CN116020754A - Shelving device for electronic component sorting machine - Google Patents

Shelving device for electronic component sorting machine Download PDF

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Publication number
CN116020754A
CN116020754A CN202211317857.7A CN202211317857A CN116020754A CN 116020754 A CN116020754 A CN 116020754A CN 202211317857 A CN202211317857 A CN 202211317857A CN 116020754 A CN116020754 A CN 116020754A
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CN
China
Prior art keywords
electronic component
pair
adapter
guides
restoring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202211317857.7A
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Chinese (zh)
Inventor
罗闰成
金索比
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Techwing Co Ltd
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Techwing Co Ltd
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Filing date
Publication date
Application filed by Techwing Co Ltd filed Critical Techwing Co Ltd
Publication of CN116020754A publication Critical patent/CN116020754A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2855Environmental, reliability or burn-in testing
    • G01R31/286External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865Holding devices, e.g. chucks; Handlers or transport devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889Interfaces, e.g. between probe and tester
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature

Abstract

The invention relates to a shelving device for an electronic component sorter. The rest for an electronic component handler according to the present invention has a moving type guide so that all electronic components having a width within a maximum tolerance can be stably seated on the adapter by the movement of the moving type guide, thus ultimately having an advantage of being able to improve the operation rate of the handler.

Description

Shelving device for electronic component sorting machine
Technical Field
The present invention relates to a shelving unit for shelving electronic components in an electronic component sorting machine.
Background
The electronic components are produced by a variety of processes and shipped after testing. At this time, an electronic component sorter (hereinafter simply referred to as "sorter") for sorting electronic components is used in a plurality of working processes. In particular, in order to test and sort the produced electronic components, a sorter must be used.
With the development of new electronic components or required processes, sorters are proposed and manufactured in new structures, and various subsequent developments are underway for stabilization.
Recently, the popularity of solid state disks (SSD: solid State Drive), which are large electronic components that mount a plurality of electronic components, has increased.
In the early stage, because the demand of the solid state disk is small, the solid state disk is handled by manual operation when the production is small. In particular, in the test process, the solid state disk is directly electrically connected to the tester by a manual operation, and the connection is released. However, with the rapid increase in demand, test support by manual operation has reached a difficult state.
However, since the thickness, structure, weight, and the like of the solid state disk are different from those of the conventional electronic components, the conventional separator cannot be directly applied. Accordingly, the applicant of the present invention previously proposed a handler suitable for test support of large-sized electronic parts such as solid state disks in korean laid-open patent nos. 10-2019-0050483 and 10-2019-0061291.
In addition, the conventional sorting machine is designed to process only the electronic components of the same specification, or when the specification of the electronic components to be processed is changed, a plurality of constituent components must be replaced. Accordingly, it is necessary to provide a sorter corresponding to the number of electronic components for handling various specifications, which results in waste of construction cost and space or reduction of operation time due to replacement of components.
In addition, since electronic components such as solid state disks are quite diverse in specifications depending on the finished products applied, they are actually produced by a system of various kinds and a small amount of production. In view of this, the applicant of the present invention has proposed a classifier having versatility (hereinafter referred to as "the prior application invention") in korean patent application No. 10-20-0073725.
The handler according to the invention of the previous application uses an adapter which functions as a carrier for supplying electronic components to a tester. Thus, by merely replacing the adapter, one sorting machine can handle a plurality of types of electronic components different in size.
The adapter has a pair of holding rails for holding or releasing the electronic component mounted thereon, and the interval between the pair of holding rails becomes wider in the process of mounting or dismounting the electronic component on or from the adapter, so that it is necessary to put the adapter in an open state. Further, in the case where the adapter is in the open state, a separate supporting protrusion capable of supporting the electronic component is required in order to maintain the position of the electronic component.
In addition, the electronic component is very delicate, but there is necessarily a tolerance. For example, when an electronic component having a width of 22mm is to be manufactured, the width of the actually manufactured electronic component reflects a tolerance of 0.15mm, thereby having a range from 21.85mm to 22.15mm. Therefore, the width supported by the support means can only be set to 22.15mm.
However, as shown in the reference diagram of fig. 20, the support base sj formed on the support protrusions 213a and 213b is formed so as to be capable of supporting only about 0.25mm of the left and right ends of the electronic component ED due to interference with the structure of the electronic component ED or other structures of the adapter. Therefore, as shown in fig. 21, the electronic component ED having a width of 21.85mm reflecting the negative tolerance cannot be normally supported by the support table sj, and there is a possibility that a poor placement may occur in which one side is lowered downward. Further, if the defective placement occurs, it is necessary to eliminate the defective placement after stopping the operation of the separator, and therefore there is a problem that the operation rate of the separator is lowered or the electronic component ED is damaged accordingly.
Disclosure of Invention
The present invention has been made in view of the above-described circumstances, and it is an object of the present invention to provide a structure capable of supporting electronic components manufactured to have different widths due to tolerance.
The shelving unit for an electronic component sorter according to the present invention includes: a pair of holding bars capable of holding or releasing the adapter detachably holding the electronic component; a driving source for enabling the pair of grip bars to grip or release the grip of the adapter by reducing or expanding the interval between the pair of grip bars; a pair of movable guides that support the electronic component in a state in which the adapter is opened by the opener and guide a placement position of the electronic component in a process in which the electronic component is placed to the adapter; a restoring member that restores the pair of movable guides to an original position when an external force is removed from the pair of movable guides after the pair of movable guides are moved by applying the external force to the pair of movable guides; and a setting frame for setting the pair of grip levers, the driving source, the pair of movable guides, and the restoring member, wherein the movable guides are movably provided to the setting frame and protrude upward by being located in a passing area of the adapter so as to be able to support the electronic components mounted on the adapter, the pair of movable guides including: a guide portion having a narrower width as facing each other downward, so as to guide a placement position of the electronic component; and a support portion located at a lower side of the guide portion to support the electronic component, thereby forming a support table for setting a placement position where the electronic component can be placed on the adapter.
The pair of movable guides are hinge-coupled to the setting frame by their lower end portions to widen or narrow a space between the support tables of the pair of guides by a rotational movement.
The restoring member has a pair of restoring springs for restoring the pair of movable guides, respectively.
The restoring member has a pair of restoring springs for restoring the pair of movable guides together.
Further comprises: a pair of fixed guides fixedly provided to the setting frame, capable of supporting the electronic component in a state where the opening machine opens the adapter, and guiding a placement position of the electronic component in a process of placing the electronic component to the adapter.
Further comprises: and a preventing protrusion fixedly provided to the setting frame for preventing deflection of an electronic component mounted to the adapter in a state where the adapter is opened by the opener.
Further comprises: a sensor for sensing poor placement of the electronic component during placement of the electronic component to the adapter.
According to the present invention, electronic components manufactured to have different widths from each other due to tolerances can be stably mounted on the adapter, and thus, there is an effect that the operation rate of the separator can be improved finally.
Drawings
Fig. 1 is a reference diagram for explaining an electrical connection structure between an electronic component and a tester.
Fig. 2 is a conceptual block diagram of an electronic component handler according to an embodiment of the present invention.
Fig. 3 is a schematic perspective view of the classifier of fig. 2.
Fig. 4 is a reference diagram for explaining a flow of the electronic component performed at the connection portion.
Fig. 5 is a plan view of an adapter applicable to the sorter of fig. 2.
Fig. 6 is a conceptual diagram of a relay device for an electronic component separator applied to the separator of fig. 2.
Fig. 7 is a partial exploded view of the relay device of fig. 6.
Fig. 8 is an extract of an opener applied to the relay apparatus of fig. 6.
Fig. 9, 10 and 11 are extracts of a rest applied to the relay device of fig. 6.
Fig. 12 and 13 are excerpts for explaining a pair of grip levers and a driving source applied to the rest of fig. 9.
Fig. 14 and 15 are excerpts of the movable guide applied to the rest of fig. 9.
Fig. 16 shows an example in which the adapter is coupled to the rest plate.
Fig. 17 is a reference diagram for explaining a characteristic operation performed in the shelving unit of fig. 9.
Fig. 18 and 19 are reference diagrams for explaining an application example of the shelving unit of fig. 9.
Fig. 20 and 21 are reference diagrams for explaining a problem of electronic component placement.
Symbol description
110: shelving device for electronic component sorting machine
111a, 111b: holding rod
112: driving source
113a, 113b: movable guide
gp: guide part
sp: support part
sj: supporting table
114a, 114b: fixed guide
115a, 115b: restoring spring
116: setting frame
117: sensor device
Detailed Description
The preferred embodiments according to the present invention will be described with reference to the accompanying drawings, and repetitive or substantially identical structure descriptions will be omitted or simplified as much as possible for the sake of brevity of description.
<Description of electrical connection of electronic component to tester>
The sort to which the shelf for an electronic component sort machine according to the present invention (hereinafter simply referred to as "shelf") is applied is more suitable for a manner in which a contact terminal side portion of an electronic component such as a solid state disk is inserted into a test slit of a tester.
For example, as shown in fig. 1, the TESTER test has a test slit S into which a terminal T-side portion of the electronic component ED is inserted, and thus has a structure in which the electronic component ED and the TESTER TES TER are electrically connected. Here, as shown in fig. 1, the test slit S may be longer in the vertical direction or longer in the horizontal direction.
<Schematic illustration of the large construction of the classifier>
Fig. 2 is a schematic plan view of the classifier HR, and fig. 3 is a schematic perspective view of the classifier HR of fig. 2.
The separator HR according to the present embodiment includes a connecting portion CP, a stacker portion SP, and a conveying device TA.
The connection part CP takes out the electronic parts ED to be tested from the user tray CT and supplies to the TESTER, or retrieves the electronic parts ED after the test from the TESTER and loads to the user tray CT. The rest according to the present invention is provided to the connection portion CP.
The stacking unit SP stores the user tray loaded into the sorting machine HR for supplying the user tray CT loaded with the electronic components ED to be tested to the connection unit CP, or stores the user tray CT loaded with the electronic components ED after the test before the user tray CT is recovered from the connection unit CP and is carried out from the sorting machine HR. Further, the stack portion SP supplies the user tray CT loaded with the electronic components ED to be tested, which are stored, to the transfer device TA, or recovers the user tray CT loaded with the electronic components ED, which are tested, from the transfer device TA.
The transfer device TA transfers the user tray CT between the connection portion CP and the stacker portion SP. That is, the user tray CT loaded with the electronic components ED to be tested is transferred from the stacker portion SP to the connecting portion CP by the transfer device TA, and the user tray CT loaded with the electronic components ED to be tested is transferred from the connecting portion CP to the stacker portion SP by the transfer device TA.
The electronic components ED required to be tested in the sorting machine HR as described above are moved from the stack portion SP to the connection portion CP by the conveying device TA in a state of being loaded on the user tray CT. And, at the connection portion CP, the user tray CT is moved to the relay apparatus 100 by the moving handle MH, and supplied to the TESTER from the relay apparatus 100 by the test handle TH. After that, the electronic component ED after the test is moved to the stack portion SP through the reverse process described above.
Here, the moving handle MH has a structure for holding the electronic component ED by vacuum suction, and the test handle TH has a structure for holding the electronic component ED by pressurization at both ends.
<Adapter stationAdministrationSummary of the flow of the electronic component implemented by the connection part of (a)>
As described in detail in the previously filed invention, the flow of the electronic component ED executed in the case of applying the adapter AD is summarized with reference to the conceptual diagram of fig. 4.
In a state where the adapter AD is set on the relay apparatus 100, the mobile handle MH takes out the electronic component ED from the user tray CT and sets the electronic component ED on the adapter AD located in the first work area WA 1. At this time, the relay apparatus 100 opens the adapter AD so that the mobile handle MH can mount the electronic component ED to the adapter AD.
When the first job of placing the electronic component ED on the adapter AD is completed, the relay apparatus 100 moves the adapter AD from the first work area WA1 to the second work area WA2. Here, the first working area WA1 is behind the second working area WA2.
When the movement of the adapter AD to the second work area WA2 is completed, the relay device 100 rotates the adapter AD so that the posture of the electronic component ED mounted on the adapter AD is converted from the horizontal state to the vertical state. Then, the test handle TH is moved after holding the adapter AD, thereby electrically connecting the electronic component ED mounted on the adapter AD to the TESTER. Then, when the test on the electronic component ED is completed, the electronic component ED after the test is moved to the user tray CT by the reverse operation.
<Schematic illustration of an adapter>
Fig. 5 is a plan view of the adapter AD, and as shown in korean patent application No. 10-2021-0017446 (hereinafter referred to as "prior application") filed by the applicant of the present invention, the opening lever FL can be pressurized or released from being pressurized by an opener (described later). When the open lever FL is pressed, the interval between the pair of grip rails GR1, GR2 is widened, and the adapter AD is opened, so that the electronic component ED can be placed on the adapter AD or the electronic component ED placed on the adapter AD can be detached. When the pressurization of the open lever FL is released, the interval between the pair of manipulation rails GR1 and GR2 is narrowed, and the adapter AD is closed, and in this case, the electronic component ED mounted on the adapter AD is fixed.
Other structures, operation structures, and the like of the adapter AD described above are described in detail in the above-mentioned prior application, and are therefore omitted in the present specification.
Since such an adapter AD is detachably coupled to the relay device 100, it is moved together with the electronic component ED by the test handle TH.
For reference, the adapter has a passage region pf through which a flow type guide and a fixed type guide to be described later can pass.
<Schematic description of the arrangement purpose and the construction of the relay device>
The relay device 100 relays the electronic parts ED between the moving handle MH and the test handle TH, which are responsible for supplying the electronic parts ED located in the user tray CT to the TESTER test or retrieving the electronic parts ED completed with the test from the TESTER test to the user tray CT.
In general, large electronic components ED having a wide form such as solid state disks are supplied to the sorting machine HR in a state of being horizontally loaded on a user tray CT. Therefore, in order to extract the electronic component ED from the user tray CT, a vacuum suction method is preferable to hold the electronic component ED. However, in order to forcibly insert the electronic component ED into the test slit S of the TESTER test, the method of holding the electronic component ED by vacuum suction is not suitable, but the method of holding both ends of the electronic component ED by pressing is suitable. This is because, in the case of pressurizing both ends of the electronic component ED, a structure capable of properly guiding the electronic component ED that moves for insertion can be easily adopted.
Therefore, as shown in the above-mentioned related application, the separator HR needs to be provided with two holding structures for holding the electronic components ED. One is a moving handle MH capable of holding the electronic component ED by vacuum suction, and the other is a test handle TH capable of holding the electronic component ED by pressing both ends.
The moving handle MH is used to extract electronic components ED from the user tray CT or load the electronic components ED to the user tray CT. The test handle TH is used when inserting or collecting the electronic component ED into or from the test slit S of the TESTER.
In addition, if the operation area of the movable handle MH overlaps with the operation area of the test handle TH, not only is the control design for preventing interference therebetween very complicated, but also the operation rate is lowered, and therefore, as described above, it is preferable to distinguish the operation areas WA1 and WA2 from each other. In addition, when the test slit S is elongated vertically, it is necessary to convert the posture of the horizontal electronic component ED into a vertical posture. Therefore, the relay device 100 as in the present invention is required.
That is, the relay apparatus 100 according to the present invention is equipped for the following reasons.
First, it is necessary to appropriately relay the electronic component ED between the moving handle MH having the vacuum suction type structure and the test handle TH having the both-end pressurizing type structure.
Second, in the relay process, it is necessary to change the posture of the electronic component ED from horizontal to vertical or from vertical to horizontal.
Third, it is necessary to prevent the movement handle MH and the working areas WA1, WA2 of the test handle TH from overlapping.
Fourth, it is necessary to cause the sorting machine HR to process the electronic components ED of various specifications.
For this purpose, as referred to in the conceptual diagram of fig. 6 and the partial extract diagram of fig. 7 in which the shuttle 120 is omitted, the relay apparatus 100 includes a rest 110, the shuttle 120, a posture converter 130, and an opener 140.
The rest 110 is provided for resting the previously described adapter AD. And the present invention relates to such a shelving 110 as will be described in more detail in another inventory hereinafter.
The shuttle 120 reciprocates the rest 110 between a first work area WA1 where the mobile handle MH works and a second work area WA2 where the test handle TH works. Accordingly, the first work area WA1 and the second work area WA2 can be separated without overlapping each other, and operational interference between the moving handle MH and the test handle TH can be prevented.
The posture converter 130 rotates the adaptor AD seated on the setter 110 by rotating the setter 110, thereby finally rotating the electronic component ED seated on the adaptor AD, thereby converting the posture of the electronic component ED. For reference, the posture of the electronic component ED is changed from the portrait to the portrait during the supply of the electronic component ED to the TESTER, and the posture of the electronic component ED is changed from the portrait to the landscape during the recovery of the electronic component ED to the user tray CT.
The opener 140 opens the adapter AD so that the electronic component ED can be placed in the adapter AD or can be extracted from the electronic component ED placed in the adapter AD. As shown in the exploded view of fig. 8, such an opener 140 includes a pressurizing rod 141, a pressurizing source 142, and a rebound spring 143.
The pressurizing lever 141 pressurizes the opening lever FL of the adapter AD to open the adapter AD.
The pressurizing source 142 advances and retreats the pressurizing rod 141, so that the pressurizing rod 141 pressurizes or de-pressurizes the open rod FL of the adapter AD. As such a pressurizing source 142, although a cylinder is applied in the present embodiment, it is not necessarily limited to a cylinder.
The rebound spring 143 is provided as an elastic member that applies elastic force to the pressing lever 141 in a direction to release the pressing force without the pressing force being supplied from the pressing source 142.
In addition, it should be noted that the rest 110 is rotated by the posture converter 130. Therefore, in order to perform an opening operation of the adapter AD rested on the rester 110, it may be preferable that the opener 140 is coupled to the rester 110, but it is difficult to couple the opener 140 to the rester 110 due to an operation structure of the rester 110 itself. Accordingly, in the present embodiment, by adopting a structure in which the pressurizing rod 141 is rotatably coupled to the pressurizing source 142, the rest 110 can rotate the pressurizing rod 141 together when rotated by the posture converter 130.
For reference, since the above-described posture converter 130 and the opener 140 are required to reciprocate together with the rest 110, they are respectively combined with the rest 110 in an operable structure to move together with the rest 110.
<Description of shelving unit>
As shown in the extracts of fig. 9, 10 and 11, the rest 110 includes a pair of grip levers 111a and 111b, a driving source 112, a pair of movable guides 113a and 113b, a pair of fixed guides 114a and 114b, a pair of return springs 115a and 115b, a setting frame 116 and a sensor 117.
The pair of grip levers 111a and 111b and the drive source 112 will be described with reference to the extracts of fig. 12 and 13.
The pair of holding bars 111a, 111b hold or release the adapter AD by narrowing or widening the interval therebetween.
The drive source 112 reduces or enlarges the interval between the pair of grip levers 111a, 111b, thereby providing a drive force that enables the pair of grip levers 111a, 111b to automatically grip or release the grip of the adapter AD. In the present embodiment, the driving force from the driving source is not directly supplied to the pair of grip levers 111a and 111b, but is transmitted through the guide rail a, the pair of rotary links b, and the advancing and retreating member c.
When the grip levers 111a, 111b move in the left-right direction, the guide rail a guides the movement of the grip levers 111a, 111 b. For this purpose, the grip bars 111a, 111b are rail-coupled to the guide rail a.
One side of the pair of rotation links b is rotatably coupled to the grip levers 111a, 111b, and the other side is rotatably coupled to the advancing and retreating member c. Accordingly, the grip levers 111a, 111b are pushed or pulled in the left-right direction while the rotating link b rotates by the forward or backward movement of the advancing-retreating member c.
The advancing and retreating member c advances and rotates by the driving force of the driving source 112.
For reference, in the present embodiment, a structure in which the driving force of the driving source 112 constituted by the air cylinder is transmitted to the pair of grip levers 111a, 111b by the advancing and retreating member c or the like is adopted, but any structure may be preferably applied as long as the interval between the pair of grip levers 111a, 111b can be changed.
The pair of holding bars 111a and 111b should be capable of holding or releasing the adapter AD when the electronic component ED is in the horizontal state, and should be capable of holding or releasing the adapter AD when the electronic component ED is in the vertical state. Therefore, the grip levers 111a, 111b and the driving source 112 should be provided to be rotatable together with the setting frame 116 by the posture converter 130. For this reason, a structure in which the grip levers 111a, 111b and the drive source 112 are operatively coupled to the setting frame 116 is employed in the present embodiment. Here, as referred to in fig. 11, the driving source 117 is located on the reverse side of the rest adapter AD, i.e., the reverse side of the setting frame 116, so as not to interfere with the rest of the adapter AD while appropriately supplying the driving force to the pair of grip levers 111a, 111 b.
The pair of moving guides 113a, 113b may support the electronic part ED in a state where the adapter AD is opened by the opener 140 to maintain a position of the electronic part ED, and guide a placement position of the electronic part ED in a process where the electronic part ED is placed to the adapter AD. Such movable guides 113a, 113B are hinge-coupled to the bracket B by being loaded on the bracket B fixed to the setting frame 116, and thus are finally rotatably and movably set on the setting frame 116. The electronic component ED mounted on the adapter AD can be supported by the passage area pf of the adapter AD protruding upward. For this purpose, as shown in the extract of fig. 14, the movable guides 113a and 113b have a guide portion gp and a support portion sp.
The smaller the mutually facing surfaces of the guide portions gp are, the narrower the widths thereof become, thereby guiding the placement positions of the electronic components ED.
The support portion sp is formed integrally with the guide portion gp and is located below the guide portion gp to support the electronic component ED, thereby forming a support table sj for setting a placement position where the electronic component ED can be placed on the adapter AD.
As shown in fig. 15, insertion grooves ig into which the restoring springs 115a and 115 are inserted are formed in the movable guides 113a and 113b, and the restoring springs 115a and 115 are provided as restoring members for restoring the positions of the movable guides 113a and 113 b.
Preferably, the interval between the pair of movable guides 113a, 113b is set so that the electronic component ED having the largest negative tolerance width can be placed.
The pair of fixed guides 114a and 114b are identical in shape and structure to the pair of movable guides 113a and 113b, but are fixedly provided on the installation frame 116. Such a pair of fixed guides 114a, 114b can also guide the placement position of the electronic component ED in the process of the electronic component ED being placed to the adapter AD. However, the interval between the pair of fixed guides 114a, 114b is set so that the electronic component ED having the largest positive tolerance width can be placed. The pair of fixed guides 114a and 114b also has a function of preventing the electronic component ED mounted to the adapter AD from being deflected in a state where the adapter AD is opened by the opener 140. Therefore, from the functional aspect of preventing the deflection of the electronic component ED described above, the pair of fixed guides 114a, 114b may also be named as a deflection preventing protrusion that prevents the deflection of the electronic component ED. For example, the elastic coefficients of the two restoring springs 115a, 115b become different, so that the electronic component ED lowered by the moving handle MH may be deflected to one side, and at this time, the fixed guides 114a, 114b will prevent the electronic component ED from being deflected beyond a prescribed threshold.
The pair of restoring springs 115a and 115b are provided as restoring members that, after an external force is applied to the pair of movable guides 113a and 113b to rotationally move the pair of movable guides 113a and 113b, restore the pair of movable guides 113a and 113b to the original positions when the external force is removed from the pair of movable guides 113a and 113 b. The lower ends of the restoring springs 115a and 115b are fixed to the installation frame 116.
The setting frame 116 is used to set a pair of grip levers 111a, 111b, a driving source 112, a pair of moving guides 113a, 113b, a pair of fixed guides 114a, 114b, and return springs 115a, 115b.
The sensor 117 senses a poor placement of the electronic component AD in a process of placing the electronic component ED to the adapter AD.
Fig. 16 shows an example in which the adapter AD rests on the rest 110. Referring to fig. 16, it can be confirmed that the adapter AD is provided with the movable guide 113a and the fixed guide 114a in the passing region pf.
<Description of characteristic operations>
When the electronic parts ED are supplied to the adaptor AD mounted on the rest 110 by moving the handle MH, the adaptor AD is maintained in an open state by the opener 140.
First, the moving guides 113a, 113b do not undergo rotational movement for the electronic component ED having the largest negative tolerance width.
However, in the case of the electronic component ED having a width equal to or greater than the maximum negative tolerance width, if the electronic component ED is lowered by the moving handle MH, both ends of the electronic component ED apply external force in the expanding direction of the moving guides 113a, 113b while contacting the guide portion gp. Thereby, as shown in enlarged fig. 17, the interval between the two support tables sj is pulled apart while the movable guides 113a, 113b are rotationally moved, so that the electronic component ED can be appropriately supported on the two support tables sj.
<Application examples for shelving>
Referring to the schematic view of fig. 18, the interval between the support tables is widened or narrowed by the horizontal movement of the movable guides 113a, 113 b.
Further, referring to the schematic diagram of fig. 19, one restoring spring 115 is formed to simultaneously provide restoring force to the both side moving guides 113a, 113 b. As shown in fig. 19, in the case of using an example in which restoring force is applied to both the movable guides 113a, 113b by one restoring spring 115, it is possible to prevent the problem that the movement amounts of the movable guides 113a, 113b become different from each other due to the elastic coefficients of the restoring springs 115a, 115b being different from each other.
As described above, although the detailed description of the present invention is made by way of example only with reference to the embodiments of the drawings, the above-described embodiments are merely illustrative of preferred embodiments of the present invention, and therefore, the present invention should not be construed as being limited to the above-described embodiments, and the scope of the claims of the present invention should be construed as the scope of the claims to be described later and the equivalents thereof.

Claims (7)

1. A shelf for an electronic component handler, comprising:
a pair of holding bars capable of holding or releasing an adapter to which an electronic component is detachably attached;
a drive source for enabling the pair of grip bars to grip or release the adapter by reducing or expanding the interval between the pair of grip bars;
a pair of movable guides that support the electronic component in a state where the adapter is opened by the opener and guide a placement position of the electronic component in a process where the electronic component is placed to the adapter;
a restoring member that restores the pair of movable guides to an original position when an external force is removed from the pair of movable guides after the pair of movable guides are moved by applying the external force to the pair of movable guides; and
a setting frame for setting the pair of holding bars, the driving source, the pair of moving guides and the restoring member,
wherein the movable guide is movably provided to the setting frame to protrude upward by being located at a passing area of the adapter to support the electronic component mounted on the adapter,
the pair of moving guides includes:
a guide portion having a narrower width as facing each other downward, so as to guide a placement position of the electronic component; and
and a support portion, which is positioned at a lower side of the guide portion, for supporting the electronic component, thereby forming a support table for setting a placement position of the electronic component at the adapter.
2. The shelving unit for an electronic component handler as defined in claim 1, wherein,
the pair of movable guides are hinge-coupled to the setting frame by their lower end portions to widen or narrow a space between the support tables of the pair of guides by a rotational movement.
3. The shelving unit for an electronic component handler as defined in claim 1, wherein,
the restoring member has a pair of restoring springs for restoring the pair of movable guides, respectively.
4. The shelving unit for an electronic component handler as defined in claim 1, wherein,
the restoring member has a pair of restoring springs for restoring the pair of movable guides together.
5. The shelf for an electronic component handler of claim 1, further comprising:
a pair of fixed guides fixedly provided to the setting frame, configured to support the electronic component in a state where the opener opens the adapter, and guide a placement position of the electronic component in a process where the electronic component is placed to the adapter.
6. The shelf for an electronic component handler of claim 1, further comprising:
and a preventing protrusion fixedly provided to the setting frame for preventing deflection of the electronic component mounted to the adapter in a state where the opener opens the adapter.
7. The shelf for an electronic component handler of claim 1, further comprising:
a sensor for sensing a defective placement of the electronic component during the placement of the electronic component to the adapter.
CN202211317857.7A 2021-10-27 2022-10-26 Shelving device for electronic component sorting machine Pending CN116020754A (en)

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KR10-2021-0144615 2021-10-27
KR1020210144615A KR20230060187A (en) 2021-10-27 2021-10-27 Holder for handler of electronic component

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114904807A (en) * 2021-02-08 2022-08-16 泰克元有限公司 Adapter of sorting machine for electronic component test
CN115121494A (en) * 2021-03-26 2022-09-30 泰克元有限公司 Sorter for testing electronic components

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7470140B1 (en) * 2007-06-18 2008-12-30 David Eldridge Integrated chip clamp adjustment assembly and method
US6873169B1 (en) * 2004-03-11 2005-03-29 Mirae Corporation Carrier module for semiconductor device test handler
JP6040530B2 (en) * 2012-01-17 2016-12-07 セイコーエプソン株式会社 Handler and inspection equipment
KR102473315B1 (en) * 2016-02-19 2022-12-02 (주)테크윙 Pushing apparatus of handler for testing electronic devices
US11837487B2 (en) * 2017-07-12 2023-12-05 Tokyo Electron Limited Transfer device, substrate processing system, transfer method and substrate processing method
CN113245215B (en) * 2020-02-10 2023-05-23 泰克元有限公司 Sorting machine for electronic component test

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114904807A (en) * 2021-02-08 2022-08-16 泰克元有限公司 Adapter of sorting machine for electronic component test
CN115121494A (en) * 2021-03-26 2022-09-30 泰克元有限公司 Sorter for testing electronic components

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KR20230060187A (en) 2023-05-04
TWI832511B (en) 2024-02-11

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