KR850006981A - 반도체 기억장치 - Google Patents

반도체 기억장치 Download PDF

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Publication number
KR850006981A
KR850006981A KR1019840006508A KR840006508A KR850006981A KR 850006981 A KR850006981 A KR 850006981A KR 1019840006508 A KR1019840006508 A KR 1019840006508A KR 840006508 A KR840006508 A KR 840006508A KR 850006981 A KR850006981 A KR 850006981A
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KR
South Korea
Prior art keywords
mos
semiconductor memory
mos capacitor
memory device
cell
Prior art date
Application number
KR1019840006508A
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English (en)
Other versions
KR900005664B1 (ko
Inventor
유끼히또 오오와끼 (외 1)
Original Assignee
사바 쇼오이찌
가부시기 가이샤 도오시바
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 사바 쇼오이찌, 가부시기 가이샤 도오시바 filed Critical 사바 쇼오이찌
Publication of KR850006981A publication Critical patent/KR850006981A/ko
Application granted granted Critical
Publication of KR900005664B1 publication Critical patent/KR900005664B1/ko

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Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/92—Capacitors having potential barriers
    • H01L29/94—Metal-insulator-semiconductors, e.g. MOS
    • H01L29/945—Trench capacitors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/37—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells the capacitor being at least partially in a trench in the substrate

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Memories (AREA)

Abstract

내용 없음

Description

반도체 기억장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 일실시예에 있어서 메모리 셀의 평면도. 제2도는 머미 셀의 평면도. 제3도 및 제4도는 제1도와 제2도에 있어서 A-A′, B-B′위치에서의 공정단면도이다.
1s-메모리 셀의 MOS 캐패시터, 2s-메모리 셀의 MOS FET, 1d-더미 셀의 MOS 캐패시터, 2d-더미셀의 MOS FET,3-P-Si 기판, 4-피일드 절연막, 5-SiO2막, 6S1,6S2,6d-미세 홈(細溝), 7-제1 게이트 산화막, 8- MOS 캐패시터 전극, 9-제2 게이트 산화막, 10s,10d-MOS FET게이트 전극, 11s,11d,12s,12d-n+층, 13-S102막, 14a,14d-비트선.

Claims (2)

  1. 한개의 MOS FET와 한개의 MOS캐패시터에 의해서 1비트의 메모리 셀이 구성되고, 한개의 MOS FET와 한개의 MOS 캐패시터에 의해서 더미 셀이 구성되며, 각 MOS캐패시터에서는 반도체 기판의 표면에 형성된 미세홈의 내부 및 주위에 게이트 절연막이 끼워져서 게이트 전극이 형성되고, 메모리셀의 MOS 캐패시터 용량이 더미 셀의 MOS캐패시터 용량에 대해서 2배로 설정된 반도체 기억장치에 있어서, 상기 메모리 셀의 MOR캐패시터에 있는 미세홈의 수를 더미 셀에 대하여 2배로 한 것을 특징으로 하는 반도체 기억장치.
  2. 제1항에 있어서, 반도체 기판상의 모든 MOS캐패시터에 있는 미세홈의 주변길이가 같도록된 것을 특징으로 하는 반도체 기억장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019840006508A 1984-03-30 1984-10-19 반도체 기억장치 KR900005664B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP62728 1984-03-30
JP59-62728 1984-03-30
JP59062728A JPS60206163A (ja) 1984-03-30 1984-03-30 半導体記憶装置

Publications (2)

Publication Number Publication Date
KR850006981A true KR850006981A (ko) 1985-10-25
KR900005664B1 KR900005664B1 (ko) 1990-08-03

Family

ID=13208712

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019840006508A KR900005664B1 (ko) 1984-03-30 1984-10-19 반도체 기억장치

Country Status (4)

Country Link
EP (1) EP0159824B1 (ko)
JP (1) JPS60206163A (ko)
KR (1) KR900005664B1 (ko)
DE (1) DE3585173D1 (ko)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR930007522B1 (ko) * 1985-03-08 1993-08-12 가부시끼 가이샤 히다찌세이사꾸쇼 종형 커패시터를 사용한 반도체메모리
US4751558A (en) * 1985-10-31 1988-06-14 International Business Machines Corporation High density memory with field shield
JPS62120070A (ja) * 1985-11-20 1987-06-01 Toshiba Corp 半導体記憶装置
JPS63122261A (ja) * 1986-11-12 1988-05-26 Mitsubishi Electric Corp 半導体装置の製造方法
US5260226A (en) * 1987-07-10 1993-11-09 Kabushiki Kaisha Toshiba Semiconductor device having different impurity concentration wells
DE3886283T2 (de) * 1987-07-10 1994-05-11 Toshiba Kawasaki Kk Halbleiterbauelement mit Bereichen unterschiedlicher Störstellenkonzentration.
US5726475A (en) * 1987-07-10 1998-03-10 Kabushiki Kaisha Toshiba Semiconductor device having different impurity concentration wells
KR910000246B1 (ko) * 1988-02-15 1991-01-23 삼성전자 주식회사 반도체 메모리장치
US5208597A (en) * 1988-10-13 1993-05-04 Crystal Semiconductor Compensated capacitors for switched capacitor input of an analog-to-digital converter
US4918454A (en) * 1988-10-13 1990-04-17 Crystal Semiconductor Corporation Compensated capacitors for switched capacitor input of an analog-to-digital converter

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57186354A (en) * 1981-05-13 1982-11-16 Hitachi Ltd Semiconductor memory storage and manufacture thereof
JPS583261A (ja) * 1981-06-29 1983-01-10 Fujitsu Ltd 竪型埋め込みキヤパシタの製造方法
JPS58137245A (ja) * 1982-02-10 1983-08-15 Hitachi Ltd 大規模半導体メモリ

Also Published As

Publication number Publication date
EP0159824A2 (en) 1985-10-30
JPS60206163A (ja) 1985-10-17
EP0159824B1 (en) 1992-01-15
DE3585173D1 (de) 1992-02-27
EP0159824A3 (en) 1987-04-01
KR900005664B1 (ko) 1990-08-03

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