CN210701237U - Chip pin detection device and transfer mechanism for multiple test stations - Google Patents
Chip pin detection device and transfer mechanism for multiple test stations Download PDFInfo
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- CN210701237U CN210701237U CN201921292619.9U CN201921292619U CN210701237U CN 210701237 U CN210701237 U CN 210701237U CN 201921292619 U CN201921292619 U CN 201921292619U CN 210701237 U CN210701237 U CN 210701237U
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- 238000012360 testing method Methods 0.000 title claims abstract description 59
- 230000007246 mechanism Effects 0.000 title claims abstract description 40
- 238000001514 detection method Methods 0.000 title claims abstract description 16
- 230000002950 deficient Effects 0.000 claims abstract description 34
- 230000007723 transport mechanism Effects 0.000 claims abstract description 5
- 238000012216 screening Methods 0.000 claims description 11
- 238000007599 discharging Methods 0.000 claims description 5
- 238000007664 blowing Methods 0.000 abstract description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 230000032258 transport Effects 0.000 description 4
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
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Abstract
The utility model provides a work piece pin foot detection device and be used for transport mechanism of many test station, relate to work piece production technical field, which comprises a fixing plate, shifting block and montant, the fixed plate is equipped with and is used for moving the pi-shaped spout that predetermines orbital as the montant, the montant upper end is equipped with the slider with pi-shaped spout complex, the lower extreme of montant is equipped with the blowing suction nozzle that is used for transporting the work piece in the platform of getting to the anchor clamps that are close to the platform of getting in proper order, a plurality of test suction nozzles that are used for transporting in proper order in the anchor clamps of test fixture subassembly and the test suction nozzle that is used for transporting the work piece in the anchor clamps that are close to receiving mechanism to the placing block or the material receiving block of defective products collecting subassembly, the shifting block can be connected in reciprocating rotation to the fixed plate and be used for; the utility model relates to a rationally, the mode that adopts automatic control realizes that the work piece removes one by one between each detection station, has reduced artificial input, has increased efficiency.
Description
Technical Field
The utility model relates to a chip production technical field particularly, relates to a chip pin foot detection device and be used for transport mechanism of many test stations.
Background
The work piece is usually required to carry out the detection of each item at each station after the preparation is accomplished, and the transportation between each station is mainly carried out by the manual work at present, for example the chip need be to the interval of pin foot, roughness and electric detection, mainly rely on the manual work to detect one by one in the actual production of chip, and the transfer of chip also transports through the manual work between each station, and inefficiency detects the precision not high, and leads to the leakage easily, and quality abnormal factor is difficult to the management and control.
SUMMERY OF THE UTILITY MODEL
A first object of the utility model is to provide a transport mechanism for many test stations, its mode that adopts automatic control realizes that the chip removes one by one between each test station, has reduced artificial input, has increased efficiency.
A second object of the utility model is to provide a chip pin foot detection device, its adopt as above a transport mechanism for testing more stations.
The embodiment of the utility model is realized like this:
a transfer mechanism for multiple test stations comprises a material taking table, a test fixture assembly and a receiving mechanism, wherein the material taking table, the test fixture assembly and the receiving mechanism are sequentially arranged on a rack and used for placing workpieces to be tested, the receiving mechanism is used for receiving the workpieces after the test is completed, the test fixture assembly comprises at least 2 fixtures, the receiving mechanism comprises a defective product collecting assembly and a material receiving block, the defective product collecting assembly comprises a placing block, the material taking table, the fixtures, the placing block and the material receiving block are positioned on the same straight line,
the transfer mechanism comprises a fixed plate, a shifting block and a vertical rod, wherein the fixed plate is provided with a n-shaped sliding groove used for serving as a rail for moving and presetting the vertical rod, the upper end of the vertical rod is provided with a sliding block matched with the n-shaped sliding groove, the lower end of the vertical rod is sequentially provided with a discharging suction nozzle used for transferring workpieces in the material taking platform into a clamp close to the material taking platform, a plurality of testing suction nozzles used for sequentially transferring the workpieces in the clamp of the testing clamp assembly and a testing suction nozzle used for transferring the workpieces in the clamp close to the receiving mechanism to a placing block or a material receiving block of the defective product collecting assembly, and the shifting block can be connected to the fixed plate in a reciprocating rotating mode and used for shifting the sliding block to slide in the sliding groove.
Further, the transfer mechanism further comprises a holding block for holding the vertical rod to be vertical, the holding block is connected to the fixing plate in a sliding manner along the horizontal direction, and the vertical rod is connected to the holding block in a sliding manner along the vertical direction.
Further, the test suction nozzle through the screening cylinder connect in the montant, the screening cylinder is connected in the montant perpendicularly, the test suction nozzle is connected in the output of screening cylinder.
Furthermore, a shifting hole is formed in the shifting block, and the sliding block of the vertical rod penetrates through the shifting hole.
Furthermore, the fixed plate is provided with a pair of sensors for sensing the position of the vertical rod, the pair of sensors are arranged at two ends of the n-shaped sliding groove, and sensing blocks matched with the sensors for use are arranged at two sides of the sliding block.
Further, the test fixture assembly comprises 2 fixtures which are respectively a first fixture and a second fixture, and the number of the test suction nozzles is 1.
Further, the workpiece is a chip, and the first clamp is used for detecting the flatness and the distance of the pin pins; and the second clamp is used for detecting the width of the pin.
A chip pin detection device comprises a material taking table for placing a chip to be detected, a first clamp for detecting the flatness and the distance of pins, a second clamp for detecting the width of the pins and a receiving mechanism for receiving the chip after testing is completed, wherein the receiving mechanism comprises a defective product collecting assembly for collecting defective products and a material receiving block for receiving the defective products, the defective product collecting assembly comprises a placing block, and the material taking table, the first clamp, the second clamp, the placing block and the material receiving block are sequentially arranged on a rack and are positioned on a straight line;
the transfer mechanism for the multiple test stations is arranged on the rack and used for transferring the chips among the material taking table, the first clamp, the second clamp, the placing blocks of the defective product collecting assemblies and the material receiving blocks.
Furthermore, first anchor clamps are including placing platform, first holder and second holder, it is fixed in to place the platform the chip that the blowing suction nozzle was placed is used for receiving to the frame, first holder and second holder are located and are placed the bench, and first holder and second holder are connected respectively in the two output of finger cylinder and are used for doing the shell that loosens or press from both sides tight chip in opposite directions or the motion of leaving mutually.
The utility model has the advantages that:
use the utility model discloses the time, the blowing suction nozzle will get the chip in the material platform and transport in to first anchor clamps and carry out pin foot and detect, test the chip that the pin foot in with first anchor clamps detected the completion simultaneously and transport in to the second anchor clamps and carry out pin foot and detect, when the chip all detected qualified at first anchor clamps and second anchor clamps, get the chip that material suction nozzle accomplished pin foot interval detection in with the second anchor clamps and transport to the piece that connects of next station, whether the person got the material suction nozzle and transported the chip to the piece of placing of defective products collection subassembly.
The utility model relates to a rationally, the mode that adopts automatic control realizes that the chip removes one by one between each detection station, has reduced artificial input, has increased efficiency.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
Fig. 1 is a schematic structural view of a transfer mechanism provided in embodiment 1 of the present invention;
fig. 2 is a schematic view of the fixing plate and the shifting block provided in embodiment 1 of the present invention;
fig. 3 is a schematic structural diagram of a chip pin detection apparatus provided in embodiment 2 of the present invention;
fig. 4 is a schematic structural view of a first clamp provided in embodiment 2 of the present invention;
icon: 31-a rack, 321-a material taking platform, 331-a first clamp, 331 a-a placing platform, 331 b-a first clamping piece, 331 c-a second clamping piece, 331 d-a finger cylinder, 332-a second clamp, 34-a transfer mechanism, 341-a material discharging suction nozzle, 342-a test suction nozzle, 343-a material taking suction nozzle, 344-a fixing plate, 344 a-a pi-shaped chute, 345-a shifting block, 345 a-a shifting hole, 346-a vertical rod, 346 a-a sliding block, 346 b-a sensing block, 347-a holding block, 348-a screening cylinder, 349-a sensor, 351 c-a placing block and 361-a material receiving block.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention, as generally described and illustrated in the figures herein, may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the accompanying drawings, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate the position or positional relationship based on the position or positional relationship shown in the drawings, or the position or positional relationship which is usually placed when the product of the present invention is used, and are only for convenience of description and simplification of the description, but do not indicate or imply that the device or element referred to must have a specific position, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.
The terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Example 1
Install in the frame in order and be used for placing the material platform 321, the test fixture subassembly of getting of waiting to detect the work piece and be used for receiving the receiving mechanism that the test accomplished the work piece, the test fixture subassembly includes 2 or 2 above anchor clamps, receiving mechanism is including the defective products collection subassembly that is used for collecting the defective products and the material piece 361 that connects that is used for receiving the non-defective products, the defective products collection subassembly is including placing piece 351c, get material platform 321, a plurality of anchor clamps, place piece 351c and connect the material piece 361 to be in a straight line.
Referring to fig. 1, the present embodiment provides a transferring mechanism 34 for multiple testing stations, which includes a fixing plate 344, a shifting block 345 and a vertical rod 346, wherein the fixing plate 344 is provided with an n-shaped sliding slot 344a for serving as a predetermined track for moving the vertical rod 346, the corners of the n-shaped sliding slot 344a are smoothly connected, the upper end of the vertical rod 346 is provided with a sliding block 346a matching with the n-shaped sliding slot 344a, the lower end of the vertical rod 346 is sequentially provided with a material feeding suction nozzle 341 for transferring a workpiece in the material feeding platform 321 into a fixture close to the material feeding platform 321, a plurality of test suction nozzles 342 for transferring in sequence in the fixture of the test fixture assembly, and a material taking 343 for transferring a workpiece in the fixture close to the receiving mechanism into a placing block 351c of a defective product collecting assembly or a material receiving block 361, the shifting block 345 is connected to the fixing plate 344 in a reciprocating manner for shifting the sliding block 346a sliding in the sliding slot to transfer the workpiece, it should be noted that the rotation power source of the shifting block 345 is a driving mechanism such as a motor, and the motion trajectory of the material placing suction nozzle 341, the test suction nozzle 342 and the material taking suction nozzle 343 is pi-shaped instead of regular circular arc, so the sliding block 346a needs to be able to move along the extending direction of the shifting block 345, and the manner of moving the shifting block 345 can be that the shifting block 345 shifts at one side of the sliding block 346a, but the rotation range of the shifting block 345 is large; therefore, in the present embodiment, the shifting block 345 is provided with a shifting hole 345a, and the sliding block 346a of the vertical rod 346 penetrates through the shifting hole 345a, so that the shifting block 345 can shift the sliding block 346a by both forward rotation and reverse rotation, and the range of the shifting block 345 required to rotate is small by adopting the manner.
In order to increase the automation degree of the device, the device needs to judge the position of the vertical rod 346 through a sensor, and the specific implementation manner in the embodiment is as follows: the fixing plate 344 is provided with a pair of sensors 349 for sensing the position of the vertical rod 346, the pair of sensors 349 are arranged at two ends of the n-shaped sliding groove 344a, sensing blocks 346b matched with the sensors 349 for use are arranged at two sides of the sliding block 346a, the sensors are electrically connected with a controller, the controller controls the rotation of the shifting block, and the sensors are mechanisms such as an infrared sensing device.
The device is particularly suitable for transferring chips, and is also suitable for other workpieces which can be sucked by the suction nozzle and need to be transferred step by step for testing.
In this embodiment, the test fixture assembly includes 2 fixtures, namely a first fixture 331 and a second fixture 332, and the number of the test nozzles 342 is 1; the first clamp 331 is used for detecting the flatness and the distance of the pin; the second fixture 332 is used to detect the width of the pin, but the apparatus may also be used in other application scenarios, for example, when a certain test requires three test stations, the number of the test nozzles 342 is 2, and so on, and the number of the test nozzles 342 is equal to the number of fixtures included in the test fixture assembly minus one.
The chip is moved one by one among all detection stations by adopting an automatic control mode, so that the manual investment is reduced, and the efficiency is increased.
In order to keep the vertical rods 346 vertical and not generate swaying, in this embodiment, the transferring mechanism 34 further comprises a holding block 347 for holding the vertical rods 346 vertical, the holding block 347 is connected to the fixing plate 344 slidably in the horizontal direction, and the vertical rods 346 are connected to the holding block 347 slidably in the vertical direction.
In this embodiment, the realization is put into the good products chip and is connect the material piece, and the realization mode of putting into the piece of placing of defective products collection subassembly with the defective products is: the material taking suction nozzle 343 is connected to the vertical rod 346 through the screening cylinder 348, the screening cylinder 348 is vertically connected to the vertical rod 346, the material taking suction nozzle 343 is connected to the output end of the screening cylinder 348, the initial position of the material taking suction nozzle 343 is preferably corresponding to the next station, and when the sucked chips are defective products, the screening cylinder 348 drives the material taking suction nozzle 343 to move to correspond to the defective product collecting assembly 35.
Example 2
The embodiment provides a chip pin detection device, which comprises a material taking table 321 for placing a chip to be detected, a first clamp 331 for detecting the flatness and the distance of pins, a second clamp 332 for detecting the width of the pins and a receiving mechanism for receiving the chip after the test is completed, wherein the receiving mechanism comprises a defective product collecting component for collecting defective products and a material receiving block 361 for receiving the defective products, the defective product collecting component comprises a placing block 351c, and the material taking table 321, the first clamp 331, the second clamp 332, the placing block 351c and the material receiving block 361 are sequentially installed on a rack 31 and are positioned on a straight line; the transfer mechanism 34 for multiple test stations provided by embodiment 1 and mounted on the rack 31 is further included to transfer the chip among the material taking table 321, the first clamp 331, the second clamp 332, the placing block 351c of the defective product collecting assembly and the material receiving block 361.
In order to solve the above problem, in the present embodiment, as shown in fig. 4, the first fixture 331 includes a placing table 331a, a first clamping member 331b and a second clamping member 331c, the placing table 331a is fixed to the frame 31 for receiving the chip placed by the discharging nozzle 341, the first clamping member 331b and the second clamping member 331c are disposed on the placing table 331a, the first clamping member 331b and the second clamping member 331c are respectively connected to two output ends of the finger cylinder 331d for moving toward or away from each other to loosen or clamp the shell of the chip, when the chip is placed, the first clamping member 331b and the second clamping member 331c are opened, after the chip is placed, the first and second clamping members 331b and 331c clamp the chip for inspection.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (9)
1. The utility model provides a transport mechanism (34) for many test stations, is including installing in order in the frame and being used for placing the material platform (321) of getting that wait to detect the work piece, test fixture assembly and being used for receiving the receiving mechanism that the test accomplished the work piece, test fixture assembly includes 2 at least anchor clamps, receiving mechanism is including the defective products collection subassembly that is used for collecting the defective products and connect material piece (361) that is used for receiving the defective products, the defective products collection subassembly is including placing piece (351c), get material platform (321), anchor clamps, place piece (351c) and connect material piece (361) and be in a straight line, its characterized in that:
the transfer mechanism (34) comprises a fixed plate (344), a shifting block (345) and a vertical rod (346), the fixing plate (344) is provided with an n-shaped sliding groove (344a) used as a preset track for the vertical rod (346) to move, the upper end of the vertical rod (346) is provided with a sliding block (346a) matched with the n-shaped sliding groove (344a), the lower end of the vertical rod (346) is sequentially provided with a discharging suction nozzle (341) used for transferring the workpieces in the material taking platform (321) to a clamp close to the material taking platform (321), a plurality of testing suction nozzles (342) used for sequentially transferring in the clamp of the testing clamp assembly, and a material taking suction nozzle (343) used for transferring the workpieces in the clamp (332) close to the receiving mechanism to a placing block (351c) or a material receiving block (361) of a defective product collecting assembly, the shifting block (345) is connected to the fixing plate (344) in a reciprocating and rotating mode and used for shifting the sliding block (346a) to slide in the sliding groove so that the workpiece can be transferred.
2. The transfer mechanism (34) for multiple test stations of claim 1, wherein: the transfer mechanism (34) further comprises a holding block (347) for holding the vertical rod (346) vertical, the holding block (347) is connected to the fixing plate (344) in a sliding manner along the horizontal direction, and the vertical rod (346) is connected to the holding block (347) in a sliding manner along the vertical direction.
3. The transfer mechanism (34) for multiple test stations of claim 1, wherein: the material taking suction nozzle (343) is connected to the vertical rod (346) through a screening air cylinder (348), the screening air cylinder (348) is vertically connected to the vertical rod (346), and the material taking suction nozzle (343) is connected to the output end of the screening air cylinder (348).
4. The transfer mechanism (34) for multiple test stations of claim 1, wherein: the shifting block (345) is provided with a shifting hole (345a), and a sliding block (346a) of the vertical rod (346) penetrates through the shifting hole (345 a).
5. The transfer mechanism (34) for multiple test stations of claim 1, wherein: the fixing plate (344) is provided with a pair of sensors (349) used for sensing the position of a vertical rod (346), the pair of sensors (349) are arranged at two ends of the n-shaped sliding groove (344a), and sensing blocks (346b) matched with the sensors (349) for use are arranged at two sides of the sliding block (346 a).
6. The transfer mechanism (34) for multiple test stations of claim 1, wherein: the test fixture assembly comprises 2 fixtures which are a first fixture (331) and a second fixture (332), and the number of the test suction nozzles (342) is 1.
7. The transfer mechanism (34) for multiple test stations of claim 6, wherein: the workpiece is a chip, and the first clamp (331) is used for detecting the flatness and the distance of pin feet; the second clamp (332) is used for detecting the width of the pin.
8. The utility model provides a chip pin detection device which characterized in that: the chip testing device comprises a material taking table (321) used for placing a chip to be tested, a first clamp (331) used for detecting the flatness and the distance of pins, a second clamp (332) used for detecting the width of the pins and a receiving mechanism used for receiving the tested chip, wherein the receiving mechanism comprises a defective product collecting component used for collecting defective products and a material receiving block (361) used for receiving the defective products, the defective product collecting component comprises a placing block (351c), and the material taking table (321), the first clamp (331), the second clamp (332), the placing block (351c) and the material receiving block (361) are sequentially arranged on a rack (31) and are positioned on a straight line;
the transfer mechanism (34) for the multiple test stations is mounted on the rack (31) and used for transferring the chips among the material taking table (321), the first clamp (331), the second clamp (332), the placing block (351c) of the defective product collecting assembly and the material receiving block (361) according to any one of claims 1 to 7.
9. The chip pin detection apparatus according to claim 8, wherein: the first clamp (331) comprises a placing table (331a), a first clamping piece (331b) and a second clamping piece (331c), the placing table (331a) is fixed on the rack (31) and used for receiving a chip placed by the discharging suction nozzle (341), the first clamping piece (331b) and the second clamping piece (331c) are arranged on the placing table (331a), and the first clamping piece (331b) and the second clamping piece (331c) are respectively connected to two output ends of the finger cylinder (331d) and used for moving towards or away from each other to loosen or clamp a shell of the chip.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921292619.9U CN210701237U (en) | 2019-08-09 | 2019-08-09 | Chip pin detection device and transfer mechanism for multiple test stations |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921292619.9U CN210701237U (en) | 2019-08-09 | 2019-08-09 | Chip pin detection device and transfer mechanism for multiple test stations |
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| Publication Number | Publication Date |
|---|---|
| CN210701237U true CN210701237U (en) | 2020-06-09 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201921292619.9U Active CN210701237U (en) | 2019-08-09 | 2019-08-09 | Chip pin detection device and transfer mechanism for multiple test stations |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113751335A (en) * | 2021-08-30 | 2021-12-07 | 绵阳伟成科技有限公司 | Single chip microcomputer PIN winding detection device and detection method |
-
2019
- 2019-08-09 CN CN201921292619.9U patent/CN210701237U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113751335A (en) * | 2021-08-30 | 2021-12-07 | 绵阳伟成科技有限公司 | Single chip microcomputer PIN winding detection device and detection method |
| CN113751335B (en) * | 2021-08-30 | 2023-10-03 | 绵阳伟成科技有限公司 | SCM PIN foot winding detection equipment and detection method |
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Effective date of registration: 20240401 Address after: 621000 Yongxing Town Industrial Park, Mianyang High-tech Zone, Sichuan Province Patentee after: Sichuan Jingweida Science and Technology Group Co.,Ltd. Country or region after: China Address before: 621000 earthquake prevention and disaster reduction Industrial Park, high tech Zone, Mianyang City, Sichuan Province Patentee before: MIANYANG CITY HIGH-TECH ZONE HONGQIANG TECHNOLOGY CO.,LTD. Country or region before: China |