JPS5690270A - Scan-in scan-out method - Google Patents

Scan-in scan-out method

Info

Publication number
JPS5690270A
JPS5690270A JP16858179A JP16858179A JPS5690270A JP S5690270 A JPS5690270 A JP S5690270A JP 16858179 A JP16858179 A JP 16858179A JP 16858179 A JP16858179 A JP 16858179A JP S5690270 A JPS5690270 A JP S5690270A
Authority
JP
Japan
Prior art keywords
scan
scanning
added
data
simultaneous scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16858179A
Other languages
Japanese (ja)
Inventor
Koji Hashiguchi
Masaki Ogawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP16858179A priority Critical patent/JPS5690270A/en
Publication of JPS5690270A publication Critical patent/JPS5690270A/en
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To enable high-speed testing of a logic circuit by enabling simultaneous scanning-in to a plurality of flip-flop and also simultaneous scanning-out of the content thereof.
CONSTITUTION: When scanning-in and scanning-out are performed, a scan designating signal terminal SCAN "1" is added, while scan-in data is added to input terminals IN1WINn. When the scan-in designating signal terminal SCAN "1" is added, a gate 5 is opened and simultaneously gates 8-1W8-n are also opened. As the result, the data added to the input terminals IN1WINn are set in the flip-flops FF1WFFn respectively, while the data housed in FF1WFFn are taken out repectively from output terminals OUT1WOUTn. Since such a constitution enables simultaneous scanning-in to FFs in plural and simultaneous scanning-out of the content of FFs in plural, the high-speed testing of the logic circuit is made possible.
COPYRIGHT: (C)1981,JPO&Japio
JP16858179A 1979-12-25 1979-12-25 Scan-in scan-out method Pending JPS5690270A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16858179A JPS5690270A (en) 1979-12-25 1979-12-25 Scan-in scan-out method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16858179A JPS5690270A (en) 1979-12-25 1979-12-25 Scan-in scan-out method

Publications (1)

Publication Number Publication Date
JPS5690270A true JPS5690270A (en) 1981-07-22

Family

ID=15870701

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16858179A Pending JPS5690270A (en) 1979-12-25 1979-12-25 Scan-in scan-out method

Country Status (1)

Country Link
JP (1) JPS5690270A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3709032A1 (en) * 1986-03-22 1987-09-24 Hitachi Ltd LARGE CIRCUIT SEMICONDUCTOR DEVICE
US4752907A (en) * 1983-08-31 1988-06-21 Amdahl Corporation Integrated circuit scanning apparatus having scanning data lines for connecting selected data locations to an I/O terminal
JPH0250738A (en) * 1988-08-12 1990-02-20 Fujitsu Ltd Test system for check processing circuit
US4922184A (en) * 1988-08-29 1990-05-01 Control Data Corporation Apparatus and process for the simultaneous continuity sensing of multiple circuits

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4752907A (en) * 1983-08-31 1988-06-21 Amdahl Corporation Integrated circuit scanning apparatus having scanning data lines for connecting selected data locations to an I/O terminal
DE3709032A1 (en) * 1986-03-22 1987-09-24 Hitachi Ltd LARGE CIRCUIT SEMICONDUCTOR DEVICE
JPH0250738A (en) * 1988-08-12 1990-02-20 Fujitsu Ltd Test system for check processing circuit
US4922184A (en) * 1988-08-29 1990-05-01 Control Data Corporation Apparatus and process for the simultaneous continuity sensing of multiple circuits

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