 스택을 베이스 상에 장착하는 단계 사이에 전기적 접촉점들을 노출시키기 위해 칩들의 모서리들을 연마하는 단계, 상기 접촉들중 선택된 것들에 있는 모서리들을 금속화하는 단계, 최상위 칩 상의 패드들 중 선택된 하나를 금속화하는 단계, 및 상기 금속화된 모서리로 부터의 리본 리드들과 패드들을 베이스 상에 있는 표시된 접촉 영역에 본딩함으로써 상기 스택-베이스 리본 본딩 단계를 수행하는 단계를 포함하는 것을 특징으로 하는 방법.
- 두께에 비해 상대적으로 큰 표면을 갖는 칩들의 어셈블리를 제조하는 방법에 있어서, 한 칩의 큰 표면이 인접한 칩의 큰 표면과 접촉되도록 적어도 두개의 집적회로 침들을 포개어 스택하는 단계, 한칩의 큰 표면의 베이스의 접촉하도록 스택된 칩들을 베이스의 표면에 어셈블링하는 단계 및 칩들을 베이스에 전기적으로 상호접속하는 단계를 포함하는 것을 특징으로 하는 방법.
- 제3항에 있어서, 개별 회로보다 각각 더 큰 개별 크기에 의해 규정되는 웨이퍼 부분을 선택하고, 상기 개별 칩들을 선택된 동작 가능 회로 상에 위치시켜서, 선택된 회로들에 인접한 회로들중 하나 위에 상기 칩들을 오우버랩시킴으로써 다수의 회로들을 갖는 웨이퍼로부터 각 칩들을 형성하는 프리스택킹 단계를 더 포함하는 것을 특징으로 하는 방법.
- 제4항에 있어서, 각 칩들의 주변에 접촉부들을 완전하게 위치시키는 단계를 더 포함하는 것을 특징으로 하는 방법.
- 제4항에 있어서, 스택된 칩들이 동일한 크기를 갖고 있고, 칩들을 그 모서리 들에서 전기적으로 상호 접속하고 최상위 칩과 베이스를 전기적으로 상호접속하는 단계를 더 포함하는 것을 특징으로 하는 방법.
- 제4항에 있어서, 스택된 칩들이 동일한 크기를 갖고 있고, 칩들을 베이스에 전기적으로 상호접속하는 단계를 더 포함하는 것을 특징으로 하는 방법.
- 제4항에 있어서, 스택된 칩들이 동일 크기를 갖고 있고, 작은 크기를 갖는 칩들 중 적어도 하나를 상대적으로 큰 크기를 갖는 칩들 중 적어도 다른 것 위에 스택하는 단계 및 상기 칩들을 하위 칩에, 또 거기에서 베이스에 연달아 전기적으로 상호접속하는 단계를 더 포함하는 것을 특징으로 하는 방법.
- 칩들의 어셈블리를 제조하기 위한 방법에 있어서, 적어도 두개의 집적 회로 칩을 포개어서 스택하는 단계, 상기 스택된 칩들을 베이스 위에 평행하게 어셈블링하는 단계 및 상기 칩들을 베이스에 전기적으로 상호접속하는 단계를 포함하는 것을 특징으로 하는 방법.
- 제9항에 있어서, 개별 회로보다 각각 더 큰 개별 칩 크기에 의해 규정되는 웨이퍼 부분을 선택하고 상기 개별 칩들을 선택된 동작 가능 회로상에 위치시켜서, 선택된 회로들에 인접한 회로들중 하나 위에 상기 칩들을 오우버랩시킴으로써 다수의 회로들을 갖는 웨이퍼로부터 각 칩들을 형성하는 프리스택킹 단계를 더 포함하는 것을 특징으로 하는 방법.
- 제9항에 있어서, 각 칩들의 주변에 접촉부들을 완전하게 위치시키는 단계를 더 포함하는 것을 특징으로 하는 방법.
- 제10항에 있어서, 상기 칩-베이스 상호접속 단계 이전에 칩들 사이에 상호 접속을 형성하는 단계를 더 포함하는 것을 특징으로 하는 방법.
- 제12항에 있어서, 상기 칩-베이스 상호접속 단계가 최상위 칩에서 베이스로의 접속부들을 형성하는 단계를 포함하는 것을 특징으로 하는 방법.
- 포개어서 스택되고 베이스 위에서 평행으로 어셈블되고 상기 베이스에 전기적으로 상호접속되고 있는 적어도 두개의 집적 회로를 포함하는 것을 특징으로 하는 칩들의 어셈블리.
- 제14항에 있어서, 웨이퍼 부분들이 개별 회로들보다 더 큰 개별 칩 크기에 의해 선택되고 상기 개별 칩들이 상기 회로들 중 선택된 동작가능한 것 위에 위치되고, 다수의 회로들을 갖는 웨이퍼로부터 상기 각 칩들을 형성하여서, 상기 선택된 회로들에 인접한 상기 회로들중 하나 위에 상기 칩들을 오우버랩하기 위한 수단을 더 포함하는 것을 특징으로 하는 어셈블리.
- 제14항에 있어서, 상기 각 칩들의 주변에 완전하게 위치된 접촉부들을 포함하는 것을 특징으로 하는 어셈블리.
- 제15항에 있어서, 상기 칩들 각각이 그 주위에 완전히 연장되어 있는 모서리 전기접촉부들이 제공되어 있고, 상기 칩들을 상호접속하기 위하여 상기 각 칩들의 상기 모서리 접촉부들 사이에 전기적 상호접속부들을 더 포함하는 것을 특징으로 하는 어셈블리.
- 제17항에 있어서, 상기 칩들 중 최상위의 것에서 상기 베이스로 연장하는 전기적 접속부들을 더 포함하는 것을 특징으로 하는 어셈블리.
- 제17항에 있어서, 상기 스택된 칩들이 동일 크기를 갖고 있고, 상기 칩들 사이의 상기 전기적 상호접속부들이 상기 칩들의 모서리들에 위치되고, 최상위 칩과 상기 베이스 사이에 전기적 상호접속이 위치되는 것을 특징으로 하는 어셈블리.
- 제17항에 있어서, 상기 스택된 칩들이 동일하지 않은 크기를 갖고 있어서 작은 크기를 갖는 것들 중 적어도 하나가 상대적으로 큰 크기를 갖는 칩들 중 적어도 다른 것 위에 있고 상기 상위 칩들에서 상기 하위 칩들로, 거기에서 다시 상기 베이스로의 연속적인 것들 사이에 전기적 상호접속부들을 포함하는 것을 특징으로 하는 어셈블리.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US727,500 | 1991-07-09 | ||
US07/727,500 US5311401A (en) | 1991-07-09 | 1991-07-09 | Stacked chip assembly and manufacturing method therefor |
Publications (2)
Publication Number | Publication Date |
---|---|
KR930003308A true KR930003308A (ko) | 1993-02-24 |
KR960003768B1 KR960003768B1 (ko) | 1996-03-22 |
Family
ID=24922916
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019920012113A KR960003768B1 (ko) | 1991-07-09 | 1992-07-08 | 스택된 칩 어셈블리 및 그 제조방법 |
Country Status (9)
Country | Link |
---|---|
US (1) | US5311401A (ko) |
EP (1) | EP0522518B1 (ko) |
JP (1) | JPH0834283B2 (ko) |
KR (1) | KR960003768B1 (ko) |
AU (1) | AU656595B2 (ko) |
CA (1) | CA2073363A1 (ko) |
DE (1) | DE69232611T2 (ko) |
ES (1) | ES2173861T3 (ko) |
IL (1) | IL102397A (ko) |
Families Citing this family (110)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2694840B1 (fr) * | 1992-08-13 | 1994-09-09 | Commissariat Energie Atomique | Module multi-puces à trois dimensions. |
US6205654B1 (en) * | 1992-12-11 | 2001-03-27 | Staktek Group L.P. | Method of manufacturing a surface mount package |
DE4311762C2 (de) * | 1993-04-08 | 1995-02-02 | Josef Dr Kemmer | Verfahren zur Verbindung elektrischer Kontaktstellen |
DE69426695T2 (de) * | 1993-04-23 | 2001-08-09 | Irvine Sensors Corp., Costa Mesa | Elektronisches modul mit einem stapel von ic-chips |
US5561622A (en) * | 1993-09-13 | 1996-10-01 | International Business Machines Corporation | Integrated memory cube structure |
US5675180A (en) * | 1994-06-23 | 1997-10-07 | Cubic Memory, Inc. | Vertical interconnect process for silicon segments |
US6124633A (en) * | 1994-06-23 | 2000-09-26 | Cubic Memory | Vertical interconnect process for silicon segments with thermally conductive epoxy preform |
US5891761A (en) * | 1994-06-23 | 1999-04-06 | Cubic Memory, Inc. | Method for forming vertical interconnect process for silicon segments with thermally conductive epoxy preform |
US5698895A (en) * | 1994-06-23 | 1997-12-16 | Cubic Memory, Inc. | Silicon segment programming method and apparatus |
US6486528B1 (en) | 1994-06-23 | 2002-11-26 | Vertical Circuits, Inc. | Silicon segment programming apparatus and three terminal fuse configuration |
US5657206A (en) * | 1994-06-23 | 1997-08-12 | Cubic Memory, Inc. | Conductive epoxy flip-chip package and method |
US6080596A (en) * | 1994-06-23 | 2000-06-27 | Cubic Memory Inc. | Method for forming vertical interconnect process for silicon segments with dielectric isolation |
US6255726B1 (en) * | 1994-06-23 | 2001-07-03 | Cubic Memory, Inc. | Vertical interconnect process for silicon segments with dielectric isolation |
MY114888A (en) * | 1994-08-22 | 2003-02-28 | Ibm | Method for forming a monolithic electronic module by stacking planar arrays of integrated circuit chips |
US5514907A (en) * | 1995-03-21 | 1996-05-07 | Simple Technology Incorporated | Apparatus for stacking semiconductor chips |
US5612570A (en) * | 1995-04-13 | 1997-03-18 | Dense-Pac Microsystems, Inc. | Chip stack and method of making same |
US5754408A (en) * | 1995-11-29 | 1998-05-19 | Mitsubishi Semiconductor America, Inc. | Stackable double-density integrated circuit assemblies |
US6861290B1 (en) * | 1995-12-19 | 2005-03-01 | Micron Technology, Inc. | Flip-chip adaptor package for bare die |
US5787569A (en) * | 1996-02-21 | 1998-08-04 | Lucent Technologies Inc. | Encapsulated package for power magnetic devices and method of manufacture therefor |
US5781413A (en) * | 1996-09-30 | 1998-07-14 | International Business Machines Corporation | Method and apparatus for directing the input/output connection of integrated circuit chip cube configurations |
US5815374A (en) * | 1996-09-30 | 1998-09-29 | International Business Machines Corporation | Method and apparatus for redirecting certain input/output connections of integrated circuit chip configurations |
JP3462026B2 (ja) * | 1997-01-10 | 2003-11-05 | 岩手東芝エレクトロニクス株式会社 | 半導体装置の製造方法 |
JP2000031614A (ja) * | 1997-11-04 | 2000-01-28 | Seiko Epson Corp | メモリモジュールおよびメモリモジュールの積層体ならびにメモリモジュールを具備するメモリカードおよびコンピュータ |
US6108210A (en) * | 1998-04-24 | 2000-08-22 | Amerasia International Technology, Inc. | Flip chip devices with flexible conductive adhesive |
US6072233A (en) | 1998-05-04 | 2000-06-06 | Micron Technology, Inc. | Stackable ball grid array package |
USRE43112E1 (en) | 1998-05-04 | 2012-01-17 | Round Rock Research, Llc | Stackable ball grid array package |
US6121576A (en) | 1998-09-02 | 2000-09-19 | Micron Technology, Inc. | Method and process of contact to a heat softened solder ball array |
NZ512581A (en) * | 1999-01-08 | 2002-12-20 | Univ Virginia Commonwealth | Polymeric delivery agents comprising a polymer conjugated to a modified amino acid and derivatives thereof |
US6313998B1 (en) * | 1999-04-02 | 2001-11-06 | Legacy Electronics, Inc. | Circuit board assembly having a three dimensional array of integrated circuit packages |
US6323060B1 (en) | 1999-05-05 | 2001-11-27 | Dense-Pac Microsystems, Inc. | Stackable flex circuit IC package and method of making same |
US6849480B1 (en) | 1999-05-07 | 2005-02-01 | Seagate Technology Llc | Surface mount IC stacking method and device |
FR2794570B1 (fr) * | 1999-06-04 | 2003-07-18 | Gemplus Card Int | Procede de fabrication de dispositif portable a circuit integre avec chemins de conduction electrique |
US7102892B2 (en) * | 2000-03-13 | 2006-09-05 | Legacy Electronics, Inc. | Modular integrated circuit chip carrier |
US6487078B2 (en) | 2000-03-13 | 2002-11-26 | Legacy Electronics, Inc. | Electronic module having a three dimensional array of carrier-mounted integrated circuit packages |
US6713854B1 (en) | 2000-10-16 | 2004-03-30 | Legacy Electronics, Inc | Electronic circuit module with a carrier having a mounting pad array |
NO20001360D0 (no) * | 2000-03-15 | 2000-03-15 | Thin Film Electronics Asa | Vertikale elektriske forbindelser i stabel |
US6660561B2 (en) | 2000-06-15 | 2003-12-09 | Dpac Technologies Corp. | Method of assembling a stackable integrated circuit chip |
US6404043B1 (en) * | 2000-06-21 | 2002-06-11 | Dense-Pac Microsystems, Inc. | Panel stacking of BGA devices to form three-dimensional modules |
JP2002033363A (ja) * | 2000-07-19 | 2002-01-31 | Hitachi Ltd | 半導体ウエハ、半導体チップ、および半導体装置の製造方法 |
US6608763B1 (en) | 2000-09-15 | 2003-08-19 | Staktek Group L.P. | Stacking system and method |
US7337522B2 (en) * | 2000-10-16 | 2008-03-04 | Legacy Electronics, Inc. | Method and apparatus for fabricating a circuit board with a three dimensional surface mounted array of semiconductor chips |
US6885106B1 (en) | 2001-01-11 | 2005-04-26 | Tessera, Inc. | Stacked microelectronic assemblies and methods of making same |
EP1378152A4 (en) * | 2001-03-14 | 2006-02-01 | Legacy Electronics Inc | METHOD AND DEVICE FOR PREPARING A PCB WITH A THREE-DIMENSIONAL ARRAY OF SEMICONDUCTOR CHIPS USED ON THE SURFACE |
US6462408B1 (en) * | 2001-03-27 | 2002-10-08 | Staktek Group, L.P. | Contact member stacking system and method |
US20030002267A1 (en) * | 2001-06-15 | 2003-01-02 | Mantz Frank E. | I/O interface structure |
US6573460B2 (en) * | 2001-09-20 | 2003-06-03 | Dpac Technologies Corp | Post in ring interconnect using for 3-D stacking |
US6573461B2 (en) | 2001-09-20 | 2003-06-03 | Dpac Technologies Corp | Retaining ring interconnect used for 3-D stacking |
US6977440B2 (en) * | 2001-10-09 | 2005-12-20 | Tessera, Inc. | Stacked packages |
US7335995B2 (en) * | 2001-10-09 | 2008-02-26 | Tessera, Inc. | Microelectronic assembly having array including passive elements and interconnects |
JP2005506690A (ja) * | 2001-10-09 | 2005-03-03 | テッセラ,インコーポレイテッド | 積層パッケージ |
US7026708B2 (en) | 2001-10-26 | 2006-04-11 | Staktek Group L.P. | Low profile chip scale stacking system and method |
US20030234443A1 (en) * | 2001-10-26 | 2003-12-25 | Staktek Group, L.P. | Low profile stacking system and method |
US7656678B2 (en) | 2001-10-26 | 2010-02-02 | Entorian Technologies, Lp | Stacked module systems |
US6576992B1 (en) * | 2001-10-26 | 2003-06-10 | Staktek Group L.P. | Chip scale stacking system and method |
US20050009234A1 (en) * | 2001-10-26 | 2005-01-13 | Staktek Group, L.P. | Stacked module systems and methods for CSP packages |
US7053478B2 (en) * | 2001-10-26 | 2006-05-30 | Staktek Group L.P. | Pitch change and chip scale stacking system |
US6940729B2 (en) * | 2001-10-26 | 2005-09-06 | Staktek Group L.P. | Integrated circuit stacking system and method |
US20050056921A1 (en) * | 2003-09-15 | 2005-03-17 | Staktek Group L.P. | Stacked module systems and methods |
US6914324B2 (en) * | 2001-10-26 | 2005-07-05 | Staktek Group L.P. | Memory expansion and chip scale stacking system and method |
US7485951B2 (en) | 2001-10-26 | 2009-02-03 | Entorian Technologies, Lp | Modularized die stacking system and method |
US7371609B2 (en) | 2001-10-26 | 2008-05-13 | Staktek Group L.P. | Stacked module systems and methods |
US7081373B2 (en) | 2001-12-14 | 2006-07-25 | Staktek Group, L.P. | CSP chip stack with flex circuit |
US6765288B2 (en) * | 2002-08-05 | 2004-07-20 | Tessera, Inc. | Microelectronic adaptors, assemblies and methods |
AU2003265417A1 (en) * | 2002-08-16 | 2004-03-03 | Tessera, Inc. | Microelectronic packages with self-aligning features |
US7294928B2 (en) * | 2002-09-06 | 2007-11-13 | Tessera, Inc. | Components, methods and assemblies for stacked packages |
US7071547B2 (en) * | 2002-09-11 | 2006-07-04 | Tessera, Inc. | Assemblies having stacked semiconductor chips and methods of making same |
DE10250538B4 (de) * | 2002-10-29 | 2008-02-21 | Infineon Technologies Ag | Elektronisches Bauteil als Multichipmodul und Verfahren zu dessen Herstellung |
US6856010B2 (en) * | 2002-12-05 | 2005-02-15 | Staktek Group L.P. | Thin scale outline package |
US6841029B2 (en) * | 2003-03-27 | 2005-01-11 | Advanced Cardiovascular Systems, Inc. | Surface modification of expanded ultra high molecular weight polyethylene (eUHMWPE) for improved bondability |
US20040207990A1 (en) * | 2003-04-21 | 2004-10-21 | Rose Andrew C. | Stair-step signal routing |
US20040245615A1 (en) * | 2003-06-03 | 2004-12-09 | Staktek Group, L.P. | Point to point memory expansion system and method |
US7061121B2 (en) | 2003-11-12 | 2006-06-13 | Tessera, Inc. | Stacked microelectronic assemblies with central contacts |
US7215018B2 (en) | 2004-04-13 | 2007-05-08 | Vertical Circuits, Inc. | Stacked die BGA or LGA component assembly |
US7705432B2 (en) * | 2004-04-13 | 2010-04-27 | Vertical Circuits, Inc. | Three dimensional six surface conformal die coating |
US7245021B2 (en) * | 2004-04-13 | 2007-07-17 | Vertical Circuits, Inc. | Micropede stacked die component assembly |
CN100527413C (zh) | 2004-06-07 | 2009-08-12 | 富士通微电子株式会社 | 内置有电容器的半导体装置及其制造方法 |
US20060033187A1 (en) * | 2004-08-12 | 2006-02-16 | Staktek Group, L.P. | Rugged CSP module system and method |
US7435097B2 (en) * | 2005-01-12 | 2008-10-14 | Legacy Electronics, Inc. | Radial circuit board, system, and methods |
US7309914B2 (en) * | 2005-01-20 | 2007-12-18 | Staktek Group L.P. | Inverted CSP stacking system and method |
US7576995B2 (en) | 2005-11-04 | 2009-08-18 | Entorian Technologies, Lp | Flex circuit apparatus and method for adding capacitance while conserving circuit board surface area |
US7608920B2 (en) | 2006-01-11 | 2009-10-27 | Entorian Technologies, Lp | Memory card and method for devising |
US7605454B2 (en) | 2006-01-11 | 2009-10-20 | Entorian Technologies, Lp | Memory card and method for devising |
US7508058B2 (en) | 2006-01-11 | 2009-03-24 | Entorian Technologies, Lp | Stacked integrated circuit module |
US7304382B2 (en) | 2006-01-11 | 2007-12-04 | Staktek Group L.P. | Managed memory component |
US7508069B2 (en) | 2006-01-11 | 2009-03-24 | Entorian Technologies, Lp | Managed memory component |
SG139573A1 (en) | 2006-07-17 | 2008-02-29 | Micron Technology Inc | Microelectronic packages with leadframes, including leadframes configured for stacked die packages, and associated systems and methods |
US7545029B2 (en) * | 2006-08-18 | 2009-06-09 | Tessera, Inc. | Stack microelectronic assemblies |
US7468553B2 (en) | 2006-10-20 | 2008-12-23 | Entorian Technologies, Lp | Stackable micropackages and stacked modules |
US8723332B2 (en) | 2007-06-11 | 2014-05-13 | Invensas Corporation | Electrically interconnected stacked die assemblies |
TW200917391A (en) * | 2007-06-20 | 2009-04-16 | Vertical Circuits Inc | Three-dimensional circuitry formed on integrated circuit device using two-dimensional fabrication |
US7763983B2 (en) * | 2007-07-02 | 2010-07-27 | Tessera, Inc. | Stackable microelectronic device carriers, stacked device carriers and methods of making the same |
SG149726A1 (en) | 2007-07-24 | 2009-02-27 | Micron Technology Inc | Microelectronic die packages with metal leads, including metal leads for stacked die packages, and associated systems and methods |
SG150396A1 (en) | 2007-08-16 | 2009-03-30 | Micron Technology Inc | Microelectronic die packages with leadframes, including leadframe-based interposer for stacked die packages, and associated systems and methods |
US8704379B2 (en) | 2007-09-10 | 2014-04-22 | Invensas Corporation | Semiconductor die mount by conformal die coating |
CN103325764B (zh) | 2008-03-12 | 2016-09-07 | 伊文萨思公司 | 支撑安装的电互连管芯组件 |
US7863159B2 (en) * | 2008-06-19 | 2011-01-04 | Vertical Circuits, Inc. | Semiconductor die separation method |
US9153517B2 (en) | 2008-05-20 | 2015-10-06 | Invensas Corporation | Electrical connector between die pad and z-interconnect for stacked die assemblies |
FR2932004B1 (fr) | 2008-06-03 | 2011-08-05 | Commissariat Energie Atomique | Dispositif electronique empile et procede de realisation d'un tel dispositif electronique |
JP5963671B2 (ja) * | 2009-06-26 | 2016-08-03 | インヴェンサス・コーポレーション | ジグザクの構成でスタックされたダイに関する電気的相互接続 |
TWI520213B (zh) | 2009-10-27 | 2016-02-01 | 英維瑟斯公司 | 加成法製程之選擇性晶粒電絕緣 |
TWI544604B (zh) | 2009-11-04 | 2016-08-01 | 英維瑟斯公司 | 具有降低應力電互連的堆疊晶粒總成 |
FR2959350B1 (fr) | 2010-04-26 | 2012-08-31 | Commissariat Energie Atomique | Procede de fabrication d?un dispositif microelectronique et dispositif microelectronique ainsi fabrique |
MY166609A (en) | 2010-09-15 | 2018-07-17 | Semiconductor Components Ind Llc | Connector assembly and method of manufacture |
US9825002B2 (en) | 2015-07-17 | 2017-11-21 | Invensas Corporation | Flipped die stack |
US9490195B1 (en) | 2015-07-17 | 2016-11-08 | Invensas Corporation | Wafer-level flipped die stacks with leadframes or metal foil interconnects |
US9871019B2 (en) | 2015-07-17 | 2018-01-16 | Invensas Corporation | Flipped die stack assemblies with leadframe interconnects |
US9508691B1 (en) | 2015-12-16 | 2016-11-29 | Invensas Corporation | Flipped die stacks with multiple rows of leadframe interconnects |
US10566310B2 (en) | 2016-04-11 | 2020-02-18 | Invensas Corporation | Microelectronic packages having stacked die and wire bond interconnects |
US9595511B1 (en) | 2016-05-12 | 2017-03-14 | Invensas Corporation | Microelectronic packages and assemblies with improved flyby signaling operation |
US9728524B1 (en) | 2016-06-30 | 2017-08-08 | Invensas Corporation | Enhanced density assembly having microelectronic packages mounted at substantial angle to board |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US456743A (en) * | 1891-07-28 | Charles e | ||
US4567643A (en) * | 1983-10-24 | 1986-02-04 | Sintra-Alcatel | Method of replacing an electronic component connected to conducting tracks on a support substrate |
JPS60130854A (ja) * | 1983-12-20 | 1985-07-12 | Toshiba Corp | 半導体集積回路 |
JPS6118164A (ja) * | 1984-07-04 | 1986-01-27 | Mitsubishi Electric Corp | 半導体装置 |
US4954875A (en) * | 1986-07-17 | 1990-09-04 | Laser Dynamics, Inc. | Semiconductor wafer array with electrically conductive compliant material |
JPH01140652A (ja) * | 1987-11-26 | 1989-06-01 | Sharp Corp | 立体型半導体装置 |
JPH0750759B2 (ja) * | 1988-07-01 | 1995-05-31 | シャープ株式会社 | 半導体装置 |
US4996583A (en) * | 1989-02-15 | 1991-02-26 | Matsushita Electric Industrial Co., Ltd. | Stack type semiconductor package |
WO1991000683A2 (en) * | 1989-07-07 | 1991-01-24 | Irvine Sensors Corporation | Fabricating electronic circuitry unit containing stacked ic layers having lead rerouting |
-
1991
- 1991-07-09 US US07/727,500 patent/US5311401A/en not_active Expired - Fee Related
-
1992
- 1992-07-02 IL IL10239792A patent/IL102397A/en not_active IP Right Cessation
- 1992-07-06 AU AU19475/92A patent/AU656595B2/en not_active Ceased
- 1992-07-08 CA CA002073363A patent/CA2073363A1/en not_active Abandoned
- 1992-07-08 EP EP92111531A patent/EP0522518B1/en not_active Expired - Lifetime
- 1992-07-08 KR KR1019920012113A patent/KR960003768B1/ko not_active IP Right Cessation
- 1992-07-08 ES ES92111531T patent/ES2173861T3/es not_active Expired - Lifetime
- 1992-07-08 DE DE69232611T patent/DE69232611T2/de not_active Expired - Fee Related
- 1992-07-09 JP JP4204302A patent/JPH0834283B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
AU656595B2 (en) | 1995-02-09 |
EP0522518B1 (en) | 2002-05-22 |
ES2173861T3 (es) | 2002-11-01 |
EP0522518A3 (en) | 1994-11-30 |
KR960003768B1 (ko) | 1996-03-22 |
IL102397A0 (en) | 1993-05-13 |
AU1947592A (en) | 1993-01-21 |
JPH05259375A (ja) | 1993-10-08 |
US5311401A (en) | 1994-05-10 |
EP0522518A2 (en) | 1993-01-13 |
DE69232611T2 (de) | 2003-01-30 |
IL102397A (en) | 1995-03-30 |
CA2073363A1 (en) | 1993-01-10 |
DE69232611D1 (de) | 2002-06-27 |
JPH0834283B2 (ja) | 1996-03-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR930003308A (ko) | 스택된 칩 어셈블리 및 그 제조방법 | |
US5448511A (en) | Memory stack with an integrated interconnect and mounting structure | |
US6603072B1 (en) | Making leadframe semiconductor packages with stacked dies and interconnecting interposer | |
US5128831A (en) | High-density electronic package comprising stacked sub-modules which are electrically interconnected by solder-filled vias | |
US5598033A (en) | Micro BGA stacking scheme | |
US6552416B1 (en) | Multiple die lead frame package with enhanced die-to-die interconnect routing using internal lead trace wiring | |
US20070126122A1 (en) | Semiconductor device with a wiring substrate and method for producing the same | |
JP2002076250A (ja) | 半導体装置 | |
JP5016811B2 (ja) | 半導体装置 | |
JP2004172157A (ja) | 半導体パッケージおよびパッケージスタック半導体装置 | |
JP4068336B2 (ja) | 半導体装置 | |
JPS6355213B2 (ko) | ||
JPS5860562A (ja) | 高端子数集積回路デバイス用パツケ−ジ | |
JPS6347259B2 (ko) | ||
JPH1168026A (ja) | 配線用補助パッケージおよび印刷回路配線板構造 | |
US7589407B2 (en) | Semiconductor multipackage module including tape substrate land grid array package stacked over ball grid array package | |
US5986346A (en) | Semiconductor device with improved pad connection | |
JPS6356706B2 (ko) | ||
JPH08264712A (ja) | 半導体装置 | |
JP6989426B2 (ja) | 半導体装置およびその製造方法 | |
US7659608B2 (en) | Stacked die semiconductor device having circuit tape | |
KR100587061B1 (ko) | 반도체 패키지 | |
JPS6094756A (ja) | 半導体装置 | |
JPS59127856A (ja) | 多層半導体チツプを有する半導体集積回路装置 | |
KR20110044077A (ko) | 반도체 패키지 구조물 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20050222 Year of fee payment: 10 |
|
LAPS | Lapse due to unpaid annual fee |