KR20230001222A - Cradle of handler for testing electronic component - Google Patents

Abstract

The present invention relates to the cradle of a handler for testing an electronic component. The cradle of a handler for testing an electronic component according to the present invention has a support protrusion or a support part for supporting the electronic component in a process of holding the electronic component by an adapter or in a process of releasing the electronic component. According to the present invention, the reliability of a product is improved because the electronic component can be appropriately positioned during the process of holding the electronic component by the adapter or releasing the electronic component.

Description

Handler for testing electronic components {CRADLE OF HANDLER FOR TESTING ELECTRONIC COMPONENT}

The present invention relates to a device that can be used in a handler for testing electronic components.

Produced electronic parts (for example, semiconductor devices, boards, SSDs, etc.) are tested by testers and then divided into good products and defective products, and only good products are shipped.

An electronic component can be tested only when it is electrically connected to the tester. At this time, the equipment that supports the electronic component to be tested by electrically connecting the electronic component to the tester is a handler for testing the electronic component (hereinafter referred to as 'handler'). to be.

Handlers are being proposed and manufactured by Donghae according to the development of new electronic components, and various future developments for stabilization are being made.

BACKGROUND OF THE INVENTION [0002] In recent years, the spread of SSDs (Solid State Drives), which are large electronic components equipped with various electronic devices, is increasing.

In the early stage, when demand for SSD was low and only a small amount was produced, the SSD was electrically connected to the tester manually and then disconnected. However, as the demand soared, manual testing became difficult.

However, since the thickness, structure, and weight of SSD are different from those of conventional electronic components, it was not possible to apply the conventional handler as it is, so a handler suitable for test support of large electronic components such as SSD was developed and published in Korean Patent Publication No. 10-2019 -0050483 and 10-2019-0061291 have been proposed.

On the other hand, in the case of an SD, various specifications may be provided depending on the type of mounted electronic device or its exclusive use, and a handler is required to support tests on electronic parts of such various specifications. However, since handlers are expensive and large in scale, it is expected that there will be a demand for a technology capable of testing electronic parts having various specifications in one handler in consideration of production costs and installation locations.

In addition, in order to test electronic components having different standards, replacement of components that meet the standard of the corresponding electronic component is required, and even if replacement of components is not necessary, down time for supply of new electronic components is required. As a result, the operation rate of handlers and testers decreases and miscellaneous manpower loss occurs, so it is expected that there will be a demand for a handler that does not require a separate downtime even during one cycle operation or continuous operation of the handler.

In addition, in the case of conventional small-type mass-produced semiconductor devices, a test tray capable of loading hundreds or more semiconductor devices is provided, and a method of holding the semiconductor devices directly with a plurality of pickers and inserting them into the insert of the test tray is taken. In this system, the precise position of the semiconductor device is also held in the insert and in the process of connecting to the tester, so even if the precision is somewhat low, it is not a problem. However, electronic parts including semiconductor devices tend to be produced in small quantities of various types in response to the diversity of applied devices, and there are cases in which various types of tests have to be performed. Since the test sockets of all testers are not in the same location However, it was necessary to manufacture expensive test trays for each type of electronic component or type of tester and to have a suitable handler. Ignoring this, it has been confirmed through previous research that there is a significant problem in connecting the electronic component to the test socket while holding the electronic component directly with the gripper. For example, electronic parts have as many different lengths and widths as there are different types, and it is difficult to manufacture 100% consistent sizes due to processing errors even for the same type of electronic parts due to manufacturing characteristics. However, if you try to grip an electronic component with a gripper without considering this situation, the electronic component may be lost due to failure to properly grip the electronic component, or the electronic component may be damaged due to too strong pressing force. Of course, even if the gripper is adjusted to grip the electronic component well, depending on which part of the electronic component is gripped and how strong the grip is, situations such as twisting or rotating the electronic component along with the gripping occur, resulting in the gripper not gripping with the gripper. It was confirmed that it is difficult for one electronic component to precisely contact the test socket. In order to improve this, the driving part must be able to be precisely controlled, and since it must correspond to all electronic parts, the driving shaft must be very long. In addition, there is a need to use an expensive motor that can even control torque for each situation in order to prevent damage, twisting, and unwanted rotation. However, this is not effective because it requires a high production cost along with enlargement of equipment. In addition, auto-teaching to set the precise gripping position of the electronic component by the gripper should be implemented to make precise contact, which is a part that requires enormous costs and technical skills.

Therefore, the applicant of the present invention has previously proposed an invention (hereinafter referred to as 'prior application technology', currently unpublished) in which the handler is equipped with an adapter so that a handler with versatility can be implemented in Patent Application No. 10-2020-0073725. . The adapter is designed to function as a carrier used to supply electronic components to the tester, and is expected to contribute to greatly increasing the usability of the handler by enabling the handler to adapt to many types of electronic components of different sizes.

However, when an electronic component is seated with an adapter that is seated in a holder or an electronic component is taken out from an adapter, there is a risk that the electronic component is not properly in place and is separated immediately before the adapter grips the electronic component or immediately after releasing the grip. there is

The present invention has been conceived to provide a technology capable of properly maintaining a magnetic position of an electronic component even during a process in which an electronic component is seated and fixed to an adapter or the fixation of the electronic component is released.

The support frame of the electronic component test handler according to the first aspect of the present invention supports the seated adapter; A pair of fixing levers that are installed on the support frame and face each other, and can fix or release the adapter by moving in a straight line in a direction in which the distance between them is narrowed or widened; and a driving component providing a driving force for widening or narrowing a gap between the pair of fixing levers. Including, the supporting frame has a support protrusion for preventing the separation of the electronic component in the process of fixing the electronic component to the adapter or releasing the fixation of the electronic component.

The supporting frame includes a mounting plate on which the pair of fixing levers and the driving parts are installed; And a support plate provided to be able to move up and down relatively with respect to the installation plate; and an elastic member for elastically supporting the support plate with respect to the installation plate. It further includes, and the support protrusion is provided on the support plate.

A plurality of the supporting protrusions are provided in the front-back direction, so that electronic components having various lengths can be supported in the front-back direction.

The support frame of the electronic component test handler according to the second aspect of the present invention supports the seated adapter; A pair of fixing levers that are installed on the support frame and face each other, and can fix or release the adapter by moving in a straight line in a direction in which the distance between them is narrowed or widened; a driving component providing a driving force for widening or narrowing a gap between the pair of fixing levers; and a support part installed on the support frame to prevent the electronic part from being separated while the electronic part is seated and fixed to the adapter or the fixation of the electronic part is released. includes

The support part is provided to be able to move up and down, support protrusions that support the electronic part when it rises and release the support of the electronic part when it goes down; and a lifting source for lifting the support protrusion. includes

A plurality of the supporting parts are provided in the front-back direction, so that electronic components having various lengths can be supported in the front-back direction.

The support part is provided to be able to move up and down, support protrusions that support the electronic part when it rises and release the support of the electronic part when it goes down; and a lifting source for lifting the support protrusion. and a moving source that ultimately enables the support protrusion to support electronic components having various lengths in the forward and backward directions by moving the lift member in the forward and backward directions; more includes

The support protrusion is located at a point capable of supporting the mechanical round pad portion at the front end of the electronic component.

The support frame has a protrusion having a protrusion capable of supporting a specific part of the electronic component, and the protrusion is fixed.

According to the present invention, the reliability of the product is improved because the electronic component can be positioned at an appropriate height without departing from its original position even in the process of holding the electronic component by the adapter or releasing the grip of the electronic component.

1 is a reference diagram for explaining an electrical connection structure between an electronic component and a tester.
2 is a conceptual structural diagram of a handler for testing an electronic component according to an embodiment of the present invention.
FIG. 3 is a schematic perspective view of the handler of FIG. 2 .
FIG. 4 is a conceptual plan view of a connection part in the handler of FIG. 2 .
5 is an excerpted perspective view of a main part in the connection part of FIG. 4;
6 is an excerpted perspective view of an adapter applicable to the handler of FIG. 2;
7 is an exploded view of the adapter of FIG. 6;
FIG. 8 is a reference view for explaining a guide groove of a gripping member configured in the adapter of FIG. 6 .
9 and 10 are excerpts of the passage according to the first embodiment of the present invention in the connection portion of FIG.
11 is an excerpt of a support frame applied to the base of FIG. 9 .
12 is a reference diagram for explaining a state in which the holder of FIG. 11 supports an electronic component.
FIG. 13 is a conceptual side view of a passer according to the second embodiment of the present invention in the connecting portion of FIG. 4 .
14 is a reference diagram for explaining a state in which the holder of FIG. 13 supports an electronic component.
FIG. 15 is a conceptual side view of a passer according to an application example using the passer shown in FIG. 13 .
16 is a reference diagram for explaining a state in which the holder of FIG. 15 supports an electronic component.

Preferred embodiments according to the present invention will be described with reference to the accompanying drawings, but for brevity of description, descriptions of overlapping or substantially identical configurations will be omitted or compressed as much as possible.

<Description of electrical connection between electronic components and tester>

The handler to which the mounting device according to the present invention is applied is more appropriately used in the case of a method in which the contact terminal side of an electronic component is inserted into a test slit of a tester, such as an SSD (Solid State Drive).

For example, as shown in FIG. 1, the tester TESTER is provided with a test slit TS, and the terminal part T of the electronic component ED is inserted into the corresponding test slit TS, thereby forming the electronic component ED. and the tester (TESTER) are electrically connected.

<A brief description of the overall structure of the handler>

FIG. 2 is a schematic plan view of a handler HR to which a passing device according to the present invention can be applied, and FIG. 3 is a schematic three-dimensional view of the handler HR of FIG. 2 .

The handler HR includes a stacker part SP, a connection part CP, and a transfer part TP.

The stacker part SP accommodates the customer trays CT on which the electronic parts ED are seated. This stacker part (SP) is used to receive customer trays (CTs) on which electronic parts (EDs) to be tested are seated from outside, or to send out customer trays (CTs) on which electronic parts (EDs) that have been tested are seated outside. used In addition, the stacker part SP is also used for storing customer trays CTs that have been brought in from the outside or are to be taken out of the outside.

The connection part (CP) draws out the electronic part (ED) from the customer tray (CT) from the stacker part (SP) and electrically connects it to the tester (TESTER) at the rear, or the test is completed by the tester (TESTER) The electronic components (ED) are placed in the customer tray (CT) while being classified by test grade. And the connection portion (CP) is provided with a guide according to the present invention.

The transfer part (TP) transfers the customer tray (CT) between the stacker part (SP) and the connection part (CP). That is, the customer trays (CT) on which the electronic components (ED) to be tested are seated are supplied from the stacker portion (SP) to the connection portion (CP) by the transfer portion (TP), and the tested electronic component (ED) ) are seated, the customer trays CT are retrieved from the connection part CP to the stacker part SP by the transfer part TP.

<Description of the connection part>

FIG. 4 is a conceptual plan view of the connection part CP, and FIG. 5 is a separately extracted main component part I from the connection part CP of FIG. 4 .

As shown in FIGS. 4 and 5, the connection part CP includes an adapter 100, a holding device 200 according to the present invention, a moving hand 300, an opening device 400, a rotating device 500, and a moving device 600. and a test hand 700. Here, the holding unit 200, the opening unit 400, the rotating unit 500, and the moving unit 600 form one body in a mutually coupled structure as shown in FIG.

The adapter 100 is provided as a carrier used to move various types of electronic components (ED). One electronic component (ED) may be seated and fixed to the adapter 100 or, conversely, may be detached. The adapter 100 will be described in more detail later.

The holder 200 is provided to fix and mount the adapter 100. Regarding this process 200, it will be described in more detail later by dividing it into embodiments.

The mobile hand 300 is an electronic component to be tested with the adapter 100 at the setting position S from the customer tray CT, which has come from the stacker part SP to the supply position F by the transfer part TP. (ED) is moved, or the test-completed electronic component (ED) is moved from the adapter 100 at the setting position (S) to the customer tray (CT) at the recovery position (R). The moving hand 300 grips the electronic parts ED by vacuum adsorption, and has several pickers to selectively adsorb and hold the electronic parts ED at various points on the customer tray CT. do. Since technology related to such a mobile hand 300 is described in detail in Korean Application No. 10-2020-0019380, which is a prior application of the present applicant, a detailed description thereof is omitted herein.

The opener 400 opens the adapter 100 at the setting position S so that the moving hand 300 can load or unload the electronic component ED on the adapter 100 . This opener 400 includes a pusher 410 and an opening circle 420 .

The pusher 410 is provided to be movable in the forward and backward directions, and when moving backward, presses a specific part of the adapter 100 (a push plate to be described later) to open the adapter 100, and when moving forward, the adapter ( The adapter 100 can be closed by releasing the pressure on the specific part of the 100.

The open circle 420 may be provided as a cylinder, and supplies a driving force for moving the pusher 410 in the forward and backward directions.

The rotator 500 ultimately rotates the adapter 100 by rotating the holder 200 to raise the electronic component ED loaded on the adapter 100 from a horizontal state to a vertical state. As the electronic component ED is vertically erected by the rotating machine 500, the terminal portion T of the electronic component ED can be properly inserted into the test slit TS. Of course, the rotator 500 reversely rotates the adapter 100 loaded with the electronic component ED, after which the test has been completed, so that the electronic component ED in a vertical state is converted to a horizontal state. If the electronic component (ED) is electrically connected to the tester (TESTER) in a horizontal state (for example, when the test slit is formed long in the horizontal direction), the rotator 500 does not perform its role, or the rotator 500 ) may be omitted.

The mover 600 moves the holder 200 from the setting position (S) to the gripping position (G) where the test hand 700 can grip, thereby ultimately moving the adapter 100 seated on the holder 200. It is moved from the setting position (S) to the gripping position (G) where the test hand 700 can grip. Here, the setting position (S) is within the work area where the moving hand 300 works, the gripping position (G) is within the work area where the test hand 700 works, and the work area where the moving hand 300 works and The working areas where the test hand 700 works are separated from each other without overlapping each other.

The reason why the adapter 100 is moved from the setting position (S) to the gripping position (G) by configuring the mover 600 is to ensure that the working areas of the moving hand 300 and the test hand 700 do not overlap each other, so that it is smooth and This is to enable rapid work. Furthermore, this is to allow the test hand 700 to quickly move the adapter 100. Therefore, the gripping position (G) is preferably located closer to the tester (TESTER) side than the setting position (S). Of course, the mover 600 also moves the holder 200 from the gripping position G to the setting position SP.

The test hand 700 grips the adapter 100 from the holder 200 at the gripping position G and moves the adapter 100 to insert the terminal part T of the electronic component ED into the test slit TS. When the test for the component (ED) is finished, the electronic component (ED) is withdrawn from the test slit (TS), and then the adapter (100) loaded with the electronic component (ED) for which the test has been completed is placed back in the gripping position (G). Move to the cradle (200).

<Detailed description of the adapter>

The adapter 100 is provided as a carrier used to move electronic components (ED) having various lengths, and one electronic component (ED) can be seated and fixed or separated. To this end, as shown in the excerpted perspective view of FIG. 6 and the exploded view of FIG. 7, the adapter 100 includes a pair of gripping members 111 and 112, an adjusting member 120, first elastic springs 131 to 134, a first It includes 2 elastic springs 141 and 142 and the frame 150.

A pair of gripping members 111 and 112 are provided to grip both left and right ends of the electronic component ED, and are guided by the guide bar GB in the frame 150 in a direction approaching or moving away from each other, and the left and right straight lines equipped to move The pair of holding members 111 and 112 have two control grooves (CG) formed on the surfaces facing each other, and a guide groove (GG) long in the front and rear direction is formed on the upper part of the control groove (CG). has been

The control groove (CG) is formed to widen or narrow the gap between the holding members 111 and 112, and is formed so that the depth becomes shallower from the front to the rear.

The guide groove (GG) has a function of guiding forward and backward movement of the electronic component (ED) and a gripping groove in which both left and right ends of the electronic component (ED) are inserted so that the electronic component (ED) is stably gripped by the adapter 110. serve as a function At this time, as shown in the exaggerated FIG. 8, the guide groove (GG) has a shape that gradually widens toward the inner side (right side based on the gripping member of reference numeral 111) on the cross section, so that both ends of the electronic component are at the center (C) of the guide groove (GG). ) to be guided.

The adjusting member 120 can move forward and backward, and serves to widen the gap between the pair of gripping members 111 and 112 when moving backward. To perform its role, the adjusting member 120 includes four rollers r, an installation structure 121, a push plate 122, and a transmission bar 123.

Two rollers (r) are provided on both left and right sides, respectively, and are in contact with the surface forming the control groove (CG).

The installation structure 121 is provided to install the four rollers (r). That is, the four rollers (r) are installed on the installation structure 121 so that they can be rotated around the Z axis (vertical axis) as a rotation axis.

The push plate 122 receives a backward pushing force applied by the opener 400 .

The transmission rod 123 has its front end fixedly coupled to the push plate 122 and its rear end fixedly coupled to the installation structure 121, so that the pushing force of the opener 400 input to the push plate 122 is transferred to the installation structure 121. convey

The first elastic springs 131 to 134 have one side in contact with the frame 150 and the other side in contact with the holding members 111 and 112 so that the pair of holding members 111 and 112 move in a direction closer to each other. It is provided as an elastic member that applies elastic force. That is, the control member 120 equipped with the roller r serves to widen the gap between the holding members 111 and 112, and the first elastic springs 131 to 134 are both holding members 111 and 112 It serves to narrow the gap between the

The second elastic springs 141 and 142 are provided as elastic members for applying elastic force to push the adjusting member 120 forward. That is, when the force of the pusher 410 of the opener 400 pushing the adjusting member 120 backward is removed, the second elastic springs 141 and 142 push the adjusting member 120 forward by the elastic force to control the adjustment. The member 120 is advanced.

The frame 150 is provided to install and support the gripping members 111 and 112, the adjusting member 120, the first elastic springs 131 to 134, and the second elastic springs 141 and 142.

On the other hand, on the bottom of the adapter 100, passage areas TFs are formed to support the electronic component ED in a protruding upward state through which a support protrusion of the holder 200, which will be described later, passes through.

Next, the operation of the adapter 100 will be described.

When the opener 400 applies a pushing force to the pushing plate 122 backward, the adjusting member 120 moves backward. At this time, since the roller r is in contact with the surface forming the control groove CG, the depth of which decreases toward the rear, the backward force of the roller r pushes both holding members 111 and 112 in the left and right directions. By switching, the gap between the holding members 111 and 112 widens. In this way, the electronic component ED may be seated by the moving hand 130 in a state where the distance between the holding members 111 and 112 is maximally widened, or the electronic component ED may be pulled out. When the force applied by the opener 400 is removed, the adjusting member 120 is moved forward by the elastic force of the second elastic springs 141 and 142, and the elastic force of the first elastic springs 131 to 134 The adapter 100 is closed by narrowing the distance between the holding members 111 and 112 by the.

Subsequently, the application 200 according to the present invention will be separately described for each embodiment.

<First embodiment of passing through>

As referenced in the drawings of FIGS. 9 and 10 , the support 200 includes a support frame 210 , a pair of fixing levers 221 and 222 and a driving part 230 .

The support frame 210 supports the seated adapter 100. The support frame 210 includes a mounting plate 211, a support plate 212 and four springs 213a to 213d, as shown in the excerpt of FIG.

A pair of fixing levers 221 and 222 and a driving part 230 as well as a support plate 212 and four springs 213a to 213d are installed on the installation plate 211 .

The support plate 212 is provided to be able to move up and down relative to the installation plate 211 and has support protrusions SS protruding upward. The support protrusions SS pass through the bottom portion of the adapter 100 through the passage area TF of the adapter 100 and support the electronic component ED.

For example, while the electronic component ED is seated and fixed to the adapter 100 or the electronic component ED is released, the gripping members 111 and 112 do not grip both ends of the electronic component ED. As a result, the support for the electronic component ED is released so that the electronic component ED can be separated from its original position. In this case, the support protrusion SS supports the electronic component ED so that the electronic component ED can be properly positioned. Here, the position is a position where the gripping members 111 and 112 can properly hold the electronic component ED or a position where the moving hand 300 can properly absorb and hold the electronic component ED.

It is preferable that the above support protrusions (SS) are provided with several in parallel in the front and rear directions. Because, since the adapter 100 needs to seat electronic components (ED) having various lengths in the front and rear directions, the number of support protrusions (SS) capable of supporting the electronic components (ED) having various lengths in the front and rear directions is also required. because it needs to be equipped with

In addition, the support protrusion SS may be composed of an upper contact portion ① and a lower coupling portion ②.

The contact part ① on the upper side comes into contact with the electronic component ED from the upper side, and the upper end of the coupling part ② is coupled to the contact part ① at the lower side of the contact part ①.

In addition, the contact part ① is preferably made of a material having a lower hardness than the coupling part ① in order to prevent damage to the supporting electronic component ED. For example, the coupling part ② is preferably made of a metal material to maintain rigidity, and the contact part ① may be made of a silicone material, rubber material, or synthetic resin material that has a lower hardness than a metal material.

The four springs 213a to 213d are provided as elastic members for elastically supporting the support plate 212 with respect to the installation plate 211 .

In addition, the support frame 210 has a jaw protrusion 214 having a jaw J capable of supporting the electronic component ED at its rear end. The jaw protrusion 214 is positioned so as to support the terminal portion T at the rear end of the electronic component ED. Of course, the jaw protrusion 214 does not necessarily have to be implemented only to support the terminal portion T, and can be formed appropriately at any location where there is a specific portion of relatively high hardness that does not damage the electronic component ED. can In general, an electronic component (ED) such as an SD is an assembly of electronic elements such as a semiconductor chip, and in the case of electronic elements, damage can be easily caused even by a small impact or scratch. Therefore, in the present embodiment, the terminal part T, which is the most stable part against impact, is implemented to be supported by the jaw protrusion 214, and it is implemented to prevent the electronic component ED from unintentionally leaving backward. Unlike the support protrusion SS, these jaw protrusions 214 are formed to be fixed so that they do not rise or move horizontally. However, it may be considered preferable that the jaw protrusion 214 is provided in the adapter 100 .

Similarly, a support protrusion 215 capable of supporting the front end of the longest electronic component ED in the front-rear direction is provided at the front end of the support frame 210 . These support protrusions 215 are also formed to be fixed so that they do not rise or move horizontally. In this embodiment, the support protrusion 215 is provided at a position capable of supporting the mechanical round pad portion (M, see FIG. 17) having a semicircular groove shape at the front end of the electronic component (ED), but it must be It doesn't have to be limited.

That is, since the upper protrusion 214 and the supporting protrusion 215 are fixed, the contact impact with the electronic component ED may be large, so in this embodiment, the protrusion 2214 and the supporting protrusion 215 are It is intended to be disposed in the terminal portion (T) and the mechanical round pad portion (M), which are portions where electronic elements are not disposed, respectively. However, depending on the implementation, if there is no fear of damage to the electronic component (ED), it can be considered that the jaw protrusion 214 and the supporting protrusion 215 or similar supporting means are provided to correspond to the corresponding area. can

The pair of fixing levers 221 and 222 may fix or release the fixation of the adapter 100 by widening or narrowing the gap in the left-right direction. That is, when the fixing levers 221 and 222 linearly move in the left and right directions while being guided by the guide rail GR, and the gap between the fixing levers 221 and 222 widens, the adapter 100 is mounted on the holder 200 or When it is in a state in which it can be separated from the holder 200 and the distance between the fixing levers 221 and 222 is narrowed, the adapter 100 is bound to the holder 200.

The driving part 230 supplies a driving force for adjusting the distance between the pair of fixing levers 221 and 222, and in this embodiment is provided with a pair of driving links 231a and 231b and a driving source 232. .

The driving links 231a and 231b transmit the driving force applied by the driving source 232 to the pair of fixing levers 221 and 222 . In this embodiment, while the driving links 231a and 232b rotate, the forward and backward forces of the driving source 232 are converted into left and right moving forces of the fixing levers 221 and 222 and transmitted. It will be possible.

Next, the main operation of the stager 200 having the above structure will be schematically described.

When the moving hand 300 moves the electronic component ED to the adapter 100, the electronic component ED is supported by the jaw protrusion 214 and the supporting protrusion SS. 12 (a), (b), (c) and (d), which are schematic diagrams, show the jaw protrusion 214 and the support protrusion ( The state supported by SS) is shown. Here, (d) of FIG. 12 shows that both front and rear ends of the longest electronic component ED are supported by the jaw protrusion 214 and the supporting protrusion 215. For reference, the illustration of the adapter 100 is omitted in FIG. 12 .

On the other hand, since the support protrusion SS is slightly raised by the springs 213a to 213d, it is slightly higher than the center C of the guide groove GG. However, when the gap between the gripping members 111 and 112 is narrowed, both ends of the electronic component ED are guided by the guide groove GG and the electronic component ED descends, so that both ends of the electronic component ED fall down. It can be properly gripped by (111, 112). At this time, the springs 213a to 213d do not fundamentally prevent the electronic component ED from descending and are elastically compressed.

Conversely, when the gripping members 111 and 112 release their gripping, the electronic component ED rises slightly due to the elastic force of the springs 213a to 213d. As both ends are guided, the electronic component ED rises. Accordingly, the electronic component ED rises while the elastic force of the springs 213a to 213d is continuously suppressed, and when the elevation is completed, the elastic force of the springs 213a to 213d no longer acts. Therefore, even when the gripping members 111 and 112 are stretched open, the electronic component ED does not bounce off due to the elastic force of the springs 213a to 213d. When the lifting of the electronic component ED is completed, the moving hand 300 grips the electronic component ED and moves it to the customer tray CT at the recovery position R.

For reference, in this embodiment, the support protrusion SS is elastically supported to prevent damage to the electronic component ED. However, depending on the implementation, if there is a circumstance that the mounting process of the electronic component ED can be performed very precisely, it may be sufficiently considered that the support protrusion SS is provided to be fixed without being lifted.

In addition, in this embodiment, the support protrusions (SS) are supported by the support plate 212, but elastically supported by the springs (213a to 213d), depending on the implementation, each of the support protrusions (SS) by an elastic member It can also be sufficiently considered to be implemented to be elastically supported.

<Second embodiment of passing through>

In the holding device 200 according to the second embodiment, the support protrusions SS are provided with an ascending and descending path.

As shown in the conceptual side view of FIG. 13, the mounting 200 according to the present embodiment includes a support frame 210, a pair of fixing levers (not shown), a driving part (not shown), and several support parts 240 ).

Since the pair of fixing levers and driving parts are the same as in the first embodiment, their descriptions are omitted.

The support frame 210 has only a function of supporting the adapter 100 . For reference, in FIG. 13 , the adapter 100 is omitted for convenience.

The support part 240 is installed on the supporting frame 210 to support the electronic part ED in the process of fixing the electronic part ED to the adapter 100 or releasing the fixing to the electronic part ED, thereby providing electronic The separation of the component ED is prevented. To this end, each support part 240 includes a support protrusion SS and an elevator 241 .

The support protrusion SS is provided to be able to move up and down, supports the electronic component ED when it ascends, and releases the support of the electronic component ED when it descends. These support protrusions SS have the same structure as the support protrusion SS in the first embodiment.

The lift member 241 lifts the support protrusion SS and is fixed to the support frame 210 .

Several supporting parts 240 are provided to support the electronic parts ED having various lengths. Therefore, as the specific lifting member 241 rises corresponding to the length of the electronic component ED, the terminal portion T at the rear end of the electronic component ED is supported by the jaw protrusion 214, and the electronic component ED ) The mechanical round pad portion (M) at the front end portion is supported by the support protrusion (SS). Of course, in this embodiment, the support frame 210 also has a support protrusion 215 at its front end.

14(a) to (e) show states in which the support 200 according to the present embodiment supports electronic components ED of various lengths. For reference, in FIG. 14 , except for the supporting protrusion SS supporting the electronic component ED, the rest of the supporting protrusions SS, which are omitted for convenience, are in a lowered state.

For reference, in this embodiment, the terminal part (T) and the mechanical round pad part (M) of the electronic part (ED), which is a part without sensitive electronic elements, are supported by the jaw protrusion 214 and the support part 240. However, if the part is not concerned about damage, it may be considered that the support part 240 is provided to correspond to the part.

Here, the reason why the support protrusion SS supports the mechanical round pad D is that it may be difficult to support the mechanical round pad D in a horizontal state when an electronic chip such as a semiconductor device is located on the rear surface of the electronic component ED.

For example, the electronic component ED has various widths and lengths, and in addition, many electronic chips having different heights may be installed on the flat surface and the rear surface. Accordingly, when the support protrusion SS supports the portion where the electronic chip is located, the convoluted electronic component ED is tilted to one side. In this case, a situation may occur in which the adapter 100 does not properly grip the electronic component ED, or a situation in which the picker of the mobile hand 300 may not properly grip the electronic component ED may occur. For this reason, it is desirable to support the terminal portion (T) and the mechanical round pad portion (M), which are portions where the electronic chip is not installed. In this embodiment, the terminal portion T is supported across the chin of the jaw protrusion 214, and the mechanical round pad portion M is implemented to be supported by the support protrusion SS.

<Application Example to the Second Embodiment>

In the base device 200 according to this application example, only one support protrusion SS is provided, as shown in the conceptual side view of FIG. 15, and a moving source 250 for moving the lifting source 241 is provided.

The moving source 250 is preferably implemented in a structure to which a motor is applied. Also, the lift member 241 may be disposed at various points while moving in the forward and backward direction by the moving member 250 . Therefore, it is possible to support the electronic components ED having various lengths in the front-rear direction with only one support protrusion SS.

16 (a) and (b) illustrate a situation in which electronic components ED having different lengths are supported by the support 200 according to this application example.

For reference, FIG. 17 shows a type of SSD, which is an electronic component (ED). There is a terminal portion (T) at the rear end of the SSD, and a mechanical round pad portion (M) dented in a semicircular shape at the rear end of the SSD.

According to the above embodiments, the terminal portion T of the electronic component ED is supported by the jaw protrusion 214 . However, since the electronic component (ED) may have various lengths, the support protrusion (SS) is located at a point capable of supporting the mechanical round pad portion (M) in response to various types of electronic components (ED) it is desirable However, in the case of the electronic component ED with the longest length scheduled in the above embodiments, the mechanical round pad portion M is supported by the supporting protrusion 215 .

On the other hand, in the case of the above second embodiment and its applications, it is necessary to check whether the support protrusion SS is in an appropriately raised state. Therefore, it may be considered that the mobile hand 300 is provided with a camera that moves along with the picker. The camera first takes pictures before the moving hand 300 places the electronic component ED on the adapter 100. In addition, the control means checks whether the support projection SS is properly raised at the required position through the image taken by the camera, and only when the support projection SS is in an appropriately raised state, the moving hand ( In operation 300 , an operation of seating the electronic component ED on the adapter 100 is controlled to be performed. Of course, if the support protrusion SS is not properly raised, the control means generates a jam and informs the administrator of this. Likewise, the camera may be provided to be fixed above the setting position (S).

As described above, the detailed description of the present invention has been made by the embodiments with reference to the accompanying drawings, but since the above-described embodiments have only been described with reference to preferred examples of the present invention, the present invention is limited to the above embodiments. It should not be understood as being limited, and the scope of the present invention should be understood as the following claims and their equivalents.

200: Handling of handlers for testing electronic components
210: support frame
211: installation plate
212: support plate
213a to 213d: spring
214: jaw protrusion
J: Chin
221, 222: fixed lever
230: driving parts
240: support parts
241: lift
250: Dongwon
SS: support protrusion

Claims (9)

Support frame for supporting the seated adapter;
A pair of fixing levers that are installed on the support frame and face each other, and can fix or release the adapter by moving in a straight line in a direction in which the distance between them is narrowed or widened; and
a driving component providing a driving force for widening or narrowing a gap between the pair of fixing levers; including,
The support frame has a support protrusion that prevents the electronic component from being separated in the process of securing the electronic component to the adapter or releasing the fixation to the electronic component.
Handling of handlers for testing electronic components. According to claim 1,
The supporting frame is
an installation plate on which the pair of fixing levers and the driving parts are installed; and
a support plate provided to be able to move up and down relative to the installation plate; and
an elastic member for elastically supporting the support plate with respect to the installation plate; Including more,
The support protrusion is provided on the support plate
Handling of handlers for testing electronic components. According to claim 1,
The support protrusions are provided with a plurality in the front and rear directions to support electronic components having various lengths in the front and rear directions.
Handling of handlers for testing electronic components. Support frame for supporting the seated adapter;
A pair of fixing levers that are installed on the support frame and face each other, and can fix or release the adapter by moving in a straight line in a direction in which the distance between them is narrowed or widened;
a driving component providing a driving force for widening or narrowing a gap between the pair of fixing levers; and
a support part installed on the supporting frame to prevent the electronic part from being separated while the electronic part is seated and fixed to the adapter or the fixation of the electronic part is released; containing
Handling of handlers for testing electronic components. According to claim 4,
The support part is
A support protrusion that is provided to be able to move up and down, support the electronic component when rising and release the support of the electronic component when descending; and
an elevator that lifts the support protrusion; containing
Handling of handlers for testing electronic components. According to claim 4,
The support part is provided with a plurality in the front and rear directions, thereby supporting electronic components having various lengths in the front and rear directions.
Handling of handlers for testing electronic components. According to claim 4,
The support part is
A support protrusion that is provided to be able to move up and down, support the electronic component when rising and release the support of the electronic component when descending; and
an elevator that lifts the support protrusion; including,
a moving source that ultimately enables the support protrusion to support electronic components having various lengths in the forward and backward directions by moving the lift member in the forward and backward directions; further comprising
Handling of handlers for testing electronic components
containing The method of any one of claims 1 to 3, 5 or 7,
The support protrusion is located at a point capable of supporting the mechanical round pad portion at the front end of the electronic component
Handling of handlers for testing electronic components. According to any one of claims 1 to 7,
The support frame has a protrusion having a jaw capable of supporting a specific part of the electronic component,
The jaw protrusion is fixed
Handling of handlers for testing electronic components.

Images