TWI745136B - Position shifter for electronic component support and operating apparatus using the same - Google Patents

Abstract

The present invention reveals a position shifter for electronic component support. The support defines a standard position by an electronic component positioned thereon. The support and the electronic component have base contacts aligned. Two sides of the electronic component and the base contact define two base lines for determining the standard position. The position shifter has a first driver for moving a first shifter to the base lines and a second driver for moving a second shifter toward the first shifter, pushing a disordered electronic component abutting against the first shifter. The electronic component is then confirmed aligning on the standard position for following operation.

Description

Supporter positioning mechanism and its operating equipment

The present invention provides a holder positioning mechanism for adjusting the correct placement of electronic components to improve the quality of work.

Nowadays, an electronic component with multiple contacts is cut into an independent electronic component by a cutting molding process after undergoing processes such as die bonding, wire bonding, and sealing. However, in order to ensure the quality of electronic components, manufacturers use test devices to perform testing operations on electronic components to eliminate defective products. Please refer to Figure 1. A accommodating groove 121 and a plurality of probes. The accommodating groove 121 is for accommodating electronic components, and a probe is used as a reference probe 122. A conveyor (not shown) moves the electronic component 21 into the container of the test base 12 Place the slot 121, and align the reference contact 211 of the electronic component 21 with the reference probe 122 of the test base 12, so that the electronic component 21 performs the electrical test operation; however, the size of the receiving slot 121 of the test base 12 is in accordance with A batch of electronic components 21 are configured according to the standard size. The first distance L1 from the side 212 of the electronic component 21 to the reference contact 211 should be the same as the second distance L2 from the side wall 1211 of the accommodating groove 121 to the reference probe 122. However, in some electronic components 21 during the cutting and forming process, the size of the side 212 is mistakenly cut, which causes the first distance L1 from the side 212 of the electronic component 21 to the reference contact 211 to be shortened. When the electronic component 21 is moved into the test base 12 When the accommodating slot 121 of the electronic component 21 cannot be aligned with the reference probe 122 of the test base 12, it will happen that the test quality is affected. , The electronic component 21 is misjudged as a defective product; especially for a precision electronic component with dozens of contacts, the accuracy of the reference contact of the precision electronic component to the reference probe 122 of the test base 12 is more important.

The first object of the present invention is to provide a holder position adjustment mechanism. The holder is used for holding electronic components, and the reference position is defined in the holding area according to the distance between the two sides of the electronic component and the reference contact point. The positioning mechanism includes a first driver, a second driver, a first positioner and a second positioner. The first driver drives the first positioner to the reference position, and the second driver drives the second positioner toward the first positioner. The positioner is displaced and the electronic component is pushed to be positioned against the first positioner, so as to adjust the correct placement of the electronic component to improve the quality of work.

The second object of the present invention is to provide a holder position adjustment mechanism, the first position adjustment mechanism of the position adjustment mechanism is provided with a first bearing member and a second bearing member, and the first driver uses the first and second driving tools. Do not drive the first and second bearing members of the first positioner to move independently. During the adjustment, the first bearing member or the second bearing member can be changed separately according to the cutting error value of the two sides of the electronic component. The position of the parts is adjusted and compensated so that the electronic components are in the correct position, thereby improving the convenience of adjustment.

The third objective of the present invention is to provide a holder position adjustment mechanism, the position adjustment mechanism is provided with a supporting part mounted on the machine table, and is used for assembling the first driver and the second driver, so as to facilitate the independent replacement of different types of holders. There is no need to replace the entire set of adjustment mechanisms and holders, thereby saving costs and improving the convenience of replacement.

The fourth object of the present invention is to provide a working equipment using a holder positioning mechanism, which includes a machine, a feeding device, a receiving device, a working device, a positioning mechanism and a central control device; the feeding device is arranged on the machine, And is equipped with at least one feeding holder for holding the electronic components to be operated; the receiving device is equipped with It is placed in the machine and is provided with at least one receiving holder for accommodating electronic components that have been operated; the working device is configured on the machine and is provided with at least one holder for holding and performing electronic components Preset operation; at least one position adjustment mechanism of the present invention is used to adjust the electronic components held by the holder to be placed in the correct position, and the central control device is used to control and integrate the actions of various devices and mechanisms to perform automated operations, Achieve the practical benefits of improving operational efficiency.

[Learning]

11: circuit board

12: Test seat

121: accommodating slot

1211: sidewall

122: Reference Probe

21: Electronic components

211: Reference contact

212: side

L1: first pitch

L2: second spacing

[this invention]

31: circuit board

321: Reference Probe

322: First Probe

33: Test the substrate

331: Through Hole

40: Position adjustment mechanism

411: First Drive

412: Second Drive

421: Third Drive

431: The first contract

4311: The first connection surface

4312: The first bearing surface

432: The second deductible

4321: second connection surface

4322: second bearing surface

441: The first move

4411: The first pushing surface

442: The second move

4421: The second pushing surface

443: Connection

45: support plate

A1: The first path

A2: Second path

A3: The third path

B1: First quintile

B2: second quintile

50: machine

501: hollow hole

51: Shifter

52: electronic components

521: Reference contact

522: first contact

523: first side

524: second side

525: third side

526: fourth side

60: Feeding device

61: Feeder

70: Receiving device

71: Receiving Holder

80: test device

81: The first shifter

82: Feeding stage

83: Second shifter

84: discharge stage

85: The third shifter

Figure 1: Schematic diagram of the use of the conventional testing device.

Figure 2: The top view of the first embodiment of the holder and the position adjustment mechanism of the present invention.

Figure 3: An assembled cross-sectional view of the first embodiment of the holder and the position adjustment mechanism of the present invention.

Figure 4: A schematic diagram of the first embodiment of the position adjustment mechanism of the present invention applied to a testing device.

Figure 5: Schematic diagram of the use of the position adjustment mechanism of the present invention (1).

Figure 6: Schematic diagram of the use of the position adjustment mechanism of the present invention (2).

Figure 7: Schematic diagram of the use of the position adjustment mechanism of the present invention (3).

Fig. 8: A schematic diagram of the second embodiment of the position adjustment mechanism of the present invention.

Figure 9: A schematic diagram of the third embodiment of the position adjustment mechanism of the present invention.

Figure 10: The first embodiment of the position adjustment mechanism of the present invention is applied to the configuration diagram of the working equipment.

In order to enable your reviewer to have a better understanding of the present invention, here is a preferred embodiment combined with the drawings. The details are as follows: Please refer to Figures 2 and 3, the position adjustment mechanism 40 of the present invention is applied to the holder, The device can be a pedestal, a tester, a stage, a material shifter or a pre-warmer, etc., to perform preset operations on electronic components (such as test operations). For example, a holder for a pedestal, which can simply hold electronic components; for example, a holder for a tester, which can hold and test electronic components; The holder of the material container can transfer and load electronic components; the aforementioned different types of holders can be placed in the correct position according to the operation requirements, and facilitate the accurate execution of the holder itself or the next related device Preset job.

In this embodiment, the holder is a tester, and the tester includes a circuit board 31, a reference probe 321, a plurality of first probes 322 and a test substrate 33, a reference probe 321 and a plurality of first probes 322 One end is electrically connected to the circuit board 31, the reference probe 321 is used as a reference component, and the other end is used to align the reference contacts of the electronic components (not shown) to determine whether the electronic components are electrically contacting the tester correctly , The other end of the plurality of first probes 322 is used to align the first contact of the electronic component; the tester uses the outermost probe as the reference probe 321, the reference probe 321 and the plurality of first probes 322 The upper area is defined as a receiving area for accommodating electronic components. The test substrate 33 is assembled on the circuit board 31, and a through hole 331 is opened for the reference probe 321 and the plurality of first probes 322 to be exposed.

The position adjustment mechanism 40 of the present invention includes a first driver, a second driver, a first positioner, and a second positioner, and further includes at least one support member for mounting the first driver and the second driver. The support member can be It is an independent shelf or a component of a holder or a machine table; for example, the supporting part can be a support plate to be placed on the machine table (not shown in the figure) for assembling the first driver and the second driver, Separate the first driver, the second driver and the holder to facilitate separate replacement of the holder; for example, the supporting member can be the substrate of the holder for assembling the first driver and the second driver, which can facilitate the placement of the holder. The device and the adjustment mechanism 40 are disassembled and repaired at one time; in this embodiment, the supporting member is the test substrate 33 of the tester.

The first driver is provided with at least one first driving device. The first driving device can be a cylinder, a linear motor, or a motor and a transmission group; the first driving device can be configured at a fixed point or can be displaced with the holder, for example, the first driving device can be The fixed point is arranged on the machine (not shown in the figure), and the first positioner is placed on the first drive on the carrier. The moving tool, the first driving tool can push the first positioner to move. For example, the first driving tool can be assembled to the holder, and can move synchronously with the holder, and drive the first positioner to move; In an embodiment, the first driver includes a first driver 411 and a second driver 412. The first driver 411 is a pressure cylinder and is arranged on the test substrate 33 of the tester in the X direction. The piston rod of the first driver 411 is The first path A1 is displaced, and the second driving device 412 is also a cylinder, and is arranged on the test substrate 33 of the tester in the Y direction, and is arranged at 90 degrees with the first driving device 411. The piston rod of the second driving device 412 is along the The second path A2 is displaced.

The second driver and the first driver are independent of each other and are provided with at least one third driver. The third driver can be a cylinder, a linear motor, or include a motor and a transmission group; the third driver can be configured at a fixed point or accompanied by a carrier Displacement, for example, the third driving device can be fixedly arranged on the machine table, and the second positioner is placed on the third driving device on the carrier, and the third driving device can push the second positioner to move, for example, the third driving device The tool can be assembled on the holder for synchronous displacement, and drives the second positioner to move, so that the first driver and the second driver independently drive the first and second positioners to move; in this embodiment , The second driver is provided with a third driver 421, the third driver 421 is a cylinder, and is arranged on the test substrate 33 of the tester in an oblique direction (such as 45 degrees), and is located away from the first driver 411 and the first driver 411 At the position of the second driving device 412, the piston rod of the third driving device 421 is displaced along the third path A3, and the angle of the third path A3 is 45 degrees.

However, in some embodiments, if the supporting member is an independent frame, the adjustment mechanism 40 may be provided with a third driver (not shown) to drive the independent frame to rotate at a horizontal angle. The independent frame is provided for assembling the first driver and the second The first driver and the second driver are respectively connected to the first positioner and the second positioner, so that the third driver can adjust the configuration angle of the first positioner and the second positioner to improve the use of position adjustment efficacy.

However, in some embodiments, the first driver and the second driver can also independently adjust the arrangement angles of the first positioner and the second positioner.

The first position adjuster is provided with a first bearing member and a second bearing member, and is driven by the first driver to move to the reference position of the bearing device. Furthermore, the first bearing member and the second bearing member can be separately It is an independent component or connected in a whole. In addition, the first position adjuster and the first driver may adopt a separate configuration or a combined connection configuration, such as the above. In addition, the reference position is a reference that allows the electronic components to be placed in the correct position. For example, the reference position is the correct position that enables the reference contact of the electronic component to align with the reference probe of the tester. The reference position is divided into the first position. (Such as the Y direction) and the second quantile (such as the X direction), the first quantile and the second quantile vary according to different types and sizes of electronic components or according to the cutting loss error values of different sides of the electronic components, such as electronic The first side edge cutting loss error value of the component Y direction is larger, and the compensation value of the first digit will also increase; in this embodiment, according to the distance between the first and second side edges of the electronic component and the reference contact The tester's bearing area defines the reference position including the first quantile B1 and the second quantile B2.

In this embodiment, the first position adjuster is provided with a first supporting member 431 and a second supporting member 432 that are two independent components. The first supporting member 431 is arranged in the Y direction, and one side is used as the first connecting surface. 4311. The first connecting surface 4311 is connected to the piston rod of the first driving device 411 of the first driver. The other surface of the first supporting member 431 serves as the first supporting surface 4312 for the corresponding first side of the electronic component When resting, the first bearing member 431 is driven by the first driving device 411 to move along the first path A1, so that the first bearing surface 4312 of the first bearing member 431 is located at the first position B1; the second bearing member 432 is arranged in the X direction, and one side is used as the second connecting surface 4321, the second connecting surface 4321 is connected to the piston rod of the second driving device 412 of the first driver, and the other side of the second bearing member 432 is used as the second bearing The surface 4322 is provided for the second side of the electronic component to be pressed against. The second bearing member 432 is driven by the second driving device 412 to move along the second path A2, so that the second bearing member 432 is pressed against The surface 4322 is located at the second position B2. Therefore, the position adjustment mechanism 40 uses the first bearing 431 and the second bearing 432 as the adjustable two side walls of the tester.

The second positioner is provided with a first pusher and a second pusher, and is driven by the second driver to move toward the first positioner, so as to push the electronic component against the first driver to move to the support The first positioner of the reference position of the device is positioned to adjust the electronic components to be placed in the correct position; further, the first pusher and the second pusher can be separate components or connected together. In addition, the second positioner and the second driver can be configured in a separate configuration or a combined connection configuration, such as the above.

In this embodiment, the second position adjuster includes a first pusher 441 and a second pusher 442. The first pusher 441 and the second pusher 442 are integrally formed. The first pusher 441 is arranged in the Y direction and is opposite to each other. On the first supporting member 431, the first pushing member 441 has a surface opposite to the first supporting surface 4312 as the first pushing surface 4411 for attaching the third side corresponding to the electronic component; the second pushing member 442 is arranged in the X direction, and relative to the second bearing member 432, the second pushing member 442 has a surface opposite to the second bearing surface 4322 as the second pushing surface 4421 for attaching the corresponding first electronic component On the four sides, the connecting portion 443 where the first pushing member 441 and the second pushing member 442 are connected is assembled to the piston rod of the third driving device 421, and the third driving device 421 drives the first pushing of the second positioner The member 441 and the second pushing member 442 move obliquely and synchronously along the third path A3. Therefore, the adjustment mechanism 40 uses the first pushing member 441 and the second pushing member 442 as the adjustable other two side walls of the tester.

Please refer to Figures 2 and 4, the holder in this embodiment is a tester, and the tester is fixedly assembled on the machine table 50 with the test substrate 33, so that the first bearing member 431, the second bearing member 432, and the first moving The part 441, the second moving part 442, the reference probe 321, and the plurality of first probes 322 are located in the hollow hole 501 of the machine 50. The transfer device 51 transfers the electronic component 52 to the top of the tester. A reference contact 521 and a plurality of first contacts 522 are provided. However, according to the requirements of the test operation, the electronic component 52 can be taken through a detector (not shown) to identify the electronic component before being placed in the tester. 52 of the first side 523 and the second side to The distance of the reference contact 521 is analyzed and the cutting loss error value and compensation value are analyzed to define the first quantile B1 and the second quantile B2 of the reference position.

Referring to FIG. 5, the position adjusting mechanism 40 drives the first bearing member 431 to move along the first path A1 with the first driving device 411, so that the first bearing surface 4312 of the first bearing member 431 is located at the first position B1. That is, the distance between the first bearing surface 4312 of the first bearing member 431 and the reference probe 321 is the distance from the first side of the electronic component to the reference contact; the second driving device 412 drives the second bearing member 432 along The second path A2 is displaced so that the second bearing surface 4322 of the second bearing member 432 is located at the second position B2, that is, the distance from the second bearing surface 4322 of the second bearing member 432 to the reference probe 321 is The distance from the second side of the electronic component to the reference contact.

Please refer to Figures 6 and 7, the material shifter places the electronic component 52 on the reference probe 321 and the plurality of first probes 322 of the tester, and is located in the receiving area, so that the electronic component 52 is located on the first bearing member 431, the second bearing member 432, the first pushing member 441 and the second pushing member 442, the first side 523 of the electronic component 52 is opposite to the first bearing surface 4312 of the first bearing member 431, and the first bearing surface 4312 The two side edges 524 are opposite to the second bearing surface 4322 of the second bearing member 432, the third side edge 525 is opposite to the first pushing surface 4411 of the first pushing member 441, and the fourth side edge 526 is opposite to the first pushing surface 4411. The second pushing surface 4421 of the two pusher 442; since the reference contact 521 of the electronic component 52 is not aligned with the reference probe 321 of the tester, the third driving device 421 drives the first pusher 441 and the second pusher 442 moves diagonally and synchronously along the third path A3. The first pushing surface 4411 of the first pusher 441 and the second pushing surface 4421 of the second pusher 442 are attached to the third side 525 and the third side of the electronic component 52, respectively. The fourth side 526, and the electronic component 52 is pushed so that the first side 523 of the electronic component 52 abuts against the first bearing surface 4312 of the first bearing member 431, and the second side 524 abuts against the first bearing surface 4312 The second bearing surface 4322 of the two bearing members 432 adjusts the electronic component 52 to the correct position so that the reference contact 521 of the electronic component 52 is accurately aligned with the reference probe 321 of the electrical contact tester, thereby improving the test quality.

However, in some embodiments, if the first driver has a first driver and the second driver has a third driver, the first driver and the third driver can be arranged diagonally so that the first driver and the second driver The three driving devices respectively drive the first positioner and the second positioner to make a diagonal path displacement.

Please refer to FIG. 8, the second embodiment of the position adjustment mechanism 40 of the present invention is roughly the same as or similar to the first embodiment in structure. The difference between the second embodiment and the first embodiment lies in the first bearing of the first positioner The member 431 and the second bearing member 432 are connected as a whole, and are assembled in a first driving device 411 in an oblique configuration. The first driving device 411 and the third driving device 421 can be arranged diagonally, so that the first driving device 411 Drives the first bearing member 431 and the second bearing member 432 to synchronously move obliquely to the reference position, and the third driving device 421 drives the first moving member 441 and the second moving member 442 to synchronously move obliquely, and push the electronic components Leaning against the first abutting member 431 and the second abutting member 432, the electronic component is adjusted to the correct position.

Please refer to FIG. 9, the third embodiment of the position adjustment mechanism 40 of the present invention is roughly the same as or similar to the first embodiment in structure. The difference between the third embodiment and the first embodiment is that the position adjustment mechanism 40 is provided with an independent and one The supporting part of the supporting plate 45, the supporting plate 45 is mounted on the machine table 50, and is used to assemble the first driver and the second driver. In this embodiment, the supporting plate 45 is used to assemble the first driving device 411, the second driving device 412, and The third driving device 421 enables the first bearing member 431, the second bearing member 432, the first pushing member 441 and the second pushing member 442 to be located in the bearing area of the tester. When changing different types of testers, there is no need to The entire set of adjustment mechanisms 40 need to be replaced, and the tester can be replaced separately, thereby saving costs and improving the convenience of replacement.

Please refer to Figures 2, 3, and 10, an operating equipment using a holder positioning mechanism, including a machine 50, a feeding device 60, a receiving device 70, a positioning mechanism 40 of the present invention, a working device, and a central control device ( Figure not shown); the feeding device 60 is assembled on the machine 50, and is provided with at least one feeding holder 61 to accommodate at least one electronic component to be operated; the receiving device 70 is assembled on the machine 50, and is provided Have at least one receipt The holder 71 is used to hold at least one electronic component that has been operated; the working device is assembled on the machine 50 and is provided with at least one holder for holding the electronic component and performing preset operations on the electronic component; In the embodiment, the working device is a testing device 80, which uses a first holder as the first shifter 81 to take out the electronic component to be tested from the feeding holder 61 of the feeding device 60 and transfer it to a It is the second holder of the feeding stage 82. The feeding stage 82 carries the electronic components to be tested to the side of the third holder, which is a tester. The tester includes a circuit board 31 and a reference probe. 321. A plurality of first probes 322 and a test substrate 33; at least one positioning mechanism 40 of the present invention for adjusting the electronic components held by the holder to be placed in the correct position. In this embodiment, the positioning mechanism 40 Disposed on the test substrate 33 of the tester, the test device 80 uses a fourth carrier, which is the second shifter 83, to take out the electronic components to be tested from the loading stage 82 and transfer them to the tester's receiving area , For the adjustment mechanism 40 to adjust the electronic components to the correct position, so that the reference contacts of the electronic components are precisely aligned with the reference probes 321 of the tester to perform the test operation, and the second shifter 83 will test the electronic components Transfer to a fifth carrier of the discharging stage 84, the discharging carrier 84 carries the tested electronic components, and the testing device 80 uses a sixth carrier of the third displacer 85 to exit The material carrier 84 takes out the tested electronic components, and according to the test results, transports the tested electronic components to the receiving carrier 71 of the receiving device 70 for sorting and storing; the central control device is used for control and integration Each device is activated to perform automated operations to achieve the practical benefits of enhancing operational efficiency.

321: Reference Probe

421: Third Drive

431: The first deductible

4312: The first bearing surface

432: The second deductible

4322: second bearing surface

441: The first move

4411: The first pushing surface

442: The second move

4421: The second pushing surface

A3: The third path

52: electronic components

521: Reference contact

523: first side

524: second side

525: third side

526: fourth side

Claims (10)

A position adjustment mechanism for a holder for holding an electronic component and defining a reference position in the holding area. The adjustment mechanism includes: a first driver: at least one first driving device is provided; Second driver: it is provided with at least one third driving device; first positioner: it is provided with a first bearing member and a second bearing member for the first driver to drive displacement to the datum of the holder Position; the second positioner: it is provided with a first pusher and a second pusher for the second driver to drive toward the first positioner to move the electronic component against the first The driver drives the first positioner shifted to the reference position of the holder for positioning, wherein the first driver and the second driver are independent of each other and independently drive the first positioner and the second positioner, respectively Position adjuster displacement. According to claim 1, the first driver of the position adjustment mechanism includes the first driving device and the second driving device, and the first driving device is used to drive the first bearing member. The first path is displaced, and the second driving device is used to drive the second bearing member to be displaced along the second path. According to claim 2, the position adjustment mechanism of the holder, one surface of the first bearing member of the adjustment mechanism is a first connecting surface, and the first connecting surface is connected to assemble the first driving device, and the first The other side of the supporting member is the first supporting surface for the corresponding first side of the electronic component to be abutted, one side of the second supporting member is used as the second connecting surface, and the second connecting surface is connected to assemble the For the second driving device, the other surface of the second bearing member is a second bearing surface for the corresponding second side of the electronic component to be abutted. According to claim 1, the position adjustment mechanism of the holder, one surface of the first pusher of the position adjustment mechanism is the first pushing surface for attaching the third side corresponding to the electronic component, the One surface of the second pushing member serves as a second pushing surface for attaching to the corresponding fourth side of the electronic component. According to the position adjustment mechanism of the holder according to any one of claims 1 to 4, the position adjustment mechanism further includes at least one support member for mounting the first driver and the second driver. According to the position adjustment mechanism of claim 5, the supporting member is an independent frame plate, which is mounted on a machine platform and is used for assembling the first driver and the second driver. According to claim 5 of the susceptor positioning mechanism, the supporting member is a component of the susceptor or the machine for assembling the first driver and the second driver. According to claim 5 of the position adjustment mechanism for the holder, the supporting member is an independent frame plate, and a third driver is provided to drive the independent frame plate to rotate at a horizontal angle. The susceptor position adjustment mechanism according to any one of claims 1 to 4, wherein the susceptor is a tester, and the tester includes an electrically connected circuit board, a reference probe, and a plurality of first probes The area above the reference probe and the plurality of first probes is defined as the holding area, and the holding device defines the holding area in the holding area according to the distance from the two sides of the electronic component to the reference contact. Reference position. An operation equipment using a position adjustment mechanism for a holder, comprising: a machine; a feeding device: arranged on the machine, and provided with at least one feeding holder for holding electronic components to be operated; and a receiving device: arranged on the machine The machine is equipped with at least one receiver for accommodating electronic components Material holder; working device: configured on the machine, and provided with at least one holder for holding an electronic component and performing preset operations on the electronic component; at least as described in claim 1 Holder adjustment mechanism for adjusting the placement position of the electronic component of the holder; central control device: for controlling and integrating the actions of various devices and mechanisms.

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