KR920009891A - 수소 실세스퀴옥산 수지 분획 및 피복재료로서의 이의 용도 - Google Patents
수소 실세스퀴옥산 수지 분획 및 피복재료로서의 이의 용도 Download PDFInfo
- Publication number
- KR920009891A KR920009891A KR1019910021202A KR910021202A KR920009891A KR 920009891 A KR920009891 A KR 920009891A KR 1019910021202 A KR1019910021202 A KR 1019910021202A KR 910021202 A KR910021202 A KR 910021202A KR 920009891 A KR920009891 A KR 920009891A
- Authority
- KR
- South Korea
- Prior art keywords
- hydrogen silsesquioxane
- ceramic coating
- silsesquioxane resin
- solvent
- weight
- Prior art date
Links
- 239000011347 resin Substances 0.000 title claims 7
- 229920005989 resin Polymers 0.000 title claims 7
- 229920003209 poly(hydridosilsesquioxane) Polymers 0.000 title claims 6
- 238000000576 coating method Methods 0.000 title claims 2
- 239000011248 coating agent Substances 0.000 title 1
- 239000000463 material Substances 0.000 title 1
- 238000005524 ceramic coating Methods 0.000 claims 5
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims 4
- 239000002904 solvent Substances 0.000 claims 4
- 239000000919 ceramic Substances 0.000 claims 2
- 150000001875 compounds Chemical class 0.000 claims 2
- 239000006185 dispersion Substances 0.000 claims 2
- 229910052697 platinum Inorganic materials 0.000 claims 2
- 229920000642 polymer Polymers 0.000 claims 2
- 239000000758 substrate Substances 0.000 claims 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims 1
- 150000001242 acetic acid derivatives Chemical class 0.000 claims 1
- 125000004423 acyloxy group Chemical group 0.000 claims 1
- 150000001298 alcohols Chemical class 0.000 claims 1
- 150000001335 aliphatic alkanes Chemical class 0.000 claims 1
- 125000003545 alkoxy group Chemical group 0.000 claims 1
- 229910052782 aluminium Inorganic materials 0.000 claims 1
- 239000004411 aluminium Substances 0.000 claims 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 claims 1
- 229910052796 boron Inorganic materials 0.000 claims 1
- 239000003054 catalyst Substances 0.000 claims 1
- 238000006243 chemical reaction Methods 0.000 claims 1
- 125000004122 cyclic group Chemical group 0.000 claims 1
- 235000013870 dimethyl polysiloxane Nutrition 0.000 claims 1
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 claims 1
- -1 glycol ethers Chemical class 0.000 claims 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 claims 1
- 150000002576 ketones Chemical class 0.000 claims 1
- 229910052758 niobium Inorganic materials 0.000 claims 1
- 239000010955 niobium Substances 0.000 claims 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims 1
- 230000003647 oxidation Effects 0.000 claims 1
- 238000007254 oxidation reaction Methods 0.000 claims 1
- 229910052698 phosphorus Inorganic materials 0.000 claims 1
- 239000011574 phosphorus Substances 0.000 claims 1
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 claims 1
- 239000002243 precursor Substances 0.000 claims 1
- 229910052703 rhodium Inorganic materials 0.000 claims 1
- 239000010948 rhodium Substances 0.000 claims 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 claims 1
- 125000001424 substituent group Chemical group 0.000 claims 1
- 229910052715 tantalum Inorganic materials 0.000 claims 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims 1
- 239000010936 titanium Substances 0.000 claims 1
- 229910052719 titanium Inorganic materials 0.000 claims 1
- 229910052720 vanadium Inorganic materials 0.000 claims 1
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 claims 1
- 229910052726 zirconium Inorganic materials 0.000 claims 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/04—Polysiloxanes
- C08G77/32—Post-polymerisation treatment
- C08G77/36—Fractionation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
- H01L21/02134—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC the material comprising hydrogen silsesquioxane, e.g. HSQ
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/4505—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements characterised by the method of application
- C04B41/455—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements characterised by the method of application the coating or impregnating process including a chemical conversion or reaction
- C04B41/4554—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements characterised by the method of application the coating or impregnating process including a chemical conversion or reaction the coating or impregnating material being an organic or organo-metallic precursor of an inorganic material
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/04—Polysiloxanes
- C08G77/12—Polysiloxanes containing silicon bound to hydrogen
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/04—Polysiloxanes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/312—Organic layers, e.g. photoresist
- H01L21/3121—Layers comprising organo-silicon compounds
- H01L21/3122—Layers comprising organo-silicon compounds layers comprising polysiloxane compounds
- H01L21/3124—Layers comprising organo-silicon compounds layers comprising polysiloxane compounds layers comprising hydrogen silsesquioxane
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4803—Insulating or insulated parts, e.g. mountings, containers, diamond heatsinks
- H01L21/481—Insulating layers on insulating parts, with or without metallisation
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Polymers & Plastics (AREA)
- Ceramic Engineering (AREA)
- Medicinal Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Wood Science & Technology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Structural Engineering (AREA)
- Inorganic Chemistry (AREA)
- Paints Or Removers (AREA)
- Silicon Polymers (AREA)
- Formation Of Insulating Films (AREA)
- Ceramic Products (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Coating Of Shaped Articles Made Of Macromolecular Substances (AREA)
- Catalysts (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
Claims (5)
- 분산도가 약 3.0미만인 수소 실세스퀴옥산 수지.
- 중합체 종의 약 90%가 약 500 내지 10,000의 분량을 갖는 수소 실세스퀴옥산 수지.
- 알콜, 방향족탄화수소, 알칸, 케톤, 사이클릭 디메틸폴리실록산, 에세테르 또는 글리콜에테르로 이루어지는 그룹 중에서 선택된 용매 중에 용해되어 있는 수소 실세스퀴옥산 수지(여기서, 수지는 이의 중합체 종의 약 90%가 약 520 내지 10,000의 분자량을 가지며, 용매는 약 0.1 내지 약 50중량%의 수소 실세스퀴옥산 수지 용액을 형성할 수 있는 양으로 존재한다) 및 티탄, 지르코늄, 알루미늅, 탄탈, 바나듐, 니오븀, 붕소 및 인으로 이루어지는 그룹 중에서 선택된 원소를 함유하는 화합물(여기서, 이 화합물을 알콕시 또는 아실옥시로 이루어지는 그룹중에서 선택된 가소분해성 치환체 하나 이상을 함유하며 세라믹 피막이 개질 세라믹 산화를 0.1 내지 30중량%를 함유하도록 하는 양으로 존재한다)을 포함하는 개질 세라믹 산화물 선구물질을 함유하는 피복용액.
- 제3항에 있어서, 분획 중량을 기준으로 백금이 약 5 내지 약 500ppm이 되는 양으로 백금 또는 로듐 촉매를 추가로 함유하는 용액.
- 용매 및 수평균 분자량이 약 700 내지 약 6000이고 분산도가 약 3.0이만인 수소 실세스퀴옥산 수지를 포함하는 용액으로 기판을 피복하고, 용매를 증발시켜 기판상에 예비세라믹 피막을 부착시키고, 예비세라믹 피막의 세라믹 피막으로의 전환을 촉진시키기에 충분한 온도에 예비세라믹 피막을 노출시킴을 특징으로 하여 세라믹 피막을 형성시키는 방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/618,865 | 1990-11-28 | ||
US07/618,865 US5063267A (en) | 1990-11-28 | 1990-11-28 | Hydrogen silsesquioxane resin fractions and their use as coating materials |
Publications (2)
Publication Number | Publication Date |
---|---|
KR920009891A true KR920009891A (ko) | 1992-06-25 |
KR960007346B1 KR960007346B1 (ko) | 1996-05-31 |
Family
ID=24479445
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019910021202A KR960007346B1 (ko) | 1990-11-28 | 1991-11-26 | 수소 실세스퀴옥산 수지 분획 및 피복재료로서의 이의 용도 |
Country Status (8)
Country | Link |
---|---|
US (1) | US5063267A (ko) |
EP (1) | EP0493879B1 (ko) |
JP (1) | JPH04275337A (ko) |
KR (1) | KR960007346B1 (ko) |
CA (1) | CA2055306C (ko) |
DE (1) | DE69100590T2 (ko) |
ES (1) | ES2047987T3 (ko) |
TW (1) | TW218858B (ko) |
Families Citing this family (91)
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US5116637A (en) * | 1990-06-04 | 1992-05-26 | Dow Corning Corporation | Amine catalysts for the low temperature conversion of silica precursors to silica |
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US5445894A (en) * | 1991-04-22 | 1995-08-29 | Dow Corning Corporation | Ceramic coatings |
US5436029A (en) * | 1992-07-13 | 1995-07-25 | Dow Corning Corporation | Curing silicon hydride containing materials by exposure to nitrous oxide |
CA2100277A1 (en) * | 1992-07-20 | 1994-01-21 | Loren Andrew Haluska | Sealing porous electronic substrates |
US5310583A (en) * | 1992-11-02 | 1994-05-10 | Dow Corning Corporation | Vapor phase deposition of hydrogen silsesquioxane resin in the presence of nitrous oxide |
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US5387480A (en) * | 1993-03-08 | 1995-02-07 | Dow Corning Corporation | High dielectric constant coatings |
US5492958A (en) * | 1993-03-08 | 1996-02-20 | Dow Corning Corporation | Metal containing ceramic coatings |
TW492989B (en) * | 1993-03-19 | 2002-07-01 | Dow Corning | Stabilization of hydrogen silsesquioxane resin solutions |
US5320868A (en) * | 1993-09-13 | 1994-06-14 | Dow Corning Corporation | Method of forming SI-O containing coatings |
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US6423651B1 (en) * | 1993-12-27 | 2002-07-23 | Kawasaki Steel Corporation | Insulating film of semiconductor device and coating solution for forming insulating film and method of manufacturing insulating film |
US5456952A (en) * | 1994-05-17 | 1995-10-10 | Lsi Logic Corporation | Process of curing hydrogen silsesquioxane coating to form silicon oxide layer |
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US5501875A (en) | 1994-12-27 | 1996-03-26 | Dow Corning Corporation | Metal coated silica precursor powders |
JPH08245792A (ja) * | 1995-03-10 | 1996-09-24 | Mitsubishi Electric Corp | シリコーンラダーポリマー、シリコーンラダープレポリマーおよびそれらの製造方法 |
US5618878A (en) * | 1995-04-07 | 1997-04-08 | Dow Corning Corporation | Hydrogen silsesquioxane resin coating composition |
US5635240A (en) * | 1995-06-19 | 1997-06-03 | Dow Corning Corporation | Electronic coating materials using mixed polymers |
US5985229A (en) * | 1995-09-21 | 1999-11-16 | Toagosei Co., Ltd. | Solid silica derivative and process for producing the same |
US5609925A (en) | 1995-12-04 | 1997-03-11 | Dow Corning Corporation | Curing hydrogen silsesquioxane resin with an electron beam |
US6583187B1 (en) | 1996-07-19 | 2003-06-24 | Andrew T. Daly | Continuous processing of powder coating compositions |
US6075074A (en) | 1996-07-19 | 2000-06-13 | Morton International, Inc. | Continuous processing of powder coating compositions |
US6114414A (en) * | 1996-07-19 | 2000-09-05 | Morton International, Inc. | Continuous processing of powder coating compositions |
US5766522A (en) * | 1996-07-19 | 1998-06-16 | Morton International, Inc. | Continuous processing of powder coating compositions |
US5711987A (en) * | 1996-10-04 | 1998-01-27 | Dow Corning Corporation | Electronic coatings |
US5776235A (en) * | 1996-10-04 | 1998-07-07 | Dow Corning Corporation | Thick opaque ceramic coatings |
US5807611A (en) * | 1996-10-04 | 1998-09-15 | Dow Corning Corporation | Electronic coatings |
US20100273011A1 (en) * | 1996-12-20 | 2010-10-28 | Bianxiao Zhong | Silicone Composition, Silicone Adhesive, Coated and Laminated Substrates |
DE19654488A1 (de) * | 1996-12-27 | 1998-07-02 | Sueddeutsche Kalkstickstoff | Verfahren zur Fraktionierung viscoser Silicone |
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US6218020B1 (en) | 1999-01-07 | 2001-04-17 | Alliedsignal Inc. | Dielectric films from organohydridosiloxane resins with high organic content |
US5906859A (en) * | 1998-07-10 | 1999-05-25 | Dow Corning Corporation | Method for producing low dielectric coatings from hydrogen silsequioxane resin |
US6340722B1 (en) | 1998-09-04 | 2002-01-22 | The University Of Akron | Polymerization, compatibilized blending, and particle size control of powder coatings in a supercritical fluid |
DE19848474C1 (de) * | 1998-10-21 | 2000-01-13 | Bosch Gmbh Robert | Verfahren und Vorrichtung zur Herstellung keramischer Formkörper mittels Setterplatten und Verendung des Verfahrens zur Herstellung keramischer Mehrschichthybride |
WO2000077575A1 (en) * | 1999-06-10 | 2000-12-21 | Alliedsignal Inc. | Spin-on-glass anti-reflective coatings for photolithography |
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-
1990
- 1990-11-28 US US07/618,865 patent/US5063267A/en not_active Expired - Lifetime
-
1991
- 1991-10-21 TW TW080108285A patent/TW218858B/zh not_active IP Right Cessation
- 1991-11-12 CA CA002055306A patent/CA2055306C/en not_active Expired - Fee Related
- 1991-11-13 DE DE91310448T patent/DE69100590T2/de not_active Expired - Lifetime
- 1991-11-13 ES ES91310448T patent/ES2047987T3/es not_active Expired - Lifetime
- 1991-11-13 EP EP91310448A patent/EP0493879B1/en not_active Expired - Lifetime
- 1991-11-19 JP JP3303095A patent/JPH04275337A/ja active Granted
- 1991-11-26 KR KR1019910021202A patent/KR960007346B1/ko not_active IP Right Cessation
Also Published As
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---|---|
KR960007346B1 (ko) | 1996-05-31 |
JPH0579693B2 (ko) | 1993-11-04 |
EP0493879A2 (en) | 1992-07-08 |
EP0493879A3 (en) | 1992-09-30 |
US5063267A (en) | 1991-11-05 |
CA2055306C (en) | 1996-06-18 |
TW218858B (ko) | 1994-01-11 |
CA2055306A1 (en) | 1992-05-29 |
ES2047987T3 (es) | 1994-03-01 |
DE69100590D1 (de) | 1993-12-09 |
EP0493879B1 (en) | 1993-11-03 |
JPH04275337A (ja) | 1992-09-30 |
DE69100590T2 (de) | 1994-05-11 |
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