KR900007743B1 - 검사하기에 용이한 반도체 lsi장치 - Google Patents

검사하기에 용이한 반도체 lsi장치 Download PDF

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Publication number
KR900007743B1
KR900007743B1 KR1019870002599A KR870002599A KR900007743B1 KR 900007743 B1 KR900007743 B1 KR 900007743B1 KR 1019870002599 A KR1019870002599 A KR 1019870002599A KR 870002599 A KR870002599 A KR 870002599A KR 900007743 B1 KR900007743 B1 KR 900007743B1
Authority
KR
South Korea
Prior art keywords
circuit
signal
input
draw
semiconductor lsi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
KR1019870002599A
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English (en)
Korean (ko)
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KR870009400A (ko
Inventor
세이이찌 아베
Original Assignee
가부시끼가이샤 히다찌세이사꾸쇼
원본미기재
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시끼가이샤 히다찌세이사꾸쇼, 원본미기재 filed Critical 가부시끼가이샤 히다찌세이사꾸쇼
Publication of KR870009400A publication Critical patent/KR870009400A/ko
Application granted granted Critical
Publication of KR900007743B1 publication Critical patent/KR900007743B1/ko
Expired legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
KR1019870002599A 1986-03-22 1987-03-21 검사하기에 용이한 반도체 lsi장치 Expired KR900007743B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP64492 1986-03-22
JP61064492A JPS62220879A (ja) 1986-03-22 1986-03-22 半導体装置

Publications (2)

Publication Number Publication Date
KR870009400A KR870009400A (ko) 1987-10-26
KR900007743B1 true KR900007743B1 (ko) 1990-10-19

Family

ID=13259753

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019870002599A Expired KR900007743B1 (ko) 1986-03-22 1987-03-21 검사하기에 용이한 반도체 lsi장치

Country Status (4)

Country Link
US (1) US4812678A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS62220879A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
KR (1) KR900007743B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE3709032A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01202025A (ja) * 1988-02-08 1989-08-15 Mitsubishi Electric Corp モード切替回路
US6304987B1 (en) 1995-06-07 2001-10-16 Texas Instruments Incorporated Integrated test circuit
GB8828828D0 (en) * 1988-12-09 1989-01-18 Pilkington Micro Electronics Semiconductor integrated circuit
US4942319A (en) * 1989-01-19 1990-07-17 National Semiconductor Corp. Multiple page programmable logic architecture
JP3005250B2 (ja) * 1989-06-30 2000-01-31 テキサス インスツルメンツ インコーポレイテツド バスモニター集積回路
JPH0372381U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1989-11-15 1991-07-22
JP2676169B2 (ja) * 1989-12-27 1997-11-12 三菱電機株式会社 スキャンパス回路
US5036215A (en) * 1990-01-29 1991-07-30 International Business Machines Corporation Pass gate multiplexer receiver circuit
FR2660071B1 (fr) * 1990-03-23 1992-07-24 Alcatel Radiotelephone Systeme de test d'un circuit imprime pourvu de circuits integres et application de ce systeme au test d'un tel circuit imprime.
JPH03279880A (ja) * 1990-03-28 1991-12-11 Matsushita Electric Ind Co Ltd 検査機能付集積回路素子
JP2627464B2 (ja) * 1990-03-29 1997-07-09 三菱電機株式会社 集積回路装置
JP2519580B2 (ja) * 1990-06-19 1996-07-31 三菱電機株式会社 半導体集積回路
DE4038535A1 (de) * 1990-12-03 1992-06-04 Siemens Ag Pruefbare integrierte schaltung und schaltungsbaugruppe
JPH06130124A (ja) * 1992-10-20 1994-05-13 Mitsubishi Electric Corp しきい値を有する信号入力回路のテスト回路
US5519355A (en) * 1992-11-19 1996-05-21 At&T Global Information Solutions Company High speed boundary scan multiplexer
EP0622735B1 (en) * 1993-04-29 1997-11-05 International Business Machines Corporation Tie-up and tie-down circuits with a primary input for testability improvement of logic networks
EP0780037B1 (en) * 1995-07-06 2003-12-17 Koninklijke Philips Electronics N.V. A method for testing an electronic circuit by logically combining clock signals, and an electronic circuit provided with facilities for such testing
DE69633713T2 (de) * 1995-10-31 2006-02-02 Texas Instruments Inc., Dallas Verfahren und Vorrichtung zur Prüfung von integrierten Schaltungen
US5969538A (en) 1996-10-31 1999-10-19 Texas Instruments Incorporated Semiconductor wafer with interconnect between dies for testing and a process of testing
US5625631A (en) * 1996-04-26 1997-04-29 International Business Machines Corporation Pass through mode for multi-chip-module die
US5887004A (en) * 1997-03-28 1999-03-23 International Business Machines Corporation Isolated scan paths
US6408413B1 (en) 1998-02-18 2002-06-18 Texas Instruments Incorporated Hierarchical access of test access ports in embedded core integrated circuits
US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
EP1185920A4 (en) 1998-11-09 2005-07-06 Broadcom Corp INTEGRATED MIXED SIGNAL MONOPOLY INTEGRATED ELECTRONICS SYSTEM FOR MAGNETIC HARD DISK DRIVERS
US7058862B2 (en) * 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter
US6411147B1 (en) * 2000-10-11 2002-06-25 General Electric Company System and method for grouped gating control logic
JP2003004808A (ja) * 2001-06-19 2003-01-08 Nec Corp 半導体装置および半導体装置のテスト方法
DE10233681B4 (de) * 2002-07-24 2005-12-01 Infineon Technologies Ag Schaltungsanordnung zur Ansteuerung wenigstens eines Verbrauchers
US7640379B2 (en) * 2005-02-12 2009-12-29 Broadcom Corporation System method for I/O pads in mobile multimedia processor (MMP) that has bypass mode wherein data is passed through without being processed by MMP
CN100524169C (zh) * 2005-02-12 2009-08-05 美国博通公司 移动多媒体处理器中输入/输出区的方法和系统
CN117825924B (zh) * 2023-12-29 2025-06-06 无锡中微亿芯有限公司 一种芯片的可测试设计方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2330014A1 (fr) * 1973-05-11 1977-05-27 Ibm France Procede de test de bloc de circuits logiques integres et blocs en faisant application
EP0013597A1 (en) * 1979-01-09 1980-07-23 Rca Corporation Signal switching apparatus
JPS5690270A (en) * 1979-12-25 1981-07-22 Fujitsu Ltd Scan-in scan-out method
US4357703A (en) * 1980-10-09 1982-11-02 Control Data Corporation Test system for LSI circuits resident on LSI chips
JPS57100522A (en) * 1980-12-13 1982-06-22 Usac Electronics Ind Co Ltd Test system of input/output device
US4561094A (en) * 1983-06-29 1985-12-24 International Business Machines Corporation Interface checking apparatus

Also Published As

Publication number Publication date
US4812678A (en) 1989-03-14
DE3709032C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1991-09-26
JPS62220879A (ja) 1987-09-29
KR870009400A (ko) 1987-10-26
DE3709032A1 (de) 1987-09-24

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