TW202011036A - Electronic component correction unit and operation classification device using the same capable of accurately correcting electronic components - Google Patents

Electronic component correction unit and operation classification device using the same capable of accurately correcting electronic components Download PDF

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TW202011036A
TW202011036A TW107130716A TW107130716A TW202011036A TW 202011036 A TW202011036 A TW 202011036A TW 107130716 A TW107130716 A TW 107130716A TW 107130716 A TW107130716 A TW 107130716A TW 202011036 A TW202011036 A TW 202011036A
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Taiwan
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electronic component
calibration
component
guide
carrier
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TW107130716A
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Chinese (zh)
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TWI671536B (en
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張家俊
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鴻勁精密股份有限公司
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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

An electronic component correction unit is provided with, on a carrier, a driving mechanism having a driving source and a detent device. The detent device is provided with first and second guide moving parts for receiving a first correcting device and a second correcting device. The first correcting device is configured to receive an electronic component. The first correcting device is provided with a first correcting part for correcting the electronic component, and a first guided part is driven to move by the first guide moving part. The second correcting device is provided with a second correcting part opposite to the first correcting part to correct the electronic component, and a second guided part is driven to move by the second guide moving part. The detent device of the driving mechanism can be used to drive the first correcting device and the second correcting device to perform relative displacements to move and correct the electronic components, so as to achieve the practical benefits of accurately correcting the electronic components.

Description

電子元件校正單元及其應用之作業分類機 Electronic component calibration unit and its applied operation classifier

本發明係提供一種可精準校正電子元件之校正單元。 The invention provides a calibration unit capable of accurately calibrating electronic components.

在現今,電子元件日趨精密輕巧,自動化作業設備係以移料器將電子元件移載至各裝置之承置器,該承置器可為料盤、預溫盤或載台等,若電子元件偏移擺置於承置器內,當移料器將偏置之電子元件移入下一製程之測試座時,由於該偏置之電子元件的中心位置無法對位測試座之中心位置,不僅影響電子元件移入測試座之準確性,更將影響測試品質,故業者係於機台上設有一校正機構,用以校正電子元件之中心位置,以期提升移料器之取放料精準性。 Nowadays, electronic components are becoming more and more precise and lightweight. Automated operation equipment transfers electronic components to the holders of various devices by means of a material shifter. The holder can be a material tray, a pre-heating plate or a stage. The offset is placed in the holder. When the feeder moves the offset electronic component into the test base of the next process, the center position of the offset electronic component cannot be aligned with the center position of the test base, which not only affects The accuracy of moving the electronic components into the test seat will also affect the quality of the test. Therefore, the manufacturer is equipped with a correction mechanism on the machine to correct the center position of the electronic components, in order to improve the accuracy of the pick and place of the feeder.

請參閱第1圖,該校正機構係於一台板11上固設一呈L型之基準件12,並於基準件12之對角處設有一由壓缸13驅動位移之夾持件14,當移料器21將電子元件22移入基準件12與夾持件14之間,且置放於台板11上時,該壓缸13即驅動夾持件14相對基準件12作位移,令夾持件14推移電子元件22,使電子元件22之一角部靠抵於基準件12而定位,進而校正電子元件22之中心位置A,使電子元件22之中心位置A相對於移料器21之中心位置,再供移料器21取出已校正之電子元件22,並移載至下一製程之測試座(圖未示出)而執行測試作業;惟,由於不同型式之電子元件具有不同尺寸,當移料器21將另一批次大尺寸之電子元件23移入校正機構時,該夾持件14雖可推移電子元件23靠抵於基準件12而定位,但大尺寸之電子元件23的中心位置B已改變,當移料器2 1位移至預設取料位置時,移料器21之中心位置並無法對位於大尺寸電子元件23之中心位置B,導致移料器21取出偏置之電子元件23,進而降低校正使用效能。 Please refer to FIG. 1, the calibration mechanism is fixed on a plate 11 with an L-shaped reference member 12, and a clamping member 14 driven and displaced by a pressing cylinder 13 is provided at the diagonal of the reference member 12, When the material shifter 21 moves the electronic component 22 between the reference member 12 and the clamping member 14 and places it on the platen 11, the pressing cylinder 13 drives the clamping member 14 to displace relative to the reference member 12, so that the clamping The holding member 14 pushes the electronic component 22 so that one corner of the electronic component 22 is positioned against the reference member 12 and then corrects the center position A of the electronic component 22 so that the center position A of the electronic component 22 is relative to the center of the material shifter 21 Position, and then the feeder 21 takes out the calibrated electronic components 22 and transfers them to the test base (not shown) of the next process to perform the test operation; however, because different types of electronic components have different sizes, when When the material shifter 21 moves another batch of large-sized electronic components 23 into the calibration mechanism, although the holding member 14 can move the electronic components 23 against the reference member 12 for positioning, the center position of the large-sized electronic components 23 B has been changed. When the shifter 21 moves to the preset retrieving position, the center position of the shifter 21 cannot be located at the center position B of the large-sized electronic component 23, causing the shifter 21 to take out the biased electrons. Element 23, thereby reducing the calibration performance.

本發明之目的一,係提供一種電子元件校正單元,其係於載具上配置具驅動源及掣動具之驅動機構,該掣動具係設有第一、二導移部件,並承置第一校正具及第二校正具,該第一校正具係承置電子元件,並具有校正電子元件之第一校正部件,以及由第一導移部件帶動位移之第一承導部件,該第二校正具係設有相對第一校正部件且校正電子元件之第二校正部件,以及由第二導移部件帶動位移之第二承導部件,利用驅動機構之掣動具帶動第一校正具及第二校正具作相對位移而推移校正電子元件,達到精準校正電子元件之實用效益。 The first object of the present invention is to provide an electronic component calibration unit which is equipped with a driving source and a driving mechanism for a trigger on a carrier. The trigger is provided with first and second guide members and is supported A first calibrator and a second calibrator. The first calibrator supports electronic components, and has a first calibrating component for calibrating the electronic components, and a first guiding component that is displaced by the first guiding component. The two calibrators are provided with a second calibrating component that calibrates the electronic components relative to the first calibrating component, and a second guide component that is displaced by the second deflecting component, and the first calibrator is driven by the driving mechanism The second calibration tool performs relative displacement to shift and calibrate the electronic components, so as to achieve the practical benefit of accurately calibrating the electronic components.

本發明之目的二,係提供一種電子元件校正單元,其更包含檢知機構,該檢知機構係於該第一校正具設有至少一相通第一校正部件之第一通槽,以及於該第二校正具設有至少一相通第二校正部件之第二通槽,另於載具上設置至少一感測器,藉以利用第一、二校正具之第一、二通槽形成的檢知通道,而供感測器檢知第一校正具上是否殘留電子元件,以有效避免疊料或壓損電子元件,達到提升使用效能之實用效益。 The second object of the present invention is to provide an electronic component calibration unit, which further includes a detection mechanism, wherein the detection mechanism is provided on the first calibration tool with at least a first through slot communicating with the first calibration component, and on the The second calibrator is provided with at least one second through slot communicating with the second calibrating component, and at least one sensor is provided on the carrier to utilize the detection formed by the first and second through slots of the first and second calibrators The channel is used for the sensor to detect whether the electronic component remains on the first calibration tool, so as to effectively avoid stacking or pressure damage of the electronic component, and achieve a practical benefit of improving the use performance.

本發明之目的三,係提供一種應用電子元件校正單元之作業分類機,其包含機台、供料裝置、收料裝置、作業裝置、輸送裝置、校正單元及中央控制裝置,該供料裝置係配置於機台上,並設有至少一容納待作業電子元件之供料承置器,該收料裝置係配置於機台上,並設有至少一容納已作業電子元件之收料承置器,該作業裝置係配置於機台上,並設有至少一對電子元件執行預設作業之作業器,該輸送裝置係配置於機台上,並設有至少一移載電子元件之移料器,以及設置至少一本發明之校正單元,以校正電子元件,該中央控制裝置係用以控制及整合各裝置作 動,以執行自動化作業,達到提升作業效能之實用效益。 The third object of the present invention is to provide an operation sorting machine using an electronic component calibration unit, which includes a machine, a feeding device, a receiving device, a working device, a conveying device, a calibration unit and a central control device. The feeding device is It is arranged on the machine table, and is provided with at least one feeding holder for accommodating the electronic components to be operated. The receiving device is arranged on the machine table and is provided with at least one feeding holder for accommodating the operated electronic components. , The working device is arranged on the machine, and is provided with at least one pair of electronic components to perform the preset operation of the working device, the conveying device is arranged on the machine, and is provided with at least one material transfer device And, at least one calibration unit of the present invention is provided to calibrate the electronic components. The central control device is used to control and integrate the actions of each device to perform automated operations, so as to achieve the practical benefit of improving the operating efficiency.

〔習知〕 〔Knowledge〕

11‧‧‧台板 11‧‧‧ Platen

12‧‧‧基準件 12‧‧‧ benchmark

13‧‧‧壓缸 13‧‧‧Press cylinder

14‧‧‧夾持件 14‧‧‧Clamping parts

21‧‧‧移料器 21‧‧‧shifter

22、23‧‧‧電子元件 22, 23‧‧‧Electronic components

A、B‧‧‧中心位置 A, B‧‧‧Central location

〔本發明〕 〔this invention〕

30‧‧‧校正單元 30‧‧‧ Calibration unit

31‧‧‧載具 31‧‧‧Vehicle

311‧‧‧載板 311‧‧‧ carrier board

312‧‧‧第一架體 312‧‧‧The first body

313‧‧‧第二架體 313‧‧‧Second body

314‧‧‧第三架體 314‧‧‧The third body

3141‧‧‧容置空間 3141‧‧‧accommodating space

3142‧‧‧第二滑軌 3142‧‧‧Second Slide

3143‧‧‧第三滑軌 3143‧‧‧The third slide

3144‧‧‧第三通槽 3144‧‧‧The third slot

315‧‧‧第一滑軌 315‧‧‧The first slide

32‧‧‧驅動機構 32‧‧‧Drive mechanism

321‧‧‧馬達 321‧‧‧Motor

3221‧‧‧螺桿 3221‧‧‧screw

3222‧‧‧螺座 3222‧‧‧Screw seat

323‧‧‧掣動具 323‧‧‧brake gear

3231‧‧‧第一導移部件 3231‧‧‧ First guide part

3232‧‧‧第二導移部件 3232‧‧‧Second guide part

324‧‧‧第一滑座 324‧‧‧First Slide

33‧‧‧第一校正具 33‧‧‧First calibrator

331‧‧‧第一塊體 331‧‧‧The first block

332‧‧‧第二塊體 332‧‧‧The second block

3321‧‧‧承置部 3321‧‧‧ Department

333、333A‧‧‧第三塊體 333, 333A ‧‧‧ third block

3331、3331A‧‧‧第一校正部件 3331, 3331A‧‧‧First correction unit

3332、3332A‧‧‧第一通槽 3332, 3332A‧‧‧First slot

334‧‧‧第一承導部件 334‧‧‧The first guiding component

335‧‧‧第二滑座 335‧‧‧Second Slide

L‧‧‧中心軸線 L‧‧‧Central axis

34‧‧‧第二校正具 34‧‧‧Second correction tool

341‧‧‧第四塊體 341‧‧‧The fourth block

342‧‧‧第五塊體 342‧‧‧The fifth block

343、343A‧‧‧第六塊體 343, 343A ‧‧‧ sixth block

3431、3431A‧‧‧第二校正部件 3431, 3431A‧‧‧Second correction part

3432、3432A‧‧‧第二通槽 3432, 3432A‧‧‧Second channel

344‧‧‧第二承導部件 344‧‧‧Second guiding component

345‧‧‧第三滑座 345‧‧‧The third slide

35‧‧‧檢知機構 35‧‧‧Inquiry agency

351‧‧‧投光元件 351‧‧‧Projection element

352‧‧‧接光元件 352‧‧‧Light receiving element

40‧‧‧移料器 40‧‧‧shifter

P‧‧‧中心位置 P‧‧‧Central location

41、42‧‧‧電子元件 41、42‧‧‧Electronic components

C、D‧‧‧中心位置 C, D‧‧‧ Central position

50‧‧‧機台 50‧‧‧machine

60‧‧‧供料裝置 60‧‧‧Feeding device

61‧‧‧供料承置器 61‧‧‧Feeding holder

70‧‧‧收料裝置 70‧‧‧Receiving device

71‧‧‧收料承置器 71‧‧‧ Receiver

80‧‧‧作業裝置 80‧‧‧operating device

81‧‧‧電路板 81‧‧‧ circuit board

82‧‧‧測試座 82‧‧‧Test seat

90‧‧‧輸送裝置 90‧‧‧Conveying device

91‧‧‧第一移料器 91‧‧‧ First material shifter

92‧‧‧第一入料載台 92‧‧‧First loading platform

93‧‧‧第二入料載台 93‧‧‧Second loading table

94‧‧‧第二移料器 94‧‧‧Second material shifter

95‧‧‧第三移料器 95‧‧‧The third feeder

96‧‧‧第一出料載台 96‧‧‧The first discharge platform

97‧‧‧第二出料載台 97‧‧‧Second discharge platform

98‧‧‧第四移料器 98‧‧‧ Fourth material shifter

第1圖:習知電子元件校正機構之使用示意圖。 Figure 1: Schematic diagram of the conventional electronic component calibration mechanism.

第2圖:本發明電子元件校正單元之外觀圖。 Figure 2: The external view of the electronic component correction unit of the present invention.

第3圖:本發明電子元件校正單元之零件分解圖。 Figure 3: Exploded view of the electronic component calibration unit of the present invention.

第4圖:本發明電子元件校正單元之俯視圖。 Figure 4: The top view of the electronic component correction unit of the present invention.

第5圖:係校正小尺寸電子元件之使用示意圖(一)。 Figure 5: Schematic diagram of the use of calibrated small-sized electronic components (1).

第6圖:係校正小尺寸電子元件之使用示意圖(二)。 Figure 6: Schematic diagram of the use of calibrated small-sized electronic components (2).

第7圖:係校正小尺寸電子元件之使用示意圖(三)。 Figure 7: Schematic diagram of the use of calibrated small-sized electronic components (3).

第8圖:係校正小尺寸電子元件之使用示意圖(四)。 Figure 8: Schematic diagram of the use of calibrated small-sized electronic components (4).

第9圖:係校正大尺寸電子元件之使用示意圖(一)。 Figure 9: Schematic diagram of the calibration of large-sized electronic components (1).

第10圖:係校正大尺寸電子元件之使用示意圖(二)。 Figure 10: Schematic diagram of the use of calibrating large-sized electronic components (2).

第11圖:係校正大尺寸電子元件之使用示意圖(三)。 Figure 11: Schematic diagram of the use of calibrating large-sized electronic components (3).

第12圖:係校正單元應用於作業分類機之示意圖。 Figure 12: Schematic diagram of the calibration unit applied to the job sorter.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:請參閱第2、3、4圖,本發明電子元件校正單元30包含載具31、驅動機構32、第一校正具33、第二校正具34及檢知機構35;該載具31係為固定式配置而固設於機台(圖未示出)上,或為活動式配置而由至少一動力源(圖未示出)驅動作至少一方向位移,於本實施例中,該載具31係設有一固設於機台之載板311,並於載板311上設置第一架體312及第二架體313,一跨置固設於第一架體312及第二架體313上之第三架體314,該第三架體314係設有中空之容置空間3141;該驅動機構32係裝配於載具31上,並設有驅動源及由該驅動源驅動位移之掣動具,更進一步,該驅動源可為壓缸、線性馬達或包含馬達及傳動組,於本實施例中,該驅 動源包含馬達321,以及由該馬達321驅動且為螺桿螺座組之傳動組,該馬達321係水平斜向配置,該螺桿螺座組之螺桿3221係連結馬達321,並以螺座3222連結掣動具323,以帶動掣動具323作水平斜向位移,該掣動具323係設有第一導移部件3231及第二導移部件3232,更進一步,第一導移部件3231及第二導移部件3232係為導槽或導桿,於本實施例中,該第一導移部件3231及第二導移部件3232均為導槽,該驅動機構32另於掣動具323與載具31之間設有至少一第一滑軌組,於本實施例中,係於載具31之載板311上固設有呈斜向配置之第一滑軌315,並於掣動具323之底面裝配有可滑置於第一滑軌315上之第一滑座324;該第一校正具33係位於驅動機構32之掣動具323上,並設有至少一承置電子元件之承置部,以及設有至少一校正電子元件之第一校正部件,更進一步,該第一校正具33係為一體成型,或包含複數個塊體,於本實施例中,該第一校正具33係設有第一塊體331、第二塊體332及複數個第三塊體333,該第一塊體331上係裝配一具有承置部3321之第二塊體332,其承置部3321係承置電子元件,並供裝配複數個具第一校正部件3331之第三塊體333,該第一校正部件3331係為一角部,用以校正電子元件,又該第一校正具33係設有至少一與掣動具323之第一導移部件3231相互配合之第一承導部件334,於本實施例中,係於第一塊體331之底面設置一為導桿之第一承導部件334,並令第一承導部件334插置且位移於掣動具323之第一導移部件3231,另於第一校正具33與載具31之第三架體314間係設有至少一第二滑軌組,於本實施例中,係於載具31之第三架體314固設呈斜向配置之第二滑軌3142,並於第一校正具33之第一塊體331上裝配有滑置於第二滑軌3142上之第二滑座335;該第二校正具34係位於驅動機構32之掣動具323上,並設有至 少一相對第一校正部件3331且校正電子元件之第二校正部件,更進一步,該第二校正具34係為一體成型,或包含複數個塊體,於本實施例中,該第二校正具34係設有第四塊體341、第五塊體342及複數個第六塊體343,該第四塊體341上係裝配第五塊體342,該第五塊體342係裝配複數個具第二校正部件3431之第六塊體343,該第二校正部件3431係為一角部,用以校正電子元件,又該第二校正具34係設有至少一與掣動具323之第二導移部件3232相互配合之第二承導部件344,於本實施例中,係於第四塊體341之底面設置一為導桿之第二承導部件344,並令第二承導部件344插置且位移於掣動具323之第二導移部件3232,另於第二校正具34與載具31之第三架體314間係設有至少一第三滑軌組,於本實施例中,係於載具31之第三架體314固設有呈斜向配置之第三滑軌3143,並於第二校正具34之第四塊體341上裝配有滑置於第二滑軌3143上之第三滑座345;該檢知機構35係於載具31設有至少一感測器,並於第一校正具33及第二校正具34分別開設有相對應之第一通槽及第二通槽,以供感測器檢知第一校正具33上是否殘留電子元件,於本實施例中,該感測器係於載具31之第一架體312裝配一投光元件351,並於第二架體313裝配一接光元件352,另於第一校正具33之各第三塊體333開設有相通第一校正部件3331之第一通槽3332,以及於第二校正具34之各第六塊體343開設有相通第二校正部件3431之第二通槽3432,以及於載具31之第三架體314開設有第三通槽3144,使得第一通槽3332、第二通槽3432及第三通槽3144形成一檢知通道,以供檢知第一校正具33上是否殘留電子元件。 In order for your reviewer to understand the present invention further, a preferred embodiment is given in conjunction with the drawings, which will be described in detail as follows: please refer to Figures 2, 3, and 4, the electronic component calibration unit 30 of the present invention includes a carrier 31. The driving mechanism 32, the first calibrator 33, the second calibrator 34, and the detection mechanism 35; the carrier 31 is a fixed configuration and fixed on the machine (not shown), or is movable It is configured to be driven by at least one power source (not shown) for displacement in at least one direction. In this embodiment, the carrier 31 is provided with a carrier plate 311 fixed on the machine platform, and disposed on the carrier plate 311 The first frame 312 and the second frame 313 are a third frame 314 fixed on the first frame 312 and the second frame 313. The third frame 314 is provided with a hollow space Space 3141; the driving mechanism 32 is assembled on the carrier 31, and is provided with a driving source and a driving device for displacement driven by the driving source. Further, the driving source may be a pressing cylinder, a linear motor or include a motor and a transmission In this embodiment, the driving source includes a motor 321 and a transmission group driven by the motor 321 and is a screw screw group. The motor 321 is horizontally and diagonally arranged, and the screw 3221 of the screw screw group is connected The motor 321 is connected to the catcher 323 with a screw base 3222 to drive the catcher 323 for horizontal oblique displacement. The catcher 323 is provided with a first guide member 3231 and a second guide member 3232. The first guide member 3231 and the second guide member 3232 are guide grooves or guide rods. In this embodiment, the first guide member 3231 and the second guide member 3232 are guide grooves, and the driving mechanism 32. At least one first slide rail set is provided between the actuator 323 and the carrier 31. In this embodiment, a first slide in an oblique configuration is fixed on the carrier plate 311 of the carrier 31 Rail 315, and on the bottom surface of the actuator 323 is equipped with a first sliding seat 324 that can be slid on the first slider 315; the first correcting tool 33 is located on the actuator 323 of the driving mechanism 32, and is provided There is at least one receiving portion for receiving electronic components, and a first calibration component provided with at least one calibration electronic component. Furthermore, the first calibration tool 33 is integrally formed, or includes a plurality of blocks, in this embodiment In the example, the first calibrator 33 is provided with a first block 331, a second block 332 and a plurality of third blocks 333. The first block 331 is equipped with a second having a receiving portion 3321 The block 332, the receiving portion 3321 is used to receive electronic components, and is used for assembling a plurality of third blocks 333 with a first correction component 3331. The first correction component 3331 is a corner for correcting electronic components, Furthermore, the first calibration tool 33 is provided with at least one first guide member 334 which cooperates with the first guide member 3231 of the detent device 323. In this embodiment, it is provided on the bottom surface of the first block 331 One is the first guide member 334 of the guide rod, and the first guide member 334 is inserted and displaced on the first guide of the actuator 323 The moving part 3231 is further provided with at least one second sliding rail set between the first calibrator 33 and the third frame 314 of the carrier 31. In this embodiment, it is attached to the third frame 314 of the carrier 31 The second slide rail 3142 in an oblique configuration is fixed, and a second slide seat 335 that is slid on the second slide rail 3142 is mounted on the first block 331 of the first corrector 33; the second corrector 34 is located on the actuator 323 of the driving mechanism 32, and is provided with at least one second calibration component that is opposite to the first calibration component 3331 and calibrates the electronic components. Furthermore, the second calibration component 34 is integrally formed, or includes A plurality of blocks, in this embodiment, the second calibration tool 34 is provided with a fourth block 341, a fifth block 342 and a plurality of sixth blocks 343, the fourth block 341 is assembled with Five blocks 342, the fifth block 342 is equipped with a plurality of sixth blocks 343 with a second correction part 3431, the second correction part 3431 is a corner for correcting electronic components, and the second correction The tool 34 is provided with at least one second guide member 344 which cooperates with the second guide member 3232 of the actuator 323. In this embodiment, a guide rod is provided on the bottom surface of the fourth block 341 The second guiding member 344, and the second guiding member 344 is inserted and displaced on the second guiding member 3232 of the actuator 323, and between the second calibration tool 34 and the third frame 314 of the carrier 31 At least one third slide rail set is provided. In this embodiment, the third frame 314 of the carrier 31 is fixed with a third slide rail 3143 arranged obliquely, and The fourth block 341 is equipped with a third sliding seat 345 that is slid on the second sliding rail 3143; the detection mechanism 35 is provided with at least one sensor on the carrier 31, and the first calibration tool 33 and The second calibration tool 34 is respectively provided with a corresponding first through slot and a second through slot for the sensor to detect whether the electronic component remains on the first calibration tool 33. In this embodiment, the sensor is A light-emitting element 351 is assembled on the first frame 312 of the carrier 31, and a light-receiving element 352 is assembled on the second frame 313, and each third block 333 of the first calibration device 33 is provided with a communicating first The first through slot 3332 of the calibration component 3331, and each sixth block 343 of the second calibration tool 34 is provided with a second through slot 3332 communicating with the second calibration component 3431, and a third frame 314 of the carrier 31 A third through-slot 3144 is provided, so that the first through-slot 3332, the second through-slot 3332, and the third through-slot 3144 form a detection channel for detecting whether electronic components remain on the first calibration tool 33.

請參閱第5圖,於執行校正電子元件作業前,該校正單元30係以檢知機構35之投光元件351經第一校正具3 3之第一通槽3332及第二校正具34之第二通槽3432及載具31之第三通槽3144所形成的檢知通道投射光線,當接光元件352經由檢知通道接收到光線時,即代表第一校正具33之承置部3321上並無殘留電子元件,進而有效避免疊料或壓損電子元件,反之,若無接收到光線,則代表第一校正具33之承置部3321上殘留電子元件或驅動源異常,工作人員即需排除異常。 Please refer to FIG. 5, before performing the calibration of the electronic component, the calibration unit 30 uses the light emitting element 351 of the detection mechanism 35 through the first through slot 3332 of the first calibration tool 33 and the third of the second calibration tool 34 The detection channel formed by the second channel 3432 and the third channel 3144 of the carrier 31 projects light. When the light receiving element 352 receives the light through the detection channel, it represents the receiving portion 3321 of the first calibration tool 33 There is no residual electronic component, which effectively avoids stacking or pressure damage to the electronic component. On the contrary, if no light is received, it means that the residual electronic component or driving source on the receiving portion 3321 of the first calibration tool 33 is abnormal, and the staff needs Eliminate exceptions.

請參閱第6圖,於檢知作業完畢,該校正單元30之驅動機構32係以馬達321經螺桿3221及螺座3222帶動該掣動具323位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向外位移,使第一校正具33之承置部3321提供一較大之入料空間,以供移料器40作Z方向位移順利將偏置之電子元件41移入第一校正具33之承置部3321。 Please refer to FIG. 6. After the detection operation is completed, the driving mechanism 32 of the calibration unit 30 is driven by the motor 321 via the screw 3221 and the screw base 3222 to move the actuator 323, and the actuator 323 is moved by the first guide The part 3231 and the second guide part 3232 guide the displacement of the first guide part 334 of the first calibrator 33 and the second guide part 344 of the second calibrator 34 to drive the first calibrator 33 and the second The two calibrators 34 are respectively displaced outwards, so that the receiving portion 3321 of the first calibrator 33 provides a larger feeding space for the Z-direction displacement of the feeder 40 to smoothly move the offset electronic component 41 into the first The receiving portion 3321 of the correction tool 33.

請參閱第7圖,接著該驅動機構32係以馬達321經螺桿3221及螺座3222帶動該掣動具323反向位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向內位移,由於電子元件41係置放於第一校正具33之承置部3321,該第一校正具33係會帶動電子元件41朝向第二校正具34作相對位移,同時,該第二校正具34之第二校正部件3431會頂推電子元件41位移,令電子元件41靠置於第一校正具33之第一校正部件3331,使得第一校正具33之第一校正部件3331及第二校正具34之第二校正部件3431校正電子元件41,由於驅動機構32係以掣動具323之第一導移部件3231及第二導移部件 3232同步作動導引第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,而可使第一校正具33及第二校正具34具有相同之位移行程,以令第一校正具33之第一校正部件3331及第二校正具34之第二校正部件3431夾持推移電子元件41之中心位置C對位於第一校正具33之承置部3321的中心軸線L,進而校正電子元件41之中心位置C。 Please refer to FIG. 7, and then the driving mechanism 32 is driven by the motor 321 through the screw 3221 and the screw base 3222 to drive the actuator 323 to reverse displacement, and the actuator 323 is moved by the first guide member 3231 and the second guide The component 3232 guides the displacement of the first guiding component 334 of the first calibrator 33 and the second guiding component 344 of the second calibrator 34 to drive the first calibrator 33 and the second calibrator 34 inward, respectively Displacement, since the electronic component 41 is placed on the receiving portion 3321 of the first calibrator 33, the first calibrator 33 will drive the electronic component 41 to move relative to the second calibrator 34, and at the same time, the second calibrator The second calibration component 3431 of 34 will push the displacement of the electronic component 41, so that the electronic component 41 leans against the first calibration component 3331 of the first calibration tool 33, so that the first calibration component 3331 of the first calibration tool 33 and the second calibration The second correction part 3431 of the tool 34 corrects the electronic component 41, because the driving mechanism 32 uses the first guide part 3231 and the second guide part 3232 of the stopper 323 to synchronously actuate and guide the first bearing of the first correction tool 33 The guide member 334 and the second guide member 344 of the second calibrator 34 are displaced, so that the first calibrator 33 and the second calibrator 34 have the same displacement stroke, so that the first calibrator of the first calibrator 33 The 3331 and the second calibration member 3431 of the second calibration tool 34 clamp the center position C of the electronic component 41 to the central axis L of the receiving portion 3321 of the first calibration tool 33, and then correct the center position C of the electronic component 41.

請參閱第8圖,於完成校正作業後,該校正單元30之驅動機構32係以馬達321經螺桿3221及螺座3222帶動該掣動具323位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向外位移,當移料器40位移至預設取料位置時,由於移料器40之中心位置P已預設對位於第一校正具33之承置部3321的中心軸線L,使得移料器40之中心位置P即可對位於電子元件41之中心位置C,該移料器40即可作Z方向向下位移而精準取出電子元件41,以利準確將電子元件41移入至下一作業器(如測試座,圖未示出)。 Please refer to FIG. 8. After the calibration operation is completed, the driving mechanism 32 of the calibration unit 30 is driven by the motor 321 via the screw 3221 and the screw base 3222 to move the actuator 323, and the actuator 323 is moved by the first guide The part 3231 and the second guide part 3232 guide the displacement of the first guide part 334 of the first calibrator 33 and the second guide part 344 of the second calibrator 34 to drive the first calibrator 33 and the second The two calibration tools 34 are respectively displaced outwards. When the material shifter 40 is moved to the preset retrieving position, the center position P of the material shifter 40 has been preset to the central axis of the receiving portion 3321 of the first calibration tool 33 L, so that the center position P of the material shifter 40 can be positioned at the center position C of the electronic component 41, and the material shifter 40 can be displaced downward in the Z direction to accurately take out the electronic component 41, so as to accurately place the electronic component 41 Move to the next operating device (such as test stand, not shown).

請參閱第9圖,欲校正大尺寸之電子元件42時,該校正單元30可更換第一校正具33之第三塊體,而於第二塊體332上換裝不同尺寸之複數個具有第一校正部件3331A及第一通槽3332A的第三塊體333A,以及更換第二校正具34之第六塊體,而於第五塊體342上換裝不同尺寸之複數個具有第二校正部件3431A及第二通槽3432A的第六塊體343A;該驅動機構32之馬達321係經由螺桿3221及螺座3222帶動該掣動具323位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承 導部件344位移,以帶動第一校正具33及第二校正具34分別向外位移,使第一校正具33及第二校正具34之間提供一較大之入料空間,該移料器40即可帶動偏置之電子元件42作Z方向向下位移置放於第一校正具33之承置部3321。 Please refer to FIG. 9, when calibrating the electronic component 42 with a large size, the calibration unit 30 can replace the third block of the first calibration tool 33, and replace a plurality of multiple blocks with different sizes on the second block 332. A correction component 3331A and the third block 333A of the first through slot 3332A, and the sixth block of the second correction tool 34 is replaced, and a plurality of second correction components of different sizes are replaced on the fifth block 342 3431A and the sixth block 343A of the second through slot 3432A; the motor 321 of the driving mechanism 32 drives the actuator 323 to move through the screw 3221 and the screw base 3222, and the actuator 323 uses the first guide member 3231 And the second guide member 3232 guide the displacement of the first guide member 334 of the first correction tool 33 and the second guide member 344 of the second correction tool 34 to drive the first correction tool 33 and the second correction The tools 34 are respectively displaced outwards to provide a larger feeding space between the first calibrator 33 and the second calibrator 34, and the material shifter 40 can drive the offset electronic component 42 to move downward in the Z direction It is placed on the receiving portion 3321 of the first calibration tool 33.

請參閱第10圖,接著該驅動機構32係以馬達321經螺桿3221及螺座3222帶動該掣動具323反向位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向內位移,該第一校正具33係會帶動電子元件42朝向第二校正具34作相對位移,同時,該第二校正具34之第二校正部件3431A會頂推電子元件42位移,令電子元件42靠置於第一校正具33之第一校正部件3331A,使得第一校正具33之第一校正部件3331A及第二校正具34之第二校正部件3431A夾持推移電子元件42之中心位置D對位於第一校正具33之承置部3321的中心軸線L,進而校正電子元件42之中心位置D。 Please refer to FIG. 10, and then the driving mechanism 32 is driven by the motor 321 through the screw 3221 and the screw base 3222 to drive the actuator 323 to reverse displacement, and the actuator 323 is moved by the first guide member 3231 and the second guide The component 3232 guides the displacement of the first guiding component 334 of the first calibrator 33 and the second guiding component 344 of the second calibrator 34 to drive the first calibrator 33 and the second calibrator 34 inward, respectively Displacement, the first calibration tool 33 will drive the electronic component 42 to make relative displacement towards the second calibration tool 34, and at the same time, the second calibration component 3431A of the second calibration tool 34 will push the electronic component 42 to move, causing the electronic component 42 Leaning on the first calibration component 3331A of the first calibration tool 33 so that the first calibration component 3331A of the first calibration tool 33 and the second calibration component 3431A of the second calibration tool 34 sandwich the center position D of the electronic component 42 It is located at the central axis L of the receiving portion 3321 of the first calibration tool 33, and further calibrates the central position D of the electronic component 42.

請參閱第11圖,於完成校正作業後,該驅動機構32之馬達321經由螺桿3221及螺座3222帶動該掣動具323位移,該掣動具323即以第一導移部件3231及第二導移部件3232分別導引頂推第一校正具33之第一承導部件334及第二校正具34之第二承導部件344位移,以帶動第一校正具33及第二校正具34分別向外位移,當移料器40位移至預設取料位置時,由於移料器40之中心位置P已預設對位於第一校正具33之承置部3321的中心軸線L,使得移料器40之中心位置P即可對位於電子元件42之中心位置D,該移料器40即可作Z方向向下位移而精準取出電子元件42,以利準確將電子元件42移入至下一作業器(如測試座,圖未示出)。 Please refer to FIG. 11, after the calibration operation is completed, the motor 321 of the driving mechanism 32 drives the actuator 323 to move through the screw 3221 and the screw base 3222, and the actuator 323 uses the first guide member 3231 and the second The guide member 3232 guides the displacement of the first guide member 334 of the first correction tool 33 and the second guide member 344 of the second correction tool 34 to drive the first correction tool 33 and the second correction tool 34 respectively Displace outward, when the shifter 40 moves to the preset retrieving position, the center position P of the shifter 40 has been preset to the central axis L of the receiving portion 3321 of the first calibration tool 33, so that the shifter The center position P of the device 40 can be located at the center position D of the electronic component 42. The material shifter 40 can be moved downward in the Z direction to accurately take out the electronic component 42, so as to accurately move the electronic component 42 to the next operation Device (such as test socket, not shown).

請參閱第2、3、4、12圖,係本發明校正單元 30應用於電子元件作業分類機之示意圖,該作業分類機係於機台50上配置有供料裝置60、收料裝置70、作業裝置80、輸送裝置90及中央控制裝置(圖未示出);該供料裝置60係裝配於機台50,並設有至少一為供料盤之供料承置器61,用以容納至少一待作業之電子元件;該收料裝置70係裝配於機台50,並設有至少一為收料盤之收料承置器71,用以容納至少一已作業之電子元件;該作業裝置80係裝配於機台50,並設有至少一作業器,以對電子元件執行預設作業,於本實施例中,該作業器係為測試器,該測試器係設有電性連接之電路板81及測試座82,並以測試座82承置及測試電子元件;該輸送裝置90係裝配於機台50上,並設有至少一移載電子元件之移料器,以及設置至少一本發明之校正單元30,以校正電子元件,於本實施例中,該輸送裝置90係設有第一移料器91,以於供料裝置60之供料承置器61取出待測之電子元件,並移載至第一入料載台92及第二入料載台93,第一入料載台92及第二入料載台93將待測之電子元件載送至測試裝置80之側方,該輸送裝置90係以第二移料器94及第三移料器95於第一入料載台92及第二入料載台93取出待測之電子元件,並分別移入二校正單元30而校正電子元件,再以第二移料器94及第三移料器95將二校正單元30內已校正之電子元件移載至作業裝置80之測試座82而執行測試作業,以及將測試座82之已測電子元件移載至第一出料載台96及第二出料載台97,第一出料載台96及第二出料載台97載出已測之電子元件,該輸送裝置90係以第四移料器98於第一出料載台96及第二出料載台97上取出已測之電子元件,並依據測試結果,將已測之電子元件輸送至收料裝置70之收料承置器71處而分類收置;該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。 Please refer to Figures 2, 3, 4, and 12, which is a schematic diagram of the calibration unit 30 of the present invention applied to an electronic component operation sorting machine. The operation sorting machine is provided with a feeding device 60 and a receiving device 70 on a machine 50. Working device 80, conveying device 90 and central control device (not shown); the feeding device 60 is assembled on the machine 50, and is provided with at least one feeding receptacle 61 which is a feeding tray for accommodating At least one electronic component to be operated; the receiving device 70 is assembled on the machine 50 and is provided with at least one receiving receptacle 71 as a receiving tray for accommodating at least one electronic component that has been operated; The device 80 is assembled on the machine 50 and is provided with at least one operating device to perform preset operations on electronic components. In this embodiment, the operating device is a tester, and the tester is provided with an electrical connection The circuit board 81 and the test base 82, and the test base 82 is used to support and test electronic components; the conveying device 90 is assembled on the machine 50, and is provided with at least one feeder for transferring electronic components, and at least one The calibration unit 30 of the present invention calibrates electronic components. In this embodiment, the conveying device 90 is provided with a first material shifter 91 to take out the electrons to be measured from the feeding holder 61 of the feeding device 60 Components, and transfer them to the first feeding stage 92 and the second feeding stage 93. The first feeding stage 92 and the second feeding stage 93 carry the electronic components to be tested to the testing device 80 On the side, the conveying device 90 uses the second material shifter 94 and the third material shifter 95 to take out the electronic components to be tested on the first material loading platform 92 and the second material loading platform 93, and move them into the second calibration respectively Unit 30 to calibrate the electronic components, and then use the second material shifter 94 and the third material shifter 95 to transfer the calibrated electronic components in the second calibration unit 30 to the test seat 82 of the operating device 80 to perform the test operation, and transfer The measured electronic components of the test base 82 are transferred to the first discharge carrier 96 and the second discharge carrier 97, and the first discharge carrier 96 and the second discharge carrier 97 carry the measured electronic components, The conveying device 90 takes out the measured electronic components on the first discharge carrier 96 and the second discharge carrier 97 by the fourth shifter 98, and according to the test result, conveys the measured electronic components to the receiving unit The receiving device 71 of the feeding device 70 is sorted and stored; the central control device is used to control and integrate the actions of each device to perform automated operations, so as to achieve the practical benefit of improving the operating efficiency.

31‧‧‧載具 31‧‧‧Vehicle

311‧‧‧載板 311‧‧‧ carrier board

312‧‧‧第一架體 312‧‧‧The first body

313‧‧‧第二架體 313‧‧‧Second body

314‧‧‧第三架體 314‧‧‧The third body

3141‧‧‧容置空間 3141‧‧‧accommodating space

3142‧‧‧第二滑軌 3142‧‧‧Second Slide

3143‧‧‧第三滑軌 3143‧‧‧The third slide

3144‧‧‧第三通槽 3144‧‧‧The third slot

315‧‧‧第一滑軌 315‧‧‧The first slide

32‧‧‧驅動機構 32‧‧‧Drive mechanism

321‧‧‧馬達 321‧‧‧Motor

3221‧‧‧螺桿 3221‧‧‧screw

3222‧‧‧螺座 3222‧‧‧Screw seat

323‧‧‧掣動具 323‧‧‧brake gear

3231‧‧‧第一導移部件 3231‧‧‧ First guide part

3232‧‧‧第二導移部件 3232‧‧‧Second guide part

324‧‧‧第一滑座 324‧‧‧First Slide

33‧‧‧第一校正具 33‧‧‧First calibrator

331‧‧‧第一塊體 331‧‧‧The first block

332‧‧‧第二塊體 332‧‧‧The second block

3321‧‧‧承置部 3321‧‧‧ Department

333‧‧‧第三塊體 333‧‧‧The third block

3331‧‧‧第一校正部件 3331‧‧‧First calibration unit

3332‧‧‧第一通槽 3332‧‧‧First slot

334‧‧‧第一承導部件 334‧‧‧The first guiding component

335‧‧‧第二滑座 335‧‧‧Second Slide

34‧‧‧第二校正具 34‧‧‧Second correction tool

341‧‧‧第四塊體 341‧‧‧The fourth block

342‧‧‧第五塊體 342‧‧‧The fifth block

343‧‧‧第六塊體 343‧‧‧The sixth block

3431‧‧‧第二校正部件 3431‧‧‧Second calibration component

3432‧‧‧第二通槽 3432‧‧‧Second channel

344‧‧‧第二承導部件 344‧‧‧Second guiding component

345‧‧‧第三滑座 345‧‧‧The third slide

35‧‧‧檢知機構 35‧‧‧Inquiry agency

351‧‧‧投光元件 351‧‧‧Projection element

352‧‧‧接光元件 352‧‧‧Light receiving element

Claims (10)

一種電子元件校正單元,包含:載具;驅動機構:係裝配於該載具上,並設有驅動源及由該驅動源驅動位移之掣動具,該掣動具係設有第一導移部件及第二導移部件;第一校正具:係位於該驅動機構之掣動具上,並設有至少一承置電子元件之承置部,以及設有至少一校正電子元件之第一校正部件,另該第一校正具係設有至少一與該掣動具之第一導移部件相互配合之第一承導部件;第二校正具:係位於該驅動機構之掣動具上,並設有至少一校正電子元件之第二校正部件,另該第二校正具係設有至少一與該掣動具之第二導移部件相互配合之第二承導部件。 An electronic component correction unit, comprising: a carrier; a driving mechanism: is mounted on the carrier, and is provided with a driving source and a driving device for displacement driven by the driving source, the switching device is provided with a first guiding Component and second guide component; first calibration tool: it is located on the actuator of the driving mechanism, and is provided with at least one receiving portion for receiving electronic components, and a first calibration with at least one calibration electronic component Components, and the first calibrator is provided with at least one first guide component that cooperates with the first guide component of the actuator; the second calibrator: is located on the actuator of the driving mechanism, and At least one second calibration component for calibrating electronic components is provided, and the second calibration component is provided with at least one second guide component that cooperates with the second guide component of the actuator. 依申請專利範圍第1項所述之電子元件校正單元,其中,該載具係設有載板,該載板設有第一架體及第二架體,一裝配於該第一架體及該第二架體之第三架體,該第三架體係設有容置空間。 The electronic component calibration unit according to item 1 of the scope of the patent application, wherein the carrier is provided with a carrier plate, the carrier plate is provided with a first frame body and a second frame body, an assembly on the first frame body and In the third frame body of the second frame body, the third frame system is provided with an accommodating space. 依申請專利範圍第1項所述之電子元件校正單元,其中,該驅動機構之第一導移部件及該第一校正具之第一承導部件係為相互配合之導槽及導桿,該驅動機構之第二導移部件及該第二校正具之第二承導部件係為相互配合之導槽及導桿。 The electronic component correction unit according to item 1 of the patent application scope, wherein the first guide member of the drive mechanism and the first guide member of the first correction tool are guide grooves and guide rods cooperating with each other, the The second guide member of the driving mechanism and the second guide member of the second correction tool are guide grooves and guide rods that cooperate with each other. 依申請專利範圍第1項所述之電子元件校正單元,其中,該驅動機構係於該掣動具與該載具之間設有至少一第一滑軌組。 The electronic component calibration unit according to item 1 of the patent application scope, wherein the driving mechanism is provided with at least one first slide rail group between the actuator and the carrier. 依申請專利範圍第1項所述之電子元件校正單元,其中,該第一校正具係設有第一塊體、第二塊體及複數個第三塊體,該第二塊體係設有該承置部,該第三塊體係設有該第一校正部 件,該第二校正具係設有第四塊體、第五塊體及複數個第六塊體,該第六塊體係設有該第二校正部件。 The electronic component calibration unit according to item 1 of the patent application scope, wherein the first calibration tool is provided with a first block, a second block and a plurality of third blocks, and the second block system is provided with the The receiving part, the third block system is provided with the first correction component, the second correction device is provided with a fourth block, a fifth block and a plurality of sixth blocks, the sixth block system is provided with the Second correction component. 依申請專利範圍第1項所述之電子元件校正單元,其中,該第一校正具與該載具之間係設有至少一第二滑軌組。 The electronic component calibration unit according to item 1 of the patent application scope, wherein at least one second slide rail set is provided between the first calibration tool and the carrier. 依申請專利範圍第1項所述之電子元件校正單元,其中,該第二校正具與該載具之間係設有至少一第三滑軌組。 The electronic component calibration unit according to item 1 of the patent application scope, wherein at least one third slide rail set is provided between the second calibration tool and the carrier. 依申請專利範圍第1項所述之電子元件校正單元,更包含檢知機構,該檢知機構係設有至少一感測器,該感測器係裝配於該載具。 The electronic component calibration unit according to item 1 of the patent application scope further includes a detection mechanism, the detection mechanism is provided with at least one sensor, and the sensor is mounted on the carrier. 依申請專利範圍第8項所述之電子元件校正單元,其中,該檢知機構係於該第一校正具開設有第一通槽,並於該第二校正具開設有第二通槽,該第一通槽及該第二通槽係形成檢知通道,以供該感測器檢知該第一校正具之承置部。 The electronic component calibration unit according to item 8 of the patent application scope, wherein the detection mechanism is provided with a first through slot in the first calibration tool and a second through slot in the second calibration tool, the The first through-slot and the second through-slot form a detection channel for the sensor to detect the receiving portion of the first calibration tool. 一種應用電子元件校正單元之作業分類機,包含:機台;供料裝置:係配置於該機台上,並設有至少一供料承置器,用以容納至少一待作業之電子元件;收料裝置:係配置於該機台上,並設有至少一收料承置器,用以容納至少一已作業之電子元件;作業裝置:係配置於該機台上,並設有至少一作業器,以對電子元件執行預設作業;輸送裝置:係配置於該機台上,並設有至少一移載電子元件之移料器,以及設置至少一依申請專利範圍第1項所述之電子元件校正單元;中央控制裝置:係用以控制及整合各裝置作動,以執行自動化作業。 An operation sorting machine using an electronic component correction unit, comprising: a machine; a feeding device: it is arranged on the machine and is provided with at least one feeding holder for accommodating at least one electronic component to be operated; Receiving device: It is arranged on the machine, and is provided with at least one receiving receiver for accommodating at least one electronic component that has been operated; Operating device: It is arranged on the machine and is provided with at least one Operating device to perform preset operations on electronic components; conveying device: it is arranged on the machine and is provided with at least one feeder for transferring electronic components, and at least one is set as described in item 1 of the patent application scope Electronic component calibration unit; central control device: used to control and integrate the actions of each device to perform automated operations.
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