CN112007868A - Chip capacitor detection equipment - Google Patents
Chip capacitor detection equipment Download PDFInfo
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- CN112007868A CN112007868A CN202010779185.6A CN202010779185A CN112007868A CN 112007868 A CN112007868 A CN 112007868A CN 202010779185 A CN202010779185 A CN 202010779185A CN 112007868 A CN112007868 A CN 112007868A
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- suction nozzle
- chip capacitor
- material box
- tray
- electrical property
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/38—Collecting or arranging articles in groups
Abstract
The invention belongs to the field of chip capacitor testing, and particularly relates to chip capacitor detection equipment which comprises a feeding device for feeding a chip capacitor, an electrical property detection device for detecting the electrical property of the chip capacitor, an electrical property defective material tray for accommodating electrical property defective products, an appearance detection device for testing the appearance of the chip capacitor, a qualified product blanking device for accommodating and conveying the chip capacitor qualified for detection, an appearance defective material tray for accommodating the appearance defective products, and a turntable conveying device for adsorbing and grabbing the chip capacitor and rotating and converting stations of the chip capacitor; the feeding device, the electrical property detection device, the electrical property defective material tray, the appearance detection device, the qualified product blanking device and the appearance defective material tray are circularly arranged on the outer side of the turntable conveying device in sequence.
Description
Technical Field
The invention belongs to the field of chip capacitor testing, and particularly relates to chip capacitor detection equipment.
Background
After the chip capacitor is produced, electrical property detection and appearance detection need to be carried out on the chip capacitor, and most of the existing chip capacitor detection adopts a manual mode. The defects of manual work are as follows: 1. the working efficiency is low; 2. the labor cost is high. 3. The production cycle is long. 4. The turnaround cost is high. 5. The energy consumption is higher. 6. Manual inspection of low standard consistency, etc.
Accordingly, the prior art is yet to be improved and developed.
Disclosure of Invention
The invention aims to solve the technical problems that the chip capacitor detection equipment is provided aiming at the defects in the prior art, so that the problems of low working efficiency, high cost, long production cycle, high turnover cost, high energy consumption, low consistency of inspection standards and the like caused by the conventional manual detection of the chip capacitor are solved.
The technical scheme adopted by the invention for solving the technical problems is as follows: the chip capacitor detection equipment comprises a feeding device for feeding a chip capacitor, an electrical property detection device for detecting the electrical property of the chip capacitor, an electrical property defective product tray for accommodating electrical property defective products, an appearance detection device for testing the appearance of the chip capacitor, a qualified product blanking device for accommodating and conveying the chip capacitor qualified for detection, an appearance defective product tray for accommodating the appearance defective products, and a turntable conveying device for adsorbing and grabbing the chip capacitor and rotating a station for converting the chip capacitor; the feeding device, the electrical property detection device, the electrical property defective material tray, the appearance detection device, the qualified product blanking device and the appearance defective material tray are circularly arranged on the outer side of the turntable conveying device in sequence.
Further preferred embodiments of the present invention are: the carousel conveyor includes: the chip capacitor picking device comprises a first rotary disc, a first rotary disc driving mechanism, a first conductive suction nozzle, a first position adjusting mechanism, a suction nozzle cylinder mechanism and an elastic lifting mechanism, wherein the first rotary disc driving mechanism is used for driving the first rotary disc to rotate; the first position adjusting mechanism is arranged on the first rotating disc, the suction nozzle is arranged on the first position adjusting mechanism in a vertically sliding mode, the elastic lifting mechanism is arranged between the first conductive suction nozzle and the first position adjusting mechanism, and the suction nozzle air cylinder mechanism is arranged above the first rotating disc.
Further preferred embodiments of the present invention are: the first position adjusting mechanism comprises a first suction nozzle mounting block, a first suction nozzle adjusting block, a first adjusting screw rod assembly and a second adjusting screw rod assembly; the first suction nozzle adjusting block is arranged on the first rotating disc in a sliding mode along a first direction, the first suction nozzle mounting block is arranged on the first suction nozzle adjusting block in a sliding mode along a second direction, the first adjusting screw assembly drives the first suction nozzle adjusting block to slide along the first direction, the second adjusting screw assembly drives the first suction nozzle mounting block to move along the second direction, the first conductive suction nozzle is mounted on the first suction nozzle mounting block, and the first direction and the second direction are perpendicular to each other;
the elastic lifting mechanism comprises a suction nozzle mounting rod which is slidably arranged on the first suction nozzle mounting block in a penetrating way, a first compression spring which is sleeved on the suction nozzle mounting rod, a guide rod which is slidably arranged on the first suction nozzle mounting block in a penetrating way and is parallel to the suction nozzle mounting rod, a connecting block which is fixedly connected with the guide rod and the suction nozzle mounting rod at two ends respectively, and a second compression spring which is sleeved on the guide rod; the first conductive suction nozzle is fixed at one end of the suction nozzle mounting rod, and two ends of the first compression spring are respectively connected with the other end of the suction nozzle mounting rod and the first suction nozzle mounting block; and two ends of the second compression spring are respectively connected with the first suction nozzle mounting block and the connecting block.
Further preferred embodiments of the present invention are: the loading attachment includes: the device comprises a first material box tray for placing material boxes, a first XY moving platform for adjusting the position of the first material box tray, and a first CCD camera assembly positioned by the first material box tray, wherein a plurality of material box grooves matched with the shape of the material boxes are formed in the first material box tray.
Further preferred embodiments of the present invention are: the electrical property detection device comprises a test frame, a first electrode test bench arranged on the test frame, a second electrode thimble arranged above the first electrode test bench in a telescopic manner, and a tester for testing the electrical property of the chip capacitor, wherein the first electrode test bench and the second electrode thimble are connected with the tester, and the second electrode thimble is arranged on the test frame in a sliding manner; the first conductive suction nozzle is connected with one electrode plate and moves downwards, the side face of the first conductive suction nozzle is contacted with the second electrode thimble, and the chip capacitor is used as the lower end of the other electrode plate and contacted with the first electrode test bench to form a test loop.
Further preferred embodiments of the present invention are: the appearance testing mechanism comprises a first upper end face detection assembly, a second rotary disc, a second conductive suction nozzle, a first lower end face detection assembly and a second lower end face detection assembly, wherein the first upper end face detection assembly, the second upper end face detection assembly and the second rotary disc are sequentially arranged on one side of the first rotary disc; after the first conductive suction nozzle on the first rotary disc adsorbs and grabs the chip capacitor and passes through the first upper end face detection assembly or the second upper end face detection assembly, the second conductive suction nozzle on the second rotary disc adsorbs and grabs the chip capacitor on the first conductive suction nozzle and conveys the chip capacitor to the first lower end face detection assembly and the second lower end face detection assembly.
Further preferred embodiments of the present invention are: qualified product unloader includes: the device comprises a material box lifting mechanism, a second XY moving platform, a conveyor belt mechanism and a clamping jaw mechanism, wherein the material box lifting mechanism is used for placing and adjusting the height of a material box; the first rotating disc and the conveyor belt mechanism are respectively arranged at two ends of the second XY moving platform, the material box lifting mechanism is arranged between the conveyor belt mechanism and the second XY moving platform, and the clamping jaw mechanism can move to the positions above the conveyor belt mechanism, the second XY moving platform and the material box lifting mechanism to take and place material boxes.
Further preferred embodiments of the present invention are: the second XY moving stage includes: the second material box clamping jaw is arranged on the second material box tray and used for fixing a material box, the first translation electric cylinder is used for driving the second material box tray to translate to and fro between the first conductive suction nozzle and the conveyor belt mechanism, and the second translation electric cylinder is arranged between the second material box tray and the first translation electric cylinder and used for adjusting the position of the second material box tray; the moving direction of the first translation electric cylinder is perpendicular to the moving direction of the second translation electric cylinder.
Further preferred embodiments of the present invention are: the chip capacitor detection equipment further comprises an electrical property good product discharging device arranged between the electrical property detection device and the electrical property defective product charging tray, wherein the electrical property good product discharging device comprises an electrical property good product charging tray used for loading the chip capacitor and a third XY moving platform used for driving the electrical property good product charging tray to adjust the position.
Further preferred embodiments of the present invention are: suction nozzle cylinder mechanism includes the cylinder mounting disc, sets up the installing support that is used for supporting the cylinder mounting disc in first carousel one side, and five at least suction nozzles that set up on the cylinder mounting disc drive actuating cylinder to and fix the rotatory auxiliary member on the cylinder mounting disc, first carousel rotates with rotatory auxiliary member and is connected, five suction nozzles drive actuating cylinder and set up respectively with loading attachment, electrical property non-defective products unloader, electrical property detection device, certified products unloader, the corresponding position of second carousel.
The invention has the advantages that the feeding device, the electrical property detection device, the electrical property defective product tray, the appearance detection device, the qualified product blanking device and the appearance defective tray can respectively complete the feeding, the electrical property test, the electrical property defective product blanking, the appearance detection, the qualified product blanking and the appearance defective product blanking of the chip capacitor, the transmission of the chip capacitor among all devices can be realized through the turntable transmission device, the whole detection and selection process is mechanically completed, the detection efficiency is effectively improved, the detection cost is reduced, the production cycle is shortened, the turnover cost is reduced, the energy consumption is reduced, and the consistency of the detection standard is ensured.
Drawings
The invention will be further described with reference to the accompanying drawings and examples, in which:
FIG. 1 is a schematic diagram of the chip capacitor inspection apparatus of the present invention;
FIG. 2 is a schematic view of the structure of a chip capacitor inspection apparatus (carousel) of the present invention;
FIG. 3 is a schematic structural view of a carousel according to the present invention;
FIG. 4 is a schematic structural view of a carousel (nozzle cylinder mechanism omitted) according to the present invention;
FIG. 5 is a partial enlarged view of portion A of FIG. 4;
FIG. 6 is a schematic structural view of a first position adjustment mechanism and an elastic lifting mechanism of the present invention;
FIG. 7 is a schematic structural view of a loading device of the present invention;
fig. 8 is a schematic plan view of an electrical property detection apparatus of the present invention;
FIG. 9 is a partial enlarged view of portion B of FIG. 8;
FIG. 10 is a schematic view of the appearance inspection apparatus according to the present invention;
FIG. 11 is a schematic structural view of a non-defective product feeding device according to the present invention;
FIG. 12 is a schematic structural view of a second XY moving stage according to the present invention;
FIG. 13 is a schematic structural view of the elevating magazine mechanism of the present invention;
FIG. 14 is a schematic structural view of the conveyor belt mechanism of the present invention;
fig. 15 is a schematic structural view of the blanking device for good electrical properties of the present invention.
Detailed Description
The invention provides a chip capacitor detection device, and in order to make the purpose, technical scheme and effect of the invention clearer and clearer, the invention is further described in detail below by referring to the attached drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
As shown in fig. 1 to 14, the chip capacitor inspection apparatus of the present embodiment includes a feeding device 1 for feeding a chip capacitor 91, an electrical property inspection device 2 for inspecting electrical properties of the chip capacitor 91, an electrical property defective tray 3 for storing electrical properties defective, an appearance inspection device 4 for testing the appearance of the chip capacitor 91, a qualified product discharging device 5 for storing and conveying the chip capacitor 91 qualified for inspection, an appearance defective tray 6 for storing appearance defective, and a turntable conveying device 7 for adsorbing and grabbing the chip capacitor 91 and rotating and changing the station of the chip capacitor 91; wherein, the feeding device 1, the electrical property detection device 2, the electrical property defective material tray 3, the appearance detection device 4, the qualified product blanking device 5 and the appearance defective material tray 6 are circularly and sequentially arranged at the outer side of the turntable conveying device 7.
Through loading attachment 1, electrical property detection device 2, electrical property defective products charging tray 3, outward appearance detection device 4, certified products unloader 5, outward appearance defective products charging tray 6, can accomplish the material loading of chip condenser 91 respectively, the electrical property test, the unloading of electrical property defective products, outward appearance detects, the unloading of certified products, and the unloading of outward appearance defective products, rethread carousel conveyer can realize the conveying of chip condenser 91 between each device, whole detection is selected the process and is all accomplished through machinery, effectual improvement detection efficiency, reduce the detection cost, shorten the production cycle length, it is higher to reduce the turnover cost, reduce the energy consumption, the uniformity of inspection standard has been guaranteed.
Further, as shown in fig. 1, 3, 4, 5, and 6, the carousel 7 includes: a first turntable 71, a first turntable driving mechanism 72 for driving the first turntable to rotate, a first conductive suction nozzle 73 for sucking and grabbing the chip capacitor 91, a first position adjusting mechanism 74 for adjusting the position of the first conductive suction nozzle 73, a nozzle cylinder mechanism 75 for pushing the first conductive suction nozzle 73 to move downwards, and an elastic lifting mechanism 76 for providing elastic lifting force for the first conductive suction nozzle 73; the first position adjusting mechanism 74 is disposed on the first rotary disk 71, the suction nozzle is disposed on the first position adjusting mechanism 74 in a vertically sliding manner, the elastic lifting mechanism 76 is disposed between the first conductive suction nozzle 73 and the first position adjusting mechanism 74, and the suction nozzle cylinder mechanism 75 is disposed above the first rotary disk 71.
Wherein the first turntable driving mechanism 72 includes a motor and a divider.
The first position adjusting mechanism 74 can be used for adjusting the position of the first conductive suction nozzle 73, so that the assembly precision requirement between the first conductive suction nozzle 73 and the first rotary table 71 is effectively reduced, and the production cost is reduced. Through the cooperation of the suction nozzle cylinder mechanism 75 and the elastic lifting mechanism 76, the first conductive suction nozzle 73 can be driven to move up and down, the chip capacitor 91 can be mechanically grabbed, and the operation is convenient and fast.
Further, as shown in fig. 1, 3, 4, 5, and 6, the first position adjustment mechanism 74 includes a first nozzle mounting block 741, a first nozzle adjustment block 742, a first adjustment screw assembly 743, and a second adjustment screw assembly 744; the first nozzle adjusting block 742 is slidably disposed on the first turntable 71 along a first direction, the first nozzle mounting block 741 is slidably disposed on the first nozzle adjusting block 742 along a second direction, the first adjusting screw assembly 743 drives the first nozzle adjusting block 742 to slide along the first direction, the second adjusting screw assembly 744 drives the first nozzle mounting block 741 to move along the second direction, and the first conductive nozzle 73 is mounted on the first nozzle mounting block 741, wherein the first direction and the second direction are perpendicular to each other;
the first adjusting screw assembly 743 is rotatably disposed on the first turntable 71, one end of the first adjusting screw assembly 743 is in threaded connection with the first nozzle adjusting block 742, and the position of the first nozzle adjusting block 742 can be adjusted by rotating the first adjusting screw assembly 743; the second adjusting screw component 744 is rotatably disposed on the first nozzle adjusting block 742, one end of the second adjusting screw component is in threaded connection with the first nozzle mounting block 741, and the position of the first nozzle mounting block 741 can be adjusted by rotating the second adjusting screw component 744.
The positions of the first nozzle mounting block 741 and the first nozzle adjusting block 742 are respectively adjusted by the first adjusting screw assembly 743 and the second adjusting screw assembly 744, so that the position of the first conductive nozzle 73 mounted on the first nozzle mounting block 741 can be adjusted, and the operation is convenient and fast.
A groove and a protrusion for guiding the first nozzle adjusting block 742 to slide along the first direction are disposed between the first nozzle adjusting block 742 and the first rotary disk 71, and a groove and a protrusion for guiding the first nozzle mounting block 741 to slide along the second direction are disposed between the first nozzle adjusting block 742 and the first nozzle mounting block 741. After the position adjustment of the first conductive suction nozzle 73 is completed, the first position adjustment mechanism 74 is fixed by a bolt.
Further, as shown in fig. 1, 3, 4, 5, and 6, the elastic lifting mechanism 76 includes a nozzle mounting rod 761 slidably disposed on the first nozzle mounting block 741, a first compression spring 762 disposed on the nozzle mounting rod 761, a guide rod 763 slidably disposed on the first nozzle mounting block 741 and parallel to the nozzle mounting rod 761, a connecting block 764 fixedly connecting the guide rod 763 and the nozzle mounting rod 761 at two ends thereof, and a second compression spring 765 disposed on the guide rod 763; the first conductive suction nozzle 73 is fixed at one end of the suction nozzle mounting bar 761, and both ends of the first compression spring 762 are respectively connected to the other end of the suction nozzle mounting bar 761 and the first suction nozzle mounting block 741; both ends of the second compression spring 765 are respectively connected with the first suction nozzle mounting block 741 and the connection block 764.
The first compression spring 762 is added to provide elastic lifting force for the first conductive suction nozzle 73, so that the structure is simple, and the production cost is effectively reduced. The guide rod 763 and the connecting block 764 are added to guide the movement direction of the nozzle mounting rod 761, so as to ensure the stability of the movement of the first conductive nozzle 73.
Further, as shown in fig. 1 and 3, the suction nozzle cylinder mechanism 75 includes a cylinder mounting plate 751, a mounting bracket 752 disposed on one side of the first rotary plate 71 and used for supporting the cylinder mounting plate 751, at least five suction nozzle driving cylinders 753 disposed on the cylinder mounting plate 751, and a rotation auxiliary member 754 fixed on the cylinder mounting plate 751, the first rotary plate 71 is rotatably connected with the rotation auxiliary member 754, and the five suction nozzle driving cylinders 753 are respectively disposed at positions corresponding to the feeding device 1, the electrical good product blanking device 8, the electrical property detection device 2, the acceptable product blanking device 5, and the second rotary plate 43.
The nozzle mounting rod 761 can be pushed to move downwards by the nozzle driving cylinder 753, that is, the first conductive nozzle 73 is pushed to move downwards, and the height adjustment of the first conductive nozzle 73 can be realized by matching with the elastic ascending mechanism 76. In this embodiment, first electrically conductive suction nozzle 73 is provided with 16, suction nozzle drive actuating cylinder 753 is provided with 5, sets up suction nozzle installation pole 761 through position that needs height-adjusting such as loading attachment 1, electrical property non-defective products unloader 8, electrical property detection device 2, certified products unloader 5, second carousel 43 and can realize the adjustment of height, need not to correspond suction nozzle installation pole 761 and the quantity one-to-one of first electrically conductive suction nozzle 73, can effectual reduction in production cost. The rotation assisting member 754 can be used to assist the rotation of the first turntable 71, thereby improving the stability of the first turntable 71 during rotation.
Further, as shown in fig. 1 and 7, the feeding device 1 includes: the device comprises a first material box tray 11 for placing material boxes 92, a first XY moving platform 12 for adjusting the position of the first material box tray 11, and a first CCD camera component 13 positioned by the first material box tray 11, wherein a plurality of material box grooves (not shown in the figure) which are matched with the shape of the material boxes 92 are arranged on the first material box tray 11.
In this embodiment, the number of the magazine grooves is 6, the first XY moving platform 12 drives the first magazine tray 11 to move in a plane, so that the magazine 92 can be conveyed to the position below the first conductive suction nozzle 73, and the first conductive suction nozzle 73 captures the chip capacitor 91 in the magazine 92, so that loading is realized. The first CCD camera assembly 13 can be used to detect the position of the magazine 92, and ensure the normal operation of the chip capacitor 91.
Further, as shown in fig. 1, fig. 2, fig. 8, and fig. 9, the electrical property detection apparatus 2 includes a testing frame 21, a first electrode testing platform 22 disposed on the testing frame 21, a second electrode thimble 23 disposed above the first electrode testing platform 22 and capable of stretching, and a tester 24 for testing the electrical property of the chip capacitor 91, where the first electrode testing platform 22 and the second electrode thimble 23 are connected to the tester 24, and the second electrode thimble 23 is slidably disposed on the testing frame 21; the first conductive suction nozzle 73 sucks and captures the chip capacitor 91, is connected with one electrode plate thereof and moves downwards, so that the side surface of the first conductive suction nozzle 73 is contacted with the second electrode thimble 23 in sequence, and the chip capacitor 91 is used as the lower end of the other electrode plate and contacted with the first electrode test bench 22 to form a test loop.
Snatch fixed chip condenser 91 and be connected with one of them plate electrode of chip condenser 91 through first electrically conductive suction nozzle 73, wherein second electrode thimble 23 telescopic setting is in first electrode testboard 22 top, when first electrically conductive suction nozzle 73 downstream, touch first electrically conductive suction nozzle 73 second electrode thimble 23 can contract and support and lean on first electrically conductive suction nozzle 73 side, the lower extreme contact first electrode testboard 22 of another plate electrode of chip condenser 91 on first electrically conductive suction nozzle 73 forms the test circuit, can cooperate tester 24 to carry out the electrical property test, and is convenient and fast, the effectual test time that shortens, improve efficiency of software testing.
Further, as shown in fig. 1, 2, and 10, the appearance testing mechanism 4 includes a first upper end surface detecting assembly 41, a second upper end surface detecting assembly 42, and a second turntable 43, which are sequentially disposed on one side of a first turntable 71, a second conductive suction nozzle 44 disposed on the second turntable 43, a first lower end surface detecting assembly 45, and a second lower end surface detecting assembly 46 disposed on one side of the second turntable 43; after the first conductive suction nozzle 73 on the first turntable 71 sucks and captures the chip capacitor 91 and passes through the first upper end surface detection assembly 41 or the second upper end surface detection assembly 42, the second conductive suction nozzle 44 on the second turntable 43 sucks and captures the chip capacitor 91 on the first conductive suction nozzle 73 and transmits the chip capacitor 91 to the first lower end surface detection assembly 45 or the second lower end surface detection assembly 46.
The first upper end face detection assembly 41, the second upper end face detection assembly 42, the first lower end face detection assembly 45 and the second lower end face detection assembly 46 are all CCD camera assemblies, and the detection focal lengths of the two assemblies are different; the first upper end face detection assembly 41 and the first lower end face detection assembly 45 are used for matching and detecting a chip capacitor 91 with one size; the second upper end face detection assembly 42 and the second lower end face detection assembly 46 are used for cooperatively detecting chip capacitors 91 with another size.
The grabbing direction of the second conductive suction nozzle 44 is opposite to the grabbing direction of the first conductive suction nozzle 73, and the detection of the two end faces of the chip capacitor 91 can be realized through the matching of the second conductive suction nozzle 44 and the first conductive suction nozzle 73, so that the detection is convenient and fast.
The first turntable 71 drives the chip capacitor 91 to pass through the upper side of the first upper end surface detection assembly 41 or the second upper end surface detection assembly 42 through the first conductive suction nozzle 73, and after the detection of the upper end surface of the chip capacitor 91 is completed, the second conductive suction nozzle 44 on the second turntable 43 sucks and captures the chip capacitor 91 on the first conductive suction nozzle 73 (at this time, the lower end surface of the chip capacitor 91 is exposed). And then the detection of the two end surfaces of the chip capacitor 91 can be completed by the first lower end surface detection component 45 or the second lower end surface detection component 46.
Further, as shown in fig. 1, 2, and 11, the non-defective product feeding device 5 includes: a magazine lifting mechanism 51 for placing and lifting and adjusting the position of the magazine 92, a second XY moving platform 52 for adjusting the position of the magazine 92, a conveyor belt mechanism 53 for discharging the magazine 92, and a gripper mechanism 54 for gripping the magazine 92; the first rotating disc 71 and the conveyor belt mechanism 53 are respectively arranged at two ends of the second XY moving platform 52, the lifting magazine mechanism 51 is arranged between the conveyor belt mechanism 53 and the second XY moving platform 52, and the clamping jaw mechanism 54 can move to the positions above the conveyor belt mechanism 53, the second XY moving platform 52 and the lifting magazine mechanism 51 to take and place the magazine 92.
The material box lifting mechanism 51 can be used for providing the material box 92, the empty material box 92 can be grabbed to the second XY moving platform 52 through the clamping jaw mechanism 54, the empty material box 92 is conveyed to the position below the first conductive suction nozzle 73 through the second XY moving platform 52, the first conductive suction nozzle 73 is used for boxing, the boxed material box 92 is driven by the second XY moving platform 52 to reach one end of the conveying belt mechanism 53, and the material box 92 is grabbed by the clamping jaw mechanism 54 and conveyed to the conveying belt mechanism 53 to complete blanking. This certified products unloader 5 need not artifical intervention and can realize the dress box unloading of chip condenser 91, and the unloading time is short, and production efficiency is high.
As shown in fig. 1, 2, 11, and 13, the elevating magazine mechanism 51 includes: a magazine rack 511 for placing the magazine 92, a lifting rack 512 arranged in the magazine rack 511 for driving the magazine 92 to move up and down, and a lifting electric cylinder 513 for driving the lifting rack 512 to move up and down. The additional feed box rack 511 can be used for placing the empty feed box 92, and provides a protective carrier for the blanking of the chip capacitor 91. The lifting frame 512 and the lifting electric cylinder 513 can be used for adjusting the height of the material box 92, so that the clamping jaw mechanism 54 can clamp materials conveniently, and the working efficiency is improved. In this embodiment, a sensor 514 for sensing the height of the material box 92 is disposed on the upper portion of the material box rack 511, and the sensor can cooperate with the lifting electric cylinder 513 to automatically adjust the height of the material box 92.
As shown in fig. 1, 2, 11, and 14, the gripper mechanism 54 includes: the second magazine clamping jaw 541 is used for clamping the magazine 92, the third translation electric cylinder 542 is used for driving the second magazine clamping jaw 541 to translate, and the second lifting electric cylinder 543 is used for driving the second magazine clamping jaw 541 to move up and down. The magazine 92 can be clamped or put down by the cooperation of the second lifting electric cylinder 543 and the second magazine clamping jaw 541, and the magazine 92 can be driven to move to and fro above the conveyor belt mechanism 53, the second XY moving platform 52 and the lifting magazine mechanism 51 by the third translation electric cylinder 542, so that the transfer of the magazine 92 is realized.
As shown in fig. 1, 2, 11, and 12, the second XY moving stage 52 includes: a second magazine tray 521 for placing the magazine 92, a first magazine claw 522 arranged on the second magazine tray 521 for fixing the magazine 92, a first translation electric cylinder 523 for driving the second magazine tray 521 to translate to and from the first conductive suction nozzle 73 and the conveyor belt mechanism 53, and a second translation electric cylinder 524 arranged between the second magazine tray 521 and the first translation electric cylinder 523 for adjusting the position of the second magazine tray 521; the moving direction of the first translational electric cylinder 523 is perpendicular to the moving direction of the second translational electric cylinder 524.
The first translation electric cylinder 523 and the second translation electric cylinder 524 can be used for moving the second magazine tray 521, that is, the position of the magazine 92 is adjusted to facilitate the first conductive suction nozzle 73 to perform the blanking of the chip capacitor 91, and meanwhile, the magazine 92 can be driven to move back and forth between the suction nozzle 1 and the conveyor belt mechanism 5. And the first magazine clamping jaw 522 is added to fix the magazine 92 on the second magazine tray 521, so that the magazine 92 is prevented from loosening and falling in the moving process.
Further, as shown in fig. 1, fig. 2, and fig. 15, the chip capacitor 91 detection apparatus further includes an electrical good product blanking device 8 disposed between the electrical property detection device 2 and the electrical poor product tray 3, where the electrical good product blanking device 8 includes an electrical good product tray 81 for loading the chip capacitor 91, and a third XY moving platform 82 for driving the adjustment position of the electrical good product tray.
The third XY moving platform 82 can drive the electrical good product tray 81 to adjust the position to the lower part of the first conductive suction nozzle 73, so as to discharge the chip capacitor 91. In the production process of the chip capacitor 91, the detection process of the chip capacitor 91 is different due to different requirements of customers for different products. The electrical property good product blanking device 8 is added to meet the production requirement of the chip capacitor 91 with low appearance requirement, and blanking can be directly carried out after electrical property test is carried out.
It should be understood that the above embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same, and those skilled in the art can modify the technical solutions described in the above embodiments, or make equivalent substitutions for some technical features; and all such modifications and alterations are intended to fall within the scope of the appended claims.
Claims (10)
1. A chip capacitor inspection apparatus, comprising:
the feeding device is used for feeding the chip capacitor;
the electrical property detection device is used for detecting the electrical property of the chip capacitor;
the electrical performance defective product tray is used for accommodating electrical performance defective products;
the appearance detection device is used for testing the appearance of the chip capacitor;
the qualified product blanking device is used for receiving and conveying chip capacitors qualified for detection;
the appearance defective material tray is used for accommodating appearance defective products;
the rotary table conveying device is used for adsorbing and grabbing the chip capacitor and rotating a station for converting the chip capacitor;
the feeding device, the electrical property detection device, the electrical property defective material tray, the appearance detection device, the qualified product blanking device and the appearance defective material tray are circularly arranged on the outer side of the turntable conveying device in sequence.
2. The chip capacitor inspection apparatus according to claim 1, wherein the carousel comprises: the chip capacitor picking device comprises a first rotary disc, a first rotary disc driving mechanism, a first conductive suction nozzle, a first position adjusting mechanism, a suction nozzle cylinder mechanism and an elastic lifting mechanism, wherein the first rotary disc driving mechanism is used for driving the first rotary disc to rotate; the first position adjusting mechanism is arranged on the first rotating disc, the suction nozzle is arranged on the first position adjusting mechanism in a vertically sliding mode, the elastic lifting mechanism is arranged between the first conductive suction nozzle and the first position adjusting mechanism, and the suction nozzle air cylinder mechanism is arranged above the first rotating disc.
3. The chip capacitor inspection apparatus according to claim 2, wherein the first position adjustment mechanism includes a first nozzle mounting block, a first nozzle adjustment block, a first adjustment screw assembly, and a second adjustment screw assembly; the first suction nozzle adjusting block is arranged on the first rotating disc in a sliding mode along a first direction, the first suction nozzle mounting block is arranged on the first suction nozzle adjusting block in a sliding mode along a second direction, the first adjusting screw assembly drives the first suction nozzle adjusting block to slide along the first direction, the second adjusting screw assembly drives the first suction nozzle mounting block to move along the second direction, the first conductive suction nozzle is mounted on the first suction nozzle mounting block, and the first direction and the second direction are perpendicular to each other;
the elastic lifting mechanism comprises a suction nozzle mounting rod which is slidably arranged on the first suction nozzle mounting block in a penetrating way, a first compression spring which is sleeved on the suction nozzle mounting rod, a guide rod which is slidably arranged on the first suction nozzle mounting block in a penetrating way and is parallel to the suction nozzle mounting rod, a connecting block which is fixedly connected with the guide rod and the suction nozzle mounting rod at two ends respectively, and a second compression spring which is sleeved on the guide rod; the first conductive suction nozzle is fixed at one end of the suction nozzle mounting rod, and two ends of the first compression spring are respectively connected with the other end of the suction nozzle mounting rod and the first suction nozzle mounting block; and two ends of the second compression spring are respectively connected with the first suction nozzle mounting block and the connecting block.
4. The chip capacitor inspection apparatus according to claim 2, wherein the loading device comprises: the device comprises a first material box tray for placing material boxes, a first XY moving platform for adjusting the position of the first material box tray, and a first CCD camera assembly positioned by the first material box tray, wherein a plurality of material box grooves matched with the shape of the material boxes are formed in the first material box tray.
5. The chip capacitor detection device according to claim 2, wherein the electrical property detection device comprises a test frame, a first electrode test platform arranged on the test frame, a second electrode thimble arranged above the first electrode test platform in a telescopic manner, and a tester for testing the electrical property of the chip capacitor, wherein the first electrode test platform and the second electrode thimble are connected with the tester, and the second electrode thimble is slidably arranged on the test frame in a penetrating manner; the first conductive suction nozzle is connected with one electrode plate and moves downwards, the side face of the first conductive suction nozzle is contacted with the second electrode thimble, and the chip capacitor is used as the lower end of the other electrode plate and contacted with the first electrode test bench to form a test loop.
6. The chip capacitor inspection apparatus according to claim 5, wherein the appearance testing mechanism comprises a first upper end face inspection component, a second turntable, a second conductive suction nozzle arranged on the second turntable, a first lower end face inspection component, a second lower end face inspection component arranged on one side of the second turntable, and a first upper end face inspection component, a second upper end face inspection component, and a second turntable which are arranged in sequence on one side of the first turntable; after the first conductive suction nozzle on the first rotary disc adsorbs and grabs the chip capacitor and passes through the first upper end face detection assembly or the second upper end face detection assembly, the second conductive suction nozzle on the second rotary disc adsorbs and grabs the chip capacitor on the first conductive suction nozzle and conveys the chip capacitor to the first lower end face detection assembly and the second lower end face detection assembly.
7. The chip capacitor inspection apparatus according to claim 5, wherein the non-defective product blanking device comprises: the device comprises a material box lifting mechanism, a second XY moving platform, a conveyor belt mechanism and a clamping jaw mechanism, wherein the material box lifting mechanism is used for placing and adjusting the height of a material box; the first rotating disc and the conveyor belt mechanism are respectively arranged at two ends of the second XY moving platform, the material box lifting mechanism is arranged between the conveyor belt mechanism and the second XY moving platform, and the clamping jaw mechanism can move to the positions above the conveyor belt mechanism, the second XY moving platform and the material box lifting mechanism to take and place material boxes.
8. The chip capacitor inspection apparatus according to claim 6, wherein the second XY moving stage comprises: the second material box clamping jaw is arranged on the second material box tray and used for fixing a material box, the first translation electric cylinder is used for driving the second material box tray to translate to and fro between the first conductive suction nozzle and the conveyor belt mechanism, and the second translation electric cylinder is arranged between the second material box tray and the first translation electric cylinder and used for adjusting the position of the second material box tray; the moving direction of the first translation electric cylinder is perpendicular to the moving direction of the second translation electric cylinder.
9. The apparatus according to claim 7, further comprising an electrical good blanking device disposed between the electrical property detection device and the electrical bad material tray, wherein the electrical good blanking device comprises an electrical good material tray for loading the chip capacitor, and a third XY moving platform for driving the electrical good material tray to adjust the position.
10. The chip capacitor detection device according to claim 2, wherein the suction nozzle cylinder mechanism comprises a cylinder mounting plate, a mounting bracket arranged on one side of the first rotary plate and used for supporting the cylinder mounting plate, at least five suction nozzle driving cylinders arranged on the cylinder mounting plate, and a rotary auxiliary member fixed on the cylinder mounting plate, the first rotary plate is rotatably connected with the rotary auxiliary member, and the five suction nozzle driving cylinders are respectively arranged at positions corresponding to the feeding device, the electrical good product discharging device, the electrical property detection device, the good product discharging device and the second rotary plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010779185.6A CN112007868A (en) | 2020-08-05 | 2020-08-05 | Chip capacitor detection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010779185.6A CN112007868A (en) | 2020-08-05 | 2020-08-05 | Chip capacitor detection equipment |
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| CN112007868A true CN112007868A (en) | 2020-12-01 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202010779185.6A Pending CN112007868A (en) | 2020-08-05 | 2020-08-05 | Chip capacitor detection equipment |
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| CN112742749A (en) * | 2020-12-16 | 2021-05-04 | 扬州日精电子有限公司 | Energizing wire-breaking detection device of metallized film capacitor welding machine |
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| CN112742749A (en) * | 2020-12-16 | 2021-05-04 | 扬州日精电子有限公司 | Energizing wire-breaking detection device of metallized film capacitor welding machine |
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| CN114011751B (en) * | 2021-10-27 | 2023-04-07 | 光子(深圳)精密科技有限公司 | Automatic detection equipment for ceramic core of electronic cigarette |
| CN114289339A (en) * | 2021-12-10 | 2022-04-08 | 郑州信大捷安信息技术股份有限公司 | Automatic chip detection method and device |
| CN114289339B (en) * | 2021-12-10 | 2023-09-26 | 郑州信大捷安信息技术股份有限公司 | Automatic chip detection method and device |
| CN114560292A (en) * | 2022-01-26 | 2022-05-31 | 福州派利德电子科技有限公司 | Automatic detection device and detection method for integrated circuit chip translation type sorting machine |
| CN114560292B (en) * | 2022-01-26 | 2023-11-14 | 福州派利德电子科技有限公司 | Automatic detection device and detection method for integrated circuit chip translation type sorting machine |
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