TWI454415B - Testing machine for electronic elements - Google Patents

Description

Electronic component inspection machine

The invention provides a detecting machine which can easily add a pick-and-place device and quickly adjust the X-Y axial spacing of each pick-and-place device to facilitate the taking of electronic components, thereby greatly improving the detection capacity and work convenience.

Press, please refer to Figure 1, which is a schematic diagram of the electronic component test sorting machine. The feeding device 10 and the receiving device 20 are arranged in front of the machine, and a plurality of testing devices are arranged behind the machine. 30, the feeding device 10 is provided with at least one tray 11 for accommodating grooves for holding a plurality of electronic components to be tested, and the receiving device 20 is also provided with a plurality of trays 21 having accommodating grooves. The test device 30 is provided with a test circuit board 31 having a plurality of test sockets 32 for testing electronic components, and a transport device 40 is provided on the machine platform for The electronic components to be tested/completed are transferred between the supply and receiving devices 10 and 20 and the testing device 30. The conveying device 40 is provided with a carrier 41 between the receiving device 20 and the testing device 30 for carrying Measuring/finishing the electronic component, and providing a first moving arm 42 with a plurality of pick-and-placers 421 between the supply and receiving device 10, 20 and the carrier 41 for transferring the tested/completed test An electronic component, and a second transfer arm 43 having a pick-and-placer 431 between the test device 30 and the carrier 41 for transferring the test/test The electronic components are different in the distance between the receiving slots of the trays 11 and 21 and the distance between the test sockets 32, that is, the pick-and-place units 421 and 431 of the first and second moving arms 42 and 43 must be used as Y. The axial spacing is adjusted so as to pick up the electronic components to be tested/completed at the trays 11, 21 and the test socket 32; please refer to Figures 2 and 3, taking the first moving arm 42 as an example, which is attached to the machine. The frame 422 is provided with first and second motors 423A, 423B for respectively driving the first and second Z-axis pulley sets 424A, 424B, and the first Z-axis pulley set 424A is equipped with a first pick-and-placer. 421A, and the second Z-axis pulley set 424B is equipped with a yoke frame 425 having a Y-axis sliding groove 4251, and is provided with a Y-axis sliding groove 4251 for sliding the bracket 4261 of the sliding frame 426, the sliding frame The front surface of the 426 is equipped with a second pick-and-placer 421B, and a transmission frame 427 is mounted on the back side, and a Z-axis slide rail 4271 and a Z-axis slide seat are provided between the transmission frame 427 and the carriage 426. 4262, further disposed on the back of the frame 422 is a third motor 423C for driving a Y-axis pulley set 428 located in front of the frame 422, and the Y-axis pulley set 428 is coupled. The frame 427, when adjusting the Y-axis spacing of the first and second pick-and-place devices 421A, 421B, uses the first pick-and-placer 421A as a reference member, and controls the third motor 423C to drive the Y-axis pulley set 428 to operate. The Y-axis pulley set 428 drives the transmission frame 427 for Y-axis displacement, and the transmission frame 427 drives the carriage 426 with the Z-axis slide 4271 and the Z-axis slide 4262 to drive the bracket 4261 along the turret 425. The Y-axis sliding groove 4251 is displaced in the Y-axis, so that the sliding frame 426 drives the second pick-and-placer 421B to be axially displaced relative to the first pick-and-placer 421A, and the first and second pick-and-place devices 421A, 421B are adjusted. Y-axis spacing; however, the first moving arm 42 can make the first and second pick-and-placers 421A, 421B make the Y-axis variable pitch adjustment and the Z-axis lifting displacement, but the first and second pick-and-placers 421A 421B for Z-axis lifting displacement is used for pick-and-place electronic components, does not involve the adjustment of the distance between the first and second pick-and-place 421A, 421B, and the Y-axis spacing adjustment of the first and second pick-and-place 421A, 421B In design, the moving arm 42 drives the Y-axis pulley set 428 only by the third motor 423C, and drives the second pick-and-placer 421B as a single Y-axis position via the transmission frame 427. However, in the current trend of high-capacity, the industry wants to add X-axis parallel-arranged pick-and-place devices to the first transfer arm 42 to improve the capacity of the electronic components. The XY axial spacing can be adjusted to facilitate the access to the electronic components in response to the spacing of the receiving slots of the different trays and the distance between the test sockets. However, the first moving arm 42 can only be designed first. The two pick-and-place devices 421A and 421B are adjusted as a single Y-axis axial distance, so that the pick-and-place device capable of adjusting the X-axis spacing cannot be added, resulting in a lack of limited production capacity of the pick-and-place electronic components.

Therefore, how to design a detector that is easy to add a pick-and-place device, and can quickly adjust the X-Y axial spacing of each pick-and-place device to facilitate access to electronic components to improve the detection capacity and work convenience is the standard developed by the industry.

A first object of the present invention is to provide a detecting device for an electronic component, which is provided with a feeding device, a receiving device, a detecting device and a conveying device, wherein the feeding device accommodates a plurality of electronic components to be tested. The receiving device is for accommodating a plurality of electronic components of different levels, and the detecting device is for detecting electronic components. The conveying device is provided with at least one carrier before and after the detecting device, and the carrier is used for supplying , the receiving device and the detecting device carry the electronic component to be tested/completed, and at least two moving arms of a plurality of pickers are provided, and each moving arm is provided with a double thread changing mechanism for Adjusting the XY axial spacing of each pick and place device, and transferring the electronic components to be tested/tested between the feeding device, the receiving device, the detecting device and the carrier; thereby, the pick and place device can be easily added, and Quickly adjust the distance between each pick-and-placer to facilitate the access to electronic components, to achieve a substantial increase in the detection of practical productivity.

A second object of the present invention is to provide a detecting device for an electronic component, wherein the multi-thread pitch changing mechanism of the conveying device is provided with an X-axis driving source and a Y-axis driving source, and the X-axis driving source is used to drive at least An X-axis screw with left and right threads, and an X-axis screw seat for screwing on the X-axis screw, and a pick-and-place device for each X-axis screw seat, and Y The axial driving source is for driving at least one Y-axis screw with left and right threads, and is screwed on the Y-axis screw to be a Y-axis screw seat for reverse displacement, and is screwed in each Y-axis. The seat is equipped with a pick-and-place device, so that the double thread pitch changing mechanism can quickly drive the pick and place devices to adjust the XY axial spacing, thereby shortening the working time and achieving the practical benefit of greatly improving the detection capacity.

A third object of the present invention is to provide a detecting device for an electronic component, wherein the multi-thread pitch changing mechanism of the conveying device is configured to respectively pass at least one Y-axis member on the two X-axis screw seats, and in the two Y-axis directions At least one X-axis rod member is respectively disposed on the screw seat, and two ends of each X-axis rod member are arranged up-and-down with the two ends of each Y-axis rod member, and are disposed at each staggered portion. The seat can be equipped with a pick and place device in each of the configuration seats, so that it is easy to add an XY axial pick and place device, thereby achieving the practical benefit of greatly improving the detection capacity.

In order to make the present invention further understand the present invention, a preferred embodiment and a drawing will be described in detail as follows: Referring to FIG. 4, the detecting machine of the present invention is equipped with a feeding device on the machine table. 50, a receiving device 60, an open device 70, a detecting device 80 and a conveying device 90, the feeding device 50 is provided with at least one tray 501, the tray 501 has a plurality of receiving slots 502 for bearing The receiving device 60 is provided with at least one tray 601. The tray 601 has a plurality of receiving slots 602 for receiving the completed electronic components. In this embodiment, A plurality of trays 601 are provided for receiving electronic components of different levels of measurement, and the empty device 70 is for receiving the empty tray of the feeding device 50, and replenishing the empty tray to the receiving device 60, The detecting device 80 can be used for electrical detection, appearance detection or other related detection of the electronic component. In the embodiment, when the electrical detection is performed, the detecting device 80 is provided with a test socket. 82 test circuit board 81, the test stand 82 can be a normally open test stand or a normally closed type test In this embodiment, the test circuit board 81 is provided with nine normally-open test sockets 82 for synchronously performing the detection operations of the nine electronic components, and is detected by a detector (not shown). The result is transmitted to a central control unit (not shown), which is controlled by a central control unit, the transport device 90 comprising at least one carrier and at least two transfer arms, the carrier being movable or fixed. In the present embodiment, the transport device 90 is provided with a first carrier 91 that can be displaced in the X-axis direction in front of the detecting device 80. The first carrier 91 is provided with a plurality of positioning slots 911, for example, 9 XY axially aligned positioning slots 911 for carrying the electronic components to be tested, and a second carrier 92 for X-axis displacement behind the detecting device 80, the second carrier 92 A plurality of positioning slots 921 are provided, for example, nine positioning slots 921 for XY axial alignment are arranged for carrying the tested electronic components, and the conveying device 90 is attached to the feeding device 50 and the first carrier. 91 is provided with a first transfer arm 93 which can be used for XYZ axial displacement, for transferring electronic components to be tested, A second transfer arm 95 capable of YZ axial displacement is disposed between the first carrier 91 and the detecting device 80 for transferring the electronic component to be tested, and the detecting device 80 and the second carrier 92 are disposed between the detecting device 80 and the second carrier 92. A third transfer arm 96 for YZ axial displacement is used for transferring the completed electronic component, and a fourth transfer arm 97 capable of XYZ axial displacement is disposed between the second carrier 92 and the receiving device 60. For transferring electronic components that have been tested, the conveying device 90 can be used for moving the electronic components, and a fixed pick-and-place or variable pitch pick-and-place device is provided on each of the moving arms. The XY axial spacing of each of the positioning slots 911, 921 of the two carriers 91, 92 is relative to the XY axial spacing of the test sockets 82 of the detecting device 80. In this embodiment, the second moving arm 95 and the second The three shifting arms 96 can be respectively provided with a plurality of fixed pickers 951, 961, and the XY axial spacing of the receiving slots 502, 602 of the feeding and receiving devices 50, 60, due to different electronic components to be tested, The XY axial spacing of the positioning slots 911 and 921 of the first and second carriers 91 and 92 may be different. In this embodiment, the first moving arm 93 and the fourth moving arm 97 are A plurality of variable pitch pick-and-place devices 931 and 971 are respectively arranged to perform pick-and-place operations with different electronic components.

Referring to Figures 4, 5, 6, and 7, since the first and fourth transfer arms 93, 97 are identical in design, in the present embodiment, the first transfer arm 93 is used as a description, and the first transfer material is used. The arm 93 is provided with a transfer mechanism 930, a multi-thread pitch changing mechanism and a plurality of pick-and-place devices 931, and a multi-thread pitch changing mechanism is mounted on the frame 932 of the transfer mechanism 930 to drive the XYZ axial displacement. The double thread pitch changing mechanism is disposed below the frame 932 with an X-axis driving source and a Y-axis driving source, and the X-axis driving source is configured to drive at least one X-axis screw with left and right threads. In this embodiment, the X-axis driving source is an X-axis motor 933 for driving a left- and right-threaded X-axis screw 934, and the X-axis screw 934 is disposed at a middle position. The mounting seat 935A is fixed on the frame 932, and an X-axis screw seat 936 is respectively screwed on the left and right threads, and a pick-and-place device is respectively disposed on the mounting seat 935A and the two X-axis screw seats 936. 931, when the X-axis screw 934 drives the displacement of the two X-axis screw seats 936, the two X-axis screw seats 936 can be used as the reference member with the mounting seat 935A as the reference member, and the X-axis reverse displacement In order to adjust the X-axis spacing of each of the pick-and-placers 931, the Y-axis driving source is used to drive at least one Y-axis screw with left and right threads. In this embodiment, the Y-axis driving source The utility model relates to a Y-axis motor 937 for driving a Y-axis screw 938 with left and right threads. The middle position of the Y-axis screw 938 is also disposed at the arranging seat 935A, and is matched with the X-axis screw 934. The upper and lower dislocations are arranged, and a Y-axis screw seat 939 is respectively screwed on the left and right threads, and the two Y-axis screw seats 939 are respectively equipped with a pick-and-placer 931, and the Y-axis screw 938 drives the two Y-axis directions. When the screw seat 939 is displaced, the two Y-axis screw seat 939 can be used as the reference member with the arrangement seat 935A as the reference member, and the Y-axis reverse displacement can be adjusted to adjust the Y-axis spacing of each pick-and-placer 931, and the other two X A Y-axis rod member 940 is respectively disposed on the axial screw seat 936, and an X-axis rod member 941 is respectively disposed on the two Y-axis screw seats 939, and the two Y-axis rod members 940 are respectively The two ends of the two X-axis rod members 941 are arranged in an up-and-down staggered manner, and a arranging seat 935B is disposed at each staggered portion, and a pick-and-placer 931 is mounted on each arranging seat 935B, and two X-axis screw seats 936 are used. band When the two Y-axis rods 940 are X-axis displacement, and the two Y-axis screw seats 939 drive the two X-axis rod members 941 for Y-axis displacement, the respective arrangement seats 935B and the upper and lower sides thereof can be driven. The 931 is XY axially displaced, so that the double thread changing mechanism can easily add the pick and place 931, and the XY axial spacing of the nine pickers 931 can be quickly adjusted. Furthermore, the first moving arm 93 of the present embodiment Each of the pick-and-place devices 931 is synchronously moved by the transfer mechanism 930 for Z-axis displacement to take and place electronic components. The first transfer arm 93 can also be used in each X-axis screw seat 936 and each Y-axis screw seat 939. And each of the mounting seats 935A, 935B is respectively equipped with a Z-axis driving source for the pressure cylinder, and then the pick-and-placer 931 is assembled on each of the pressure cylinders, so that each pick-and-placer 931 can independently perform Z-axis displacement for pick-and-place Electronic component.

Referring to FIGS. 8 and 9, in use, the transfer mechanism 930 of the first transfer arm 93 drives the pick and placeers 931 to move over the tray 501 of the feeding device 50, and controls the X-axis motor 933 and The Y-axis motor 937 drives the X-axis screw 934 and the Y-axis screw 938 to rotate, respectively. Since the X-axis screw 934 and the Y-axis screw 938 have opposite left and right threads, the X-axis screw is made. 934 can drive the two X-axis screw seats 936 and the two pick-up devices 931 for the X-axis inward displacement, and the two X-axis screw seats 936 simultaneously drive the two Y-axis rod members 940 for the X-axis inward. The displacement causes the two Y-axis members 940 to drive the respective positioning seats 935B and the pick-and-placers 931 thereon to be displaced in the X-axis direction, and the Y-axis screws 938 can drive the two Y-axis screws 939. And the second pick-and-placer 931 is displaced inward in the Y-axis, and the two Y-axis screw seats 939 also drive the two X-axis members 941 to perform the Y-axis inward displacement, so that the two X-axis members 941 Each of the positioning seats 935B and the pick-and-placers 931 thereon are displaced in the Y-axis direction, and the XY axial spacing of each of the pick-and-placers 931 can be adjusted and reduced, and the transfer mechanism 930 drives the pick-and-placers 931 again. Z axis Displacement to take out the electronic component 100 to be tested on the tray 501.

Referring to FIGS. 10 and 11, when the plurality of pick and placeers 931 of the first transfer arm 93 take out the electronic component 100 to be tested, the transfer mechanism 930 drives the pick and placeers 931 to the first carrier 91. The XY axial spacing of each of the receiving slots 502 of the feeding device 50 is different from the XY axial spacing of the positioning slots 911 of the first carrier 91 by different electronic components, and the first moving arm 93 is adjusted and enlarged. The XY axial spacing of the pick-and-placer 931 is controlled to control the X-axis motor 933 and the Y-axis motor 937 to drive the X-axis screw 934 and the Y-axis screw 938 to rotate in opposite directions, so that the X-axis screw The 934 can drive the two X-axis screw seats 936 and the upper two pick-and-place 931 for the X-axis outward displacement, and the two X-axis screw seats 936 simultaneously drive the two Y-axis rod members 940 for the X-axis. Displaceing outwardly, the two Y-axis rods 940 further drive the respective positioning seats 935B and the pick-and-placers 931 thereon to perform an X-axis outward displacement, and the Y-axis screw 938 can drive the two Y-axis screws. The seat 939 and the upper second pick-and-placer 931 are outwardly displaced in the Y-axis, and the two Y-axis screw seats 939 also drive the two X-axis rod members 941 to perform the Y-axis outward displacement, so that the two X The axial rod member 941 further drives the respective positioning seats 935B and the pick-and-placers 931 thereon for outward displacement of the Y-axis, thereby adjusting and aligning the XY axial spacing of each of the pick-and-placers 931 so that the pick-and-placers 931 The XY axial spacing corresponds to the XY axial spacing of the positioning slot 911 of the first carrier 91. The transfer mechanism 930 further drives the pick and placeers 931 for Z-axis displacement to place the electronic component 100 to be tested on the first load. With 91 on.

Referring to FIG. 12 , the first carrier 91 carries the electronic component 100 to be tested to the front of the detecting device 80 , and the pick-and-place 951 of the second moving arm 95 is taken out in the positioning slot 911 of the first carrier 91 . The electronic component 100 to be tested; referring to FIG. 13, each of the pick-and-place devices 951 of the second moving arm 95 transfers the electronic component 100 to be tested to each test socket 82 of the detecting device 80, and each test socket 82 is The test operation is performed, and the test circuit board 81 transmits the detection signal to the detector, and the detector transmits the detection result to the central control unit. At this time, the first carrier 91 resets and carries the next electronic component 110 to be tested. Referring to FIG. 14 , after the testing operation of the test socket 82 is completed, since the first carrier 91 has carried the next electronic component 110 to be tested to the front of the detecting device 80, the second moving arm 95 is placed and removed. The device 951 moves to the top of the first carrier 91 and takes out the next electronic component 110 to be tested. At this time, the pick-and-placers 961 of the third moving arm 96 are displaced above the detecting device 80 to make each The receiver 961 takes out the tested electronic component 100 in each test socket 82; see Figure 15 Each of the pick-and-place devices 961 of the third moving arm 96 is placed on the positioning groove 921 of the second carrier 92 by the transfer of the electronic component 100, and the pick-and-placer 951 of the second moving arm 95 will The next electronic component 110 to be tested is placed in each test socket 82 of the detecting device 80 to perform the detecting operation; refer to FIGS. 16 and 17 , and the second carrier 92 carries out the tested electronic component 100 . The transfer mechanism 970 of the fourth moving arm 97 further drives the pick-and-place 971 to be displaced above the second carrier 92, and drives and adjusts the XY axial spacing of each of the pickers 971 by using a multi-thread pitch changing mechanism. Corresponding to the XY axial spacing of the positioning slot 921 of the second carrier 92, the transfer mechanism 970 further drives the pick-and-placer 971 for Z-axis displacement, and the completed electronic component 100 is removed from the second carrier 92; Referring to FIGS. 18 and 19, the transfer mechanism 970 of the fourth moving arm 97 drives the pick-and-place 971 to the tray 601 of the receiving device 60, and then uses the multi-thread pitch changing mechanism to drive the adjustment and reduction. The XY axial spacing of the pick-and-place 971 corresponds to the XY axial spacing of the receiving slots 602 of the tray 61, and the transfer mechanism 970 The respective pick-and-placer 971 is driven to perform Z-axis displacement, and the completed electronic component 100 is directly placed in the tray 601 according to the detection result (such as good electronic component, defective electronic component or secondary electronic component). In each of the accommodating grooves 602, the sorting and collecting operation is completed.

Accordingly, the present invention can easily add a pick and place device, and quickly adjust the XY axial spacing of each pick and place device, so as to facilitate the electronic components, and greatly improve the detection capacity and work convenience, which is practical and practical. Progressive design, but did not see the same product and publications open, thus allowing the invention patent application requirements, 提出 apply in accordance with the law.

[Literature]

10. . . Feeding device

11. . . Trays

20. . . Receiving device

twenty one. . . Trays

30. . . Test device

31. . . Test board

32. . . Test stand

40. . . Conveyor

41. . . vehicle

42. . . First transfer arm

421. . . Pick and place

421A. . . First pick and place

421B. . . Second pick and place

422. . . frame

423A. . . First motor

423B. . . Second motor

423C. . . Third motor

424A. . . First Z-axis pulley set

424B. . . Second Z-axis pulley set

425. . . Swing frame

4251. . . Y axial chute

426. . . Sliding frame

4261. . . Convex

4262. . . Z axial slide

427. . . Drive frame

4271. . . Z axial slide

428. . . Y axial pulley set

43. . . Second transfer arm

431. . . Pick and place

[this invention]

50. . . Feeding device

501. . . Trays

502. . . Locating slot

60. . . Receiving device

601. . . Trays

602. . . Locating slot

70. . . Open device

80. . . Testing device

81. . . Test board

82. . . Test stand

90. . . Conveyor

91. . . First vehicle

911. . . Positioning slot

92. . . Second vehicle

921. . . Positioning slot

93. . . First transfer arm

930. . . Transfer mechanism

931. . . Pick and place

932. . . frame

933. . . X-axis motor

934. . . X-axis screw

935A, 935B. . . Configuration seat

936. . . X-axis screw seat

937. . . Y axial motor

938. . . Y axial screw

939. . . Y-axis screw seat

940. . . Y axial rod

941. . . X axial rod

95. . . Second transfer arm

951. . . Pick and place

96. . . Third transfer arm

961. . . Pick and place

97. . . Fourth transfer arm

970. . . Transfer mechanism

971. . . Pick and place

100, 110. . . Electronic component

Figure 1: Schematic diagram of the configuration of the application of each device in the test machine.

Figure 2: Appearance of the conventional material transfer device.

Figure 3: Side view of the conventional shifting device.

Fig. 4 is a schematic view showing the configuration of each device of the detecting machine of the present invention.

Figure 5: Top view of the first transfer arm of the present invention.

Figure 6: Front view of the first transfer arm of the present invention.

Figure 7: Side view of the first transfer arm of the present invention.

Figure 8: Schematic diagram of the use of the detector of the present invention (1).

Figure 9: Schematic diagram of the use of the first transfer arm to adjust and reduce the spacing of each pick and place.

Figure 10: Schematic diagram of the use of the detector of the present invention (2).

Figure 11: Schematic diagram of the use of the first transfer arm to adjust the magnification of each pick and place.

Figure 12: Schematic diagram of the use of the detector of the present invention (3).

Figure 13: Schematic diagram of the use of the detector of the present invention (4).

Figure 14: Schematic diagram of the use of the detector of the present invention (5).

Figure 15: Schematic diagram of the use of the detector of the present invention (6).

Figure 16: Schematic diagram of the use of the detector of the present invention (7).

Figure 17: Schematic diagram of the use of the second transfer arm to adjust the magnification of each pick and place.

Figure 18: Schematic diagram of the use of the detector of the present invention (8).

Figure 19: Schematic diagram of the use of the second transfer arm to adjust and reduce the spacing of each pick and place.

50. . . Feeding device

501. . . Trays

502. . . Locating slot

60. . . Receiving device

601. . . Trays

602. . . Locating slot

70. . . Open device

80. . . Testing device

81. . . Test board

82. . . Test stand

90. . . Conveyor

91. . . First vehicle

911. . . Positioning slot

92. . . Second vehicle

921. . . Positioning slot

93. . . First transfer arm

930. . . Transfer mechanism

931. . . Pick and place

95. . . Second transfer arm

951. . . Pick and place

96. . . Third transfer arm

961. . . Pick and place

97. . . Fourth transfer arm

970. . . Transfer mechanism

971. . . Pick and place

Claims (7)

A detecting device for an electronic component, comprising: a machine table; a feeding device: disposed on the machine table, and provided with at least one tray, the tray having a plurality of receiving slots for accommodating a plurality of electrons to be tested The receiving device is arranged on the machine to accommodate a plurality of completed electronic components; the detecting device is disposed on the machine for detecting electronic components; and the conveying device is disposed on the machine. The utility model is provided with at least two transfer arms of a plurality of pick-and-placers and at least one carrier having a plurality of positioning grooves for transferring electronic components, and a transfer mechanism is arranged on at least one of the transfer arms. The frame of the transfer mechanism is provided with a double thread pitch changing mechanism with a plurality of pick and place devices, and the double thread changing mechanism is provided with an X-axis driving source and a Y-axis driving source below the frame. The X-axis driving source is for driving at least one X-axis screw with left and right threads, and screwing at least two X-axis screw seats of the reverse displacement on the X-axis screw, and screwing in each X-axis The seat is equipped with a pick and place device, and the Y-axis drive source is used to drive at least one left and right thread Y To the screw, and screwing at least two Y-axis screw seats of the reverse displacement on the Y-axis screw, and assembling the pick-and-place device on each Y-axis screw seat, and adjusting the X-Y axis of each pick and place device The spacing of the positioning grooves of the carrier is different from the spacing of the receiving grooves of the feeding device; the central control unit is used to control and integrate the operations of the devices to perform automated operations. The detecting device for an electronic component according to claim 1, wherein the receiving device is provided with a plurality of trays having receiving slots for receiving the electronic components of different testing results. The detecting device for an electronic component according to claim 1, wherein the conveying device is provided with at least one carrier before and behind the detecting device for receiving the electronic component. The electronic component detecting machine according to claim 1, wherein the X-axis driving source of the double-thread changing mechanism is an X-axis motor for driving the X-axis screw and the Y-axis driving The source is a Y-axis motor for driving the Y-axis screw. The detecting device for an electronic component according to claim 1, wherein the multi-thread pitch changing mechanism is provided with at least one Y-axis member on each X-axis screw seat, and each Y-axis At least one X-axis rod member is respectively disposed on the screw seat, and each Y-axis rod member and each X-axis rod member are vertically arranged alternately, and a arranging seat is disposed at each staggered portion, and then configured The seat is equipped with a pick and place. The detecting device for an electronic component according to claim 5, wherein each of the X-axis screw seat, the Y-axis screw seat and the arranging seat are respectively equipped with a Z-axis driving source for the pressure cylinder, and then The pressure cylinder is equipped with a pick and place device, so that each of the pick and place devices can independently perform Z-axis displacement to take and place electronic components. The detecting device for the electronic component according to the first aspect of the patent application, further comprising an empty device disposed on the machine table, the empty device is for receiving the empty tray of the feeding device, and the empty tray is It is added to the receiving device to hold the finished electronic components.