KR880013255A - 바이폴라트랜지스터 - Google Patents

바이폴라트랜지스터 Download PDF

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Publication number
KR880013255A
KR880013255A KR1019880002429A KR880002429A KR880013255A KR 880013255 A KR880013255 A KR 880013255A KR 1019880002429 A KR1019880002429 A KR 1019880002429A KR 880002429 A KR880002429 A KR 880002429A KR 880013255 A KR880013255 A KR 880013255A
Authority
KR
South Korea
Prior art keywords
region
bipolar transistor
base extraction
disposed
element isolation
Prior art date
Application number
KR1019880002429A
Other languages
English (en)
Other versions
KR0118111B1 (ko
Inventor
아키오 가야누마
Original Assignee
오가 노리오
소니 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오가 노리오, 소니 가부시키가이샤 filed Critical 오가 노리오
Publication of KR880013255A publication Critical patent/KR880013255A/ko
Application granted granted Critical
Publication of KR0118111B1 publication Critical patent/KR0118111B1/ko

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices
    • H01L29/72Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/73Bipolar junction transistors
    • H01L29/732Vertical transistors
    • H01L29/7322Vertical transistors having emitter-base and base-collector junctions leaving at the same surface of the body, e.g. planar transistor

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Bipolar Transistors (AREA)

Abstract

내용 없음

Description

바이폴라트랜지스터
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제 1 도는 본원 발명의 일실시예를 나타내는 개략 단면도, 제 2 도는 제 1 도의 실시예의 요부를 확대하여 나타낸 개략 단면도, 제 4 도는 본원 발명의 다른 실시예를 나타내는 개략 단면도.

Claims (1)

  1. 고농도의 베이스취출영역이 에미터영역과 소자분리영역과의 사이에 배설되고, 상기 베이스취출영역상에 베이스전극이 배설되어 이루어지는 바이폴라트랜지스터에 있어서, 동작시에, 상기 베이스취출영역과 상기 소자분리영역과의 사이에 걸치는 기판표면 근방에 공핍영역을 갖는 것을 특징으로 하는 바이폴라트랜지스터.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019880002429A 1987-04-10 1988-03-09 바이폴라트랜지스터 KR0118111B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP87-88353 1987-04-10
JP62088353A JPS63253664A (ja) 1987-04-10 1987-04-10 バイポ−ラトランジスタ

Publications (2)

Publication Number Publication Date
KR880013255A true KR880013255A (ko) 1988-11-30
KR0118111B1 KR0118111B1 (ko) 1997-09-30

Family

ID=13940455

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019880002429A KR0118111B1 (ko) 1987-04-10 1988-03-09 바이폴라트랜지스터

Country Status (6)

Country Link
US (1) US4984053A (ko)
EP (1) EP0286117B1 (ko)
JP (1) JPS63253664A (ko)
KR (1) KR0118111B1 (ko)
CA (1) CA1307357C (ko)
DE (1) DE3882565T2 (ko)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2579999B2 (ja) * 1988-05-13 1997-02-12 株式会社日立製作所 半導体装置の製造方法
US5468989A (en) * 1988-06-02 1995-11-21 Hitachi, Ltd. Semiconductor integrated circuit device having an improved vertical bipolar transistor structure
JP2861006B2 (ja) * 1988-12-08 1999-02-24 ソニー株式会社 バイポーラトランジスタの製造方法
US5221856A (en) * 1989-04-05 1993-06-22 U.S. Philips Corp. Bipolar transistor with floating guard region under extrinsic base
DE69031784D1 (de) * 1989-04-05 1998-01-22 Koninkl Philips Electronics Nv Halbleiteranordnung mit einem Kollektorbereich, einem Basisbereich und einem Emitterbereich, und Verfahren zu deren Herstellung
US5410175A (en) * 1989-08-31 1995-04-25 Hamamatsu Photonics K.K. Monolithic IC having pin photodiode and an electrically active element accommodated on the same semi-conductor substrate
JP2746289B2 (ja) * 1989-09-09 1998-05-06 忠弘 大見 素子の作製方法並びに半導体素子およびその作製方法
JP2825169B2 (ja) * 1990-09-17 1998-11-18 キヤノン株式会社 半導体装置
US5302535A (en) * 1991-09-20 1994-04-12 Nec Corporation Method of manufacturing high speed bipolar transistor
JPH0831841A (ja) 1994-07-12 1996-02-02 Sony Corp 半導体装置及びその製造方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE27045E (en) * 1963-11-08 1971-02-02 Transistor with limited area base-collector junction
US4003072A (en) * 1972-04-20 1977-01-11 Sony Corporation Semiconductor device with high voltage breakdown resistance
NL185484C (nl) * 1975-04-28 1990-04-17 Philips Nv Halfgeleiderinrichting met een halfgeleiderlichaam bevattende tenminste een transistor.
US4153904A (en) * 1977-10-03 1979-05-08 Texas Instruments Incorporated Semiconductor device having a high breakdown voltage junction characteristic
CA1131801A (en) * 1978-01-18 1982-09-14 Johannes A. Appels Semiconductor device
US4868624A (en) * 1980-05-09 1989-09-19 Regents Of The University Of Minnesota Channel collector transistor
JPS57201062A (en) * 1981-06-05 1982-12-09 Nec Corp Semiconductor device
NL8302092A (nl) * 1983-06-13 1985-01-02 Philips Nv Halfgeleiderinrichting bevattende een veldeffekttransistor.
JPS60247940A (ja) * 1984-05-23 1985-12-07 Hitachi Ltd 半導体装置およびその製造方法
JPS6146063A (ja) * 1984-08-10 1986-03-06 Hitachi Ltd 半導体装置の製造方法
JPH0622238B2 (ja) * 1985-10-02 1994-03-23 沖電気工業株式会社 バイポ−ラ型半導体集積回路装置の製造方法

Also Published As

Publication number Publication date
EP0286117A1 (en) 1988-10-12
EP0286117B1 (en) 1993-07-28
KR0118111B1 (ko) 1997-09-30
JPS63253664A (ja) 1988-10-20
US4984053A (en) 1991-01-08
DE3882565D1 (de) 1993-09-02
CA1307357C (en) 1992-09-08
DE3882565T2 (de) 1994-02-24

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