KR930003308A - 스택된 칩 어셈블리 및 그 제조방법 - Google Patents

스택된 칩 어셈블리 및 그 제조방법 Download PDF

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KR930003308A
KR930003308A KR1019920012113A KR920012113A KR930003308A KR 930003308 A KR930003308 A KR 930003308A KR 1019920012113 A KR1019920012113 A KR 1019920012113A KR 920012113 A KR920012113 A KR 920012113A KR 930003308 A KR930003308 A KR 930003308A
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쥬니어 루이스 이. 게이츠
케이. 코크란 리처드
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완다 케이. 덴슨-로우
휴우즈 에어크라프 캄파니
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Abstract

내용 없음.

Description

스택된 칩 어셈블리 및 그 제조방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 포함되는 제품을 생산하는 전형적인 제조 및 어셈블리 공정의 흐름도,
제2도는 크기가 양호한 회로들보다 더 큰 각각의 칩에 포함되도록 “G”로 표시된 양호한 집적 회도들을 사용하여 본 발명의 제조 및 어셈블리 공정에서의 개시 단계를 보여 주기 위해 변형된 전형적인 전체 웨이퍼를 나타내는 도면,
제3도는 회로 기판 상에 장착되기 전에 스택된 칩 어셈블리를 포함하는 본 발명의 한 실시예의 도면,
제4도 내지 제7도는 메모리 또는 다른 칩들을 인쇄 회로 기판 상에 장착하기 위한 특별한 요건들을 만족시키기 위해 고안된 다른 제조방법을 보여주는 본 발명의 다른 실시예를 도시하는 도면.

Claims (20)

  1. 제조, 어셈블링 및 스택된 상위 및 하위 칩 배열에 있는 적어도 두개의 집적 회로/메모리 칩들에서 회로기판/인쇄 회로 기판 지지대에 상호접속시킴으로써 스택된 칩 어셈블리를 제조하는 방법에 있어서, 동작가능 및 동작불능 회로를 결정하기 위해 전 웨이퍼를 검사하는 단계, 개개의 크기가 회로들의 개별 크기보다 각각 큰 칩들은 규정하고 칩들의 각각을 동작가능 회로들중 하나에 위치시켜서, 웨이퍼를 상위 및 하위 칩들로 다이스하기 위한 준비로서 칩들을 선택된 회로들에 인접한 회로들중 하나 위에 오우버랩시키기 위한 다이싱법을 제공하는 단계, 스택된 칩 어셈블리의 구성 부분을 규정하는 회로 설계에 따라 유전체층 마스크를 웨이퍼에 인가하는 단계, 입력/출력 재배치 금속을 마스크를 통해 노출된 웨이퍼 부분에 인가하는 단계, 상위 칩에 대해, 리본 본딩 가능 금속을 웨이퍼 상의 주변 패드들에 인가하여 패드를 마스킹하는 단계, 웨이퍼를 상위 및 하위 칩들로 다이싱하는 단계, 칩들을 인접 칩에 접촉하여 칩들의 층진 스택에 어셈블리하여 본딩하는 단계, 상기 스택을 베이스 상에 장착하는 단계, 스택을 베이스에 리본 본딩하는 단계, 상기 스택되고 본딩된 칩들을 전기적으로 검사하는 단계, 상기 스택되고 본딩된 칩들과 베이스를 지지대에 장착하는 단계, 상기 스택되고 본딩된 칩들과 베이스를 지지대에 리본 본딩하는 단계 및 상기 스택되고 본딩된 칩들, 베이스 및 지지대 어셈블리 캡슐포장하는 단계를 포함하는 것을 특징으로 하는 방법.
  2. 제1항에 있어서, 칩을 스택에 어셈블링하고 본딩하는 상기 단계와 스택을 베이스 상에 장착하는 단계 사이에 전기적 접촉점들을 노출시키기 위해 칩들의 모서리들을 연마하는 단계, 상기 접촉들중 선택된 것들에 있는 모서리들을 금속화하는 단계, 최상위 칩 상의 패드들 중 선택된 하나를 금속화하는 단계, 및 상기 금속화된 모서리로 부터의 리본 리드들과 패드들을 베이스 상에 있는 표시된 접촉 영역에 본딩함으로써 상기 스택-베이스 리본 본딩 단계를 수행하는 단계를 포함하는 것을 특징으로 하는 방법.
  3. 두께에 비해 상대적으로 큰 표면을 갖는 칩들의 어셈블리를 제조하는 방법에 있어서, 한 칩의 큰 표면이 인접한 칩의 큰 표면과 접촉되도록 적어도 두개의 집적회로 침들을 포개어 스택하는 단계, 한칩의 큰 표면의 베이스의 접촉하도록 스택된 칩들을 베이스의 표면에 어셈블링하는 단계 및 칩들을 베이스에 전기적으로 상호접속하는 단계를 포함하는 것을 특징으로 하는 방법.
  4. 제3항에 있어서, 개별 회로보다 각각 더 큰 개별 크기에 의해 규정되는 웨이퍼 부분을 선택하고, 상기 개별 칩들을 선택된 동작 가능 회로 상에 위치시켜서, 선택된 회로들에 인접한 회로들중 하나 위에 상기 칩들을 오우버랩시킴으로써 다수의 회로들을 갖는 웨이퍼로부터 각 칩들을 형성하는 프리스택킹 단계를 더 포함하는 것을 특징으로 하는 방법.
  5. 제4항에 있어서, 각 칩들의 주변에 접촉부들을 완전하게 위치시키는 단계를 더 포함하는 것을 특징으로 하는 방법.
  6. 제4항에 있어서, 스택된 칩들이 동일한 크기를 갖고 있고, 칩들을 그 모서리 들에서 전기적으로 상호 접속하고 최상위 칩과 베이스를 전기적으로 상호접속하는 단계를 더 포함하는 것을 특징으로 하는 방법.
  7. 제4항에 있어서, 스택된 칩들이 동일한 크기를 갖고 있고, 칩들을 베이스에 전기적으로 상호접속하는 단계를 더 포함하는 것을 특징으로 하는 방법.
  8. 제4항에 있어서, 스택된 칩들이 동일 크기를 갖고 있고, 작은 크기를 갖는 칩들 중 적어도 하나를 상대적으로 큰 크기를 갖는 칩들 중 적어도 다른 것 위에 스택하는 단계 및 상기 칩들을 하위 칩에, 또 거기에서 베이스에 연달아 전기적으로 상호접속하는 단계를 더 포함하는 것을 특징으로 하는 방법.
  9. 칩들의 어셈블리를 제조하기 위한 방법에 있어서, 적어도 두개의 집적 회로 칩을 포개어서 스택하는 단계, 상기 스택된 칩들을 베이스 위에 평행하게 어셈블링하는 단계 및 상기 칩들을 베이스에 전기적으로 상호접속하는 단계를 포함하는 것을 특징으로 하는 방법.
  10. 제9항에 있어서, 개별 회로보다 각각 더 큰 개별 칩 크기에 의해 규정되는 웨이퍼 부분을 선택하고 상기 개별 칩들을 선택된 동작 가능 회로상에 위치시켜서, 선택된 회로들에 인접한 회로들중 하나 위에 상기 칩들을 오우버랩시킴으로써 다수의 회로들을 갖는 웨이퍼로부터 각 칩들을 형성하는 프리스택킹 단계를 더 포함하는 것을 특징으로 하는 방법.
  11. 제9항에 있어서, 각 칩들의 주변에 접촉부들을 완전하게 위치시키는 단계를 더 포함하는 것을 특징으로 하는 방법.
  12. 제10항에 있어서, 상기 칩-베이스 상호접속 단계 이전에 칩들 사이에 상호 접속을 형성하는 단계를 더 포함하는 것을 특징으로 하는 방법.
  13. 제12항에 있어서, 상기 칩-베이스 상호접속 단계가 최상위 칩에서 베이스로의 접속부들을 형성하는 단계를 포함하는 것을 특징으로 하는 방법.
  14. 포개어서 스택되고 베이스 위에서 평행으로 어셈블되고 상기 베이스에 전기적으로 상호접속되고 있는 적어도 두개의 집적 회로를 포함하는 것을 특징으로 하는 칩들의 어셈블리.
  15. 제14항에 있어서, 웨이퍼 부분들이 개별 회로들보다 더 큰 개별 칩 크기에 의해 선택되고 상기 개별 칩들이 상기 회로들 중 선택된 동작가능한 것 위에 위치되고, 다수의 회로들을 갖는 웨이퍼로부터 상기 각 칩들을 형성하여서, 상기 선택된 회로들에 인접한 상기 회로들중 하나 위에 상기 칩들을 오우버랩하기 위한 수단을 더 포함하는 것을 특징으로 하는 어셈블리.
  16. 제14항에 있어서, 상기 각 칩들의 주변에 완전하게 위치된 접촉부들을 포함하는 것을 특징으로 하는 어셈블리.
  17. 제15항에 있어서, 상기 칩들 각각이 그 주위에 완전히 연장되어 있는 모서리 전기접촉부들이 제공되어 있고, 상기 칩들을 상호접속하기 위하여 상기 각 칩들의 상기 모서리 접촉부들 사이에 전기적 상호접속부들을 더 포함하는 것을 특징으로 하는 어셈블리.
  18. 제17항에 있어서, 상기 칩들 중 최상위의 것에서 상기 베이스로 연장하는 전기적 접속부들을 더 포함하는 것을 특징으로 하는 어셈블리.
  19. 제17항에 있어서, 상기 스택된 칩들이 동일 크기를 갖고 있고, 상기 칩들 사이의 상기 전기적 상호접속부들이 상기 칩들의 모서리들에 위치되고, 최상위 칩과 상기 베이스 사이에 전기적 상호접속이 위치되는 것을 특징으로 하는 어셈블리.
  20. 제17항에 있어서, 상기 스택된 칩들이 동일하지 않은 크기를 갖고 있어서 작은 크기를 갖는 것들 중 적어도 하나가 상대적으로 큰 크기를 갖는 칩들 중 적어도 다른 것 위에 있고 상기 상위 칩들에서 상기 하위 칩들로, 거기에서 다시 상기 베이스로의 연속적인 것들 사이에 전기적 상호접속부들을 포함하는 것을 특징으로 하는 어셈블리.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019920012113A 1991-07-09 1992-07-08 스택된 칩 어셈블리 및 그 제조방법 KR960003768B1 (ko)

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US07/727,500 US5311401A (en) 1991-07-09 1991-07-09 Stacked chip assembly and manufacturing method therefor

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Families Citing this family (110)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2694840B1 (fr) * 1992-08-13 1994-09-09 Commissariat Energie Atomique Module multi-puces à trois dimensions.
US6205654B1 (en) * 1992-12-11 2001-03-27 Staktek Group L.P. Method of manufacturing a surface mount package
DE4311762C2 (de) * 1993-04-08 1995-02-02 Josef Dr Kemmer Verfahren zur Verbindung elektrischer Kontaktstellen
DE69426695T2 (de) * 1993-04-23 2001-08-09 Irvine Sensors Corp., Costa Mesa Elektronisches modul mit einem stapel von ic-chips
US5561622A (en) * 1993-09-13 1996-10-01 International Business Machines Corporation Integrated memory cube structure
US5675180A (en) * 1994-06-23 1997-10-07 Cubic Memory, Inc. Vertical interconnect process for silicon segments
US6124633A (en) * 1994-06-23 2000-09-26 Cubic Memory Vertical interconnect process for silicon segments with thermally conductive epoxy preform
US5891761A (en) * 1994-06-23 1999-04-06 Cubic Memory, Inc. Method for forming vertical interconnect process for silicon segments with thermally conductive epoxy preform
US5698895A (en) * 1994-06-23 1997-12-16 Cubic Memory, Inc. Silicon segment programming method and apparatus
US6486528B1 (en) 1994-06-23 2002-11-26 Vertical Circuits, Inc. Silicon segment programming apparatus and three terminal fuse configuration
US5657206A (en) * 1994-06-23 1997-08-12 Cubic Memory, Inc. Conductive epoxy flip-chip package and method
US6080596A (en) * 1994-06-23 2000-06-27 Cubic Memory Inc. Method for forming vertical interconnect process for silicon segments with dielectric isolation
US6255726B1 (en) * 1994-06-23 2001-07-03 Cubic Memory, Inc. Vertical interconnect process for silicon segments with dielectric isolation
MY114888A (en) * 1994-08-22 2003-02-28 Ibm Method for forming a monolithic electronic module by stacking planar arrays of integrated circuit chips
US5514907A (en) * 1995-03-21 1996-05-07 Simple Technology Incorporated Apparatus for stacking semiconductor chips
US5612570A (en) * 1995-04-13 1997-03-18 Dense-Pac Microsystems, Inc. Chip stack and method of making same
US5754408A (en) * 1995-11-29 1998-05-19 Mitsubishi Semiconductor America, Inc. Stackable double-density integrated circuit assemblies
US6861290B1 (en) * 1995-12-19 2005-03-01 Micron Technology, Inc. Flip-chip adaptor package for bare die
US5787569A (en) * 1996-02-21 1998-08-04 Lucent Technologies Inc. Encapsulated package for power magnetic devices and method of manufacture therefor
US5781413A (en) * 1996-09-30 1998-07-14 International Business Machines Corporation Method and apparatus for directing the input/output connection of integrated circuit chip cube configurations
US5815374A (en) * 1996-09-30 1998-09-29 International Business Machines Corporation Method and apparatus for redirecting certain input/output connections of integrated circuit chip configurations
JP3462026B2 (ja) * 1997-01-10 2003-11-05 岩手東芝エレクトロニクス株式会社 半導体装置の製造方法
JP2000031614A (ja) * 1997-11-04 2000-01-28 Seiko Epson Corp メモリモジュールおよびメモリモジュールの積層体ならびにメモリモジュールを具備するメモリカードおよびコンピュータ
US6108210A (en) * 1998-04-24 2000-08-22 Amerasia International Technology, Inc. Flip chip devices with flexible conductive adhesive
US6072233A (en) 1998-05-04 2000-06-06 Micron Technology, Inc. Stackable ball grid array package
USRE43112E1 (en) 1998-05-04 2012-01-17 Round Rock Research, Llc Stackable ball grid array package
US6121576A (en) 1998-09-02 2000-09-19 Micron Technology, Inc. Method and process of contact to a heat softened solder ball array
NZ512581A (en) * 1999-01-08 2002-12-20 Univ Virginia Commonwealth Polymeric delivery agents comprising a polymer conjugated to a modified amino acid and derivatives thereof
US6313998B1 (en) * 1999-04-02 2001-11-06 Legacy Electronics, Inc. Circuit board assembly having a three dimensional array of integrated circuit packages
US6323060B1 (en) 1999-05-05 2001-11-27 Dense-Pac Microsystems, Inc. Stackable flex circuit IC package and method of making same
US6849480B1 (en) 1999-05-07 2005-02-01 Seagate Technology Llc Surface mount IC stacking method and device
FR2794570B1 (fr) * 1999-06-04 2003-07-18 Gemplus Card Int Procede de fabrication de dispositif portable a circuit integre avec chemins de conduction electrique
US7102892B2 (en) * 2000-03-13 2006-09-05 Legacy Electronics, Inc. Modular integrated circuit chip carrier
US6487078B2 (en) 2000-03-13 2002-11-26 Legacy Electronics, Inc. Electronic module having a three dimensional array of carrier-mounted integrated circuit packages
US6713854B1 (en) 2000-10-16 2004-03-30 Legacy Electronics, Inc Electronic circuit module with a carrier having a mounting pad array
NO20001360D0 (no) * 2000-03-15 2000-03-15 Thin Film Electronics Asa Vertikale elektriske forbindelser i stabel
US6660561B2 (en) 2000-06-15 2003-12-09 Dpac Technologies Corp. Method of assembling a stackable integrated circuit chip
US6404043B1 (en) * 2000-06-21 2002-06-11 Dense-Pac Microsystems, Inc. Panel stacking of BGA devices to form three-dimensional modules
JP2002033363A (ja) * 2000-07-19 2002-01-31 Hitachi Ltd 半導体ウエハ、半導体チップ、および半導体装置の製造方法
US6608763B1 (en) 2000-09-15 2003-08-19 Staktek Group L.P. Stacking system and method
US7337522B2 (en) * 2000-10-16 2008-03-04 Legacy Electronics, Inc. Method and apparatus for fabricating a circuit board with a three dimensional surface mounted array of semiconductor chips
US6885106B1 (en) 2001-01-11 2005-04-26 Tessera, Inc. Stacked microelectronic assemblies and methods of making same
EP1378152A4 (en) * 2001-03-14 2006-02-01 Legacy Electronics Inc METHOD AND DEVICE FOR PREPARING A PCB WITH A THREE-DIMENSIONAL ARRAY OF SEMICONDUCTOR CHIPS USED ON THE SURFACE
US6462408B1 (en) * 2001-03-27 2002-10-08 Staktek Group, L.P. Contact member stacking system and method
US20030002267A1 (en) * 2001-06-15 2003-01-02 Mantz Frank E. I/O interface structure
US6573460B2 (en) * 2001-09-20 2003-06-03 Dpac Technologies Corp Post in ring interconnect using for 3-D stacking
US6573461B2 (en) 2001-09-20 2003-06-03 Dpac Technologies Corp Retaining ring interconnect used for 3-D stacking
US6977440B2 (en) * 2001-10-09 2005-12-20 Tessera, Inc. Stacked packages
US7335995B2 (en) * 2001-10-09 2008-02-26 Tessera, Inc. Microelectronic assembly having array including passive elements and interconnects
JP2005506690A (ja) * 2001-10-09 2005-03-03 テッセラ,インコーポレイテッド 積層パッケージ
US7026708B2 (en) 2001-10-26 2006-04-11 Staktek Group L.P. Low profile chip scale stacking system and method
US20030234443A1 (en) * 2001-10-26 2003-12-25 Staktek Group, L.P. Low profile stacking system and method
US7656678B2 (en) 2001-10-26 2010-02-02 Entorian Technologies, Lp Stacked module systems
US6576992B1 (en) * 2001-10-26 2003-06-10 Staktek Group L.P. Chip scale stacking system and method
US20050009234A1 (en) * 2001-10-26 2005-01-13 Staktek Group, L.P. Stacked module systems and methods for CSP packages
US7053478B2 (en) * 2001-10-26 2006-05-30 Staktek Group L.P. Pitch change and chip scale stacking system
US6940729B2 (en) * 2001-10-26 2005-09-06 Staktek Group L.P. Integrated circuit stacking system and method
US20050056921A1 (en) * 2003-09-15 2005-03-17 Staktek Group L.P. Stacked module systems and methods
US6914324B2 (en) * 2001-10-26 2005-07-05 Staktek Group L.P. Memory expansion and chip scale stacking system and method
US7485951B2 (en) 2001-10-26 2009-02-03 Entorian Technologies, Lp Modularized die stacking system and method
US7371609B2 (en) 2001-10-26 2008-05-13 Staktek Group L.P. Stacked module systems and methods
US7081373B2 (en) 2001-12-14 2006-07-25 Staktek Group, L.P. CSP chip stack with flex circuit
US6765288B2 (en) * 2002-08-05 2004-07-20 Tessera, Inc. Microelectronic adaptors, assemblies and methods
AU2003265417A1 (en) * 2002-08-16 2004-03-03 Tessera, Inc. Microelectronic packages with self-aligning features
US7294928B2 (en) * 2002-09-06 2007-11-13 Tessera, Inc. Components, methods and assemblies for stacked packages
US7071547B2 (en) * 2002-09-11 2006-07-04 Tessera, Inc. Assemblies having stacked semiconductor chips and methods of making same
DE10250538B4 (de) * 2002-10-29 2008-02-21 Infineon Technologies Ag Elektronisches Bauteil als Multichipmodul und Verfahren zu dessen Herstellung
US6856010B2 (en) * 2002-12-05 2005-02-15 Staktek Group L.P. Thin scale outline package
US6841029B2 (en) * 2003-03-27 2005-01-11 Advanced Cardiovascular Systems, Inc. Surface modification of expanded ultra high molecular weight polyethylene (eUHMWPE) for improved bondability
US20040207990A1 (en) * 2003-04-21 2004-10-21 Rose Andrew C. Stair-step signal routing
US20040245615A1 (en) * 2003-06-03 2004-12-09 Staktek Group, L.P. Point to point memory expansion system and method
US7061121B2 (en) 2003-11-12 2006-06-13 Tessera, Inc. Stacked microelectronic assemblies with central contacts
US7215018B2 (en) 2004-04-13 2007-05-08 Vertical Circuits, Inc. Stacked die BGA or LGA component assembly
US7705432B2 (en) * 2004-04-13 2010-04-27 Vertical Circuits, Inc. Three dimensional six surface conformal die coating
US7245021B2 (en) * 2004-04-13 2007-07-17 Vertical Circuits, Inc. Micropede stacked die component assembly
CN100527413C (zh) 2004-06-07 2009-08-12 富士通微电子株式会社 内置有电容器的半导体装置及其制造方法
US20060033187A1 (en) * 2004-08-12 2006-02-16 Staktek Group, L.P. Rugged CSP module system and method
US7435097B2 (en) * 2005-01-12 2008-10-14 Legacy Electronics, Inc. Radial circuit board, system, and methods
US7309914B2 (en) * 2005-01-20 2007-12-18 Staktek Group L.P. Inverted CSP stacking system and method
US7576995B2 (en) 2005-11-04 2009-08-18 Entorian Technologies, Lp Flex circuit apparatus and method for adding capacitance while conserving circuit board surface area
US7608920B2 (en) 2006-01-11 2009-10-27 Entorian Technologies, Lp Memory card and method for devising
US7605454B2 (en) 2006-01-11 2009-10-20 Entorian Technologies, Lp Memory card and method for devising
US7508058B2 (en) 2006-01-11 2009-03-24 Entorian Technologies, Lp Stacked integrated circuit module
US7304382B2 (en) 2006-01-11 2007-12-04 Staktek Group L.P. Managed memory component
US7508069B2 (en) 2006-01-11 2009-03-24 Entorian Technologies, Lp Managed memory component
SG139573A1 (en) 2006-07-17 2008-02-29 Micron Technology Inc Microelectronic packages with leadframes, including leadframes configured for stacked die packages, and associated systems and methods
US7545029B2 (en) * 2006-08-18 2009-06-09 Tessera, Inc. Stack microelectronic assemblies
US7468553B2 (en) 2006-10-20 2008-12-23 Entorian Technologies, Lp Stackable micropackages and stacked modules
US8723332B2 (en) 2007-06-11 2014-05-13 Invensas Corporation Electrically interconnected stacked die assemblies
TW200917391A (en) * 2007-06-20 2009-04-16 Vertical Circuits Inc Three-dimensional circuitry formed on integrated circuit device using two-dimensional fabrication
US7763983B2 (en) * 2007-07-02 2010-07-27 Tessera, Inc. Stackable microelectronic device carriers, stacked device carriers and methods of making the same
SG149726A1 (en) 2007-07-24 2009-02-27 Micron Technology Inc Microelectronic die packages with metal leads, including metal leads for stacked die packages, and associated systems and methods
SG150396A1 (en) 2007-08-16 2009-03-30 Micron Technology Inc Microelectronic die packages with leadframes, including leadframe-based interposer for stacked die packages, and associated systems and methods
US8704379B2 (en) 2007-09-10 2014-04-22 Invensas Corporation Semiconductor die mount by conformal die coating
CN103325764B (zh) 2008-03-12 2016-09-07 伊文萨思公司 支撑安装的电互连管芯组件
US7863159B2 (en) * 2008-06-19 2011-01-04 Vertical Circuits, Inc. Semiconductor die separation method
US9153517B2 (en) 2008-05-20 2015-10-06 Invensas Corporation Electrical connector between die pad and z-interconnect for stacked die assemblies
FR2932004B1 (fr) 2008-06-03 2011-08-05 Commissariat Energie Atomique Dispositif electronique empile et procede de realisation d'un tel dispositif electronique
JP5963671B2 (ja) * 2009-06-26 2016-08-03 インヴェンサス・コーポレーション ジグザクの構成でスタックされたダイに関する電気的相互接続
TWI520213B (zh) 2009-10-27 2016-02-01 英維瑟斯公司 加成法製程之選擇性晶粒電絕緣
TWI544604B (zh) 2009-11-04 2016-08-01 英維瑟斯公司 具有降低應力電互連的堆疊晶粒總成
FR2959350B1 (fr) 2010-04-26 2012-08-31 Commissariat Energie Atomique Procede de fabrication d?un dispositif microelectronique et dispositif microelectronique ainsi fabrique
MY166609A (en) 2010-09-15 2018-07-17 Semiconductor Components Ind Llc Connector assembly and method of manufacture
US9825002B2 (en) 2015-07-17 2017-11-21 Invensas Corporation Flipped die stack
US9490195B1 (en) 2015-07-17 2016-11-08 Invensas Corporation Wafer-level flipped die stacks with leadframes or metal foil interconnects
US9871019B2 (en) 2015-07-17 2018-01-16 Invensas Corporation Flipped die stack assemblies with leadframe interconnects
US9508691B1 (en) 2015-12-16 2016-11-29 Invensas Corporation Flipped die stacks with multiple rows of leadframe interconnects
US10566310B2 (en) 2016-04-11 2020-02-18 Invensas Corporation Microelectronic packages having stacked die and wire bond interconnects
US9595511B1 (en) 2016-05-12 2017-03-14 Invensas Corporation Microelectronic packages and assemblies with improved flyby signaling operation
US9728524B1 (en) 2016-06-30 2017-08-08 Invensas Corporation Enhanced density assembly having microelectronic packages mounted at substantial angle to board

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US456743A (en) * 1891-07-28 Charles e
US4567643A (en) * 1983-10-24 1986-02-04 Sintra-Alcatel Method of replacing an electronic component connected to conducting tracks on a support substrate
JPS60130854A (ja) * 1983-12-20 1985-07-12 Toshiba Corp 半導体集積回路
JPS6118164A (ja) * 1984-07-04 1986-01-27 Mitsubishi Electric Corp 半導体装置
US4954875A (en) * 1986-07-17 1990-09-04 Laser Dynamics, Inc. Semiconductor wafer array with electrically conductive compliant material
JPH01140652A (ja) * 1987-11-26 1989-06-01 Sharp Corp 立体型半導体装置
JPH0750759B2 (ja) * 1988-07-01 1995-05-31 シャープ株式会社 半導体装置
US4996583A (en) * 1989-02-15 1991-02-26 Matsushita Electric Industrial Co., Ltd. Stack type semiconductor package
WO1991000683A2 (en) * 1989-07-07 1991-01-24 Irvine Sensors Corporation Fabricating electronic circuitry unit containing stacked ic layers having lead rerouting

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EP0522518B1 (en) 2002-05-22
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EP0522518A3 (en) 1994-11-30
KR960003768B1 (ko) 1996-03-22
IL102397A0 (en) 1993-05-13
AU1947592A (en) 1993-01-21
JPH05259375A (ja) 1993-10-08
US5311401A (en) 1994-05-10
EP0522518A2 (en) 1993-01-13
DE69232611T2 (de) 2003-01-30
IL102397A (en) 1995-03-30
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