TW202011036A - Electronic component correction unit and operation classification device using the same capable of accurately correcting electronic components - Google Patents
Electronic component correction unit and operation classification device using the same capable of accurately correcting electronic components Download PDFInfo
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Abstract
Description
本發明係提供一種可精準校正電子元件之校正單元。 The invention provides a calibration unit capable of accurately calibrating electronic components.
在現今,電子元件日趨精密輕巧,自動化作業設備係以移料器將電子元件移載至各裝置之承置器,該承置器可為料盤、預溫盤或載台等,若電子元件偏移擺置於承置器內,當移料器將偏置之電子元件移入下一製程之測試座時,由於該偏置之電子元件的中心位置無法對位測試座之中心位置,不僅影響電子元件移入測試座之準確性,更將影響測試品質,故業者係於機台上設有一校正機構,用以校正電子元件之中心位置,以期提升移料器之取放料精準性。 Nowadays, electronic components are becoming more and more precise and lightweight. Automated operation equipment transfers electronic components to the holders of various devices by means of a material shifter. The holder can be a material tray, a pre-heating plate or a stage. The offset is placed in the holder. When the feeder moves the offset electronic component into the test base of the next process, the center position of the offset electronic component cannot be aligned with the center position of the test base, which not only affects The accuracy of moving the electronic components into the test seat will also affect the quality of the test. Therefore, the manufacturer is equipped with a correction mechanism on the machine to correct the center position of the electronic components, in order to improve the accuracy of the pick and place of the feeder.
請參閱第1圖,該校正機構係於一台板11上固設一呈L型之基準件12,並於基準件12之對角處設有一由壓缸13驅動位移之夾持件14,當移料器21將電子元件22移入基準件12與夾持件14之間,且置放於台板11上時,該壓缸13即驅動夾持件14相對基準件12作位移,令夾持件14推移電子元件22,使電子元件22之一角部靠抵於基準件12而定位,進而校正電子元件22之中心位置A,使電子元件22之中心位置A相對於移料器21之中心位置,再供移料器21取出已校正之電子元件22,並移載至下一製程之測試座(圖未示出)而執行測試作業;惟,由於不同型式之電子元件具有不同尺寸,當移料器21將另一批次大尺寸之電子元件23移入校正機構時,該夾持件14雖可推移電子元件23靠抵於基準件12而定位,但大尺寸之電子元件23的中心位置B已改變,當移料器2 1位移至預設取料位置時,移料器21之中心位置並無法對位於大尺寸電子元件23之中心位置B,導致移料器21取出偏置之電子元件23,進而降低校正使用效能。 Please refer to FIG. 1, the calibration mechanism is fixed on a
本發明之目的一,係提供一種電子元件校正單元,其係於載具上配置具驅動源及掣動具之驅動機構,該掣動具係設有第一、二導移部件,並承置第一校正具及第二校正具,該第一校正具係承置電子元件,並具有校正電子元件之第一校正部件,以及由第一導移部件帶動位移之第一承導部件,該第二校正具係設有相對第一校正部件且校正電子元件之第二校正部件,以及由第二導移部件帶動位移之第二承導部件,利用驅動機構之掣動具帶動第一校正具及第二校正具作相對位移而推移校正電子元件,達到精準校正電子元件之實用效益。 The first object of the present invention is to provide an electronic component calibration unit which is equipped with a driving source and a driving mechanism for a trigger on a carrier. The trigger is provided with first and second guide members and is supported A first calibrator and a second calibrator. The first calibrator supports electronic components, and has a first calibrating component for calibrating the electronic components, and a first guiding component that is displaced by the first guiding component. The two calibrators are provided with a second calibrating component that calibrates the electronic components relative to the first calibrating component, and a second guide component that is displaced by the second deflecting component, and the first calibrator is driven by the driving mechanism The second calibration tool performs relative displacement to shift and calibrate the electronic components, so as to achieve the practical benefit of accurately calibrating the electronic components.
本發明之目的二,係提供一種電子元件校正單元,其更包含檢知機構,該檢知機構係於該第一校正具設有至少一相通第一校正部件之第一通槽,以及於該第二校正具設有至少一相通第二校正部件之第二通槽,另於載具上設置至少一感測器,藉以利用第一、二校正具之第一、二通槽形成的檢知通道,而供感測器檢知第一校正具上是否殘留電子元件,以有效避免疊料或壓損電子元件,達到提升使用效能之實用效益。 The second object of the present invention is to provide an electronic component calibration unit, which further includes a detection mechanism, wherein the detection mechanism is provided on the first calibration tool with at least a first through slot communicating with the first calibration component, and on the The second calibrator is provided with at least one second through slot communicating with the second calibrating component, and at least one sensor is provided on the carrier to utilize the detection formed by the first and second through slots of the first and second calibrators The channel is used for the sensor to detect whether the electronic component remains on the first calibration tool, so as to effectively avoid stacking or pressure damage of the electronic component, and achieve a practical benefit of improving the use performance.
本發明之目的三,係提供一種應用電子元件校正單元之作業分類機,其包含機台、供料裝置、收料裝置、作業裝置、輸送裝置、校正單元及中央控制裝置,該供料裝置係配置於機台上,並設有至少一容納待作業電子元件之供料承置器,該收料裝置係配置於機台上,並設有至少一容納已作業電子元件之收料承置器,該作業裝置係配置於機台上,並設有至少一對電子元件執行預設作業之作業器,該輸送裝置係配置於機台上,並設有至少一移載電子元件之移料器,以及設置至少一本發明之校正單元,以校正電子元件,該中央控制裝置係用以控制及整合各裝置作 動,以執行自動化作業,達到提升作業效能之實用效益。 The third object of the present invention is to provide an operation sorting machine using an electronic component calibration unit, which includes a machine, a feeding device, a receiving device, a working device, a conveying device, a calibration unit and a central control device. The feeding device is It is arranged on the machine table, and is provided with at least one feeding holder for accommodating the electronic components to be operated. The receiving device is arranged on the machine table and is provided with at least one feeding holder for accommodating the operated electronic components. , The working device is arranged on the machine, and is provided with at least one pair of electronic components to perform the preset operation of the working device, the conveying device is arranged on the machine, and is provided with at least one material transfer device And, at least one calibration unit of the present invention is provided to calibrate the electronic components. The central control device is used to control and integrate the actions of each device to perform automated operations, so as to achieve the practical benefit of improving the operating efficiency.
〔習知〕 〔Knowledge〕
11‧‧‧台板 11‧‧‧ Platen
12‧‧‧基準件 12‧‧‧ benchmark
13‧‧‧壓缸 13‧‧‧Press cylinder
14‧‧‧夾持件 14‧‧‧Clamping parts
21‧‧‧移料器 21‧‧‧shifter
22、23‧‧‧電子元件 22, 23‧‧‧Electronic components
A、B‧‧‧中心位置 A, B‧‧‧Central location
〔本發明〕 〔this invention〕
30‧‧‧校正單元 30‧‧‧ Calibration unit
31‧‧‧載具 31‧‧‧Vehicle
311‧‧‧載板 311‧‧‧ carrier board
312‧‧‧第一架體 312‧‧‧The first body
313‧‧‧第二架體 313‧‧‧Second body
314‧‧‧第三架體 314‧‧‧The third body
3141‧‧‧容置空間 3141‧‧‧accommodating space
3142‧‧‧第二滑軌 3142‧‧‧Second Slide
3143‧‧‧第三滑軌 3143‧‧‧The third slide
3144‧‧‧第三通槽 3144‧‧‧The third slot
315‧‧‧第一滑軌 315‧‧‧The first slide
32‧‧‧驅動機構 32‧‧‧Drive mechanism
321‧‧‧馬達 321‧‧‧Motor
3221‧‧‧螺桿 3221‧‧‧screw
3222‧‧‧螺座 3222‧‧‧Screw seat
323‧‧‧掣動具 323‧‧‧brake gear
3231‧‧‧第一導移部件 3231‧‧‧ First guide part
3232‧‧‧第二導移部件 3232‧‧‧Second guide part
324‧‧‧第一滑座 324‧‧‧First Slide
33‧‧‧第一校正具 33‧‧‧First calibrator
331‧‧‧第一塊體 331‧‧‧The first block
332‧‧‧第二塊體 332‧‧‧The second block
3321‧‧‧承置部 3321‧‧‧ Department
333、333A‧‧‧第三塊體 333, 333A ‧‧‧ third block
3331、3331A‧‧‧第一校正部件 3331, 3331A‧‧‧First correction unit
3332、3332A‧‧‧第一通槽 3332, 3332A‧‧‧First slot
334‧‧‧第一承導部件 334‧‧‧The first guiding component
335‧‧‧第二滑座 335‧‧‧Second Slide
L‧‧‧中心軸線 L‧‧‧Central axis
34‧‧‧第二校正具 34‧‧‧Second correction tool
341‧‧‧第四塊體 341‧‧‧The fourth block
342‧‧‧第五塊體 342‧‧‧The fifth block
343、343A‧‧‧第六塊體 343, 343A ‧‧‧ sixth block
3431、3431A‧‧‧第二校正部件 3431, 3431A‧‧‧Second correction part
3432、3432A‧‧‧第二通槽 3432, 3432A‧‧‧Second channel
344‧‧‧第二承導部件 344‧‧‧Second guiding component
345‧‧‧第三滑座 345‧‧‧The third slide
35‧‧‧檢知機構 35‧‧‧Inquiry agency
351‧‧‧投光元件 351‧‧‧Projection element
352‧‧‧接光元件 352‧‧‧Light receiving element
40‧‧‧移料器 40‧‧‧shifter
P‧‧‧中心位置 P‧‧‧Central location
41、42‧‧‧電子元件 41、42‧‧‧Electronic components
C、D‧‧‧中心位置 C, D‧‧‧ Central position
50‧‧‧機台 50‧‧‧machine
60‧‧‧供料裝置 60‧‧‧Feeding device
61‧‧‧供料承置器 61‧‧‧Feeding holder
70‧‧‧收料裝置 70‧‧‧Receiving device
71‧‧‧收料承置器 71‧‧‧ Receiver
80‧‧‧作業裝置 80‧‧‧operating device
81‧‧‧電路板 81‧‧‧ circuit board
82‧‧‧測試座 82‧‧‧Test seat
90‧‧‧輸送裝置 90‧‧‧Conveying device
91‧‧‧第一移料器 91‧‧‧ First material shifter
92‧‧‧第一入料載台 92‧‧‧First loading platform
93‧‧‧第二入料載台 93‧‧‧Second loading table
94‧‧‧第二移料器 94‧‧‧Second material shifter
95‧‧‧第三移料器 95‧‧‧The third feeder
96‧‧‧第一出料載台 96‧‧‧The first discharge platform
97‧‧‧第二出料載台 97‧‧‧Second discharge platform
98‧‧‧第四移料器 98‧‧‧ Fourth material shifter
第1圖:習知電子元件校正機構之使用示意圖。 Figure 1: Schematic diagram of the conventional electronic component calibration mechanism.
第2圖:本發明電子元件校正單元之外觀圖。 Figure 2: The external view of the electronic component correction unit of the present invention.
第3圖:本發明電子元件校正單元之零件分解圖。 Figure 3: Exploded view of the electronic component calibration unit of the present invention.
第4圖:本發明電子元件校正單元之俯視圖。 Figure 4: The top view of the electronic component correction unit of the present invention.
第5圖:係校正小尺寸電子元件之使用示意圖(一)。 Figure 5: Schematic diagram of the use of calibrated small-sized electronic components (1).
第6圖:係校正小尺寸電子元件之使用示意圖(二)。 Figure 6: Schematic diagram of the use of calibrated small-sized electronic components (2).
第7圖:係校正小尺寸電子元件之使用示意圖(三)。 Figure 7: Schematic diagram of the use of calibrated small-sized electronic components (3).
第8圖:係校正小尺寸電子元件之使用示意圖(四)。 Figure 8: Schematic diagram of the use of calibrated small-sized electronic components (4).
第9圖:係校正大尺寸電子元件之使用示意圖(一)。 Figure 9: Schematic diagram of the calibration of large-sized electronic components (1).
第10圖:係校正大尺寸電子元件之使用示意圖(二)。 Figure 10: Schematic diagram of the use of calibrating large-sized electronic components (2).
第11圖:係校正大尺寸電子元件之使用示意圖(三)。 Figure 11: Schematic diagram of the use of calibrating large-sized electronic components (3).
第12圖:係校正單元應用於作業分類機之示意圖。 Figure 12: Schematic diagram of the calibration unit applied to the job sorter.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:請參閱第2、3、4圖,本發明電子元件校正單元30包含載具31、驅動機構32、第一校正具33、第二校正具34及檢知機構35;該載具31係為固定式配置而固設於機台(圖未示出)上,或為活動式配置而由至少一動力源(圖未示出)驅動作至少一方向位移,於本實施例中,該載具31係設有一固設於機台之載板311,並於載板311上設置第一架體312及第二架體313,一跨置固設於第一架體312及第二架體313上之第三架體314,該第三架體314係設有中空之容置空間3141;該驅動機構32係裝配於載具31上,並設有驅動源及由該驅動源驅動位移之掣動具,更進一步,該驅動源可為壓缸、線性馬達或包含馬達及傳動組,於本實施例中,該驅 動源包含馬達321,以及由該馬達321驅動且為螺桿螺座組之傳動組,該馬達321係水平斜向配置,該螺桿螺座組之螺桿3221係連結馬達321,並以螺座3222連結掣動具323,以帶動掣動具323作水平斜向位移,該掣動具323係設有第一導移部件3231及第二導移部件3232,更進一步,第一導移部件3231及第二導移部件3232係為導槽或導桿,於本實施例中,該第一導移部件3231及第二導移部件3232均為導槽,該驅動機構32另於掣動具323與載具31之間設有至少一第一滑軌組,於本實施例中,係於載具31之載板311上固設有呈斜向配置之第一滑軌315,並於掣動具323之底面裝配有可滑置於第一滑軌315上之第一滑座324;該第一校正具33係位於驅動機構32之掣動具323上,並設有至少一承置電子元件之承置部,以及設有至少一校正電子元件之第一校正部件,更進一步,該第一校正具33係為一體成型,或包含複數個塊體,於本實施例中,該第一校正具33係設有第一塊體331、第二塊體332及複數個第三塊體333,該第一塊體331上係裝配一具有承置部3321之第二塊體332,其承置部3321係承置電子元件,並供裝配複數個具第一校正部件3331之第三塊體333,該第一校正部件3331係為一角部,用以校正電子元件,又該第一校正具33係設有至少一與掣動具323之第一導移部件3231相互配合之第一承導部件334,於本實施例中,係於第一塊體331之底面設置一為導桿之第一承導部件334,並令第一承導部件334插置且位移於掣動具323之第一導移部件3231,另於第一校正具33與載具31之第三架體314間係設有至少一第二滑軌組,於本實施例中,係於載具31之第三架體314固設呈斜向配置之第二滑軌3142,並於第一校正具33之第一塊體331上裝配有滑置於第二滑軌3142上之第二滑座335;該第二校正具34係位於驅動機構32之掣動具323上,並設有至 少一相對第一校正部件3331且校正電子元件之第二校正部件,更進一步,該第二校正具34係為一體成型,或包含複數個塊體,於本實施例中,該第二校正具34係設有第四塊體341、第五塊體342及複數個第六塊體343,該第四塊體341上係裝配第五塊體342,該第五塊體342係裝配複數個具第二校正部件3431之第六塊體343,該第二校正部件3431係為一角部,用以校正電子元件,又該第二校正具34係設有至少一與掣動具323之第二導移部件3232相互配合之第二承導部件344,於本實施例中,係於第四塊體341之底面設置一為導桿之第二承導部件344,並令第二承導部件344插置且位移於掣動具323之第二導移部件3232,另於第二校正具34與載具31之第三架體314間係設有至少一第三滑軌組,於本實施例中,係於載具31之第三架體314固設有呈斜向配置之第三滑軌3143,並於第二校正具34之第四塊體341上裝配有滑置於第二滑軌3143上之第三滑座345;該檢知機構35係於載具31設有至少一感測器,並於第一校正具33及第二校正具34分別開設有相對應之第一通槽及第二通槽,以供感測器檢知第一校正具33上是否殘留電子元件,於本實施例中,該感測器係於載具31之第一架體312裝配一投光元件351,並於第二架體313裝配一接光元件352,另於第一校正具33之各第三塊體333開設有相通第一校正部件3331之第一通槽3332,以及於第二校正具34之各第六塊體343開設有相通第二校正部件3431之第二通槽3432,以及於載具31之第三架體314開設有第三通槽3144,使得第一通槽3332、第二通槽3432及第三通槽3144形成一檢知通道,以供檢知第一校正具33上是否殘留電子元件。 In order for your reviewer to understand the present invention further, a preferred embodiment is given in conjunction with the drawings, which will be described in detail as follows: please refer to Figures 2, 3, and 4, the electronic
請參閱第5圖,於執行校正電子元件作業前,該校正單元30係以檢知機構35之投光元件351經第一校正具3 3之第一通槽3332及第二校正具34之第二通槽3432及載具31之第三通槽3144所形成的檢知通道投射光線,當接光元件352經由檢知通道接收到光線時,即代表第一校正具33之承置部3321上並無殘留電子元件,進而有效避免疊料或壓損電子元件,反之,若無接收到光線,則代表第一校正具33之承置部3321上殘留電子元件或驅動源異常,工作人員即需排除異常。 Please refer to FIG. 5, before performing the calibration of the electronic component, the
請參閱第6圖,於檢知作業完畢,該校正單元30之驅動機構32係以馬達321經螺桿3221及螺座3222帶動該掣動具323位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向外位移,使第一校正具33之承置部3321提供一較大之入料空間,以供移料器40作Z方向位移順利將偏置之電子元件41移入第一校正具33之承置部3321。 Please refer to FIG. 6. After the detection operation is completed, the
請參閱第7圖,接著該驅動機構32係以馬達321經螺桿3221及螺座3222帶動該掣動具323反向位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向內位移,由於電子元件41係置放於第一校正具33之承置部3321,該第一校正具33係會帶動電子元件41朝向第二校正具34作相對位移,同時,該第二校正具34之第二校正部件3431會頂推電子元件41位移,令電子元件41靠置於第一校正具33之第一校正部件3331,使得第一校正具33之第一校正部件3331及第二校正具34之第二校正部件3431校正電子元件41,由於驅動機構32係以掣動具323之第一導移部件3231及第二導移部件 3232同步作動導引第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,而可使第一校正具33及第二校正具34具有相同之位移行程,以令第一校正具33之第一校正部件3331及第二校正具34之第二校正部件3431夾持推移電子元件41之中心位置C對位於第一校正具33之承置部3321的中心軸線L,進而校正電子元件41之中心位置C。 Please refer to FIG. 7, and then the driving mechanism 32 is driven by the motor 321 through the screw 3221 and the screw base 3222 to drive the actuator 323 to reverse displacement, and the actuator 323 is moved by the first guide member 3231 and the second guide The component 3232 guides the displacement of the first guiding component 334 of the first calibrator 33 and the second guiding component 344 of the second calibrator 34 to drive the first calibrator 33 and the second calibrator 34 inward, respectively Displacement, since the electronic component 41 is placed on the receiving portion 3321 of the first calibrator 33, the first calibrator 33 will drive the electronic component 41 to move relative to the second calibrator 34, and at the same time, the second calibrator The second calibration component 3431 of 34 will push the displacement of the electronic component 41, so that the electronic component 41 leans against the first calibration component 3331 of the first calibration tool 33, so that the first calibration component 3331 of the first calibration tool 33 and the second calibration The second correction part 3431 of the tool 34 corrects the electronic component 41, because the driving mechanism 32 uses the first guide part 3231 and the second guide part 3232 of the stopper 323 to synchronously actuate and guide the first bearing of the first correction tool 33 The guide member 334 and the second guide member 344 of the second calibrator 34 are displaced, so that the first calibrator 33 and the second calibrator 34 have the same displacement stroke, so that the first calibrator of the first calibrator 33 The 3331 and the second calibration member 3431 of the second calibration tool 34 clamp the center position C of the electronic component 41 to the central axis L of the receiving portion 3321 of the first calibration tool 33, and then correct the center position C of the electronic component 41.
請參閱第8圖,於完成校正作業後,該校正單元30之驅動機構32係以馬達321經螺桿3221及螺座3222帶動該掣動具323位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向外位移,當移料器40位移至預設取料位置時,由於移料器40之中心位置P已預設對位於第一校正具33之承置部3321的中心軸線L,使得移料器40之中心位置P即可對位於電子元件41之中心位置C,該移料器40即可作Z方向向下位移而精準取出電子元件41,以利準確將電子元件41移入至下一作業器(如測試座,圖未示出)。 Please refer to FIG. 8. After the calibration operation is completed, the
請參閱第9圖,欲校正大尺寸之電子元件42時,該校正單元30可更換第一校正具33之第三塊體,而於第二塊體332上換裝不同尺寸之複數個具有第一校正部件3331A及第一通槽3332A的第三塊體333A,以及更換第二校正具34之第六塊體,而於第五塊體342上換裝不同尺寸之複數個具有第二校正部件3431A及第二通槽3432A的第六塊體343A;該驅動機構32之馬達321係經由螺桿3221及螺座3222帶動該掣動具323位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承 導部件344位移,以帶動第一校正具33及第二校正具34分別向外位移,使第一校正具33及第二校正具34之間提供一較大之入料空間,該移料器40即可帶動偏置之電子元件42作Z方向向下位移置放於第一校正具33之承置部3321。 Please refer to FIG. 9, when calibrating the
請參閱第10圖,接著該驅動機構32係以馬達321經螺桿3221及螺座3222帶動該掣動具323反向位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向內位移,該第一校正具33係會帶動電子元件42朝向第二校正具34作相對位移,同時,該第二校正具34之第二校正部件3431A會頂推電子元件42位移,令電子元件42靠置於第一校正具33之第一校正部件3331A,使得第一校正具33之第一校正部件3331A及第二校正具34之第二校正部件3431A夾持推移電子元件42之中心位置D對位於第一校正具33之承置部3321的中心軸線L,進而校正電子元件42之中心位置D。 Please refer to FIG. 10, and then the
請參閱第11圖,於完成校正作業後,該驅動機構32之馬達321經由螺桿3221及螺座3222帶動該掣動具323位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向外位移,當移料器40位移至預設取料位置時,由於移料器40之中心位置P已預設對位於第一校正具33之承置部3321的中心軸線L,使得移料器40之中心位置P即可對位於電子元件42之中心位置D,該移料器40即可作Z方向向下位移而精準取出電子元件42,以利準確將電子元件42移入至下一作業器(如測試座,圖未示出)。 Please refer to FIG. 11, after the calibration operation is completed, the
請參閱第2、3、4、12圖,係本發明校正單元 30應用於電子元件作業分類機之示意圖,該作業分類機係於機台50上配置有供料裝置60、收料裝置70、作業裝置80、輸送裝置90及中央控制裝置(圖未示出);該供料裝置60係裝配於機台50,並設有至少一為供料盤之供料承置器61,用以容納至少一待作業之電子元件;該收料裝置70係裝配於機台50,並設有至少一為收料盤之收料承置器71,用以容納至少一已作業之電子元件;該作業裝置80係裝配於機台50,並設有至少一作業器,以對電子元件執行預設作業,於本實施例中,該作業器係為測試器,該測試器係設有電性連接之電路板81及測試座82,並以測試座82承置及測試電子元件;該輸送裝置90係裝配於機台50上,並設有至少一移載電子元件之移料器,以及設置至少一本發明之校正單元30,以校正電子元件,於本實施例中,該輸送裝置90係設有第一移料器91,以於供料裝置60之供料承置器61取出待測之電子元件,並移載至第一入料載台92及第二入料載台93,第一入料載台92及第二入料載台93將待測之電子元件載送至測試裝置80之側方,該輸送裝置90係以第二移料器94及第三移料器95於第一入料載台92及第二入料載台93取出待測之電子元件,並分別移入二校正單元30而校正電子元件,再以第二移料器94及第三移料器95將二校正單元30內已校正之電子元件移載至作業裝置80之測試座82而執行測試作業,以及將測試座82之已測電子元件移載至第一出料載台96及第二出料載台97,第一出料載台96及第二出料載台97載出已測之電子元件,該輸送裝置90係以第四移料器98於第一出料載台96及第二出料載台97上取出已測之電子元件,並依據測試結果,將已測之電子元件輸送至收料裝置70之收料承置器71處而分類收置;該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 Please refer to Figures 2, 3, 4, and 12, which is a schematic diagram of the
31‧‧‧載具 31‧‧‧Vehicle
311‧‧‧載板 311‧‧‧ carrier board
312‧‧‧第一架體 312‧‧‧The first body
313‧‧‧第二架體 313‧‧‧Second body
314‧‧‧第三架體 314‧‧‧The third body
3141‧‧‧容置空間 3141‧‧‧accommodating space
3142‧‧‧第二滑軌 3142‧‧‧Second Slide
3143‧‧‧第三滑軌 3143‧‧‧The third slide
3144‧‧‧第三通槽 3144‧‧‧The third slot
315‧‧‧第一滑軌 315‧‧‧The first slide
32‧‧‧驅動機構 32‧‧‧Drive mechanism
321‧‧‧馬達 321‧‧‧Motor
3221‧‧‧螺桿 3221‧‧‧screw
3222‧‧‧螺座 3222‧‧‧Screw seat
323‧‧‧掣動具 323‧‧‧brake gear
3231‧‧‧第一導移部件 3231‧‧‧ First guide part
3232‧‧‧第二導移部件 3232‧‧‧Second guide part
324‧‧‧第一滑座 324‧‧‧First Slide
33‧‧‧第一校正具 33‧‧‧First calibrator
331‧‧‧第一塊體 331‧‧‧The first block
332‧‧‧第二塊體 332‧‧‧The second block
3321‧‧‧承置部 3321‧‧‧ Department
333‧‧‧第三塊體 333‧‧‧The third block
3331‧‧‧第一校正部件 3331‧‧‧First calibration unit
3332‧‧‧第一通槽 3332‧‧‧First slot
334‧‧‧第一承導部件 334‧‧‧The first guiding component
335‧‧‧第二滑座 335‧‧‧Second Slide
34‧‧‧第二校正具 34‧‧‧Second correction tool
341‧‧‧第四塊體 341‧‧‧The fourth block
342‧‧‧第五塊體 342‧‧‧The fifth block
343‧‧‧第六塊體 343‧‧‧The sixth block
3431‧‧‧第二校正部件 3431‧‧‧Second calibration component
3432‧‧‧第二通槽 3432‧‧‧Second channel
344‧‧‧第二承導部件 344‧‧‧Second guiding component
345‧‧‧第三滑座 345‧‧‧The third slide
35‧‧‧檢知機構 35‧‧‧Inquiry agency
351‧‧‧投光元件 351‧‧‧Projection element
352‧‧‧接光元件 352‧‧‧Light receiving element
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TWI745136B (en) * | 2020-10-27 | 2021-11-01 | 鴻勁精密股份有限公司 | Position shifter for electronic component support and operating apparatus using the same |
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JP5354419B2 (en) * | 2008-02-18 | 2013-11-27 | アキム株式会社 | Simultaneous alignment device for parts |
KR101198754B1 (en) * | 2009-12-01 | 2012-11-12 | 주식회사 고영테크놀러지 | Tray transporter and side pusher employed in the same |
TWI474016B (en) * | 2013-07-05 | 2015-02-21 | Hon Tech Inc | Lightweight correction unit and its application equipment |
TWI579573B (en) * | 2016-08-26 | 2017-04-21 | Electronic component transfer device and its application test classification equipment | |
TWI631651B (en) * | 2017-10-20 | 2018-08-01 | 鴻勁精密股份有限公司 | Conveying device with bearing unit and test classification device thereof |
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