CN112007868A - Chip capacitor detection equipment - Google Patents

Abstract

The invention belongs to the field of chip capacitor testing, and in particular relates to a chip capacitor testing device, comprising a feeding device for chip capacitor feeding, an electrical performance testing device for testing the electrical performance of chip capacitors, and an electrical performance testing device for accommodating defective electrical performance products. Defective product tray for electrical performance, appearance inspection device for testing the appearance of chip capacitors, qualified product blanking device for receiving and conveying qualified chip capacitors, poor appearance tray for storing defective appearance products, used for adsorption and grasping Take the chip capacitor and rotate the turntable conveying device for changing the position of the chip capacitor; wherein, the feeding device, the electrical performance detection device, the electrical performance defective product tray, the appearance detection device, the qualified product blanking device, and the appearance defective material tray are formed. The circles are arranged in sequence on the outside of the carousel.

Description

A chip capacitor testing device

technical field

The invention belongs to the field of chip capacitor testing, in particular to a chip capacitor testing device.

Background technique

After the chip capacitor is produced, it needs to be tested for its electrical properties and appearance. Most of the existing chip capacitors are tested manually. The disadvantages of using labor are: 1. Low work efficiency; 2. High labor cost. 3. Long production cycle. 4. The turnover cost is high. 5. High energy consumption. 6. The consistency of manual inspection standards is not high.

Therefore, the existing technology still needs to be improved and developed.

SUMMARY OF THE INVENTION

The technical problem to be solved by the present invention is to provide a chip capacitor detection device in view of the above-mentioned defects of the prior art, so as to solve the problems of low work efficiency, high cost, long production cycle, low work efficiency, high cost and high cost caused by the existing manual detection of chip capacitors. High turnover costs, high energy consumption, inconsistent inspection standards and other issues.

The technical solution adopted by the present invention to solve the technical problem is to provide a chip capacitor detection device, which includes a feeding device for chip capacitor feeding, an electrical performance detection device for detecting the electrical performance of the chip capacitor, and an electrical performance detection device for receiving the electrical performance of the chip capacitor. Electrically defective product tray for defective products, appearance inspection device for testing the appearance of chip capacitors, qualified product unloading device for receiving and transporting qualified chip capacitors, appearance defective tray for storing defective appearance products, A turntable conveying device used for adsorbing and grasping chip capacitors, and rotating and changing the position of chip capacitors; among them, feeding device, electrical performance testing device, electrical performance defective product tray, appearance testing device, qualified product unloading device, appearance The defective material discs are arranged in a circle on the outer side of the turntable conveying device.

A further preferred solution of the present invention is that: the turntable conveying device comprises: a first turntable, a first turntable drive mechanism for driving the first turntable to rotate, a first conductive suction nozzle for sucking and grasping the chip capacitor, a first position adjustment mechanism for adjusting the position of the first conductive suction nozzle, a suction nozzle cylinder mechanism for pushing the first conductive suction nozzle downward, and an elastic lifting mechanism for providing elastic lifting force for the first conductive suction nozzle; The first position adjustment mechanism is arranged on the first turntable, the suction nozzle is arranged to slide up and down on the first position adjustment mechanism, and the elastic lifting mechanism is arranged between the first conductive suction nozzle and the first position adjustment mechanism, The suction nozzle cylinder mechanism is arranged above the first turntable.

A further preferred solution of the present invention is that: the first position adjustment mechanism includes a first suction nozzle mounting block, a first suction nozzle adjustment block, a first adjustment screw assembly, and a second adjustment screw assembly; the first suction nozzle The adjustment block is slidably arranged on the first turntable along the first direction, the first suction nozzle mounting block is slidably arranged on the first suction nozzle adjustment block along the second direction, and the first adjustment screw assembly drives the first suction nozzle to adjust The block slides along the first direction, the second adjusting screw assembly drives the first suction nozzle mounting block to move along the second direction, the first conductive suction nozzle is mounted on the first suction nozzle mounting block, and the first direction is the same as that of the first suction nozzle mounting block. The second directions are perpendicular to each other;

The elastic lifting mechanism includes a suction nozzle installation rod slidably penetrated on the first suction nozzle installation block, a first compression spring sleeved on the suction nozzle installation rod, slidably penetrated on the first suction nozzle installation block and connected with the first suction nozzle installation block. The guide rod is parallel to the suction nozzle installation rod, and the connecting blocks connecting the guide rod and the suction nozzle installation rod are respectively fixed at both ends, and a second compression spring is sleeved on the guide rod; the first conductive suction nozzle is fixed on the suction nozzle installation rod At one end, the two ends of the first compression spring are respectively connected to the other end of the suction nozzle installation rod and the first suction nozzle installation block; the two ends of the second compression spring are respectively connected to the first suction nozzle installation block and the connection block.

A further preferred solution of the present invention is: the feeding device comprises: a first material box tray for placing the material box, a first XY moving platform for adjusting the position of the first material box tray, and a first material box A first CCD camera assembly for pallet positioning, the first material box pallet is provided with a plurality of material box grooves adapted to the shape of the material box.

A further preferred solution of the present invention is that: the electrical performance detection device includes a test stand, a first electrode test stand arranged on the test stand, a retractable second electrode thimble provided above the first electrode test stand, and a A tester for testing the electrical performance of chip capacitors, the first electrode test table and the second electrode thimble are connected to the tester, and the second electrode thimble is slidably passed through the test frame; wherein, the first conductive suction nozzle Adsorbing and grabbing the chip capacitor and connecting it to one of its electrode plates and moving it downward, completing the contact between the side of the first conductive suction nozzle and the second electrode thimble, and the chip capacitor as the lower end of the other electrode plate in contact with the first electrode test table, Form a test loop.

A further preferred solution of the present invention is that: the appearance testing mechanism includes a first upper end surface detection component, a second upper end surface detection component, and a second turntable arranged on one side of the first turntable in sequence, and the first upper end surface detection component arranged on the second turntable is arranged on the second turntable. Two conductive suction nozzles, a first lower end surface detection component and a second lower end surface detection component disposed on one side of the second turntable; the first conductive suction nozzle on the first turntable adsorbs and grabs the chip capacitor through the first upper end surface detection component Or after the second upper end surface detection component, the second conductive suction nozzle on the second turntable sucks and grabs the chip capacitor on the first conductive suction nozzle and transmits it to the first lower end surface detection component and the second lower end surface detection component.

A further preferred solution of the present invention is that: the qualified product unloading device includes: a lifting and lowering box mechanism for placing and adjusting the height of the material box, a second XY moving platform for adjusting the position of the material box, for lowering the material box The conveyor belt mechanism for the material, and the jaw mechanism for grabbing the material box; the first turntable and the conveyor belt mechanism are respectively arranged at both ends of the second XY moving platform, and the lifting and lowering material box mechanism is arranged on the conveyor belt mechanism and the second Between the XY moving platforms, the gripper mechanism can move to the top of the conveyor belt mechanism, the second XY moving platform, and the lifting and lowering material box mechanism to pick up and place the material box.

A further preferred solution of the present invention is that: the second XY moving platform includes: a second material box tray for placing the material box, and a first material box gripper disposed on the second material box tray for fixing the material box , a first translation electric cylinder for driving the second material box tray to move back and forth between the first conductive suction nozzle and the conveyor belt mechanism, and a first translation electric cylinder arranged between the second material box tray and the first translation electric cylinder for adjusting the second material box The second translation electric cylinder at the tray position; the movement direction of the first translation electric cylinder and the movement direction of the second translation electric cylinder are perpendicular to each other.

A further preferred solution of the present invention is that: the chip capacitor testing equipment further includes a material blanking device for good electrical properties disposed between the electrical property testing device and the material tray for products with poor electrical properties, and the material blanking device for good electrical properties includes a It is used for loading the good electrical performance tray for chip capacitors, and the third XY moving platform for driving the adjustment position of the good electronic performance tray.

A further preferred solution of the present invention is that: the suction nozzle cylinder mechanism includes a cylinder mounting plate, a mounting bracket arranged on one side of the first turntable for supporting the cylinder mounting plate, and at least five suction nozzles arranged on the cylinder mounting plate A driving cylinder and a rotating auxiliary piece fixed on the cylinder mounting plate, the first turntable is rotatably connected with the rotating auxiliary piece, and the five suction nozzle driving cylinders are respectively arranged on the feeding device, the unloading device with good electrical performance, The corresponding position of the electrical performance detection device, the qualified product blanking device, and the second turntable.

The beneficial effect of the present invention is that, through the feeding device, the electrical performance detection device, the material tray for poor electrical performance, the appearance detection device, the unloading device for qualified products, and the poor appearance tray, the feeding and electrical performance of the chip capacitor can be completed respectively. Testing, unloading of defective electrical properties, appearance inspection, unloading of qualified products, and unloading of unqualified products, and then the transfer of chip capacitors between various devices can be realized through the turntable transfer device. The entire testing and selection process is completed by machinery. Effectively improve inspection efficiency, reduce inspection cost, shorten production cycle, reduce high turnover cost, reduce energy consumption, and ensure the consistency of inspection standards.

Description of drawings

The present invention will be further described below in conjunction with the accompanying drawings and embodiments, in which:

1 is a schematic structural diagram of a chip capacitor detection device of the present invention;

2 is a schematic structural diagram of a chip capacitor detection device (turntable conveying device) of the present invention;

Fig. 3 is the structural representation of the turntable conveying device of the present invention;

4 is a schematic structural diagram of the turntable conveying device of the present invention (with the suction nozzle cylinder mechanism omitted);

Fig. 5 is the partial enlarged view of A part among Fig. 4;

6 is a schematic structural diagram of the first position adjustment mechanism and the elastic lifting mechanism of the present invention;

Fig. 7 is the structural representation of the feeding device of the present invention;

8 is a schematic plan view of the electrical performance detection device of the present invention;

Fig. 9 is a partial enlarged view of part B in Fig. 8;

Fig. 10 is the structural representation of the appearance detection device of the present invention;

Fig. 11 is the structural representation of the qualified product blanking device of the present invention;

Fig. 12 is the structural representation of the second XY moving platform of the present invention;

13 is a schematic structural diagram of the lifting and lowering material box mechanism of the present invention;

Fig. 14 is the structural representation of the conveyor belt mechanism of the present invention;

FIG. 15 is a schematic structural diagram of the feeding device for good electrical properties of the present invention.

Detailed ways

The present invention provides a chip capacitor detection device. In order to make the purpose, technical solutions and effects of the present invention clearer and clearer, the present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.

As shown in FIGS. 1-14 , the chip capacitor testing device of this embodiment includes a feeding device 1 for feeding the chip capacitor 91 , an electrical performance testing device 2 for testing the electrical performance of the chip capacitor 91 , and an electrical performance detecting device 2 for receiving the electrical performance of the chip capacitor 91 . The electrical performance defective product tray 3 for poor performance products, the appearance inspection device 4 for testing the appearance of the chip capacitor 91, the qualified product unloading device 5 for storing the chip capacitors 91 that have passed the conveying inspection, and the appearance defective product. The poor appearance material tray 6 is used to adsorb and grab the chip capacitor 91 and rotate the turntable conveying device 7 for changing the position of the chip capacitor 91; wherein, the feeding device 1, the electrical performance detection device 2, the electrical performance defective product tray 3, The appearance detection device 4 , the qualified product unloading device 5 , and the poor appearance material tray 6 are arranged in a circular sequence on the outer side of the turntable conveying device 7 .

Through the feeding device 1 , the electrical performance detection device 2 , the electrical performance defective product tray 3 , the appearance detection device 4 , the qualified product unloading device 5 , and the appearance defective tray 6 , the chip capacitors 91 can be loaded and the electrical performance can be completed respectively. Testing, blanking of defective electrical properties, appearance inspection, blanking of qualified products, and blanking of defective appearance products, and then the transfer of chip capacitors 91 between various devices can be realized through the rotary transfer device. The entire detection and selection process is completed by machinery. , effectively improve the inspection efficiency, reduce the inspection cost, shorten the production cycle, reduce the high turnover cost, reduce the energy consumption, and ensure the consistency of inspection standards.

Further, as shown in FIG. 1 , FIG. 3 , FIG. 4 , FIG. 5 , and FIG. 6 , the turntable transmission device 7 includes: a first turntable 71 , a first turntable driving mechanism 72 for driving the first turntable to rotate, and a first turntable driving mechanism 72 for driving the first turntable to rotate. The first conductive suction nozzle 73 for sucking and grasping the chip capacitor 91, the first position adjustment mechanism 74 for adjusting the position of the first conductive suction nozzle 73, and the suction cylinder mechanism for pushing the first conductive suction nozzle 73 downward 75, and an elastic lifting mechanism 76 that provides elastic lifting force for the first conductive suction nozzle 73; wherein, the first position adjustment mechanism 74 is arranged on the first turntable 71, and the suction nozzle slides up and down at the first position On the adjustment mechanism 74 , the elastic lifting mechanism 76 is arranged between the first conductive suction nozzle 73 and the first position adjustment mechanism 74 , and the suction nozzle cylinder mechanism 75 is arranged above the first turntable 71 .

Wherein, the first turntable driving mechanism 72 includes a motor and a divider.

The first position adjustment mechanism 74 can be used to adjust the position of the first conductive suction nozzle 73 , thereby effectively reducing the assembly precision requirement between the first conductive suction nozzle 73 and the first turntable 71 and reducing the production cost. Through the cooperation of the suction nozzle cylinder mechanism 75 and the elastic lifting mechanism 76, the first conductive suction nozzle 73 can be driven to move up and down, so as to realize mechanized grasping of the chip capacitor 91, which is convenient and quick.

Further, as shown in FIG. 1 , FIG. 3 , FIG. 4 , FIG. 5 , and FIG. 6 , the first position adjustment mechanism 74 includes a first suction nozzle mounting block 741 , a first suction nozzle adjustment block 742 , and a first adjustment screw assembly 743, and a second adjusting screw assembly 744; the first suction nozzle adjusting block 742 is slidably arranged on the first turntable 71 along the first direction, and the first suction nozzle mounting block 741 is slidably arranged along the second direction on the first On a suction nozzle adjustment block 742, the first adjustment screw assembly 743 drives the first suction nozzle adjustment block 742 to slide in the first direction, and the second adjustment screw assembly 744 drives the first suction nozzle installation block 741 in the second direction moving, the first conductive suction nozzle 73 is installed on the first suction nozzle mounting block 741, and the first direction and the second direction are perpendicular to each other;

The first adjusting screw assembly 743 is rotatably arranged on the first turntable 71, and one end is threadedly connected with the first nozzle adjusting block 742. By rotating the first adjusting screw assembly 743, the first nozzle adjusting block 742 can be adjusted. position; the second adjustment screw assembly 744 is rotatably arranged on the first suction nozzle adjustment block 742, and one end is threadedly connected with the first suction nozzle installation block 741, and the first suction nozzle installation can be adjusted by rotating the second adjustment screw assembly 744 Location of block 741.

By adjusting the positions of the first suction nozzle mounting block 741 and the first suction nozzle adjusting block 742 respectively by the first adjusting screw assembly 743 and the second adjusting screw assembly 744, the first suction nozzle mounting block 741 can be adjusted. The location of a conductive suction nozzle 73 is convenient and quick.

Wherein, grooves and protrusions are provided between the first suction nozzle adjustment block 742 and the first turntable 71 for guiding the first suction nozzle adjustment block 742 to slide in the first direction. The first suction nozzle adjustment block 742 and the first suction nozzle adjustment block 742 A groove and a protrusion for guiding the first suction nozzle mounting block 741 to slide in the second direction are disposed between the suction nozzle mounting blocks 741 . After the position adjustment of the first conductive suction nozzle 73 is completed, the first position adjustment mechanism 74 is fixed by bolts.

Further, as shown in FIG. 1 , FIG. 3 , FIG. 4 , FIG. 5 , and FIG. 6 , the elastic lifting mechanism 76 includes a suction nozzle installation rod 761 slidably penetrated on the first suction nozzle installation block 741 and sleeved on the first suction nozzle installation block 741 . The first compression spring 762 on the suction nozzle installation rod 761 slides through the guide rod 763 on the first suction nozzle installation block 741 and is parallel to the suction nozzle installation rod 761, and the two ends are respectively fixed to connect the guide rod 763 to the suction nozzle installation The connecting block 764 of the rod 761, and the second compression spring 765 sleeved on the guide rod 763; the first conductive suction nozzle 73 is fixed on one end of the suction nozzle installation rod 761, and the two ends of the first compression spring 762 are respectively connected to the suction nozzle. The other end of the nozzle installation rod 761 is connected to the first suction nozzle installation block 741 ; the two ends of the second compression spring 765 are respectively connected to the first suction nozzle installation block 741 and the connection block 764 .

By adding the first compression spring 762, an elastic upward force can be provided for the first conductive suction nozzle 73, the structure is simple, and the production cost is effectively reduced. Furthermore, by adding a guide rod 763 and a connecting block 764 , the movement direction of the suction nozzle mounting rod 761 can be guided to ensure the stability of the movement of the first conductive suction nozzle 73 .

Further, as shown in FIG. 1 and FIG. 3 , the suction nozzle cylinder mechanism 75 includes a cylinder mounting plate 751 , and at least five mounting brackets 752 are provided on one side of the first turntable 71 for supporting the cylinder mounting plate 751 . The suction nozzles on the cylinder mounting plate 751 drive the cylinder 753, and the rotating auxiliary member 754 fixed on the cylinder mounting plate 751, the first rotating plate 71 is rotatably connected with the rotating auxiliary member 754, and the five suction nozzles drive the cylinder 753 They are respectively arranged at positions corresponding to the feeding device 1 , the feeding device 8 for good electrical properties, the detecting device 2 for electrical properties, the feeding device 5 for qualified products, and the second turntable 43 .

The suction nozzle mounting rod 761 can be pushed downward by the suction nozzle driving cylinder 753 , that is, the first conductive suction nozzle 73 can be pushed downward, and the height adjustment of the first conductive suction nozzle 73 can be realized in cooperation with the elastic lifting mechanism 76 . In this embodiment, there are 16 first conductive suction nozzles 73 and 5 suction nozzle driving cylinders 753 . , Qualified product unloading device 5, second turntable 43 and other positions that need to adjust the height can be adjusted by setting the suction nozzle mounting rod 761, and there is no need to correspond the number of the suction nozzle mounting rod 761 to the number of the first conductive suction nozzles 73 one-to-one , which can effectively reduce the production cost. By adding a rotating auxiliary member 754 , it can be used to assist the rotation of the first turntable 71 to improve the stability of the first turntable 71 when it rotates.

Further, as shown in FIGS. 1 and 7 , the feeding device 1 includes: a first material box tray 11 for placing the material box 92 , and a first XY moving platform for adjusting the position of the first material box tray 11 12, and a first CCD camera assembly 13 positioned with a first material box tray 11, the first material box tray 11 is provided with a plurality of material box grooves (not shown in the figure) adapted to the shape of the material box 92 .

In this embodiment, there are 6 material box slots, and the first XY moving platform 12 drives the first material box tray 11 to move in a plane, so that the material box 92 can be transported to the bottom of the first conductive suction nozzle 73 , the chip capacitor 91 in the material box 92 is grasped by the first conductive suction nozzle 73 to realize feeding. The first CCD camera assembly 13 can be used to detect the position of the material box 92 to ensure the normal operation of the chip capacitor 91 .

Further, as shown in FIG. 1 , FIG. 2 , FIG. 8 , and FIG. 9 , the electrical performance detection device 2 includes a test frame 21 , and a first electrode test table 22 arranged on the test frame 21 is arranged on the first electrode test stand 22 . The retractable second electrode thimble 23 above the table 22, and the tester 24 for testing the electrical performance of the chip capacitor 91, the first electrode test table 22 and the second electrode thimble 23 are connected to the tester 24, and the The two-electrode thimble 23 is slidably passed through the test frame 21 ; wherein, the first conductive suction nozzle 73 adsorbs and grasps the chip capacitor 91 and is connected to an electrode plate thereof and moves downward, thereby completing the side surface of the first conductive suction nozzle 73 in turn. Contact 23 with the second electrode thimble, and the lower end of the chip capacitor 91 as another electrode plate is in contact with the first electrode test table 22 to form a test circuit.

The chip capacitor 91 is grasped and fixed by the first conductive suction nozzle 73 and connected to one of the electrode plates of the chip capacitor 91, wherein the second electrode ejector pin 23 is retractably arranged above the first electrode test table 22, when the first conductive suction nozzle When the 73 moves downward, the second electrode thimble 23 touching the first conductive suction nozzle 73 will shrink and abut against the side of the first conductive suction nozzle 73 until the other side of the chip capacitor 91 on the first conductive suction nozzle 73 The lower end of the electrode plate contacts the first electrode test table 22 to form a test loop, and can cooperate with the tester 24 to conduct electrical performance test, which is convenient and quick, effectively shortens the test time, and improves the test efficiency.

Further, as shown in FIG. 1 , FIG. 2 , and FIG. 10 , the appearance testing mechanism 4 includes a first upper end surface detection component 41 , a second upper end surface detection component 42 , a second upper end surface detection component 42 , and a second upper end surface detection component 42 , which are sequentially arranged on one side of the first turntable 71 . The turntable 43, the second conductive suction nozzles 44 arranged on the second turntable 43, the first lower end surface detection component 45 and the second lower end surface detection component 46 arranged on one side of the second turntable 43; on the first turntable 71 After the first conductive suction nozzle 73 sucks and grabs the chip capacitor 91 after passing through the first upper end surface detection component 41 or the second upper end surface detection component 42 , the second conductive suction nozzle 44 on the second turntable 43 sucks and grabs the first conductive suction nozzle 44 . The chip capacitor 91 on the nozzle 73 is transferred to the first lower end surface detection unit 45 or the second lower end surface detection unit 46 .

Wherein, the first upper end surface detection component 41, the second upper end surface detection component 42, the first lower end surface detection component 45, and the second lower end surface detection component 46 are all CCD camera components, and the detection focal lengths of the two are different; wherein, The first upper end surface detection component 41 and the first lower end surface detection component 45 are used to detect a chip capacitor 91 of one size; the second upper end surface detection component 42 and the second lower end surface detection component 46 are used to cooperate and detect Another size chip capacitor 91 .

The grasping direction of the second conductive suction nozzle 44 is opposite to the grasping direction of the first conductive suction nozzle 73 , and the chip capacitor 91 can be realized by the cooperation of the second conductive suction nozzle 44 and the first conductive suction nozzle 73 . The detection of two end faces is convenient and quick.

The first turntable 71 drives the chip capacitor 91 through the first conductive suction nozzle 73 to pass over the first upper end surface detection component 41 or the second upper end surface detection component 42. After the detection of the upper end surface of the chip capacitor 91 is completed, the second The second conductive suction nozzle 44 on the turntable 43 sucks and grabs the chip capacitor 91 on the first conductive suction nozzle 73 (the lower end surface of the chip capacitor 91 is exposed at this time). The detection of the two end surfaces of the chip capacitor 91 can then be completed through the first lower end surface detection component 45 or the second lower end surface detection component 46 .

Further, as shown in FIG. 1 , FIG. 2 , and FIG. 11 , the qualified product unloading device 5 includes: a lifting and lowering material box mechanism 51 for placing and raising and lowering the position of the material box 92 , and a mechanism for adjusting the position of the material box 92 . The second XY moving platform 52, the conveyor belt mechanism 53 for unloading the material box 92, and the gripper mechanism 54 for grasping the material box 92; the first turntable 71 and the conveyor belt mechanism 53 are respectively arranged on the second XY moving platform At both ends of the platform 52, the lifting and lowering material box mechanism 51 is arranged between the conveyor belt mechanism 53 and the second XY moving platform 52, and the gripper mechanism 54 can move to the conveyor belt mechanism 53, the second XY moving platform 52, and the lifting and lowering material The cassette 92 is taken and placed above the cassette mechanism 51 .

The lifting and lowering box mechanism 51 can be used to provide the material box 92 , and then the empty material box 92 can be grabbed onto the second XY moving platform 52 by the clamping jaw mechanism 54 , and the empty material box 92 can be conveyed by the second XY moving platform 52 To the bottom of the first conductive suction nozzle 73, the first conductive suction nozzle 73 is used for boxing, and the box 92 that has been boxed is driven by the second XY moving platform 52 to reach one end of the conveyor belt mechanism 53, and is grasped by the clamping jaw mechanism 54. The material box 92 is transferred to the conveyor belt mechanism 53 to complete the unloading. The qualified product unloading device 5 can realize the packing and unloading of the chip capacitor 91 without manual intervention, the unloading time is short, and the production efficiency is high.

Among them, as shown in FIGS. 1 , 2 , 11 , and 13 , the lifting and lowering magazine mechanism 51 includes: a magazine frame 511 for placing the magazine 92 , which is arranged in the magazine frame 511 for driving the magazine 92 lift frame 512 that moves up and down, and lift electric cylinder 513 that drives the lift frame 512 to move up and down. By adding the cartridge holder 511 , it can be used to place the empty cartridge 92 , and provide a carrier for protection for the chip capacitor 91 to be unloaded. The lifting frame 512 and the lifting electric cylinder 513 can be used to adjust the height of the material box 92, which facilitates the clamping by the jaw mechanism 54 and improves the work efficiency. In this embodiment, a sensor 514 for sensing the height of the material box 92 is arranged on the upper part of the material box frame 511 , which can cooperate with the lifting electric cylinder 513 to automatically adjust the height of the material box 92 .

Wherein, as shown in FIGS. 1 , 2 , 11 and 14 , the gripper mechanism 54 includes: a second cartridge gripper 541 for gripping the cartridge 92 for driving the second cartridge gripper 541 is a third translation electric cylinder 542 for translation, and a second lifting electric cylinder 543 is used for driving the second cartridge clamping jaw 541 to move up and down. Through the cooperation of the second lifting electric cylinder 543 and the second material box clamping jaw 541, the material box 92 can be clamped or put down, and then the third translation electric cylinder 542 can drive the material box 92 to and from the conveyor mechanism 53, the first The two XY moving platforms 52 and the upper part of the lifting and lowering material box mechanism 51 realize the transfer of the material box 92 .

Among them, as shown in FIGS. 1 , 2 , 11 and 12 , the second XY moving platform 52 includes: a second material box tray 521 for placing the material box 92 on the second material box tray 521 The first cartridge gripper 522 for fixing the cartridge 92, the first translation electric cylinder 523 for driving the second cartridge tray 521 to travel back and forth between the first conductive suction nozzle 73 and the conveyor mechanism 53, and the first translation cylinder 523 provided on the second A second translation cylinder 524 between the magazine tray 521 and the first translation cylinder 523 for adjusting the position of the second magazine tray 521; the movement direction of the first translation cylinder 523 is the same as that of the second translation cylinder 524. The directions of motion are perpendicular to each other.

The first translating electric cylinder 523 and the second translating electric cylinder 524 can be used to move the second cartridge tray 521, that is, to adjust the position of the cartridge 92 to facilitate the first conductive suction nozzle 73 to unload the chip capacitor 91, and also The magazine 92 is driven to and fro between the suction nozzle 1 and the conveyor belt mechanism 5 . By adding the first cartridge clamping jaw 522, it can be used to fix the cartridge 92 on the second cartridge tray 521 to prevent the cartridge 92 from loosening and falling off during the movement.

Further, as shown in FIG. 1 , FIG. 2 and FIG. 15 , the chip capacitor 91 detection equipment also includes an electrical performance good product blanking device 8 arranged between the electrical performance detection device 2 and the electrical performance poor product material tray 3 , The electrical good product unloading device 8 includes an electrical good product tray 81 for loading the chip capacitors 91 , and a third XY moving platform 82 for driving the electrical good product tray to adjust the position.

The third XY moving platform 82 can drive the electrical good product tray 81 to adjust the position to be below the first conductive suction nozzle 73 , so as to perform the blanking of the chip capacitor 91 . In the production process of the chip capacitor 91, due to the different requirements of customers for different products, the detection process of the chip capacitor 91 will be different. Among them, the addition of the blanking device 8 for good electrical performance is to meet the production requirements of chip capacitors 91 that do not have high requirements on appearance, and blanking can be performed directly after the electrical performance test.

It should be understood that the above embodiments are only used to illustrate the technical solutions of the present invention, but not to limit them. For those skilled in the art, the technical solutions recorded in the above embodiments can be modified, or some of the technical features can be modified. Equivalent replacements are made; and all such modifications and replacements shall fall within the protection scope of the appended claims of the present invention.

Claims (10)

1. A chip capacitor detection device is characterized in that, comprising: Feeding device for chip capacitor feeding; Electrical performance testing device for testing the electrical performance of chip capacitors; The material tray for defective electrical properties is used to store defective electrical properties; Appearance testing device for testing the appearance of chip capacitors; Qualified product unloading device, used to receive qualified chip capacitors for transmission and testing; Defective appearance tray, used to store defective appearance products; A rotary transfer device is used to adsorb and grab the chip capacitor and rotate the station for changing the chip capacitor; Among them, the feeding device, the electrical performance detection device, the electrical performance defective product tray, the appearance detection device, the qualified product unloading device, and the appearance defective tray are arranged in a circular order on the outer side of the turntable conveying device. 2 . The chip capacitor detection device according to claim 1 , wherein the turntable conveying device comprises: a first turntable, a first turntable driving mechanism for driving the first turntable to rotate, and for attracting and grabbing the chip capacitors. 3 . The first conductive suction nozzle, the first position adjustment mechanism for adjusting the position of the first conductive suction nozzle, the suction cylinder mechanism for pushing the first conductive suction nozzle downward, and the elastic rise for the first conductive suction nozzle Force elastic lifting mechanism; wherein, the first position adjustment mechanism is arranged on the first turntable, the suction nozzle is arranged on the first position adjustment mechanism sliding up and down, and the elastic lifting mechanism is arranged on the first conductive suction nozzle Between the first position adjustment mechanism and the suction nozzle cylinder mechanism, the suction nozzle cylinder mechanism is arranged above the first turntable. 3. The chip capacitor detection device according to claim 2, wherein the first position adjustment mechanism comprises a first suction nozzle mounting block, a first suction nozzle adjustment block, a first adjustment screw assembly, and a second adjustment screw assembly; the first suction nozzle adjustment block is slidably arranged on the first turntable along the first direction, the first suction nozzle installation block is slidably arranged on the first suction nozzle adjustment block along the second direction, the first The adjustment screw assembly drives the first suction nozzle adjustment block to slide in the first direction, the second adjustment screw assembly drives the first suction nozzle installation block to move in the second direction, and the first conductive suction nozzle is installed on the first suction nozzle installation On the block, the first direction and the second direction are perpendicular to each other; The elastic lifting mechanism includes a suction nozzle installation rod slidably penetrated on the first suction nozzle installation block, a first compression spring sleeved on the suction nozzle installation rod, slidably penetrated on the first suction nozzle installation block and connected with the first suction nozzle installation block. The guide rod is parallel to the suction nozzle installation rod, and the connecting blocks connecting the guide rod and the suction nozzle installation rod are respectively fixed at both ends, and a second compression spring is sleeved on the guide rod; the first conductive suction nozzle is fixed on the suction nozzle installation rod At one end, the two ends of the first compression spring are respectively connected to the other end of the suction nozzle installation rod and the first suction nozzle installation block; the two ends of the second compression spring are respectively connected to the first suction nozzle installation block and the connection block. 4. The chip capacitor detection device according to claim 2, wherein the feeding device comprises: a first material box tray for placing the material box, a first XY for adjusting the position of the first material box tray A moving platform, and a first CCD camera assembly positioned with a first material box tray, the first material box tray is provided with a plurality of material box grooves adapted to the shape of the material box. 5. The chip capacitor testing device according to claim 2, wherein the electrical property testing device comprises a test stand, and the first electrode test stand arranged on the test stand is retractable and retractable above the first electrode test stand. The second electrode thimble, and a tester for the electrical performance test of the chip capacitor, the first electrode test table and the second electrode thimble are connected to the tester, and the second electrode thimble is slidably penetrated on the test frame; Wherein, the first conductive suction nozzle sucks and grabs the chip capacitor, connects with one of its electrode plates, and moves downward to complete the contact between the side surface of the first conductive suction nozzle and the second electrode thimble, and the chip capacitor is used as another electrode plate. The lower end is in contact with the first electrode test stand to form a test loop. 6. The chip capacitor testing device according to claim 5, wherein the appearance testing mechanism comprises a first upper end surface detection component, a second upper end surface detection component, and a second turntable sequentially arranged on one side of the first turntable , the second conductive suction nozzle arranged on the second turntable, the first lower end surface detection component and the second lower end surface detection component arranged on one side of the second turntable; the first conductive suction nozzle on the first turntable sucks and grabs After the chip capacitor passes through the first upper end surface detection component or the second upper end surface detection component, the second conductive suction nozzle on the second turntable sucks and grabs the chip capacitor on the first conductive suction nozzle and transfers it to the first lower end surface detection component , the second lower end face detection component. 7. The chip capacitor detection device according to claim 5, wherein the qualified product unloading device comprises: a lifting and lowering material box mechanism for placing and adjusting the height of the material box, a second mechanism for adjusting the position of the material box An XY moving platform, a conveyor belt mechanism for unloading the material box, and a gripper mechanism for grabbing the material box; the first turntable and the conveyor belt mechanism are respectively arranged at both ends of the second XY moving platform, and the lifting and lowering material The box mechanism is arranged between the conveyor belt mechanism and the second XY moving platform, and the clamping jaw mechanism can move to the top of the conveyor belt mechanism, the second XY moving platform, and the lifting and lowering box mechanism to pick up and place the material box. 8. The chip capacitor detection device according to claim 6, wherein the second XY moving platform comprises: a second material box tray for placing the material box, arranged on the second material box tray for fixing The first material box clamping jaw of the material box is used to drive the second material box tray to translate to and from the first conductive suction nozzle and the first translation electric cylinder of the conveyor belt mechanism, and the first translation electric cylinder arranged on the second material box tray and the first translation electric cylinder a second translation electric cylinder for adjusting the position of the second material box tray; the movement direction of the first translation electric cylinder and the movement direction of the second translation electric cylinder are perpendicular to each other. 9. The chip capacitor testing device according to claim 7, wherein the chip capacitor testing device further comprises an electrical good product blanking device arranged between the electrical performance testing device and the electrical performance poor product material tray, so The above-mentioned unloading device for good electrical properties includes a good electrical performance tray for loading chip capacitors, and a third XY moving platform for driving the adjustment position of the good electrical performance tray. 10. The chip capacitor detection device according to claim 2, wherein the suction nozzle cylinder mechanism comprises a cylinder mounting plate, a mounting bracket arranged on one side of the first turntable for supporting the cylinder mounting plate, at least five The suction nozzle driving cylinder arranged on the cylinder mounting plate, and the rotating auxiliary member fixed on the cylinder mounting plate, the first turntable is rotatably connected with the rotating auxiliary member, and the five suction nozzle driving cylinders are respectively arranged on the feeding cylinder and the feeding cylinder. The corresponding position of the second turntable is the device, the blanking device for good electrical properties, the electrical performance testing device, the blanking device for qualified products, and the second turntable.

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