KR100828407B1 - Test handler for usb memory device - Google Patents

Abstract

A test handler for a USB memory device is provided to prevent a USB memory unit from being detached from a PCB(Printed Circuit Board) by directly supporting the PCB of the USB memory device. A loader unit(2) transfers a tray, on which a USB(Universal Serial Bus) memory device to be tested is mounted. An unloader unit(3) transfers the tray, on which a tested USB memory device is mounted. A test board(6) performs a test on the USB memory device. A shuttle unit(5) transfers the USB memory device and connects the USB memory device to the test board. The shuttle unit includes a separation preventing portion which supports a board of the USB memory device, when the tested USB memory device is separated from the test board. When the tested USB memory device is separated from the test board, a pickup unit(4) picks up the tested USB memory device between the loader unit and the shuttle unit and between the unloader unit and the shuttle unit, and transfers the USB memory device.

Description

Test Handler for USB Memory Device

1 is a perspective view of a USB memory device tested in a test handler of a conventional USB memory device;

2A is a plan view schematically illustrating a test handler of a conventional USB memory device.

FIG. 2B is a view illustrating a state in which a USB memory device to be tested in a test handler of a conventional USB memory device is mounted in a shuttle unit; FIG.

3 is a perspective view of a test handler of a USB memory device according to the present invention;

4 is an enlarged view of a shuttle unit and a test board configuration in a test handler of a USB memory device according to the present invention;

5 is an exploded perspective view of a shuttle unit in a test handler of a USB memory device according to the present invention;

Figure 6a is a state of use for the shuttle unit in the test handler of the USB memory device according to the present invention

Figure 6b is another use state for the shuttle in the test handler of the USB memory device according to the present invention

* Description of the symbols for the main parts of the drawings *

1: test handler of a USB memory device according to the present invention 2: loader

3: unloader part 4: pickup part 5: shuttle part 6: test board 7: buffer part

8: US memory device 21: loader lifting unit 22: tray loader

31: unloader lifting unit 32: tray unloader unit 41: picker 51: departure prevention unit

52 Kit 53 Housing 61 Test Socket 81 Substrate 82 Holding Groove

83: connector 511: holding hole 512: engaging projection 521: substrate mounting groove 522: guide hole

531: kit receiving groove 532: connector mounting groove 533: connector 534: coupling hole

611: US Viport C: Loading position D: Loading pick-up position E: Unloading position

F: Unloading pick-up position T: Tray G: Longitudinal direction H: Horizontal direction I: Vertical direction

DESCRIPTION OF SYMBOLS 100 USS memory element 101 Connector 102 Case 1011 Insulation member

10: test handler of conventional USB memory device 11: tray loader

12: Trader loader 13: Test board 14: Shuttle 131: Test socket

141: Shuttle home

The present invention relates to a test handler, and more particularly, to a test handler of a USB memory device capable of determining whether there is a defect by testing its electrical characteristics before shipment of the USB memory device, and classifying the USB memory device according to the presence or absence of a defect. will be.

USB (Universal Serial Bus) is a bus standard for connecting a computer and a peripheral device, and a computer is generally equipped with a USB port.

This USB protocol is used as a standard protocol for connecting computer peripherals, and since all computer peripherals use the same specifications, the computer supports a complete Plug and Play function and a separate operating system of the computer. It can be automatically recognized and added as a new peripheral device without system setting, thus providing convenience of using peripheral devices.

As a peripheral device using the USB port, a device capable of storing and outputting data is a USB memory device. Recently, the use of the USB memory device has become common due to its high capacity and ease of portability.

Here, the USB memory device is a test handler of the USB memory device that can determine whether there is a defect by testing the electrical characteristics before shipment, so that only the product of a certain quality or more can be shipped and sold. Is being used.

1 is a perspective view of a USB memory device tested in a test handler of a conventional USB memory device.

Referring to FIG. 1, a USB memory device 100 tested in a test handler of a conventional USB memory device includes a connector 101 and a case 102.

The connector 101 is a hollow rectangular plate as a whole, and is electrically connected to a USB client chip (not shown) accommodated inside the case 102, and a plurality of through holes 101a are formed on upper and lower surfaces thereof. The insulating member 1011 is accommodated therein.

The insulating member 1011 closes the through hole (not shown) formed on the lower surface of the connector 101, and opens the through hole 101a formed on the upper surface of the connector 101 to open the inside of the connector 101. A plurality of leads (not shown) are accommodated in one side of the space 101b and electrically connected to the USB client chip.

Therefore, the connector 101 is closed at one side of the inner space 101b by the insulating member 1011, the other side is opened, the USB port is provided in a computer or the like so that the connector 101 can be inserted, It is formed in a shape opposite to the inner space 101b of the connector 101.

The case 102 is a hollow rectangular plate as a whole, and a printed circuit board (not shown) is installed therein, and the USB client chip and a flash memory are electrically connected to the printed circuit board. , The connector 101 is coupled to one side thereof.

In addition, the case 102 is formed to have a larger size than the connector 101 to form a case step 102a at the surface to which the connector 101 is coupled.

2A is a plan view schematically illustrating a test handler of a conventional USB memory device.

Referring to FIG. 2A, the test handler 10 of the conventional USB memory device includes a tray T, a tray loader 11, a tray unloader 12, a test board 13, and a shuttle unit 14. .

The tray T is generally rectangular in shape and includes a plurality of tray mounting grooves (not shown) spaced at predetermined intervals, and the plurality of USB memory devices 100 to be tested are mounted on the tray mounting grooves. The plurality of tested USB memory devices 100 are mounted.

The tray loader 11 transfers a tray T on which a plurality of UESB memory devices 100 to be tested are mounted while linearly moving in the Y-axis direction, and the plurality of UESB memory devices 100 to be tested are loaded picking means ( (Not shown) and transferred to the shuttle unit 14 from the tray T located in the tray loader 11.

The tray-unloader 12 transfers a tray T in which the plurality of tested USB memory devices 100 are mounted while linearly moving in the Y-axis direction, and the plurality of used USB memory devices 100 that have been tested are unloaded. Picked up by picking means (not shown) and transferred from the shuttle portion 14 to the tray T located in the tray-unloader 12.

The test board 13 is configured to test the electrical characteristics of the USB memory device, and includes a test socket 131.

The test socket 131 includes a plurality of USB ports (not shown) spaced at predetermined intervals, and the USB ports are electrically connected by being inserted into the connector 101 of the USB memory device 100 to be tested. The test is performed.

The shuttle unit 14 inserts the USB memory device 100 to be tested into the test socket 131 while linearly moving in the Y-axis direction, so that the test is performed. It is separated from the test socket 131, and includes a shuttle mounting groove 141 is mounted on the USB memory device 100.

FIG. 2B is a view illustrating a state in which a USB memory device to be tested in a test handler of a conventional USB memory device is mounted in a shuttle unit.

2A and 2B, the shuttle mounting groove 141 is a plurality of grooves formed while being spaced apart at predetermined intervals in the longitudinal direction (arrow B direction) of the shuttle portion 14, and one side 141a is the USB. The case 102 of the memory device 100 is accommodated and mounted, and the other side 141b is accommodated and mounted with the connector 101 of the USB memory device 100.

In addition, the shuttle mounting groove 141 corresponds to a case step 102a formed at a surface at which the case 102 and the connector 101 are coupled to each other, and at one side of the shuttle mounting groove 141 is connected to the other side 141b. It includes a shuttle step 141c is formed.

The shuttle step 141c supports the case step 102a when the tested UESB memory device 100 is separated from the test socket 131 by the shuttle unit 14 so as to support the UESB memory device 100. Is not separated from the shuttle 14 arbitrarily.

Therefore, the test handler 10 of the conventional USB memory device may perform a stable test only on the USB memory device 100 in which the case 102 is assembled.

Here, when the test handler 10 of the conventional USB memory device performs a test on the USB memory device 100 in which the case 102 is assembled, when the test result of the USB memory device 100 is determined to be bad, In order to repair the defective parts only when the preassembled case 102 is separated, the repair work is cumbersome and inefficient.

In addition, in the process of separating the pre-assembled case 102, if damage occurs to the case 102 should be assembled into a new case 102 after the repair work, in addition to the case 102 other damage occurs There is a possibility that a simple repair work to be subjected to a complicated repair work for the USB memory device 100 that was able to operate normally by a simple repair operation, there is a problem that the cost is increased.

The present invention has been made to solve the above problems,

An object of the present invention is to provide a test handler of the USB memory device that can be easily repaired for the USB memory device determined as a test result, thereby improving the efficiency of the work.

Another object of the present invention is to prevent the occurrence of additional damage in the repair process for the UESB memory device determined as a test result in advance, the test handler of the UESB memory device that can reduce the production cost accordingly The purpose is to provide.

The test handler of the USB memory device for achieving the above object of the present invention includes the following configuration.

The test handler of the USB memory device according to the present invention includes a shuttle having a release preventing part for supporting a substrate of the USB memory device when the tested USB memory device is separated from the test board to prevent the USB memory device from being separated.

In addition, the test handler of the USB memory device according to the present invention includes a loader for transporting a tray on which the USB memory device to be tested is mounted; An unloader unit for transferring a tray on which the tested USB memory device is mounted; A test board for performing a test on a USB memory device; A shuttle unit having a departure prevention unit for transferring a plurality of USB memory devices to be connected to the test board, and supporting the substrate of the USB memory device when the tested USB memory device is separated from the test board to prevent the USB memory device from being separated. ; And a pickup unit for picking up and transferring the USB memory device between the loader unit and the shuttle unit and between the unloader unit and the shuttle unit.

Therefore, the test result is poor because the USB memory device is directly inserted into the substrate of the USB memory device while the case is not assembled to hold the USB memory device, thereby preventing the USB memory device from being separated when the tested memory device is separated from the test board. It is possible to easily perform repair work on the USB memory device determined as without additional work.

In addition, it is possible to proceed with the repair work for the USB memory device determined to be a bad test result without any additional work, it is possible to block the possibility of additional damage that may occur in the process of removing the conventional pre-assembled case, accordingly The production cost of the memory device can be reduced.

Hereinafter, with reference to the accompanying drawings a preferred embodiment of the configuration of the test handler of the USB memory device according to the present invention will be described in detail.

3 is a perspective view of a test handler of a USB memory device according to the present invention.

Referring to FIG. 3, the test handler 1 of the USB memory device according to the present invention includes a loader part 2, an unloader part 3, a pickup part 4, a shuttle part 5, and a test board 6. And a buffer unit 7.

The loader unit 2 is a configuration in which a plurality of trays T on which a plurality of USB memory elements 8 to be tested are mounted, and a plurality of trays T loaded are sequentially transferred. ) And the tray loader unit 22.

Here, the tray T includes a plurality of tray mounting grooves (not shown) spaced at predetermined intervals, similar to the conventional tray T described above, and includes a plurality of USB memory devices to be tested in the tray mounting groove. (8) or a plurality of tested USB memory devices 8 are mounted.

The loader elevating unit 21 is configured to sequentially raise and lower a plurality of stacked trays T. The tray loader unit 22 holds a tray T on which a USB memory device 8 to be tested is mounted. (T) is sequentially raised to the loading position (C) that can be transported.

In addition, the loader elevating unit 21 has a tray (T) in which the USB memory device 8 to be tested is transferred to the shuttle unit 5 by the pick-up unit 4 and is empty. Raise upwards. In this case, the loader elevating unit 21 raises the tray T on which the USB memory device 8 to be tested loaded on the lower side of the loading position C is mounted to the loading position C, and at the same time the loading position ( It is preferable to raise the emptying tray (T) located in C) to the upper side of the loading position (C) to load.

Meanwhile, the loader elevating unit 21 sequentially lowers the tray T, and loads the tray T on which the USB memory device 8 to be tested loaded on the upper side of the loading position C is mounted. (C) can be lowered sequentially, and the tray (T) which is empty in the loading position (C) can be lowered to the lower side of the loading position (C) to be loaded.

In addition, the plurality of trays (T) equipped with the USB memory device 8 to be tested may be manually transported to the loader lifting unit 21 by an operator or connected through in-line to be automatically transferred. It may be.

On the other hand, the loader lifting unit 21 loads the tray (T) which is empty on the upper or lower side of the loading position (C) as described above, if the tray (T) is loaded as much as can be loaded, The tray T may be transferred to the unloader lifting unit 31.

The tray loader 22 is configured to transfer the tray T on which the USB memory device 8 to be tested is mounted while linearly moving along the Y axis, and the tray T is loaded from the loading position C to the loading pick-up position ( Transfer to D). Here, the loading pick-up position (D) refers to a position at which the pickup unit 4 can pick up the USB memory device 8 to be tested mounted on the tray T.

In addition, the tray loader 22 transfers the tray T located at the loading position C to the loading pick-up position D, and then the USB memory device 8 causes the shuttle to be moved by the pickup unit 4. The trays T, which are all transferred to the section 5 and emptied, are re-transferred to the loading position C.

The unloader unit 3 is configured to transfer a tray T on which a plurality of tested USB memory devices 8 are mounted, and to load a plurality of transferred trays T. Is equipped with a plurality of USB memory elements (8) determined to be normally operated and includes an unloader elevating unit (31) and a tracer loader unit (32).

The unloader elevating unit 31 is configured to stack a plurality of trays T while sequentially raising and lowering the trays T, and the trays T have been tested and have been determined to operate normally. (8) is mounted and a plurality of trays (T) are stacked while the trays (T) are sequentially lowered at the unloading position (E).

In addition, the unloader raising and lowering unit 31 sequentially lowers the empty tray T from the upper side of the unloading position E. FIG. In this case, the tray T on which the USB memory device 8, which has been tested by the pickup unit 4, is mounted is lowered and loaded below the unloading position E, and the unloading position E is loaded. It is preferable to lower the empty tray (T) located on the upper side to the unloading position (E).

Meanwhile, the unloader raising and lowering unit 31 raises the tray T sequentially, and raises the tray T on which the tested USB memory device 8 is completed to the upper side of the unloading position E. The empty tray T located below the unloading position E may be raised to the unloading position E.

In addition, the plurality of stacked trays T may be manually transported by a worker to a space for a next process performed before shipment after completion of the test, or may be automatically connected by being connected through in-line.

The tray-unloader unit 32 is a configuration for transporting the tray T on which the tested USB memory device 8 is mounted while linearly moving in the Y-axis, and unloading the tray T from the unloading pick-up position F. FIG. Transfer to loading position (E). Here, the unloading pick-up position F refers to a position at which the pick-up unit 4 picks up and transports the USB memory device 8 that has been tested from the shuttle unit 5 to be mounted on the tray T. .

In addition, the unloading unit 32 transfers the tray T on which the tested USB memory device 8 is mounted from the unloading pick-up position F to the unloading position E, and then unloads the unloading unit. The empty tray T which is positioned at the unloading position E by the lifting unit 31 is transferred from the unloading position E to the unloading pick-up position F. FIG.

On the other hand, the loader elevating unit 21 and the unloader elevating unit 31 for raising and lowering the tray T, and the tray loader unit 22 for transferring the tray T while linearly moving in the Y-axis direction, and the tray Loader unit 32 may be implemented by applying a variety of configurations obvious to those skilled in the art, such as an elevator, a ball screw.

The pick-up unit 4 is configured to pick up and transfer a plurality of USB memory devices 8 while linearly moving along the X and Y axes, and to test them from the tray T located at the loading pick-up position D. (8) picks up and transports and mounts the shuttle unit (5), and picks up the tested USB memory device (8) from the shuttle unit (5) and the tray (T) located at the unloading pick-up position (F). Transfer it to) and install it.

Meanwhile, the pick-up unit 4 includes a plurality of pickers 41 capable of picking up a plurality of USB memory devices 8, and the picker 41 picks up the USB memory devices 8 by vacuum. In addition, the pickup unit 4 including the picker 41 is a configuration obvious to those skilled in the art to which the present invention pertains, and a detailed description thereof will be omitted.

4 is an enlarged view of a shuttle unit and a test board configuration in a test handler of a USB memory device according to the present invention, and FIG. 5 is an exploded perspective view of the shuttle part in a test handler of the USB memory device according to the present invention.

4 and 5, the shuttle unit 5 is connected to the test board 6 by connecting the plurality of USB memory elements 8 to the test board 6 while linearly moving along the Y axis. As a structure which separates from the test board 6, it contains the separation prevention part 51, the kit 52, and the housing 53. As shown in FIG.

In addition, the shuttle unit 5 may be provided in plural, in order to allow the user to adjust the number of the USB memory device 8 that the user can test at a time according to a desired specification.

On the other hand, the configuration of linear movement of the shuttle portion 5 in the Y axis is apparent to those skilled in the art to which the present invention belongs, such as a ball screw, a linear guide block (Linear Guide Block) and a linear guide rail (Linear Guide Rail) Various configurations can be applied.

The detachment preventing unit 51 supports the substrate 81 of the USB memory device 8 when the test is removed from the test board 6 of the completed USB test device 6. Is formed in a rectangular rectangular plate shape extending in the longitudinal direction (arrow G direction) as a whole, and includes a holding tool 511 and a coupling part 512.

Here, referring to FIG. 5, the USB memory device 8 tested in the test handler 1 of the USB memory device according to the present invention is not assembled with a case (shown in FIG. 1), and thus performs a test. After that, it is possible to immediately perform repair work on the USB memory device 8 that is determined to be defective without any additional work.

In addition, the USB memory device 8 has holding grooves 82 formed at both ends of the substrate 81, and the USB memory device 8 generally includes the holding grooves 82 as described above. Even in the USS memory device 8 having no groove 82, the holding groove 82 can be formed on the substrate 81 through a simple processing process.

On the other hand, the departure preventing portion 51 is movably coupled to the housing 53, it is preferable to be movably coupled in the horizontal direction (arrow H direction) and vertical direction (arrow I direction), such a departure prevention part The configuration for moving the 51 in a state coupled to the housing 53 may be implemented by applying various configurations obvious to those skilled in the art, such as a ball screw.

Here, the reason why the detachment preventing part 51 is movably coupled to the housing 53 in the horizontal direction (arrow H direction) is briefly described, where the position of the holding groove 82 is a type of the USB memory device 8. This is because it may be different every time, the separation prevention portion 51 in the horizontal direction (arrow H direction) to the housing 53 to adjust the position of the holding hole 511 in accordance with the position of the holding groove 82 It will be combined to move to.

In addition, referring to FIGS. 3 and 5, the reason why the separation preventing unit 51 is movably coupled to the housing 53 in a vertical direction (arrow I direction) will be described. When the device 8 is picked up by the shuttle unit 5, the holding hole 511 may be caught by the holding groove 82, and the pickup may fail, and the pick-up unit 4 may be used as the shuttle unit 5 by the shuttle unit 5. This is because the holding holes 511 may be disturbed when the memory device 8 is transported and mounted, and the mounting may fail.

FIG. 6A is a diagram illustrating one use state of the shuttle unit in the test handler of the USB memory device according to the present invention, and FIG. 6B is a diagram illustrating another use state of the shuttle unit in the test handler of the USB memory device according to the present invention.

Therefore, the separation prevention unit 51 is shown in FIG. 6A when the pickup unit 4 picks up and detaches the USB memory device 8 from the shuttle unit 5, and transfers and mounts the transfer unit to the shuttle unit 5. As shown in the drawing, the holding holes 511 are lowered to be spaced apart from the holding grooves 82, so that the holding holes 511 do not interfere with the movement of the pickup unit 4, When the test is completed and separated from the test board 6, the holding hole 511 is raised to be inserted into the holding groove 82, as shown in FIG. 6B.

Referring to FIG. 5, the holding holes 511 are formed in a rectangular cylindrical shape as a whole, protrude from the upper surface 51b of the body 51a constituting the separation preventing part 51, and a plurality of the holding holes 511 are formed. It is inserted into the holding groove 82 of the memory device 8 to hold the USB memory device 8.

In addition, a plurality of holding spheres 511 are spaced apart at regular intervals in the longitudinal direction (arrow G direction) of the body 51a, and holding grooves formed at both ends of the substrate 81 of the USB memory device 8. Two holding spheres 511 spaced apart from each other at an interval 511a substantially equal to the interval 82a of 82 are formed in a pair, and are spaced apart at the same interval 511b to form a plurality.

On the other hand, the number of the holding spheres 511 formed as a pair is formed in the number corresponding to the USB memory device 8 mounted on the shuttle portion 5 can be tested at a time.

In addition, the height 511c of the holding hole 511 protrudes from the upper surface 51b of the body 51a may be the holding hole 511 when the departure preventing part 51 is raised as shown in FIG. 6B. Is inserted into the holding groove 82 of the USB memory device 8, and as shown in FIG. 6A, the holding hole 511 is a holding groove of the USB memory device 8 when the release preventing part 51 is lowered. It is formed at a height that can be spaced apart from 82.

Referring to FIG. 5, the coupling protrusion 512 is configured to couple the separation preventing part 51 to the housing 53 so as to be movable, and at one side 51c of the body 51a of the separation preventing part 51. A plurality is formed while being spaced apart at regular intervals in the longitudinal direction (arrow G direction), and as described above, the separation preventing part 51 is disposed in the horizontal direction (arrow H direction) and vertical direction (arrow I direction) to the housing 53. Joining moveably.

The kit 52 has a configuration in which a plurality of USB memory devices 8 are mounted, and is formed in a rectangular plate shape which is formed to extend a predetermined length in the longitudinal direction (arrow G direction) as a whole, and has a substrate mounting groove 521 and a guide hole. 522.

In addition, the kit 52 is detachably coupled to the housing 53. Since the position of the holding groove 82 may be different for each type of the USB memory device 8 as described above, the USB is to be tested. This is to replace the kit 52 with the guide hole 522 formed at a position corresponding to the holding groove 82 of the memory device 8.

The substrate mounting grooves 521 are grooves on which the substrate 81 of the USB memory device 8 is mounted, and a plurality of the substrate mounting grooves 521 are spaced apart at equal intervals along the longitudinal direction (arrow G direction) of the kit 52.

In addition, the substrate mounting groove 521 is formed to have a number equal to the number of the USB memory devices 8 that can be tested at a time, and the size of the substrate mounting grooves 521 is the substrate of the USB memory device 8. It is preferable that it is formed to a size approximately equal to (81).

The guide hole 522 is a through hole that guides the insertion hole of the holding hole 511 so that the holding hole 511 can be inserted into the holding groove 82 of the USB memory device 8. A plurality of mounting grooves 521 may be formed, and a plurality of mounting grooves 521 may be formed in the same number as the holding holes 511.

In addition, the guide hole 522 is formed at a size substantially coincident with the holding hole 511 and a position substantially coincident with the holding groove 82 so as to guide the insertion position of the holding hole 511. desirable.

The housing 53 is a configuration constituting the main body of the shuttle unit 5, the kit 52 and the separation prevention unit 51 is coupled, the kit accommodating groove 531, connector mounting groove 532, connection hole 533 and the coupling hole 534.

The kit accommodating groove 531 is a groove in which the kit 52 is detachably coupled. Preferably, the kit accommodating groove 531 is formed to have a size and a shape approximately equal to the kit 52.

The connector mounting groove 532 is a groove in which the connector 83 of the USB memory device 8 is mounted, and a plurality of connector mounting grooves 532 are formed in the same number as the number of the USB memory devices 8 that can be tested at one time. It is preferable that it is formed in the form substantially coinciding with (83).

The connection hole 533 is a through hole penetrating the holding hole 511, the holding hole 511 passes through the guide hole 522 to be inserted into the holding groove 82, the holding hole Plural numbers are formed while 511 is spaced at intervals 533a and 533b substantially coincident with the spaced intervals 511a and 511b.

In addition, the connection hole 533 is preferably formed in the form of a long hole extending in the movement direction, so that the holding hole 511 can be moved in the horizontal direction (arrow H direction) in a penetrating state. Accordingly, the holding holes 511 can be easily moved in the horizontal direction (arrow H direction) in accordance with the holding grooves 82 of the USB memory device 8 without removing the separation preventing part 51 from the housing 53. You can.

The coupling hole 534 is coupled to the coupling protrusion 512 to movably couple the departure prevention portion 51, and as described above, the separation prevention portion 51 in the horizontal direction (arrow H direction) and vertical It is coupled so as to be movable in the direction (arrow I direction), a plurality is formed in a number approximately equal to the engaging projection 512.

In addition, the coupling hole 534 extends in the movement direction such that the holding hole 511 can be moved in the horizontal direction (arrow H direction) in the state where the holding hole 511 penetrates the connection hole 533 like the connection hole 533. It is preferable to be formed in the form of a long hole is formed.

Referring to FIG. 4, the test board 6 is configured to perform a test on the USB memory device 8 and includes a test socket 61.

The test socket 61 includes a plurality of USB ports 611 spaced at regular intervals, and a connector 83 of the USB memory device 8 to be tested is inserted into the USB ports 611. The test is performed while electrically connected. On the other hand, the USB port 611 is formed in the same number as the USB memory device 8 that can be tested at a time.

Referring to FIG. 3, the buffer unit 7 is a configuration in which the UESB memory device 8, which is determined to be defective, is mounted, and includes a plurality of buffer mounting grooves 71. The memory device 8 can be mounted.

In addition, the buffer portion 7 is preferably formed between the shuttle portion 5 and the loader portion 2 and between the shuttle portion 5 and the unloader portion 3, and thus the pickup portion 4 In the process of picking up the tested USB memory device 8 and transferring it to the tray T located at the unloading pick-up position F, the buffer unit 7 After attaching to, the USB memory device 8 determined to be normally operated can be transferred to the tray 7 for mounting.

Hereinafter, with reference to the accompanying drawings a preferred embodiment of the operating relationship for the test handler of the USB memory device according to the present invention will be described in detail.

Referring to FIG. 3, the loader elevating unit 21 raises the tray T on which the USB memory device 8 to be tested is mounted to the loading position C, and the tray loader 22 is a loading position. The tray T raised to (C) is transferred to the loading pick-up position D.

The pickup unit 4 picks up and separates a plurality of USB memory elements 8 from the tray T transferred to the loading pick-up position D, and then transfers and mounts the shuttle unit 5 to the shuttle unit 5.

In this case, as shown in FIG. 6B, the shuttle part 5 has the separation prevention part 51 in the horizontal direction (arrow H direction) so that the positions of the holding holes 511 and the holding grooves 82 coincide with each other. It is moved to the adjusted state, as shown in Figure 6a is the departure prevention portion 51 is lowered state so that the holding hole 511 does not protrude from the guide hole 522.

Referring to FIG. 4, when the mounting of the plurality of UESB memory devices 8 that can be tested at one time is completed, the shuttle unit 5 linearly moves on the Y axis to move the connector 83 to the UESB of the test socket 61. The port 611 is connected to allow the test to be performed.

When the test is completed, the shuttle part 5 separates the connector 83 from the US bepot 611 of the test socket 61 while linearly moving in the Y axis.

In this case, as shown in FIG. 6B, the release preventing part 51 is switched to a state in which the holding holes 511 are raised to be inserted into the holding grooves 82, and the holding holes 511 are held by the holding grooves 82. The substrate 81 of the USB memory device 8 is supported in the inserted state so as to prevent the USB memory device 8 from being randomly detached.

When the separation of the USB memory device 8 from the test board 6 is completed, the pickup part 4 picks up the USB memory device 8 from the shuttle part 5 and separates it.

In this case, as shown in FIG. 6A, the detachment preventing part 51 is switched to a state in which the holding holes 511 are lowered to be spaced apart from the holding grooves 82, so that the holding holes 511 are picked up. Do not disturb the movement of the part (4).

The pickup unit 4 transfers and mounts the USB memory device 8 picked up and separated from the shuttle unit 5 to the tray T located at the unloading pick-up position F. FIG.

In this case, the pick-up unit 4 mounts the USB memory device 8 that is determined to be defective in the transfer process to the buffer server 7, and then selects the USB memory device 8 that is determined to operate normally. Mount on the tray (T) located in the unloading pick-up position (F).

When the mounting of the USB memory device 8 which is determined to be normally operated in the tray T located at the unloading pick-up position F is completed, the tray unloader unit 32 moves linearly along the Y axis. Transfer (T) to the unloading position (E).

The unloader elevating unit 31 lowers and loads the tray T transferred to the unloading position E to the lower side of the unloading position E, and at the same time is loaded on the upper side of the unloading position E. Lower the empty tray (T) to the unloading position (E).

The tray unloader 32 transfers the empty tray T lowered to the unloading position E to the unloading pick-up position F. FIG.

In addition, the tray loader 22 is empty when the USB memory device 8 of the tray T transported to the loading pick-up position D is transferred to the shuttle 5 and is empty. Transfer to the loading position (C).

The loader raising and lowering unit 21 raises and loads the tray T transferred to the loading position C to the upper side of the loading position C, and at the same time the test tray loaded at the lower side of the loading position C. The tray T on which the USB memory device 8 is mounted is raised to the loading position C. FIG.

The tray loader 22 transfers the tray T, which is raised to the loading position C, to the loading pickup position D, and is picked up and transported to the shuttle unit 5 by the pickup unit 4. Be sure to

By repeatedly performing the above-described operating relationship, the test for the USB memory device 8 to be tested is completed, and the classification for the USB memory device 8 normally operated as a result of the test is completed.

The present invention described above is not limited to the above-described embodiments and the accompanying drawings, and it is common in the art that various substitutions, modifications, and changes can be made without departing from the technical spirit of the present invention. It will be apparent to those who have knowledge.

The present invention can achieve the following effects by the above configuration, embodiment and operation relationship.

The present invention directly supports the substrate of the USB memory device in a state where the case is not assembled, thereby preventing the USB memory device from being separated when the tested memory device is separated from the test board. Repair work can be easily carried out without any additional work, thereby improving the efficiency of the work can be obtained.

The present invention can proceed with the repair work for the USB memory device determined to be a bad test result without any additional work, it is possible to block the possibility of additional damage that may occur in the process of removing the conventional pre-assembled case, accordingly It can achieve the effect of reducing the production cost of the USB memory device.

Claims (12)

A test handler of a USB memory device, comprising: a shuttle unit having a release preventing unit for supporting a substrate of the USB memory device to prevent the USB memory device from being separated when the tested USB memory device is separated from the test board. A loader unit for transferring a tray on which a USB memory device to be tested is mounted; An unloader unit for transferring a tray on which the tested USB memory device is mounted; A test board for performing a test on a USB memory device; A shuttle unit having a departure prevention unit for transferring a plurality of USB memory devices to be connected to the test board, and supporting the substrate of the USB memory device when the tested USB memory device is separated from the test board to prevent the USB memory device from being separated. ; And And a pickup unit for picking up and transferring the USB memory device between the loader unit and the shuttle unit and between the unloader unit and the shuttle unit. The test handler of claim 1 or 2, wherein the release preventing part includes a holding hole inserted into a holding groove formed on a substrate of the USB memory device. The method of claim 3, wherein the shuttle unit A kit having a plurality of substrate mounting grooves on which a substrate of a USB memory device is mounted, and a plurality of guide holes through which the holding holes pass; And And a housing having a kit accommodation groove to which the kit is detachably coupled, and a plurality of connector mounting grooves to which the connector of the USB memory device is mounted. The test handler of claim 4, wherein the housing includes a plurality of connecting holes through which the holding hole is inserted into the guide hole. The method of claim 5, wherein the housing And a coupling hole for movably coupling the release preventing part to be movable in a state in which the holding hole is inserted into the connection hole. The method of claim 6, wherein the connection hole Test holding of the USB memory device, characterized in that the holding sphere is formed in a long hole shape in a direction that can move horizontally. The method of claim 6, wherein the coupling hole Test holding of the USB memory device, characterized in that the holding sphere is formed in a long hole shape in a direction that can move horizontally. The method of claim 6, wherein the separation prevention portion When the test for the USB memory device is completed and separated from the test board, the holding hole is raised to be inserted into the holding groove, And the holding port is lowered apart from the holding groove when the USB memory device is mounted on the shuttle unit and when the USB memory device is separated from the shuttle unit. The test handler of claim 1 or 2, wherein the test handler of the USB memory device further comprises a buffer unit in which the USB memory device determined as a bad test result is mounted. The test handler of claim 1, wherein the test handler of the USB memory device comprises: A loader unit which raises and lowers the tray sequentially, and has a tray on which a USB memory device to be tested is mounted, and a loader lifting unit for loading the tray being empty; And And an unloader unit which raises and lowers the tray sequentially and has an unloader lifting unit for loading the empty tray and a tray on which the tested UESB memory element is completed. 3. The loader as claimed in claim 2, wherein the loader unit lifts and lowers the tray sequentially, and includes a tray on which a USB memory device to be tested is mounted, and a loader lifting unit for loading a tray being empty; The unloader unit raises and lowers the tray sequentially, and includes an unloader lifting unit configured to load the empty tray and the tray on which the test is completed, and the empty tray.

Images