TW202217321A - Position shifter for electronic component support and operating apparatus using the same - Google Patents

Abstract

The present invention reveals a position shifter for electronic component support. The support defines a standard position by an electronic component positioned thereon. The support and the electronic component have base contacts aligned. Two sides of the electronic component and the base contact define two base lines for determining the standard position. The position shifter has a first driver for moving a first shifter to the base lines and a second driver for moving a second shifter toward the first shifter, pushing a disordered electronic component abutting against the first shifter. The electronic component is then confirmed aligning on the standard position for following operation.

Description

Positioning mechanism of the holder and the working equipment for its application

The present invention provides a position adjustment mechanism for a holder for adjusting the correct placement of electronic components to improve operation quality.

At present, an electronic component with a plurality of contacts is cut into an independent electronic component by a cutting and molding process after going through processes such as die bonding, wire bonding and sealing. However, in order to ensure the quality of electronic components, manufacturers use test equipment to perform testing operations on electronic components to eliminate defective products; please refer to FIG. The accommodating groove 121 and a plurality of probes, the accommodating groove 121 is used for accommodating electronic components, and a probe is used as the reference probe 122, and a conveyor (not shown in the figure) moves the electronic components 21 into the test seat 12. The groove 121 is placed, and the reference contact 211 of the electronic component 21 is aligned and contacted with the reference probe 122 of the test seat 12, so that the electronic component 21 can perform the electrical test operation; however, the size of the accommodating groove 121 of the test seat 12 is according to the A batch of electronic components 21 is configured according to the standard size, the first distance L1 from the side edge 212 of the electronic component 21 to the reference contact 211 should be the same as the second distance L2 from the side wall 1211 of the accommodating groove 121 to the reference probe 122 , However, in some electronic components 21 during the cutting and molding process, the size of the side 212 may be incorrectly cut, resulting in the shortening of the first distance L1 from the side 212 of the electronic component 21 to the reference contact 211 . When the electronic component 21 is moved into the test seat 12 When the accommodating groove 121 is placed, the reference contact 211 of the electronic component 21 cannot be aligned and contacted with the reference probe 122 of the test seat 12, so that the test quality is affected. , the electronic component 21 is misjudged as a defective product; especially for a precision electronic component with dozens of contacts, it is more important that the reference contacts of the precision electronic component contact the reference probe 122 of the test seat 12 accurately.

The first objective of the present invention is to provide a holder positioning mechanism, wherein the holder is used for holding electronic components, and a reference position is defined in the holding area according to the distance between the two sides of the electronic components and the reference point. , the position adjustment mechanism includes a first driver, a second driver, a first positioner and a second positioner, the first driver drives the first positioner to be at the reference position, and the second driver drives the second positioner towards the first positioner The positioner is displaced, and the electronic components are pushed against the first positioner to be positioned, so as to adjust the correct placement of the electronic components , in order to improve the quality of work.

The second object of the present invention is to provide a position adjustment mechanism for a positioner, wherein the first positioner of the position adjustment mechanism is provided with a first bearing member and a second bearing member, and the first driver is composed of the first and second driving means respectively. Do not drive the first and second bearing members of the first position adjuster to move independently. When adjusting the position, the first bearing member or the second bearing member can be changed independently according to the cutting error value of the two sides of the electronic component. The position of the components is adjusted and compensated so that the electronic components are located in the correct position, thereby improving the convenience of positioning.

The third object of the present invention is to provide a position adjustment mechanism for a holder, wherein the position adjustment mechanism is provided with a support member mounted on a machine table for assembling the first driver and the second driver, so as to facilitate the replacement of different types of holders independently, There is no need to replace the entire set of positioning mechanisms and holders, thereby saving costs and improving the convenience of replacement.

The fourth object of the present invention is to provide an operation equipment using the position adjustment mechanism of the holder, which includes a machine table, a feeding device, a material receiving device, an operation device, a position adjustment mechanism and a central control device; the feeding device is arranged on the machine table, And at least one feeding and receiving device for accommodating the electronic components to be operated is provided; the receiving device is arranged on the machine table, and at least one receiving and receiving device for accommodating the electronic components that have been processed is arranged; the working device is arranged on the machine platform, and At least one holder is provided for holding electronic components and performing preset operations on the electronic components ; At least one positioning mechanism of the present invention is used to adjust the electronic components carried by the holder to be placed in the correct position, and the central control device is used to control and integrate the actions of each device and mechanism, and perform automated operations to achieve lifting operations. Practical benefits of performance.

In order to make your examiners further understand the present invention, hereby give a preferred embodiment and cooperate with the drawings, the details are as follows:

Please refer to FIGS. 2 and 3 , the positioning mechanism 40 of the present invention is applied to a holder, and the holder can be a pedestal, a tester, a carrier, a feeder or a pre-heater, etc., to perform preset operations on electronic components ( Such as testing operations, carrying operations or moving materials, etc.); for example, a holder for the pedestal, which can simply hold electronic components; for example, a holder for a tester, which can hold and test electronic components; for example, a holder Holder for the feeder , can transfer and pick and place electronic components; the above-mentioned different types of holders are based on operation requirements, in order to hold the electronic components placed in the correct position, which is beneficial to the holder itself or the next related device to accurately perform the preset operation.

In this embodiment, the holder is a tester, and the tester includes a circuit board 31 , a reference probe 321 , a plurality of first probes 322 and a test substrate 33 , the reference probe 321 and a plurality of first probes 322 One end is electrically connected to the circuit board 31, the reference probe 321 is used as a reference piece, and the other end is used to align the reference point of the electronic component (not shown), and is used to judge whether the electronic component is correctly electrically contacted with the tester , the other ends of the plurality of first probes 322 are used to align the first contacts of the electronic components; the tester uses the probe located at the outermost side as the reference probe 321, the reference probe 321 and the plurality of first probes 322 The upper area is defined as a receiving area for accommodating electronic components. The test substrate 33 is mounted on the circuit board 31 and has through holes 331 for exposing the reference probes 321 and the first probes 322 to the outside.

The positioning mechanism 40 of the present invention includes a first driver, a second driver, a first positioner and a second positioner, and further includes at least one support member, the support member is used to mount the first driver and the second driver, and the support member can It is an independent shelf, or a part of a holder and a machine; for example, the supporting part can be a support plate, which can be mounted on the machine (not shown in the figure) for assembling the first driver and the second driver, The first driver, the second driver and the holder are separated to facilitate the replacement of the holder; for example, the support member can be the base plate of the holder for assembling the first driver and the second driver, which can facilitate the replacement of the holder The tester and the positioning mechanism 40 can be disassembled and repaired at one time; in this embodiment, the supporting component is the test substrate 33 of the tester.

The first driver is provided with at least one first driver. The first driver can be a cylinder, a linear motor, or includes a motor and a transmission group; the first driver can be positioned at a fixed point or displaced with the holder. The fixed point is arranged on the machine table (not shown in the figure), and the first positioner is carried on the holder to be positioned on the first driving tool, and the first driving tool can push the first positioner for displacement. It is assembled on the holder, and can be displaced synchronously with the holder, and drives the displacement of the first positioner. In this embodiment, the first driver includes a first driver 411 and a second driver 412. The first driver 411 is a pressure cylinder and is arranged on the test substrate 33 of the tester in the X direction. The piston rod of the first driving tool 411 is displaced along the first path A1, and the second driving tool 412 is also a pressure cylinder and is arranged in the Y direction for the test. The test substrate 33 of the device is disposed at 90 degrees to the first driving device 411, and the piston rod of the second driving device 412 is displaced along the second path A2.

The second driver is provided with at least one third driver. The third driver can be a cylinder, a linear motor, or includes a motor and a transmission group; the third driver can be positioned at a fixed point or displaced with the holder. The fixed point is arranged on the machine table, and the second positioner is carried on the holder to be positioned on the third driver, and the third driver can push the second positioner for displacement. For example, the third driver can be assembled on the holder to synchronous displacement , and drive the displacement of the second positioner; in this embodiment, the second driver is provided with a third driving tool 421, the third driving tool 421 is a pressure cylinder, and is arranged in an oblique direction (such as 45 degrees) on the tester The test substrate 33 is located away from the first driving tool 411 and the second driving tool 412. The piston rod of the third driving tool 421 is displaced along a third path A3, and the angle of the third path A3 is 45 degrees.

However, in some embodiments, if the supporting member is an independent shelf, the positioning mechanism 40 can be provided with a third driver (not shown) to drive the independent shelf to rotate at a horizontal angle, and the independent shelf is used for assembling the first driver and the second driver. The driver, the first driver and the second driver are connected to the first positioner and the second positioner respectively, so that the third driver can adjust the arrangement angle of the first positioner and the second positioner, so as to improve the use of position adjustment efficacy.

However, in some embodiments, the first driver and the second driver can also independently adjust the disposition angles of the first positioner and the second positioner, respectively.

The first positioner is provided with a first bearing member and a second bearing member, and is driven and displaced by the first driver to the reference position of the bearing member. Further, the first bearing member and the second bearing member can be respectively As independent components or connected in one. In addition, the first positioner and the first driver can be configured separately or in combination. , for example above. In addition, the reference position is a reference for placing the electronic components in the correct position. For example, the reference position is the correct position for the reference contacts of the electronic components to be aligned with the reference probes of the tester. The reference position is divided into the first quantile. (such as the Y direction) and the second quantile (such as the X direction), the first quantile and the second quantile vary according to different types and sizes of electronic components or according to the cutting error value of different sides of the electronic components, such as electronic components The error value of the first side edge of the component in the Y direction is larger, and the compensation value of the first quantile will also increase. In this embodiment, according to the distance from the first and second sides of the electronic component to the reference contact The bearing area of the tester defines the reference position including the first quantile B1 and the second quantile B2.

In this embodiment, the first positioner is provided with a first bearing member 431 and a second bearing member 432 which are two independent components. The first bearing member 431 is arranged in the Y direction, and one side is used as the first connecting surface. 4311, the first connecting surface 4311 is connected to the piston rod of the first driving tool 411 for assembling the first driver, and the other side of the first bearing member 431 is used as the first bearing surface 4312 for the first side corresponding to the electronic component Abutting, the first bearing member 431 is driven by the first driving tool 411 to move along the first path A1, so that the first bearing surface 4312 of the first bearing member 431 is located at the first position B1; the second bearing member 432 is arranged in the X direction, and one side is used as the second connecting surface 4321, the second connecting surface 4321 is connected to the piston rod of the second driving tool 412 for assembling the first driver, and the other side of the second bearing member 432 is used as the second bearing. The surface 4322 is used for the corresponding second side of the electronic component to rest, and the second bearing member 432 is driven by the second driving tool 412 to move along the second path A2, so that the second bearing member 432 can abut the second bearing member 432. The surface 4322 is located at the second sub-position B2. Therefore, the positioning mechanism 40 uses the first bearing member 431 and the second bearing member 432 as two adjustable side walls of the tester.

The second positioner is provided with a first pusher and a second pusher, and is driven by the second driver to move toward the first positioner, so as to push the electronic components against the first positioner to be positioned, and then adjust the electronic components placed in the correct position; further, the first push piece and the second push piece can be separate components or connected as a whole. In addition, the second positioner and the second driver can be configured in a separate configuration or in a combined configuration, such as the above.

In this embodiment, the second position adjuster includes a first push piece 441 and a second push piece 442. The first push piece 441 and the second push piece 442 are integrally formed. The first push piece 441 is arranged in the Y direction and is opposite to In the first bearing member 431, the first pushing member 441 uses a face opposite to the first bearing surface 4312 as the first pushing surface 4411 for attaching the corresponding third side of the electronic component; the second pushing member 442 is arranged in the X direction, and relative to the second bearing member 432, the second pushing member 442 uses a surface opposite to the second bearing surface 4322 as the second pushing surface 4421 for attaching the corresponding first part of the electronic component. On the four sides, the connecting portion 443 where the first pushing piece 441 and the second pushing piece 442 are connected is assembled to the piston rod of the third driving tool 421 , and the third driving tool 421 drives the first pushing of the second positioner The piece 441 and the second push piece 442 are synchronously displaced in an oblique direction along the third path A3. Therefore, the positioning mechanism 40 uses the first push piece 441 and the second push piece 442 as the other two adjustable side walls of the tester.

Please refer to FIGS. 2 and 4 , the holder in this embodiment is a tester, and the tester is fixedly assembled on the machine table 50 by the test substrate 33 , so that the first bearing member 431 , the second bearing member 432 , the first pushing member The component 441 , the second pusher 442 , the reference probe 321 and the plurality of first probes 322 are located in the hollow hole 501 of the machine table 50 , and the feeder 51 transfers the electronic components 52 to the top of the tester. A reference contact 521 and a plurality of first contacts 522 are provided. However, depending on the test operation requirements, the electronic component 52 can be imaged by a detector (not shown in the figure) before being placed in the tester to identify the electronic component. The distances from the first side 523 and the second side of 52 to the reference contact 521 are analyzed, and the cut loss error value and the compensation value are analyzed to define the first quantile B1 and the second quantile B2 of the reference position.

Referring to FIG. 5 , the positioning mechanism 40 drives the first bearing member 431 to displace along the first path A1 by the first driving tool 411 , so that the first bearing surface 4312 of the first bearing member 431 is located at the first position B1 , That is, the distance from the first bearing surface 4312 of the first bearing member 431 to the reference probe 321 is the distance from the first side of the electronic component to the reference point; the second driving tool 412 drives the second bearing member 432 along the The second path A2 is displaced so that the second bearing surface 4322 of the second bearing member 432 is located at the second position B2, that is, the distance from the second bearing surface 4322 of the second bearing member 432 to the reference probe 321 is The distance from the second side of the electronic component to the reference point.

Please refer to FIGS. 6 and 7 , the feeder places the electronic component 52 on the reference probe 321 and the plurality of first probes 322 of the tester, and is located in the receiving area, so that the electronic component 52 is located on the first bearing member 431 , between the second bearing member 432 , the first pushing member 441 and the second pushing member 442 , the first side edge 523 of the electronic component 52 is opposite to the first bearing surface 4312 of the first bearing member 431 , and the second The side 524 is opposite to the second bearing surface 4322 of the second bearing member 432 , the third side 525 is opposite to the first pushing surface 4411 of the first pushing member 441 , and the fourth side 526 is opposite to the second The second pushing surface 4421 of the pusher 442; since the reference contact 521 of the electronic component 52 is not aligned with the reference probe 321 of the tester, the third driver 421 drives the first pusher 441 and the second pusher 442 The oblique synchronous displacement along the third path A3, the first pushing surface 4411 of the first pushing piece 441 and the second pushing surface 4421 of the second pushing piece 442 are respectively attached to the third side 525 and the first pushing surface of the electronic component 52. The four side edges 526 are pushed, and the electronic component 52 is pushed, so that the first side edge 523 of the electronic component 52 abuts against the first bearing surface 4312 of the first bearing member 431, and the second side edge 524 abuts against the second side edge 524. The second bearing surface 4322 of the bearing member 432 adjusts and places the electronic component 52 in the correct position, so that the reference contact 521 of the electronic component 52 is accurately aligned and electrically contacts the reference probe 321 of the tester, thereby improving the test quality .

However, in some embodiments, if the first driver has a first driver and the second driver has a third driver, the first driver and the third driver can be arranged diagonally, so that the first driver and the third driver can be arranged diagonally. It is also possible for the three driving tools to drive the first positioner and the second positioner respectively for diagonal path displacement.

Please refer to FIG. 8 , the second embodiment of the positioning mechanism 40 of the present invention is substantially the same in structure or similar to the first embodiment. The difference between the second embodiment and the first embodiment lies in the first bearing of the first positioner. The component 431 and the second bearing component 432 are connected as a whole, and are assembled to a first driving tool 411 in an oblique configuration. , the first driving tool 411 and the third driving tool 421 can be arranged diagonally, so that the first driving tool 411 drives the first bearing member 431 and the second bearing member 432 to move obliquely to the reference position synchronously, and the third driving tool 421 drives the first push piece 441 and the second push piece 442 to move obliquely synchronously, and pushes the electronic components against the first abutting piece 431 and the second abutting piece 432, so that the electronic components are adjusted and placed in the correct position .

Please refer to FIG. 9 , the third embodiment of the positioning mechanism 40 of the present invention is substantially the same in structure or similar to the first embodiment. The difference between the third embodiment and the first embodiment is that the positioning mechanism 40 is provided with an independent and one The support member of the support plate 45, the support plate 45 is mounted on the machine table 50 and is used for assembling the first driver and the second driver. In this embodiment, the support plate 45 is used for assembling the first driver 411, the second driver 412 and the The third driving tool 421 makes the first bearing member 431, the second bearing member 432, the first pushing member 441 and the second pushing member 442 located in the bearing area of the tester. When replacing different types of testers, there is no need to The entire set of positioning mechanisms 40 needs to be replaced, and the tester can be replaced individually, thereby saving costs and improving the convenience of replacement.

Please refer to FIGS. 2, 3, and 10, an operation equipment using the positioning mechanism of the holder, including a machine 50, a feeding device 60, a receiving device 70, the positioning mechanism 40 of the present invention, a working device and a central control device ( The feeding device 60 is assembled on the machine table 50, and is provided with at least one feeding holder 61 to accommodate at least one electronic component to be operated; the receiving device 70 is assembled on the machine table 50, and is provided with There is at least one receiving container 71 for accommodating at least one electronic component that has been processed; the working device is assembled on the machine table 50 and is provided with at least one container for receiving the electronic component and performing presetting on the electronic component. design work; in this example , the operating device is the testing device 80, which uses a first holder as the first feeder 81 to take out the electronic components to be tested from the feed holder 61 of the feeding device 60, and transfer them to a feeder The second holder of the material carrier 82 , the feeding stage 82 carries the electronic components to be tested to the side of a third holder which is a tester. The tester includes a circuit board 31 , a reference probe 321 , a plurality of first probes 322 and a test substrate 33; At least one positioning mechanism 40 of the present invention is used to adjust the electronic components supported by the holder to be placed in the correct position. In this embodiment, the positioning mechanism 40 is arranged on the test substrate 33 of the tester, and the test device 80 A fourth holder, which is the second feeder 83, is used to take out the electronic components to be tested from the feeding stage 82, and transfer them to the holding area of the tester, for the positioning mechanism 40 to adjust the electronic components. Put it in the correct position, so that the reference point of the electronic component is precisely aligned with the reference probe 321 of the tester to perform the test operation. Five holders, the discharging stage 84 carries out the tested electronic components, and the testing device 80 uses a sixth holder which is the third feeder 85 to take out the tested electronic components from the discharging stage 84, and According to the test results, the tested electronic components are sent to the receiving device 71 of the receiving device 70 for classification and storage; the central control device is used to control and integrate the actions of each device to perform automatic operations and achieve lifting operations. Practical benefits of performance.

[acquaintance] 11: circuit board 12: Test seat 121: accommodating slot 1211: Sidewall 122: Reference Probe 21: Electronic Components 211: Reference contact 212: Side L1: first pitch L2: Second spacing [this invention] 31: circuit board 321: Benchmark Probe 322: First Probe 33: Test substrate 331: Through hole 40: Positioning mechanism 411: First drive 412: Second drive 421: Third drive 431: The first bearing 4311: First connection surface 4312: The first bearing surface 432: Second bearing 4321: Second connection surface 4322: Second bearing surface 441: First Push Piece 4411: The first push surface 442: Second push piece 4421: Second push surface 443: Connector 45: Support plate A1: The first path A2: Second path A3: Third Path B1: first quantile B2: Second quantile 50: Machine 501: Hollow Hole 51: Feeder 52: Electronic Components 521: Reference contact 522: First Contact 523: First side 524: Second side 525: Third side 526: Fourth side 60: Feeding device 61: Feed holder 70: Receiving device 71: Receiving holder 80: Test device 81: First mover 82: Feeding platform 83: Second mover 84: discharge stage 85: Third mover

Figure 1: A schematic diagram of the use of a conventional test device. FIG. 2 is a top view of the first embodiment of the holder and the positioning mechanism of the present invention. FIG. 3 is a cross-sectional view of the assembly of the first embodiment of the holder and the positioning mechanism of the present invention. FIG. 4 is a schematic diagram of the application of the first embodiment of the position adjusting mechanism of the present invention to a testing device. Figure 5: Schematic diagram (1) of the use of the positioning mechanism of the present invention. Figure 6: Schematic diagram (2) of the use of the positioning mechanism of the present invention. Figure 7: Schematic diagram (3) of the use of the positioning mechanism of the present invention. FIG. 8 is a schematic diagram of the second embodiment of the positioning mechanism of the present invention. FIG. 9 is a schematic diagram of the third embodiment of the positioning mechanism of the present invention. Fig. 10: The configuration diagram of the first embodiment of the position adjusting mechanism of the present invention applied to the working equipment.

321: Benchmark Probe

421: Third drive

431: The first bearing

4312: The first bearing surface

432: Second bearing

4322: Second bearing surface

441: First Push Piece

4411: The first push surface

442: Second push piece

4421: Second push surface

A3: Third Path

52: Electronic Components

521: Reference contact

523: First side

524: Second side

525: Third side

526: Fourth side

Claims (10)

A position adjusting mechanism for a holder, the holder is used for holding electronic components, and a reference position is defined in the holding area, and the position adjusting mechanism comprises: The first driver: it is provided with at least one first driver; Second drive: it is provided with at least one third drive; The first positioner: it is provided with a first bearing member and a second bearing member for the first driver drive the displacement to the reference position of the holder; Second positioner: it is provided with a first push piece and a second push piece for the second driver The drive is displaced toward the first positioner to push the electronic component to be positioned against the first positioner. The position-adjusting mechanism of the holder according to claim 1, the first driver of the position-adjusting mechanism Including the first driving tool and the second driving tool, the first driving tool is used for driving the first bearing The member is displaced along the first path, and the second driving means is used to drive the second bearing member along the second path displacement. The positioning mechanism of the holder according to claim 2, wherein one surface of the first bearing member of the positioning mechanism is a first connecting surface, the first connecting surface is connected to assemble the first driving tool, the first The other side of the bearing member is a first bearing surface for the corresponding first side of the electronic component to rest on, and one side of the second bearing member serves as a second connecting surface, and the second connecting surface connects and assembles the first side. Two driving means, the other side of the second bearing member is a second bearing surface for the second side corresponding to the electronic component to rest. According to the positioning mechanism of the holder according to claim 1, one surface of the first pushing member of the positioning mechanism is a first pushing surface for attaching the corresponding third side of the electronic component, and the first One surface of the two push pieces is used as the second push surface for attaching to the corresponding fourth side of the electronic component. The receptacle adjusting mechanism according to any one of claims 1 to 4, wherein the adjusting mechanism further includes At least one supporting member is included, and the supporting member is used to mount the first driver and the second driver device. The positioning mechanism of the holder according to claim 5, wherein the supporting member is an independent shelf, so as to It is mounted on the machine table and is used for assembling the first driver and the second driver. The receptacle adjusting mechanism according to claim 5, wherein the supporting member is the receptacle or the machine A part of the stage for assembling the first driver and the second driver. According to the positioning mechanism of the holder according to claim 5, the supporting member is an independent shelf plate, and a third driver is arranged to drive the independent shelf plate to rotate at a horizontal angle. The receptacle adjusting mechanism according to any one of claims 1 to 4, wherein the receptacle is a tester, and the tester comprises an electrically connected circuit board, a reference probe and a plurality of first probes , the area above the reference probe and the plurality of first probes is defined as the receiving area, and the holder defines the reference in the receiving area according to the distance from the two sides of the electronic component to the reference contact Location. A working equipment using a position adjusting mechanism of a holder, comprising: Machine; Feeding device: It is arranged on the machine and has at least one supply for accommodating the electronic components to be operated. material holder; Receiving device: It is arranged on the machine and has at least one receiving device for accommodating the electronic components that have been processed. material holder; Operating device: It is arranged on the machine and has at least one holder for holding electronic components. components, and perform preset operations on electronic components; At least one setter adjustment mechanism as described in claim 1 for adjusting the electronics of the setter the placement of the components; Central control device: for controlling and integrating the actions of various devices and mechanisms.

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