KR860003655A - 반도체장치와 그 제조방법 - Google Patents
반도체장치와 그 제조방법 Download PDFInfo
- Publication number
- KR860003655A KR860003655A KR1019850006793A KR850006793A KR860003655A KR 860003655 A KR860003655 A KR 860003655A KR 1019850006793 A KR1019850006793 A KR 1019850006793A KR 850006793 A KR850006793 A KR 850006793A KR 860003655 A KR860003655 A KR 860003655A
- Authority
- KR
- South Korea
- Prior art keywords
- semiconductor device
- manufacturing
- connection
- junction line
- lead electrode
- Prior art date
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- 238000004519 manufacturing process Methods 0.000 title claims description 13
- 239000004065 semiconductor Substances 0.000 title claims 19
- 238000010438 heat treatment Methods 0.000 claims 8
- 239000007789 gas Substances 0.000 claims 7
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims 3
- 229910000881 Cu alloy Inorganic materials 0.000 claims 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims 3
- 229910052782 aluminium Inorganic materials 0.000 claims 3
- 229910052802 copper Inorganic materials 0.000 claims 3
- 239000010949 copper Substances 0.000 claims 3
- 239000000463 material Substances 0.000 claims 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims 2
- 230000001590 oxidative effect Effects 0.000 claims 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims 1
- 229910052786 argon Inorganic materials 0.000 claims 1
- 238000005538 encapsulation Methods 0.000 claims 1
- 230000004927 fusion Effects 0.000 claims 1
- 239000001307 helium Substances 0.000 claims 1
- 229910052734 helium Inorganic materials 0.000 claims 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims 1
- 239000001257 hydrogen Substances 0.000 claims 1
- 229910052739 hydrogen Inorganic materials 0.000 claims 1
- 239000011261 inert gas Substances 0.000 claims 1
- 230000005855 radiation Effects 0.000 claims 1
- 239000011347 resin Substances 0.000 claims 1
- 229920005989 resin Polymers 0.000 claims 1
- 238000000034 method Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
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- H01L24/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/22—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating taking account of the properties of the materials to be welded
- B23K20/233—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating taking account of the properties of the materials to be welded without ferrous layer
- B23K20/2333—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating taking account of the properties of the materials to be welded without ferrous layer one layer being aluminium, magnesium or beryllium
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- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
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- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Engineering & Computer Science (AREA)
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- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- Wire Bonding (AREA)
- Lead Frames For Integrated Circuits (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제2도 내지 제5도 및 제7도는 본 발명의 제조방법을 공정순으로 도시한 설명도.
Claims (13)
- 구리 또는 여러가지 구리합금들 중에서 선택된 물질로 된 리이드프레임(20)의 소정영역에 장착시킨 반도체소자와, 상기 리이드프레임(22)에 형성시킨 리이드전극(25), 한쪽끝이 상기 반도체소자의 접합패드(24)에 연결되면서 다른 끝은 리이드전극(25)에 연결되도록 된 접합선(23) 및, 상기 리이드프레임과 상기 리이드 전극의 일부를 외부로 인출시켜지도록 한 상기 반도체소자(22), 상기 접합패드(24) 및 상기 접합선(23)을 봉합하고 있는 수지제봉합체(27)를 구비하고 있는 반도체장치에 있어서, 상기 접합선(23)이 알루미늄으로 되면서 리이드전극(25)과의 접속부인 반응층의 두께가 0.2미크론 이상으로 되어진 것을 특징으로 하는 접합선의 접속을 개량한 반도체 장치.
- 반도체소자(22)를 장착시킨 구리 또는 여러가지 구리합금중에서 선택된 물질로 된 리이드프레임(20)의 리이드전극(25)에다 그 한쪽끝이 상기 반도체소자(22)의 전극패드(24)에 접속되어진 접합선(23)의 다른쪽끝을 접속시키는 공정을 갖고 있는 반도체장치의 제조방법에 있어서, 전극패드(24)에다 알루미늄으로 된 접합선(23)의 다른쪽끝을 융착시킴과 더불어 그 융착부에 열처리를 실시해서 상기 구리 또는 여러가지 구리합금중에서 선택된 물질과 상기 알루미늄으로 형성되어진 반응층 두께를 0.2미크론이상되게 하는 공정이 구비된 것을 특징으로 하는 접합선의 접속을 개량한 반도체장치의 제조방법.
- 제2항에 있어서, 리이드전극(25)를 히터부재(40)(42)사이에다 끼워넣어 가열처리하도록 된 접합선의 접속을 개량한 반도체장치의 제조방법.
- 제3항에 있어서, 히터부재(40)(40)들에 의한 끼워잡혀지는 것이 단속적으로 이루어지게 된 접합선의 접속을 개량한 반도체장치의 제조방법.
- 제3항에 있어서, 히터부재(40)(42)로 가열하는 동안 리이드프레임(20)아랫쪽으로부터 비산화성개스가 분출되도록된 접합선의 접속을 개량한 반도체장치의 제조방법.
- 제2항에 있어서, 열처리를 수소오븐을 통과시킴으로서 이루어지도록 한 접합선의 접속을 개량한 반도체장치의 제조방법.
- 제2항에 있어서, 열처리로서 버너토오치로 접합부를 제외한 리이드전극(25)을 가열함으로서 이루어지도록 한 접합선의 접속을 개량한 반도체장치의 제조방법.
- 제2항에 있어서, 열처리가 저항가열장치로 리이드전극(25)을 가열하도록 된 접합선의 접속을 개량한 반도체장치의 제조방법.
- 제2항에 있어서, 열처리가 레이저방사선에 의해 접합부(26)을 가열하도록 된 접합선의 접속을 개량한 반도체장치의 제조방법.
- 제3항에 있어서, 히터부재(40)(42)에 의한 끼워잡음이 일정시간동안 연속적으로 행하여 지도록 된 접합선의 접속을 개량한 반도체장치의 제조방법.
- 제5항에 있어서, 비산화성개스가 불활성개스와 환원성개스 계열로부터 선택된 접합선의 접속을 개량한 반도체장치의 제조방법.
- 제11항에 있어서, 불화성개스가 질서와 아르곤 및 헬륨으로 이루어지는 계열로부터 선택된 개스이고, 환원성개스는 수소개스로 된 접합선의 접속을 개량한 반도체장치의 제조방법.
- ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59211960A JPS6189643A (ja) | 1984-10-09 | 1984-10-09 | 半導体装置及びその製造方法 |
JP59-211960 | 1984-10-09 |
Publications (2)
Publication Number | Publication Date |
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KR860003655A true KR860003655A (ko) | 1986-05-28 |
KR900000439B1 KR900000439B1 (ko) | 1990-01-30 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1019850006793A KR900000439B1 (ko) | 1984-10-09 | 1985-09-17 | 접합선의 접속을 개량한 반도체 장치와 그 제조방법 |
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US (1) | US4891333A (ko) |
EP (1) | EP0178170B1 (ko) |
JP (1) | JPS6189643A (ko) |
KR (1) | KR900000439B1 (ko) |
CN (1) | CN85107077B (ko) |
DE (1) | DE3581039D1 (ko) |
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EP0284820A3 (en) * | 1987-03-04 | 1989-03-08 | Canon Kabushiki Kaisha | Electrically connecting member, and electric circuit member and electric circuit device with the connecting member |
US5229646A (en) * | 1989-01-13 | 1993-07-20 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device with a copper wires ball bonded to aluminum electrodes |
JPH0817189B2 (ja) * | 1989-01-13 | 1996-02-21 | 三菱電機株式会社 | 半導体装置の製造方法 |
IT1233008B (it) * | 1989-09-21 | 1992-03-14 | Sgs Thomson Microelectronics | Dispositivo integrato con connessioni perfezionate fra i terminali e la piastrina di materiale semiconduttore integrante componenti elettronici |
US5156999A (en) * | 1990-06-08 | 1992-10-20 | Wai-Hon Lee | Packaging method for semiconductor laser/detector devices |
FR2678773B1 (fr) * | 1991-07-05 | 1997-03-14 | Thomson Csf | Procede de cablage entre des sorties de boitier et des elements d'hybride. |
US5825623A (en) * | 1995-12-08 | 1998-10-20 | Vlsi Technology, Inc. | Packaging assemblies for encapsulated integrated circuit devices |
CN100397602C (zh) * | 1998-10-05 | 2008-06-25 | 库利克及索法工业公司 | 半导体铜键合焊点表面保护 |
US6352743B1 (en) * | 1998-10-05 | 2002-03-05 | Kulicke & Soffa Investments, Inc. | Semiconductor copper band pad surface protection |
US6790757B1 (en) * | 1999-12-20 | 2004-09-14 | Agere Systems Inc. | Wire bonding method for copper interconnects in semiconductor devices |
EP1306898A1 (en) * | 2001-10-29 | 2003-05-02 | Dialog Semiconductor GmbH | Sub-milliohm on-chip interconnection |
JP3943416B2 (ja) * | 2002-03-07 | 2007-07-11 | 株式会社ルネサステクノロジ | 半導体装置の製造方法 |
CN100347853C (zh) * | 2003-08-07 | 2007-11-07 | 富士通株式会社 | 引线框架及其制造方法以及半导体器件 |
KR100998042B1 (ko) * | 2004-02-23 | 2010-12-03 | 삼성테크윈 주식회사 | 리드 프레임 및 이를 구비한 반도체 패키지의 제조방법 |
AT12326U1 (de) * | 2009-04-20 | 2012-03-15 | Austria Tech & System Tech | Verfahren zum vorbehandeln eines rahmen- bzw. trägerelements für eine herstellung einer leiterplatte, sowie rahmen- bzw. trägerelement und verwendung hiefür |
US8581378B2 (en) * | 2009-09-29 | 2013-11-12 | Panasonic Corporation | Semiconductor device and method of manufacturing the same |
JP6239840B2 (ja) * | 2013-03-27 | 2017-11-29 | ローム株式会社 | 半導体装置および半導体装置の製造方法 |
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JPS4810904B1 (ko) * | 1969-03-12 | 1973-04-09 | ||
US3706840A (en) * | 1971-05-10 | 1972-12-19 | Intersil Inc | Semiconductor device packaging |
US3914858A (en) * | 1974-08-23 | 1975-10-28 | Nitto Electric Ind Co | Method of making sealed cavity molded semiconductor devices |
US4188438A (en) * | 1975-06-02 | 1980-02-12 | National Semiconductor Corporation | Antioxidant coating of copper parts for thermal compression gang bonding of semiconductive devices |
US4248920A (en) * | 1978-04-26 | 1981-02-03 | Tokyo Shibaura Denki Kabushiki Kaisha | Resin-sealed semiconductor device |
US4218701A (en) * | 1978-07-24 | 1980-08-19 | Citizen Watch Co., Ltd. | Package for an integrated circuit having a container with support bars |
FR2439478A1 (fr) * | 1978-10-19 | 1980-05-16 | Cii Honeywell Bull | Boitier plat pour dispositifs a circuits integres |
US4224499A (en) * | 1978-10-20 | 1980-09-23 | General Electric Company | Laser welding aluminum to copper |
DE2929623C2 (de) * | 1979-07-21 | 1981-11-26 | W.C. Heraeus Gmbh, 6450 Hanau | Feinstdraht aus einer Aluminiumlegierung |
JPS5948714B2 (ja) * | 1979-10-29 | 1984-11-28 | 株式会社日立製作所 | 共晶反応を利用して金属母材を圧接する方法 |
JPS56137664A (en) * | 1980-03-31 | 1981-10-27 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Lead frame and semiconductor device having lead frame |
JPS582054A (ja) * | 1981-06-26 | 1983-01-07 | Fujitsu Ltd | 半導体装置 |
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US4384899A (en) * | 1981-11-09 | 1983-05-24 | Motorola Inc. | Bonding method adaptable for manufacturing capacitive pressure sensing elements |
JPS5889831A (ja) * | 1981-11-24 | 1983-05-28 | Hitachi Ltd | ワイヤボンデイング方法および装置 |
US4633573A (en) * | 1982-10-12 | 1987-01-06 | Aegis, Inc. | Microcircuit package and sealing method |
US4498121A (en) * | 1983-01-13 | 1985-02-05 | Olin Corporation | Copper alloys for suppressing growth of Cu-Al intermetallic compounds |
JPS59130449A (ja) * | 1983-01-17 | 1984-07-27 | Nec Corp | 絶縁型半導体素子用リードフレーム |
JPS59177955A (ja) * | 1983-03-28 | 1984-10-08 | Toshiba Corp | 半導体装置 |
JPH0622328A (ja) * | 1992-07-06 | 1994-01-28 | Matsushita Electric Ind Co Ltd | 地磁気補正装置 |
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1984
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- 1985-10-09 EP EP85307236A patent/EP0178170B1/en not_active Expired - Lifetime
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CN85107077A (zh) | 1986-10-01 |
DE3581039D1 (de) | 1991-02-07 |
CN85107077B (zh) | 1988-01-27 |
JPS6189643A (ja) | 1986-05-07 |
US4891333A (en) | 1990-01-02 |
KR900000439B1 (ko) | 1990-01-30 |
EP0178170B1 (en) | 1991-01-02 |
EP0178170A3 (en) | 1987-03-25 |
JPH0332912B2 (ko) | 1991-05-15 |
EP0178170A2 (en) | 1986-04-16 |
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