KR20210156053A - Handling system for testing electronic component - Google Patents

Abstract

The present invention relates to a handling system for testing electronic components. According to the present invention, the handling system for testing electronic components is provided with an adaptor that can settle electronic components with various standards. The present invention can simultaneously process electronic components with various standards without separate component replacement, thereby extending usability and improving movability.

Description

Handling system for testing electronic components

The present invention relates to a handling system for supporting testing of electronic components, and more particularly, to a handling system for supporting testing of large electronic components equipped with various electronic components, such as SSDs.

Produced electronic components (eg, semiconductor devices, boards, SSDs, etc.) are tested by testers and then divided into good and defective products, and only good products are shipped.

Electronic components can be tested only when they are electrically connected to the tester. In this case, the handling system is the equipment that supports the electronic components to be tested by electrically connecting the electronic components to the tester.

The handling system is being proposed and manufactured in companionship according to the development of new electronic components, and various subsequent developments are being made for stabilization.

In recent years, the spread of SSD (Solid State Drive), which is a large electronic component equipped with various electronic devices, is increasing.

When the initial demand for SSDs was low and only a small amount was produced, the SSDs were manually electrically connected to the tester and disconnected, but as the demand increased, it became difficult to support manual tests.

However, since the thickness, structure, and weight of the SSD were different from those of conventional electronic components, the conventional handling system could not be applied as it is. It has been proposed as 2019-0050483 and 10-2019-0061291.

On the other hand, in the case of an SSD, it may have various standards depending on the type of the mounted electronic device or its dedicated use. Therefore, handling systems for supporting testing of electronic components of various standards are required. However, since the handling system is expensive and its scale is large, it is expected that there will be a demand for a technology that can handle testing of electronic components having various specifications in one handling system in consideration of production cost and installation location.

In addition, in order to test electronic components having different specifications, replacement of components meeting the specifications of the corresponding electronic component is required, and even if replacement of components is not required, a pause time for supply of new electronic components is required. Accordingly, it is expected that there will be a demand for a handling system that does not require a separate downtime even during one cycle or continuous operation of the handling system because the operation rate of the handling system and the tester is damaged, and miscellaneous manpower is lost. do.

In addition, in the case of a semiconductor device, which is a conventional mass-produced product, a test tray capable of loading several hundred or more semiconductor devices is provided, and the semiconductor device is directly gripped with a gripper and inserted into the insert of the test tray. In this system, the precise position of the semiconductor element is held at the insert and also during the connection process with the tester. However, electronic components including semiconductor devices are gradually being produced in small batches of various types in response to the diversity of applied devices, and there are cases where several types of tests have to be performed. , it was necessary to manufacture expensive test trays for each type of electronic component or type of tester and to have a handling system suitable for it. It has been confirmed through previous studies that there is a significant problem in connecting the electronic component to the test socket while holding the electronic component directly with the gripper without considering this. For example, electronic components have different lengths and widths as much as various types, and it is difficult to manufacture the same type of electronic components 100% in size due to processing errors, etc. due to the characteristics of manufacturing. However, if the electronic component is to be gripped with a gripper without considering such a situation, the electronic component may not be properly gripped and may be lost or the electronic component may be damaged due to excessively strong pressing force. Of course, even if the gripper is adjusted to grip the electronic component well, depending on which part of the electronic component is gripped and how strong the grip is, a situation such as the electronic component twisting or rotating along with the gripping occurs, and the gripper grips the electronic component. It was confirmed that it was difficult for an electronic component to precisely contact the test socket. In order to improve this, the driving unit must be capable of precise control, and since it must correspond to all electronic components, the driving shaft must also be very long. In addition, there is a need to use an expensive motor capable of even controlling torque for each situation in order to prevent damage, distortion, and undesired rotation. However, this is ineffective because high cost is required along with enlargement of the equipment. In addition, auto-teaching to set the precise gripping position of electronic components by the gripper should be implemented to make precise contact, which is a part that requires enormous cost and technical skills.

The present invention provides a general-purpose handling system that can stably support all tests on large-sized and various electronic components such as SSDs, and in particular, each electronic component is individually inserted into the slit of the test socket to provide a test socket. It was made with the motivation to provide a handling system that can be optimized for technology that can be electrically connected to and.

In addition, the present invention was made with the motivation to provide a handling system that does not require a handling system or a tester to have a down time for testing electronic components of different standards.

Furthermore, the present invention is to provide a handling system that enables precise contact between an electronic component and a tester even when the width and length of the electronic component change or even the position of the tester socket changes, and does not damage the electronic component made out of motive.

A handling system for testing electronic components according to the present invention includes: a handler for supplying electronic components to be tested to a tester or recovering electronic components for which testing is completed from the tester; a stacker provided to supply a customer tray in which electronic components to be tested to be tested to the handler are loaded, or to retrieve a customer tray in which electronic components that have been tested are loaded from the handler; and a transfer device for transferring a customer tray between the handler and the stacker. Including, wherein the handler is capable of loading one electronic component, the adapter of which the seating width of the electronic component can be adjusted so that the electronic component of various standards can be seated; Move the electronic component to be tested from the customer tray that came from the stacker to the supply position to the adapter at the setting position, or transfer the electronic component that has been tested from the adapter at the setting position to the customer tray at the retrieve position. at least one moving hand for moving; an opening device for opening the adapter so that the mobile hand can load or handle electronic components on the adapter; and a test hand that enables the electronic component to be tested by gripping and moving the adapter and then electrically connecting the electronic component loaded on the adapter to a tester while the adapter is gripped. includes

a rotator capable of rotating the adapter to stand up electronic components mounted on the adapter from a horizontal state to a vertical state, or to lay down an electronic component mounted on the adapter from a vertical state to a horizontal state; may further include.

a mover for moving the adapter from the setting position to a holding position capable of being held by the test hand; Further comprising, wherein the test hand grips the adapter at the gripping position, the gripping position is preferably closer to the tester than the setting position.

The adapter may include a pair of gripping members capable of linearly moving toward or away from each other in order to grip both ends of the electronic component; and an elastic member for applying an elastic force so that the gap between the pair of gripping members is narrowed when the distance between the pair of gripping members is widened by the external force applied by the opener and then the external force by the opener is removed. includes

A guide groove is formed in the holding member to guide the movement of the electronic component while being electrically connected to the tester while the electronic component is moved by the test hand.

The test hand includes a gripping element for gripping or releasing the gripping adapter; a horizontal moving element for moving the gripping element in a horizontal direction; a vertical moving element for moving the gripping element in a vertical direction; an opening element for opening the adapter so that the electronic component can move while being supported by the adapter; and a connection element for electrically connecting the electronic component to the tester by pushing the electronic component made movable by the operation of the opening element toward the tester. includes

An adapter for mounting an electronic component according to the present invention includes: a pair of gripping members capable of linear movement toward or away from each other in order to grip both ends of the electronic component; and an elastic member for applying an elastic force so that the distance between the pair of gripping members is narrowed when the external force is removed after the gap between the pair of gripping members is widened by an external force; includes

A guide groove is formed in the holding member to guide the movement of the electronic component while the electronic component is electrically connected to the tester while moving.

According to the present invention, there are the following effects.

First, the handling system itself can test electronic components of various standards (width, length, type) including processing errors without involving replacement of parts. In particular, the seating part of the adapter is open in the front and rear directions, and even if the moving hand grips or releases any part of the adapter, it is not a problem because the position can be changed in the test hand. wide.

Second, since electronic components with different specifications can be continuously tested, usability is expanded and operability is improved.

Third, even when all testers with different positions or arrangements of test sockets (slits) have to go through, all responses are possible.

Fourth, even electronic components with weak thin film strength can be precisely connected to the tester without damage.

Fifth, it is possible to respond to electronic parts that cannot be resolved even by torque control.

Sixth, since the test hand holds the adapter on which the electronic component is seated, the adapter has a calibration hole and the tester has a calibration pin on the side of the tester to correct the mutual position between the adapter and the tester, the electronic component is aligned with the calibration pin Since the adapter moves, it is possible to precisely connect the electronic component and the tester without damage or distortion of the electronic component.

Seventh, since there is no rotator or a long motor shaft for rotating electronic components in the test hand, the test hand is very light and stable operation is possible, and the size of the equipment is small, so hypertrophy of the equipment is prevented.

1 is a reference diagram for explaining an electrical connection structure between an electronic component and a tester.
2 is a conceptual structural diagram of a handling system for testing electronic components) according to an embodiment of the present invention.
3 is a schematic perspective view of the handling system of FIG. 2 ;
4 is a conceptual plan view of a handler applied to the handling system of FIG. 2 .
5 is an excerpted perspective view of a main part of the handler of FIG. 4 .
Fig. 6 is a schematic perspective view of an adapter applied to the handler of Fig. 4;
7 is an exploded perspective view of the adapter of FIG. 6 ;
FIG. 8 is a reference diagram for explaining an operating state of the adapter of FIG. 6 .
9 is a schematic perspective view of a mount applied to the handler of FIG. 4 .
10 is a schematic perspective view of a test hand applied to the handler of FIG. 4 .
11 is an excerpt of a gripping element configured in the test hand of FIG. 10 .
Fig. 12 is an excerpt of an opening element configured in the test hand of Fig. 10;
13 is an excerpt of a connection element configured in the test hand of FIG. 10 .
14 is a conceptual perspective view of a stacker applied to the handling system of FIG. 2 .
15 is a schematic perspective view of a transport device applied to the handling system of FIG. 2 .
16 is a schematic perspective view of a feeder applied to the transport device of FIG. 15 .
17 is a schematic perspective view of a supply elevator applied to the transfer device of FIG. 15 .
18 is a schematic perspective view of a transfer applied to the transfer device of FIG. 15 .
19 is a reference diagram for explaining an extension example of the handling system of FIG. 2 .

A preferred embodiment according to the present invention will be described with reference to the accompanying drawings, but for the sake of brevity of description, descriptions of overlapping or substantially identical components will be omitted or compressed as much as possible.

<Description of the electrical connection between the electronic component and the tester>

The handling system for testing electronic components (hereinafter abbreviated as 'handling system') according to the present invention is more appropriately applied when the contact terminal side portion of the electronic component is inserted into the test slit of the tester, such as SSD.

For example, as in FIG. 1 , a test slit S is provided in the tester TESTER, and the terminal T side portion of the electronic component ED is inserted into the test slit S, thereby the electronic component ED. ) and the tester are electrically connected.

<A brief description of the large structure of the handling system>

2 is a schematic plan view of a handling system (HS, hereinafter abbreviated as 'handling system') for testing electronic components according to an embodiment of the present invention, and FIG. 3 is a schematic plan view of the handling system HS of FIG. 2 is a perspective view.

The handling system HS according to the present embodiment includes a handler 100 , a stacker 200 , and a transfer device 300 .

The handler 100 supplies the electronic component ED to be tested to the tester TESTER or collects the electronic component ED for which the test is completed from the tester TESTER.

The stacker 200 supplies the customer tray CT on which the electronic components ED to be tested to be tested to the handler 100 are loaded, or the customer tray CT on which the electronic components ED for which the test has been completed are loaded. (100) is provided for recovery from.

The transfer device 300 transfers the customer tray CT between the handler 100 and the stacker 200 . That is, the customer tray CT on which the electronic components ED to be tested are loaded may be transferred from the stacker 200 to the handler 100 by the transfer device 300 , and the electronic component ED for which the test is completed. The customer tray CT on which ) are loaded may be transferred from the handler 100 to the stacker 200 by the transfer device 300 .

Hereinafter, the table of contents will be divided and described for each major component.

<Description of the handler>

The present invention has its main characteristics in the handler 100 of the handling system HS. FIG. 4 is a conceptual plan view of the handler 100 applied to the handling system HS of FIG. 3 , and FIG. 5 is an excerpt of the main component part I from the handler 100 of FIG. 4 .

As shown in FIGS. 4 and 5 , the handler 100 includes an adapter 110 , a holder 120 , a moving hand 130 , an opener 140 , a rotator 150 , a mover 160 , and a test hand 170 . ) is included.

The adapter 110 has a structure in which one electronic component ED can be seated and fixed, and the seating width can be adjusted so that electronic components ED of various standards can be seated without any change in configuration. For this purpose, as in the excerpted perspective view of FIG. 6 and the exploded view of FIG. 7 , the adapter 110 includes a pair of gripping members 111a and 111b, the adjusting member 112 , the first elastic springs 113 , and the second elastic It includes springs 114 and a frame 115 .

The pair of gripping members 111a and 111b are provided to grip the left and right ends of the electronic component ED, and are guided by the guide bar GB in the frame 115 in a direction closer to or farther away from each other while moving left and right linearly. provided to do The pair of gripping members 111a and 111b has two adjustment grooves CG formed on the surfaces facing each other, and guide grooves GG long in the front-rear direction at the upper portion of the adjustment groove CG. ) is formed. Here, the adjustment groove GG is formed to adjust the seating width W of the electronic component ED formed between the both gripping members 111a and 111b, and is formed to have a shallower depth from the front to the rear. In addition, the guide groove GG has a function of guiding the forward and backward movement of the electronic component ED and a gripping groove in which the left and right ends of the electronic component ED are inserted so that the electronic component ED is stably gripped by the adapter 110 . functions as a

The adjusting member 112 may move forward and backward in the forward and backward directions, and when moving backward, serves to widen the gap between the pair of gripping members 111a and 111b. In order to perform its role, the adjusting member 112 includes four rollers (R), an installation structure (112a), a push plate (112b) and a transmission rod (112c).

Two rollers (R) are provided on both left and right sides, respectively, and are in contact with the surface forming the adjustment groove (CG).

The installation structure 112a is provided to install four rollers (R). That is, the four rollers R are installed in the installation structure 112a so that they can be rotated using the Z axis (vertical axis) as the rotation axis.

The push plate 112b receives a rearward pushing force applied by the opener 140 .

The transmission rod 112c has a front end fixedly coupled to the push plate 112b and a rear end fixedly coupled to the installation structure 112a, so that the pushing force of the opener 140 input to the push plate 112b is applied to the installation structure 112a. transmit

One side of the first elastic springs 113 is in contact with the frame 115, and the other side is in contact with the gripping members 111a and 111b. It is provided as an elastic member to apply. That is, the adjustment member 112 on which the roller R is mounted functions to widen the gap between the holding members 111a and 111b, and the first elastic springs 113 are the gap between the holding members 111a and 111b. functions to narrow the

The second elastic springs 114 are provided as elastic members for applying an elastic force for pushing the adjustment member 112 forward. That is, when the opener 140, which will be described later, removes the force pushing the adjusting member 112 backward, the second elastic spring 114 pushes the adjusting member 112 forward by the elastic force, thereby adjusting the adjusting member 112. advance the

The frame 115 is provided to install and support the holding members 111a and 111b, the adjusting member 112, the first elastic spring 113, the second elastic spring 114, and the like. A calibration hole for matching between the electronic component ED and the tester TESTER may be formed in the frame 115 (to be described later).

Next, the operation of the adapter 110 will be described.

When the opener 140 applies a rearward pushing force to the push plate 112b, the adjusting member 112 moves rearward. At this time, since the roller (R) is in contact with the surface forming the adjustment groove (CG) that becomes shallower toward the rear, the backward force of the roller (R) is the force that pushes both the holding members (111a, 111b) in the left and right directions. By switching, the gap between the holding members 111a and 111b is widened. In this way, the electronic component ED may be seated or the electronic component ED seated thereon may be pulled out by the moving hand 130 in a state where the distance between the both gripping members 111a and 111b is maximized. And when the force applied by the opener 140 is removed, the adjusting member 112 is advanced by the elastic force of the second elastic spring 114 , and both gripping members are driven by the elastic force of the first elastic spring 113 . (111a, 111b) becomes narrower. As such, since the seating width W in which the electronic component ED can be seated can be adjusted by a certain range between the maximum and minimum spacing between the two gripping members 111a and 111b, the left and right widths within the range can be adjusted. All electronic components ED of various standards may be stably loaded on the adapter 110 . For reference, (a), (b), (c) of FIG. 8 schematically shown exaggeratedly are electronic components (ED) having _{various seating widths (W 1} , W ₂ , W _{3 ) of the adapter 110} ) to show the fixed state. Here, the seating width W corresponds to the extent to which the first elastic spring 113 corresponds to the size of the electronic component ED, so the electronic component ED is stably gripped by the adapter 110, which will be described later. Since the test hand 170 only needs to be strongly gripped by the same height so that only the adapter 110 is not lost, the problem or load of the gripping and movable range of the test hand 170 is reduced.

The mount 120 is provided to fix and mount the adapter 110, and as referenced in the excerpts of FIGS. 9 (a) and (b), a pair of fixing members 121a, 121b, and a driving source 122 and a pair of transmission elements 123 .

The pair of fixing members 121a and 121b may fix or release the adapter 110 by being spaced apart or narrowing in the left and right directions. That is, when the fixing members 121a and 121b move in a straight line in the left and right directions while being guided by the guide rail GR, and the gap between the fixing members 121a and 121b widens, the adapter 110 is mounted on the holder 120 or When the distance between the fixing members 121a and 121b is narrowed, the adapter 110 is in a state in which it can be separated from the holder 120 .

The driving source 122 supplies a driving force for adjusting the distance between the pair of fixing members 121a and 121b, and is provided as a cylinder in this embodiment.

The transmission elements 123a and 123b transmit the driving force applied by the driving source 122 to the pair of fixing members 121a and 121b. In the present embodiment, while the transmission elements 123a and 123b rotate, the forward and backward movement force of the driving source 122, which is a cylinder, is converted to the left and right movement force of the fixing members 121a and 121b and is transmitted. Transformation may be possible.

For reference, the cradle 120 is adopted as a configuration by taking a structure to move and rotate the adapter 110 between the holding positions GP from the setting position SP to the setting position SP, as will be described later. However, depending on the implementation, it may be omitted if rotation of the adapter 110 is not required.

The moving hand 130 moves the electronic component ED to be tested from the stacker 200 to the adapter 110 at the setting position SP from the customer tray CT, which has come to the supply position FP, or The electronic component ED whose test has been completed is moved from the adapter 110 in the setting position SP to the customer tray CT in the recovery position RP. The moving hand 130 holds the electronic component ED by vacuum adsorption, and has a plurality of pickers so as to selectively suck and hold the electronic component ED at various points. Since the technology related to the mobile hand 130 is described in detail in Korean Application No. 10-2020-0019380, which is a prior application of the present applicant, a detailed description thereof will be omitted herein.

The opener 140 opens the adapter 110 so that the moving hand 130 can load or load the electronic component ED on the adapter 110 by opening the adapter 110 at the setting position SP. That is, in a state in which no external force is applied, both gripping members 111a and 111b of the adapter 110 are closed by the elastic force of the first elastic spring 113 in a state where the distance between them is minimized, and the opener 140 . An external force is applied to widen the gap between the holding members 111a and 111b through the adjusting member 112 . Such an opener 140 may be implemented in various forms, but in this embodiment it is composed of a cylinder 141 and a pusher 142 as an operating source.

The cylinder 141 moves the pusher 142 forward and backward in the forward and backward directions, and the pusher 142 contacts the push plate 112b when moving backward to push the adjusting member 112 rearward. Accordingly, as mentioned above, as the adjusting member 112 is pushed back, the gap between the both gripping members 111a and 111b is widened. Of course, when the pusher 142 moves forward, since the external force is removed from the push plate 112b, the adjustment member 112 advances forward by the elastic force of the second elastic spring 114 .

The rotator 150 ultimately rotates the adapter 110 by rotating the holder 120 to set the electronic component ED loaded on the adapter 110 from a horizontal state to a vertical state. As the electronic component ED is vertically erected by the rotating machine 150 , the contact terminal T side portion of the electronic component ED is in a state in which it can be properly inserted into the test slit S. Of course, the rotator 150 also serves to reversely rotate the adapter 110 on which the electronic component ED, which is later tested, is loaded, so that the electronic component ED in the vertical state is converted to the horizontal state. For reference, if the electronic component ED is electrically connected to the tester TESTER in a horizontal state (for example, when the test slit is formed to be long in the horizontal direction), the rotating machine 150 does not perform its role, or The configuration of the rotator 150 may be omitted.

The mover 160 moves the cradle 120 from the setting position SP to the holding position GP that the test hand 170 can hold, thereby ultimately moving the adapter 110 from the setting position SP to the test hand. (170) moves to the gripping position (GP) that can be gripped. The reason for moving the adapter 110 from the setting position SP to the holding position GP through the mover 160 is smooth and smooth by preventing the operation sections of the moving hand 130 and the test hand 170 from overlapping each other. This is to enable rapid work, and further, to enable the test hand 170 to move the adapter 110 quickly. Therefore, it is preferable that the holding position GP is closer to the tester TESTER than the setting position SP.

The test hand 170 grips the adapter 110 at the gripping position GP, moves it, inserts the contact terminal T side of the electronic component ED into the test slit S, and moves the electronic component ED. When the test is completed, the electronic component ED is withdrawn from the test slit S, and the adapter 110 loaded with the electronic component ED for which the test is completed is moved back to the gripping position GP. For this purpose, as shown in the excerpt of FIG. 10 , the test hand 170 includes a gripping element 171 , horizontal moving elements 172a and 172b , a vertical moving element 173 , an opening element 174 and a connecting element 175 . includes

The gripping element 171 is provided for gripping or releasing the gripping of the adapter 110, and for this purpose, as referenced in the excerpt of FIG. 11 , the distance between each other is widened or narrowed by the driving force of the drive source 171b. It has a pair of gripping members (171a-1, 171a-2) capable of gripping or releasing the grip (110).

The horizontal moving elements (172a, 172b) can move the adapter 110 to the currently empty test slit (S) side among the plurality of test slits (S) by moving the gripping element 171 in the horizontal direction, left, right, and front and rear directions. let there be

The vertical moving element 173 moves the gripping element 171 in the vertical direction, whereby the gripping element 171 grips the adapter 110 in the gripping position GP or the gripped adapter 110 is the height required for testing. to be raised, and vice versa.

The opening element 174 slightly opens the adapter 110 to the extent that the electronic component ED can be retained in the adapter 110 . To this end, the opening element 174 has a pusher 174a that can be moved forward and backward by a driving source 174b as shown in the excerpt of FIG. 12 . Here, the pusher 174a opens the adapter 110 by slightly pushing the push plate 112b while the gripping element 171 grips the adapter 110, so that the electronic component ED is maintained in the adapter 110. to be in a state where it can be moved forward or backward. That is, the opening element 174 provided in the test hand 170 opens the adapter 110 only to the extent that the electronic component ED can be moved in the front-rear direction without being separated from the adapter 110 . Accordingly, the electronic component ED may be moved in the front-rear direction while being guided by the guide groove GG while still being mounted on the adapter 110 .

In the connection element 175, the pusher 175a moving forward and backward by the actuating source 175b pushes the electronic component ED backward, and the contact terminal T side of the electronic component ED is inserted into the test slit S. make it possible Here, since the electronic component (ED) is inserted into the test slit (S) by the connecting element (175), the electronic component (ED) is inserted into the adapter ( It suffices to be seated on the 110) And when the forward and backward distance of the connecting element 175 is adjusted, both the electronic component ED having a short front and rear length and the electronic component ED having a relatively long front and rear length are all out of the adapter 110. The terminal portion of the electronic component ED may be exposed, and the configuration and operation of the connection element 175 may be fully understood through the excerpt of Fig. 13 .

On the other hand, in the process of connecting the electronic component ED and the tester, the adapter 110 is slightly opened, and the electronic component ED is moved in the guide groove GG of the adapter 110 to insert the electronic component into the adapter ( It is a great advantage of the present invention that the electronic component (ED) can be made in a state that can be inserted into the test slit (S) by exposing it to the outside of the 110). That is, in the present invention, the guide groove GG of the adapter 110 performs two functions, which will be described additionally.

The first is the gripping function. If the electronic component (ED) seated on the adapter is a thin plate, there may be problems such as bending or twisting. Therefore, the first elastic spring 113 that applies a gripping force for gripping the electronic component ED should have an elastic modulus capable of pressing the electronic component to a weak degree as possible. Therefore, the stability of gripping the electronic component (ED) may be a problem, and the guide groove (GG) reinforces this.

The second is the guidance function. In order to insert the electronic component ED into the test slit S, the electronic component ED must be drawn out of the adapter 110. At this time, the guide groove GG guides the movement of the electronic component ED. will be.

For reference, when the test is finished, the adapter 110 is in a state in which the electronic component ED is fixed, and the gripper 171 holding the adapter 110 moves forward so that the electronic component ED is moved to the test slit ( It can be removed from S). In this case, it may be preferable to provide a separate fixed insert (not shown) so that the electronic component ED can be accurately inserted into the adapter 110 . If the insertion stand is provided, after withdrawing the electronic component ED, the rear end of the electronic component ED is placed on the insertion table, and the gripper 171 moves backward in a state in which the adapter 110 is slightly opened. ED) is properly inserted into the adapter 110 to be seated. In this way, the electronic component ED and the terminal thereof can be protected by being seated inside the adapter 110 again.

Alternatively, additionally providing a separate insertion mechanism with power to the test hand 170 to properly seat the electronic component ED drawn from the test slit S on the adapter 110 may be considered. can

<Description of the stacker>

14 is a schematic perspective view of the stacker 200 .

The stacker 200 is provided to supply the customer tray CT to the handler 100 or collect it from the handler 100 . For this purpose, the stacker 200 has storage spaces RS having a height of three floors.

The storage spaces (RS2) on the second floor can be used to supply or retrieve a bundle (B) of customer trays (CT) by an automated logistics device or a worker. At this time, the top of the customer trays (CT) of the bundle (B) is covered by the cover tray.

The storage spaces (RS) on the third floor are provided to secure capacity, and a bundle (B) of customer trays (CTs) with electronic components (ED) to be tested coming from the storage spaces (RS) on the second floor are accommodated. do. However, any one of the storage spaces RS of the third floor may be used to accommodate the cover trays.

The storage spaces (RS) on the first floor accommodate customer trays (CT) loaded with electronic components (ED) that have been tested.

Of course, the roles of the above storage spaces (RS) can be interchanged, and the situation of the test house (test factory) or its The role may change according to the needs of the system or the consumer.

For the logistics of the customer tray CT in the stacker 200, a moving space MS for logistics of the customer tray CT is secured between the storage spaces RS on the left and the handler 100 on the right. have. And each storage space (RS) is provided with a moving element 210 that can move the customer tray (CT, or a bundle of customer trays) in the left and right direction, so that the customer tray ( It is possible to move the CT) to the moving space MS, or to move the customer tray CT in the moving space MS to the storage space RS.

In addition, the stacker 200 is provided with a tray mover 220 for moving the customer tray (CT, or a set of customer trays) on the moving space (MS).

The tray mover 220 has a gripper 221 capable of holding a bundle (B) of customer trays (CT) on its upper side, and a cover tray or a single sheet of customer tray (CT) on its lower side. have. In addition, the gripper 221 may move in up-down and front-rear directions. Therefore, the tray mover 220 can lift or horizontally move a bundle of customer trays (CT) or individual customer trays (CT) or cover trays on the moving space (MS), and transfer the individual customer trays (CT) to the transfer device ( 300) can also be supplied. Of course, the tray mover 220 may be provided separately as a first mover for moving the customer trays (CT) of a bundle (B) and a second mover for moving the customer trays (CT) or cover trays of individual sheets. There will be.

The operation of the stacker 200 as described above will be briefly described.

When a set of customer trays (CT) are loaded into the storage space (RS) on the second floor by automated equipment or other manual labor, the tray mover 220 moves the customer trays (CT) of each bundle (B) to 3 It is moved to the storage space (RS) of the floor at once. In this way, the automation equipment or the operator can load the customer tray (CT) of another bundle (B) in the storage space (RS) on the second floor. At this time, bundles (B) of customer trays (CT) supplied by automation equipment or workers through the storage space (RS) on the second floor may contain electronic components (ED) of different specifications for each bundle (B). have. That is, according to the present invention, since electronic components (ED) of different standards can also be supported to enable continuous test work, each of the storage spaces RS in the storage spaces RS on the second or third floor has each other. A customer tray (CT) filled with electronic components (ED) of different specifications may be loaded.

<Description of the transfer device>

15 is a schematic perspective view of the transport device 300 .

The transfer device 300 is located in front of the handler 100, and receives the customer tray CT on which the electronic component ED to be tested is loaded from the tray mover 220 of the stacker 200 and moves the hand 130. Moves the electronic component (ED) to the supply position (FP) where it can be gripped, and returns the customer tray (CT) loaded with the electronic component (ED) to the stacker 200 from the recovery position (RP). give. To this end, the transfer device 300 includes a feeder 310 , a recovery machine 320 , five supply elevators 331 , three recovery elevators 332 , and a transfer 340 . Among these configurations, the feeder 310 and the collector 320 are located on the stacker 200 side, and the elevators 331 and 332 and the transfer 340 are located on the handler 100 side.

The feeder 310 is provided to supply the customer tray CT on which the electronic component ED to be tested received from the tray mover 220 is loaded to the transfer 340 . This feeder is provided with a moving plate 311 that can load the customer tray CT as referenced in the excerpt of FIG. 16, and the moving plate 311 is an area (stack) in which the tray mover 220 operates. Since it is possible to reciprocate between the kerr side) and the region (handler side) in which the transfer 340 operates, the customer tray CT received from the tray mover 220 can be supplied to the transfer 340 .

The collector 320 is provided to collect the customer tray CT on which the electronic component ED received from the transfer furnace 340 has been completed and transfer it to the tray mover 220 . Similarly, the collector 320 also has the same structure as the feeder 310 so that the customer tray CT received from the transfer 340 can be sent to the tray mover 220 .

Each of the five supply elevators 331 on the supply line side has a supply elevator plate 331a on which the customer tray CT can be placed, as referenced in the excerpt of FIG. 17 . Therefore, the customer tray CT placed on the elevator plate 331a for supply by the transfer 340 rises to a height at which the moving hand 130 can hold the electronic component ED in the customer tray CT. can And when the elevated customer tray CT is fixed by a fixture (not shown) installed on the work plate WP, the lifting plate 331a for supply descends again, so the lifting plate 331a for supply is the work plate. It may be in a state that does not interfere with the operation of the transfer 340 working under the (WP).

When all of the electronic components (ED) whose test has been completed by the operation of the moving hand 130 are loaded in the customer tray CT, the elevator 332 for recovery 332 lowers the customer tray CT so that the transfer 340 is It enables the customer tray CT to be moved to the collecting machine 320 . The elevator 332 for recovery also has a lift plate 332a for recovery and has the same structure as the elevator 331 for supply.

The transfer 340 moves the customer tray (CT) loaded with the electronic component (ED) to be tested from the feeder 310 to the elevator 331 for supply, and the customer tray ( CT) is moved from the recovery elevator 332 to the recovery device 320 . In addition, when the customer tray CT placed on the supply elevator plate 331a is empty, the transfer 340 moves the emptied customer tray CT to the recovery elevator plate 332a to complete the test. (ED) plays a role to be loaded on the customer tray (CT). Such a transfer 340 has a pair of gripping levers 341a and 341b for gripping or releasing the gripping of the customer tray CT as shown in the excerpt of FIG. 18 . Of course, the grip levers 341a and 341b are provided to be movable in the left-right direction, the front-rear direction, and the vertical direction.

For reference, in this embodiment, for the smooth distribution of the customer tray (CT), the supply line and test for supplying the customer tray (CT) loaded with the electronic component (ED) to be tested from the stacker 200 to the handler 100 Although there is a recovery line for recovering the customer tray CT loaded with the electronic component ED from the handler 100 to the stacker 200, depending on the implementation, the supply line and the recovery line are one line. Incorporation into , can also be considered. In this case, the supply unit 310 and the recovery unit 320 are integrated into one, and the supply elevator 331 and the recovery elevator 332 are also located on the same line in the left and right directions to be integrated and operated.

In addition, since there is a transfer 340 , the supply position FP and the recovery position RP in FIG. 4 are arbitrarily marked, and the supply position FP and the recovery position RP are various positions changed depending on the use situation. This can be.

<Description of overall logistics>

1. Logistics accompanying the customer tray

When the customer tray CT loaded with the electronic component ED to be tested in the storage space RS is placed on the elevator plate 331a for supply by the tray mover 220 , the feeder 310 and the transfer 340 , , the elevator 331 for supply raises the customer tray CT to the work plate WP, and the customer tray CT is fixed to the work plate WP. In this state, when all the electronic components ED to be tested are emptied from the customer tray CT by the moving hand 130 , the elevator 331 for supply lowers the empty customer tray CT.

On the other hand, when the lowered emptied customer tray CT is placed on the elevator plate 332a for collection by the transfer 340, the elevator 332 for collection raises the customer tray CT to the work plate WP, The customer tray CT is fixed to the work plate WP. And when the electronic components ED for which the test has been completed are loaded into the customer tray CT by the moving hand 130 , the recovery elevator 332 lowers the customer tray CT. Thereafter, the customer tray CT loaded with the electronic component ED whose test has been completed by the transfer 340 , the collector 320 , and the tray mover 220 is loaded into the storage space RS on the first floor.

For reference, it is preferable that the customer trays CT loaded in the storage space RS on the first floor are classified by test grade and loaded in a separate storage space RS.

2. Independent logistics of electronic components

The moving hand 130 takes out the electronic components ED one by one from the customer tray CT at the supply position FP and moves them to the adapter 110 at the setting position SP. At this time, the adapter 110 is in an open state. When the customer tray CT is seated with the adapter 110 , the opening of the adapter 110 is released so that the electronic component ED is fixed to the adapter 110 . Subsequently, the holder 120 holding the adapter 110 is moved from the setting position SP to the holding position GP by the mover 160 , and the rotator 150 rotates the holder 120 to ultimately electronic Component (ED) will be erected. Here, the rotation of the holder 120 may be made at the setting position SP before the movement of the holder 120 or at the holding position GP after the movement of the holder 120 . Thereafter, the test hand 170 grips and moves the adapter 110 at the gripping position GP, and then inserts the portion on the side of the contact terminal T of the electronic component ED into the test slit S. And when the test for the electronic component (ED) is finished, the test hand 170 draws the electronic component (ED) from the test slit (S) and then holds the adapter 110 at the gripping position GP (120) When the adapter 110 is moved to the setting position SP along with the mounting 120, the moving hand 130 moves the electronic component ED for which the test has been completed to the customer tray CT in the recovery position RP. ) is moved to At this time, the position where each of the lifting plates for recovery 332a is located is the recovery position RP, and different electronic components ED are classified by test grade in the customer tray CT at each recovery position RP. It may be considered preferable to be loaded.

<References>

1. Identification by batch

According to the present invention, the customer trays CT are supplied to the storage space RS in a bundle (for example, 30 sheets per bundle) in a state covered by the cover tray. It is generally considered that the quantity of the same lot or the electronic components (ED) of the same standard may be in the customer trays (CT) stacked and supplied in the same bundle, but the customer trays (CT) stacked in a different bundle from the bundle CTs) may be electronic components (EDs) of different types (lots or different specifications). That is, the electronic components (ED) of different standards can be divided into bundles and loaded into the handling system (HS) according to the present invention.

Accordingly, barcodes are printed on the cover tray that can confirm the standard of the electronic components (ED) loaded on the customer trays (CT) constituting the bundle or, furthermore, the type of test. And correspondingly, the tray mover 220 may be provided with a barcode reader capable of identifying the barcode of the cover tray. So, when the tray mover 220 moves a set of customer trays (CT), the barcode reader recognizes the barcode of the cover tray and can check the standard or test type of the electronic component (ED), which is a control device (shown in the figure). not), it can be used as control information such as the degree of opening of the adapter 110 or a test in the future.

2. Individual identification

In the process of moving the customer tray CT placed on the moving plate 311 of the feeder 310 from the stacker 200 side to the handler 100 side, a barcode reader is placed at the boundary between the stacker 200 and the handler 100. may be provided.

The barcode reader reads a barcode printed on each electronic component (ED) to individually identify the electronic component (ED), so that individual history management of the electronic component (ED) may be possible.

3. Position adjustment of electronic components

In the process of the test hand 170 inserting the electronic component ED into the test slit S, precise positioning between the electronic component ED and the test slit S is required. For this purpose, as shown in FIG. 10 , the adapter 110 has a matching hole AH, and the tester TESTER may preferably include a matching pin AP inserted into the matching hole AH. In this case, since the matching pin AP is inserted into the matching hole AH, the positions of the electronic component ED and the test slit S may be precisely adjusted. If the matching hole (AH) and the matching pin (AP) are provided, the adapter 110 must flow to a certain extent. In the matching process, the test hand 170 grips the adapter 110 with a weak gripping force. ) to flow, and when the matching process is finished and the electronic component (ED) is inserted into the test slit (S), the test hand 170 grips the adapter 110 with a strong gripping force, so that the friction resistance of the tester is also increased. It is necessary to prevent the adapter 110 from flowing.

4. Supplementary notes on adapters

A structure in which the test hand 170 directly grips the electronic component ED and electrically connects to the tester may be considered, but the electronic component ED is thin and may not withstand the gripping force of the test hand 170 . For this reason, damage to the electronic component ED by the test hand 170 is prevented by the adapter 110 , and the test can be stably supported.

Meanwhile, there may be electronic components ED having a width exceeding the maximum seating width of the existing adapter 110 or narrower than the minimum seating width. In this case, by replacing only the adapter 110, it can be easily compatible to support testing of the corresponding electronic components ED.

5. Capacity Expansion

Referring to FIG. 19 , it can be seen that two handlers 100A and 100B are provided side by side. And there is a repeater 400 between the first handler 100A and the second handler 100B, and the customer tray CT coming from the stacker 200 through the first handler 100A is transferred to the second handler 100B. and the customer tray CT coming from the second handler 100B may be moved to the first handler 100A. Here, the repeater 400 may have a structure similar to that of the supply unit 310 and the recovery unit 320 .

As described above, according to the example of FIG. 19 , since one stacker 200 can handle multiple handlers 100 , in particular, when the test time for the electronic component (ED) is long, the minimum configuration and additional capacity This has an expansive effect. Of course, the utility of dividing the customer tray CT on which the different types of electronic components (ED) from the stacker 200 are loaded into the first handler 100A and the second handler 100B and conducting the test should also be considered. will be able

Alternatively, in the extended example of FIG. 19 , the first handler 110A supports the first test, and among the electronic components ED for which the first test is completed, the electronic components ED determined to be good are transferred to the second handler 100B. ) and operating it in a form that supports the second test may be sufficiently considered.

6. Variants

In the embodiment described above, the adapter 110 can be moved to the lateral position of the recovery position RP by the mover 160, but according to the modification of FIG. 20 , the adapter 110 is moved to the recovery position RP. It can only be moved backwards. Instead, the operating area of the moving hand 130 may be widened. Instead, the overall left and right width of the electronic component handling system (HS) can be reduced. In addition, a buffer area BS exists between the supply position FP and the recovery position RP, and the buffer area BS is provided with seating grooves in which electronic components of various standards can be seated, so that the test fails or It may be implemented so that the electronic component ED that needs to be retested is seated.

As described above, the detailed description of the present invention has been made by the embodiments with reference to the accompanying drawings, but since the above-described embodiments have only been described with preferred examples of the present invention, the present invention is limited to the above embodiments only. It should not be construed as being limited, and the scope of the present invention should be understood as the following claims and their equivalents.

HS : Handling system for testing electronic parts
100 : handler
110: adapter
111a, 111b: holding member
GG : Information Home
113: first elastic member
130: moving hand
140: opener
150: rotating machine
160: move
170: test hand
171: gripping element
172a, 172b: horizontal moving element
173: vertical moving element
174: open element
175: connection element
200 : Stacker
300: transfer device

Claims (8)

a handler that supplies electronic components to be tested to a tester or retrieves electronic components that have been tested from the tester;
a stacker provided to supply a customer tray loaded with electronic components to be tested to the handler or to retrieve a customer tray loaded with electronic components on which the test has been completed from the handler; and
a transfer device for transferring a customer tray between the handler and the stacker; including,
The handler is
An adapter capable of loading one electronic component and having an adjustable seating width of the electronic component so that electronic components of various standards can be seated;
Move the electronic component to be tested from the customer tray that came from the stacker to the supply position to the adapter in the setting position, or transfer the electronic component that has been tested from the adapter in the setting position to the customer tray in the recovery position. at least one moving hand for moving;
an opening device for opening the adapter so that the mobile hand can load or handle electronic components on the adapter; and
a test hand for holding and moving the adapter and electrically connecting the electronic component loaded on the adapter to a tester while holding the adapter so that the electronic component can be tested; containing
Handling system for testing electronic components. According to claim 1,
a rotator capable of rotating the adapter to stand up electronic components mounted on the adapter from a horizontal state to a vertical state, or to lay down an electronic component mounted on the adapter from a vertical state to a horizontal state; further comprising
Handling system for testing electronic components. According to claim 1,
a mover for moving the adapter from the setting position to a holding position capable of being held by the test hand; further comprising,
The test hand grips the adapter at the gripping position,
The gripping position is closer to the tester than the setting position.
Handling system for testing electronic components. According to claim 1,
The adapter is
a pair of gripping members capable of linearly moving toward or away from each other in order to grip both ends of the electronic component; and
an elastic member for applying an elastic force so that the distance between the pair of gripping members is narrowed when the distance between the pair of gripping members is widened by the external force applied by the opener and then the external force by the opener is removed; containing
Handling system for testing electronic components. 5. The method of claim 4,
A guide groove is formed in the gripping member to guide the movement of the electronic component while being electrically connected to the tester while the electronic component is moved by the test hand.
Handling system for testing electronic components. According to claim 1,
The test hand is
a gripping element for gripping or releasing the gripping adapter;
a horizontal moving element for moving the gripping element in a horizontal direction;
a vertical moving element for moving the gripping element in a vertical direction;
an opening element for opening the adapter so that the electronic component can move while being supported by the adapter; and
a connection element for electrically connecting the electronic component to the tester by pushing the electronic component made movable by the operation of the opening element toward the tester; containing
Handling system for testing electronic components. a pair of gripping members capable of linearly moving toward or away from each other in order to grip both ends of the electronic component; and
an elastic member for applying an elastic force such that the gap between the pair of gripping members is widened by an external force and then the gap between the pair of gripping members is narrowed when the external force is removed; containing
Adapter for mounting electronic components. 8. The method of claim 7,
A guide groove is formed in the holding member to guide the movement of the electronic component while the electronic component is electrically connected to the tester while moving.
Handling system for testing electronic components.

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