CN115870241A

CN115870241A - Socket guide for electronic component testing

Info

Publication number: CN115870241A
Application number: CN202210914820.6A
Authority: CN
Inventors: 罗闰成; 崔僖峻; 赵永焕
Original assignee: Techwing Co Ltd
Current assignee: Techwing Co Ltd
Priority date: 2021-08-09
Filing date: 2022-08-01
Publication date: 2023-03-31
Also published as: TW202321702A; TWI807953B; KR20230022567A

Abstract

The present invention relates to a socket guide for electronic component testing. The socket guide according to the present invention has an elastic support body maintaining the posture of the electronic component by supporting both ends of the electronic component inserted into the test slit. According to the present invention, since a large electronic component such as a solid state drive can be accurately connected to a tester, the reliability of electrical contact formed between the electronic component and the tester can be improved.

Description

Socket guide for electronic component testing

Technical Field

The present invention relates to a socket guide for electronic component testing that accurately guides the movement of an electronic component when the electronic component is inserted into a test slot.

Background

The produced electronic parts (e.g., SSD, circuit board, semiconductor device, etc.) are separated into good parts and defective parts after being tested by the tester, and only the good parts are taken out of the library.

The electronic component can be tested only by electrically connecting the electronic component to the tester, and in this case, the apparatus for supporting the electronic component by electrically connecting the electronic component to the tester is a handler for testing the electronic component (hereinafter, referred to as a "handler").

In the past, relatively large electronic components, such as Solid State Drives (SSDs), supported testing in a manner that operators directly connected or disconnected them from the tester. However, as the demand for solid state drives has exploded, the applicant has developed and proposed a handler for automatically handling solid state drives to electrically connect or disconnect them from a tester.

An electronic component such as a solid state drive may be formed with a terminal on one surface of one side thereof to be inserted into a test socket in a slit form (hereinafter referred to as a "test slit") so as to be electrically connectable to a tester. At this time, it is the socket guide that appropriately guides the movement of the electronic component in the process of inserting the electronic component into the test slit. Further, the insertion guide may also function to support the electronic component inserted into the test slot.

However, the specifications of electronic components such as solid state drives are continuously upgraded, and accordingly, as more electronic elements are additionally provided in a highly integrated and highly densified manner, the weight of large electronic components tends to gradually increase.

In addition, although the socket guide supports the electronic component, the electronic component should be guided to be movable. This means that the socket guides cannot be firmly attached to both ends of the electronic component to stably support the electronic component. Therefore, at present, the proper posture of the electronic component is maintained by the holding force in the state where the electronic component is inserted into the test slit.

In general, as shown in the reference diagram of fig. 22, in a state where the electronic component ED is inserted into the test slit S, a portion supported by the tester is only a partial region of the rear end, and the electronic component EE which increases the weight of the electronic component is provided in the remaining portion. Therefore, as described above, since the weight of the electronic component ED gradually increases, it is expected that in the near future, a time when the electronic component ED cannot maintain an appropriate posture in a state of being inserted into the test slit S due to handling impact, load, or the like will come. If the electronic component ED cannot maintain an appropriate posture, short-circuiting, poor testing, or the like due to poor electrical contact may occur.

[ Prior art documents ]

[ patent document ]

Korean laid-open patent No. 10-2019-0050483

Korean laid-open patent No. 10-2019-0061291

Disclosure of Invention

The present invention is proposed to properly maintain the posture of a large electronic component electrically connected to a tester with a structure inserted into a test slot.

The socket guide for electronic component testing according to the present invention may include: a pair of guide bodies configured to support both ends of an electronic component inserted into a test slit having an elongated shape, a portion of the electronic component on a contact terminal side being inserted into the test slit; and a pair of elastic support bodies which are replaceably coupled to the guide body and elastically support both ends of the electronic component during insertion of the contact terminal side portion into the test slit or the electronic component which has been inserted, to maintain the posture of the electronic component, wherein the pair of guide bodies are provided on both sides of the test slit in a direction in which the test slit is elongated, and the pair of elastic support bodies are respectively provided on the pair of guide bodies and detachably provided to the guide bodies.

In order to guide the movement of the electronic component in the process of being inserted into the test slit, an elongated guide groove is formed in the guide body in the movement direction of the electronic component, a coupling groove is formed at a position of the guide groove, and the elastic support body is a positioning ball plunger provided in a structure inserted into the coupling groove, and a ball of the positioning ball plunger is elastically supported by a spring while pressurizing the electronic component.

The elastic support body includes: a coupling portion coupled with the guide body; a guide portion formed with an elongated guide groove along a moving direction of the electronic component in order to guide the movement of the electronic component in a process of being inserted into the test slit; and at least one elastic part protruding from the coupling part toward the guide body side so that the coupling part and the guide part can be elastically supported by the guide body, wherein a coupling groove to which the coupling part can be coupled is formed in the guide body such that the coupling part is inserted into the coupling groove to be coupled with the guide body.

The coupling portion is inserted into and coupled to the coupling groove while moving forward from the rear.

The coupling portion, the guide portion, and the elastic portion are formed in one body.

The elastic support body is formed by a synthetic resin material which can realize elastic deformation or restoration and can be injection-molded.

The coupling portion is formed with an insertion groove for inserting the elastic portion, and the elastic portion is insertion-coupled with the coupling portion by being inserted into the insertion groove.

The combining portion and the guide portion are integrally molded, and the elastic portion is injection molded using a material that is capable of elastic deformation and restoration and softer than the combining portion and the guide portion as a synthetic resin.

And at least one correcting pin coupled to the guide body in a forwardly protruding manner, correcting a position of the electronic component supplied through the holder such that a portion on a contact terminal side of the electronic component is accurately inserted into the testing slit so as to be engaged with a correcting hole on the holder side, wherein the correcting pin is located at a position deviated from a virtual straight line passing through the testing slit in a direction of elongation of the testing slit, and the correcting hole is located at a position deviated from a plane including a surface of the electronic component held by the holder.

And a first correcting pin and a second correcting pin coupled to the guide body in a manner of protruding forward, correcting a position of the electronic component supplied through the holder so that a portion of the electronic component on a contact terminal side is accurately inserted into the test slit to be engaged with a correcting hole on the holder side, wherein the first correcting pin and the second correcting pin are spaced apart from each other from a position deviated from a virtual straight line passing through the test slit in a direction in which the test slit is elongated, the first correcting pin is used for a purpose of correcting the position of the electronic component when a lying electronic component is inserted into the test slit after standing at 90 degrees, the second correcting pin is used for a purpose of correcting the position of the electronic component when the lying electronic component is inserted into the test slit after standing at-90 degrees, and the correcting hole is located at a position deviated from a plane including a surface of the electronic component held by the holder.

The invention has the following effects:

first, in a state where a heavy and large electronic component is inserted into the test slit, both ends are pressed by the elastic support bodies, so that the posture can be stably maintained, thereby improving the reliability of the electrical connection between the electronic component and the tester.

Second, since the elastic support body made of a different material from the guide body is provided to be replaceable, when problems such as abrasion and loss of elastic force occur, only the elastic support body can be replaced, and thus, the replacement cost can be reduced and the stability can be improved.

Thirdly, since the alignment pins are divided into two sides with reference to the virtual center line, it is possible to cope with a change in test conditions, a need to change the order of contact between the terminals of the test socket and the terminals of the electronic component, a need to change the insertion direction of the electronic component according to a tester, or the like.

Drawings

Fig. 1 is a reference diagram for explaining an electrical connection structure between an electronic component and a tester.

Fig. 2 is a reference view for explaining a setting position of the socket guide according to the present invention.

Fig. 3 is a schematic plan view of a sorter for forming a pair with a tester.

Fig. 4 is a schematic perspective view of the sorter of fig. 3.

Fig. 5 is a schematic plan view of a connecting portion for the sorter of fig. 3.

Fig. 6 is a schematic sectional view of a main portion of the connection portion of fig. 5.

Fig. 7 is a cut-away view of the placer at the connection portion of fig. 5.

Fig. 8 is a cut-away view for the test hand at the connection portion of fig. 5.

Fig. 9 is a cut-away view of the grip element of the test hand in fig. 8.

Fig. 10 is a cut-away view of the open elements of the test hand of fig. 8.

Fig. 11 is a cut-away view of the connection elements for the test hand in fig. 8.

Fig. 12 is a perspective view for the socket guide according to the first embodiment of the present invention.

Fig. 13 to 15 are reference views for explaining the socket guide of fig. 12.

Fig. 16 is a perspective view for a socket guide according to a second embodiment of the present invention.

Fig. 17 is a partially exploded perspective view of a feature of the socket guide of fig. 16.

Fig. 18 and 19 are reference views for explaining the socket guide of fig. 16.

Fig. 20 and 21 are reference views for explaining a modification to the socket guide of fig. 16.

Fig. 22 is a reference diagram for explaining the background art.

Description of the reference numerals

100. 200: socket guide 110, 210: guide body

111: guide groove 112, 212: combination groove

120: positioning ball plug 121: ball with ball-shaped section

122: the spring 220: elastic support

221: the coupling portion 222: guide part

222a: guide groove 223: elastic part

131. 231: first correction pin 132, 232: second correcting pin

140: the coupling member L: virtual straight line

Detailed Description

Preferred embodiments according to the present invention will be described with reference to the accompanying drawings, and descriptions for overlapping or substantially identical structures will be omitted or compressed as much as possible for the sake of simplicity of description.

< description of electrical connection of electronic component to tester >

The socket guides 100 and 200 (see fig. 11 and 14) according to the present invention are applied to a case where a portion on the contact terminal T side of the electronic component ED is inserted into the test slit S of the tester.

For example, as shown in fig. 1, the TESTER is equipped with a test slit S into which a portion on the contact terminal T side of the electronic component ED is inserted so that the electronic component ED is electrically connected with the TESTER.

Also, as shown in fig. 2, the

socket guide

100, 200 according to the present invention is disposed around the test slit S. Such socket guides 100, 200 guide the movement of the electronic component ED by the handler in the process of inserting the electronic component ED into the test slit S, and maintain the posture of the electronic component ED during the insertion into the test slit S and the electronic component ED that has completed the insertion. In this regard, the following will be described in detail with reference to examples.

< schematic description of the entire configuration of the sorting machine >

Fig. 3 is a schematic plan view for a sorter forming a pair with a tester, and fig. 4 is a schematic perspective view for the sorter HR of fig. 3.

The sorter HR according to the present embodiment includes a stacker portion SP, a connecting portion CP, and a transfer portion TP.

The stacker portion SP receives a customer tray CT in which electronic components ED are placed. Such a stacker portion SP serves to receive a customer tray CT provided with electronic components ED to be tested from the outside or to transfer a customer tray CT provided with electronic components ED subjected to testing to the outside. The stacker portion SP may be used for storing customer trays CT carried in or out from the outside.

The connection portion CP takes out the electronic components ED from the customer tray CT transferred from the stacker portion SP and electrically connects the electronic components ED to the TESTER behind, or places the electronic components ED whose tests are completed by the TESTER on the customer tray CT while being classified according to the test grades.

The transfer portion TP transfers the customer tray CT between the stacker portion SP and the connecting portion CP. That is, the customer tray CT on which the electronic components ED to be tested are mounted is supplied from the stacker portion SP to the connecting portion CP by the transfer portion TP, and the customer tray CT on which the tested electronic components ED are mounted is recovered from the connecting portion CP to the stacker portion SP by the transfer portion TP.

Next, the connection portion CP related to the socket guides 100, 200 according to the present invention will be observed in more detail.

As shown in the schematic plan view of fig. 5 and the cutaway view of fig. 6 for the main part I, the connection part CP includes a placer 510, a moving hand 520, an opener 530, a converter 540, a reciprocating mover 550, and a testing hand 560.

The placement device 510 is equipped for placing the electronic component ED. The electronic component ED may be placed on the placement device 510 by the electronic component ED itself, or may be placed on the placement device 510 by mounting an adapter AD capable of holding the electronic component ED. As shown in the cut-out views (a) and (b) of fig. 7, such a setter 510 includes a pair of fixing members 511, a driving source 512, and a pair of transmission elements 513.

The pair of fixing members 511 can fix or release the electronic component ED by widening or narrowing the interval in the left-right direction. That is, the fixing members 511 are linearly moved in the left-right direction by the guide of the guide rail GR, and if the interval between the fixing members 511 is widened, the electronic component ED or the adapter AD on which the electronic component ED is mounted is in a state of being able to be placed on the placing device 510 or being detached from the placing device 510, and if the interval between the fixing members 511 is narrowed, the electronic component ED is in a state of being fixedly mounted on the placing device 510.

The driving source 512 supplies a driving force for adjusting the interval between the pair of fixing members 511, which is provided as a cylinder in the present embodiment.

The transmission element 513 transmits the driving force applied by the driving source 512 to the pair of fixing members 511. Although the transmission element 513 in this embodiment has a coupling structure for converting the forward/backward movement force of the driving source 512 as a cylinder into the leftward/rightward movement force of the fixing member 511 while rotating, it may be modified in various ways according to the embodiment.

The moving hand 520 moves the electronic components ED to be tested from the customer tray CT transferred from the stacker portion SP to the supply position FP by the transfer portion TP to be placed on the placer 510 or moves the tested electronic components ED placed on the placer 510 to the customer tray CT at the recovery position RP. Such a moving hand 520 holds the lying-shaped electronic part ED by vacuum suction, which is implemented to be equipped with a plurality of suction elements and selectively sucked by one or more suction elements, so that it can be implemented to suction-hold all the electronic parts ED of various sizes (refer to korean application No. 10-2020-0019380).

The dispenser 530 is applied with the adapter AD applied in order to place the electronic component ED on the placer 510. Here, the adaptor AD is a holder for handling a relatively small electronic part ED having a size that is difficult to directly place on the placer 510, and also functions as a carrier (refer to korean application No. 10-2021-0017446). That is, since the opener 530 pushes the operation member of the adapter AD in the first operation area W1 to open the adapter AD, the moving hand 520 can load or unload the electronic component ED in the adapter AD. Such an opener 530 may include a pusher 531 for pushing an operating member for operating the adapter AD to open the adapter AD, and an advancing-retreating source 532 for advancing and retreating the pusher 531.

The translator 540 rotates the placer 510 by 90 degrees or-90 degrees to finally translate the posture of the electronic component ED placed on the placer 510. That is, the posture of electronic component ED can be changed from the horizontal posture to the vertical posture or from the vertical posture to the horizontal posture by converter 540. With this converter 540, the position of the electronic component ED on the contact terminal T side can be appropriately inserted into the test slit S, and the electronic component ED whose posture is converted from the horizontal state to the vertical state can be appropriately sucked and held by the moving hand 520. Of course, in the case where the electronic component ED is electrically connected to the TESTER in a state of being laid down (for example, in the case where the test slit is formed to be elongated in the horizontal direction), the converter 540 may not perform its function, or the configuration of the converter 540 may be omitted. Here, the reason why the inverter 540 is configured to selectively rotate the placer 510 by 90 degrees or-90 degrees is related to the position of the connection terminal in the test slot S. That is, since the contact terminals T of the electronic component ED need to be opposed to each other when the contact terminals T of the electronic component ED are brought into electrical contact with the connection terminals in the test slit S, the contact terminals T of the electronic component ED need to be rotated to be opposed to the connection terminals depending on whether the connection terminals in the test slit S are positioned on the left side or the right side with respect to the electronic component ED inserted.

The shuttle 550 moves the placer 510 between a first operation area W1, which is an area operated by the moving hand 520, and a second operation area W2, which is an area operated by the test hand 560. Since the placer 510 shuttles to and from the first and second operation areas W1 and W2 by such a shuttle 550, the first and second operation areas W1 and W2 are regionally separated, so that interference between the moving hand 520 and the testing hand 560 can be excluded.

The tester hand 560 holds the electronic component ED of the mounter 510 placed in the second manipulation area W2, moves to insert the contact terminal T side portion of the electronic component ED into the test slit S, and after the test of the electronic component ED is completed, takes out the electronic component ED from the test slit S, places the tested electronic component ED again on the mounter 510. Of course, in the case of applying the adapter AD, the test hand 560 moves the adapter AD holding the electronic component ED. To this end, as shown in the cut-out of fig. 8, the test hand 560 includes a holding element 561, horizontal moving

elements

562a, 562b, a vertical moving element 563, an opening element 564, and a connecting element 565.

The holding element 561 is provided for holding or releasing the electronic component ED or the adapter AD, and for this purpose, as shown in the section of fig. 9, includes a pair of holding members 561a-1 and 561a-2 capable of holding or releasing the electronic component ED or the adapter AD by widening or narrowing the interval therebetween by the driving force of the first driving source 561 b.

The horizontal moving

elements

562a and 562b move the holding element 561 in the horizontal direction, i.e., the left-right direction and the front-back direction, so that the electronic component ED can move to the side of the test slit S that is currently empty among the plurality of test slits S.

The vertical moving element 563 moves the holding element 561 in the vertical direction so that the holding element 561 can hold the electronic component ED or the adapter AD in the holding position, or can raise the held electronic component ED or the adapter AD to a height required for the test, and also can perform the reverse operation thereof.

The open element 564 slightly opens the adapter AD within a limit of an extent to which the electronic component ED can be maintained in the adapter AD when the adapter AD is applied. For this purpose, as shown in the cut-out view of fig. 10, the opening element 564 has a first pusher 564a that can be advanced and retracted by a second drive source 564 b. Here, the first pusher 564a slightly pushes the operation member of the adapter AD to open the adapter AD in a state where the holding element 561 holds the adapter AD, and thereby brings the electronic component ED into a state where it can move backward while being maintained in the adapter AD. That is, the opening element 564 provided in the test hand 560 opens the adapter AD to such an extent that the electronic component ED can move backward without being detached from the adapter AD. Therefore, the electronic component ED can be moved backward while still being carried on the adapter AD.

As shown in the sectional view of fig. 11, in the connection element 565, the second pusher 565a which advances and retracts by the operation source 565b pushes the electronic component ED rearward, so that the portion of the electronic component ED on the contact terminal T side can be inserted into the test slit S. Also, the

socket guide

100, 200 according to the present invention plays a role in a process of inserting a portion of the electronic component ED on the contact terminal T side into the test slit S and a state of completing the insertion by the operation of the connection element 565.

For reference, in the present embodiment, the test hand 560 is configured to hold the electronic component ED or the adaptor AD whose posture is converted from the horizontal shape into the vertical shape by the converter 540, but the test hand 560 may be implemented to hold the horizontal electronic component ED or the adaptor AD depending on the form of the test slit S.

< first embodiment for socket guide >

Fig. 12 is a perspective view for the socket guide according to the first embodiment of the present invention. The socket guide 100 according to the present embodiment includes a pair of guide bodies 110, a positioning ball plunger 120, a first correcting pin 131, a second correcting pin 132, and a coupling member 140.

The pair of guide main bodies 110 are provided to interpose the vertically elongated test slit S therebetween and to face each other on both sides of the test slit S in the vertical direction, and are identical in configuration. Such a pair of guide bodies 110 is equipped to guide the movement of the electronic component ED inserted into the test slit S, and finally serves to support both ends of the electronic component ED.

The guide body 110 has a long guide groove 111 formed in the front-rear direction, which is the moving direction of the electronic component ED. The front end portion of the guide groove 111 becomes larger toward the front, so that the electronic component ED moving toward the rear can be appropriately inserted into the guide groove 111.

Further, in the guide body 110, a coupling groove 112 is formed in a vertical direction at a position on the guide groove 111.

The two ball plungers 120 are provided as a pair as elastic support members for elastically supporting the electronic component ED inserted into the test slit S at both ends thereof with the side portions of the contact terminals T interposed therebetween to maintain the posture of the electronic component ED. The pair of ball plungers 120 are divided into the pair of guide bodies 110 and are inserted into the coupling grooves 112 in the vertical direction.

The first aligning pins 131 are engaged with the aligning holes RH (refer to fig. 8) on the side of the holder (which may be an adapter or a test hand), so that the position of the electronic component ED held by the holder can be aligned to guide the portions of the electronic component ED on the side of the contact terminals T to be accurately inserted into the test slot S. As shown in the reference drawing of fig. 13, when a virtual straight line L passing through the center of the test slit S in the up-down direction is drawn, such a first correction pin 131 is arranged at a position deviated from the virtual straight line L toward the right side.

The second correcting pins 132 are engaged with the correcting holes RH on the holder side, so that the position of the electronic component ED held by the holder can be corrected to guide the site on the contact terminal T side of the electronic component ED to be accurately inserted into the testing slit S. As shown in the reference drawing of fig. 13, such a second correction pin 132 is located with the virtual straight line L in the middle and symmetrically spaced from the first correction pin 131. Of course, the second correction pin 132 is also disposed at a position deviated from the virtual straight line L toward the left side.

Further, the above-described first and second correcting

pins

131 and 132 are selectively used during the insertion of the electronic component ED into the test slit S.

For example, when the electronic component ED in a horizontal shape is erected at 90 degrees and inserted into the test slit S, the first correcting pin 131 is used for correcting the position of the electronic component ED, and when the electronic component ED in a horizontal shape is erected at-90 degrees and inserted into the test slit S, the second correcting pin 132 is used for correcting the position of the electronic component ED.

For reference, in the present description, only the case where the correction hole RH is formed in the test hand 560 is exemplified by fig. 8, but the correction hole RH may also be formed in the adaptor AD according to the implementation. At this time, whichever composition is adopted as the holder, as shown in the conceptual diagram of fig. 14, the aligning hole RH is located at a position deviated to one side (lower side in fig. 14) from the plane PS including one surface of the electronic component ED held by the holder, regardless of which composition is selected as the holder, so as to be engaged with the first aligning pin 131 or the second aligning pin 132.

The coupling member 140 fixedly couples the positioning ball plunger 120 inserted into the coupling groove 112 to the guide body 110. Therefore, after the coupling member 140 is removed later, the positioning ball plunger 120 having the expired life can be replaced. That is, the ball plunger 120 is replaceably coupled to the guide body 110.

According to the first embodiment as described above, as shown in the exaggerated conceptual sectional view of fig. 15, in a state where the contact terminal T side portion of the electronic component ED is inserted into the test slit S, the ball 121 is elastically supported by the spring 122, and both ends TT and DT (see fig. 22) of the electronic component ED are pressed. Accordingly, since electronic component ED receives not only the insertion force received by test slit S but also the pressing force of ball 121, it is possible to maintain the state of being inserted into test slit S in a stable and appropriate posture.

< second embodiment for socket guide >

Fig. 16 is a perspective view of a socket guide 200 according to a second embodiment of the present invention, and fig. 17 is a partially exploded perspective view of a feature of the socket guide 200 of fig. 16.

The socket guide 200 according to the present embodiment includes a pair of guide bodies 210, an elastic support 220, a first correction pin 231, and a second correction pin 232.

The pair of guide main bodies 210 are provided to face each other on both sides of the test slit S in the up-down direction with the test slit S elongated in the up-down direction in the middle, and are identical in configuration. Such a pair of guide bodies 210 is equipped to guide the movement of the electronic component ED inserted into the test slit S, and finally serves to support both ends of the electronic component ED. As in the first embodiment, the guide body 210 is formed with a coupling groove 212 to which the elastic support 220 can be coupled.

As shown in the cut perspective views (a) and (b) of fig. 18, the elastic support 220 includes a coupling portion 221, a guide portion 222, and an elastic portion 223.

The coupling portion 221 is inserted into the coupling groove 212, thereby being coupled to the guide body 210. At this time, the coupling portion 221 moves from the rear to the front and is inserted into and coupled to the coupling groove 212, and its rear end portion protrudes downward to form the engagement base J. Accordingly, the rear surface of the elastic support body 220 is in contact with the front surface of the TESTER, and since the catching table J is in a state of being caught at the rear end of the guide body 210, the elastic support body 220 is fundamentally prevented from moving backward or forward from the coupling groove 212.

In order to guide the movement of the electronic component ED in the process of being inserted into the test slit S, the guide portion 222 has a guide groove 222a formed to be elongated in the front-rear direction as the movement direction of the electronic component ED.

The elastic portion 223 is formed to protrude from the coupling portion 221 toward the guide body 210 side so that the coupling portion 221 and the guide portion 222 may be elastically supported from the guide body 210. For appropriate magnitude and balance of the elastic force, it is preferable that such elastic portion 223 is provided in plurality. Of course, as shown in fig. 18, the elastic portion 223 may also have

The character form, however, may be a form in which a short protrusion protrudes according to the implementation, and in this case, the end may be designed to have a circular form, so that the problem of friction can be solved.

Also, the coupling portion 221, the guide portion 222, and the elastic portion 223 are formed in one body. That is, it is preferable that the elastic support 220 is formed of a synthetic resin material (e.g., polyetherimide) that can be injection molded while achieving elastic deformation and restoration.

Since the first and second correcting

pins

231 and 232 have the same structure as that of the first embodiment, the description thereof will be omitted.

According to the second embodiment as described above, as shown in the exaggerated conceptual sectional view of fig. 19, in a state where the portion of the electronic component ED on the contact terminal T side is inserted into the test slit S, the contact surface of the guide groove 222a constituting the elastic support 220 presses the electronic component ED in a state of being in close contact with both ends TT and DT (see fig. 22) of the electronic component ED by the elastic force of the elastic portion 223. Accordingly, the electronic component ED receives the insertion force from the test slit S and also receives the pressing force of the elastic support 220, and thus can maintain the state of being inserted into the test slit S in a stable and appropriate posture.

< modification of the second embodiment >

Fig. 20 and 21 are views of modifications of the second embodiment described above, and more specifically, perspective and exploded views of modifications of the elastic support 220.

The elastic support 220 according to the present modification is integrally molded only by the coupling portion 221 and the guide portion 222. Meanwhile, an insertion groove 221a into which the elastic part 223 can be inserted is formed at the coupling part 221.

The elastic part 223 has an insertion protrusion 223a and four elastic legs 223b-1, 223b-2, 223b-3, 223b-4, and is injection molded as one body.

The insertion projection 223a is inserted into the insertion groove 221a, so that the elastic part 223 can be finally inserted and coupled to the coupling part 221.

The four resilient legs 223b-1, 223b-2, 223b-3, 223b-4 are divided into two and extend forward and backward from the insertion projection 223a, respectively. That is, the elastic portion 223 has an "H" shape when viewed from the bottom surface. The elastic legs 223b-1, 223b-2, 223b-3, 223b-4 extend to be inclined downward as being spaced apart from the insertion projection 223a such that the distal ends thereof contact the bottom surface constituting the coupling groove 212.

In addition, it is preferable that the coupling part 221 and the guide part 222 are integrally molded and formed of a material relatively harder than the elastic part 223, thereby having hard physical properties that are very slowly damaged by use. Of course, it is preferable that the combining part 221 and the guide part 222 are also formed using a synthetic resin material capable of injection molding, but not limited to this material.

Also, the elastic portion 223 is formed using a material that is softer than the coupling portion 221 and the guide portion 222 and that is capable of elastic deformation and restoration. For example, the elastic portion 223 may be formed using a thermoplastic urethane resin for appropriate elastic deformation and restoration.

According to the present modification, only the elastic portion 223 that is easily damaged due to continuous elastic deformation can be separately replaced as compared to the second embodiment, thus reducing replacement costs, and has a structure closer to environmental protection by saving resources, thus being more preferable. Of course, in the case where the coupling portion 221 and the guide portion 222 are damaged due to long-term use, the elastic support body 220 itself may be replaced, but the replacement cycle thereof will be longer than that of the second embodiment described above.

In the above-described embodiment, the electronic component ED is moved in the front-rear direction and inserted into the elongated test slit S in the vertical direction, but the present invention is not limited to this configuration. For example, the present invention can be applied to a case where the test slit S is elongated in the left-right direction, and can be applied to a structure where the electronic component ED is inserted into the test slit S while moving in the up-down direction.

As described above, the present invention has been described in detail with reference to the embodiments shown in the drawings, but the above embodiments are only described as preferred examples of the present invention, and therefore, the present invention should not be construed as being limited to the embodiments, and the scope of the claims of the present invention should be construed as being defined in the claims and the equivalents thereof.

Claims

1. A socket guide for electronic component testing, comprising:

a pair of guide bodies configured to support both ends of an electronic component inserted into a test slit having an elongated shape, a portion of the electronic component on a contact terminal side being inserted into the test slit; and

a pair of elastic support bodies replaceably coupled to the guide body and elastically supporting both ends of the electronic component during insertion of the contact terminal side portion into the test slot or the electronic component having been inserted to maintain a posture of the electronic component,

wherein the pair of guide bodies are provided on both sides of the test slit in a direction in which the test slit is elongated,

the pair of elastic supports are respectively provided on the pair of guide bodies and detachably provided to the guide bodies.

2. The socket guide for electronic component testing according to claim 1,

in order to guide the movement of the electronic component in the process of being inserted into the test slot, an elongated guide groove is formed in the guide body in the moving direction of the electronic component, a coupling groove is formed at a position of the guide groove,

the elastic support body is a positioning ball plug which is arranged in a structure inserted into the combination groove,

the ball of the ball plunger is elastically supported by a spring while pressurizing the electronic part.

3. The socket guide for electronic component testing according to claim 1,

the elastic support body includes:

a coupling portion coupled with the guide body;

a guide portion formed with an elongated guide groove along a moving direction of the electronic component in order to guide movement of the electronic component in a process of insertion into the test slit; and

at least one elastic part protruding from the coupling part toward the guide body side to enable the coupling part and the guide part to be elastically supported by the guide body,

wherein a coupling groove to which the coupling portion is coupled is formed in the guide body such that the coupling portion is inserted into the coupling groove and coupled to the guide body.

4. The socket guide for electronic component testing according to claim 3,

the combination part is provided with a clamping table which is inserted into the combination groove and clamped at the rear end of the guide piece main body in the process of moving from back to front.

5. The socket guide for electronic parts testing of claim 3, wherein,

6. The socket guide for electronic component testing of claim 5,

7. The socket guide for electronic component testing according to claim 3,

the coupling portion is formed with an insertion groove for inserting the elastic portion,

the elastic portion is inserted into the insertion groove to be coupled to the coupling portion.

8. The socket guide for electronic component testing according to claim 7,

the combining portion and the guide portion are integrally formed,

the elastic portion is injection molded using a material that is capable of elastic deformation and recovery and is softer than the coupling portion and the guide portion and is a synthetic resin.

9. The socket guide for electronic component testing of claim 1, further comprising:

at least one correcting pin coupled to the guide body in a forwardly protruding manner, correcting a position of the electronic part supplied through the holder such that a portion of the electronic part on the contact terminal side is accurately inserted into the testing slit to be engaged with the correcting hole on the holder side,

wherein the correction pin is located at a position deviated from a virtual straight line passing through the test slit in a direction of elongation of the test slit,

the correction hole is located at a position deviated from a plane including a surface of the electronic component held by the holder.

10. The socket guide for electronic component testing of claim 1, further comprising:

a first correcting pin and a second correcting pin which are combined with the guide body in a forward protruding mode, correct the position of the electronic component supplied by the holder, enable the part of the electronic component on the contact terminal side to be accurately inserted into the testing slit and then to be occluded with the correcting hole on the holder side,

wherein the first correction pin and the second correction pin are spaced apart from each other from a position deviated from a virtual straight line passing through the test slit in a direction in which the test slit is elongated,

the first correcting pin is used for correcting the position of the electronic component when the electronic component in a lying state is inserted into the test slit after standing at 90 degrees, the second correcting pin is used for correcting the position of the electronic component when the electronic component in a lying state is inserted into the test slit after standing at-90 degrees,