TW202321702A - Socket guider for tester of testing electronic components - Google Patents

Abstract

The invention relates to a socket guide for electronic component testing. A socket guide according to the present invention has an elastic support body that maintains the posture of an electronic component by supporting both ends of the electronic component inserted into a test slit. According to the present invention, since a large electronic component such as a solid state drive can be accurately connected with the tester, the reliability of an electrical contact formed between the electronic component and the tester can be improved.

Description

Socket guides for electronic component testing

The present invention relates to a socket guide for electronic component testing that accurately guides movement of the electronic component when the electronic component is inserted into a test slit.

The electronic components produced (for example, SSD, circuit board, semiconductor components, etc.) are divided into good products and defective products after being tested by the tester, and only good products are released from the warehouse.

Electronic components can only be tested when they are electrically connected to the tester. At this time, the equipment that supports electronic components to be tested by electrically connecting electronic components to the tester is a sorting machine for electronic component testing (hereinafter referred to as "sorting machine") ").

Conventionally, a relatively large electronic component such as a solid state drive (SSD: Solid State Drive) supports testing in such a way that an operator directly connects or disconnects it to a tester. However, as the demand for solid-state drives increases sharply, the applicant of this case has developed and proposed a sorting machine for automatically handling solid-state drives to electrically connect or disconnect them from a tester.

Electronic components such as solid state drives may have terminals formed on one surface thereof to be inserted into test sockets in the form of slots (hereinafter referred to as “test slots”) so as to be electrically connected to a tester. At this time, it is the socket guide that properly guides the movement of the electronic component in the procedure of inserting the electronic component into the test slot. In addition, the insertion guide may also function to support the electronic component inserted into the test slot.

However, the specifications of electronic components such as solid-state drives continue to be upgraded. Accordingly, as more electronic components are added in a highly integrated and high-density manner, the weight of large electronic components tends to gradually increase.

In addition, although the socket guide supports the electronic components, the electronic components should be guided to be movable. Also, this means that the socket guide cannot be firmly attached to both ends of the electronic component to stably support the electronic component. Therefore, conventionally, the proper posture of the electronic component is maintained by the holding force of the state in which the electronic component is inserted into the test slot.

Usually, as shown in the reference diagram of FIG. 22, in the state where the electronic component ED is inserted into the test slot S, the part supported by the tester is only a part of the rear end, and the remaining part is provided with additional electronic components. The weight of electronic components EE. Therefore, as mentioned above, since the weight of the electronic component ED is gradually increasing, it is expected that in the near future, the electronic component ED will not be able to maintain a proper posture in the state inserted into the test slit S due to an operation shock or a load. . If the electronic part ED cannot maintain a proper posture, a short circuit or test failure due to poor electrical contact may occur.

(Prior art literature) (patent literature) Korean Publication Patent 10-2019-0050483 Korean Publication Patent 10-2019-0061291

The present invention is proposed to properly maintain the posture of a large electronic component electrically connected to a tester in a structure inserted into a test slot.

A socket guide for electronic component testing according to the present invention may include: a pair of guide bodies equipped to support both ends of an electronic component inserted into a test slit in an elongated form, the contact terminals of the electronic component The part on the side is inserted into the test slit; and a pair of elastic supporting bodies, which are replaceably combined with the guide body, and elastically support the electronic component or the electronic part during the insertion of the part on the side of the contact terminal into the test slit. Both ends of the inserted electronic part are completed to maintain the posture of the electronic part, wherein the pair of guide bodies are provided on both sides of the test slit in the elongated direction of the test slit, and the pair of elastic The supporting bodies are respectively divided into the pair of guide main bodies and detachably arranged on the guide main bodies.

In order to guide the movement of the electronic component in the process of being inserted into the test slot, an elongated guide groove is formed on the guide body along the moving direction of the electronic component, and a coupling groove is formed at a position of the guide groove. The elastic supporting body is a positioning ball plug inserted into the coupling groove, and the ball of the positioning ball plug is elastically supported by a spring while pressing the electronic component.

The elastic supporting body includes: a coupling part coupled with the guide main body; a guide part formed with elongated holes along a moving direction of the electronic component in order to guide the movement of the electronic component in a procedure of being inserted into the test slit. a guide groove; and at least one elastic portion protruding from the coupling portion toward the guide body side so that the coupling portion and the guide portion can be elastically supported by the guide body, wherein The main body is formed with a coupling groove into which the coupling part can be coupled, so that the coupling part is inserted into the coupling groove to be coupled with the guide body.

The coupling part is inserted into and coupled to the coupling groove while moving from the rear to the front.

The coupling portion, the guide portion, and the elastic portion are integrally formed.

The elastic supporting body is formed of a synthetic resin material capable of elastic deformation or recovery and injection molding.

The coupling portion is formed with an insertion groove for inserting the elastic portion, and the elastic portion is inserted into the coupling portion by being inserted into the insertion groove.

The coupling portion and the guiding portion are molded integrally, and the elastic portion is injection-molded with a material capable of elastic deformation and restoration, which is softer than the coupling portion and the guiding portion, and which is a synthetic resin.

Also includes at least one correction pin, which is combined with the guide body in a manner protruding forward, and corrects the position of the electronic part supplied through the holder, so that the part on the contact terminal side of the electronic part is accurately inserted into the test slot. slit so as to engage with a correction hole on the side of the holder, wherein the correction pin is located at a position deviated from an imaginary straight line passing through the test slit along the elongated direction of the test slit, the correction hole Located at a position deviated from a plane including a surface of the electronic component held by the holder.

It also includes a first correction pin and a second correction pin, which are combined with the guide main body in such a manner as to protrude forward, and correct the position of the electronic component supplied through the holder, so that the part on the contact terminal side of the electronic component is inserted accurately to the test slot so as to engage with the calibration holes on the side of the holder, wherein the first calibration pin and the second calibration pin pass through the test slot along the elongated direction of the test slot The position of the virtual straight line of the slit deviates from each other, and when the horizontal electronic component is inserted into the test slit after being erected at 90 degrees, the first calibration pin is used for correcting the position of the electronic component. When a horizontal electronic component is erected at -90 degrees and inserted into the test slot, the second calibration pin is used to correct the position of the electronic component, and the calibration hole is located from the A position deviated from the plane of a surface of an electronic component to be held.

According to the present invention, it has the following effects: First, when a heavy and large electronic component is inserted into the test slot, both ends are pressed by the elastic support body to maintain a stable posture, thereby improving the reliability of the electrical connection between the electronic component and the tester. Second, since the elastic support body made of a material different from that of the guide body is replaceable, only the elastic support body can be replaced when problems such as wear and loss of elastic force occur, thereby reducing and stabilizing replacement costs sex. Third, since the calibration pin is divided into two sides based on the virtual center line, the test conditions change, or the contact sequence between the terminals of the test socket and the terminals of the electronic component needs to be changed, or the electronic component needs to be changed according to the tester Any insertion direction etc. can be handled.

Referring to the drawings, preferred embodiments according to the present invention will be described. For the sake of brevity of description, descriptions on repeated or substantially identical configurations will be omitted or compressed as much as possible. <Explanation for electrical connection of electronic components and tester>

The socket guides 100 and 200 (see FIGS. 11 and 14 ) according to the present invention are applied to a case where the part on the contact terminal T side of the electronic component ED is inserted into the test slit S of the tester.

For example, as shown in FIG. 1 , the tester TESTER is equipped with a test slit S into which the portion on the contact terminal T side of the electronic component ED is inserted so that the electronic component ED is electrically connected to the tester TESTER.

And, as shown in FIG. 2 , socket guides 100 , 200 according to the present invention are disposed around the test slit S. Referring to FIG. Such socket guides 100, 200 guide the movement of the electronic component ED in the procedure of inserting the electronic component ED into the test slot S by the sorting machine, and maintain the electronic component ED during insertion into the test slot S and when the insertion is completed. The pose of the electronic part ED. In this regard, the following sequence will describe in detail according to each embodiment. <Schematic description of the overall structure of the sorter>

FIG. 3 is a schematic plan view for a handler forming a pair with a tester, and FIG. 4 is a schematic perspective view for the handler HR of FIG. 3 .

The sorter HR according to the present embodiment includes a stacker part SP, a connection part CP, and a transfer part TP.

The stacker part SP accommodates customer trays CT on which electronic components ED are placed. This stacker part SP is used for externally receiving customer trays CT on which electronic components ED to be tested are mounted, or for externally transferring customer trays CT on which electronic components ED to be tested are mounted. In addition, the stacker part SP can also be used for storing the customer tray CT carried in or carried out from the outside.

The connection part CP takes out the electronic components ED from the customer tray CT delivered by the stacker part SP, and electrically connects the electronic components ED to the tester TESTER at the back, or classifies the electronic components ED that have been tested by the tester TESTER according to the test level While placed on the customer tray CT.

The transfer part TP transfers the customer tray CT between the stacker part SP and the connection part CP. That is, the customer tray CT on which the electronic part ED to be tested is placed is supplied from the stacker part SP to the connecting part CP by the transfer part TP, and the customer tray CT on which the electronic part ED which has completed the test is placed is transferred from the connecting part by the transfer part TP. CP is recycled to stack part SP.

Next, the connection portion CP related to the socket guide 100, 200 according to the invention will be observed in more detail.

As shown in the schematic plan view of FIG. 5 and the sectional view of the main part I of FIG. 6, the connection part CP includes a placer 510, a moving hand 520, an opener 530, a converter 540, a reciprocating mover 550, and a testing hand 560. .

The placer 510 is equipped for placing the electronic component ED. The electronic component ED may be placed on the placer 510 as the electronic component ED itself, or may be placed on the placer 510 by attaching an adapter AD capable of holding the electronic component ED. As shown in sectional view (a) and sectional view (b) of FIG. 7 , such a placer 510 includes a pair of fixing members 511 , a driving source 512 and a pair of transmission elements 513 .

The pair of fixing members 511 can fix or unfix the electronic component ED by widening or narrowing the interval in the left-right direction. That is, the fixing member 511 is linearly moved in the left-right direction by being guided by the guide rail GR, and when the interval between the fixing members 511 becomes wider, the electronic component ED or the adapter AD on which the electronic component ED is placed is placed in the placer 510. Or in a state detached from the placer 510 , if the space between the fixing members 511 is narrowed, the electronic component ED is in a state of being fixedly mounted on the placer 510 .

The driving source 512 supplies a driving force for adjusting the interval between the pair of fixing members 511, and is equipped as an air cylinder in this embodiment.

The transmission element 513 transmits the driving force applied by the driving source 512 to the pair of fixing members 511 . In this embodiment, the transmission element 513 adopts a connection structure that converts the forward and backward force of the driving source 512 as the cylinder into the left and right movement force of the fixed member 511 while rotating, but various modifications can be made according to the implementation.

The moving hand 520 is placed on the placer 510 by moving the electronic components ED to be tested from the customer tray CT transferred from the stacker part SP to the supply position FP by the transfer part TP to be placed on the placer 510 or the completed test placed on the placer 510 The electronic components ED are moved to the customer tray CT at the recycling position RP. This mobile hand 520 holds the horizontal electronic component ED by vacuum suction, and it is realized that it is equipped with multiple adsorption elements and is selectively adsorbed by more than one adsorption element, so that it can be realized to hold various sizes for adsorption. All electronic components ED (refer to Korean Application No. 10-2020-0019380).

The opener 530 is used when the adapter AD is used to place the electronic component ED on the placer 510 . Here, the adapter AD is a holder for handling a relatively small electronic part ED having a size that is difficult to place directly on the placer 510, and also functions as a carrier (refer to Korean Application No. 10-2021-0017446 ). That is, since the opener 530 pushes the operating part of the adapter AD at the first operation area W1 to open the adapter AD, the moving hand 520 can load or unload the electronic part ED in the adapter AD. This opener 530 can include a pusher 531 and a forward and backward source 532, the pusher 531 is used to push the operating part, the operating part is used to operate the adapter AD to open the adapter AD, and the forward and backward source 532 is used to make the pusher 531 advance and retreat.

The converter 540 rotates the placer 510 by 90 degrees or −90 degrees to finally convert the posture of the electronic component ED placed on the placer 510 . That is, the posture of the electronic component ED can be changed from the lying state to the standing state, or from the standing state to the lying state by the converter 540 . With such a switch 540, the position of the electronic component ED whose position is changed from a lying position to a standing position is in a state where the portion on the contact terminal T side can be properly inserted into the test slit S, and the position is changed from a standing position to a lying position. The electronic component ED is in a state in which it can be properly sucked and held by the moving hand 520 . Of course, in the case where the electronic component ED is electrically connected to the tester TESTER in a lying state (for example, when the test slit is formed elongated in the horizontal direction), the converter 540 may not perform its function, or switch The configuration of the device 540 can also be omitted. Here, the reason why the switch 540 is configured to selectively rotate the placer 510 by 90 degrees or -90 degrees is related to the position of the connection terminal in the test slot S. As shown in FIG. That is, if the contact terminal T of the electronic component ED is to be in electrical contact with the connection terminal in the test slot S, they need to face each other. Therefore, depending on whether the connection terminal in the test slot S is located on the left or right side based on the inserted electronic component ED , it is necessary to rotate the contact terminals T of the electronic component ED so as to face the connection terminals with each other.

The reciprocating mover 550 moves the placer 510 between a first operation area W1 which is an area where the moving hand 520 operates and a second operation area W2 which is an area where the test hand 560 operates. Since the placer 510 travels back and forth between the first operation area W1 and the second operation area W2 through this reciprocating mover 550, the first operation area W1 and the second operation area W2 are regionally separated, thereby eliminating the possibility of moving the hand 520 from the test. Interference between hands 560.

The test hand 560 moves after holding the electronic component ED of the placer 510 placed in the second operation area W2, so as to insert the part of the electronic component ED on the contact terminal T side into the test slit S. After the test is completed, the electronic component ED is taken out from the test slit S, and the tested electronic component ED is placed on the placer 510 again. Of course, when the adapter AD is applied, the test hand 560 moves the adapter AD holding the electronic component ED. For this, as shown in the screenshot of FIG. 8 , the test hand 560 includes a grip element 561 , horizontal movement elements 562 a , 562 b , a vertical movement element 563 , an opening element 564 and a connection element 565 .

The holding element 561 is equipped for holding or releasing the electronic component ED or the adapter AD, and for this purpose, as shown in the sectional view of FIG. A pair of gripping members 561a-1, 561a-2 widened or narrowed so that the electronic component ED or the adapter AD can be gripped or released.

The horizontal movement elements 562a and 562b move the holding element 561 in the left-right and front-back directions, which are horizontal directions, so that the electronic component ED can be moved to the test slot S side which is currently vacant among many test slots S.

The vertical movement element 563 moves the holding element 561 along the vertical direction, so that the holding element 561 can hold the electronic part ED or the adapter AD in the holding position, or can lift the held electronic part ED or the adapter AD. As high as the test required, and also able to achieve its reverse operation.

The opening element 564 slightly opens the adapter AD to the extent that the electronic component ED can be maintained in the adapter AD when the adapter AD is used. For this, as shown in the cutaway view of FIG. 10 , the opening element 564 has a first pusher 564 a capable of advancing and retreating by a second driving source 564 b. Here, the first pusher 564a slightly pushes the operating member of the adapter AD while the holding element 561 is holding the adapter AD to open the adapter AD, thereby making the electronic component ED in a state capable of moving backward while being held on the adapter AD. . That is, the opening element 564 provided in the test hand 560 opens the adapter AD to such an extent that the electronic component ED can move backward without detaching from the adapter AD. Therefore, the electronic component ED can be moved backward while still being mounted on the adapter AD.

As shown in the sectional view of FIG. 11 , in the connecting element 565, the electronic component ED is pushed backward by the second pusher 565 a that advances and retreats by the operation source 565 b, so that the part on the contact terminal T side of the electronic component ED can be inserted. into the test slot S. Furthermore, the socket guides 100 and 200 according to the present invention play a role in the process of inserting the portion on the contact terminal T side of the electronic component ED into the test slit S and the inserted state through the operation of the connection element 565 .

For reference, in this embodiment, although the test hand 560 is configured to hold the electronic component ED or the adapter AD whose posture is converted from a lying position to an upright position by the converter 540, the test hand 560 may also It can be realized to hold a horizontal electronic component ED or an adapter AD. <The first embodiment for the socket guide>

Fig. 12 is a perspective view for the socket guide according to the first embodiment of the present invention. The socket guide 100 according to the present embodiment includes a pair of guide bodies 110 , ball plungers 120 , first correction pins 131 , second correction pins 132 , and coupling members 140 .

A pair of guide main bodies 110 are provided to face each other on both sides of the test slit S in the vertical direction with the vertically elongated test slit S interposed therebetween, and are identically constituted. Such a pair of guide bodies 110 is equipped to guide the movement of the electronic part ED inserted into the test slit S, and finally serves to support both ends of the electronic part ED.

The guide main body 110 is formed with a long guide groove 111 in the front-rear direction which is the moving direction of the electronic component ED. The front end portion of the guide groove 111 becomes larger toward the front, so that the electronic component ED moving backward can be properly inserted into the guide groove 111 .

Also, in the guide body 110 , a coupling groove 112 is formed at a position on the guide groove 111 in the vertical direction.

Two positioning ball plugs 120 constitute a pair, and are equipped as an elastic supporting body that elastically supports the side portions of the contact terminal T inserted into both ends of the electronic part ED of the test slit S to maintain the electronic part ED. pose. Also, the positioning ball plungers 120 that constitute a pair are divided into a pair of guide main bodies 110 and arranged to be inserted into the coupling groove 112 in the vertical direction.

The first correction pin 131 is engaged with the correction hole RH (refer to FIG. 8 ) on the side of the holder (which may be an adapter or a test hand), so that the position of the electronic part ED held by the holder can be corrected to guide the position of the electronic part ED. The portion on the side of the contact terminal T can be inserted into the test slit S accurately. As shown in the reference diagram of FIG. 13 , when a virtual straight line L passing through the center of the test slit S in the vertical direction is drawn, such a first correction pin 131 is arranged at a position deviated from the virtual straight line L toward the right.

The second correction pin 132 is engaged with the correction hole RH on the holder side, so that the position of the electronic part ED held by the holder can be corrected to guide the position of the contact terminal T side of the electronic part ED to be accurately inserted into the test slot. Seam S. As shown in the reference diagram of FIG. 13 , such second correction pins 132 are symmetrically spaced apart from the first correction pins 131 with the imaginary straight line L in the middle. Of course, the second correction pin 132 is also arranged at a position deviated from the virtual straight line L toward the left.

Further, in the procedure of inserting the electronic part ED into the test slit S, the above-mentioned first correction pin 131 and second correction pin 132 are selectively used.

For example, when the horizontal electronic component ED is inserted into the test slot S after being erected at 90 degrees, the first calibration pin 131 is used for correcting the position of the electronic component ED. The second correction pin 132 is used for correcting the position of the electronic component ED when it is inserted into the test slit S after being erected.

For reference, in this description, only the case where the correction hole RH is formed in the test hand 560 is exemplified through FIG. 8 , but the correction hole RH may also be formed in the adapter AD according to implementation. At this time, no matter which composition is used as the holder, as shown in the conceptual diagram of FIG. In FIG. 14 , the lower side) deviates, regardless of which configuration is selected as the holder, so as to engage with the first correction pin 131 or the second correction pin 132 .

The coupling member 140 fixedly couples the positioning ball plug 120 inserted into the coupling groove 112 to the guide body 110 . Therefore, after detaching the coupling member 140 later, the life-expired positioning ball plug 120 can be replaced. That is, the positioning ball plug 120 is replaceably coupled to the guide body 110 .

According to the aforementioned first embodiment, as shown in the exaggerated conceptual cross-sectional view of FIG. While supporting, pressurize both ends TT, DT (see FIG. 22 ) of the electronic component ED. Accordingly, since the electronic component ED receives the pressing force of the ball 121 in addition to the insertion force received in the test slot S, the state inserted into the test slot S can be maintained in a stable and appropriate posture. <Second embodiment for socket guide>

FIG. 16 is a perspective view of a socket guide 200 according to a second embodiment of the present invention, and FIG. 17 is a partially exploded perspective view of characteristic parts of the socket guide 200 of FIG. 16 .

The socket guide 200 according to the present embodiment includes a pair of guide bodies 210 , an elastic support body 220 , a first alignment pin 231 , and a second alignment pin 232 .

The pair of guide bodies 210 are provided to face each other on both sides of the test slit S in the vertical direction with the vertically elongated test slit S interposed therebetween, and are configured identically. Such a pair of guide bodies 210 is equipped to guide the movement of the electronic part ED inserted into the test slit S, and finally serves to support both ends of the electronic part ED. Similar to the first embodiment, a coupling groove 212 capable of coupling the elastic support body 220 is formed on the guide body 210 .

As shown in the sectional perspective view (a) and the sectional perspective view (b) of FIG. 18 , the elastic support body 220 includes a coupling portion 221 , a guiding portion 222 , and an elastic portion 223 .

The coupling part 221 is inserted into the coupling groove 212 to be coupled to the guide body 210 . At this time, the coupling portion 221 moves from the rear to the front to be inserted into the coupling groove 212 , and its rear end portion protrudes downward to form a locking platform J. As shown in FIG. Therefore, the rear surface of the elastic support body 220 is in contact with the front surface of the tester TESTER, and since the clamping platform J is in the state of being stuck on the rear end of the guide body 210, the elastic support body 220 is basically prevented from moving from the coupling groove 212 to the rear end of the guide body 210. Move back or forward or disengage.

In order to guide the movement of the electronic part ED in the process of being inserted into the test slit S, the guide part 222 has a guide groove 222a formed elongatedly in the front-rear direction as the moving direction of the electronic part ED.

The elastic portion 223 is formed to protrude from the coupling portion 221 to the guide body 210 side so that the coupling portion 221 and the guide portion 222 can be elastically supported from the guide body 210 . For proper size and balance of the elastic force, preferably, the elastic portion 223 is provided in multiples. Of course, as shown in Figure 18, the elastic part 223 can also have the shape of "𠃍", but according to the implementation, it can also be a shape with a short protrusion. In this case, it can also be designed to have a rounded shape at its end. Form, so as to be able to solve the problem of friction.

And, the coupling part 221, the guide part 222, and the elastic part 223 are integrally formed. That is, preferably, the elastic supporting body 220 is formed using a synthetic resin material (for example, polyetherimide) that is capable of elastic deformation and recovery and that can be injection molded at the same time.

Since the first correction pin 231 and the second correction pin 232 have the same structure as that of the first embodiment, description thereof will be omitted.

According to the aforementioned second embodiment, as shown in the exaggerated conceptual cross-sectional view of FIG. The contact surface of the guide groove 222 a pressurizes the electronic component ED in a state of being in close contact with both ends TT and DT (see FIG. 22 ) of the electronic component ED by the elastic force of the elastic portion 223 . Accordingly, since the electronic component ED receives the pressing force of the elastic support body 220 in addition to the insertion force from the test slit S, the state inserted into the test slit S can be maintained in a stable and appropriate posture. <Modification to the second embodiment>

20 and 21 are perspective views and exploded views according to the modified example of the second embodiment described above, more specifically, according to the modified example of the elastic support body 220 .

The elastic supporting body 220 according to the present modification is integrally formed of only the coupling portion 221 and the guide portion 222 . Meanwhile, an insertion groove 221 a into which the elastic portion 223 can be inserted is formed in the coupling portion 221 .

The elastic part 223 has an insertion protrusion 223a and four elastic feet 223b-1, 223b-2, 223b-3, 223b-4, and is integrally formed by injection molding.

The insertion protrusion 223 a is inserted into the insertion groove 221 a, so that the elastic part 223 can finally be inserted and combined with the coupling part 221 .

The four elastic feet 223b-1, 223b-2, 223b-3, 223b-4 are divided into two parts, and extend forward and rearward from the insertion protrusion 223a respectively. That is, the elastic portion 223 has an "H" shape when viewed from the bottom surface. Furthermore, the elastic legs 223b-1, 223b-2, 223b-3, 223b-4 extend downwardly as they get away from the insertion protrusion 223a, so that their ends contact the bottom surface constituting the coupling groove 212.

In addition, preferably, the coupling portion 221 and the guiding portion 222 are integrally formed and made of a relatively harder material than the elastic portion 223 , so as to have a hard physical property that is damaged very slowly due to use. Of course, preferably, the combining portion 221 and the guiding portion 222 can also be formed by injection-molding synthetic resin materials, but they are not limited to this material.

Also, the elastic portion 223 is formed using a material softer than the coupling portion 221 and the guide portion 222 and capable of elastic deformation and restoration. For example, the elastic portion 223 may be formed using thermoplastic urethane resin for proper elastic deformation and recovery.

According to this modified example, compared with the second embodiment, only the elastic portion 223 that is easily damaged due to continuous elastic deformation can be replaced alone, thereby reducing the replacement cost, and has a structure closer to the environment by saving resources, so better. Certainly, in the case that the coupling portion 221 and the guiding portion 222 are damaged due to long-term use, the elastic supporting body 220 itself can also be replaced, but the replacement cycle will be longer than that of the above-mentioned second embodiment.

In addition, the above-mentioned embodiment has described the structure in which the electronic component ED is inserted into the elongated test slit S in the vertical direction while moving in the front-rear direction, but the present invention is not limited to such a structure. For example, the present invention can be applied to a case where the test slit S is elongated in the left-right direction, and can also be suitably applied to a structure in which the electronic component ED is inserted into the test slit S while moving in the vertical direction.

As mentioned above, the specific description of the present invention has been described with reference to the embodiment of the drawings, but the above-mentioned embodiment has only been described as an example of a preferred example of the present invention. Therefore, the present invention should not be construed as being limited to The embodiments, and the scope of rights of the present invention should be understood as the scope of the patent application and its equivalent scope.

100,200: socket guide 110,210: guide body 111: guide groove 112,212: combination groove 120: Positioning ball plug 121: ball 122: spring 220: elastic support body 221: Combination part 222: Guidance part 222a: guide groove 223: elastic part 131,231: first correction pin 132,232: Second calibration pin 140: Combine parts L: virtual straight line

FIG. 1 is a reference diagram for explaining an electrical connection structure between an electronic component and a tester.

FIG. 2 is a reference diagram for explaining the installation position of the socket guide according to the present invention.

Figure 3 is a schematic plan view for a sorter forming a pair with a tester.

Fig. 4 is a schematic perspective view of the sorting machine of Fig. 3 .

FIG. 5 is a schematic plan view for a connection portion of the sorter in FIG. 3 .

FIG. 6 is a schematic sectional view for main parts of the connection portion in FIG. 5 .

FIG. 7 is a cutaway view of the placer for the connection portion of FIG. 5 .

FIG. 8 is a cutaway view of the testing hand for the connection portion of FIG. 5 .

FIG. 9 is a screenshot for the grip elements of the test hand in FIG. 8 .

FIG. 10 is a screenshot for an open element of the test hand in FIG. 8 .

FIG. 11 is a screenshot of the connection elements for the test hand in FIG. 8 .

Fig. 12 is a perspective view for the socket guide according to the first embodiment of the present invention.

13 to 15 are reference views for explaining the socket guide of FIG. 12 .

Fig. 16 is a perspective view for a socket guide according to a second embodiment of the present invention.

FIG. 17 is a partially exploded perspective view of characteristic parts of the socket guide of FIG. 16 .

18 and 19 are reference views for explaining the socket guide of FIG. 16 .

20 and 21 are reference diagrams for explaining modifications to the socket guide of FIG. 16 .

FIG. 22 is a reference diagram for explaining the background art.

Domestic deposit information (please note in order of depositor, date, and number) none Overseas storage information (please note in order of storage country, institution, date, and number) none

131: The first calibration pin

132: Second correction pin

210: guide body

220: elastic support body

222a: guide groove

223: elastic part

T: contact terminal

ED: electronic components

Claims (10)

A socket guide for electronic component testing, comprising: a pair of guide bodies equipped to support both ends of an electronic component inserted into a test slot of an elongated form into which a portion on the contact terminal side of the electronic component is inserted; and A pair of elastic supports replaceably coupled to the guide main body, and elastically supporting the electronic part during insertion of the portion on the contact terminal side into the test slit or the electronic part after the insertion is completed. ends to maintain the posture of the electronic components, wherein the pair of guide bodies are provided on both sides of the test slit in an elongated direction of the test slit, The pair of elastic supports are respectively divided into the pair of guide body and detachably arranged on the guide body. The socket guide for electronic component testing according to claim 1, wherein In order to guide the movement of the electronic component in the process of being inserted into the test slot, an elongated guide groove is formed in the guide body along the moving direction of the electronic component, and at a position of the guide groove formed with coupling grooves, The elastic support body is a positioning ball plug equipped with a structure inserted into the coupling groove, The ball of the positioning ball plug is elastically supported by the spring while pressing the electronic component. The socket guide for electronic component testing according to claim 1, wherein The elastic support includes: a combining portion combined with the guide body; a guide part having an elongated guide groove formed in a moving direction of the electronic part in order to guide movement of the electronic part in a process of being inserted into the test slot; and at least one elastic portion protruding from the coupling portion toward the guide body side so that the coupling portion and the guide portion can be elastically supported by the guide body, Wherein the guide body is formed with a coupling groove to which the coupling part can be coupled, so that the coupling part is inserted into the coupling groove and coupled with the guide body. The socket guide for electronic component testing according to claim 3, wherein The engaging portion has an engaging stage that is engaged with the rear end of the guide body in a process in which the engaging stage is inserted into and engaged with the engaging groove while moving from the rear to the front. The socket guide for electronic component testing according to claim 3, wherein The coupling portion, the guide portion, and the elastic portion are integrally formed. The socket guide for electronic component testing according to claim 5, wherein The elastic supporting body is formed of a synthetic resin material capable of elastic deformation or recovery and injection molding. The socket guide for electronic component testing according to claim 3, wherein the coupling portion is formed with an insertion groove for inserting the elastic portion, The elastic portion is insert-coupled with the coupling portion by being inserted into the insertion groove. The socket guide for electronic component testing according to claim 7, wherein The coupling portion and the guide portion are integrally formed, The elastic portion is injection-molded with a material capable of elastic deformation and restoration, which is softer than the coupling portion and the guide portion, and which is a synthetic resin. The socket guide for testing electronic components according to claim 1, further comprising: At least one correction pin is combined with the guide body in such a manner as to protrude forward, and corrects the position of the electronic part supplied through the holder so that the part on the contact terminal side of the electronic part is accurately inserted into the test slit so as to snap into alignment holes on the side of the gripper, wherein the calibration pin is located at a position deviated from an imaginary straight line passing through the test slit along the elongate direction of the test slit, The alignment hole is located at a position deviated from a plane including a surface of the electronic component held by the holder. The socket guide for testing electronic components according to claim 1, further comprising: The first correction pin and the second correction pin, combined with the guide main body in a manner protruding forward, correct the position of the electronic part supplied through the holder so that the position of the contact terminal side of the electronic part is accurate. inserted into the test slot so as to snap into the calibration hole on the side of the holder, wherein said first calibration pin and said second calibration pin are spaced apart from each other from positions deviated from a virtual straight line passing said test slit along an elongated direction of said test slit, The first alignment pin is used to correct the position of the electronic component when the horizontal electronic component is erected at 90 degrees and then inserted into the test slot. When inserted into the test slot after being erected at -90 degrees, the second alignment pin is used for the purpose of correcting the position of the electronic component, The alignment hole is located at a position deviated from a plane including a surface of the electronic component held by the holder.

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