TWI296049B - Ic testing machine capable of simultaneously testing a plurality of integrated circuits - Google Patents

Description

1296049 IX. Description of the invention: [Technical field to which the invention belongs] Test bee = system time to transfer to the test [previously ϋ 彳 彳 置 置 1 1 (10) measuring machine (two).

Under the research and development and innovation of this electrician, it has to be replaced by many integrated circuits (integrated =ii) in the past. Because Ic has been multi-channel in the production process, Therefore, in order to ensure the quality of the products, the manufacturer is responsible for the damage in the production process after the IC production is completed, and the iW refers to the first item, which is the previous Taiwanese special edition 91210, No. IC detection. In the patent case of the transport device of the machine, the test machine is arranged on the other side of the g 2 0 side to arrange a plurality of automatic lifting and lowering supply racks 2 丄 and the receiving rack machine 20 0. The test station 2 3 is provided with a left cantilever pick-and-place mechanism, a 24, a right cantilever pick-and-place mechanism 25 and a transport mechanism 2 6 between the collections 2, 2, 2 and the test station 2; When the left cantilever pick-and-place mechanism 24 transfers the single test ic to the transfer mechanism" 2, the transfer mechanism 26 moves to the rear side in a tunnel crossing manner, and then the cantilever pick-and-place mechanism 25 transfers the 1C to The inspection station 2 3 performs the inspection operation, and after the * detection, the right cantilever pick-and-place mechanism 2 5 Transfer the single test IC to the transfer ^ 2 6, transfer the 1C back to the front side by the transfer mechanism 26, and take the left cantilever pick and place 2 4 to take out the measured 1C and transfer the IC according to the test result. And sorting to the rack 2 2, and completing the 1C detecting operation. Referring to FIG. 2, the upper part of each group of detecting stations 23 is respectively provided with a crimping mechanism 2 7, and the crimping mechanism 27 has a usable driving source. After the lifting and lowering pressure rod 2 7 1 and the lower pressing fixture 2 7 2 are separately placed in each test stand 2 3 test seat 2 31, the lower pressing rod 2 71 will be lowered to lower the jig 2 7 2Mo 1296049 Abuts the surface of ic, so that the IC ensures contact with the contact of the test stand 2 3 i to perform the test smoothly. Sister η due to the above IC test operation, the ICs to be tested are The left cantilever pick-and-place machine, the rich ft is first transferred to the transfer mechanism 2 6, and then the right cantilever pick-and-place mechanism 2 5 transfers the 1C on the rotary structure to the inspection station 2 3 for inspection operation, so that the delivery is over, It takes two exchanges to transfer and displace the program, and the exchange of excessive consumption is two. In contrast, the 1C delivery after the completion of the test also requires two passes. In exchange for the release order, the overall transportation costs too much time; in addition, each group of test bench j test stand 2 3 1 series - only provide a single IC for testing, even if t: and two: Bay! 3. It is only possible to test and test six ic at the same time, so it is quite limited. If the test time required for each ic is longer, the capacity of the entire inspection is limited. The department is sufficient to meet the current high production capacity. ^ Secret!: This is the inventor's in-depth research and development of the research and production of the current research. The long-term efforts to study the fish 5 can effectively reduce the IC exchange and release and test. This is the trial production capacity, to test the shortcomings of the good f-type, [inventory content] check the ϊΓ-明) ί 目! The system provides a kind of IC that can be loaded with multiple π at the same time, and the system is full. The one is sent; the second is sent directly to the community, and the lion is sent to the ίπϊΐ After exiting, the nozzle will drop a number of ICs to be tested and suck 7c, the second carrier will be moved into the test 埠, 1C will be placed, and the second carrier will be transported by the rail transfer mechanism. According to the test results, the measuring end 1C conveying mechanism classifies and draws the first and second's in the collection ship; thereby, the time of the seven 1296049 is set to be 'large: only two 1c j for the exchange Transfer = time two ^ set? ric, two-load delivery

The side to be tested at the same time, the test is carried out at the same time, and the ii ΐ and ί are placed on both sides of the parallel transmission mechanism. The first carrier is sent to the first load and the chemical tool. When the test is performed by ic, the first carrier can be moved, so that the input 1C transport mechanism can connect the 1C to be tested on the feed ε. Gt-Newtech's and when the second New Zealand tool will complete the test and test to the discharge area, the ICs on the second carrier are tested at the output 1C delivery mechanism. The classification is taken and placed in each receiving magazine, and the 1C to be tested on the first carrying fixture is transferred to the test 埠 for testing operation, and then the multiple sets of the fixtures are used alternately, which can be fully utilized. The timing is matched to reduce the standby time of the test when the Ic parent shifts, so that the tester can effectively increase the test capacity. [Embodiment] In order to make the reviewer further understand the present invention, a preferred embodiment will be exemplified and illustrated with reference to the following: Please refer to Figures 3 and 4, the present invention is attached to the front side of the machine. It is provided with a translatable supply 匣30 and an open space 31, 3 2, and a receiving 匣3 3, 3 4 with a translatable good product on the circumferential side and a receiving 匣 3 5, 3 6 of the defective product. 3 7, 3 8, on the side of the feed 匣 30, there is an input end 1C conveying mechanism 40, and on the side of the receiving 匣 3 5, 3 6 , 3 7 , 3 8 is provided with an output end 1C conveying The mechanism 4 1 and the input end 1C conveying mechanism 4 are provided with a pick-and-place head 4 〇 1 having a plurality of nozzles, and the head 12401 can be used for the first, second and third directions to displace the feed Ε 3 The ic to be tested on 0, the displacement of the jVj axis f) is taken to pick up the pick-and-place head with a plurality of nozzles. 4 i tIC transport mechanism 4 1 is the same set in two or three directions (X, Y, Z) The axial direction of her face can be used as the first, graded receipt 匣3 3, 3 4, 3 5 ' to move the test IC to the test 埠 5 Q side of the side frame with the implementation Road transfer 7: 2, another difference across 6 ◦ Feeding area 61, test area: 2 2 feeding material on both sides of the feeding area 6 i and the discharge area 6 are set, and the fixture 7 1 and the second carrying fixture 7 2, and _ ^ knife The same first carrier is provided. - - Carrying the fixture 7 1 in the feeding area 6 The working food ^^ 2 conveying mechanism 6 0 The jig 7 2 is in the discharge area 63 and the test area. And discharge operations. 2 movements for IC entry Please refer to Figures 4 and 5 for the first translation of 'θ 7, with a plurality of mounting bases 7 i tools 7 1, saying 'the top of the array of signals to the central controller The test board 5 is provided with a connection test test stand 5 1 1, and the test stand 5 is the number of the majority of the seats (five) and 2) for carrying the test _ for testing. On the eve of the test, 1C will be pressed into the nozzle 5 2 at the same time. Ming > Read Figure 9, and then test 埠 95 2 will drop, and at the same time, a number of IC8 0 will be sucked up so that ^ 1296049 will be sent 71. Please refer to the first diagram, and then the delivery section 6 1 'connected to the delivery end of the fixture 7 1 to transfer back to the incoming operation. Please refer to the second and fifth domain 40 to pick up the head 4 〇 1 Into the test 1C8 0 repeatedly into the test interest u at the same time, the nozzle 5 2 drop, will be more than 1 2 map, after the interview for f, '^^^ 彳 test operation. Please refer to IC8 0. Please Refer to the work redundancy J: 5 I above = 1 = = = the second load reversed without the 1C, the ^ channel communication mechanism 60 will be activated, and the first picture, then the nozzle 5H7 2 transfer Enter the post 5 (4). Please refer to the carrying tool ^ drop, and put a number of completed IC8 ◦ into the second. Please refer to Figure 15, the second load is sent and 72 ί will be sent to the mechanism 41 Head 411, according to the test, 1 di25, 36, 37, 38, at the same time, because the L/f area 616 is required to complete the man-made work, and the full load has another entry, the 'track transfer mechanism 6 〇 and then the first The carrier jig 71 is transferred into the cassette 50 to be connected to perform the test operation as described above. wit The invention utilizes the load-carrying tool for loading a multi-chip IC with full load to be directly moved into the test chamber, which can be greatly reduced. 1C exchanges the time of pick and place, And will be carried = with more than 1C at the same time test, can also effectively reduce the time of 1C test, t group carries the alternation of the fixture, can be fully surface timing matching, to reduce the test = 1C exchange displacement The standby time of the time, which in turn enables the detector to effectively increase the productivity of the test, is a practical and progressive design. However, the same product and publication are not disclosed, so that the requirements for invention patent application are allowed. Application. [Simple diagram of the diagram] It is a schematic diagram of the configuration of the conventional 1C detector. It is a schematic diagram of the configuration of the inspection table and the crimping mechanism of the conventional 1C detector. FIG. 1 is a second plan view. 3 Figure 1296049 Figure 4: Schematic diagram of the configuration of the present invention. Fig. 5 is a schematic view showing the appearance of the test fixture of the present invention. Fig. 6 is a schematic view showing the appearance of the test board of the present invention. Fig. 8 is a schematic view showing the operation of the present invention (2). Fig. 9 is a schematic view showing the operation of the present invention (3).

Figure 10: Schematic diagram of the operation of the present invention (4). Fig. 1 is a schematic view of the operation of the present invention (5). Figure 12: Schematic diagram of the action of the present invention (6). Figure 13: Schematic diagram of the operation of the present invention (7). Figure 14: Schematic diagram of the operation of the present invention (8). Figure 15: Schematic diagram of the action of the present invention (9). [Main component symbol description] Part of the formula: 2: Receiving rack 2 0: Machine table 2 1 : Feeding rack 2 2 3 : Test stand 2 31 : Test stand 2 4 : Left cantilever pick-and-place mechanism 2 5 : Right Cantilever pick-and-place mechanism 2 6 : transfer mechanism 2 7 : crimping mechanism 2 71 : lower pressing rod 2 7 2 : lower pressing jig Part of the invention: 3 2 : air 3 5 : receiving 匣 3 8 : receiving匣4 01 : Pick-up head 411: Pick-up head 3 0 : Feeder 匣 3 1 : Air 匣 3 3 : Receipt 匣 3 4 : Receipt 匣 3 6 : Receipt 匣 3 7 : Receipt 匣 4 0 : Input end 1C conveying mechanism 4 1 : Output end 1C conveying mechanism 5 0 : Test 埠 51: Test plate 511 : Test stand 1296049 5 2 : Nozzle 6 0 : Track transfer mechanism 6 3 : Exhaust zone 6 1 : Feeding zone 6 2 ··Test area 7 1 ··First carrying fixture 711: Bearing base 7 2 ··Second carrying fixture

8 0 : 1C

9 0 : 1C

Claims (1)

1296049 Patent application scope: 1 ·), which mainly includes a 1C inspection machine that can be tested at the same time. (There are at least one supply, at least one receipt, at least one test, and a plurality of tests. According to the test results, Ic can be installed. The test board is equipped with a test signal connected to the central controller, and the test board is provided with a testable Ic. % Μ , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , It can be transferred to the feeding area and the test section by the rail conveying mechanism, and the test operation is performed. The first-parent fixture is arranged with the second (four), A1. Ϊ a plurality of sockets to simultaneously hold a plurality of 1C to be tested; The first-loaded K, . system is placed on the other side of the obeying transport mechanism, and can be transferred to the discharge area and the test section by the rail transport mechanism to discharge the work. The second button has a plurality of hearts. τ 障 , , , , , , , , , , , , , , , , , , 1C ; at least one 1C transmission domain structure: there is a pick-and-place head that can be used for multi-directional displacement, and J can be placed in the feeding material, the receiving material, and the first and second loading 2 • according to the scope of the patent application! ° can be taken in two: set two: = two), which = the inside of the ==== corresponds to the first - and second money fixtures set f 3 ίίΐί 1 to be tested 1 into the test Hey. The 1C area, the test area and the discharge area are used for the first part to have incoming and outgoing operations. A loading/porting device for feeding, 蜊4 · According to the application of the patent scope, item i can be simultaneously inserted in multiple test pins 12 1296049 testing machine (2) 'where the ic transport mechanism pick and place The head system is provided with a plurality of nozzles for simultaneously absorbing and displacing a plurality of 1C. 5 · According to the first paragraph of the patent application scope, the 1C detecting machine (2) capable of simultaneously inserting multiple parallel tests, wherein the 1C conveying mechanism comprises an input end conveying mechanism and an output end 1C conveying mechanism, Pipette the IC separately. 6 · According to the application of the patent vehicle έ 围 围 围 围 围 围 可 可 ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic ic Set to the first carrier. 7 · According to the fifth paragraph of the patent application scope, the jc detector (2) which can be inserted in parallel at the same time, wherein the output ic transport mechanism absorbs the finished iC from the second carrier Set to receipt. 8 · According to the scope of the patent application, the IC detector (2), which can be placed in parallel at the same time, can be divided into two types: the receipt of the goods and the receipt of the goods. • According to the scope of the patent application, the test machine (2) can be inserted in parallel at the same time. The test cymbal is equipped with a nozzle that can be lifted and lowered to take 1C and lower the pressure. Enter the test board and have its pins touch the probe contacts for testing. J skill 13