KR20230022567A - Socket guider for tester of testing electronic components - Google Patents

Abstract

The present invention relates to a socket guider for an electronic component tester. The socket guider according to the present invention has an elastic support which maintains the posture of the electronic component by supporting both ends of the electronic component inserted into a test slit. According to the present invention, large electronic components such as SD can be precisely connected to the tester, so that reliability of electrical contact between the electronic component and the tester may be improved.

Description

Socket guider for electronic component testers {SOCKET GUIDER FOR TESTER OF TESTING ELECTRONIC COMPONENTS}

The present invention relates to a socket guider for testing an electronic component for precisely guiding the movement of an electronic component when inserting the electronic component into a test slit.

Produced electronic parts (eg, SSDs, circuit boards, semiconductor devices, etc.) are tested by a tester and then divided into good products and defective products, and only good products are shipped.

An electronic component can be tested only when it is electrically connected to the tester. At this time, the equipment that supports the electronic component to be tested by electrically connecting the electronic component to the tester is a handler for testing the electronic component (hereinafter referred to as 'handler'). am.

Conventionally, a relatively large electronic component such as a solid state drive (SSD) has been supported for testing by a worker directly connecting or disconnecting the tester. However, as the demand for SSD has increased exponentially, the present applicant has developed and proposed a handler for automatically handling and electrically connecting or disconnecting the SSD to the tester.

An electronic component such as an SD can be electrically connected to a tester by being inserted into a slit test socket (hereinafter referred to as a 'test slit') since a terminal is formed on one side of the electronic component. At this time, the socket guider appropriately guides the movement of the electronic component in the process of inserting the electronic component into the test slit. In addition, the socket guider serves to support the electronic component inserted into the test slit.

However, specifications of electronic components such as SDs are continuously upgraded, and accordingly, as more electronic devices are additionally installed to achieve high integration and high density, the weight of large electronic components tends to increase more and more.

Meanwhile, although the socket guider supports the electronic component, it must guide the electronic component to be movable. Also, this means that the socket guider is strongly adhered to both ends of the electronic component, so that a structure for stably supporting the electronic component cannot be obtained. Therefore, at present, the proper posture of the electronic component is maintained by the insertion force when the electronic component is inserted into the test slit.

In general, as shown in the reference drawing of FIG. 22, in the state where the electronic component (ED) is inserted into the test slit (S), the portion supported by the tester is only a partial area at the rear end, and the weight of the electronic component is increased in the remaining area. Electronic elements (EE) are installed. So, as mentioned above, since the weight of the electronic component (ED) increases more and more, in the near future, the electronic component (ED) cannot maintain an appropriate posture while inserted into the test slit (S) due to operating shock or load. It is expected that the timing will come. If the electronic component ED fails to maintain an appropriate posture, a short circuit or test failure may occur due to poor electrical contact.

Republic of Korea Patent Publication 10-2019-0050483 Republic of Korea Patent Publication 10-2019-0061291

The present invention was devised from the motivation to properly maintain the posture of a large electronic component electrically connected to a tester with a structure inserted into a test slit.

A socket guider for an electronic component tester according to the present invention includes a pair of guider bodies provided to support both ends of an electronic component inserted into an elongated test slit into which a contact terminal side of the electronic component is inserted; and a pair of elastic supports coupled to the guider body in a replaceable manner and elastically supporting both ends of the electronic component having the contact terminal side inserted into the test slit to maintain the posture of the electronic component; The pair of guider bodies are provided on both sides of the test slit in the elongated direction of the test slit, and the pair of elastic supports are divided into the pair of guider bodies to be detachable from the guider body installed

The guider body has a long guide groove formed in the movement direction of the electronic component to guide the movement of the electronic component in the process of being inserted into the test slit, and a coupling groove is formed at one point of the guide groove. The elastic support is a ball plunger provided in a structure inserted into the coupling groove, and the ball of the ball plunger is elastically supported by a spring to press the electronic component.

The elastic support includes a coupling portion coupled to the guider body; a guide portion in which a long guide groove is formed in the moving direction of the electronic component to guide the movement of the electronic component in the process of being inserted into the test slit; and at least one elastic part protruding from the coupling part toward the guider body so that the coupling part and the guide part can be elastically supported with respect to the guider body. Including, the guider body is formed with a coupling groove into which the coupling portion can be coupled, and the coupling portion is coupled to the guider body by being inserted into the coupling groove.

The coupling part is fitted into the coupling groove while moving from the rear to the front.

The coupling part, the guide part and the elastic part are integrally formed.

The elastic support is provided with a synthetic resin material that can be elastically deformed and restored and injection molded.

The coupling portion has a fitting groove for fitting and inserting the elastic portion, and the elastic portion is inserted into the fitting groove to be fitted into the coupling portion.

The coupling portion and the guide portion are integrally molded, and the elastic portion can be elastically deformed and restored, and is softer than the coupling portion and the guide portion and is injection-molded with a synthetic resin material.

A calibration hole on the side of the gripping mechanism coupled to the guider body so as to protrude forward and calibrating the position of the electronic component supplied by the gripping mechanism so that the contact terminal side of the electronic component is precisely inserted into the test slit at least one orthodontic pin to occlude; The calibration pin is positioned away from an imaginary straight line passing through the test slit in the elongated direction of the test slit, and the calibration hole is positioned away from a plane including one surface of the electronic component gripped by the gripping mechanism. .

A calibration hole on the side of the gripping mechanism coupled to the guider body so as to protrude forward and calibrating the position of the electronic component supplied by the gripping mechanism so that the contact terminal side of the electronic component is precisely inserted into the test slit a first correction pin and a second correction pin to mate; The first calibration pin and the second calibration pin are spaced apart from each other away from an imaginary straight line passing through the test slit in the elongated direction of the test slit, and the first calibration pin has an eddy-shaped electronic component at 90 It is used for calibrating the position of the electronic component when it is inserted into the test slit after being erected, and the second correction pin is used to correct the position of the electronic component when the vortex electronic component is inserted into the test slit after being erected at -90 degrees. It is used for calibrating, and the calibrating hole is located away from a plane containing one surface of the electronic component gripped by the gripping mechanism.

According to the present invention, there are the following effects.

First, reliability of the electrical connection between the electronic component and the tester is improved because both ends of the heavy electronic component are pressurized by the elastic support in a state in which a large electronic component is inserted into the test slit, and thus the posture can be stably maintained.

Second, since the guider body and the elastic support of a different material are provided interchangeably, only the elastic support can be exchanged when problems such as abrasion and loss of elasticity occur, so replacement cost can be reduced and stability can be sought.

Third, since the calibration pin is divided into both sides based on the imaginary center line, the test conditions must be changed, the contact sequence between the terminal of the test socket and the terminal of the electronic component must be changed, or the insertion direction of the electronic component must be changed according to the tester. It is possible to respond at any time.

1 is a reference diagram for explaining an electrical connection structure between an electronic component and a tester.
2 is a reference view for explaining the installation position of the socket guider according to the present invention.
3 is a schematic plan view of a handler paired with a tester.
FIG. 4 is a schematic three-dimensional view of the handler of FIG. 3 .
FIG. 5 is a conceptual plan view of a connection part in the handler of FIG. 3 .
Figure 6 is a schematic excerpt of the main part in the connection portion of Figure 5.
FIG. 7 is an excerpt of a stage in the connection portion of FIG. 5 .
FIG. 8 is an excerpt of the test hand in the connection part of FIG. 5 .
Figure 9 is an excerpt of the gripping element in the test hand of Figure 8;
Figure 10 is an excerpt of the opening element in the test hand of Figure 8;
Figure 11 is an excerpt of the connection elements in the test hand of Figure 8.
12 is a perspective view of the socket guider according to the first embodiment of the present invention.
13 to 15 are reference views for explaining the socket guider of FIG. 12 .
16 is a perspective view of a socket guider according to a second embodiment of the present invention.
17 is a partially exploded perspective view of a characteristic part of the socket guider of FIG. 16;
18 and 19 are reference views for explaining the socket guider of FIG. 16 .
20 and 21 are reference views for explaining modified examples of the socket guider of FIG. 16 .
22 is a reference diagram for explaining the background art.

Preferred embodiments according to the present invention will be described with reference to the accompanying drawings, but for brevity of description, descriptions of overlapping or substantially identical configurations will be omitted or compressed as much as possible.

<Description of electrical connection between electronic components and tester>

The socket guider (100, 200: see FIGS. 11 and 14) according to the present invention is applied when the contact terminal side of the electronic component is inserted into the test slit of the tester.

For example, as shown in FIG. 1, a test slit (S) is provided in the tester (TESTER), and the contact terminal (T) side of the electronic component (ED) is inserted into the corresponding test slit (S) so that the electronic component ( ED) and the tester (TESTER) are electrically connected.

And as referenced in FIG. 2 , the socket guiders 100 and 200 according to the present invention are installed around the test slit S. These socket guiders (100, 200) guide the movement of the electronic component (ED) in the process of inserting the electronic component (ED) into the test slit (S) by the handler, and the electronic component (ED) guides the movement of the test slit (S). while being inserted into and maintaining the posture of the inserted electronic component (ED). This will be described in detail later by dividing each embodiment.

<A brief description of the overall structure of the handler>

FIG. 3 is a schematic plan view of the handler HR paired with the tester TSETER, and FIG. 4 is a schematic three-dimensional view of the handler HR of FIG. 3 .

The handler HR according to this embodiment includes a stacker part SP, a connection part CP, and a transfer part TP.

The stacker part SP accommodates the customer trays CT on which the electronic parts ED are seated. This stacker part (SP) is used to receive customer trays (CTs) on which electronic parts (EDs) to be tested are seated from outside, or to send out customer trays (CTs) on which electronic parts (EDs) that have been tested are seated outside. used In addition, the stacker part SP is also used for storing customer trays CTs that have been brought in from the outside or are to be taken out of the outside.

The connection part (CP) draws out the electronic part (ED) from the customer tray (CT) from the stacker part (SP) and electrically connects it to the tester (TESTER) at the rear, or the test is completed by the tester (TESTER) The electronic components (ED) are placed in the customer tray (CT) while being classified by test grade.

The transfer part (TP) transfers the customer tray (CT) between the stacker part (SP) and the connection part (CP). That is, the customer trays (CT) on which the electronic components (ED) to be tested are seated are supplied from the stacker portion (SP) to the connection portion (CP) by the transfer portion (TP), and the tested electronic component (ED) ) are seated, the customer trays CT are retrieved from the connection part CP to the stacker part SP by the transfer part TP.

Continuing, the connection part (CP) related to the socket guider (100, 200) according to the present invention will be looked at in more detail.

As shown in the conceptual plan view of FIG. 5 and the excerpt of the main part (I) of FIG. It includes a reciprocating mover 550 and a test hand 560.

The holder 510 is provided to mount the electronic component ED. The electronic component ED may be mounted on the holder 510 by itself or may be mounted on the holder 510 with an adapter AD capable of holding the electronic component ED. This stage 510 includes a pair of fixing members 511, a driving source 512, and a pair of transmission elements 513, as referenced in (a) and (b) of FIG.

The pair of fixing members 511 may fix or release the fixing of the electronic component ED by widening or narrowing the gap in the left-right direction. That is, when the fixing members 511 linearly move in the left and right directions while being guided by the guide rail GR, and the gap between the fixing members 511 widens, the electronic component ED or the adapter in which the electronic component ED is seated A state in which the electronic component (ED) is fixedly seated on the holder 510 when the AD is mounted on the holder 510 or can be separated from the holder 510 and the distance between the fixing members 511 is narrowed. becomes

The driving source 512 supplies a driving force for adjusting the distance between the pair of fixing members 511, and is provided as a cylinder in this embodiment.

The transmission element 513 transmits the driving force applied by the driving source 512 to the pair of fixing members 511 . In this embodiment, while the transmitting element 513 rotates, it takes a link structure in which the forward and backward forces of the driving source 512, which is a cylinder, are converted into the left and right moving force of the fixing member 511 and transmitted, but various modifications are possible according to the implementation. You will be able to.

The moving hand 520 moves the electronic component ED to be tested from the customer tray CT from the stacker portion SP to the supply position FP by the transfer portion TP and places it on the cradle 510. or move the tested electronic component (ED) placed in the holder 510 to the customer tray (CT) in the recovery position (RP). The moving hand 520 grips the eddy-shaped electronic component ED by vacuum adsorption. It is provided with several adsorption elements so that one or more adsorption elements selectively adsorb the electronic component ED of various sizes. All are implemented to be adsorbed and held (see Application No. 10-2020-0019380).

The opener 530 is used when an adapter AD is applied to mount the electronic component ED on the holder 510 . Here, the adapter (AD) serves as a holding mechanism and a carrier for handling the relatively small electronic component (ED) having a size that is difficult to directly mount on the holder 510 (see Application No. 10-2021-0017446). That is, the opener 530 pushes the operating member of the adapter AD in the first work area W1 to open the adapter AD, so that the moving hand 520 loads the electronic component ED on the adapter AD. or let it be called. The opener 530 may include a pusher 531 for pushing an operating member to open the adapter AD and a forward/retract member 532 for moving the pusher 531 forward and backward.

The converter 540 ultimately changes the posture of the electronic component ED mounted on the holder 510 by rotating the holder 510 by 90 degrees or -90 degrees. That is, the posture of the electronic component ED may be converted from a vortex to a standing position or from a standing position to a vortex position by the converter 540 . The electronic component (ED) whose posture has been converted from the eddy-shaped to the eddy-shaped by such a converter 540 is in a state in which the contact terminal (T) side part can be properly inserted into the test slit (S), The electronic component ED converted to ED is in a state in which it can be properly adsorbed and held by the moving hand 520 . Of course, when the electronic component (ED) is electrically connected to the tester (TESTER) in a eddy state (for example, when the test slit is formed long in the horizontal direction), the converter 540 does not perform its role, or the converter 540 The configuration of 540 may be omitted. Here, the reason why the transducer 540 is configured to selectively rotate the pass through 510 by 90 degrees or -90 degrees is related to the position of the connection terminal in the test slit (S). That is, since the contact terminal (T) of the electronic component (ED) and the connection terminal in the test slit (S) must face each other in order to make electrical contact, the electronic component (ED) with the connection terminal in the test slit (S) is inserted. Depending on whether it is on the left or right side as a reference, the contact terminal T of the electronic component ED needs to be rotated to face the connection terminal.

The reciprocating mover 550 moves the stepper 510 between the first work area W1 where the moving hand 520 works and the second work area W2 where the test hand 560 works. Since the carrier 510 moves back and forth between the first work area W1 and the second work area W2 by the reciprocating mover 550, the first work area W1 and the second work area W2 are Interference between the mobile hand 520 and the test hand 560 can be eliminated.

The test hand 560 grips and moves the electronic component ED mounted on the holder 510 in the second work area W2 to place the contact terminal T side of the electronic component ED in the test slit ( S), and when the test for the electronic component (ED) is finished, the electronic component (ED) is withdrawn from the test slit (S), and then the electronic component (ED) for which the test has been completed is placed in the process (510) again. let it Of course, when the adapter AD is applied, the test hand 560 moves the adapter AD holding the electronic component ED. To this end, as shown in the excerpt of FIG. 8, the test hand 560 includes a gripping element 561, horizontal moving elements 562a and 562b, vertical moving elements 563, opening elements 564 and connection elements 565. includes

The gripping element 561 is provided to grip or release the gripping of the electronic component ED or the adapter AD. To this end, as referred to in the drawing of FIG. 9 , the gripping element 561 is mutually operated by the driving force of the first driving source 561b. It has a pair of gripping members 561a-1 and 561a-2 capable of gripping or releasing the electronic component ED or adapter AD by widening or narrowing the gap between them.

The horizontal moving elements 562a and 562b move the gripping element 561 horizontally in left and right and forward and backward directions so that the electronic component ED is moved to the currently empty test slit S among the plurality of test slits S. make it possible

The vertical movement element 563 moves the gripping element 561 in the vertical direction, so that the gripping element 561 grips the electronic component ED or adapter AD in the gripping position, or the gripped electronic component ED or It allows the adapter (AD) to be raised to the height required for testing, and vice versa.

The opening element 564 slightly opens the adapter AD to the extent that the electronic component ED can be retained in the adapter AD when the adapter AD is applied. To this end, the opening element 564 has a first pusher 564a that can move forward and backward by the second drive source 564b, as shown in the excerpt of FIG. 10 . Here, the first pusher 564a gently pushes the operating member of the adapter AD in a state where the gripping element 561 grips the adapter AD to open the adapter AD, thereby allowing the electronic component ED to move to the adapter AD. ) so that it can be moved backward while being maintained. That is, the opening element 564 provided in the test hand 560 opens the adapter AD only to the extent that the electronic component ED can move backward without being separated from the adapter AD. Accordingly, the electronic component ED can be moved backward while still loaded on the adapter AD.

As shown in the excerpt of FIG. 11, the connection element 565 is connected to the contact terminal T of the electronic component ED by pushing the electronic component ED backward by the second pusher 565a moving forward and backward by the operating source 565b. ) side can be inserted into the test slit (S). In addition, the socket guiders 100 and 200 according to the present invention function when the contact terminal T side of the electronic component is inserted into the test slit S by the operation of the connecting element 565 and in the inserted state.

For reference, in this embodiment, the test hand 560 is configured to hold the electronic component ED or adapter AD, whose posture has been converted from a lying position to a standing position by the converter 540, but the test slit S Depending on the shape, the test hand 560 may be implemented to hold the vortex electronic component ED or adapter AD.

<First Embodiment of Socket Guider>

12 is a perspective view of the socket guider 100 according to the first embodiment of the present invention. The socket guider 100 according to the present embodiment includes a pair of guider bodies 110, ball plungers 120, first calibration pins 131, second calibration pins 132, and a coupling member 140. include them

The pair of guider bodies 110 are provided to face each other on both sides of the test slit S in the vertical direction with the elongated test slit S interposed therebetween in the vertical direction, and have the same configuration. The pair of guider bodies 110 are provided to guide the movement of the electronic component ED inserted into the test slit S and ultimately support both ends of the electronic component ED.

A guide groove 111 is formed in the guider body 110 in the forward and backward direction, which is the moving direction of the electronic component ED. The front end of the guide groove 111 expands toward the front so that the electronic component ED moving backward can be properly inserted into the guide groove 111 .

In addition, a coupling groove 112 is formed in the guide groove 111 in the vertical direction at one point on the guide groove 111 in the guider body 110 .

Two ball plungers 120 form a pair, and maintain the posture of the electronic component ED by elastically supporting both ends of the electronic component ED with the contact terminal T side inserted into the test slit S. It is provided as an elastic support. In addition, the ball plungers 120 forming a pair are divided into a pair of guider bodies 110 and are disposed in a structure in which they are inserted into coupling grooves 112 in the vertical direction.

The first calibration pin 131 mates with the calibration hole (RH, see FIG. 8) on the side of the holding mechanism (which may be an adapter or a test hand) to correct the position of the electronic component ED held by the holding mechanism. The part on the contact terminal (T) side of the component (ED) is induced to be precisely inserted into the test slit (S). As shown in the reference diagram of FIG. 13, the first calibration pin 131 is disposed at a position that deviated to the right from the virtual straight line L when a virtual straight line L passing vertically through the center of the test slit S is drawn. .

The second calibration pin 132 mates with the calibration hole RH on the holding mechanism side to correct the position of the electronic component ED held by the holding mechanism so that the contact terminal T side of the electronic component ED is It is induced to be precisely inserted into the test slit (S). As shown in the reference drawing of FIG. 13 , the second calibration pins 132 are symmetrically spaced apart from the first calibration pins 131 with an imaginary straight line L therebetween. Of course, the second correction pin 132 is also disposed at a position deviating from the imaginary straight line L to the left.

In addition, in the process of inserting the electronic component ED into the test slit S, the first calibration pin 131 and the second calibration pin 132 are selectively used.

For example, the first calibration pin 131 is used for calibrating the position of the electronic component ED when it is inserted into the test slit S after the electronic component ED is erected at 90 degrees, and the second The calibration pin 132 is used for calibrating the position of the eddy-shaped electronic component ED when it is inserted into the test slit S after the electronic component ED is erected at -90 degrees.

For reference, in this description, only the calibration hole RH is formed in the test hand 560 through FIG. 8 as an example, but the calibration hole RH may be formed in the adapter AD depending on the implementation. . At this time, regardless of which configuration is adopted as the gripping mechanism, as shown in the conceptual diagram of FIG. 14, the calibration hole RH is located on one side from the plane PS including one side of the electronic component ED gripped by the gripping mechanism (FIG. 14). In the lower side), it is positioned to mate with the first correction pin 131 or the second correction pin 132.

The coupling members 140 fixably couple the ball plunger 120 inserted into the coupling groove 112 to the guider body 110. Therefore, after the coupling members 140 are dismantled, the ball plunger 120 whose life has expired can be replaced. That is, the ball plunger 120 is coupled to the guider body 110 to be replaceable.

According to the first embodiment as described above, as referred to in the exaggerated and conceptual cross-sectional view of FIG. 15, the ball 121 is inserted into the test slit S at the contact terminal T side of the electronic component ED. While being elastically supported by the spring 122, both ends (TT, DT: see FIG. 22) of the electronic component ED are pressed. Accordingly, since the electronic component ED receives the pressing force of the ball 121 in addition to the pinching force received from the test slit S, it can be maintained inserted into the test slit S in a stable and appropriate posture.

<Second Embodiment of Socket Guider>

16 is a perspective view of a socket guider 200 according to a second embodiment of the present invention, and FIG. 17 is a partially exploded perspective view of a characteristic part of the socket guider 200 of FIG. 16 .

The socket guider 200 according to the present embodiment includes a pair of guider bodies 210, an elastic support 220, first correction pins 231 and second correction pins 232.

The pair of guider bodies 210 are provided to face each other on both sides of the test slit S in the vertical direction with the elongated test slit S interposed therebetween in the vertical direction, and have the same configuration. The pair of guider bodies 210 are provided to guide the movement of the electronic component ED inserted into the test slit S and ultimately support both ends of the electronic component ED. As in the first embodiment, the guider body 210 has a coupling groove 212 to which the elastic support 220 can be coupled.

The elastic support 220 includes a coupling portion 221, a guide portion 222, and an elastic portion 223, as shown in the perspective views (a) and (b) of FIG. 18.

The coupling portion 221 is coupled to the guider body 210 by being inserted into the coupling groove 212 . At this time, the coupling portion 221 is fitted into the coupling groove 212 while moving from the rear to the front, and its rear end protrudes downward to form a locking jaw (J). As a result, the back of the elastic support 220 comes into contact with the front of the tester, and the locking jaw J is caught on the rear end of the guider body 210, so the elastic support 220 is coupled to the coupling groove 212 It is fundamentally prevented from moving backwards or forwards and leaving.

The guide part 222 has a guide groove 222a formed long in the front-rear direction, which is the moving direction of the electronic component ED, to guide the movement of the electronic component ED in the process of being inserted into the test slit S.

The elastic part 223 protrudes from the coupling part 221 toward the guider body 210 so that the coupling part 221 and the guide part 222 can be elastically supported with respect to the guider body 210. It is preferable that the elastic part 223 is provided in plurality in order to properly balance and size the elastic force. Of course, the elastic part 223 may have a 'L' shape as shown in FIG. 18, but depending on the implementation, it may also have a protruding short protrusion. In this case, the end has a round shape to reduce friction Problems can also be designed to be solved.

And the coupling part 221, the guide part 222 and the elastic part 223 are integrally formed. That is, it is preferable that the elastic support 220 is provided with a synthetic resin material (for example, Ultem) capable of elastic deformation and restoration and injection molding.

Since the first calibration pins 231 and the second calibration pins 232 are the same as those in the first embodiment, their descriptions are omitted.

According to the second embodiment as described above, as referred to in the exaggerated and conceptual cross-sectional view of FIG. 19, the elastic portion 223 in the state where the contact terminal T side of the electronic component ED is inserted into the test slit S The elastic force of ) presses the electronic component ED in a state where the contact surface constituting the guide groove 222a of the elastic support 220 is in close contact with both ends of the electronic component ED (TT, DT: see FIG. 22). . Accordingly, since the electronic component ED receives the pressing force of the elastic support 220 in addition to the pinching force received from the test slit S, it can be maintained in a state inserted into the test slit S in a stable and appropriate posture.

<Modification to the second embodiment>

20 and 21 are a perspective view and an exploded view according to a modification of the second embodiment described above, more specifically, a modification of the elastic supporter 220.

In the elastic support 220 according to this modified example, only the coupling portion 221 and the guide portion 222 are integrally molded. Instead, a fitting groove 221a into which the elastic part 223 can be inserted is formed in the coupling part 221 .

The elastic portion 223 has a fitting protrusion 223a and four elastic feet 223b-1, 223b-2, 223b-3, and 223b-4, and is integrally injection-molded.

The fitting protrusion 223a is inserted into the fitting groove 221a, so that the elastic part 223 can ultimately be fitted into the coupling part 221.

The four elastic feet 223b-1, 223b-2, 223b-3, and 223b-4 are divided into two and each extend forward and backward from the fitting protrusion 223a. That is, the elastic part 223 has an 'H' shape when viewed from the bottom. And the elastic feet (223b-1, 223b-2, 223b-3, 223b-4) extend obliquely downward as they get farther from the fitting protrusion (223a) so that their ends come into contact with the bottom surface forming the coupling groove (212). has been

On the other hand, the coupling part 221 and the guide part 222 are molded integrally, and are relatively harder than the elastic part 223, so it is preferable to have hard physical properties that are very slow to be damaged by use. Of course, it is preferable that the coupling part 221 and the guide part 222 are also provided with a synthetic resin material capable of injection molding, but it is not necessarily limited to that material.

Also, the elastic portion 223 is made of a material that is softer than the coupling portion 221 and the guide portion 222 and can be elastically deformed and restored. For example, the elastic part 223 may be made of thermoplastic polyurethane resin for proper elastic deformation and restoration.

According to this modification, compared to the second embodiment, only the elastic part 223, which is easily damaged by continuous elastic deformation, can be separately replaced, thereby lowering the replacement cost and approaching the eco-friendly structure more closely through resource saving. It is more desirable because it has Of course, when damage is applied to the coupling part 221 and the guide part 222 due to long use, the elastic support 220 itself may need to be replaced, but the replacement cycle will be longer than that of the second embodiment .

Meanwhile, the above embodiments have been described taking a structure in which the electronic component ED is inserted into the elongated test slit S in the vertical direction while moving in the forward and backward directions, but the present invention is not limited to such a structure. For example, the present invention can be applied even when the test slit is elongated in the left and right directions, and can be appropriately applied to a structure in which the electronic component (ED) is inserted into the test slit while moving in the vertical direction.

As described above, the detailed description of the present invention has been made by the embodiments with reference to the accompanying drawings, but since the above-described embodiments have only been described with reference to preferred examples of the present invention, the present invention is limited to the above embodiments. It should not be understood as being limited, and the scope of the present invention should be understood as the following claims and their equivalents.

100, 200: socket guider
110, 210: guider body
111: guide groove
112, 212: coupling groove
120: ball plunger
121: ball 122: spring
220: elastic support
221: coupling part
222: guidance part
222a: guide groove
223: elastic part
131, 231: first calibration pin 132, 232: second calibration pin
140: coupling member
L: imaginary straight line

Claims (10)

a pair of guider bodies provided to support both ends of the electronic component inserted into the elongated test slit into which the contact terminal side of the electronic component is inserted; and
a pair of elastic supports coupled to the guider body in a replaceable manner and maintaining the posture of the electronic component by elastically supporting both ends of the inserted electronic component while the contact terminal side is inserted into the test slit; Including,
The pair of guider bodies are provided on both sides of the test slit in the elongated direction of the test slit,
The pair of elastic supports are divided into the pair of guider bodies and detachably installed in the guider body
Socket guider for testing electronic components. According to claim 1,
The guider body has a long guide groove formed in the movement direction of the electronic component to guide the movement of the electronic component in the process of being inserted into the test slit, and a coupling groove is formed at one point of the guide groove,
The elastic support is a ball plunger provided with a structure inserted into the coupling groove,
The ball of the ball plunger presses the electronic component while being elastically supported by the spring.
Socket guider for testing electronic components. According to claim 1,
The elastic support
a coupling portion coupled to the guider body;
a guide portion in which a long guide groove is formed in the moving direction of the electronic component to guide the movement of the electronic component in the process of being inserted into the test slit; and
at least one elastic part protruding from the coupling part toward the guider body so that the coupling part and the guide part can be elastically supported with respect to the guider body; including,
The guider body is formed with a coupling groove into which the coupling portion can be coupled, and the coupling portion is inserted into the coupling groove to be coupled to the guider body
Socket guider for testing electronic components. According to claim 3,
The coupling portion has a locking jaw caught at the rear end of the guider body in the process of being fitted into the coupling groove while moving from rear to front
Socket guider for testing electronic components. According to claim 3,
The coupling part, the guide part and the elastic part are integrally formed
Socket guider for testing electronic components. According to claim 5,
The elastic support is provided with a synthetic resin material capable of elastic deformation and restoration and injection molding.
Socket guider for testing electronic components. According to claim 3,
The coupling part is formed with a fitting groove for inserting the elastic part,
The elastic part is fitted into the fitting groove and is fitted into the coupling part.
Socket guider for testing electronic components. According to claim 7,
The coupling part and the guide part are integrally molded,
The elastic part can be elastically deformed and restored, and is injection molded of a synthetic resin material while being softer than the coupling part and the guide part.
Socket guider for testing electronic components. According to claim 1,
A calibration hole on the side of the gripping mechanism coupled to the guider body so as to protrude forward and calibrating the position of the electronic component supplied by the gripping mechanism so that the contact terminal side of the electronic component is precisely inserted into the test slit at least one orthodontic pin to occlude; Including more,
The calibration pin is positioned away from an imaginary straight line passing through the test slit in the elongated direction of the test slit,
The correction hole is located away from a plane including one surface of the electronic component gripped by the gripping mechanism.
Socket guider for testing electronic components. According to claim 1,
A calibration hole on the side of the gripping mechanism coupled to the guider body so as to protrude forward and calibrating the position of the electronic component supplied by the gripping mechanism so that the contact terminal side of the electronic component is precisely inserted into the test slit a first correction pin and a second correction pin to mate; Including more,
The first calibration pin and the second calibration pin are spaced apart from each other in an elongated direction of the test slit, out of an imaginary straight line passing through the test slit,
The first calibration pin is used for calibrating the position of the electronic component when it is inserted into the test slit after the electronic component of the vortex is erected at 90 degrees, and the second calibration pin is used after the electronic component of the vortex is erected at -90 degrees It is used for calibrating the position of electronic components when inserted into the test slit,
The correction hole is located away from a plane including one surface of the electronic component gripped by the gripping mechanism.
Socket guider for testing electronic components.

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