TW201018635A - A testing device for electronic component testing and collating machine - Google Patents

Abstract

This invention provides a testing device for electronic component testing and classification machine. This testing device is installed at a testing station and on a platform of a conveyor device; furthermore, a first capturing mechanism and a second capturing mechanism are installed on one side of the testing device. The first and second capturing mechanism each has a first and second elevator structure and a first and second horizontal movement structure, which are utilized for leading a first and second vertical press rod frame to perform up down and side to side displacement of the bottom lateral sides that have the first and second pick and place devices. Therefore, causing the first and the second pick and place devices of the first and second capturing mechanism to perform independent action at the testing station and between a first and second feeding and discharging material carrying platform of conveyor device that carry a before test/after test electronic component. Furthermore, utilizing the first and second vertical press rod frame to cause the first and second pick and place devices to maintain a better degree of level measurement in order to flatten and press down the component that is to be tested for test process execution. Therefore, the first and second capturing mechanism can simultaneously be side mounted and allow for simpler structural design and will not take up too much space. As a result, permitting independent operation to reduce operating time and allows all electronic components to receive even pressure during testing; hence, increase test quality.

Description

201018635 VI. Description of the Invention: [Technical Field of the Invention] The present invention provides an electronic component measurement that can be configured on the same side, the first design, the simple design and the thin space, and the actuation timing, and the improvement of the test quality. Eight $ j σ shortens the working time [previous technology] "_ test device. The nightmare '1 picture' is the invention of Taiwan's invention _ _ _ "member of the exchange 馨 Xin 11 series equipped with a signal link to the test machine sd side to send the test / test electronic parts, and test ΪΙ Ϋί 3' is used to carry the source to be tested 13 2, with lateral drive: the system is equipped with a first = ϊ; hang: jr to 】 c front - 丄:: the second L-shaped cantilever 136, another The movable parts Tim, 13 8 and 13 9 are assembled on the frame 131 for respectively driving the first, third, and the first and second transmissions to be connected to the first and second transmissions. 2 [Font arm 丨 3 4, when the sub-element is working, the transfer source 13 2 drives the bearing q 1 q Q η is enough T, 0 J especially the lateral drive ^; t 5 1 3 & and the first-in, out The material stage 12 1 , 122 and the second ^ , 1 24 4 are laterally displaced, and then the first ―, '^39::;7;:^^40'14^ / Electronic components to be tested 'and make 丄 ^ 3 two pick and place! 3 5 or the second pick-and-place device i 3 7 press down to be tested two or more: The pin of the electronic component of the temple is in contact with the contact of the test stand 1 1 1 ^^ .201018635, but because of the dress 1 1 1 and the second into the second: the second pick-and-placer 1 3 5, 1 3 7 must be in the test seat 1 2 3, 1 9 /1 discharge stage 1 2 1 , 1 2 2 and the second person, discharge The second pick-and-place of the stage is used to synchronize the horizontal women. This design will cause the electronic test to be detected after the test seat 1 1 ] is completed on the second loading station 12 3 . Unfinished work, because the first pick-and-placer 1 3 5 is pressed to wait for the test operation, and the second pick-and-placer 13 7 must be behind the component, then: 111 3 5 After the test stand 1 1 1 is taken out, the electronic actuation timing is received by the first and second pick-and-place devices 1 3 5 and 1 3 7 ; and the waiting time is increased; further, because the first and second products are taken i, therefore the pressure under the If part will directly affect the test pressure, only In: 1 3 5, 1 3 7 must be kept in the same quality, but the first - each === tested under the same secret The product cantilever 134,]5: 137 is placed in the -, [Type of horizontal production, inspection ^ 'When τ pressure to be tested electronic components, may have a poor impact ^ quality wire _ under pressure under the suppression of electronic components, and then number "rdmt for the applicant's previous application for Taiwan invention 94272219 I set The patent case is equipped with a test station 21 on the machine platform.

Q ^ 1 is equipped with signal connection, reclaiming structure, installation two == redundant second bracket 201018635 moving first - and second L type hanging g frame 2 4 3, 2 4 4 and respectively

2 4 0 with the cyclotron cycle and the first and second take-off ϋ 2 3 8 , 2 2 1 , 2 2 2 for the lateral: shift, seat 2 1 1 and the inlet and discharge platforms 2 3 3, 2 3 4 Drive the first: two first-, two vertical drive source type cantilever 2 3 7, 2 3 9 for lifting ^ Hi2 3 6 and clever one, two L ❹ 2 4 0 in test seat 211 and people, out f, -, two The pick and place device 2 3 8 , the component, and the bit 2 = two pieces of the electronic component, so that the electronic device to be tested; the detecting device 2 3 can perform the test operation; however, the displacement to avoid the action |2,8,2 4 ◦There are the horizontal and the second reclaiming mechanism - the 'arm c waiting time', but the first ejector 2 3 8 , 2 4 0 is the opposite of the second 2 3 7, 2 3 9 and the first and second take-off, only the mechanism 2 == ring alternate way makes the activator simple and does not take up space, and can be actuated separately: shorten the operation coffee, and make the electronic components The test device for uniform quality is the standard developed by the manufacturer. The test of the electronic component test sorting machine is installed on the machine top of the machine with the test station and the pick-up device, and drives the first-and-two-phase structure and the second traverse structure for respectively and the reclaimer ^, The two pick and place devices can be operated at the test station to shorten the operation time and achieve the purpose of effectively improving the use efficiency. The second object of the present invention is to provide a test device for an electronic component test sorter. 5 201018635 No.: Practical benefit. The first and second pick-and-place devices are provided on the bottom surface of the work space which is conducive to the space configuration. The cutters are different from the first and second straight press bar frames, and the same lower Lili road pressure is used to treat the ^zis. ϊ ϊ ϊ ϊ ϊ ϊ ϊ 兹 兹 兹 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳The first person, the discharge load ^, the load; ^ set 4 ◦ in the test station two into, the discharge platform 4 3, 4 4, the 洌nw ς p / and the rear above the upper or related device In the second embodiment, the second embodiment is disposed directly on the outer cover 3 2 of the machine base 30, and is disposed on the test station mechanism and the second reclaiming mechanism. A take-off structure and a first, second, and second riser respectively have first and second vertical drive J, and the first lift structure is attached to the first and second vertical motors of the frame 51. 52a, 52r, - vertical drive source is composed of 5 3 B and the first and second vertical direction screw 5 Z, the second two pulley set 5 3 A, the two vertical direction screws 54A, 54B each screw 5/6, and To the first First, 5 51 A, 5 51B of the -, jt side mask first and second lateral sliding support 5 5A, 5 5B and the frame 51; Department Branch,, 55B 'the first and second straight slide 5 5 2 A, 5 5 2 B and flute i, 1 cooperate with the first and second slabs 511B to assist the first and second brackets to the vertical rail 511 A, and the first and second brackets 5 5 A, 5 5 lean, 5 5 B for lifting displacement, 5 5 1 (10) for top mask first and second lateral slip: f ^ 6th 201018635 straight rod frame 5 6Α, 5 6 set up assembly, first - second The straight-pressing rod frame ( g (10) is provided with first and second 5 6 2 AB ' on both sides of the bottom surface relative to the position of the straight rod, and first and second vertical sliding rails on the side sides - πil 5 6 2 B The first and second traverse structures are respectively provided with a first, a (four) line = a group of 5 8 Α, a first transverse drive source of 5 8 Β, and a first-direction linear motor group 58 A, 5 8 βI»—, S sq Each connection-::, two transmission 59? with R β 9 A, 5 9 B in the corresponding first and second straight pressure rod frame 5 6A, φ 酉丄 g g3: 5 6 2 The B position is provided with a mutual interaction between the top 59 B and the top surface of the outer cover 3 2 . ί slide 5 9 2 A, 5 9 2 B and the first and second horizontal slides 6 〇A, 曰 plus = auxiliary ―, two transmissions 5 9 A, 5 9 B drive the first, second - ffn e A, 5 6 fat steady displacement, another The top surface of the outer cover 3 2 is provided with a finder image of the von=D 6 1 for sweeping the test stand 3 of the cat test station 30. The department/n eves 3, 7 and 7 are performing the electronic component test operation. When the loading station is loaded, the loading platform 4 1 can carry the electronic tree 7 1 to be tested to the test 2 side, and the first device of the testing device 5 is placed above the first input. The retracting mechanism can control the first vertical motor M. The first pulley set 5 3 drives the first vertical screw 5 4A to rotate 1 such as cr vertical to the screw $ 4 A to drive the first carrier 5 5 A to reduce displacement, the first A horizontal slide 5 5 1 8 and a cross-slider and G β Δ 0 ▼ move the first straight bar frame 5 6 A for the downward displacement, the first straight dust bar frame 5 6A is the first vertical slide The rail 5 6 2 is displaced downward along the 5 9 i ,, so that the first pick-and-place unit 5 ίί2 !" takes out the electronic component to be tested and resets in reverse reverse displacement. At this time, the CCD 6 1 can be scanned first. Cat Test Station 3 测试 test stand 3 1 is the residual electronic material or gray foreign matter of the money electronic components. For example, the scanning test stand 3 1 can remove the foreign matter in advance to prevent the electronic components that are subsequently placed from being pressed against the foreign matter and causing damage, which is greatly reduced! c damage rate, if not continue to continue 201018635 read Figure 8 'in the first pick and place device 5 7 A to take out the electronic test - rotor ίβίΐίϊΐ structure control first horizontal linear motor group 58 eight ΐ Jt581 eight drive first The linkage frame 5 9 横向 lateral displacement, the first-linkage = and the belt: the first: vertical r straight slide 59 1A and the first - vertical direction 3

The displacement 'move the first pick-and-placer 5 7 A to the electronic circuit to be tested ❹ a vertical motor 5 2 a pass = 2: rotate to the screw 5 4 A so that the first vertical screw 5 4 A carries the f-support 5 5 A drives the first straight pressure bar to advance! ^Drop displacement, so that the first - pick-up device 5 7 will test the electronic component 71 to the pressure bar frame to =1 test: industry, due to the first - straight first Put "I is placed on both sides of the straight rod, so that the first - pick and place two element 7 2 is displaced to the side of the test station 30, and the second is vertical: ί; = 5] = 5 3 with 5 5 1 Β and the second lateral slide utilizes the second transverse slide: the lower displacement, the second plume 5 66 pick and place 5 7 Β can be activated separately, and: the first seat: up! „ shift, make the second = Piece; 7 less and reverse ascending displacement complex f = take two, electric first - carrier 5 5 Α and the first, frame 5 "rise:: 捍201018635 at 1 = 3⁄4 load of the reading test station 3 0 side, The test device 5 〇 is controlled to f has been displaced to y, a rotor 5 8 i A drives 5 degrees;: the first group = - linkage frame 5 9 A that drives the first - straight pressure bar frame 5 6 A' JL-; 3 Ο After there is no residual foreign matter in the test seat 31, the second green can be controlled; the second rotor of the group reaches the group of 5 8 5 5 8丄Β Hyperactivity "=== shift 'the second linking frame 5 9 Β i.e. straight lever to drive the second frame rail 562Β 56Β to use a second direction perpendicular to the vertical position = first ^

Pressure=5 6 Β is the second transverse slide 5 6 Β ;; J5 2 transverse slide 5 5 1 B for lateral displacement, so that the second take, the piece 7 2 is transferred to the test station 3 测试 test seat 3 i J 5 straight; · B through the second pulley set 5 3 B and the second J, take 5 5 B and the second straight frame 5 6 B as a downward displacement, so that the electronic component 7 2 to be tested is placed in the pressure抵 测试 测试 测试 测试 测试 测试 测试 ί ί ί ί ί ί , , , , , , , , , , , , , , , , , , , , , The test operation is performed in sequence while the heart σ Ί 4 f transfers the side/test electronic components. Reference to publications [Simplified illustration] 201018635 Figure 1: Schematic diagram of the patent No. 86108470. Fig. 2 is a schematic view of a detecting device of the patent No. 94272219. Fig. 3 is a diagram showing the configuration of a test station, a carrying device and a test device of the test sorting machine of the present invention. Figure 4: Front view of the test device of the present invention. Figure 5: Side view of the test device of the present invention. Figure 6: Schematic diagram of the use of the test device of the present invention (1). Figure 7: Schematic diagram of the use of the test device of the present invention (2). Figure 8: Schematic diagram of the use of the test device of the present invention (3). Figure 9: Schematic diagram of the use of the test device of the present invention (4). ® Figure 10: Schematic diagram of the use of the test device of the invention (5). Figure 11: Schematic diagram of the use of the test device of the present invention (vi). Figure 12: Schematic diagram of the use of the test device of the present invention (7). Figure 13: Schematic diagram of the use of the test device of the present invention (8). [Main component symbol description] [Live] Test stand·_ 1 1 1 First loading stage: 121 Second loading stage: 12 3 Rack: 131 Shelf = 13 3 First pick-and-place: 13 5 Second pick and place: 13 7 Second vertical drive source: 13 9 Second drive: 141 Test stand: 211 Feeding station: 2 21 First frame: 2 31 Test station: 11 Carrier: 12 First discharge stage: 12 2 φ Second discharge stage: 12 4 Test set: 13 Transverse drive source: 13 2 First L-type cantilever: 13 4 Second L-type cantilever: 13 6 First vertical direction Drive source: 13 8 First transmission: 140 Test station. 21 Carrier: 2 2 Discharge station: 2 2 2 Detection device: 2 3 201018635

❹ Second rack: 2 3 2 Second vertical drive source: 2 3 4 Second bracket: 2 3 6 First pick-and-place: 2 3 8 Second pick-and-place: 2 4 0 Second lateral drive source: 2 4 2 Second link frame · 2 44 [Invention] Test station: 3 0 Cover: 3 2 Carrier: 40 First discharge stage: 4 2 Second discharge stage: 4 4 Test set: 5 0 First vertical slide: 511 A First vertical motor: 5 2 A First pulley set: 5 3A First vertical screw: 5 4 A First frame: 5 5 A First transverse slip: 5 51 A First vertical slide: 5 5 2A First press frame: 5 6A First transverse slide: 5 61 A First vertical slide: 5 6 2A First pick-and-place: 5 7A A transverse linear motor set: 5 8 A First rotor: 5 81 A First drive frame: 5 9A First vertical slide: 5 91 A First transverse slide: 5 9 2 A First vertical drive source: 2 3 3 First bracket: 2 3 5 First L-shaped cantilever: 2 3 7 Second L-shaped cantilever: 2 3 9 First lateral drive source: 2 41 First link: 2 4 3 Test stand: 31 First Feeding station: 41 No. - Material platform: 4 3 Rack: 5 1

Second vertical slip: 511B Second vertical motor: 5 2 B First pulley set: 5 3B Second vertical screw: 5 4 B Second support: 5 5 B Second transverse slide: 5 51B Two vertical slides: 5 5 2 B Second straight press frame: 5 6 B Second transverse slide: 5 61B Second vertical slide: 5 6 2 B Second pick-and-place: 5 7B Second horizontal Linear motor set: 5 8 B Second rotor: 5 81B Second drive: 5 9 B Second vertical slide: 5 91B Second transverse slide: 5 9 2 B 201018635

Second horizontal slip: 6 0 B

First horizontal slip: 6 0A C CD : 6 1 Electronic components: 71, 7 2

12

Claims (1)

201018635 VII. Application for patent scope 1 · j electronic components 峨 face-to-face device, the device 2 has a test station and a carrier device, the carrier device is equipped with the first and second The loading and unloading stage, the test equipment rack is set on the machine table; 3. The first reclaiming mechanism: it is installed on one side of the rack, and has the first lifting structure and the first traverse The structure is used for respectively driving the bottom mask g to the first-right pressing rod frame for fine and lateral 1 movement, so that the first pick-and-place device is between the test station and the carrying device g-in and out-feeding platform Transferring the second reclaiming mechanism of the electronic component to be tested/completed: it is installed in the rack for the first reclaiming mechanism of the first reclaiming mechanism, the same side = the upper part has the second lifting structure and the second moving structure With the third side of the moving bottom, there is a third pick-and-place ίίΞϊ for lifting and lateral displacement', so that the second two-input device is placed in the test station and the second input device of the carrier device. #由&*. Transfer between stations/test/ Complete the electronic components. '2. The electronic component described in item 1 of the patent application scope of the present invention, wherein the first vertical feed source of the test device of the first reclaimer cover is used for driving on the frame. The first bearing 3 is provided between the frame and the first straight pressure bar frame. • According to the second item of the patent application scope, the H and ^1 pick and place materials are lowered. The direct-drive motor and the first pulley set] are provided with a first carrier from the first-vertical-vertical screw. It is composed of a vertical screw and is equipped with a first-vertical slide of the test assembly of the 4th ===== classification machine; the frame and the frame are provided with a mutual lifting displacement. Straightening straight rails to assist the first bearing 13 201018635 5 申 以 测试 test test drive test drive source for driving a first pass = structure = - horizontal 6 · according to the scope of patent application * 5 items The thunder picker is described for lateral displacement. Positioning, wherein the first traverse junction test assembly 7 is connected to the group, and the first rotor is connected to the first horizontal ί, the tester of the sorter A 4 r test station ==== Displacement - horizontal slide rail, used to assist the first drive frame for lateral 8 9 Hi Lee ί ί ί ί ί ί The second lifting structure of the first reclaiming mechanism is attached to the frame and the "7 vertical driving source is used to drive a second frame for lifting displacement, and the second frame and the second straight pressing frame are arranged. The second horizontal slide rails and the two horizontal slides of the two sides are matched with each other, and the second horizontal pressure slide frame is used for the electronic component test classification according to item 8 of the patent application scope. The test device of the machine, wherein the second vertical driving source of the second lifting structure is composed of a second vertical motor, a second pulley group and a second vertical screw, and a second vertical screw is provided with a second Shelf. The test device of the electronic component test sorting machine according to claim 8, wherein the second vertical frame of the second lifting structure and the frame are provided with a second vertical sliding seat and The second vertical sliding handle is used to assist the second carrier to move up and down. The test device of the electronic component test sorting machine according to claim 1, wherein the second traverse structure of the second reclaiming mechanism is provided with a second lateral drive source for driving a second transmission The frame is laterally displaced, and the second vertical sliding seat and the second vertical 201018635 straight sliding rail are arranged between the second driving frame and the second straight pressing frame to drive the second straight frame and the second Pick and place 1 2 · According to the electronic tree test sorter & test device according to claim 1 of the patent application scope, the second lateral drive source of the second traverse structure is a second transverse linear motor group. And connecting the second transmission frame with the second rotor. 13. The test device for an electronic component test sorting machine according to claim 11, wherein the outer portion of the test station is provided with a cover, and the second drive frame of the test take-off mechanism and the upper portion of the test stand The second lateral slide and the second transverse slide are combined with each other to assist the lateral displacement of the second transmission frame. ❹ ❹ L 4 Ϊ Ϊ? In the test of the electronic component test sorting machine described in the first item of the patent scope, the first and second straight press frame are respectively provided with first and second pickers on both sides of the bottom surface relative to the position of the straight bar. The test device for the electronic component test facet described in the first paragraph of the patent application scope includes the image capture mechanism above the test station. The measuring device of the side test sorting machine, wherein the image capturing mechanism is CC ϋ. The measuring unit of the electronic component testing and classifying machine described in Item 16 of Qing Quanquanwei, wherein the test station is provided with a cover. The c CD of the image taking mechanism is mounted on the inner surface of the test stand cover.