CN116803551A

CN116803551A - Adapter of sorting machine for electronic component test

Info

Publication number: CN116803551A
Application number: CN202310293387.3A
Authority: CN
Inventors: 罗闰成; 赵永焕; 朴承吉; 金索比
Original assignee: Techwing Co Ltd
Current assignee: Techwing Co Ltd
Priority date: 2022-03-23
Filing date: 2023-03-23
Publication date: 2023-09-26
Also published as: TW202401028A; KR20230138212A

Abstract

The present invention relates to an adapter of a sorter for testing electronic components. The adapter of the sorting machine for electronic component test according to the present invention has a structure capable of appropriately holding electronic components having various manufacturing tolerances and lengths and capable of appropriately maintaining the mounted state of the electronic components. According to the present invention, various electronic components having manufacturing tolerances and lengths can be properly mounted and held to the adaptor during manufacturing, while also maintaining a mounting posture, so that the electronic components can be accurately electrically connected to the tester, thereby improving reliability for the sorter.

Description

Adapter of sorting machine for electronic component test

Technical Field

The present invention relates to an adapter usable in a sorting machine for testing electronic components.

Background

The produced electronic components (such as semiconductor elements, substrates, SSDs, etc.) are separated into good products and defective products after being tested by the tester, and only good products are taken out of the warehouse.

The electronic component can be tested only by being electrically connected to the tester, and in this case, a device that supports the electronic component for testing by electrically connecting the electronic component to the tester is a sort machine for electronic component testing (hereinafter simply referred to as a "sort machine").

Sorting machines are proposed and made with the development of new electronic components, and for stabilization, various subsequent developments are underway.

Recently, the popularity of solid state drives (SSD: solid State Drive), which are large electronic components that incorporate a plurality of electronic components, is expanding.

Initially, when only a small amount of production is performed due to less demand for the SSD, the SSD is directly electrically connected to the tester and disconnected by manual operation, but with the rapid increase of demand, it is difficult to support the test by manual operation.

However, since the thickness, structure, weight, etc. of the SSD are different from those of the existing electronic components, the existing classifier cannot be directly applied, and thus a classifier suitable for supporting the test of a large-sized electronic component such as the SSD has been developed and proposed in korean patent laid-open nos. 10-2019-0050483 and 10-2019-0061291.

SSD can have various specifications according to the type of electronic component mounted or its dedicated use, and a sort machine for supporting test of such various specifications of electronic components is required. However, since the sorting machine is expensive and its scale is large, a technique capable of handling tests of electronic components having various specifications in one sorting machine is required in consideration of production cost, installation place, and the like.

In order to test electronic components having different specifications, it is necessary to replace components that meet the specifications corresponding to the electronic components, and even if the components do not need to be replaced, a rest time for supplying new electronic components is required. Accordingly, since the operation rate of the separator and the tester is lowered and a complicated manpower loss is generated, there is a need for a separator that does not require an additional rest time even when the separator is operated for one cycle or continuously operated.

In addition, in the case of semiconductor elements of existing small-variety mass-produced products, the following method is adopted: a test tray capable of loading hundreds of semiconductor elements is provided, and a plurality of pickers are used for directly clamping the semiconductor elements and inserting the semiconductor elements into the test tray. In such a system, since the precise position of the semiconductor element can be ensured in the interposer and also the position thereof can be ensured during the connection with the tester, there is no problem even if the accuracy is slightly lowered.

However, electronic components having a plurality of electronic components including semiconductor elements such as SSD tend to be produced in a small number of varieties corresponding to the diversity of application devices, and there is a case where a plurality of tests are required, and since test sockets of all testers are not present at the same position, it is necessary to manufacture a high-priced test tray according to the kind of electronic components or the kind of testers and to equip a sorter matched thereto. Through previous studies, it was found that there is a considerable problem in connecting an electronic component to a test socket in a state in which the electronic component is directly held by a holder (clip) without taking the above-described problem into consideration.

For example, electronic components are not only of various types but also of various lengths and widths, and even electronic components of the same type are difficult to be made 100% uniform in size due to processing errors and the like due to the characteristics of the manufacture. However, in the case of clamping the electronic component using the clamp irrespective of such a situation, the electronic component may be lost due to failure to accurately clamp the electronic component, or the electronic component may be damaged due to a very strong pressurizing force. Of course, even if the holder is adjusted to hold the electronic component well, the following drawbacks are confirmed: the electronic component is twisted or rotated while being clamped according to which portion of the electronic component is clamped and how strong it is clamped, so that it is difficult for the electronic component clamped by the clamp to precisely contact the test socket. In order to improve this, the driving portion needs to be able to be controlled accurately and needs to correspond to all the electronic components, and therefore the driving shaft needs to be very long. In order to prevent breakage, twisting, and unnecessary rotation, it is necessary to use a motor of high cost capable of performing torque control in some cases. However, this problem requires an increase in size of the apparatus and a high production cost, and is therefore not effective. Also, it is necessary to perform automatic calibration for setting an accurate holding position or the like of an electronic component by the holder to achieve accurate contact, which is a part that actually requires enormous cost and technical force.

In general, in the case of an SSD, the width is the same within a processing error range regardless of the kind, but the length is various depending on the number, size, and the like of electronic components to be mounted.

Accordingly, the applicant of the present invention previously proposed an invention of equipping an adapter in a classifier (hereinafter referred to as "prior application technique") in patent application No. 10-2020-0073125, so as to be able to realize a classifier having versatility. The adapter is designed to serve as a carrier for supplying electronic components to the tester and increases the versatility of the sorter by enabling the sorter to accommodate a variety of different sizes of electronic components.

The most important situation in the adapter related part is as follows.

First, the adapter should be able to properly grip both ends of all SSDs having a width within the error range due to manufacturing tolerances.

Second, it should be possible to clamp all SSDs within a normal length range (a range from the shortest SSD to the longest SSD) that electronic components of the so-called SSDs can have.

Third, there is a need for a feature that can accurately place SSDs on adapters. Here, the feature may be a structure for the periphery of the adapter, but a structure for the adapter itself is also required. If the SSD is poorly placed, it may become a cause of interference in proper electrical connection between the SSD and the tester afterwards.

Fourth, the posture of the SSD mounted to the adapter should be accurately maintained. In general, the sorting machine generates various operation impacts, and the adapter needs to be moved in a state having electronic components. However, if the SSD cannot be maintained to be properly set due to an operational shock or shake during movement or the like, thereby generating a failure, this eventually leads to a poor electrical connection between the SSD and the tester.

Accordingly, there is a need to continuously study on the adapter in consideration of all the above cases.

Disclosure of Invention

The present invention has been made in view of the following technical considerations: the adapter can properly hold a variety of electronic components regardless of manufacturing tolerances or lengths within an error range.

Moreover, the present invention has been made in view of the following technical considerations: the electronic component can be accurately mounted on the adapter, and the state thereof can be continuously and appropriately maintained after mounting.

An adapter of a sorter for electronic component test according to the present invention includes: a pair of clamping rods which are opposite to each other and linearly move along the direction of narrowing or widening the interval between the clamping rods so as to clamp the rear end part of the electronic component at two ends or release clamping; a setting frame configured to enable the pair of clamping bars to move linearly; a spacing operation device provided to the setting frame for applying an operation force to the pair of clamping bars to move the pair of clamping bars in a direction in which a spacing therebetween becomes wider; and an operation member that applies pressure to the pair of holding bars in a direction in which a distance between the holding bars is narrowed, so that when an operation force applied to the pair of holding bars by the distance operation device is released, the pair of holding bars are moved in the direction in which the distance between the holding bars is narrowed, wherein guide grooves for holding both ends of the electronic component and guiding movement in the front-rear direction are formed on surfaces of the pair of holding bars facing each other, and the guide grooves are formed to be elongated in the front-rear direction.

The interval operation device is provided to the setting frame so as to be linearly movable in the front-rear direction, and includes: and an operation portion provided so that both ends are in contact with the pair of clamp bars, and that, when the pair of clamp bars are linearly moved rearward by an external force, an operation force is applied to the pair of clamp bars in a direction in which a space between the pair of clamp bars becomes wider, and when the pair of clamp bars are linearly moved forward with the external force removed, the operation force is released.

An operation groove having an inclined surface whose depth of a recess becomes shallower toward the rear is formed at a portion where the pair of grip levers face each other, and the operation portion has a protruding portion corresponding to the operation groove and the protruding portion is in contact with the inclined surface, so that an interval between the pair of grip levers is changed according to a position of the operation portion.

The operating member includes: and an elastic member having one side supported by the setting frame and the other side coupled to the pair of clamping bars.

The setting frame has at least one position setting protrusion on both left and right sides, respectively, which can be inserted into a position setting groove of a test hand for moving the adapter.

The front end portion of the installation frame is provided with a receiving groove capable of receiving the front end portion of the electronic component, and the left and right walls forming the receiving groove are provided with support tables capable of supporting two side ends of the front end portion of the electronic component, so that the front end portion of the electronic component can be inserted between the left and right walls forming the receiving groove and aligned by a structure supported by the support tables.

The placement space for placing the electronic component including the guide groove and the receiving groove is opened in the front-rear direction.

The guide groove includes: a horizontal holding section for holding horizontally the electronic component held in a horizontal state; a width increasing section in which a width in the up-down direction gradually increases from a front end of the horizontal maintaining section toward the front; an open section having a width greater than or equal to a front end of the width increasing section toward a rear of the width increasing section.

The adapter further comprises: and a support member having a pair of support protrusions for supporting lower ends of the electronic components, wherein a support table for preventing detachment of the electronic components placed in a horizontal state is formed on the pair of support protrusions, and a through groove through which the support protrusions can pass is formed on the pair of clamping bars.

At least one position fixing groove into which a position fixing pin for placing the bracket of the adapter can be inserted is formed at each of the left and right sides of the installation frame.

According to the present invention, the following effects are exhibited.

First, even in the case where there is a manufacturing tolerance in the manufacturing process, the electronic component can be mounted on the adapter in a state of being appropriately clamped.

Second, electronic components having various lengths can be properly placed on the adapter, thereby improving versatility of the sorter.

Third, the electronic component can be supported by the clamping rod of the elastic component, the guide groove and the step structure of the supporting table, and the electronic component can be properly maintained in the installation state.

Fourth, in the horizontal maintenance section of the guide groove, the rear end portion of the electronic component can be precisely maintained flat, thereby minimizing the possibility of occurrence of a failure in the electrical connection between the electronic component and the tester, thereby improving the reliability of the sorter.

Drawings

Fig. 1 is a reference diagram for explaining an electrical connection structure between an electronic component and a tester.

Fig. 2 is a conceptual block diagram of a handler for testing electronic components to which an adapter is to be applied according to an embodiment of the present invention.

Fig. 3 is a schematic perspective view of the classifier of fig. 2.

Fig. 4 is a combined perspective view for an adapter according to a first embodiment of the invention.

Fig. 5 is an exploded perspective view of the adapter of fig. 4.

Fig. 6 is a cut-away view of a clamping bar for the adapter applied to fig. 4.

Fig. 7 is a virtual cut-out view of a guide slot for the clamping bar of fig. 6.

Fig. 8 is a reference diagram for explaining the function of the guide groove of fig. 7.

Fig. 9 is a reference diagram for explaining a relationship between the adaptor of fig. 4 and the test hand.

Description of the reference numerals

100: adapters 111, 112 of the sorting machine for electronic component testing: clamping rod

GG: guide groove HM: horizontal maintenance interval

WG: width increasing section OS: open section

OG: operation groove TH: through hole

TG: through groove 120: setting frame

121: position setting projections 125, 126: guiding rod

AG: receiving groove J: supporting table

130: the interval operation device 131: operation part

141. 142, 143, 144: elastic member R: rolling roller

Detailed Description

The preferred embodiments according to the present invention will be described with reference to the accompanying drawings, and for brevity of description, repeated or substantially identical descriptions of the structures will be omitted or compressed as much as possible.

The sorter to which the adapter according to the present invention is applied is more suitable for the case of applying a manner in which a portion of the contact terminal side of an electronic component such as an SSD is inserted into a test slot of a tester.

For example, as shown in fig. 1, the structure is as follows: the test slot S is provided in the TESTER test, and the electronic component ED is electrically connected to the TESTER test by inserting the electronic component ED into the test slot S at the contact terminal T side.

Fig. 2 is a schematic plan view of a handler HR for which an adapter (hereinafter simply referred to as "adapter") of the handler for electronic part test according to the present invention can be used, and fig. 3 is a schematic perspective view of the handler HR of fig. 2.

The separator HR according to the present embodiment includes a connecting portion CP, a stacker portion SP, and a transfer device TA.

The connection part CP takes out the electronic component ED to be tested from the customer tray CT and supplies it to the TESTER, or retrieves the electronic component ED after the test from the TESTER and loads it to the customer tray CT. The adapter according to the present invention is used for the connection part CP.

The stacker portion SP stores the customer tray CT carried in the sorting machine HR for supplying the customer tray CT loaded with the electronic components ED to be tested to the connection portion CP, or recovers the customer tray CT loaded with the electronic components ED after the test from the connection portion CP and stores it before carrying it out from the sorting machine HR. The stacker portion SP supplies the customer tray CT loaded with the electronic components ED to be tested, which are being stored, to the transfer device TA, or recovers the customer tray CT loaded with the electronic components ED after the test from the transfer device TA.

The transfer device TA transfers the customer tray CT between the connection portion CP and the stacker portion SP. That is, the customer tray CT loaded with the electronic components ED to be tested is transferred from the stacker portion SP to the connection portion CP by the transfer device TA, and the customer tray CT loaded with the electronic components ED after the test is transferred from the connection portion CP to the stacker portion SP by the transfer device TA.

The sorting machine HR is described in detail in the prior art, and therefore, a flow mainly including an adapter is schematically described.

In a state where the adapter is mounted on the rack, a mobile hand (not shown) takes out the electronic component ED from the client tray CT and mounts it on the adapter. At this time, an opener (not shown) opens the adapter so that the mobile hand can place the electronic component ED on the adapter.

The adapter with the electronic component ED mounted thereon moves from the set position to the clamping position together with the bracket, and stands up by rotation. The test hand (not shown) moves while holding the adapter in the upright state, and electrically connects the electronic component ED to the TESTER. After that, when the test on the electronic component ED is completed, the electronic component ED after the test is loaded on the customer tray CT by the reverse operation.

Fig. 4 is a combined perspective view for the adapter 100 according to the first embodiment of the present invention, and fig. 5 is an exploded perspective view for the adapter 100 of fig. 4.

The adapter 100 includes a pair of holding rods 111, 112, a setting frame 120, a spacing operation device 130, elastic members 141, 142, 143, 144, and a supporting member 150.

The pair of holding rods 111, 112 may be provided so as to face each other, may be guided by guide rods 125, 126 provided to the setting frame 120, and may be linearly moved in the left-right direction in which the distance therebetween becomes narrower or wider. Therefore, if the interval between the pair of holding rods 111, 112 is narrowed, the pair of holding rods 111, 112 is in a state of holding the rear end portion of the electronic component ED in a horizontal state from both ends. When the gap between the pair of holding rods 111, 112 becomes wider, the pair of holding rods 111, 112 is in an open state in which the holding of the electronic component ED is released. Therefore, if an electronic component ED is to be mounted on the adapter 100 or removed from the adapter 100 by a mobile hand, the pair of holding rods 111, 112 should be in an open state for releasing the holding of the electronic component ED.

As shown in the sectional view of fig. 6, two operation grooves OG are formed on the surfaces of the pair of holding rods 111, 112 facing each other, respectively.

The operation groove OG is formed at a portion where the clamping bars 111, 112 contact the spacing operation device 130. Two operation grooves OG respectively located on the same holding rod 111, 112 are formed side by side in the front-rear direction. The operation groove OG is formed to have an inclined surface with a recessed depth that becomes shallower toward the rear.

As shown in fig. 6, a guide groove GG is formed in a longitudinal direction on the upper side of the operation groove OG on the surfaces of the pair of clamp levers 111 and 112 facing each other. The guide groove GG guides the movement of the electronic component ED during the movement of the electronic component ED in the front-rear direction (for example, during the movement of the electronic component to be tested for electrical connection with the tester or during the removal of the electronic component after the test from the tester and the movement to the adapter). Further, when the pair of holding rods 111, 112 are in a state of holding both ends of the rear end portion of the electronic component ED, both ends of the electronic component ED are inserted into and locked in the guide groove GG in the up-down direction, so that the guide groove GG also has a function of holding the electronic component ED.

As shown in the virtual cut-out view of fig. 7, the guide groove GG has a horizontal maintenance section HM, a width increase section WG, a penetration section TS, and an opening section OS in this order from the rear to the front.

The horizontal holding section HM has a narrow width, and has a vertical width substantially equal to the vertical thickness of the electronic component ED, so that the electronic component ED can be held at the position where the contact terminal T at the rear end of the electronic component ED is located while the both ends of the electronic component ED are properly held.

The width increasing section WG is formed so that the width gradually becomes wider toward the front from the front end of the horizontal maintenance section HM. Thus, even if a phenomenon occurs in which the electronic component ED falls due to gravity in a region other than the portion sucked and held by the moving hand during the placement of the electronic component ED, both ends of the electronic component ED can be appropriately held by the two holding rods 111, 112.

The through section TS is formed to have a predetermined width along the front-rear direction from the front end of the width increasing section WG, and corresponds to the width of a through groove TG in the front-rear direction through which left and right side support protrusions of the support member 150 described later can pass.

The open section OS is formed to have a width at least the same as or wider than the front end of the width increasing section WG.

The guide groove GG is opened in the front-rear direction.

As shown in the enlarged view of fig. 8, even when the electronic component ED is bent in a predetermined direction, the guide groove GG having the configuration shown in fig. 7 prevents the adaptor 100 from being problematic when the electronic component ED is held, and also helps the contact terminal T side portion at the rear end to be accurately inserted into the test slot S by maintaining the levelness thereof.

The setting frame 120 is provided for setting and supporting the holding rods 111, 112, the spacing operation device 130, the elastic members 141 to 144, and the support member 150.

The installation frame 120 has position setting protrusions 121 protruding to the left and right sides, respectively, on the left and right sides of the front end portion thereof.

As shown in the reference diagram of fig. 9, the position setting protrusion 121 is associated with a position setting groove SG formed in the grip surface of the test hand 400. That is, when the test hand 400 grips the set frame 120 and finally grips the adapter 100, the position setting protrusion 121 is inserted into the position setting groove SG. Therefore, even if an external force in the front-rear direction is applied to the adapter 100 in a state where the adapter 100 is held by the test hand 400 thereafter, the position of the setting frame 120 can be fixed and maintained, so that the position of the adapter 100 can be fixed and maintained finally. Such a position setting protrusion 121 may be provided at least one. Of course, according to the embodiment, the position setting groove may be formed in the setting frame 120, and the position setting protrusion may be formed in the test hand 400.

The setting frame 120 has guide bars 125 and 126 elongated in the left-right direction to guide the pair of clamp bars 111 and 112 to linearly move in the left-right direction. Naturally, through holes TH through which the guide rods 125, 126 are inserted are formed in the clamp rods 111, 112.

A receiving groove AG capable of receiving a front end portion of the electronic component ED is formed in a front end portion of the installation frame 120. Support bases J capable of supporting both side ends of the front end portion of the electronic component are formed on the left and right walls forming the housing groove AG. Therefore, the electronic component ED can be accurately inserted between the two walls while being supported by the support base J on both sides of the front end portion thereof, and the electronic component ED can be maintained in an aligned configuration. Thus, the electronic components ED can be properly aligned even in a horizontal state, and the electronic components ED can be properly aligned even in a state in which they are formed to stand by posture conversion.

The housing groove AG is also opened in the front-rear direction as in the guide groove GG. This means that the installation space of the adapter 100 where the electronic component is installed is opened in the front-rear direction. That is, the installation space including the guide groove GG and the receiving groove AG is opened in the front-rear direction. Therefore, the electronic components ED of various lengths can be all placed across the guide groove GG and the housing groove AG without being limited by the lengths thereof.

The gap operating device 130 is provided to the setting frame 120, and applies an operating force to the pair of clamp levers 111, 112 to move the pair of clamp levers 111, 112 in a direction in which the gap therebetween becomes wider. For this purpose, the interval manipulation device 130 is provided to the setting frame 120 in a manner capable of moving in the front-rear direction, and includes a manipulation portion 131, a push plate 132, and a transmission lever 133.

The operation portion 131 has two rolling rollers R on the left and right sides, respectively, and the rolling rollers R form protruding portions protruding to the outside of the left and right sides.

The roll roller R is provided at a position corresponding to the position of the operation groove OG. Therefore, the rolling roller R contacts the surface constituting the operation groove OG in a state where a part thereof is inserted into the operation groove OG. That is, both ends of the operating portion 131 of the interval operating device 130 are contacted to the clamp bars 111, 112 by the rolling roller R. Therefore, when the gap operating device 130 moves rearward, the rolling roller R comes into contact with the inclined surface of the operation groove OG, the depth of the recess becomes shallow, and therefore the gap operating device 130 naturally applies an operating force to the two clamp levers 111, 112 in the direction in which the gap between the two clamp levers 111, 112 becomes wider.

In contrast, when the interval operation device 130 moves forward, the rolling roller R comes into contact with the inclined surface of the operation groove OG, the recess depth of which becomes deep, as the interval operation device 130 moves, and thus the operation force applied to the two clamp levers 111, 112 is naturally released.

The push plate 132 receives an external force applied to the spacing operation device 130 in a positive direction via an opener (not shown). That is, the opener applies a force to the rear direction by the push plate 132, thereby supplying a driving force that the interval operation device 130 can move to the rear direction, and the interval operation device 130 is moved to the rear direction by the driving force of the opener.

The transmission lever 133 has a front end fixedly coupled to the push plate 132 and a rear end fixedly coupled to the operating portion 131 side, thereby transmitting an external force of the opener pushing the push plate 132 rearward to the operating portion 131.

The elastic members 141 to 144 are provided with one side thereof connected to the setting frame 120 and the other side thereof connected to the clamping bars 111, 112. Accordingly, the elastic members 141 to 144 apply elastic force to the pair of clamping bars 111, 112 in a direction in which the interval between the pair of clamping bars 111, 112 becomes narrower. Accordingly, when the operation force applied to the pair of holding rods 111, 112 by the interval operation device 130 is removed, the pair of holding rods 111, 112 are moved in a direction in which the interval between them is narrowed by the elastic force of the elastic members 141 to 144, thereby holding the electronic component ED. From this point of view, the elastic members 141 to 144 function as operation members that generate and maintain a pressing force with which the pair of holding rods 111, 112 can hold the electronic component ED, and further function as the closing adapter 100. Of course, as the operation member, a motor, a cylinder, or the like may be considered, but in order to cope with all widths of the electronic member within the machining error range without being provided alone, it is most preferable to construct the operation member with an elastic member such as a spring.

The elastic members 141 to 144 determine the interval between the pair of clamping bars 111, 112 according to the degree of compression thereof. Moreover, this fact means that the elastic members 141 to 144 also function as variable elements that change the clamping width between the pair of clamping bars 111, 112 (the width that the pair of clamping bars need to be spaced apart in order to clamp the electronic component). That is, the clamping bars 111, 112 can clamp the electronic components ED having various widths according to the compression degree of the elastic members 141 to 144.

The support member 150 is provided to prevent the electronic component ED placed in a horizontal state from being separated downward when the pair of holding rods 111, 112 are in a state of releasing the holding of the electronic component ED. Accordingly, the support member 150 has support protrusions protruding upward on the left and right sides, and a support base 151 for supporting the lower end of the electronic component ED is formed on the support protrusions.

The support member 150 is formed substantially asOr U-shaped and fixed to the installation frame 120, the supporting protrusions at the left and right ends protrude upward and pass through the through groove TG, and the supporting base 151 is provided at the upper region of the supporting protrusions. For reference, in the present embodiment, the support member 150 is integrally provided to the setting frame 120, but may be provided to be fixed to the setting frame 120 by a fixing device or detachable from the setting frame 120 according to an embodiment.

Next, the operation of the adapter 100 as described above will be described.

With the replacement of the original or electronic component ED to be tested, the operator mounts the adapter 100 matching the specification of the electronic component ED to be tested to the holder 200. After that, when the hand is moved to place the electronic component ED taken out from the customer tray on the adapter 100, the opener pushes the spacing operation device 130 rearward. At this time, since the setting frame 120 is fixed to the bracket by the position fixing groove (not shown), only the interval manipulation device 130 is moved rearward by the pressurizing force of the opener. In this process, the rolling roller R moves rearward in contact with the inclined surface of the operation groove OG while applying a force in the left-right direction to the clamp levers 111, 112, thereby opening the adapter 100 while widening the interval between the two clamp levers 111, 112.

When the opening of the adapter 100 is completed, the mobile hand places the electronic component ED on the adapter 100. At this time, the rear end portion of the electronic component ED is placed on the support base 151 as the support member 150, and the front end portion of the electronic component ED is placed on the support base J, so that the electronic component ED is placed on the adapter 100 while maintaining an accurate horizontal state.

After that, when the moving hand releases the grip of the electronic component ED and moves to another position, the opener releases the external force applied to the interval operation device 130. Then, by the elastic force of the elastic members 141 to 144, the interval between the two holding rods 111, 112 is narrowed, and the interval manipulation device 130 is also pushed forward. In this process, both left and right ends of the electronic component ED are inserted into the guide grooves GG of the clamping bars 111, 112, thereby completing the clamping of the electronic component ED by the adapter 100. At this time, the degree of compression/expansion of the elastic members 141 to 144 naturally varies according to the left and right widths of the electronic component ED within the machining error range.

At this time, the rear end portion of the electronic component ED can be maintained flat due to the shape of the guide groove GG. Further, even if the electronic component ED is bent to some extent, the electronic component can be appropriately held by the holding bars 111, 112 through the guide groove GG. Even if there is a wider tolerance in the lateral width of the electronic component ED, the rear end portion of the electronic component ED does not become locked to the wall constituting the housing groove AG because the housing groove AG is wide enough.

In addition, the adapter 100 mounted to the stand 200 stands in a vertical manner. At this time, the lower end of the electronic component ED standing vertically is supported by the wall surface of the support table J constituted by the guide groove GG, so that the mounted state thereof is appropriately maintained.

The adapter 100 erected in a vertical manner is held by the test hand 400, in the course of which the position setting protrusion 121 is inserted into the position setting groove SG. Accordingly, the adapter 100 is held at the test hand 400 such that the adapter 100 is positioned at an accurate setting position. Also, since the position of the setting frame 120 can be fixed and maintained even under external force applied to the adapter 100 later, the position of the adapter 100 can be fixed and maintained eventually.

Then, when the test hand 400 moves the adapter 100 toward the TESTER test side to accurately set the position between the adapter 100 and the test slot S, the open element in the test hand 4 finely pushes the gap operating device 130 to finely enlarge the gap between the two holding levers 111, 112, and in this state, the connection element in the test hand 400 pushes the electronic component ED toward the test socket side, so that the rear end portion of the electronic component ED where the contact terminal T is located is inserted into the test slot S located in the test socket.

And, when the test is finished, the adapter 100 is operated in a state of fixing the electronic component ED, and then, the electronic component ED is then taken out of the test slot S by the test hand 400. The extracted electronic component ED is moved through the reverse process and finally loaded to the customer tray CT.

As described above, the present invention has been specifically described by embodiments with reference to the accompanying drawings, but the above embodiments are merely illustrative of preferred embodiments of the present invention, and thus the present invention should not be construed as being limited to the above embodiments, and the scope of the claims and their equivalents should be construed as being defined in the claims.

Claims

1. An adapter of a sorter for electronic component testing, comprising:

a pair of clamping rods which are opposite to each other and linearly move along the direction of narrowing or widening the interval between the clamping rods so as to clamp the rear end part of the electronic component at two ends or release clamping;

a setting frame configured to enable the pair of clamping bars to move linearly;

a gap operation device provided on the setting frame for applying an operation force to the pair of clamping bars to move the pair of clamping bars in a direction in which a gap therebetween is widened; and

an operation member that applies pressure to the pair of clamp levers in a direction in which the distance between the clamp levers is narrowed, so that when the operation force applied to the pair of clamp levers by the distance operation device is released, the pair of clamp levers is moved in the direction in which the distance between the clamp levers is narrowed,

wherein guide grooves for clamping both ends of the electronic component and guiding movement in the front-rear direction are formed on the surfaces facing each other on the pair of clamping bars,

the guide groove is formed to be elongated in the front-rear direction.

2. The adapter of a sorter for electronic component testing according to claim 1 wherein,

the interval operation device is provided to the setting frame in such a manner as to be linearly movable in the front-rear direction,

the interval operation device includes:

and an operation portion provided so that both ends are in contact with the pair of clamp bars, and that, when the pair of clamp bars are linearly moved rearward by an external force, an operation force is applied to the pair of clamp bars in a direction in which a space between the pair of clamp bars becomes wider, and when the pair of clamp bars are linearly moved forward with the external force removed, the operation force is released.

3. The adapter of a sorter for electronic component testing according to claim 2 wherein,

an operation groove is formed at a portion where the pair of holding bars are in contact with each other on surfaces of the pair of holding bars facing each other,

the operation groove is formed into an inclined surface with a concave depth which is gradually reduced toward the rear,

the operating portion has a protruding portion corresponding to the operating groove, and the protruding portion contacts the inclined surface, thereby changing the interval between the pair of clamp bars according to the position of the operating portion.

4. The adapter of a sorter for electronic component testing according to claim 1 wherein,

5. The adapter of a sorter for electronic component testing according to claim 1 wherein,

6. The adapter of a sorter for electronic component testing according to claim 1 wherein,

a receiving groove capable of receiving the front end part of the electronic component is formed at the front end part of the setting frame,

support tables capable of supporting both side ends of a front end portion of the electronic component are formed on left and right walls forming the accommodating groove, so that the front end portion of the electronic component can be inserted between the left and right walls forming the accommodating groove and aligned by a structure supported by the support tables.

7. The adapter of a sorter for electronic component testing as in claim 6 wherein,

8. The adapter of a sorter for electronic component testing according to claim 1 wherein,

the guide groove includes:

a horizontal holding section for holding horizontally the electronic component held in a horizontal state;

a width increasing section in which a width in the up-down direction gradually increases from a front end of the horizontal maintaining section toward the front;

an open section having a width greater than or equal to a front end of the width increasing section toward a rear of the width increasing section.

9. The adapter of a sorter for electronic component testing of claim 1, further comprising:

a support member having a pair of support protrusions for supporting a lower end of the electronic component,

wherein a support table for preventing the lower part of the electronic component arranged in a horizontal state from being separated is formed on the pair of support protrusions,

through grooves through which the support protrusions can pass are formed in the pair of clamp rods.

10. The adapter of a sorter for electronic component testing according to claim 1 wherein,

at least one position fixing groove into which a position fixing pin for placing the bracket of the adapter can be inserted is formed at the left and right sides of the setting frame, respectively.