TWI745136B - Position shifter for electronic component support and operating apparatus using the same - Google Patents
Position shifter for electronic component support and operating apparatus using the same Download PDFInfo
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- TWI745136B TWI745136B TW109137303A TW109137303A TWI745136B TW I745136 B TWI745136 B TW I745136B TW 109137303 A TW109137303 A TW 109137303A TW 109137303 A TW109137303 A TW 109137303A TW I745136 B TWI745136 B TW I745136B
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Abstract
Description
本發明提供一種調整電子元件正確擺置,以提升作業品質之承置器調位機構。 The present invention provides a holder positioning mechanism for adjusting the correct placement of electronic components to improve the quality of work.
在現今,一具有複數個接點之電子元件,於歷經黏晶、焊線及封膠等製程後,再以切割成型製程切割為一獨立之電子元件。然為確保電子元件之品質,業者以測試裝置對電子元件執行測試作業,以淘汰出不良品;請參閱圖1,測試裝置設有電性連接之電路板11及測試座12,測試座12具有容置槽121及複數個探針,容置槽121供容置電子元件,並以一探針作為基準探針122,一輸送器(圖未示出)將電子元件21移入測試座12之容置槽121,並以電子元件21之基準接點211對位接觸於測試座12之基準探針122,使電子元件21執行電性測試作業;惟,測試座12之容置槽121尺寸是依照一批次電子元件21之制式尺寸而配置,電子元件21之側邊212至基準接點211的第一間距L1理應相同於容置槽121之側壁1211至基準探針122的第二間距L2,但部分電子元件21於切割成型製程會發生側邊212尺寸被誤切過當之情形,導致電子元件21之側邊212至基準接點211的第一間距L1縮短,當電子元件21移入測試座12之容置槽121時,即會發生電子元件21之基準接點211無法對位接觸測試座12之基準探針122,以致影響測試品質
,電子元件21被誤判為不良品;尤其對於一具有數十個接點之精密電子元件而言,精密電子元件之基準接點對位接觸測試座12之基準探針122的精準性更加重要。
Nowadays, an electronic component with multiple contacts is cut into an independent electronic component by a cutting molding process after undergoing processes such as die bonding, wire bonding, and sealing. However, in order to ensure the quality of electronic components, manufacturers use test devices to perform testing operations on electronic components to eliminate defective products. Please refer to Figure 1. A
本發明之目的一,提供一種承置器調位機構,其承置器供承置電子元件,並依電子元件之二側邊至基準接點的距離而於承置區界定出基準位置,調位機構包含第一驅動器、第二驅動器、第一調位器及第二調位器,第一驅動器驅動第一調位器位於基準位置,第二驅動器驅動第二調位器朝第一調位器位移,並推移電子元件靠抵於第一調位器而定位,進而調整電子元件正確擺置,以提高作業品質。 The first object of the present invention is to provide a holder position adjustment mechanism. The holder is used for holding electronic components, and the reference position is defined in the holding area according to the distance between the two sides of the electronic component and the reference contact point. The positioning mechanism includes a first driver, a second driver, a first positioner and a second positioner. The first driver drives the first positioner to the reference position, and the second driver drives the second positioner toward the first positioner. The positioner is displaced and the electronic component is pushed to be positioned against the first positioner, so as to adjust the correct placement of the electronic component to improve the quality of work.
本發明之目的二,提供一種承置器調位機構,其調位機構之第一調位器設有第一承抵件及第二承抵件,第一驅動器以第一、二驅動具各別驅動第一調位器之第一、二承抵件作獨立位移,於調位時,可視電子元件之二側邊的切損誤差值,而單獨改變第一承抵件或第二承抵件之位置作一調整補償,以使電子元件位於正確位置,進而提高調位便利性。 The second object of the present invention is to provide a holder position adjustment mechanism, the first position adjustment mechanism of the position adjustment mechanism is provided with a first bearing member and a second bearing member, and the first driver uses the first and second driving tools. Do not drive the first and second bearing members of the first positioner to move independently. During the adjustment, the first bearing member or the second bearing member can be changed separately according to the cutting error value of the two sides of the electronic component. The position of the parts is adjusted and compensated so that the electronic components are in the correct position, thereby improving the convenience of adjustment.
本發明之目的三,提供一種承置器調位機構,其調位機構設置支撐部件架置於機台,而供裝配第一驅動器及第二驅動器,以利單獨更換不同型式之承置器,毋需更換整組調位機構及承置器,進而節省成本及提高更換便利性。 The third objective of the present invention is to provide a holder position adjustment mechanism, the position adjustment mechanism is provided with a supporting part mounted on the machine table, and is used for assembling the first driver and the second driver, so as to facilitate the independent replacement of different types of holders. There is no need to replace the entire set of adjustment mechanisms and holders, thereby saving costs and improving the convenience of replacement.
本發明之目的四,提供一種應用承置器調位機構之作業設備,包含機台、供料裝置、收料裝置、作業裝置、調位機構及中央控制裝置;供料裝置配置於機台,並設有至少一容納待作業電子元件之供料承置器;收料裝置配 置於機台,並設有至少一容納已作業電子元件之收料承置器;作業裝置配置於機台,並設有至少一承置器,以供承置電子元件,並對電子元件執行預設作業;至少一本發明之調位機構,以供調整承置器所承置之電子元件擺置於正確位置,中央控制裝置以供控制及整合各裝置、機構作動,而執行自動化作業,達到提升作業效能之實用效益。 The fourth object of the present invention is to provide a working equipment using a holder positioning mechanism, which includes a machine, a feeding device, a receiving device, a working device, a positioning mechanism and a central control device; the feeding device is arranged on the machine, And is equipped with at least one feeding holder for holding the electronic components to be operated; the receiving device is equipped with It is placed in the machine and is provided with at least one receiving holder for accommodating electronic components that have been operated; the working device is configured on the machine and is provided with at least one holder for holding and performing electronic components Preset operation; at least one position adjustment mechanism of the present invention is used to adjust the electronic components held by the holder to be placed in the correct position, and the central control device is used to control and integrate the actions of various devices and mechanisms to perform automated operations, Achieve the practical benefits of improving operational efficiency.
11:電路板 11: circuit board
12:測試座 12: Test seat
121:容置槽 121: accommodating slot
1211:側壁 1211: sidewall
122:基準探針 122: Reference Probe
21:電子元件 21: Electronic components
211:基準接點 211: Reference contact
212:側邊 212: side
L1:第一間距 L1: first pitch
L2:第二間距 L2: second spacing
31:電路板 31: circuit board
321:基準探針 321: Reference Probe
322:第一探針 322: First Probe
33:測試基板 33: Test the substrate
331:通孔 331: Through Hole
40:調位機構 40: Position adjustment mechanism
411:第一驅動具 411: First Drive
412:第二驅動具 412: Second Drive
421:第三驅動具 421: Third Drive
431:第一承抵件 431: The first contract
4311:第一連接面 4311: The first connection surface
4312:第一承靠面 4312: The first bearing surface
432:第二承抵件 432: The second deductible
4321:第二連接面 4321: second connection surface
4322:第二承靠面 4322: second bearing surface
441:第一推移件 441: The first move
4411:第一頂推面 4411: The first pushing surface
442:第二推移件 442: The second move
4421:第二頂推面 4421: The second pushing surface
443:連接部 443: Connection
45:支撐板 45: support plate
A1:第一路徑 A1: The first path
A2:第二路徑 A2: Second path
A3:第三路徑 A3: The third path
B1:第一分位 B1: First quintile
B2:第二分位 B2: second quintile
50:機台 50: machine
501:鏤空孔 501: hollow hole
51:移料器 51: Shifter
52:電子元件 52: electronic components
521:基準接點 521: Reference contact
522:第一接點 522: first contact
523:第一側邊 523: first side
524:第二側邊 524: second side
525:第三側邊 525: third side
526:第四側邊 526: fourth side
60:供料裝置 60: Feeding device
61:供料承置器 61: Feeder
70:收料裝置 70: Receiving device
71:收料承置器 71: Receiving Holder
80:測試裝置 80: test device
81:第一移料器 81: The first shifter
82:入料載台 82: Feeding stage
83:第二移料器 83: Second shifter
84:出料載台 84: discharge stage
85:第三移料器 85: The third shifter
圖1:習知測試裝置之使用示意圖。 Figure 1: Schematic diagram of the use of the conventional testing device.
圖2:本發明承置器與調位機構第一實施例之俯視圖。 Figure 2: The top view of the first embodiment of the holder and the position adjustment mechanism of the present invention.
圖3:本發明承置器與調位機構第一實施例之組裝剖視圖。 Figure 3: An assembled cross-sectional view of the first embodiment of the holder and the position adjustment mechanism of the present invention.
圖4:本發明調位機構第一實施例應用於測試裝置之示意圖。 Figure 4: A schematic diagram of the first embodiment of the position adjustment mechanism of the present invention applied to a testing device.
圖5:本發明調位機構之使用示意圖(一)。 Figure 5: Schematic diagram of the use of the position adjustment mechanism of the present invention (1).
圖6:本發明調位機構之使用示意圖(二)。 Figure 6: Schematic diagram of the use of the position adjustment mechanism of the present invention (2).
圖7:本發明調位機構之使用示意圖(三)。 Figure 7: Schematic diagram of the use of the position adjustment mechanism of the present invention (3).
圖8:本發明調位機構第二實施例之示意圖。 Fig. 8: A schematic diagram of the second embodiment of the position adjustment mechanism of the present invention.
圖9:本發明調位機構第三實施例之示意圖。 Figure 9: A schematic diagram of the third embodiment of the position adjustment mechanism of the present invention.
圖10:本發明調位機構第一實施例應用於作業設備之配置圖。 Figure 10: The first embodiment of the position adjustment mechanism of the present invention is applied to the configuration diagram of the working equipment.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:請參閱圖2、3,本發明調位機構40應用於承置器,承置器可為台座、測試器、載台、移料器或預溫器等,以對電子元件執行預設作業(如測試作
業、載送作業或移料作業等);例如一為台座之承置器,可單純承置電子元件;例如一為測試器之承置器,可承置及測試電子元件;例如一為移料器之承置器,可移載取放電子元件;前述不同型式之承置器依作業需求,以期承置擺放正確位置之電子元件,而利於承置器本身或下一相關裝置準確執行預設作業。
In order to enable your reviewer to have a better understanding of the present invention, here is a preferred embodiment combined with the drawings. The details are as follows: Please refer to Figures 2 and 3, the
於本實施例,承置器為一測試器,測試器包含電路板31、一基準探針321、複數個第一探針322及測試基板33,基準探針321及複數個第一探針322的一端電性連接電路板31,基準探針321作為一基準件,並以另一端供對位電子元件(圖未示出)之基準接點,而供判別電子元件是否正確電性接觸測試器,複數個第一探針322的另一端供對位電子元件之第一接點;測試器以位於最外側之一探針作為基準探針321,基準探針321及複數個第一探針322上方之區域界定為承置區,以供容置電子元件,測試基板33裝配於電路板31上,並開設通孔331,以供基準探針321及複數個第一探針322裸露於外。
In this embodiment, the holder is a tester, and the tester includes a
本發明調位機構40包含第一驅動器、第二驅動器、第一調位器及第二調位器,更包含至少一支撐部件,支撐部件供架置第一驅動器及第二驅動器,支撐部件可為獨立架板,或為承置器、機台之其一部件;例如支撐部件可為支撐板,以架置於機台(圖未示出),而供裝配第一驅動器及第二驅動器,使第一驅動器、第二驅動器與承置器分離,以利單獨更換承置器;例如支撐部件可為承置器之基板,以供裝配第一驅動器及第二驅動器,而可利於將承置器及調位機構40一次拆卸修護;於本實施例,支撐部件為測試器之測試基板33。
The
第一驅動器設有至少一第一驅動具,第一驅動具可為壓缸、線性馬達或包含馬達及傳動組;第一驅動具可定點配置或隨承置器位移,例如第一驅動具可定點配置於機台(圖未示出),於承置器載送第一調位器對位於第一驅
動具,第一驅動具可頂推第一調位器位移,例如第一驅動具可裝配於承置器,而可隨承置器作同步位移,並驅動第一調位器位移;於本實施例,第一驅動器包含第一驅動具411及第二驅動具412,第一驅動具411為壓缸,並呈X方向配置於測試器之測試基板33,第一驅動具411之活塞桿沿第一路徑A1位移,第二驅動具412亦為壓缸,並呈Y方向配置於測試器之測試基板33,且與第一驅動具411呈90度配置,第二驅動具412之活塞桿沿第二路徑A2位移。
The first driver is provided with at least one first driving device. The first driving device can be a cylinder, a linear motor, or a motor and a transmission group; the first driving device can be configured at a fixed point or can be displaced with the holder, for example, the first driving device can be The fixed point is arranged on the machine (not shown in the figure), and the first positioner is placed on the first drive on the carrier.
The moving tool, the first driving tool can push the first positioner to move. For example, the first driving tool can be assembled to the holder, and can move synchronously with the holder, and drive the first positioner to move; In an embodiment, the first driver includes a
第二驅動器與該第一驅動器彼此獨立而設有至少一第三驅動具,第三驅動具可為壓缸、線性馬達或包含馬達及傳動組;第三驅動具可定點配置或隨承置器位移,例如第三驅動具可定點配置於機台,於承置器載送第二調位器對位於第三驅動具,第三驅動具可頂推第二調位器位移,例如第三驅動具可裝配於承置器而作同步位移,並驅動第二調位器位移,使第一驅動器與第二驅動器分別獨立地驅動第一調位器與第二調位器位移;於本實施例,第二驅動器設有一第三驅動具421,第三驅動具421為壓缸,並呈斜角方向(如45度)配置於測試器之測試基板33,且位於遠離第一驅動具411與第二驅動具412之位置,第三驅動具421之活塞桿沿第三路徑A3位移,第三路徑A3之角度呈45度。
The second driver and the first driver are independent of each other and are provided with at least one third driver. The third driver can be a cylinder, a linear motor, or include a motor and a transmission group; the third driver can be configured at a fixed point or accompanied by a carrier Displacement, for example, the third driving device can be fixedly arranged on the machine table, and the second positioner is placed on the third driving device on the carrier, and the third driving device can push the second positioner to move, for example, the third driving device The tool can be assembled on the holder for synchronous displacement, and drives the second positioner to move, so that the first driver and the second driver independently drive the first and second positioners to move; in this embodiment , The second driver is provided with a
然於部分實施例,若支撐部件為獨立架板,調位機構40可設置第三驅動器(圖未示出)以驅動獨立架板作水平角度旋轉,獨立架板供裝配第一驅動器及第二驅動器,第一驅動器及第二驅動器又分別連結第一調位器及第二調位器,使得第三驅動器可調整第一調位器及第二調位器之配置角度,以提升調位使用效能。
However, in some embodiments, if the supporting member is an independent frame, the
然於部分實施例,第一驅動器及第二驅動器亦可分別獨立調整第一調位器及第二調位器之配置角度,亦無不可。 However, in some embodiments, the first driver and the second driver can also independently adjust the arrangement angles of the first positioner and the second positioner.
第一調位器設有第一承抵件及第二承抵件,並由第一驅動器驅動位移於承置器之基準位置,更進一步,第一承抵件及第二承抵件可分別為獨立元件或連接於一體。另第一調位器與第一驅動器可採分離配置或組合連結配置,舉例如上述。又,基準位置為一可使電子元件擺置於正確位置之基準,例如基準位置為可使電子元件之基準接點對位測試器之基準探針的正確位置,基準位置分為第一分位(如Y方向)及第二分位(如X方向),第一分位及第二分位依不同型式尺寸之電子元件或依電子元件之不同側邊的切損誤差值而改變,例如電子元件Y方向之第一側邊切損誤差值較大,第一分位的補償值也會增加;於本實施例,依電子元件之第一、二側邊至基準接點的距離,而於測試器之承置區界定基準位置包含第一分位B1及第二分位B2。 The first position adjuster is provided with a first bearing member and a second bearing member, and is driven by the first driver to move to the reference position of the bearing device. Furthermore, the first bearing member and the second bearing member can be separately It is an independent component or connected in a whole. In addition, the first position adjuster and the first driver may adopt a separate configuration or a combined connection configuration, such as the above. In addition, the reference position is a reference that allows the electronic components to be placed in the correct position. For example, the reference position is the correct position that enables the reference contact of the electronic component to align with the reference probe of the tester. The reference position is divided into the first position. (Such as the Y direction) and the second quantile (such as the X direction), the first quantile and the second quantile vary according to different types and sizes of electronic components or according to the cutting loss error values of different sides of the electronic components, such as electronic The first side edge cutting loss error value of the component Y direction is larger, and the compensation value of the first digit will also increase; in this embodiment, according to the distance between the first and second side edges of the electronic component and the reference contact The tester's bearing area defines the reference position including the first quantile B1 and the second quantile B2.
於本實施例,第一調位器設有二為獨立元件之第一承抵件431及第二承抵件432,第一承抵件431呈Y方向配置,並以一面作為第一連接面4311,第一連接面4311連結組裝第一驅動器之第一驅動具411的活塞桿,第一承抵件431之另一面作為第一承靠面4312,以供電子元件相對應之第一側邊靠置,第一承抵件431由第一驅動具411驅動沿第一路徑A1位移,以使第一承抵件431之第一承靠面4312位於第一分位B1;第二承抵件432呈X方向配置,並以一面作為第二連接面4321,第二連接面4321連結組裝第一驅動器之第二驅動具412的活塞桿,第二承抵件432之另一面作為第二承靠面4322,以供電子元件相對應之第二側邊靠置,第二承抵件432由第二驅動具412驅動沿第二路徑A2位移,以使第二承抵件432之第二承靠面4322位於第二分位B2,因此,調位機構40以第一承抵件431及第二承抵件432作為測試器之可調整式二側壁。
In this embodiment, the first position adjuster is provided with a first supporting
第二調位器設有第一推移件及第二推移件,並由第二驅動器驅動朝第一調位器位移,以推移電子元件靠抵於已受該第一驅動器驅動位移至該承置器之該基準位置之第一調位器而定位,進而調整電子元件擺置於正確位置;更進一步,第一推移件及第二推移件可分別為獨立元件或連接於一體。另第二調位器與第二驅動器可採分離配置或組合連結配置,舉例如上述。 The second positioner is provided with a first pusher and a second pusher, and is driven by the second driver to move toward the first positioner, so as to push the electronic component against the first driver to move to the support The first positioner of the reference position of the device is positioned to adjust the electronic components to be placed in the correct position; further, the first pusher and the second pusher can be separate components or connected together. In addition, the second positioner and the second driver can be configured in a separate configuration or a combined connection configuration, such as the above.
於本實施例,第二調位器包含第一推移件441及第二推移件442,第一推移件441及第二推移件442為一體成型,第一推移件441呈Y方向配置,且相對於第一承抵件431,第一推移件441以相對於第一承靠面4312之一面作為第一頂推面4411,以供貼接電子元件相對應之第三側邊;第二推移件442呈X方向配置,且相對於第二承抵件432,第二推移件442以相對於第二承靠面4322之一面作為第二頂推面4421,以供貼接電子元件相對應之第四側邊,又第一推移件441及第二推移件442相連處的連接部443則組裝於第三驅動具421的活塞桿,由第三驅動具421帶動第二調位器之第一推移件441及第二推移件442沿第三路徑A3作斜向同步位移,因此,調位機構40以第一推移件441及第二推移件442作為測試器之可調整式另二側壁。
In this embodiment, the second position adjuster includes a
請參閱圖2、4,本實施例之承置器為測試器,測試器以測試基板33鎖固裝配於機台50,使第一承抵件431、第二承抵件432、第一推移件441、第二推移件442、基準探針321及複數個第一探針322等位於機台50之鏤空孔501,移料器51將電子元件52移載至測試器之上方,電子元件52設有一基準接點521及複數個第一接點522,然可視測試作業需求,電子元件52置放於測試器之前,可先經過檢知器(圖未示出)取像,以判別電子元件52之第一側邊523及第二側邊至
基準接點521之距離,並分析出切損誤差值及補償值,而界定基準位置之第一分位B1及第二分位B2。
Please refer to Figures 2 and 4, the holder in this embodiment is a tester, and the tester is fixedly assembled on the machine table 50 with the
請參閱圖5,調位機構40以第一驅動具411驅動第一承抵件431沿第一路徑A1位移,使第一承抵件431之第一承靠面4312位於第一分位B1,亦即第一承抵件431之第一承靠面4312至基準探針321的距離為電子元件之第一側邊至基準接點的距離;第二驅動具412驅動第二承抵件432沿第二路徑A2位移,使第二承抵件432之第二承靠面4322位於第二分位B2,亦即第二承抵件432之第二承靠面4322至基準探針321的距離為電子元件之第二側邊至基準接點的距離。
Referring to FIG. 5, the
請參閱圖6、7,移料器將電子元件52置放於測試器之基準探針321及複數個第一探針322上,而位於承置區,使電子元件52位於第一承抵件431、第二承抵件432、第一推移件441及第二推移件442之間,電子元件52之第一側邊523相對於第一承抵件431之第一承靠面4312,以及第二側邊524相對於第二承抵件432之第二承靠面4322,以及第三側邊525相對於第一推移件441之第一頂推面4411,以及第四側邊526相對於第二推移件442之第二頂推面4421;由於電子元件52之基準接點521並未對位於測試器之基準探針321,第三驅動具421即驅動第一推移件441及第二推移件442沿第三路徑A3作斜向同步位移,第一推移件441之第一頂推面4411及第二推移件442之第二頂推面4421分別貼接電子元件52之第三側邊525及第四側邊526,而推移電子元件52,令電子元件52之第一側邊523靠抵於第一承抵件431之第一承靠面4312,以及令第二側邊524靠抵於第二承抵件432之第二承靠面4322,將電子元件52調整擺置於正確位置,使電子元件52之基準接點521準確對位電性接觸測試器之基準探針321,進而提高測試品質。
Please refer to Figures 6 and 7, the material shifter places the
然於部分實施例,若第一驅動器具有一第一驅動具,以及第二驅動器具有一第三驅動具時,第一驅動具與第三驅動具可作對角配置,使第一驅動具與第三驅動具分別帶動第一調位器及第二調位器作對角路徑位移,亦無不可。 However, in some embodiments, if the first driver has a first driver and the second driver has a third driver, the first driver and the third driver can be arranged diagonally so that the first driver and the second driver The three driving devices respectively drive the first positioner and the second positioner to make a diagonal path displacement.
請參閱圖8,本發明調位機構40之第二實施例,其大致結構相同或近似第一實施例,第二實施例與第一實施例之差異在於第一調位器之第一承抵件431及第二承抵件432連接為一體,並裝配於一呈斜向配置之第一驅動具411,第一驅動具411與第三驅動具421可作對角配置,使第一驅動具411帶動第一承抵件431及第二承抵件432同步作斜向位移至基準位置,第三驅動具421帶動第一推移件441及第二推移件442同步作斜向位移,並推移電子元件靠抵於第一承抵件431及第二承抵件432,進而使電子元件調整擺置於正確位置。
Please refer to FIG. 8, the second embodiment of the
請參閱圖9,本發明調位機構40之第三實施例,其大致結構相同或近似第一實施例,第三實施例與第一實施例之差異在於調位機構40設有一獨立且為一支撐板45之支撐部件,支撐板45架置於機台50,並供裝配第一驅動器及第二驅動器,於本實施例,支撐板45供裝配第一驅動具411、第二驅動具412及第三驅動具421,使第一承抵件431、第二承抵件432、第一推移件441及第二推移件442位於測試器之承置區,於更換不同型式之測試器時,毋需更換整組調位機構40,而可單獨更換測試器,進而節省成本及提高更換便利性。
Please refer to FIG. 9, the third embodiment of the
請參閱圖2、3、10,一種應用承置器調位機構之作業設備,包含機台50、供料裝置60、收料裝置70、本發明調位機構40、作業裝置及中央控制裝置(圖未示出);供料裝置60裝配於機台50,並設有至少一供料承置器61,以容納至少一待作業之電子元件;收料裝置70裝配於機台50,並設有至少一收料
承置器71,以容納至少一已作業之電子元件;作業裝置裝配於機台50,並設有至少一承置器,以供承置電子元件,並對電子元件執行預設作業;於本實施例,作業裝置為測試裝置80,其以一為第一移料器81之第一承置器於供料裝置60之供料承置器61取出待測之電子元件,並移載至一為入料載台82之第二承置器,入料載台82將待測之電子元件載送至一為測試器之第三承置器側方,測試器包含電路板31、基準探針321、複數個第一探針322及測試基板33;至少一本發明調位機構40,以供調整承置器所承置之電子元件擺置於正確位置,於本實施例,調位機構40配置於測試器之測試基板33,測試裝置80以一為第二移料器83之第四承置器於入料載台82取出待測之電子元件,並移載至測試器之承置區,以供調位機構40將電子元件調整擺置於正確位置,令電子元件之基準接點精準對位測試器之基準探針321而執行測試作業,第二移料器83將已測電子元件移載至一為出料載台84之第五承置器,出料載台84載出已測之電子元件,測試裝置80以一為第三移料器85之第六承置器於出料載台84取出已測之電子元件,並依據測試結果,將已測之電子元件輸送至收料裝置70之收料承置器71處而分類收置;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。
Please refer to Figures 2, 3, and 10, an operating equipment using a holder positioning mechanism, including a
321:基準探針 321: Reference Probe
421:第三驅動具 421: Third Drive
431:第一承抵件 431: The first deductible
4312:第一承靠面 4312: The first bearing surface
432:第二承抵件 432: The second deductible
4322:第二承靠面 4322: second bearing surface
441:第一推移件 441: The first move
4411:第一頂推面 4411: The first pushing surface
442:第二推移件 442: The second move
4421:第二頂推面 4421: The second pushing surface
A3:第三路徑 A3: The third path
52:電子元件 52: electronic components
521:基準接點 521: Reference contact
523:第一側邊 523: first side
524:第二側邊 524: second side
525:第三側邊 525: third side
526:第四側邊 526: fourth side
Claims (10)
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TW202002133A (en) * | 2018-06-29 | 2020-01-01 | 鴻勁精密股份有限公司 | Receiving and correcting unit of electronic component, and operation categorizing equipment applying the same in which the center positions of the electronic components of different sizes are aligned with the preset correction positions of the receiving member for accurately correcting the electronic components of different sizes |
WO2020082578A1 (en) * | 2018-10-24 | 2020-04-30 | 深圳配天智能技术研究院有限公司 | Adjustable tool |
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US6471462B1 (en) * | 1998-11-28 | 2002-10-29 | Mirae Corporation | Carrier handling apparatus of an IC module handler |
US20110109336A1 (en) * | 2009-11-06 | 2011-05-12 | Yu-Hsing Lin | Positioning method and apparatus for inspecting solar battery panel |
TW201806064A (en) * | 2016-08-05 | 2018-02-16 | 台灣暹勁股份有限公司 | Position calibration mechanism and operating equipment applying the same achieving the actual benefit of improving the operating quality |
TW202002133A (en) * | 2018-06-29 | 2020-01-01 | 鴻勁精密股份有限公司 | Receiving and correcting unit of electronic component, and operation categorizing equipment applying the same in which the center positions of the electronic components of different sizes are aligned with the preset correction positions of the receiving member for accurately correcting the electronic components of different sizes |
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