TWI790096B - Adaptor of handler for testing electronic component - Google Patents
Adaptor of handler for testing electronic component Download PDFInfo
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- TWI790096B TWI790096B TW111101814A TW111101814A TWI790096B TW I790096 B TWI790096 B TW I790096B TW 111101814 A TW111101814 A TW 111101814A TW 111101814 A TW111101814 A TW 111101814A TW I790096 B TWI790096 B TW I790096B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/62—Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement
- H01R13/639—Additional means for holding or locking coupling parts together, after engagement, e.g. separate keylock, retainer strap
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
本發明涉及一種電子部件測試用分選機的適配器。根據本發明的電子部件測試用分選機的適配器具有可夾持具有多樣的寬度的所有電子部件的構成、用於防止所安置的電子部件的脫離的構成、適配器可準確地安置於支架並維持其位置的構成、可被測試手準確地夾持並固定其位置的構成。根據本發明,由於適配器能夠搬運多樣的規格的電子部件,因此具有增加分選機的可用性的效果,而且,由於適配器的位置在與其他結構之間的關係中被準確地設定並維持,因此能夠防止由適配器的位置不良而引起的操作不良或電子部件與測試儀之間的電連接不良等,最終提高針對分選機的可靠性。The invention relates to an adapter of a sorting machine for testing electronic components. The adapter of the sorter for electronic component testing according to the present invention has a structure capable of holding all electronic components having various widths, a structure for preventing the set electronic components from detaching, and the adapter can be accurately set on the rack and maintained. The composition of its position can be accurately grasped by the test hand and its position can be fixed. According to the present invention, since the adapter can carry electronic components of various specifications, it has the effect of increasing the usability of the sorting machine, and since the position of the adapter is accurately set and maintained in relation to other structures, it can It prevents poor operation caused by poor position of the adapter or poor electrical connection between the electronic part and the tester, etc., and ultimately improves the reliability for the sorter.
Description
本發明涉及一種可在電子部件測試用分選機使用的適配器。The present invention relates to an adapter that can be used in a sorter for testing electronic components.
生產的電子部件(例如,半導體元件、基板、SSD等)借由測試儀而進行測試後分為良品和不良品,且只有良品出庫。The electronic components produced (such as semiconductor components, substrates, SSDs, etc.) are tested by a tester and divided into good products and defective products, and only good products are released from the warehouse.
電子部件只有電連接於測試儀才能進行測試,此時,通過將電子部件電連接於測試儀來支持電子部件能夠進行測試的設備為電子部件測試用分選機(以下簡稱為「分選機」)。Electronic components can be tested only when they are electrically connected to the tester. At this time, the equipment that supports electronic components to be tested by electrically connecting electronic components to the tester is a sorter for electronic component testing (hereinafter referred to as "sorter" ).
分選機隨著新的電子部件的開發而被提出並製作,並且為了穩定化,正在進行多樣的後續開發。Sorters are proposed and produced along with the development of new electronic components, and various follow-up developments are being carried out for stabilization.
近來,存在作為搭載有多個電子元件的大型電子部件的固態驅動器(SSD:Solid State Drive)的普及正在擴大的趨勢。Recently, there is a tendency that the popularity of solid state drives (SSD: Solid State Drives), which are large electronic components on which a plurality of electronic components are mounted, is increasing.
最初,由於對SSD的需求較少而僅生產少量時,借由手動操作將SSD直接電連接於測試儀並解除其連接,但是隨著對SSD的需求的劇增,難以借由手動操作來支援測試。Initially, when only a small amount of SSD was produced due to the low demand for SSD, the SSD was directly electrically connected to the tester and disconnected by manual operation, but as the demand for SSD increased sharply, it was difficult to support by manual operation test.
但是,由於SSD的厚度、結構及重量等與現有的電子部件不同而無法直接應用現有的分選機,因此,開發了適合於支援諸如SSD之類的大型電子部件的測試的分選機,並在韓國公開專利10-2019-0050483號及10-2019-0061291號提出。However, because the thickness, structure, and weight of SSDs are different from existing electronic components, existing sorters cannot be directly applied. Therefore, a sorter suitable for supporting the testing of large electronic components such as SSDs has been developed, and It is proposed in Korean Patent Publication No. 10-2019-0050483 and No. 10-2019-0061291.
另外,在SSD的情況下,可以根據所搭載的電子元件的種類或其專用用途等而具有多樣的規格,需要一種用於支援針對這種多樣的規格的電子元件的測試的分選機。但是,由於分選機高價且其規模較大,因此,考慮到生產費用及設置場所等,預計存在對於可在一個分選機對具有多樣的規格的電子部件進行測試的技術的需求。Also, in the case of SSDs, various specifications can be obtained depending on the types of electronic components mounted or their dedicated uses, etc., and a sorter that supports testing of electronic components of such various specifications is required. However, since a sorter is expensive and has a large scale, it is estimated that there is a demand for a technology that can test electronic components having various specifications with a single sorter in consideration of production costs, installation places, and the like.
並且,為了測試規格分別不同的電子部件,需要更換符合對應電子部件的規格的部件,即使不需要更換部件,也需要用於供應新的電子部件的休止時間。據此,由於分選機和測試儀的運行率下降且產生繁雜的人力損失,因此,預計還存在對即使在分選機1週期運行或連續運行時也不需要額外的休止時間的分選機的需求。In addition, in order to test electronic components with different specifications, it is necessary to replace the components conforming to the specifications of the corresponding electronic components, and even if the components do not need to be replaced, a downtime for supplying new electronic components is required. According to this, since the operating rate of the sorting machine and the tester is reduced and complicated manpower loss occurs, it is expected that there will be a sorting machine that does not require an additional stop time even when the sorting machine is operated in one cycle or in continuous operation. demand.
並且,在現有的小品種批量生產產品的半導體元件的情況下,採用如下的方式:配備可裝載數百個以上的半導體元件的測試托盤,並利用多個夾持器直接夾持半導體元件並插入到測試托盤的插入件。在這種系統中,由於在插入件中保持半導體元件的精確位置,並且在與測試儀的連接程序中也保持半導體元件的精確位置,因此即使精度稍微降低也不存在問題。但是,包括半導體元件的電子部件呈逐漸多品種少量生產化的趨勢而對應適用裝置的多樣性,而且會發生需要經過多種測試的情況,由於並非所有測試儀的測試插座存在於相同的位置,因此,需要按電子部件的種類或測試儀的種類製作高價的測試托盤並配備與其相匹配的分選機。通過之前的研究發現,在不考慮上述問題的情況下,在用夾持器直接夾持電子部件的狀態下將電子部件連接到測試插座存在相當大的問題。例如,電子部件不僅具有多樣的種類,還具有多樣的長度和寬度,由於製作的特性,即使是相同種類的電子部件也因加工誤差等原因而難以將其大小製作成100%一致。然而,在不考慮這種狀況而使用夾持器夾持電子部件的情況下,由於未能準確夾持電子部件而丟失,或者電子部件可能由於太強的加壓力而損壞。當然,即使調整夾持器而很好地夾持電子部件,也確認到了如下缺點:根據夾持電子部件的哪個部位、其夾持的強度多少而發生電子部件在夾持的同時被扭曲或旋轉等的情況,從而用夾持器夾持的電子部件難以精確地接觸測試插座。為了改善這種情況,驅動部需要能夠進行精確控制,並需要與所有電子部件相對應,因此驅動軸也需要非常長。並且,為了防止破損或扭曲、不需要的旋轉,需要使用能夠按情況進行扭矩控制的高價的馬達。然而,這種問題要求設備的增大化且較高的生產成本,因此沒有實效性。並且,需要進行用於設定借由夾持器的電子部件的準確的夾持位置等的自動校準來實現精確的接觸,這是實際上需要巨大的費用和技術力的部分。In addition, in the case of semiconductor components of existing small-type mass-produced products, the following method is adopted: a test tray capable of loading more than hundreds of semiconductor components is equipped, and the semiconductor components are directly clamped and inserted by multiple holders. Insert to test tray. In such a system, since the precise position of the semiconductor element is maintained in the interposer and also in the connection procedure with the tester, there is no problem even if the accuracy is slightly lowered. However, electronic components including semiconductor elements tend to be mass-produced in small quantities in a variety of varieties to correspond to the diversity of applicable devices, and there may be cases where various tests are required. Since the test sockets of all testers do not exist in the same position, therefore , It is necessary to make expensive test trays according to the type of electronic components or the type of tester and equip them with matching sorting machines. Through previous studies, it has been found that there are considerable problems in connecting an electronic component to a test socket in a state where the electronic component is directly clamped by a clamper without considering the above-mentioned problems. For example, electronic components not only have various types, but also have various lengths and widths. Due to the characteristics of manufacturing, even electronic components of the same type are difficult to make their
因此,本發明的申請人先前在專利申請10-2020-0073725號中提出了在分選機配備適配器的發明(以下稱為「在先申請技術」,目前未公開),以便能夠體現具有通用性的分選機。適配器被設計成用作用於將電子部件供應到測試儀的載體,並且通過使分選機能夠適應多種不同大小的電子部件,預計有助於大大增加分選機的可用性。Therefore, the applicant of the present invention previously proposed the invention of equipping the sorting machine with an adapter in Patent Application No. 10-2020-0073725 (hereinafter referred to as "prior application technology", which is currently unpublished), in order to be able to reflect the universality sorting machine. The adapter is designed to serve as a carrier for supplying electronic components to the tester and is expected to help greatly increase the usability of the handler by enabling the handler to accommodate electronic components of many different sizes.
本發明更加明確地提出了作為前述的在先申請技術提出的適配器,並且為了進一步改善,出於如下所述的考慮而提出。The present invention proposes the adapter proposed as the technique of the aforementioned prior application more specifically, and proposes it from the considerations described below for further improvement.
第一、需要將適配器準確地安置於支架,即使外力作用於適配器,也需要保持適配器的安置狀態。First, the adapter needs to be accurately placed on the bracket, even if an external force acts on the adapter, the adapter needs to be kept in the placed state.
第二、需要使適配器保持準確地夾持在測試手的狀態。Second, it is necessary to keep the adapter accurately clamped on the test hand.
第三、需要防止安置於適配器的電子部件向下方脫離或掉落。Thirdly, it is necessary to prevent the electronic components placed on the adapter from detaching or falling downwards.
第四、需要使夾持在適配器的電子部件與測試儀精確地電連接。Fourth, it is necessary to precisely electrically connect the electronic components held in the adapter to the tester.
根據本發明的一種電子部件測試用分選機的適配器,包括:一對夾持桿,相互對向,並沿相互之間的間隔變窄或變寬的方向進行直線移動,從而夾持電子部件的兩端或解除夾持;設置框架,設置為所述一對夾持桿能夠直線移動;間隔操作裝置,設置於所述設置框架,用於向所述一對夾持桿施加操作力,以使所述一對夾持桿沿相互之間的間隔變寬的方向移動;及彈性部件,對所述一對夾持桿沿相互之間的間隔變窄的方向施加彈力,從而若借由所述間隔操作裝置而移除施加於所述一對夾持桿的操作力,則使所述一對夾持桿沿相互之間的間隔變窄的方向移動,其中所述彈性部件作為可變元件起到根據壓縮程度來改變所述一對夾持桿之間的夾持寬度的功能,從而使所述一對夾持桿能夠夾持具有多樣的寬度的電子部件。An adapter for a sorter for electronic component testing according to the present invention, comprising: a pair of clamping rods facing each other and moving linearly along the direction in which the distance between them becomes narrower or wider, thereby clamping the electronic component the two ends of the clamping or releasing the clamping; the setting frame is set so that the pair of clamping rods can move linearly; the interval operating device is set on the setting frame and is used to apply an operating force to the pair of clamping rods to moving the pair of clamping rods in a direction in which the distance between them is widened; and an elastic member which applies elastic force to the pair of clamping rods in a direction in which the distance between them is narrowed, so that if the Removing the operating force applied to the pair of clamping rods by removing the gap operating means, the pair of clamping rods is moved in a direction in which the gap between them is narrowed, wherein the elastic member is used as a variable element. It functions to change the clamping width between the pair of clamping rods according to the degree of compression, so that the pair of clamping rods can clamp electronic components with various widths.
所述一對夾持桿在所述一對夾持桿彼此面對的面上形成有引導槽,所述引導槽在所述電子部件沿與所述一對夾持桿進行直線移動的方向垂直的方向移動且電連接到測試儀的程序中引導所述電子部件的移動,其中將與所述一對夾持桿進行直線移動的方向垂直的方向稱為正交方向,所述引導槽沿著所述正交方向細長地形成,從而電子部件隨所述引導槽沿所述正交方向移動。The pair of clamping rods is formed with guide grooves on the faces of the pair of clamping rods facing each other, and the guide grooves are perpendicular to the direction in which the electronic component moves linearly with the pair of clamping rods. The direction of moving and electrically connected to the tester guides the movement of the electronic component, wherein the direction perpendicular to the direction in which the pair of clamping rods move linearly is called the orthogonal direction, and the guide groove is along the The orthogonal direction is formed elongated so that the electronic component moves along the orthogonal direction along with the guide groove.
在所述一對夾持桿處於夾持電子部件的兩端的狀態的情況下,使所述電子部件的兩端插入於所述引導槽,從而所述引導槽還作為夾持槽起到用於夾持電子部件的功能。When the pair of clamping rods are in the state of clamping both ends of the electronic component, the two ends of the electronic component are inserted into the guide groove, so that the guide groove also functions as a clamping groove for The function of holding electronic components.
所述間隔操作裝置以能夠沿所述正交方向進行直線移動的方式設置於所述設置框架,所述間隔操作裝置包括:操作部分,配備為兩端與所述一對夾持桿接觸,並且當沿正方向進行直線移動時,沿所述一對夾持桿之間的間隔變寬的方向對所述一對夾持桿施加操作力,當沿反方向進行直線移動時,解除操作力。The interval operating device is disposed on the setting frame in a manner capable of linearly moving in the orthogonal direction, the interval operating device includes: an operating portion provided with both ends in contact with the pair of clamping rods, and When linearly moving in the forward direction, an operating force is applied to the pair of clamping rods in a direction in which a space between the pair of clamping rods is widened, and when linearly moving in a reverse direction, the operating force is released.
所述操作部分包括:滾動輥,與所述一對夾持桿接觸,在所述一對夾持桿的彼此面對的面的與所述滾動輥接觸的部位形成有操作槽,所述操作槽形成為具有凹陷的深度趨向正方向而變淺的傾斜面。The operation part includes: a rolling roller contacting the pair of clamping rods, an operating groove is formed at a portion of the surfaces of the pair of clamping rods facing each other in contact with the rolling roller, the operating groove The groove is formed to have an inclined surface in which the depth of the depression becomes shallower toward the positive direction.
所述適配器還包括:支撐部件,當所述一對夾持桿處於解除對電子部件的夾持的狀態時,用於防止以臥狀安置的電子部件向下方脫離。The adapter further includes: a support member for preventing the electronic component placed in a lying shape from falling out downward when the pair of clamping rods are in a state of releasing the clamping of the electronic component.
所述支撐部件作為限制部件還起到限制所述一對夾持桿之間的最小間隔的功能。所述適配器還包括:設定孔,當所述適配器安置於支架時,用於與從所述支架的安置面向上方突出的位置設定銷相匹配。The supporting member also functions as a restricting member to restrict the minimum interval between the pair of clamping rods. The adapter further includes: a setting hole for matching with a position setting pin protruding upward from the placement surface of the bracket when the adapter is placed on the bracket.
所述設定孔中的至少一個特定設定孔的邊緣的一部分區間形成於所述設置框架,另一部分區間形成於所述間隔操作裝置。A part of the edge of at least one specific setting hole among the setting holes is formed in the setting frame, and another part of the area is formed in the distance operating device.
所述間隔操作裝置以能夠沿與所述一對夾持桿進行直線移動的方向垂直的方向進行直線移動的方式設置於所述設置框架,其中將與所述一對夾持桿進行直線移動的方向垂直的方向稱為正交方向,與所述特定設定孔對應的特定位置設定銷以如下的高度形成:當所述一對夾持桿處於解除夾持的狀態時,支撐以臥狀安置的電子部件而防止電子部件向下方脫離,在所述間隔操作裝置具有使所述特定位置設定銷通過所述間隔操作裝置而能夠向上方突出的通過孔,所述通過孔為沿所述正交方向形成的細長的長孔形態,從而排除所述特定位置設定銷對所述間隔操作裝置的直線移動的干涉,所述通過孔的一部分構成所述特定設定孔的邊緣的另一部分區間。The spacer operating device is provided on the installation frame so as to be linearly movable in a direction perpendicular to the direction in which the pair of clamping rods are linearly moved, and the pair of clamping rods that are linearly moved The direction perpendicular to the direction is referred to as the orthogonal direction, and the specific position setting pin corresponding to the specific setting hole is formed at a height that supports the horizontally placed To prevent electronic components from coming off downward, the spacer operating device has a passage hole through which the specific position setting pin can protrude upward through the spacer operation device, and the passage hole is along the orthogonal direction. The shape of the elongated long hole is formed to eliminate the interference of the specific position setting pin on the linear movement of the distance operating device, and a part of the passing hole constitutes another part of the edge of the specific setting hole.
所述設定孔中的至少一個設定孔形成於所述設置框架,從而能夠使所述設置框架的位置相對於所述支架而固定。At least one of the setting holes is formed in the setting frame so that the position of the setting frame can be fixed relative to the bracket.
所述設置框架具有在測試手夾持所述設置框架時插入到位於所述測試手的夾持面的位置固定槽的位置固定突起,或者具有供位於所述測試手的夾持面的位置固定突起插入的位置固定槽,使得所述設置框架的位置相對於所述測試手而固定。The setting frame has a position fixing protrusion inserted into a position fixing groove on the clamping surface of the testing hand when the testing hand clamps the setting frame, or has a position fixing protrusion on the clamping surface of the testing hand. The position fixing slot into which the protrusion is inserted allows the position of the setting frame to be fixed relative to the testing hand.
根據本發明,除了借由搬運具有多樣的寬度的電子部件的適配器來增加分選機的可用性的效果之外,還具有如下的效果。According to the present invention, in addition to the effect of increasing the usability of the sorter by carrying the adapters having various widths of electronic components, there are the following effects.
第一、適配器準確地安置於支架,即使外力作用於適配器,也保持適配器的安置狀態,並且保持準確地夾持在測試手的狀態,因此能夠防止因適配器的位置不良而引起的分選機的操作不良。First, the adapter is accurately placed on the bracket, even if an external force acts on the adapter, it will maintain the adapter’s placement state, and maintain the state of being accurately clamped on the test hand, so it can prevent the sorting machine from being damaged due to the poor position of the adapter Poor operation.
第二、不會發生安置於適配器的電子部件的安置不良或丟失。Second, there will be no misplacement or loss of electronic components mounted on the adapter.
第三、不會發生因適配器而引起的電子部件與測試儀的接觸不良。Third, there will be no poor contact between the electronic components and the tester caused by the adapter.
因此、最終提高了分選機的可靠性。Therefore, the reliability of the sorting machine is finally improved.
參照圖式對根據本發明的較佳實施例進行說明,為了簡潔的說明,盡可能省略或壓縮對重複或實質上相同的構成的說明。 <針對電子部件與測試儀的電連接的說明> The preferred embodiments according to the present invention will be described with reference to the drawings, and for the sake of brevity, descriptions of repeated or substantially the same configurations will be omitted or compressed as much as possible. <Explanation for the electrical connection of electronic components and testers>
應用根據本發明的適配器的電子部件測試用分選機更加適用於諸如SSD之類的電子部件的接觸端子側的部位插入到測試儀的測試槽的方式的情況。The electronic component test sorter to which the adapter according to the present invention is applied is more suitable for the case where the contact terminal side portion of an electronic component such as SSD is inserted into the test slot of the tester.
例如,如圖1所示,具有如下結構:在測試儀TESTER配備有測試槽S,並在該測試槽S插入電子部件ED的端子T側的部位,從而電子部件ED與測試儀TESTER電連接。 <針對分選機的構成的示意性的說明> For example, as shown in FIG. 1 , a tester TESTER is equipped with a test slot S, and the electronic component ED is electrically connected to the tester TESTER by inserting the terminal T side of the electronic component ED into the test slot S. <Schematic description of the structure of the sorting machine>
圖2是針對可使用根據本發明的電子部件測試用分選機的適配器100(以下簡稱為「適配器」)的分選機HR的示意性的平面圖,圖3是針對圖2的分選機HR的示意性的立體圖。FIG. 2 is a schematic plan view of a handler HR that can use an adapter 100 (hereinafter simply referred to as “adapter”) of a handler for electronic component testing according to the present invention, and FIG. 3 is a schematic plan view of the handler HR of FIG. 2 Schematic perspective view of .
根據本實施例的分選機HR包括連接部分CP、堆疊器部分SP及移送裝置TA。The sorter HR according to the present embodiment includes a connection part CP, a stacker part SP, and a transfer device TA.
連接部分CP從客戶托盤CT取出待測試的電子部件ED並提供給測試儀TESTER,或者從測試儀TESTER回收測試結束的電子部件ED並裝載到客戶托盤CT。根據本發明的適配器100用於該連接部分CP。The connection part CP takes out the electronic component ED to be tested from the customer tray CT and supplies it to the tester TESTER, or collects the tested electronic component ED from the tester TESTER and loads it on the customer tray CT. An
堆疊器部分SP為了向連接部分CP供應裝載有待測試的電子部件ED的客戶托盤CT而保管搬入到分選機HR的客戶托盤,或者從連接部分CP回收裝載有測試結束的電子部件ED的客戶托盤CT並在從分選機搬出之前進行保管。並且,堆疊器部分SP將正在保管的裝載有待測試的電子部件ED的客戶托盤CT供應到移送裝置TA,或者從移送裝置TA回收裝載有測試結束的電子部件ED的客戶托盤CT。The stacker section SP stores the customer trays carried into the sorter HR to supply the customer trays CT loaded with the electronic components ED to be tested to the connection section CP, or collects the customer trays loaded with the tested electronic components ED from the connection section CP. CT and keep it until it is moved out of the sorter. And, the stacker part SP supplies the customer tray CT loaded with the electronic component ED to be tested being stored to the transfer device TA, or collects the customer tray CT loaded with the tested electronic component ED from the transfer device TA.
移送裝置TA在連接部分CP與堆疊器部分SP之間移送客戶托盤CT。即,裝載有待測試的電子部件ED的客戶托盤CT借由移送裝置TA而從堆疊器部分SP傳遞到連接部分CP,裝載有測試結束的電子部件ED的客戶托盤CT借由移送裝置TA而從連接部分CP傳遞到堆疊器部分SP。 <針對適配器所涉及的電子部件的示意性的流程的說明> The transfer device TA transfers the customer tray CT between the connection part CP and the stacker part SP. That is, the customer tray CT loaded with the electronic parts ED to be tested is transferred from the stacker part SP to the connection part CP by the transfer device TA, and the customer tray CT loaded with the tested electronic parts ED is transferred from the connection part CP by the transfer device TA. Part CP passes to stacker part SP. <Explanation of the schematic flow of electronic components involved in the adapter>
由於在在先申請技術中進行了詳細說明,因此示意性地說明以適配器100為主的移動。Since it has been described in detail in the prior art, the movement mainly of the
在適配器100安置於支架的狀態下,移動手(未圖示)從客戶托盤CT取出電子部件ED並安置於適配器100。此時,開放器(未圖示)開放適配器100,使得移動手柄可將電子部件ED安置於適配器100。With the
安置有電子部件ED的適配器100從設定位置向夾持位置移動,並借由旋轉而豎立。測試手(未圖示)夾持豎立狀態的適配器100後進行移動,並將電子部件ED電連接於測試儀TESTER。此後,若對電子部件ED的測試結束,則經過相反的操作而將測試結束的電子部件ED裝載到客戶托盤CT。
<針對適配器的說明>
The
圖4是針對根據本發明的一實施例的適配器100的分解立體圖。並且,圖5是針對圖4的適配器100的平面圖,圖6是針對圖4的適配器100的底面圖。FIG. 4 is an exploded perspective view of the
適配器100包括一對夾持桿111、112、設置框架120、間隔操作裝置130、彈性部件141、142、143、144、145、146、支撐部件150及復原部件161、162。The
一對夾持桿111、112可以配備為相互對向,可以借由設置於設置框架120的引導桿GB而被引導,並可以沿相互之間的間隔變窄或變寬的方向(圖中的左右方向,以下稱為「左右方向」)進行直線移動。因此,瑞一對夾持桿111、112之間的間隔變窄,則處於一對夾持桿111、112夾持臥狀的電子部件ED的狀態。並且,若一對夾持桿111、112之間的間隔變寬,則一對夾持桿111、112處於解除對電子部件ED的夾持的狀態。因此,如果要想借由移動手將電子部件ED安置於適配器100或從適配器100取出,則一對夾持桿111、112應處於解除對電子部件ED的夾持的開放狀態。A pair of clamping
在一對夾持桿111、112的相互面對的表面分別形成有兩個操作槽OG。Two operation grooves OG are respectively formed on the surfaces facing each other of the pair of
操作槽OG形成於夾持桿111、112與間隔操作裝置130接觸的部位。分別位於同一夾持桿111、112的兩個操作槽OG沿著垂直於左右方向的方向(圖中的前後方向,以下稱為「正交方向」)並排形成。並且,操作槽OG形成為具有凹陷的深度趨向後方而變淺的傾斜面。The operation groove OG is formed at a portion where the clamping
並且,在一對夾持桿111、112的相互面對的面且操作槽OG的上側,沿著正交方向細長地形成有引導槽GG。該引導槽GG在電子部件ED沿正交方向移動的程序中(例如,待測試的電子部件為了與測試儀電連接而移動的程序或測試結束的電子部件從測試儀取出並向適配器移動的程序)引導電子部件ED的移動。進而,在一對夾持桿111、112處於夾持電子部件ED的兩端的狀態的情況下,由於電子部件ED的兩端插入並卡定在引導槽GG,因此引導槽GG還起到用於夾持電子部件ED的夾持槽的功能。In addition, a guide groove GG is formed elongately along the orthogonal direction on the surfaces facing each other of the pair of
設置框架120用於設置並支撐夾持桿111、112、間隔操作裝置130、彈性部件141至146、支撐部件150及復原部件161、162而配備。這種設置框架120在左右兩側分別具有向左側及右側突出的位置固定突起121。The
如圖7的參照圖所示,位置固定突起121與形成於測試手300的夾持面的位置固定槽FG相關。即,當測試手300夾持設置框架120並最終夾持適配器100時,位置固定突起121插入到位置固定槽FG。因此,在之後測試手300夾持適配器100的狀態下,即使對適配器100施加沿正交方向的外力,也能夠固定並維持設置框架120的位置,從而最終可以固定並維持適配器100的位置。當然,根據實施方式,也可以在設置框架120形成有位置固定槽,並在測試手300形成有位置固定突起。As shown in the reference diagram of FIG. 7 , the
並且,在設置框架120的其前方部位形成有兩個第一設定孔122。並且,在中間部位形成有第一設定槽123,在後方部位形成有第二設定槽124。第一設定孔122、第一設定槽123及第二設定槽124為了在適配器100安置於支架的程序中設定適配器100的位置而形成。In addition, two first setting holes 122 are formed at the front portion of the
如參照圖8所示,在本實施例中,以在支架200的安置面形成有向上方突出的位置設定銷PP為前提。並且,第一設定孔122和設定槽123、124形成在對應於位置設定銷PP的位置。因此,在適配器100安置於支架200的程序中,位置設定銷PP插入於第一設定孔122,或者借由與構成設定槽123、124的邊緣面相接的結構而與第一設定孔122及設定槽123、124相匹配,從而準確地設定適配器100的安置位置。進而,第一設定孔122還具有在以後沿垂直方向對適配器100施加外力時固定並維持設置框架120的位置的功能,因此最終還具有相對於支架200固定適配器100的位置的功能。As shown with reference to FIG. 8 , in this embodiment, it is assumed that the position setting pin PP protruding upward is formed on the mounting surface of the
並且,在本實施例中,以位置設定銷PP形成為如下的高度為前提:當一對夾持桿111、112處於解除夾持的狀態時,支撐以臥狀安置於適配器100的電子部件ED,從而防止電子部件ED向下方脫離。In addition, in this embodiment, it is assumed that the position setting pin PP is formed at a height that supports the electronic component ED placed on the
作為參考,第一設定孔122、設定槽123、124、位置設定銷PP的數量可以任意增減為適當的數量。For reference, the number of the
並且,為了防止在一對夾持桿111、112處於解除夾持的狀態時以臥狀安置的電子部件ED向下方脫離,設置框架120具有支撐電子部件ED的下端的第一支撐凸台125。In addition, in order to prevent the electronic component ED placed in a horizontal position from coming off downward when the pair of clamping
間隔操作裝置130設置於設置框架120,並對一對夾持桿111、112施加操作力,以使一對夾持桿111、112向相互間的間隔變寬的方向移動。為此,間隔操作裝置130以可向正交方向移動的方式設置於設置框架120,並包括操作部分131、推板132及傳遞桿133。The
操作部分131在左右兩側分別具有兩個滾動輥R。The
滾動輥R配備於與操作槽OG的位置對應的位置。因此,滾動輥R以其一部分插入於操作槽OG的狀態接觸於構成操作槽OG的面。即,間隔操作裝置130的操作部分131的兩端通過滾動輥R接觸於夾持桿111、112。因此,當間隔操作裝置130向正方向(圖中為後方)移動時,滾動輥R隨著移動而與操作槽OG的凹陷深度變淺的面接觸,因此,間隔操作裝置130自然地向兩個夾持桿111、112之間的間隔變寬的方向對兩個夾持桿111、112施加操作力。在此,正方向是指間隔操作裝置130使適配器100開放的方向移動適配器100的方向。The rolling roller R is provided at a position corresponding to the position of the operation groove OG. Therefore, the rolling roller R is in contact with the surface constituting the operation groove OG in a state where a part thereof is inserted into the operation groove OG. That is, both ends of the operating
相反,當間隔操作裝置130向作為正方向的相反方向的反方向移動時,隨著間隔操作裝置130移動,滾動輥R與操作槽OG的凹陷深度變深的面接觸,因此,自然地解除施加於兩個夾持桿111、112的操作力。On the contrary, when the
推板132受到借由開放器而向間隔操作裝置130向正方向施加的外力。The
傳遞桿133的前端固定結合於推板132,後端固定結合於操作部分131側,從而將輸入到推板132的開放器的外力傳遞到操作部分131。The front end of the
另外,在間隔操作裝置130形成有通過孔134和第三設定槽135。通過孔134和第三設定槽135為了與第一設定孔122、第一設定槽123及第二設定槽124一起在適配器100安裝於支架200的程序中設定適配器100的位置而形成。In addition, a passing
如參照圖9所示,通過孔134與第二設定槽124成對而形成第二設定孔SH。對於這種理由將接著進行說明。As shown with reference to FIG. 9 , the second setting hole SH is formed by pairing the
支架200的位置設定銷PP具有可支撐安置於適配器100的電子部件ED的高度,為此,特定的位置設定銷PP必須通過間隔操作裝置130,為此而在間隔操作裝置130形成通過孔134。因此,第二設定孔SH的邊緣的一部分區間S1由形成於設置框架120的第二設定槽124而提供,另一部分區間S2由形成於間隔操作裝置130的通過孔134而提供。在此,特定的位置設定銷PP應維持插入到通過孔134的狀態。因此,為了不妨礙間隔操作裝置130借由特定位置設定銷PP的直線移動,通過孔134應形成為沿正交方向的細長的長孔形態。如此,由於通過孔134的形態應為長孔,因此需要如圖9所示的機械設計。據此,排除了特定位置設定銷PP對間隔操作裝置130的直線移動的干涉。The position setting pin PP of the
第三設定槽135與第一設定槽123成對而約束位置設定銷PP。The
彈性部件141至146設置成其一側與設置框架120相接,其另一側與夾持桿111、112相接。因此,彈性部件141至146向一對夾持桿111、112之間的間隔變窄的方向對一對夾持桿111、112施加彈力。據此,若借由間隔操作裝置130而移除施加於一對夾持桿111、112的操作力,則一對夾持桿111、112借由彈性部件141至146的彈力而向相互間的間隔變窄的方向移動,從而夾持電子部件ED。從這種觀點來看,彈性部件141至146起到產生並維持一對夾持桿111、112可夾持電子部件ED的夾持力的功能,進一步起到封閉適配器100的功能。The
彈性部件141至146根據其壓縮程度而決定一對夾持桿111、112之間的間隔。而且,這種事實意味著彈性部件141至146作為可變元件還起到改變一對夾持桿111、112之間的夾持寬度(一對夾持桿為了夾持電子部件而需要隔開的寬度)的功能。即,根據彈性部件141至146的壓縮程度,夾持桿111、112能夠夾持具有多樣的寬度的電子部件ED。The
支撐部件150為了在一對夾持桿111、112處於解除對電子部件ED的夾持的狀態時防止以臥狀安置的電子部件ED向下方脫離而配備。因此,在支撐部件150形成有用於支撐電子部件ED的下端的第二支撐凸台151。The supporting
由於支撐部件150以U字形態而固定於設置框架120,因此支撐部件150的左右兩端作為限制部件還起到限制一對夾持桿111、112之間的最小間隔的功能。Since the
在由開放器產生的外力被移除時,復原部件161、162為了使間隔操作裝置向前方復原,對間隔操作裝置朝後方施加彈力。
<對特徵構成的作用的說明>
When the external force generated by the opener is removed, the
隨著更換初始或待測試的電子部件ED,操作者將與待測試的電子部件ED匹配的適配器100安置於支架200。此時,從支架200的安置面向上方突出形成的位置設定銷PP插入到由第一設定孔122、第二設定孔SH、第一設定槽123及第三設定槽135彼此成對而約束位置設定銷PP的部位,從而適配器100以其位置被準確地設定的狀態安置於支架200。Along with replacing the original or electronic part ED to be tested, the operator places the
此後,當移動手要將從客戶托盤CT取出的電子部件ED安置於適配器100時,開放器向後方推動間隔操作裝置130。此時,由於設置框架120的位置被插入於第一設定孔122的位置設定銷PP而固定,因此只有間隔操作裝置130借由開放器的加壓力而向後方移動。在此程序中,復原部件161、162被壓縮,滾動輥R以與形成傾斜面的操作槽OG的壁面相接觸的狀態移動的同時向夾持桿111、112施加左右方向的力,從而兩個夾持桿111、112之間的間隔變寬的同時開放適配器100。Thereafter, when the moving hand is to place the electronic component ED taken out from the customer tray CT on the
當適配器100的開放完成時,移動手將電子部件ED安置於適配器100。此時,電子部件ED放置於第一支撐凸台125、第二支撐凸台151及位置設定銷PP,從而防止其向下方脫離。由此,位置設定銷PP的上端較佳地形成為平坦的形態。When the opening of the
若移動手解除對電子部件ED的夾持之後移動到另一位置,則開放器移除施加到間隔操作裝置130的外力。據此,間隔操作裝置130借由復原部件161、162而向前方復原,並借由彈性部件141至146的彈力而縮小兩個夾持桿111、112之間的間隔。並且,電子部件ED的左右兩端插入到夾持桿111、112的引導槽GG,從而完成借由適配器100的對電子部件ED的夾持。If the moving hand moves to another position after unclamping the electronic component ED, the opener removes the external force applied to the
另外,安置於支架200的適配器100借由測試手300而被夾持,在此程序中,位置固定突起121插入於位置固定槽FG。據此,適配器100被夾持在測試手300,使得適配器100位於正確的設定位置。並且,由於設置框架120的位置在之後施加到適配器100的外力下也能夠被固定和維持,因此適配器100的位置最終也可以被固定和維持。In addition, the
接著,若測試手300使適配器100向測試儀TESTER側移動而正確地設定適配器100與測試插座之間的位置,則測試手300中的開放元件細微地推動間隔操作裝置130而細微地擴大兩個夾持桿111、112之間的間隔,在該狀態下,測試手300中的連接元件將電子部件ED推向測試插座側,從而使電子部件ED的端子部分插入到位於測試插座的測試槽S。Then, if the
並且,當測試結束時,適配器100被操作為固定電子部件ED的狀態,接著,隨後借由測試手300而從測試槽S取出電子部件ED。取出的電子部件ED經過相反的程序而移動,最終被裝載到客戶托盤CT。
<參考事項>
And, when the test ends, the
1、在本實施例中,位置設定銷PP、支撐部件150、第一支撐凸台125及第二支撐凸台151形成為支撐以臥狀安置於適配器100的電子部件ED。但是,也可以實現為在移動手以夾持的狀態下,一對夾持桿111、112夾持電子部件ED或解除夾持。但是,在以後者的方式實現的情況下,需要非常精密地管理移動手的位置、移動手的夾持或解除夾持的時間點、借由夾持桿111、112的夾持或解除夾持的時間點。並且,由於處理速度隨之下降,因此,更佳地,如本實施例所示,實現為位置設定銷PP、支撐部件150、第一支撐凸台125及第二支撐凸台151支撐以臥狀安置於適配器100的電子部件ED。1. In this embodiment, the position setting pin PP, the
並且,較佳地,第一支撐凸台125、形成於支撐部件的第二支撐凸台151及位置設定銷PP的上端的高度以電子部件ED以臥狀安置於適配器100時為基準與形成於夾持桿111、112的引導槽GG的下端高度相同。And, preferably, the heights of the
2、在大多數情況下,當適配器100借由測試手300而接近測試儀TESTER時,測試儀TESTER中測試有大量的電子部件ED。在這種情況下,適配器100和正在測試的電子部件ED可能會發生碰撞,因此為了防止這種情況,如圖10的示意性的背面圖所示,較佳地在適配器100的後端一側配備物理標記M。並且,與此相對應地,在測試儀TESTER側設置相機,使得適配器100接近測試儀TESTER側時能夠借由相機而確認物理標記M。據此,能夠防止適配器100與當前正在測試的電子部件ED之間的碰撞。2. In most cases, when the
並且,如圖11的示意性的側面圖所示,較佳地,實現為適配器100的後端部位形成為具有寬度趨向後方而變窄的傾斜面TF,從而最大限度地防止適配器100與正在測試的電子部件ED之間的碰撞。And, as shown in the schematic side view of FIG. 11 , preferably, the rear end portion of the
3、只有適配器100與測試儀TSETR的測試插座正確對置,電子部件ED才能適當地插入到測試槽S。因此,如參照圖10所示,較佳地,在適配器100的後端另一側沿正交方向形成細長的校正孔CH,在測試插座配備有可插入校正孔CH的矯正銷,使得適配器100能夠精確地對應於測試插座而佈置。3. Only when the
如前述,通過參照圖式的實施例對本發明進行了具體說明,但上述實施例僅對本發明的較佳實施例進行了說明,因此不應理解為本發明僅局限於上述實施例,本發明的權利範圍應理解為申請專利範圍及其等同範圍。As mentioned above, the present invention has been specifically described by referring to the embodiments of the drawings, but the above-mentioned embodiments have only described the preferred embodiments of the present invention, so it should not be understood that the present invention is only limited to the above-mentioned embodiments. The scope of rights should be understood as the scope of the patent application and its equivalent scope.
100:電子部件測試用分選機的適配器 111,112:夾持桿 120:設置框架 121:位置固定突起 122:第一設定孔 130:間隔操作裝置 131:操作部分 134:通過孔 140:彈性部件 150:支撐部件 GG:引導槽 OG:操作槽 R:滾動輥 SH:第二設定孔 100: Adapter for sorting machine for electronic component testing 111,112: clamping rod 120: Setting the frame 121: position fixing protrusion 122: The first setting hole 130: interval operating device 131: Operation part 134: through the hole 140: Elastic parts 150: support part GG: guide groove OG: operation slot R: rolling roller SH: Second setting hole
圖1是用於說明電子部件與測試儀之間的電連接結構的參照圖。FIG. 1 is a reference diagram for explaining an electrical connection structure between an electronic component and a tester.
圖2是針對根據本發明的一實施例的電子部件測試用分選機的概念性的結構圖。FIG. 2 is a conceptual configuration diagram of a sorter for electronic component testing according to an embodiment of the present invention.
圖3是針對圖2的分選機的示意性的立體圖。Fig. 3 is a schematic perspective view of the sorting machine of Fig. 2 .
圖4是針對根據本發明的一實施例的適配器的分解立體圖。Fig. 4 is an exploded perspective view of an adapter according to an embodiment of the present invention.
圖5是針對圖4的適配器的示意性的平面圖。FIG. 5 is a schematic plan view of the adapter of FIG. 4 .
圖6是針對圖4的適配器的示意性的底面圖。FIG. 6 is a schematic bottom view of the adapter of FIG. 4 .
圖7是用於說明圖4的適配器與測試手之間的關係的參照圖。FIG. 7 is a reference diagram for explaining the relationship between the adapter of FIG. 4 and the test hand.
圖8是用於說明圖4的適配器與支架的關係的參照圖。FIG. 8 is a reference diagram for explaining the relationship between the adapter and the bracket in FIG. 4 .
圖9是用於說明圖4的適配器中的第二設定孔的概念圖。FIG. 9 is a conceptual diagram for explaining a second setting hole in the adapter of FIG. 4 .
圖10是針對圖4的適配器的示意性的背面圖。FIG. 10 is a schematic rear view of the adapter of FIG. 4 .
圖11是針對圖4的適配器的示意性的側面圖。FIG. 11 is a schematic side view of the adapter of FIG. 4 .
國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無 Domestic deposit information (please note in order of depositor, date, and number) none Overseas storage information (please note in order of storage country, institution, date, and number) none
ED:電子部件 S:測試槽 T:端子 ED: electronic components S: test slot T: terminal
Claims (12)
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KR20220114214A (en) | 2022-08-17 |
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