KR20220114214A - Adaptor of handler for testing electronic component - Google Patents

Abstract

The present invention relates to an adapter of a handler for testing electronic components. The adapter of a handler for testing electronic components according to the present invention has a structure capable of holding all electronic components having various widths, a structure for preventing the mounted electronic components from being detached, a structure capable of accurately mounting the adapter on a holder and maintaining the position thereof, and a structure capable of being accurately held by a test hand and having the position thereof fixed. According to the present invention, since the adapter can carry electronic components of various specifications, the usability of the handler is increased, and since the position of the adapter is accurately set and maintained in relation to other structures, operational failure due to a positional failure of the adapter or electrical connection failure between an electronic component and a tester is prevented, thereby improving the reliability of the handler.

Description

Adapter of handler for testing electronic components

The present invention relates to an adapter that can be used in a handler for testing electronic components.

Produced electronic components (eg, semiconductor devices, boards, SSDs, etc.) are tested by testers and then divided into good and defective products, and only good products are shipped.

Electronic components can be tested only when they are electrically connected to the tester. At this time, the electronic component testing handler (hereinafter abbreviated as 'handler') is the equipment that supports the electronic component to be tested by electrically connecting the electronic component to the tester. to be.

Handlers are being proposed and manufactured by Dong-Ah according to the development of new electronic components, and various subsequent developments are being made for stabilization.

In recent years, the spread of SSDs (Solid State Drives), which are large electronic components loaded with various electronic devices, is on the rise.

In the early stage, when the demand for SD was low and only a small amount was produced, the SD was directly connected to the tester and disconnected manually. However, as the demand increased, it became difficult to support manual testing.

However, since the conventional handler could not be applied because the thickness, structure, and weight of SD were different from those of conventional electronic components, a handler suitable for test support of large electronic components such as SD was developed and published in Korean Patent Publication No. 10-2019 -0050483 and 10-2019-0061291 have been proposed.

On the other hand, SD may have various standards depending on the type of mounted electronic device or its dedicated use, and a handler for supporting testing of electronic components of various standards is required. However, since the handler is expensive and its scale is large, it is expected that there will be a demand for a technology that can handle testing of electronic components having various specifications in one handler in consideration of production cost and installation location.

In addition, in order to test electronic components having different specifications, replacement of components meeting the specifications of the corresponding electronic component is required, and even if replacement of components is not required, a pause time for supplying new electronic components is required. As a result, the utilization rate of handlers and testers decreases and miscellaneous manpower is lost. Therefore, it is expected that there will be a demand for a handler that does not require a separate downtime even during one cycle or continuous operation of the handler.

In addition, in the case of semiconductor devices, which are conventional small-scale mass-produced products, a test tray capable of loading several hundred or more semiconductor devices is provided, and the semiconductor devices are directly gripped with a plurality of pickers and inserted into the insert of the test tray. In this system, the precise position of the semiconductor element is held in the insert and also in the process of connecting with the tester, so it was not a problem even if the precision was somewhat lowered. However, electronic components including semiconductor devices are gradually being produced in small quantities in various types in response to the diversity of applied devices, and there are cases where several types of tests have to be performed. , it was necessary to manufacture expensive test trays for each type of electronic component or type of tester and to have a suitable handler. It has been confirmed through previous studies that there is a significant problem in connecting the electronic component to the test socket while holding the electronic component directly with the gripper without considering this. For example, electronic components have different lengths and widths as much as various types, and it is difficult to manufacture the same type of electronic components 100% in size due to processing errors, etc. due to the characteristics of manufacturing. However, if the electronic component is to be gripped with a gripper without considering such a situation, the electronic component cannot be properly gripped and thus lost or the electronic component is damaged due to excessively strong pressing force. Of course, even if the gripper is adjusted to grip the electronic component well, depending on which part of the electronic component is gripped and how strong the grip is, a situation such as the electronic component twisting or rotating along with the gripping occurs. It was confirmed that it was difficult for an electronic component to precisely contact the test socket. In order to improve this, the driving unit must be capable of precise control, and since it must correspond to all electronic components, the driving shaft must also be very long. In addition, there is a need to use an expensive motor capable of even controlling torque for each situation in order to prevent damage, distortion, and undesired rotation. However, this is not effective because it requires a high production cost along with the enlargement of the equipment. In addition, auto-teaching for setting the precise gripping position of the electronic component by the gripper should be implemented to make precise contact, which is a part that requires enormous cost and technical skill.

Therefore, the applicant of the present invention has previously proposed an invention (hereinafter referred to as 'pre-application technology', which is currently unpublished) in which an adapter is provided in a handler to implement a general-purpose handler in Patent Application No. 10-2020-0073725. . The adapter is designed to function as a carrier used to supply electronic components to the tester, and is expected to contribute to greatly increasing the usability of the handler by allowing the handler to adapt to many kinds of electronic components of different sizes.

The present invention has been devised by the following considerations for further improvement while more clearly presenting the adapter presented as the above-mentioned prior application technology.

First, it is necessary for the adapter to be accurately seated on the cradle, and to maintain the seated state of the adapter even when an external force is applied to the adapter.

Second, the adapter needs to be held correctly in the test hand.

Third, it is necessary to prevent the electronic component seated on the adapter from being separated or falling downward.

Fourth, the electronic component held by the adapter needs to be precisely electrically connected to the tester.

The adapter of the handler for testing electronic components according to the present invention includes: a pair of grip levers opposite to each other and for gripping or releasing both ends of an electronic component by linear movement in a direction in which the distance between each other is narrowed or widened; an installation frame in which the pair of gripping levers are installed to be movable in a straight line; a gap manipulation mechanism installed on the installation frame and configured to apply an operating force to the pair of gripping levers to move in a direction in which the distance between them is widened; and by applying an elastic force to the pair of gripping levers in a direction in which the distance between them is narrowed, when the operating force applied to the pair of gripping levers is removed by the gap manipulation mechanism, the pair of gripping levers are spaced apart from each other. Elastic members that allow movement in the narrowing direction; Including, wherein the elastic members function as variable elements that vary the gripping width between the pair of gripping levers according to the degree of compression, so that the pair of gripping levers can grip electronic components having various widths.

When the pair of gripping levers face each other, the electronic component moves in a direction perpendicular to the direction in which the pair of grip levers move linearly (hereinafter referred to as 'orthogonal direction') while being electrically connected to the tester. A guide groove for guiding the movement of the electronic component is formed, and the guide groove is elongated in a direction (hereinafter referred to as 'orthogonal direction') perpendicular to the direction in which the pair of gripping levers move in a straight line. It moves in an orthogonal direction along the guide groove.

When the pair of gripping levers hold both ends of the electronic component, both ends of the electronic component are inserted into the guide groove, so that the guide groove also functions as a gripping groove for gripping the electronic component.

The gap manipulating mechanism is installed on the installation frame to enable linear movement in a direction perpendicular to the direction in which the pair of gripping levers move linearly (hereinafter referred to as 'orthogonal direction'), and the gap manipulating mechanism has both ends. An operation part that is in contact with the pair of gripping levers and is provided to apply an operating force to the pair of gripping levers in a direction in which the distance between the pair of gripping levers is widened when moving in a straight line in the forward direction ; have

The operation portion includes rolling rollers in contact with the pair of gripping levers; In the pair of gripping levers, a manipulation groove is formed on a surface facing each other at a portion in contact with the rolling rollers, and the manipulation groove is formed to have an inclination such that the depth of the dent becomes shallower as it goes in the forward direction. .

a support member for preventing downward detachment of the electronic component seated in the supine shape when the pair of gripping levers are in a state of releasing the grip of the electronic component; further includes

The support member also functions as a limiting member for limiting the minimum distance between the pair of gripping levers. When seated on the cradle, it has setting holes for matching with the positioning pins protruding upward from the seating surface of the cradle.

A portion of the rim of at least one of the setting holes is formed in the installation frame, and another portion is formed in the gap manipulation mechanism.

The gap manipulation mechanism is installed on the installation frame to enable linear movement in a direction perpendicular to the direction in which the pair of gripping levers move linearly (hereinafter referred to as 'orthogonal direction'), and a specific corresponding to the specific setting hole. The positioning pin is formed at a height to prevent downward separation of the electronic component by supporting the electronic component seated in a supine shape when the pair of gripping levers are in a state of releasing the grip, and the gap control mechanism has the specific It has a through hole through which the positioning pin can protrude upwardly through the interval manipulating mechanism, and the through hole is in the form of an elongated long hole in the orthogonal direction, so that the interference of the specific positioning pin with the linear movement of the interval manipulating mechanism. This is excluded, and a part of the through hole forms another partial section of the rim of the specific setting hole.

At least one setting hole among the setting holes is formed in the installation frame so that the position of the installation frame with respect to the cradle can be fixed.

The installation frame has a position fixing protrusion that is inserted into the position fixing groove on the gripping surface of the test hand when the test hand grips the installation frame, or has a position fixing groove into which the position fixing projection on the gripping surface of the test hand is inserted As a result, the position of the installation frame with respect to the test hand can be fixed.

According to the present invention, in addition to the effect of increasing the usability of the handler by the adapter for carrying electronic components having various widths, the following effects are further obtained.

First, the adapter is correctly seated on the cradle, and the adapter remains seated even when an external force is applied to the adapter. do.

Second, there is no misplacement or loss of electronic components that are seated on the adapter.

Third, there is no contact defect between the electronic component and the tester due to the adapter.

This ultimately improves the reliability of the handler.

1 is a reference diagram for explaining an electrical connection structure between an electronic component and a tester.
2 is a conceptual structural diagram of a handler for testing electronic components according to an embodiment of the present invention.
Fig. 3 is a schematic perspective view of the handler of Fig. 2;
4 is an exploded perspective view of an adapter according to an embodiment of the present invention.
Fig. 5 is a schematic plan view of the adapter of Fig. 4;
Fig. 6 is a schematic bottom view of the adapter of Fig. 4;
7 is a reference diagram for explaining the relationship between the adapter and the test hand of FIG. 4 .
8 is a reference diagram for explaining the relationship between the adapter and the pass through of FIG. 4 .
9 is a conceptual diagram for explaining a second setting hole in the adapter of FIG.
Fig. 10 is a schematic rear view of the adapter of Fig. 4;
Fig. 11 is a schematic side view of the adapter of Fig. 4;

A preferred embodiment according to the present invention will be described with reference to the accompanying drawings, but for the sake of brevity of the description, descriptions of overlapping or substantially the same components will be omitted or compressed as much as possible.

<Description of the electrical connection between the electronic component and the tester>

The handler for testing electronic components to which the adapter according to the present invention is applied is more appropriately applied when the contact terminal side of the electronic component is inserted into the test slit of the tester, such as SD.

For example, as shown in FIG. 1 , the tester TESTER is provided with a test slit S, and the terminal T side portion of the electronic component ED is inserted into the test slit S. It has a structure in which a tester and a tester are electrically connected.

<A brief description of the parallelism of the handler>

2 is a schematic plan view of a handler (HR) in which an adapter 100 (hereinafter abbreviated as 'adapter') of the handler for testing electronic components according to the present invention can be used, and FIG. 3 is the handler (HR) of FIG. is a schematic three-dimensional diagram of

The handler HR according to the present embodiment includes a connection part CP, a stacker part SP, and a transfer device TA.

The connection part (CP) draws out the electronic component to be tested (ED) from the customer tray (CT) and supplies it to the tester (TESTER), or collects the electronic component (ED) that has been tested from the tester and collects it from the customer tray (CT). The adapter 100 according to the invention is used in this connection part CP.

The stacker part (SP) stores the customer trays brought into the handler (HR) to supply the customer tray (CT) loaded with the electronic components (ED) to be tested to the connection part (CP), or the electronic components that have been tested The customer tray (CT) loaded with the parts (ED) is recovered from the connection part (CP) and stored before being taken out from the handler. In addition, the stacker part (SP) supplies the customer tray (CT) loaded with the electronic component (ED) to be tested stored to the transfer device (TA), or the customer tray loaded with the electronic component (ED) that has been tested. (CT) is recovered from the transfer device (TA).

The transfer device TA transfers the customer tray CT between the connection part CP and the stacker part SP. That is, the customer tray CT on which the electronic components ED to be tested are loaded is transferred from the stacker portion SP to the connection portion CP by the transfer device TA, and the electronic component ED is tested. The loaded customer tray CT is transferred from the connecting portion CP to the stacker portion SP by the transfer device TA.

<Explanation of the schematic flow of electronic components related to the adapter>

Since it has been described in detail in the prior art, the flow of the adapter 100 will be schematically described.

In a state in which the adapter 100 is seated on the cradle, a moving hand (not shown) draws out the electronic component ED from the customer tray CT to be seated on the adapter 100 . At this time, an opener (not shown) opens the adapter 100 so that the moving hand can seat the electronic component ED on the adapter 100 .

The adapter 100 on which the electronic component ED is seated is moved from the setting position to the holding position, and is erected by rotation. A test hand (not shown) moves after holding the adapter 100 in a standing state to electrically connect the electronic component ED to the tester TESTER. After that, when the test on the electronic component ED is finished, the electronic component ED whose test has been completed through the reverse operation is loaded onto the customer tray CT.

<Description of the adapter>

4 is an exploded perspective view of the adapter 100 according to an embodiment of the present invention. And FIG. 5 is a plan view of the adapter 100 of FIG. 4 , and FIG. 6 is a bottom view of the adapter 100 of FIG. 4 .

The adapter 100 includes a pair of gripping levers 111 and 112 , an installation frame 120 , a gap manipulation mechanism 130 , elastic members 141 to 146 , a support member 150 , and restoration members 161 and 162 . ) are included.

The pair of gripping levers 111 and 112 are provided to face each other, and are guided by the guide bar GB in the installation frame 120 in a direction in which the distance between them is narrowed or widened (left and right in the drawing, hereinafter ' It can move in a straight line (referred to as 'left and right direction'). Therefore, when the distance between the pair of gripping levers 111 and 112 is narrowed, the pair of gripping levers 111 and 112 is in a state of gripping the eddy electronic component ED. And when the distance between the pair of gripping levers 111 and 112 is widened, the pair of gripping levers 111 and 112 is in a state of releasing the grip of the electronic component ED. Therefore, in order for the electronic component ED to be seated on the adapter 100 by the moving hand or to be withdrawn from the adapter 100, the pair of gripping levers 111 and 112 must be in an open state to release the gripping of the electronic component ED. do.

Two manipulation grooves OG are formed on the surfaces of the pair of gripping levers 111 and 112 facing each other.

The manipulation groove OG is formed in a portion where the grip levers 111 and 112 and the gap manipulation mechanism 130 contact each other. The two manipulation grooves OG in the same holding levers 111 and 112, respectively, are formed side by side in a direction perpendicular to the left and right direction (the front-rear direction in the drawing, hereinafter referred to as 'orthogonal direction'). In addition, the manipulation groove OG is formed to have an inclination such that the depth of the dent becomes shallower toward the rear.

In addition, the pair of gripping levers (111, 112) is formed with a guide groove (GG) long in the orthogonal direction on the upper side of the operation groove (OG) facing each other. The guide groove GG is formed during the process of moving the electronic component ED in the orthogonal direction (for example, the process in which the electronic component to be tested moves to be electrically connected to the tester or the electronic component after the test is drawn out from the tester) It guides the movement of the electronic component (ED) in the process of moving to the adapter). Furthermore, when the pair of gripping levers 111 and 112 hold both ends of the electronic component ED, both ends of the electronic component ED are inserted and caught in the guide groove GG, so the guide groove ( 111 and 112 also function as gripping grooves for gripping the electronic component ED.

The installation frame 120 is to install and support the grip levers 111 and 112, the gap control mechanism 130, the elastic members 141 to 146, the supporting members 150 and the restoration members 161, 162. will be prepared This installation frame 120 has a position fixing protrusion 121 protruding to the left and right, respectively, on both sides of the left and right sides.

The position fixing protrusion 121 is related to the position fixing groove FG formed on the gripping surface of the test hand 300 as shown in the reference diagram of FIG. 7 . That is, when the test hand 300 grips the installation frame 120 and ultimately grips the adapter 100 , the positioning protrusion 121 is inserted into the positioning groove FG. So, even if an external force is applied to the adapter 100 in an orthogonal direction while the test hand 300 holds the adapter 100 in the future, the position of the installation frame 120 is fixed and maintained, so the position of the adapter 100 in the end can be fixed and maintained. Of course, depending on the implementation, a position fixing groove may be formed in the installation frame 120 , and a position fixing protrusion may be formed in the test hand 300 .

In addition, two first setting holes 122 are formed in the front portion of the installation frame 120 . And the first setting groove 123 is formed in the middle portion, the second setting groove 124 is formed in the rear portion. The first setting hole 122 , the first setting groove 123 , and the second setting groove 124 are formed to set the position of the adapter 100 while the adapter 100 is seated on the cradle.

This embodiment assumes that the positioning pins PP protruding upwards are formed on the seating surface of the cradle 200 as shown in FIG. 8 . And the first setting hole 122 and the setting grooves (123, 124) are formed at positions corresponding to the positioning pins (PP). Therefore, in the process of the adapter 100 being seated on the cradle 200, the positioning pins PP are inserted into the first setting hole 122 or positioned by a structure in contact with the edge surface forming the setting grooves 123 and 124. The seating position of the adapter 100 is accurately set by matching the setting pins PP with the first setting hole 122 and the setting grooves 123 and 124 . Furthermore, since the first setting hole 122 also has a function of fixing and maintaining the position of the installation frame 120 when an external force is applied to the adapter 100 in a later orthogonal direction, ultimately the adapter with respect to the holder 200 . (100) also functions to fix the position.

In addition, in this embodiment, the positioning pin (PP) by supporting the electronic component (ED) seated on the adapter 100 in a supine position when the pair of gripping levers 111 and 112 are in a state to release the grip. It is assumed that the electronic component ED is formed at a height that prevents the downward separation of the electronic component ED.

For reference, the number of the first setting hole 122 , the setting grooves 123 and 124 , and the positioning pin PP may be increased or decreased to an appropriate number.

In addition, the installation frame 120 is an electronic component (ED) in order to prevent the downward separation of the electronic component (ED) seated in a supine state when the pair of gripping levers (111, 112) are in a state to release the grip. It has a first fulcrum 125 supporting the lower end.

The gap manipulation mechanism 130 is installed on the installation frame 120 and applies an operating force to the pair of gripping levers 111 and 112 to move in a direction in which the distance between them is widened. To this end, the gap manipulation mechanism 130 is installed on the installation frame 120 to be movable in the orthogonal direction, and includes an operation part 131 , a push plate 132 and a transmission rod 133 .

The operation part (131) has two rolling rollers (R) on each left and right sides.

Rolling rollers (R) are provided at positions corresponding to the positions of the operation grooves (OG). Therefore, the rolling rollers (R) are in contact with the surface forming the operation groove (OG) in a state that a part of it is inserted into the operation groove (OG). That is, both ends of the operation part 131 of the gap operation mechanism 130 are in contact with the grip levers 111 and 112 through the rolling roller R. So, when the gap manipulation mechanism 130 moves in the forward direction (rearward in the drawing), the rolling rollers R come into contact with the shallower surface of the manipulation groove OG as they move, so naturally the gap manipulation mechanism 130 ) applies an operating force to both the gripping levers 111 and 112 in a direction in which the distance between the gripping levers 111 and 112 is widened. Here, the forward direction means a direction in which the gap manipulation mechanism 130 moves to open the adapter 100 .

Conversely, when the gap manipulation mechanism 130 moves in the reverse direction, which is opposite to the normal direction, the rolling rollers R come into contact with the surface of the manipulation groove OG increasing in depth as it moves, so naturally both grip levers 111 , 112) is released.

The push plate 132 receives an external force applied in the forward direction to the gap manipulation mechanism 130 by the opener.

The transmission rod 133 has a front end fixedly coupled to the push plate 132 , and a rear end fixedly coupled to the operation portion 131 side, thereby transferring the external force of the opener input to the push plate 132 to the operation portion 131 . .

On the other hand, the gap manipulation mechanism 130 has a through hole 134 and a third setting groove 135 is formed. The through hole 134 and the third setting groove 135 are the first setting hole 122 , the first setting groove 123 , and the second setting groove 124 , and the adapter 100 is seated on the cradle 200 . It is formed to set the position of the adapter 100 in the process of being.

9, the through hole 134 is paired with the second setting groove 124 to form a second setting hole SH. This reason will be described next.

The positioning pin PP of the cradle 200 has a height capable of supporting the electronic component ED seated on the adapter 100 , and for this purpose, the specific positioning pin PP uses the gap manipulation mechanism 130 . It must pass through, and for this purpose, a through hole 134 is formed in the gap adjusting mechanism 130 . Therefore, the second setting hole (SH) is provided by the second setting groove 124 formed in the second setting groove 124 formed in the part of the edge section (S1) of the installation frame (120), the other section (S2) to the gap manipulation mechanism (130) provided by a formed through hole 134 . Here, the specific positioning pin PP must remain inserted into the through hole 134 . So, so that the linear movement of the gap manipulation mechanism 130 by the specific positioning pin PP is not hindered, the through hole 134 must be formed in the form of a long long hole in the orthogonal direction. Since the shape of the through hole 134 should be a long hole, a mechanical design as shown in FIG. 9 was required. Accordingly, the interference of the specific positioning pin (PP) with respect to the linear movement of the gap manipulation mechanism 130 is excluded.

The third setting groove 135 is paired with the first setting groove 123 to constrain the positioning pin PP.

The elastic members 141 to 146 are installed so that one side is in contact with the installation frame 120 , and the other side is in contact with the grip levers 111 and 112 . Accordingly, the elastic members 141 to 146 apply an elastic force to the pair of gripping levers 111 and 112 in a direction in which the distance between the pair of gripping levers 111 and 112 is narrowed. Accordingly, when the operating force applied to the pair of gripping levers 111 and 112 by the gap operation mechanism 130 is removed, the pair of gripping levers 111 and 112 by the elastic force of the elastic members 141 to 146 . moves in the direction in which the distance between them becomes narrower, thereby gripping the electronic component (ED). From this point of view, the elastic members 141 to 146 function to generate and maintain a gripping force capable of gripping the electronic component ED by the pair of gripping levers 111 and 112, and furthermore, the adapter 100 ) to close the

The elastic members 141 to 146 are spaced between the pair of gripping levers 111 and 112 according to the degree of compression thereof. And this fact is also as a variable element that the elastic members 141 to 146 vary the gripping width between the pair of gripping levers 111 and 112 (the width at which the pair of gripping levers must be spaced apart to grip the electronic component). means to function. That is, the gripping levers 111 and 112 can grip the electronic components ED having various widths according to the degree of compression of the elastic members 141 to 146 .

The support member 150 is provided to prevent the downward separation of the electronic component ED seated in the supine shape when the pair of gripping levers 111 and 112 are in a state to release the gripping of the electronic component ED. . Accordingly, the support member 150 has a second support protrusion 151 for supporting the lower end of the electronic component ED.

Since the support member 150 is fixed to the installation frame 120 in a U-shape, the left and right ends also function as a limiting member for limiting the minimum distance between the pair of gripping levers 111 and 112 .

The restoring members 161 and 162 apply an elastic force to the rear of the gap manipulation mechanism to restore the gap manipulation mechanism to the front when the external force caused by the opener is removed.

<Explanation of the operation of the features>

As the initial or electronic component (ED) to be tested is replaced, the operator places the adapter 100 suitable for the electronic component (ED) to be tested on the cradle 200 . At this time, the positioning pin PP formed to protrude upward from the seating surface of the cradle 200 is a first setting hole 122 , a second setting hole SH, a first setting groove 123 and a third setting hole. While the grooves 135 are paired with each other to be inserted into the portion constraining the positioning pin PP, the adapter 100 is seated on the cradle 200 in a state in which the position is accurately set.

Thereafter, when the moving hand intends to seat the electronic component ED drawn out from the customer tray CT on the adapter 100 , the opener pushes the gap control mechanism 130 rearward. At this time, since the position of the installation frame 120 is fixed by the positioning pin PP inserted into the first setting hole 122, only the gap manipulation mechanism 130 is rearward by the pressing force of the opener. will move In this process, the restoration members (161, 162) are compressed, and the rolling roller (R) moves in a state in contact with the wall surface of the manipulation groove (OG) forming the inclined surface, while the force is exerted on the holding levers (111, 112) in the left and right directions. By applying , the gap between the both gripping levers 111 and 112 is widened and the adapter 100 is opened.

When the opening of the adapter 100 is completed, the moving hand places the electronic component ED on the adapter 100 . At this time, the electronic component ED is placed on the first fulcrum 125 , the second fulcrum 151 , and the positioning pins PP to prevent downward separation thereof. For this reason, it is preferable that the upper ends of the positioning pins PP are formed in a flat shape.

When the moving hand moves to another position after releasing the grip of the electronic component ED, the external force applied by the opener to the gap manipulation mechanism 130 is removed. Accordingly, the gap between the grip levers 111 and 112 is narrowed by the elastic force of the elastic members 141 to 146 while the gap manipulation mechanism 130 is returned to the front by the restoration members 161 and 162 . And the left and right ends of the electronic component ED are inserted into the guide grooves GG of the grip levers 111 and 112 , thereby completing the gripping of the electronic component ED by the adapter 100 .

Meanwhile, the adapter 100 seated on the cradle 200 is gripped by the test hand 300 , and in this process, the positioning protrusion 121 is inserted into the positioning fixing groove FG. Accordingly, the adapter 100 is gripped by the test hand 300 so as to be positioned at the correct setting position. In addition, since the position of the installation frame 120 can be fixed and maintained even after the external force applied to the adapter 100 , ultimately the position of the adapter 100 can be fixed and maintained.

If the test hand 300 continuously moves the adapter 100 to the tester side and the position between the adapter 100 and the test socket is accurately set, the opening element in the test hand 300 moves the gap control mechanism 130 . to slightly widen the gap between the grip levers 111 and 112 by pushing the Let it be inserted into the test slit (S) in this test socket.

And when the test is finished, the adapter 100 is operated in a state of fixing the electronic component ED, and then the electronic component ED is drawn out from the test slit S by the test hand 300 . The extracted electronic component (ED) is ultimately loaded onto the customer tray (CT) by moving through the reverse process.

<Note>

1. In this embodiment, the electronic component (ED) in which the positioning pin (PP), the supporting member 150, the first supporting jaw 125 and the second supporting jaw 151 are seated on the adapter 100 in a supine shape. is meant to be supported. However, the pair of gripping levers 111 and 112 may be implemented to grip or release the electronic component ED in a state in which the moving hand is gripped. However, if the latter is followed, the position of the moving hand, the holding or releasing time of the moving hand, and the holding or releasing time by the holding levers 111 and 112 must be managed very precisely. And since the processing speed is reduced accordingly, the positioning pin PP, the supporting member 150, the first supporting jaw 125 and the second supporting jaw 151 are connected to the adapter 100 as in the present embodiment. It is more preferable to be implemented to support the electronic component (ED) seated in a vortex.

And the height of the upper end of the first fulcrum 125, the second fulcrum 152 formed on the supporting member and the positioning pin PP is based on when the electronic component ED is seated on the adapter 100 in a supine shape. It is preferable to have the same height as the lower end of the guide grooves GG formed in the grip levers 111 and 112 .

2. In most cases, when the adapter 100 approaches the tester TESTER by the test hand 300, a large number of electronic components ED are being tested in the tester TESTER. In such a case, since the adapter 100 and the electronic component ED being tested may collide, a physical mark M is provided on one side of the rear end of the adapter 100 as in the schematic rear view of FIG. 10 to prevent this. It is preferable to do And in response to this, by placing a camera on the tester (TESTER) side, when the adapter 100 approaches the tester (TESTER) side, the physical mark (M) can be confirmed by the camera. Accordingly, collision between the adapter 100 and the electronic component ED currently being tested can be prevented.

In addition, as in the schematic side view of FIG. 11 , a collision between the adapter 100 and the electronic component ED being tested is prevented by forming the rear end portion of the adapter 100 to have an inclined surface TF that becomes narrower toward the rear. It is desirable to be implemented to prevent it as much as possible.

3. The electronic component ED can be properly inserted into the test slit S only when the adapter 100 exactly faces the test socket of the tester TSETR. Therefore, as referenced in FIG. 10, a long calibration hole (CH) is formed in an orthogonal direction on the other side of the rear end of the adapter 100, and a calibration pin that can be inserted into the calibration hole is provided in the test socket, so that the adapter 100 It can be considered desirable to be implemented so that it can be located precisely corresponding to the test socket.

As described above, the specific description of the present invention has been made by the embodiments with reference to the accompanying drawings, but since the above-described embodiments have been described only with preferred examples of the present invention, the present invention is limited to the above embodiments only. It should not be construed as being limited, and the scope of the present invention should be understood as the following claims and their equivalents.

100: adapter of handler for testing electronic components
111, 112: grip lever
GG : Information Home
OG : Control Home
120: installation frame
121: position fixing projection
122: first setting hole
130: gap control mechanism
131: operation part
R : Roller Roller
134: through hole
140: elastic member
150: support member
SH: 2nd setting hole

Claims (12)

a pair of gripping levers facing each other and configured to grip or release both ends of the electronic component by linear movement in a direction in which the distance between them is narrowed or widened;
an installation frame in which the pair of gripping levers are installed to be movable in a straight line;
a gap manipulation mechanism installed on the installation frame and configured to apply an operating force to the pair of gripping levers to move in a direction in which the distance between them is widened; and
By applying an elastic force to the pair of gripping levers in a direction in which the distance between them is narrowed, when the operating force applied to the pair of gripping levers is removed by the gap manipulating mechanism, the pair of gripping levers are spaced apart from each other. elastic members that allow movement in a narrowing direction; includes,
The elastic members function as variable elements that vary the gripping width between the pair of gripping levers according to the degree of compression, so that the pair of gripping levers can grip electronic components having various widths.
Adapter of handler for testing electronic components. The method of claim 1,
When the pair of gripping levers face each other, the electronic component moves in a direction perpendicular to the direction in which the pair of gripping levers move linearly (hereinafter referred to as 'orthogonal direction') while being electrically connected to the tester. A guide groove is formed to guide the movement of electronic components,
The guide groove is elongated in a direction perpendicular to the direction in which the pair of gripping levers move linearly (hereinafter referred to as an 'orthogonal direction'), so that the electronic component moves in the orthogonal direction along the guide groove.
Adapter of handler for testing electronic components. 3. The method of claim 2,
When the pair of gripping levers hold both ends of the electronic component, both ends of the electronic component are inserted into the guide groove, so that the guide groove also functions as a gripping groove for gripping the electronic component.
Adapter of handler for testing electronic components. 3. The method of claim 2,
The gap manipulation mechanism is installed on the installation frame to enable linear movement in the orthogonal direction,
The gap control mechanism has both ends in contact with the pair of gripping levers, and applies an operating force to the pair of gripping levers in a direction in which the distance between the pair of gripping levers is widened during forward linear movement, an operation portion provided to release the operation force; having
Adapter of handler for testing electronic components. 5. The method of claim 4,
The operation part
rolling rollers in contact with the pair of gripping levers; has,
The pair of gripping levers has a manipulation groove formed on the surface facing each other at a portion in contact with the rolling rollers,
The manipulation groove is formed to have an inclination such that the depth of the dent becomes shallower toward the forward direction.
Adapter of handler for testing electronic components. The method of claim 1,
a support member for preventing downward detachment of the electronic component seated in the supine shape when the pair of gripping levers are in a state of releasing the grip of the electronic component; further comprising
Adapter of handler for testing electronic components. 7. The method of claim 6,
The support member also functions as a limiting member for limiting the minimum distance between the pair of gripping levers.
Adapter of handler for testing electronic components. The method of claim 1,
When seated on the cradle, it has setting holes for matching with the positioning pins protruding upward from the seating surface of the cradle.
Adapter of handler for testing electronic components. 9. The method of claim 8,
Some sections of the rim of at least one specific setting hole among the setting holes are formed in the installation frame, and other partial sections are formed in the gap manipulation mechanism
Adapter of handler for testing electronic components. 10. The method of claim 9,
The gap manipulation mechanism is installed on the installation frame to enable linear movement in a direction perpendicular to the direction in which the pair of gripping levers move linearly (hereinafter referred to as 'orthogonal direction'),
The specific positioning pin corresponding to the specific setting hole is formed at a height to prevent the downward separation of the electronic component by supporting the electronic component seated in a recline when the pair of gripping levers are in a state to release the grip, ,
The gap manipulation mechanism has a through hole through which the specific positioning pin can protrude upward through the gap manipulation mechanism,
The through hole is in the form of a long long hole in the orthogonal direction, so that the interference of the specific positioning pin with respect to the linear movement of the gap manipulation mechanism is excluded,
A part of the through hole forms another section of the edge of the specific setting hole
Adapter of handler for testing electronic components. 9. The method of claim 8,
At least one setting hole among the setting holes is formed in the installation frame so that the position of the installation frame can be fixed with respect to the cradle.
Adapter of handler for testing electronic components. The method of claim 1,
The installation frame has a position fixing protrusion that is inserted into the position fixing groove on the gripping surface of the test hand when the test hand grips the installation frame, or has a position fixing groove into which the position fixing projection on the gripping surface of the test hand is inserted By doing so, the position of the installation frame can be fixed with respect to the test hand.
Adapter of handler for testing electronic components.

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