TWI454415B - Testing machine for electronic elements - Google Patents

Testing machine for electronic elements Download PDF

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TWI454415B
TWI454415B TW099107269A TW99107269A TWI454415B TW I454415 B TWI454415 B TW I454415B TW 099107269 A TW099107269 A TW 099107269A TW 99107269 A TW99107269 A TW 99107269A TW I454415 B TWI454415 B TW I454415B
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axis
pick
place
electronic component
seat
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TW099107269A
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TW201130726A (en
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Ming Da Xie
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Hon Tech Inc
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Description

電子元件之檢測機Electronic component inspection machine

本發明係提供一種可易於增設取放器,並迅速調整各取放器之X-Y軸向間距,以利取放電子元件,而大幅提升檢測產能及作業便利性之檢測機。The invention provides a detecting machine which can easily add a pick-and-place device and quickly adjust the X-Y axial spacing of each pick-and-place device to facilitate the taking of electronic components, thereby greatly improving the detection capacity and work convenience.

按,請參閱第1圖,係為坊間電子元件測試分類機之示意圖,其係於機台之前方設有供料裝置10及收料裝置20,並於機台之後方設有複數個測試裝置30,該供料裝置10係設有至少一具容置槽之料盤11,用以盛裝複數個待測之電子元件,收料裝置20亦設有複數個具容置槽之料盤21,用以盛裝不同等級完測之電子元件,而測試裝置30則設有具複數個測試座32之測試電路板31,用以測試電子元件,另於機台上設有輸送裝置40,用以於供、收料裝置10、20及測試裝置30間移載待測/完測之電子元件,該輸送裝置40係於收料裝置20與測試裝置30間設有載具41,用以載送待測/完測之電子元件,並於供、收料裝置10、20與載具41間設有具複數個取放器421之第一移料臂42,用以移載待測/完測之電子元件,以及於測試裝置30與載具41間設有具取放器431之第二移料臂43,用以移載待測/完測之電子元件,由於料盤11、21之各容置槽的間距與各測試座32之間距不同,即必須使第一、二移料臂42、43之各取放器421、431可作Y軸向間距調整,以便於料盤11、21及測試座32處取放待測/完測之電子元件;請參閱第2、3圖,以第一移料臂42為例,其係於機架422上設有第一、二馬達423A、423B,用以各別驅動第一、二Z軸向皮帶輪組424A、424B,並於第一Z軸向皮帶輪組424A上裝配有第一取放器421A,而第二Z軸向皮帶輪組424B上則裝配有一具Y軸向滑槽4251之掣動架425,並以Y軸向滑槽4251供一滑動架426之凸榫4261滑置,滑動架426之前面係裝配有第二取放器421B,並於背面裝設有傳動架427,且於傳動架427與滑動架426間設有相配合之Z軸向滑軌4271及Z軸向滑座4262,另於機架422之背面設有第三馬達423C,用以驅動一位於機架422前面之Y軸向皮帶輪組428作動,該Y軸向皮帶輪組428則連結傳動架427,於調整第一、二取放器421A、421B之Y軸向間距時,係以第一取放器421A作基準件,並控制第三馬達423C驅動Y軸向皮帶輪組428作動,令Y軸向皮帶輪組428帶動傳動架427作Y軸向位移,傳動架427利用Z軸向滑軌4271及Z軸向滑座4262之傳動而驅動滑動架426以凸榫4261沿掣動架425之Y軸向滑槽4251作Y軸向位移,使滑動架426帶動第二取放器421B相對於第一取放器421A作Y軸向位移,而調整第一、二取放器421A、421B之Y軸向間距;惟,該第一移料臂42雖可使第一、二取放器421A、421B作Y軸向變距調整及Z軸向升降位移,但第一、二取放器421A、421B作Z軸向升降位移係用以取放電子元件,並不涉及第一、二取放器421A、421B之間距調整,於第一、二取放器421A、421B之Y軸向間距調整設計上,該移料臂42僅以第三馬達423C驅動Y軸向皮帶輪組428,並經傳動架427帶動第二取放器421B作單一Y軸向位移,然在現今講求高產能之趨勢下,業者欲於第一移料臂42上增設X軸向平行排列之取放器,以提升取放電子元件作業之產能時,即必須使各列取放器可作X-Y軸向間距之調整,以因應不同料盤之容置槽間距及各測試座之間距,方可便利取放電子元件,但該第一移料臂42之設計僅可使第一、二取放器421A、421B作單一Y軸向之間距調整,以致無法增設可作X軸向間距調整之取放器,造成取放電子元件作業產能受限之缺失。Press, please refer to Figure 1, which is a schematic diagram of the electronic component test sorting machine. The feeding device 10 and the receiving device 20 are arranged in front of the machine, and a plurality of testing devices are arranged behind the machine. 30, the feeding device 10 is provided with at least one tray 11 for accommodating grooves for holding a plurality of electronic components to be tested, and the receiving device 20 is also provided with a plurality of trays 21 having accommodating grooves. The test device 30 is provided with a test circuit board 31 having a plurality of test sockets 32 for testing electronic components, and a transport device 40 is provided on the machine platform for The electronic components to be tested/completed are transferred between the supply and receiving devices 10 and 20 and the testing device 30. The conveying device 40 is provided with a carrier 41 between the receiving device 20 and the testing device 30 for carrying Measuring/finishing the electronic component, and providing a first moving arm 42 with a plurality of pick-and-placers 421 between the supply and receiving device 10, 20 and the carrier 41 for transferring the tested/completed test An electronic component, and a second transfer arm 43 having a pick-and-placer 431 between the test device 30 and the carrier 41 for transferring the test/test The electronic components are different in the distance between the receiving slots of the trays 11 and 21 and the distance between the test sockets 32, that is, the pick-and-place units 421 and 431 of the first and second moving arms 42 and 43 must be used as Y. The axial spacing is adjusted so as to pick up the electronic components to be tested/completed at the trays 11, 21 and the test socket 32; please refer to Figures 2 and 3, taking the first moving arm 42 as an example, which is attached to the machine. The frame 422 is provided with first and second motors 423A, 423B for respectively driving the first and second Z-axis pulley sets 424A, 424B, and the first Z-axis pulley set 424A is equipped with a first pick-and-placer. 421A, and the second Z-axis pulley set 424B is equipped with a yoke frame 425 having a Y-axis sliding groove 4251, and is provided with a Y-axis sliding groove 4251 for sliding the bracket 4261 of the sliding frame 426, the sliding frame The front surface of the 426 is equipped with a second pick-and-placer 421B, and a transmission frame 427 is mounted on the back side, and a Z-axis slide rail 4271 and a Z-axis slide seat are provided between the transmission frame 427 and the carriage 426. 4262, further disposed on the back of the frame 422 is a third motor 423C for driving a Y-axis pulley set 428 located in front of the frame 422, and the Y-axis pulley set 428 is coupled. The frame 427, when adjusting the Y-axis spacing of the first and second pick-and-place devices 421A, 421B, uses the first pick-and-placer 421A as a reference member, and controls the third motor 423C to drive the Y-axis pulley set 428 to operate. The Y-axis pulley set 428 drives the transmission frame 427 for Y-axis displacement, and the transmission frame 427 drives the carriage 426 with the Z-axis slide 4271 and the Z-axis slide 4262 to drive the bracket 4261 along the turret 425. The Y-axis sliding groove 4251 is displaced in the Y-axis, so that the sliding frame 426 drives the second pick-and-placer 421B to be axially displaced relative to the first pick-and-placer 421A, and the first and second pick-and-place devices 421A, 421B are adjusted. Y-axis spacing; however, the first moving arm 42 can make the first and second pick-and-placers 421A, 421B make the Y-axis variable pitch adjustment and the Z-axis lifting displacement, but the first and second pick-and-placers 421A 421B for Z-axis lifting displacement is used for pick-and-place electronic components, does not involve the adjustment of the distance between the first and second pick-and-place 421A, 421B, and the Y-axis spacing adjustment of the first and second pick-and-place 421A, 421B In design, the moving arm 42 drives the Y-axis pulley set 428 only by the third motor 423C, and drives the second pick-and-placer 421B as a single Y-axis position via the transmission frame 427. However, in the current trend of high-capacity, the industry wants to add X-axis parallel-arranged pick-and-place devices to the first transfer arm 42 to improve the capacity of the electronic components. The XY axial spacing can be adjusted to facilitate the access to the electronic components in response to the spacing of the receiving slots of the different trays and the distance between the test sockets. However, the first moving arm 42 can only be designed first. The two pick-and-place devices 421A and 421B are adjusted as a single Y-axis axial distance, so that the pick-and-place device capable of adjusting the X-axis spacing cannot be added, resulting in a lack of limited production capacity of the pick-and-place electronic components.

故,如何設計一種易於增設取放器,並可迅速調整各取放器之X-Y軸向間距而便利取放電子元件,以提升檢測產能及作業便利性之檢測機,即為業者研發之標的。Therefore, how to design a detector that is easy to add a pick-and-place device, and can quickly adjust the X-Y axial spacing of each pick-and-place device to facilitate access to electronic components to improve the detection capacity and work convenience is the standard developed by the industry.

本發明之目的一,係提供一種電子元件之檢測機,係於機台上配置有供料裝置、收料裝置、檢測裝置及輸送裝置,該供料裝置係容納複數個待測之電子元件,收料裝置係容納複數個不同等級完測之電子元件,檢測裝置係用以檢測電子元件,該輸送裝置係於檢測裝置之前、後方各設有至少一載具,該載具係用以於供、收料裝置及檢測裝置間載送待測/完測之電子元件,另設有至少二具複數個取放器之移料臂,各移料臂係設有複式螺紋變距機構,用以調整各取放器之X-Y軸向間距,而可於供料裝置、收料裝置、檢測裝置及載具間移載待測/完測之電子元件;藉此,可易於增設取放器,並迅速調整各取放器之間距而便利取放電子元件,達到大幅提升檢測產能之實用效益。A first object of the present invention is to provide a detecting device for an electronic component, which is provided with a feeding device, a receiving device, a detecting device and a conveying device, wherein the feeding device accommodates a plurality of electronic components to be tested. The receiving device is for accommodating a plurality of electronic components of different levels, and the detecting device is for detecting electronic components. The conveying device is provided with at least one carrier before and after the detecting device, and the carrier is used for supplying , the receiving device and the detecting device carry the electronic component to be tested/completed, and at least two moving arms of a plurality of pickers are provided, and each moving arm is provided with a double thread changing mechanism for Adjusting the XY axial spacing of each pick and place device, and transferring the electronic components to be tested/tested between the feeding device, the receiving device, the detecting device and the carrier; thereby, the pick and place device can be easily added, and Quickly adjust the distance between each pick-and-placer to facilitate the access to electronic components, to achieve a substantial increase in the detection of practical productivity.

本發明之目的二,係提供一種電子元件之檢測機,該輸送裝置之複式螺紋變距機構係設有X軸向驅動源及Y軸向驅動源,該X軸向驅動源係用以驅動至少一具左、右螺紋之X軸向螺桿,並於X軸向螺桿上螺合二可作反向位移之X軸向螺座,且於各X軸向螺座上裝配取放器,而Y軸向驅動源係用以驅動至少一具左、右螺紋之Y軸向螺桿,並於Y軸向螺桿上螺合二可作反向位移之Y軸向螺座,且於各Y軸向螺座上裝配取放器,使得複式螺紋變距機構可迅速帶動各取放器作X-Y軸向間距調整,而縮短作業時間,達到大幅提升檢測產能之實用效益。A second object of the present invention is to provide a detecting device for an electronic component, wherein the multi-thread pitch changing mechanism of the conveying device is provided with an X-axis driving source and a Y-axis driving source, and the X-axis driving source is used to drive at least An X-axis screw with left and right threads, and an X-axis screw seat for screwing on the X-axis screw, and a pick-and-place device for each X-axis screw seat, and Y The axial driving source is for driving at least one Y-axis screw with left and right threads, and is screwed on the Y-axis screw to be a Y-axis screw seat for reverse displacement, and is screwed in each Y-axis. The seat is equipped with a pick-and-place device, so that the double thread pitch changing mechanism can quickly drive the pick and place devices to adjust the XY axial spacing, thereby shortening the working time and achieving the practical benefit of greatly improving the detection capacity.

本發明之目的三,係提供一種電子元件之檢測機,該輸送裝置之複式螺紋變距機構係於二X軸向螺座上分別穿設至少一Y軸向桿件,而於二Y軸向螺座上則分別穿設至少一X軸向桿件,並使各X軸向桿件之兩端與各Y軸向桿件之兩端作上下交錯設置,且於各交錯處裝設有配置座,而可於各配置座上裝配有取放器,進而易於增設X-Y軸向取放器,達到大幅提升檢測產能之實用效益。A third object of the present invention is to provide a detecting device for an electronic component, wherein the multi-thread pitch changing mechanism of the conveying device is configured to respectively pass at least one Y-axis member on the two X-axis screw seats, and in the two Y-axis directions At least one X-axis rod member is respectively disposed on the screw seat, and two ends of each X-axis rod member are arranged up-and-down with the two ends of each Y-axis rod member, and are disposed at each staggered portion. The seat can be equipped with a pick and place device in each of the configuration seats, so that it is easy to add an XY axial pick and place device, thereby achieving the practical benefit of greatly improving the detection capacity.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如后:請參閱第4圖,本發明檢測機係於機台上配置有供料裝置50、收料裝置60、空匣裝置70、檢測裝置80及輸送裝置90,該供料裝置50係設有至少一料盤501,該料盤501係具有複數個容置槽502,用以承置待測之電子元件,該收料裝置60係設有至少一料盤601,料盤601則具有複數個容置槽602,用以承置完測之電子元件,於本實施例中,係設有複數個料盤601,用以承置不同等級完測之電子元件,空匣裝置70係用以收置供料裝置50之空料盤,並將空料盤補充於收料裝置60,用以盛裝完測之電子元件,該檢測裝置80係可為電子元件之電性檢測、外觀檢測或其他相關之檢測,本實施例為電性檢測時,該檢測裝置80係設有具測試座82之測試電路板81,該測試座82可為常開型測試座或常閉型測試座,於本實施例中,該測試電路板81上係配置有9個常開型測試座82,用以同步執行9個電子元件之檢測作業,並以檢測器(圖未示出)將檢測結果傳輸至中央控制單元(圖未示出),由中央控制單元控制各裝置作動,該輸送裝置90包含有至少一載具及至少二移料臂,該載具可採活動式或固定式設計,於本實施例中,該輸送裝置90係於檢測裝置80之前方設有可作X軸向位移之第一載具91,第一載具91係設有複數個定位槽911,例如設有9個採X-Y軸向排列之定位槽911,用以載送待測之電子元件,以及於檢測裝置80之後方亦設有一可作X軸向位移之第二載具92,第二載具92係設有複數個定位槽921,例如設有9個採X-Y軸向排列之定位槽921,用以載送完測之電子元件,另該輸送裝置90係於供料裝置50與第一載具91間設有可作X-Y-Z軸向位移之第一移料臂93,用以移載待測之電子元件,於第一載具91與檢測裝置80間設有可作Y-Z軸向位移之第二移料臂95,用以移載待測之電子元件,於檢測裝置80與第二載具92間設有可作Y-Z軸向位移之第三移料臂96,用以移載完測之電子元件,於第二載具92與收料裝置60間設有可作X-Y-Z軸向位移之第四移料臂97,用以移載完測之電子元件,該輸送裝置90可視移載電子元件作業所需,而於各移料臂上設有固定式取放器或變距式取放器,由於第一、二載具91、92之各定位槽911、921的X-Y軸向間距係相對於檢測裝置80之各測試座82的X-Y軸向間距,於本實施例中,該第二移料臂95及第三移料臂96可分別設置複數個固定式之取放器951、961,而供、收料裝置50、60之容置槽502、602的X-Y軸向間距,因不同待測電子元件,而可能不同於第一、二載具91、92之定位槽911、921的X-Y軸向間距,於本實施例中,該第一移料臂93及第四移料臂97係可分別設置複數個變距式之取放器931、971,以配合不同電子元件進行取放作業。In order to make the present invention further understand the present invention, a preferred embodiment and a drawing will be described in detail as follows: Referring to FIG. 4, the detecting machine of the present invention is equipped with a feeding device on the machine table. 50, a receiving device 60, an open device 70, a detecting device 80 and a conveying device 90, the feeding device 50 is provided with at least one tray 501, the tray 501 has a plurality of receiving slots 502 for bearing The receiving device 60 is provided with at least one tray 601. The tray 601 has a plurality of receiving slots 602 for receiving the completed electronic components. In this embodiment, A plurality of trays 601 are provided for receiving electronic components of different levels of measurement, and the empty device 70 is for receiving the empty tray of the feeding device 50, and replenishing the empty tray to the receiving device 60, The detecting device 80 can be used for electrical detection, appearance detection or other related detection of the electronic component. In the embodiment, when the electrical detection is performed, the detecting device 80 is provided with a test socket. 82 test circuit board 81, the test stand 82 can be a normally open test stand or a normally closed type test In this embodiment, the test circuit board 81 is provided with nine normally-open test sockets 82 for synchronously performing the detection operations of the nine electronic components, and is detected by a detector (not shown). The result is transmitted to a central control unit (not shown), which is controlled by a central control unit, the transport device 90 comprising at least one carrier and at least two transfer arms, the carrier being movable or fixed. In the present embodiment, the transport device 90 is provided with a first carrier 91 that can be displaced in the X-axis direction in front of the detecting device 80. The first carrier 91 is provided with a plurality of positioning slots 911, for example, 9 XY axially aligned positioning slots 911 for carrying the electronic components to be tested, and a second carrier 92 for X-axis displacement behind the detecting device 80, the second carrier 92 A plurality of positioning slots 921 are provided, for example, nine positioning slots 921 for XY axial alignment are arranged for carrying the tested electronic components, and the conveying device 90 is attached to the feeding device 50 and the first carrier. 91 is provided with a first transfer arm 93 which can be used for XYZ axial displacement, for transferring electronic components to be tested, A second transfer arm 95 capable of YZ axial displacement is disposed between the first carrier 91 and the detecting device 80 for transferring the electronic component to be tested, and the detecting device 80 and the second carrier 92 are disposed between the detecting device 80 and the second carrier 92. A third transfer arm 96 for YZ axial displacement is used for transferring the completed electronic component, and a fourth transfer arm 97 capable of XYZ axial displacement is disposed between the second carrier 92 and the receiving device 60. For transferring electronic components that have been tested, the conveying device 90 can be used for moving the electronic components, and a fixed pick-and-place or variable pitch pick-and-place device is provided on each of the moving arms. The XY axial spacing of each of the positioning slots 911, 921 of the two carriers 91, 92 is relative to the XY axial spacing of the test sockets 82 of the detecting device 80. In this embodiment, the second moving arm 95 and the second The three shifting arms 96 can be respectively provided with a plurality of fixed pickers 951, 961, and the XY axial spacing of the receiving slots 502, 602 of the feeding and receiving devices 50, 60, due to different electronic components to be tested, The XY axial spacing of the positioning slots 911 and 921 of the first and second carriers 91 and 92 may be different. In this embodiment, the first moving arm 93 and the fourth moving arm 97 are A plurality of variable pitch pick-and-place devices 931 and 971 are respectively arranged to perform pick-and-place operations with different electronic components.

請參閱第4、5、6、7圖,由於第一、四移料臂93、97之設計相同,於本實施例中,係以第一移料臂93作一說明,該第一移料臂93係設有移載機構930、複式螺紋變距機構及複數個取放器931,並於移載機構930之機架932上裝配複式螺紋變距機構,以帶動其作X-Y-Z軸向位移,該複式螺紋變距機構係於機架932之下方設有X軸向驅動源及Y軸向驅動源,該X軸向驅動源係用以驅動至少一具左、右螺紋之X軸向螺桿,於本實施例中,該X軸向驅動源係為一X軸向馬達933,用以驅動一具左、右螺紋之X軸向螺桿934,該X軸向螺桿934之中間位置係穿設一固設於機架932上之配置座935A,並於左、右螺紋處分別螺合一X軸向螺座936,再於配置座935A及二X軸向螺座936上各裝配有一取放器931,於X軸向螺桿934驅動二X軸向螺座936位移時,可使二X軸向螺座936以配置座935A為基準件,而作X軸向之反向位移,以調整各取放器931之X軸向間距,又該Y軸向驅動源係用以驅動至少一具左、右螺紋之Y軸向螺桿,於本實施例中,該Y軸向驅動源係為一Y軸向馬達937,用以驅動一具左、右螺紋之Y軸向螺桿938,該Y軸向螺桿938之中間位置亦穿設於配置座935A,且與X軸向螺桿934作上下錯位配置,而於左、右螺紋處分別螺合一Y軸向螺座939,二Y軸向螺座939上則各裝配有一取放器931,於Y軸向螺桿938驅動二Y軸向螺座939位移時,可使二Y軸向螺座939以配置座935A為基準件,而作Y軸向之反向位移,以調整各取放器931之Y軸向間距,另於二X軸向螺座936上分別穿設有一Y軸向桿件940,並於二Y軸向螺座939上分別穿設有一X軸向桿件941,該二Y軸向桿件940之兩端及二X軸向桿件941之兩端係呈上下交錯配置,並於各交錯處裝設一配置座935B,再於各配置座935B上裝配有一取放器931,當二X軸向螺座936帶動二Y軸向桿件940作X軸向位移,以及二Y軸向螺座939帶動二X軸向桿件941作Y軸向位移時,係可帶動各配置座935B及其上之各取放器931作X-Y軸向位移,使得複式螺紋變距機構可易於增設取放器931,以及迅速調整9個取放器931之X-Y軸向間距,再者,本實施例第一移料臂93之各取放器931係由移載機構930帶動同步作Z軸向位移,以取放電子元件,該第一移料臂93亦可於各X軸向螺座936、各Y軸向螺座939及各配置座935A、935B上分別裝配一為壓缸之Z軸向驅動源,再於各壓缸上裝配取放器931,使各取放器931可獨立執行Z軸向位移,以取放電子元件。Referring to Figures 4, 5, 6, and 7, since the first and fourth transfer arms 93, 97 are identical in design, in the present embodiment, the first transfer arm 93 is used as a description, and the first transfer material is used. The arm 93 is provided with a transfer mechanism 930, a multi-thread pitch changing mechanism and a plurality of pick-and-place devices 931, and a multi-thread pitch changing mechanism is mounted on the frame 932 of the transfer mechanism 930 to drive the XYZ axial displacement. The double thread pitch changing mechanism is disposed below the frame 932 with an X-axis driving source and a Y-axis driving source, and the X-axis driving source is configured to drive at least one X-axis screw with left and right threads. In this embodiment, the X-axis driving source is an X-axis motor 933 for driving a left- and right-threaded X-axis screw 934, and the X-axis screw 934 is disposed at a middle position. The mounting seat 935A is fixed on the frame 932, and an X-axis screw seat 936 is respectively screwed on the left and right threads, and a pick-and-place device is respectively disposed on the mounting seat 935A and the two X-axis screw seats 936. 931, when the X-axis screw 934 drives the displacement of the two X-axis screw seats 936, the two X-axis screw seats 936 can be used as the reference member with the mounting seat 935A as the reference member, and the X-axis reverse displacement In order to adjust the X-axis spacing of each of the pick-and-placers 931, the Y-axis driving source is used to drive at least one Y-axis screw with left and right threads. In this embodiment, the Y-axis driving source The utility model relates to a Y-axis motor 937 for driving a Y-axis screw 938 with left and right threads. The middle position of the Y-axis screw 938 is also disposed at the arranging seat 935A, and is matched with the X-axis screw 934. The upper and lower dislocations are arranged, and a Y-axis screw seat 939 is respectively screwed on the left and right threads, and the two Y-axis screw seats 939 are respectively equipped with a pick-and-placer 931, and the Y-axis screw 938 drives the two Y-axis directions. When the screw seat 939 is displaced, the two Y-axis screw seat 939 can be used as the reference member with the arrangement seat 935A as the reference member, and the Y-axis reverse displacement can be adjusted to adjust the Y-axis spacing of each pick-and-placer 931, and the other two X A Y-axis rod member 940 is respectively disposed on the axial screw seat 936, and an X-axis rod member 941 is respectively disposed on the two Y-axis screw seats 939, and the two Y-axis rod members 940 are respectively The two ends of the two X-axis rod members 941 are arranged in an up-and-down staggered manner, and a arranging seat 935B is disposed at each staggered portion, and a pick-and-placer 931 is mounted on each arranging seat 935B, and two X-axis screw seats 936 are used. band When the two Y-axis rods 940 are X-axis displacement, and the two Y-axis screw seats 939 drive the two X-axis rod members 941 for Y-axis displacement, the respective arrangement seats 935B and the upper and lower sides thereof can be driven. The 931 is XY axially displaced, so that the double thread changing mechanism can easily add the pick and place 931, and the XY axial spacing of the nine pickers 931 can be quickly adjusted. Furthermore, the first moving arm 93 of the present embodiment Each of the pick-and-place devices 931 is synchronously moved by the transfer mechanism 930 for Z-axis displacement to take and place electronic components. The first transfer arm 93 can also be used in each X-axis screw seat 936 and each Y-axis screw seat 939. And each of the mounting seats 935A, 935B is respectively equipped with a Z-axis driving source for the pressure cylinder, and then the pick-and-placer 931 is assembled on each of the pressure cylinders, so that each pick-and-placer 931 can independently perform Z-axis displacement for pick-and-place Electronic component.

請參閱第8、9圖,於使用時,第一移料臂93之移載機構930係帶動各取放器931位移至供料裝置50之料盤501上方,並控制X軸向馬達933及Y軸向馬達937分別驅動X軸向螺桿934及Y軸向螺桿938旋轉作動,由於X軸向螺桿934及Y軸向螺桿938上各具有旋向相反之左、右螺紋,使得X軸向螺桿934可帶動二X軸向螺座936及二取放器931作X軸向之向內位移,而二X軸向螺座936則同時帶動二Y軸向桿件940作X軸向之向內位移,使二Y軸向桿件940再帶動各配置座935B及其上之各取放器931作X軸向之向內位移,而Y軸向螺桿938則可帶動二Y軸向螺座939及二取放器931作Y軸向之向內位移,二Y軸向螺座939亦同時帶動二X軸向桿件941作Y軸向之向內位移,使二X軸向桿件941再帶動各配置座935B及其上之各取放器931作Y軸向之向內位移,進而可調整縮小各取放器931之X-Y軸向間距,移載機構930再帶動各取放器931作Z軸向位移,以於料盤501上取出待測之電子元件100。Referring to FIGS. 8 and 9, in use, the transfer mechanism 930 of the first transfer arm 93 drives the pick and placeers 931 to move over the tray 501 of the feeding device 50, and controls the X-axis motor 933 and The Y-axis motor 937 drives the X-axis screw 934 and the Y-axis screw 938 to rotate, respectively. Since the X-axis screw 934 and the Y-axis screw 938 have opposite left and right threads, the X-axis screw is made. 934 can drive the two X-axis screw seats 936 and the two pick-up devices 931 for the X-axis inward displacement, and the two X-axis screw seats 936 simultaneously drive the two Y-axis rod members 940 for the X-axis inward. The displacement causes the two Y-axis members 940 to drive the respective positioning seats 935B and the pick-and-placers 931 thereon to be displaced in the X-axis direction, and the Y-axis screws 938 can drive the two Y-axis screws 939. And the second pick-and-placer 931 is displaced inward in the Y-axis, and the two Y-axis screw seats 939 also drive the two X-axis members 941 to perform the Y-axis inward displacement, so that the two X-axis members 941 Each of the positioning seats 935B and the pick-and-placers 931 thereon are displaced in the Y-axis direction, and the XY axial spacing of each of the pick-and-placers 931 can be adjusted and reduced, and the transfer mechanism 930 drives the pick-and-placers 931 again. Z axis Displacement to take out the electronic component 100 to be tested on the tray 501.

請參閱第10、11圖,當第一移料臂93之複數個取放器931取出待測之電子元件100後,移載機構930則帶動各取放器931位移至第一載具91處,由於供料裝置50之各容置槽502的X-Y軸向間距因不同電子元件而不同於第一載具91之定位槽911的X-Y軸向間距,該第一移料臂93則調整放大各取放器931之X-Y軸向間距,於調整時,係控制X軸向馬達933及Y軸向馬達937分別驅動X軸向螺桿934及Y軸向螺桿938反向旋轉作動,使得X軸向螺桿934可帶動二X軸向螺座936及裝配於上之二取放器931作X軸向之向外位移,而二X軸向螺座936則同時帶動二Y軸向桿件940作X軸向之向外位移,二Y軸向桿件940再帶動各配置座935B及其上之各取放器931作X軸向之向外位移,而Y軸向螺桿938可帶動二Y軸向螺座939及裝配於上之二取放器931作Y軸向之向外位移,二Y軸向螺座939亦同時帶動二X軸向桿件941作Y軸向之向外位移,使二X軸向桿件941再帶動各配置座935B及其上之各取放器931作Y軸向之向外位移,進而可調整放大各取放器931之X-Y軸向間距,使得各取放器931之X-Y軸向間距對應於第一載具91之定位槽911的X-Y軸向間距,移載機構930再帶動各取放器931作Z軸向位移將待測之電子元件100放置於第一載具91上。Referring to FIGS. 10 and 11, when the plurality of pick and placeers 931 of the first transfer arm 93 take out the electronic component 100 to be tested, the transfer mechanism 930 drives the pick and placeers 931 to the first carrier 91. The XY axial spacing of each of the receiving slots 502 of the feeding device 50 is different from the XY axial spacing of the positioning slots 911 of the first carrier 91 by different electronic components, and the first moving arm 93 is adjusted and enlarged. The XY axial spacing of the pick-and-placer 931 is controlled to control the X-axis motor 933 and the Y-axis motor 937 to drive the X-axis screw 934 and the Y-axis screw 938 to rotate in opposite directions, so that the X-axis screw The 934 can drive the two X-axis screw seats 936 and the upper two pick-and-place 931 for the X-axis outward displacement, and the two X-axis screw seats 936 simultaneously drive the two Y-axis rod members 940 for the X-axis. Displaceing outwardly, the two Y-axis rods 940 further drive the respective positioning seats 935B and the pick-and-placers 931 thereon to perform an X-axis outward displacement, and the Y-axis screw 938 can drive the two Y-axis screws. The seat 939 and the upper second pick-and-placer 931 are outwardly displaced in the Y-axis, and the two Y-axis screw seats 939 also drive the two X-axis rod members 941 to perform the Y-axis outward displacement, so that the two X The axial rod member 941 further drives the respective positioning seats 935B and the pick-and-placers 931 thereon for outward displacement of the Y-axis, thereby adjusting and aligning the XY axial spacing of each of the pick-and-placers 931 so that the pick-and-placers 931 The XY axial spacing corresponds to the XY axial spacing of the positioning slot 911 of the first carrier 91. The transfer mechanism 930 further drives the pick and placeers 931 for Z-axis displacement to place the electronic component 100 to be tested on the first load. With 91 on.

請參閱第12圖,第一載具91係承載待測之電子元件100至檢測裝置80之前方,第二移動臂95之各取放器951即於第一載具91之定位槽911中取出待測之電子元件100;請參閱第13圖,第二移動臂95之各取放器951係將待測之電子元件100移載至檢測裝置80之各測試座82中,各測試座82即執行檢測作業,並使測試電路板81將檢測訊號傳輸至檢測器,檢測器再將檢測結果傳輸至中央控制單元,此時,該第一載具91則復位承載下一待測之電子元件110;請參閱第14圖,於測試座82之檢測作業完畢後,由於第一載具91已承載下一待測之電子元件110至檢測裝置80之前方,該第二移動臂95之各取放器951則移動至第一載具91之上方,並取出下一待測之電子元件110,此時,第三移動臂96之各取放器961係位移至檢測裝置80之上方,使各取放器961於各測試座82中取出完測之電子元件100;請參閱第15圖,第三移動臂96之各取放器961係將完測之電子元件100移載放置於第二載具92之定位槽921上,此時,第二移動臂95之各取放器951則將下一待測之電子元件110移載置入於檢測裝置80之各測試座82內而接續執行檢測作業;請參閱第16、17圖,第二載具92係載出完測之電子元件100,第四移動臂97之移載機構970再帶動各取放器971位移至第二載具92之上方,並利用複式螺紋變距機構驅動調整放大各取放器971之X-Y軸向間距,以對應於第二載具92之定位槽921的X-Y軸向間距,移載機構970再帶動各取放器971作Z軸向位移,而於第二載具92上取出完測之電子元件100;請參閱第18、19圖,之後,第四移動臂97之移載機構970係帶動各取放器971位移至收料裝置60之料盤601處,再利用複式螺紋變距機構驅動調整縮小各取放器971之X-Y軸向間距,以對應於料盤61之容置槽602的X-Y軸向間距,移載機構970則帶動各取放器971作Z軸向位移,並依檢測結果(如良品電子元件、不良品電子元件或次級品電子元件),而直接將完測之電子元件100置入於料盤601之各容置槽602中,以完成分類收置作業。Referring to FIG. 12 , the first carrier 91 carries the electronic component 100 to be tested to the front of the detecting device 80 , and the pick-and-place 951 of the second moving arm 95 is taken out in the positioning slot 911 of the first carrier 91 . The electronic component 100 to be tested; referring to FIG. 13, each of the pick-and-place devices 951 of the second moving arm 95 transfers the electronic component 100 to be tested to each test socket 82 of the detecting device 80, and each test socket 82 is The test operation is performed, and the test circuit board 81 transmits the detection signal to the detector, and the detector transmits the detection result to the central control unit. At this time, the first carrier 91 resets and carries the next electronic component 110 to be tested. Referring to FIG. 14 , after the testing operation of the test socket 82 is completed, since the first carrier 91 has carried the next electronic component 110 to be tested to the front of the detecting device 80, the second moving arm 95 is placed and removed. The device 951 moves to the top of the first carrier 91 and takes out the next electronic component 110 to be tested. At this time, the pick-and-placers 961 of the third moving arm 96 are displaced above the detecting device 80 to make each The receiver 961 takes out the tested electronic component 100 in each test socket 82; see Figure 15 Each of the pick-and-place devices 961 of the third moving arm 96 is placed on the positioning groove 921 of the second carrier 92 by the transfer of the electronic component 100, and the pick-and-placer 951 of the second moving arm 95 will The next electronic component 110 to be tested is placed in each test socket 82 of the detecting device 80 to perform the detecting operation; refer to FIGS. 16 and 17 , and the second carrier 92 carries out the tested electronic component 100 . The transfer mechanism 970 of the fourth moving arm 97 further drives the pick-and-place 971 to be displaced above the second carrier 92, and drives and adjusts the XY axial spacing of each of the pickers 971 by using a multi-thread pitch changing mechanism. Corresponding to the XY axial spacing of the positioning slot 921 of the second carrier 92, the transfer mechanism 970 further drives the pick-and-placer 971 for Z-axis displacement, and the completed electronic component 100 is removed from the second carrier 92; Referring to FIGS. 18 and 19, the transfer mechanism 970 of the fourth moving arm 97 drives the pick-and-place 971 to the tray 601 of the receiving device 60, and then uses the multi-thread pitch changing mechanism to drive the adjustment and reduction. The XY axial spacing of the pick-and-place 971 corresponds to the XY axial spacing of the receiving slots 602 of the tray 61, and the transfer mechanism 970 The respective pick-and-placer 971 is driven to perform Z-axis displacement, and the completed electronic component 100 is directly placed in the tray 601 according to the detection result (such as good electronic component, defective electronic component or secondary electronic component). In each of the accommodating grooves 602, the sorting and collecting operation is completed.

據此,本發明可易於增設取放器,並迅速調整各取放器之X-Y軸向間距,以利取放電子元件,而大幅提升檢測產能及作業便利性,實為一深具實用性及進步性之設計,然未見有相同之產品及刊物公開,從而允符發明專利申請要件,爰依法提出申請。Accordingly, the present invention can easily add a pick and place device, and quickly adjust the XY axial spacing of each pick and place device, so as to facilitate the electronic components, and greatly improve the detection capacity and work convenience, which is practical and practical. Progressive design, but did not see the same product and publications open, thus allowing the invention patent application requirements, 提出 apply in accordance with the law.

[習式][Literature]

10...供料裝置10. . . Feeding device

11...料盤11. . . Trays

20...收料裝置20. . . Receiving device

21...料盤twenty one. . . Trays

30...測試裝置30. . . Test device

31...測試電路板31. . . Test board

32...測試座32. . . Test stand

40...輸送裝置40. . . Conveyor

41...載具41. . . vehicle

42...第一移料臂42. . . First transfer arm

421...取放器421. . . Pick and place

421A...第一取放器421A. . . First pick and place

421B...第二取放器421B. . . Second pick and place

422...機架422. . . frame

423A...第一馬達423A. . . First motor

423B...第二馬達423B. . . Second motor

423C...第三馬達423C. . . Third motor

424A...第一Z軸向皮帶輪組424A. . . First Z-axis pulley set

424B...第二Z軸向皮帶輪組424B. . . Second Z-axis pulley set

425...掣動架425. . . Swing frame

4251...Y軸向滑槽4251. . . Y axial chute

426...滑動架426. . . Sliding frame

4261...凸榫4261. . . Convex

4262...Z軸向滑座4262. . . Z axial slide

427...傳動架427. . . Drive frame

4271...Z軸向滑軌4271. . . Z axial slide

428...Y軸向皮帶輪組428. . . Y axial pulley set

43...第二移料臂43. . . Second transfer arm

431...取放器431. . . Pick and place

[本發明][this invention]

50...供料裝置50. . . Feeding device

501...料盤501. . . Trays

502...容置槽502. . . Locating slot

60...收料裝置60. . . Receiving device

601...料盤601. . . Trays

602...容置槽602. . . Locating slot

70...空匣裝置70. . . Open device

80...檢測裝置80. . . Testing device

81...測試電路板81. . . Test board

82...測試座82. . . Test stand

90...輸送裝置90. . . Conveyor

91...第一載具91. . . First vehicle

911...定位槽911. . . Positioning slot

92...第二載具92. . . Second vehicle

921...定位槽921. . . Positioning slot

93...第一移料臂93. . . First transfer arm

930...移載機構930. . . Transfer mechanism

931...取放器931. . . Pick and place

932...機架932. . . frame

933...X軸向馬達933. . . X-axis motor

934...X軸向螺桿934. . . X-axis screw

935A、935B...配置座935A, 935B. . . Configuration seat

936...X軸向螺座936. . . X-axis screw seat

937...Y軸向馬達937. . . Y axial motor

938...Y軸向螺桿938. . . Y axial screw

939...Y軸向螺座939. . . Y-axis screw seat

940...Y軸向桿件940. . . Y axial rod

941...X軸向桿件941. . . X axial rod

95...第二移料臂95. . . Second transfer arm

951...取放器951. . . Pick and place

96...第三移料臂96. . . Third transfer arm

961...取放器961. . . Pick and place

97...第四移料臂97. . . Fourth transfer arm

970...移載機構970. . . Transfer mechanism

971...取放器971. . . Pick and place

100、110...電子元件100, 110. . . Electronic component

第1圖:習式應用於檢測機各裝置之配置示意圖。Figure 1: Schematic diagram of the configuration of the application of each device in the test machine.

第2圖:習式移料裝置之外觀圖。Figure 2: Appearance of the conventional material transfer device.

第3圖:習式移料裝置之側視圖。Figure 3: Side view of the conventional shifting device.

第4圖:本發明檢測機各裝置之配置示意圖。Fig. 4 is a schematic view showing the configuration of each device of the detecting machine of the present invention.

第5圖:本發明第一移料臂之俯視圖。Figure 5: Top view of the first transfer arm of the present invention.

第6圖:本發明第一移料臂之前視圖。Figure 6: Front view of the first transfer arm of the present invention.

第7圖:本發明第一移料臂之側視圖。Figure 7: Side view of the first transfer arm of the present invention.

第8圖:本發明檢測機之使用示意圖(一)。Figure 8: Schematic diagram of the use of the detector of the present invention (1).

第9圖:係第一移料臂調整縮小各取放器間距之使用示意圖。Figure 9: Schematic diagram of the use of the first transfer arm to adjust and reduce the spacing of each pick and place.

第10圖:本發明檢測機之使用示意圖(二)。Figure 10: Schematic diagram of the use of the detector of the present invention (2).

第11圖:係第一移料臂調整放大各取放器間距之使用示意圖。Figure 11: Schematic diagram of the use of the first transfer arm to adjust the magnification of each pick and place.

第12圖:本發明檢測機之使用示意圖(三)。Figure 12: Schematic diagram of the use of the detector of the present invention (3).

第13圖:本發明檢測機之使用示意圖(四)。Figure 13: Schematic diagram of the use of the detector of the present invention (4).

第14圖:本發明檢測機之使用示意圖(五)。Figure 14: Schematic diagram of the use of the detector of the present invention (5).

第15圖:本發明檢測機之使用示意圖(六)。Figure 15: Schematic diagram of the use of the detector of the present invention (6).

第16圖:本發明檢測機之使用示意圖(七)。Figure 16: Schematic diagram of the use of the detector of the present invention (7).

第17圖:係第二移料臂調整放大各取放器間距之使用示意圖。Figure 17: Schematic diagram of the use of the second transfer arm to adjust the magnification of each pick and place.

第18圖:本發明檢測機之使用示意圖(八)。Figure 18: Schematic diagram of the use of the detector of the present invention (8).

第19圖:係第二移料臂調整縮小各取放器間距之使用示意圖。Figure 19: Schematic diagram of the use of the second transfer arm to adjust and reduce the spacing of each pick and place.

50...供料裝置50. . . Feeding device

501...料盤501. . . Trays

502...容置槽502. . . Locating slot

60...收料裝置60. . . Receiving device

601...料盤601. . . Trays

602...容置槽602. . . Locating slot

70...空匣裝置70. . . Open device

80...檢測裝置80. . . Testing device

81...測試電路板81. . . Test board

82...測試座82. . . Test stand

90...輸送裝置90. . . Conveyor

91...第一載具91. . . First vehicle

911...定位槽911. . . Positioning slot

92...第二載具92. . . Second vehicle

921...定位槽921. . . Positioning slot

93...第一移料臂93. . . First transfer arm

930...移載機構930. . . Transfer mechanism

931...取放器931. . . Pick and place

95...第二移料臂95. . . Second transfer arm

951...取放器951. . . Pick and place

96...第三移料臂96. . . Third transfer arm

961...取放器961. . . Pick and place

97...第四移料臂97. . . Fourth transfer arm

970...移載機構970. . . Transfer mechanism

971...取放器971. . . Pick and place

Claims (7)

一種電子元件之檢測機,包含:機台;供料裝置:係配置於機台上,並設有至少一料盤,該料盤係具有複數個容置槽,以容納複數個待測之電子元件;收料裝置:係配置於機台上,用以容納複數個完測之電子元件;檢測裝置:係配置於機台上,用以檢測電子元件;輸送裝置:係配置於機台上,其設有至少二具複數個取放器之移料臂及至少一具有複數個定位槽之載具,用以移載電子元件,並於至少一移料臂上設有移載機構,於該移載機構之機架上則設有具複數個取放器之複式螺紋變距機構,該複式螺紋變距機構係於機架之下方設有X軸向驅動源及Y軸向驅動源,該X軸向驅動源係用以驅動至少一具左、右螺紋之X軸向螺桿,並於X軸向螺桿上螺合至少二反向位移之X軸向螺座,且於各X軸向螺座上裝配取放器,而Y軸向驅動源則用以驅動至少一具左、右螺紋之Y軸向螺桿,並於Y軸向螺桿上螺合至少二反向位移之Y軸向螺座,且於各Y軸向螺座上裝配取放器,而可調整各取放器之X一Y軸向間距,另該載具之定位槽的間距係不同於供料裝置之料盤容置槽的間距;中央控制單元:係用以控制及整合各裝置作動,以執行自動化作業。 A detecting device for an electronic component, comprising: a machine table; a feeding device: disposed on the machine table, and provided with at least one tray, the tray having a plurality of receiving slots for accommodating a plurality of electrons to be tested The receiving device is arranged on the machine to accommodate a plurality of completed electronic components; the detecting device is disposed on the machine for detecting electronic components; and the conveying device is disposed on the machine. The utility model is provided with at least two transfer arms of a plurality of pick-and-placers and at least one carrier having a plurality of positioning grooves for transferring electronic components, and a transfer mechanism is arranged on at least one of the transfer arms. The frame of the transfer mechanism is provided with a double thread pitch changing mechanism with a plurality of pick and place devices, and the double thread changing mechanism is provided with an X-axis driving source and a Y-axis driving source below the frame. The X-axis driving source is for driving at least one X-axis screw with left and right threads, and screwing at least two X-axis screw seats of the reverse displacement on the X-axis screw, and screwing in each X-axis The seat is equipped with a pick and place device, and the Y-axis drive source is used to drive at least one left and right thread Y To the screw, and screwing at least two Y-axis screw seats of the reverse displacement on the Y-axis screw, and assembling the pick-and-place device on each Y-axis screw seat, and adjusting the X-Y axis of each pick and place device The spacing of the positioning grooves of the carrier is different from the spacing of the receiving grooves of the feeding device; the central control unit is used to control and integrate the operations of the devices to perform automated operations. 依申請專利範圍第1項所述之電子元件之檢測機,其中,該收料裝置係設有複數個具容置槽之料盤,用以承置不同檢測結果之完測電子元件。 The detecting device for an electronic component according to claim 1, wherein the receiving device is provided with a plurality of trays having receiving slots for receiving the electronic components of different testing results. 依申請專利範圍第1項所述之電子元件之檢測機,其中,該輸送裝置係於檢測裝置之前、後方各設有至少一載具,用以承置電子元件。 The detecting device for an electronic component according to claim 1, wherein the conveying device is provided with at least one carrier before and behind the detecting device for receiving the electronic component. 依申請專利範圍第1項所述之電子元件之檢測機,其中,該複式螺紋變距機構之X軸向驅動源係為X軸向馬達,用以驅動X軸向螺桿,而Y軸向驅動源則為Y軸向馬達,用以驅動Y軸向螺桿。 The electronic component detecting machine according to claim 1, wherein the X-axis driving source of the double-thread changing mechanism is an X-axis motor for driving the X-axis screw and the Y-axis driving The source is a Y-axis motor for driving the Y-axis screw. 依申請專利範圍第1項所述之電子元件之檢測機,其中,該複式螺紋變距機構係於各X軸向螺座上分別穿設有至少一Y軸向桿件,而於各Y軸向螺座上分別穿設有至少一X軸向桿件,各Y軸向桿件與各X軸向桿件係呈上下交錯配置,並於各交錯處裝設一配置座,再於各配置座上裝配有取放器。 The detecting device for an electronic component according to claim 1, wherein the multi-thread pitch changing mechanism is provided with at least one Y-axis member on each X-axis screw seat, and each Y-axis At least one X-axis rod member is respectively disposed on the screw seat, and each Y-axis rod member and each X-axis rod member are vertically arranged alternately, and a arranging seat is disposed at each staggered portion, and then configured The seat is equipped with a pick and place. 依申請專利範圍第5項所述之電子元件之檢測機,其中,各X軸向螺座、Y軸向螺座及配置座係分別裝配一為壓缸之Z軸向驅動源,再於各壓缸上裝配取放器,使各取放器可獨立執行Z軸向位移,以取放電子元件。 The detecting device for an electronic component according to claim 5, wherein each of the X-axis screw seat, the Y-axis screw seat and the arranging seat are respectively equipped with a Z-axis driving source for the pressure cylinder, and then The pressure cylinder is equipped with a pick and place device, so that each of the pick and place devices can independently perform Z-axis displacement to take and place electronic components. 依申請專利範圍第1項所述之電子元件之檢測機,更包含於機台上配置有空匣裝置,該空匣裝置係用以收置供料裝置之空料盤,並將空料盤補充於收料裝置,用以盛裝完測之電子元件。 The detecting device for the electronic component according to the first aspect of the patent application, further comprising an empty device disposed on the machine table, the empty device is for receiving the empty tray of the feeding device, and the empty tray is It is added to the receiving device to hold the finished electronic components.
TW099107269A 2010-03-12 2010-03-12 Testing machine for electronic elements TWI454415B (en)

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CN114516537A (en) * 2020-11-19 2022-05-20 三赢科技(深圳)有限公司 Adsorption component and adsorption device
CN114955541B (en) * 2022-06-30 2024-04-09 歌尔科技有限公司 Battery testing device

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TWM339481U (en) * 2007-10-18 2008-09-01 Alpha Plus Machinery Corp Rapid adjusting apparatus for material storing rack
TW200948693A (en) * 2008-05-23 2009-12-01 Hon Tech Inc Vertical moving mechanism of a picker for a carrying device

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TWI296049B (en) * 2006-03-21 2008-04-21 Hon Tech Inc Ic testing machine capable of simultaneously testing a plurality of integrated circuits
TWM339481U (en) * 2007-10-18 2008-09-01 Alpha Plus Machinery Corp Rapid adjusting apparatus for material storing rack
TW200948693A (en) * 2008-05-23 2009-12-01 Hon Tech Inc Vertical moving mechanism of a picker for a carrying device

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