TWI593980B - Electronic components operating device and its application test classification equipment - Google Patents

Description

Electronic component operating device and its application test classification equipment

The invention provides a first operator for moving the first and second transfer carriers by using a transfer mechanism transversely disposed on the first and second working areas, so that the first transfer carrier is in the first working area and the first working device Transferring the electronic components between the stages, and synchronizing the second transfer carrier with the second carrier and the second stage to transfer the electronic components, thereby not only enhancing the transfer of the first and second transfer carriers Efficient, and simplify the components for transfer and facilitate the space configuration, thereby improving the production efficiency and cost-saving electronic component operation device.

Please refer to Figures 1, 2 and 3, which are schematic diagrams of a conventional working device, which is provided with a test mechanism 11 having a test circuit board 111 and a test socket 112 on the machine table, and the test seat 112 is provided with upward facing The plurality of probes are configured to contact the electrical contacts of the electronic component to be tested, and the transport mechanism 12 is disposed on one side of the testing mechanism 11 and is provided with a loading stage 121 for the first direction displacement (such as the X direction). For carrying the electronic component to be tested, and on the other side of the testing mechanism 11 is provided a discharge carrier 122 for the first direction displacement for carrying the measured electronic component, and a transfer mechanism 13 The first motor 1321 and the first transmission group 1322 are disposed on the frame 131, and the first transmission group 1322 drives a first L-shaped arm 133 to be displaced in the second direction (such as the Z direction). The first L-shaped arm 133 is provided with a first pick-and-place member 1331 for picking and placing electronic components, and the second motor 1341 and the second transmission group 1342 are disposed on the frame 131, and the second transmission group 1342 drives a second. The L-shaped arm 135 is displaced in the second direction, and the second L-shaped arm 135 is provided with the second pick-and-place member 1351 for taking and placing electronic components, and the transfer mechanism 13 The first pick-and-place member 1331 and the second pick-and-place member 1351 are displaced in the third direction (such as the Y direction), and the electronic components are transferred between the testing mechanism 11 and the transport mechanism 12, and the transfer mechanism 13 is attached to the first transmission group. A first slide rail 1323 and a first slide seat 1332 are disposed between the first L-shaped arm 133 and the first L-shaped arm 133, and a first movable seat 136 is disposed on the two sides of the first L-shaped arm 133. a second sliding rail 1333 and a second sliding seat 1361 which are arranged in a second direction and which are mutually matched, and then The first moving seat 136 is driven by the third driving unit 1372 to be displaced in the third direction by the third driving unit 1372, so that the first moving seat 136 drives the first L-shaped arm 133 and the first pick-and-place member 1331 to be displaced in the third direction. In addition, a third sliding rail 1343 and a third sliding gate 1352 are disposed between the second transmission group 1342 and the second L-shaped arm 135, and are disposed on the two sides of the second L-shaped arm 135. A fourth sliding rail 1353 and a fourth sliding seat 1381 disposed in a second direction are disposed between the second moving base 138, and the second moving base 138 is driven by the fourth driving unit 1392 via a fourth motor 1391. The displacement of the third direction causes the second movable seat 138 to drive the second L-shaped arm 135 and the second pick-and-place member 1351 to be displaced in the third direction; for example, the first L-shaped arm 133 transfers the electronic component, the third motor 1371 The third movement group 1372 is used to drive the first movement seat 136 for the third direction displacement. The first movement base 136 drives the first L-shaped arm 133 and the first pick-and-place member 1331 via the second sliding seat 1361 and the second sliding rail 1333. Displacement in the third direction, the first L-shaped arm 133 is slid along the first sliding rail 1323 by the first sliding seat 1332 and located at the conveying mechanism 12 Above the material stage 121, the first motor 1321 drives the first L-shaped arm 133 to be displaced in the second direction via the first transmission group 1322, so that the first pick-and-place unit 1331 takes out the electrons to be tested at the loading stage 121. After the retrieving, the third motor 1371 drives the first L-shaped arm 133 and the first pick-and-place member 1331 to be tested in the third direction to the testing mechanism 11 via the third transmission group 1372 and the first moving seat 136. The first L-shaped arm 133 is driven by the first motor 1322 to be displaced in the second direction by the first motor 1321, so that the first pick-and-place member 1331 presses the electronic component to be tested into the test socket 112. After the test is completed, after the test is completed, the first L-shaped arm 133 of the transfer mechanism 13 performs the second and third-direction displacement to transfer the measured electronic components to the discharge stage 122 of the transport mechanism 12 so as to be Output; however, since the loading and unloading stages 121, 122 are located on both sides of the testing mechanism 11, the transfer mechanism 13 must be configured to move the first movement in order to displace the first and second pick-and-place members 1331, 1351 in the Y direction. Seat 136, third motor 1371, third transmission group 1372, second moving seat 138, fourth motor 1391 And the fourth transmission group 1392 and other components for transfer, not only the overall mechanism is quite complicated, but also increases the mechanism cost and is not conducive to the device space configuration; further, when the second pick-and-place member 135 is displaced in the Y direction, the tested electronic components are tested. After the seat 112 is transferred to the discharge stage 122, it must be reversely displaced in the Y direction across the test seat 112 before being displaced to the loading stage 121 to continue to take the next test. The electronic components, so as to increase the transfer stroke and the operation time, can not improve the lack of test capacity.

An object of the present invention is to provide an electronic component working device which is arranged in an operating mechanism and a transporting mechanism in the first and second working areas of the machine, and the working mechanism is provided in the first and second working areas. The first and second operators perform preset operations on the electronic components. The transport mechanism is provided with first and second stages for carrying electronic components in the first and second working areas, and a transfer mechanism is provided with a driver, and The driver drives a carrier displacement across the first and second working areas, and the first and second transfer carriers of the transferable electronic component are disposed on both sides of the carrier; thereby, the transfer mechanism utilizes the carrier to drive the first and second The transfer carrier synchronously shifts in the X direction, so that the first transfer carrier transfers the electronic component between the first operator and the first carrier in the first working area, and synchronizes the second transfer carrier to the second working area. The transfer of electronic components between the second operator and the second carrier not only improves the transfer efficiency of the first and second transfer carriers, but also simplifies the components for transfer and facilitates space configuration, thereby improving the practical production efficiency and saving cost. benefit.

An object of the present invention is to provide an electronic component working device, wherein the transfer mechanism is provided with a first limiting block and a second limiting block respectively above the first working area and the second working area, and The first abutting device and the second abutting device are disposed on both sides of the frame. When the first moving carrier on one side of the receiving frame receives the upward reaction force of the electronic component, the first abutting device can be used to abut the first The limiting block is subjected to a downward reaction force to prevent the side of the carrier from being warped on the side of the first transfer carrier, thereby ensuring that the first transfer member is pressed against the electronic component in the first The operator effectively performs the preset work to achieve the practical benefit of improving the quality of the work.

A third object of the present invention is to provide a test classification device for applying an electronic component working device, the test classification device comprising a machine table, a feeding device, a receiving device, a working device, a material moving device and a central control device, the feeding device Mounted on the machine table and provided with at least one feeding device for accommodating the electronic components to be tested; the receiving device is mounted on the machine table and provided with at least one receiving device for accommodating the tested electronic components The working device is mounted on the machine table, and is provided with first and second working areas and an operating mechanism, a conveying mechanism and a transfer mechanism for transferring electronic components and performing preset operations on the electronic components; the moving device Mounted on the machine table and provided with at least one feeder for transferring electronic components between the supply and receiving device and the working device; the central control device is used for controlling and integrating the devices to perform automation operations To achieve improved production Practical benefits of performance.

[study]

11‧‧‧Test institutions

111‧‧‧Test circuit board

112‧‧‧ test seat

12‧‧‧Transportation agencies

121‧‧‧Feeding platform

122‧‧‧Output loading platform

13‧‧‧Transportation agency

131‧‧‧Rack

1321‧‧‧First motor

1322‧‧‧First Transmission Group

1323‧‧‧First slide rail

133‧‧‧First L-arm

1331‧‧‧First pick and place

1332‧‧‧First slide

1333‧‧‧Second rail

1341‧‧‧second motor

1342‧‧‧Second gear set

1343‧‧‧ third slide

135‧‧‧Second L-arm

1351‧‧‧Second pick and place

1352‧‧‧ Third slide

1353‧‧‧fourth rail

136‧‧‧First mobile seat

1361‧‧‧Second slide

1371‧‧‧third motor

1372‧‧‧ Third transmission set

138‧‧‧Second mobile seat

1381‧‧‧fourth slide

1391‧‧‧fourth motor

1392‧‧‧Fourth drive set

〔this invention〕

20‧‧‧Working device

211‧‧‧First operation area

212‧‧‧Second working area

22‧‧‧ operating agencies

221‧‧‧First board

222, 222A, 222B, 222C, 222D‧‧‧ first test seat

223‧‧‧second circuit board

224, 224A, 224B, 224C, 224D‧‧‧ second test seat

225A, 225B, 225C, 225D‧‧‧ first pressure reducer

226A, 226B, 226C, 226D‧‧‧ second pressure reducer

23‧‧‧Transportation agencies

231‧‧‧First stage

2311‧‧‧First accommodating slot

232‧‧‧Second stage

2321‧‧‧Second accommodating slot

24‧‧‧Transportation agency

241‧‧‧First drive

242‧‧‧Second drive

243‧‧‧ Shelf

244‧‧‧First Transfer Vehicle

245‧‧‧Second transfer vehicle

246‧‧‧First Limit Block

247‧‧‧second limit block

248‧‧‧First topping device

2481‧‧‧First top block

249‧‧‧Second topper

2491‧‧‧second top block

250‧‧‧ third drive

31, 32, 33, 34, 35, 36, 37, 38‧‧‧ Electronic components

40‧‧‧ machine

50‧‧‧Feeding device

51‧‧‧Feeder

60‧‧‧ receiving device

61‧‧‧Receipt receiver

70‧‧‧Transfer device

71‧‧‧Transfer

Fig. 1 is a schematic view showing the arrangement of various mechanisms of a conventional electronic component operating device (1).

Figure 2: Schematic diagram of the configuration of each mechanism of the conventional electronic component operating device (2).

Figure 3: Schematic diagram of the transfer mechanism of the conventional electronic component operating device.

Figure 4 is a schematic view showing a first embodiment of the working device of the present invention.

Fig. 5 is a schematic view (1) showing the use of the first embodiment of the working device of the present invention.

Figure 6 is a schematic view showing the use of the first embodiment of the working device of the present invention (2).

Figure 7 is a schematic view showing the use of the first embodiment of the working device of the present invention (3).

Figure 8 is a schematic view showing the use of the first embodiment of the working device of the present invention (4).

Figure 9 is a schematic view showing the use of the first embodiment of the working device of the present invention (5).

Figure 10 is a plan view showing a second embodiment of the working device of the present invention.

Figure 11 is a front elevational view of a second embodiment of the working device of the present invention.

Figure 12 is a schematic view showing the use of the second embodiment of the working device of the present invention (I).

Figure 13 is a schematic view showing the use of the second embodiment of the working device of the present invention (2).

Figure 14 is a schematic view showing the use of the second embodiment of the working device of the present invention (3).

Figure 15 is a schematic view showing the use of the second embodiment of the working device of the present invention (4).

Figure 16 is a schematic view showing the application of the working device of the present invention to a test sorting device.

In order to make the present invention further understand the present invention, a preferred embodiment will be described in conjunction with the drawings, which will be described in detail later. Referring to FIG. 4, the working device 20 of the present invention is first configured on the machine. The work area 211, the second work area 212, the work mechanism 22, the transport mechanism 23, and the transfer mechanism 24, the first work area 211 and the second work area 212 are arranged correspondingly, and the work mechanism 22 is tied to the first work. The area 211 is provided with a first operator that performs at least one pair of electronic components to perform a preset operation, and a second operator that is provided with at least another pair of electronic components to perform a preset operation in the second work area 212, and further, the first The second operator can be a detector or a tester. The preset operation can be an appearance inspection operation or an electrical test operation. In this embodiment, the first operator is a tester and has electricity. First connection board 221 and first test a 222 for testing the electronic component, the second operator is also a tester, and has a second circuit board 223 and a second test socket 224 electrically connected for testing the electronic component; the transport mechanism 23 is attached to the machine The stage is provided with at least one carrying platform for carrying electronic components, and further, at least one first loading stage 231 for carrying electronic components is disposed in the first working area 211, and at least one carrying electronic component is disposed in the second working area 212. The second stage 232, the first and second stages 231, 232 can be fixed or movable to carry the electronic component to be tested or the tested electronic component, or to carry the electronic component to be tested and the tested electronic component. In the embodiment, the transport mechanism 23 is disposed on the first test seat 222 side of the first working area 211 with a first stage 231 displaced in a third direction (such as the Y direction). The first stage 231 has The first receiving slot 2311 of the electronic component or the tested electronic component is mounted, and the second loading block 232 is disposed on the other side of the second testing block 224 of the second working area 212 for the Y direction. The second stage 232 has a second receiving slot 2321 for mounting the electronic component to be tested or the tested electronic component. The transfer mechanism 24 is disposed between the first working area 211 and the second working area 212, and is provided with at least one rack displaced between the first and second working areas 211, 212. In this embodiment, The transfer mechanism 24 is provided with a first driver 241 disposed in a second direction (such as the Z direction) on the machine table to drive a second driver 242 disposed in a first direction (eg, the X direction) to be larger. The Z-direction displacement of the stroke, the second driver 242 is provided with a frame 243 disposed in the X direction and spanning the first and second working areas 211, 212, so that the frame 243 can be displaced in the ZX direction, and the bearing The frame 243 is equipped with at least one first transfer carrier 244 at a position corresponding to the first working area 211, and at least one second transfer carrier 245 is assembled at a position corresponding to the second working area 212, and the carrier is 243 driving the first transfer carrier 244 and the second transfer carrier 245 to synchronously shift, the first transfer carrier 244 is to transfer the electronic component between the first operator and the carrier, the second transfer carrier 245 transferring another electronic component between the stage and the second operator, even if the first transfer carrier 244 is in the first operator and the first carrier 231 transfer electronic components, and the second transfer carrier 245 transfers the other electronic components to the second stage 232 and the second operator, thereby causing the first and second transfer carriers 244, 245 to move synchronously and rapidly. The utility model can effectively reduce the cost of the transfer component and facilitate the space arrangement. Further, the first and second transfer carriers 244 and 245 can be a transfer device for simply transferring electronic components, or can be used for transferring and depressing electronic components. In the embodiment, the first transfer carrier 244 is a press tool and can be displaced in the Z direction of a small stroke, and is in the first test seat 222 and the first stage 231. The electronic component is transferred and the electronic component is pressed into the first test socket 222 to perform a test operation. The second transfer carrier 245 is also a press tool and can be displaced in the Z direction of a small stroke. The test device 224 and the second stage 232 transfer electronic components, and the electronic components are pressed into the second test socket 224 to perform a test operation, and the transfer mechanism 24 is coupled to the first work area 211 and the second A first limiting block 246 and a second limiting block 247 are respectively disposed on the upper side of the working area 212, and at least one first topping device 248 is disposed on the side of the receiving frame 243 to abut the first limiting block 246. And at least one second abutment 249 occupies the second limiting block 247 on the other side of the frame 243. In the embodiment, the first abutting device 248 is a pressure cylinder and has The first top block 2481 is displaced in the Z direction to abut against the first limiting block 246. The second topping device 249 is also a pressure cylinder and has a second top block 2491 for displacement in the Z direction. Two limit blocks 247.

Referring to FIG. 5 and FIG. 6 , since the electronic component 32 to be tested is pre-positioned in the first test socket 222 at the first working area 211, the transfer mechanism 24 can drive the carrier 243 and the first by using the first driver 241. The first and second transfer carriers 244 and 245 are synchronously shifted downward in the Z direction of the larger stroke, and the first transfer carrier 244 is pressed downward in the Z direction of the smaller stroke to be pressed into the first test socket 222 to be tested. The electronic component 32 performs the test operation. However, since the first transfer carrier 244 is subjected to the upward reaction force of the electronic component 32 to be tested, in order to prevent the carrier 243 from being bent and deformed on the side of the first transfer carrier 244, When the first transfer carrier 244 presses down the electronic component 32 to be tested, the transfer mechanism 24 drives the first top block 2481 to the Z-direction upward displacement against the first limit block 246 by using the first topping device 248. The first abutting device 248 receives the downward reaction force of the first limiting block 246, and utilizes this downward reaction force to prevent one side of the bracket 243 from being bent and deformed laterally, so that the first shift on the side of the bracket 243 is performed. The carrier 244 does depress the electronic component 32 to be tested and performs the test effectively in the first test socket 222. In addition, since the second transfer carrier 245 has taken out the tested electronic component 31 in the second test socket 224, the second carrier 232 of the transport mechanism 23 can be displaced in the Y direction to the second transfer carrier 245. Below, the Z-direction downward displacement of the second transfer carrier 245 for a smaller stroke moves the measured electronic component 31 into the second stage 232 and is reverse-displaced to reset; since the first transfer carrier 244 remains pressed down The electronic component 32 to be tested effectively performs a test operation in the first test socket 222. The second stage 232 of the transport mechanism 23 is displaced in the Y direction to carry out the measured electronic component 31, and then carries the next electronic component to be tested. Element 33 Below the second transfer carrier 245, the second transfer carrier 245 is displaced downward in the Z direction to the second stage 232 to take out the next electronic component 33 to be tested, and is reversely displaced and reset; therefore, the second The transfer tool 245 can synchronously perform the pick and place operation during the test operation of pressing the electronic component 32 to be tested by the first transfer carrier 244, thereby reducing the working time to increase the test throughput.

Referring to FIG. 7, after the electronic component 32 in the first test socket 222 is tested, the first transfer carrier 244 of the transfer mechanism 24 is displaced upward in the Z direction of the smaller stroke to take out the measured electronic component 32. And the first topping device 248 drives the first top block 2481 to be displaced downward in the Z direction from the first limiting block 246, and then the transfer mechanism 24 drives the carrier 243 and the first and second transfer by the first driver 241. The 244 and 245 are synchronously shifted in the Z direction for a large stroke, and then the second actuator 242 drives the carrier 243 and the first and second transfer carriers 244 and 245 to be synchronously displaced in the X direction so that the electronic component 32 is tested. The first transfer carrier 244 is displaced from the first test seat 222 to above the first stage 231, and the second transfer carrier 245 having the electronic component 33 to be tested is displaced from the second stage 232 to the second test stand. Above 224.

Referring to FIGS. 8 and 9, the transfer mechanism 24 is configured such that the first driver 241 drives the carrier 243 and the first and second transfer carriers 244 and 245 are simultaneously displaced in the Z direction of the larger stroke to the preset position. The second transfer carrier 245 is moved downward in the Z direction of the smaller stroke, and the electronic component 33 to be tested is moved into the second test socket 224 to perform the test operation, because the second transfer carrier 245 is subjected to the test. The upward reaction force of the electronic component 33 is to prevent the bracket 243 from being bent and deformed on the other side of the second transfer carrier 245. Therefore, when the second transfer carrier 245 presses down the electronic component 33 to be tested, the second The abutting device 249 drives the second top block 2491 to be displaced upward in the Z direction against the second limiting block 247, so that the second abutting device 249 is subjected to the downward reaction force of the second limiting block 247, and the downward reaction is utilized. The force prevents the other side of the frame 243 from being bent upwardly, so that the second transfer carrier 245 located on the other side of the frame 243 does press down the electronic component 33 to be tested in the second test socket 224 to effectively perform the test. The operation, and since the first transfer carrier 244 has taken out the measured electronic element in the first test socket 222 The first stage 231 of the transport mechanism 23 can be displaced in the Y direction below the first transfer carrier 244, so that the first transfer carrier 244 is displaced downward in the Z direction of the smaller stroke. The electronic component 32 is moved into the first stage 231 and is reversely displaced and reset; however, since the second transfer carrier 245 still keeps pressing down the electronic component 33 to be tested in the second measurement The test 224 effectively performs the test operation. The first stage 231 of the transport mechanism 23 is configured to shift the electronic component 32 to be tested in the Y direction, and then carry the next electronic component 34 to be tested to the first transfer carrier. Below the 244, the first transfer carrier 244 is displaced in the Z direction downwardly from the first stage 231 to take out the next electronic component 34 to be tested, and is reversely displaced and reset; therefore, the first transfer carrier 244 can be When the second transfer carrier 245 presses down the electronic component 33 to be tested, the pick-and-place operation is simultaneously performed during the test operation, thereby reducing the operation time to increase the test throughput.

Referring to FIGS. 10 and 11, a second embodiment of the working device 20 of the present invention differs from the first embodiment in that the working mechanism 22 is provided with a plurality of first working devices and plural numbers in the first working area 211. The first depressor that is pressed against the electronic component is not described here because the first depressor is a conventional technique. In the present embodiment, the first depressor is provided with a plurality of first The test sockets 222A, 222B, 222C, and 222D are provided with a plurality of first pressure reducers 225A, 225B that are displaced in the Z direction and can be pressed against the electronic components at the plurality of first test sockets 222A, 222B, 222C, and 222D. 225C, 225D, further comprising a plurality of second operators at positions corresponding to the plurality of first operators in the second working area 212, and a plurality of second pressing electronic components at the plurality of second working devices In the present embodiment, the second working area 212 is provided with a plurality of second test sockets 224A, 224B, 224C, and 224D, and is provided at a plurality of second test sockets 224A, 224B, 224C, and 224D. a second depressor 226A, 226B, 226C, 226D that is displaced in the Z direction and can be pressed against the electronic component; The first stage 231 of the transport mechanism 23 is displaced in the Y direction on the side of the plurality of first test sockets 222A, 222B, 222C, and 222D, and the second stage 232 is in the plurality of second test sockets 224A, 224B. The other side of the 224C, 224D is displaced in the Y direction; the transfer mechanism 24 is provided with at least one third driver 250 for driving the first driver 241 to be displaced in the Y direction to drive the first driver 241 and the second driver 242, the carrier 243, the first transfer carrier 244 and the second transfer carrier 245 are synchronously displaced in the Y direction, and the first transfer carrier 244 and the second transfer carrier 245 are displaced to the plurality of first test sockets 222A, 222B. 222C, 222D and a plurality of second test sockets 224A, 224B, 224C, 224D, and since the operating mechanism 22 has been configured with an independent downLoader, the first transfer carrier 244 and the second transfer of the transfer mechanism 24 245 can be a simple transfer vehicle, and can reduce the first and second limit blocks and the first and second tops depending on the operation requirements. The configuration of the device.

Referring to Figures 12 and 13, in use, the transfer mechanism 24 drives the first driver 241, the second driver 242, the carrier 243, the first transfer carrier 244, and the second transfer carrier with the third driver 250. 245 is synchronously displaced in the Y direction, so that the first transfer carrier 244 and the second transfer carrier 245 are respectively located on the side of the first test socket 222A and the second test socket 224A, and the second driver 242 is used to drive the carrier 243, the first The one-shift carrier 244 and the second transfer carrier 245 are synchronously displaced in the X direction such that the first transfer carrier 244 is located above the first test socket 222A and the second transfer carrier 245 is located above the second carrier 232. Then, the first driver 241 drives the second driver 242, the carrier 243, the first transfer carrier 244 and the second transfer carrier 245 to shift to the preset position in the Z direction of the larger stroke, and then the first transfer carrier 244 is the Z-direction displacement of the smaller stroke, and the pre-fetched electronic component 35 to be tested is moved into the first test seat 222A. At this time, the second transfer carrier 245 is also displaced in the Z direction of the smaller stroke to the second load. The next electronic component 36 to be tested is taken out from the stage 232; then the transfer mechanism 24 drives the carrier 2 by using the second driver 242. 43. The first transfer carrier 244 and the second transfer carrier 245 are displaced in the X direction, so that the first transfer carrier 244 is corresponding to the first stage 231 and is displaced in the Z direction to take out the next electronic component 37 to be tested. And moving the second electronic component 36 to the second test socket 224A corresponding to the second test carrier 224A and shifting in the Z direction, and the first transfer carrier 244 has left the first test socket 222A. Above, the working mechanism 22 performs the test operation by pressing the first pressure reducer 225A in the Z direction and pressing the electronic component 35 to be tested in the first test socket 222A.

Referring to FIGS. 14 and 15 , when the first voltage lowering device 225A and the second voltage reducing device 226A are respectively pressed against the electronic component 35 and the electronic component 36 in the first test socket 222A and the second test socket 224A, the test operation is performed. The transfer mechanism 24 drives the first driver 241, the carrier 243, the first transfer carrier 244 and the second transfer carrier 245 to simultaneously shift in the Y direction, so that the first transfer carrier 244 and the second carrier are driven by the third driver 250. The transfer carrier 245 is displaced to the side of the first test socket 222B and the second test socket 224B. Since the first transfer carrier 244 has adsorbed the next electronic component 37 to be tested, the transfer mechanism 24 is driven by the second driver 242. The carrier 243, the first transfer carrier 244 and the second transfer carrier 245 are synchronously displaced in the X direction, so that the first transfer carrier 244 is located above the first test socket 222B, and The second transfer carrier 245 is positioned above the second stage 232, so that the first transfer carrier 244 is displaced in the Z direction to move the electronic component 37 to be tested into the first test socket 222B, and the second transfer carrier 245 is The second stage 232 takes out the electronic component 38 to be tested, so that the first and second transfer carriers 244 and 245 perform the picking and discharging operations simultaneously, thereby achieving the use efficiency of improving the transfer efficiency.

Referring to Figures 4 and 16, the working device 20 of the present invention is applied to a test sorting device as an example, and includes a machine table 40, a feeding device 50, a receiving device 60, a working device 20, a moving device 70, and a central control device ( The feeding device 50 is disposed on the machine table 40, and is provided with at least one feeding device 51 for accommodating electronic components to be tested; the receiving device 60 is disposed on the machine table 40, And at least one receiving device 61 for accommodating the tested electronic components; the working device 20 of the present invention is disposed on the machine 40, and is provided with the working mechanism 22, the conveying mechanism 23 and the transfer mechanism 24; The material device 70 is mounted on the machine table 40, and is provided with at least one feeder for transferring electronic components between the feeding device 50, the receiving device 60 and the working device 20. In this embodiment, The feeder 71 transfers the electronic component to be tested on the supply receiver 51 of the feeding device 50 to the first stage 231 or the second stage 232 of the transfer mechanism 23, the first stage 231 or the first stage The two stages 232 respectively carry the electronic components to be tested to the working mechanism 22, and the first transfer carrier 244 or the second transfer of the transfer mechanism 24 245 is to take out the electronic component to be tested on the first stage 231 or the second stage 232, and use the second driver 242 to drive the frame 243, the first transfer carrier 244 and the second transfer carrier 245 to synchronize X. The directional displacement causes the first transfer carrier 244 or the second transfer carrier 245 to move the electronic component to be tested into the first test socket 222 or the second test socket 224 to perform a test operation, and the first test socket 222 or the second The tested electronic components in the test socket 224 are transferred to the first stage 231 or the second stage 232, and the tested electronic components are carried by the first stage 231 or the second stage 232 for the loading device 70. The loader 71 takes out the measured electronic components, and according to the test result, the measured electronic components are transported to the receiving and receiving device 61 of the receiving device 60 for sorting, and the central control device is used for controlling and integrating the devices. In order to perform automated operations, the practical benefits of improving operational efficiency are achieved.

20‧‧‧Working device

211‧‧‧First operation area

212‧‧‧Second working area

22‧‧‧ operating agencies

221‧‧‧First board

222‧‧‧First test seat

223‧‧‧second circuit board

224‧‧‧Second test seat

23‧‧‧Transportation agencies

231‧‧‧First stage

2311‧‧‧First accommodating slot

232‧‧‧Second stage

2321‧‧‧Second accommodating slot

24‧‧‧Transportation agency

241‧‧‧First drive

242‧‧‧Second drive

243‧‧‧ Shelf

244‧‧‧First Transfer Vehicle

245‧‧‧Second transfer vehicle

246‧‧‧First Limit Block

247‧‧‧second limit block

248‧‧‧First topping device

2481‧‧‧First top block

249‧‧‧Second topper

2491‧‧‧second top block

Claims (9)

An electronic component working device includes: a machine: a first working area and a second working area; and an operating mechanism: at least one pair of electronic components in the first working area of the machine performs a preset operation An operator, and a second operator in the second work area of the machine is provided with at least one pair of electronic components to perform a preset operation; and a transport mechanism is provided with at least one carrier carrying the electronic components; The transfer mechanism is provided with a second driver, and the second driver drives a frame to be displaced between the first and second working areas in a second direction, and one side of the frame is assembled with at least one displacement in the Z direction. First shifting the carrier, and assembling at least one second transfer carrier in the Z direction on the other side, the first transfer carrier transferring the electronic component between the first operator and the stage, The second transfer carrier transfers another electronic component between the stage and the second operator. The electronic component working device according to claim 1, wherein the conveying mechanism is provided with at least one first carrier carrying the electronic component in the first working area of the machine, and the first stage of the machine The second working area is provided with at least one second stage carrying electronic components. The electronic component working device according to claim 1, wherein the transfer mechanism is provided with a first actuator arranged in the Z direction to drive the second actuator to be displaced in the Z direction. The electronic component working device according to claim 3, wherein the transfer mechanism is provided with a third driver disposed in the Y direction to drive the first driver and the carrier to be displaced in the Y direction. The electronic component working device according to claim 1, wherein the first transfer carrier and the second transfer carrier of the transfer mechanism are transfer carriers for simply transferring electronic components, or are transferable And pressing the electronic component. The electronic component working device according to claim 1, wherein the transfer mechanism is provided with a first limiting block and a second limiting block respectively above the first working device and the second working device. And at least one first abutting device is disposed at a position corresponding to the first limiting block on the side of the receiving frame, and the other side of the receiving frame is provided with at least one second corresponding to the position of the second limiting block Topping. The electronic component working device according to claim 6, wherein the first abutting device and the second abutting device are pressure cylinders. The electronic component working device according to claim 1, wherein the operating mechanism is provided with the plurality of the first working device and the plurality of first depressors in the first working area, and the second The working area is provided with a plurality of the second working device and a plurality of second pressing devices, and the carrier of the conveying mechanism is displaced in the Y direction. A test classification device for applying an electronic component working device, comprising: a machine table; a feeding device: disposed on the machine table, and provided with at least one feeding device for accommodating at least one electronic component to be tested; Receiving device: disposed on the machine, and provided with at least one receiving device for accommodating at least one tested electronic component; at least one electronic component working device according to claim 1 : being disposed on the machine for testing and transferring electronic components; and a loading device: being mounted on the machine for transferring electrons between the feeding device, the receiving device and the working device Components; central control unit; used to control and integrate the various devices to perform automated operations.