200816887 九、發明說明： 【發明所屬之技術領域】 、本發明尤指其提供一種利用架置於作業站上方並可作三鈾命 f移作動之第—移載取放ϋ及第二移載取放II，以將電子元件於 二Ϊ載f作業站，並以穩定的水平度將電子元件置入作業站執^ K前於㈣及提升作業品f之€子耕移餘置及方法。 『τ/1 參閱第1、2、3圖，其係為台灣專利申請第93110783 # 則裝置（二）』專利案，該檢測裝置包含有測試台1 〇、 一、二取料機構20、3 0及入、出料機構4〇、5〇，盆中， 1 ◦之兩侧設有第—、二取料機構2 ◦、3 〇，i取料 羊上二相互組裝之橫移轉及升降結構，各橫移結構係於機 :^有，滑軌2 1、3 i及橫向螺桿2 2、3 2，而橫向= 、32由馬達23、33驅動，-具有螺套241、’、 且蟬ί2; 3 4 2之滑動件2 4、3 4，係滑置 縱㈣座2 4 3、3 4 3，而升降結構係於—底面且吸J 二，、3 5側面設有縱向滑執2 5 i、3 5 i面;= 。月動件2 4、3 4之縱向滑座2 4 24 2 Φ -錢2。6、36之橫向滑軌261、3612=升 3 ^亚於献6、3 6之另面設有二縱向滑座2 6 2、 g 2二螺套2 6 3、3 6 3 ’以分別組裝於機架之縱1骨軌 3 7及縱向螺桿2 8、3 8上，而縱向螺桿2 二，2 9、3 9驅動，進而當各橫移結構之馬達2 3 "：rfL222^：2 於機架之橫向滑軌21'31及支 200816887 2 9、3 9:4二後:二而=降結構之馬達 之縱向滑座2 6 2、？fi ^8日守〜動支架26、36 251、351於==92 5、35之縱向滑軌 3 4之縱向滑座2 4 3、34 ^ :二3 7及滑動件2 4、 ===構5 ◦係分顺於測: 吸io'Ui取1二，結構，用《載送具ΐ 吸嘴4 2係將待測ϊ 於載^入料機構4 〇之 一取料機構2 Q之取料器2 5匕，4 1載送至第 器2 5之吸嘴於載台4工上吸取工c 機構2 0令取料 行测試作業，而載台4丨 並置人於測試台1〇中進 當入料機構以轉下-待測I C ; :則方時’第二取料機構3 〇二測試台1 0之 器3 5位於人料機構4 5作X方向位移’令取料 料機構5 0之載台5 χ上方，並令取2 5橫向位移至出 J台51上送出’在此同時，第料將IC放置於 f = Z方向位移，將取料器3 5上另J取料器3 5作 2中進行測試作業，當第二取料機構3 〇之^ =测試台 機構 一、二取料機構2。、3。依序= 由於該第一、二取料機構2 〇.、3 〇且 5僅能作X-Z兩軸向的位移，使得取料 ，器2 5、 ϋ ΰ、3 5於各取 200816887 放位置及測試位置無法作χ—γ—ζ^向的位置微調，因此载台 4 1、5 1相對於測试台1 〇的位移定位位置，以及取料器2 5、 35相對於測試台1Q、載台41、5 1的位移錄位於裝 配設計上都必須具有絕對的精準度，才能使取料器2 5、3 Χ — Ζ兩軸向的位移限制下，準確的載送丨c進行測試作業，如 此高精，的製作需求’即造成製作不纽大幅提高製作成J的問 題丄”Μ 5、3 5以L型懸臂_態架置於測試台1 壓吸嘴2 5 3、3 5 3壓抵待測之I C，可能產生 較差之水平度，而影響測試品質。 王 有於此本發明人遂以其多年從事相 =二::出一種可作三軸向滑移之移載取放器，以卿立 ㈣作及穩定 【發明内容】 本毛明之主要目的係提供一種電子元件移 :括有作業站、位於作業站一側之第一供料載具▲第一收料截，、 八、位於作業站另侧之第二供料載具及二^ :；、 作鞏站t !τ 有吸嘴，升降桿並以滑執組分聊置ϊ 業1 二，三軸向，動，使得進3 成本各相對位置間的誤差，進喊到易於製作及降低 中，一目f係提供一種電子元件移载裝置及方法，盆 缸羊詈於从專載取放器及第二移載取放器之升降桿俜分別以、、坪^ 、夺’升降桿可帶触嘴準粉作業站正上方置入電子元 7 200816887 .=====度’穩定_抵電子元件以執行作業，達 - 【實施方式】 第二收料載具8 3了8巧完^電8子2 業區8 0内之第-、 輸出:S=9Q_ 檢測結果由 位於作業站8 5 一御區80包括有作業站85、 位於作業站8 5另‘;二;共：；以一=具⑼、 ^一移載取放器8 6及第二移收料载具8 4、 及第-、二收料載具83 :二固、82 業=5的相關位置，以供第…：移载位f相對作 立左右動:¾輸j:::掌::作業’或以Ιίί 供第―、二移载取放位ft對作業站8 5的相關位置，以 送機構進行供、收料作業 輪送機構、輪出端輸 =:1，_軌《 6 丄 放 -8 ε,,^ίϊί 8(^8^' 橫向面板8 6 3、8 7 3裝設兩二8 6 4 2j7 2頭端係以 8 200816887 8 6 3、8 7 3帶動吸嘴8 6 4、8 74作 移作的滑 明多閱第7圖，本發明之電子元件 • 8 0執行檢測作業時，其第：移其係於作業區 六方電子元件11 〇執行檢測作業業站8 5 =於第—供料載具8 1處準備取置待檢測U载=器8 6 請參閱第8圖，當電子元株！ Ί J之電子轉1 1 1 ; 8 7將完測之電子元件丄檢测後，第二移载取放器 供輸出端輸送機構依據檢測結果4放置，以 第-移載取放器8 6將待檢測=類放置’同時 9圖，於電子元件請參閲第 元件110完成放置後，“GSiS器 輸S二機檢測之電子元夂 ^丄心明參閱第1 〇圖’接著當電子元 具\1移載;第:載 ΐζτ,τ 8j. 測之雷早U、料載具81處’由於輸人端輸送機構已將待檢 3輸送至第一供料載具81上，因此第-= 子元^ $一供！ί載具81上準備取置下一組待檢測之電 8 7分別由作辈站=第一移載取放器8 6及第二移載取放器 測作業。由作業8 5兩側交互輪替的將電子元件移載並執行檢 9 200816887 本發明之第一移载取放器86及第二 作三軸向的_，因此仰微難方由於可 式供料載具、固找收料載具間之各相對^^巧站、固定 到易f製作及降低製作成本之效益。 s的#差’進而達 5月參閱第12圖，本發明之第一移載取放 取放器8 7由於可作二軸向的#銘，1^^#敌°°86及苐二移載 降桿8 6 2、移 執㈣試作業時，其升 2 8 7 2頭端之吸嘴8 6 4、874可準雜你普二 Μ正^方置人電子树，並且以較佳的水平度，提供平均^下 =的穩定的壓域子元相執行檢測作業，達到 檢測發3僅作及降低製作成本，且有效提升200816887 IX. INSTRUCTIONS: [Technical field to which the invention pertains] The present invention particularly provides a first-to-load transfer amp and a second transfer that are placed above the work station and can be used for the movement of the three uranium Pick and place II to place the electronic components on the second station, and place the electronic components in a stable level to the work station before the (K) and lifting the work item f. 『τ/1 Refer to Figures 1, 2 and 3, which is the Taiwan Patent Application No. 93110783 #装置(二)』 patent case, the test device includes a test stand 1 一, one, two reclaiming mechanisms 20, 3 0 and 4, 5 入, 5 〇, 5 〇, in the basin, 1 ◦ on both sides of the first and second reclaiming mechanism 2 ◦, 3 〇, i take the sheep on the two sides of the assembly of the horizontal transfer and lift Structure, each traverse structure is attached to the machine: ^, slide rails 2 1 , 3 i and transverse screws 2 2, 3 2, and lateral = , 32 are driven by motors 23, 33, - have screw sleeves 241, ', and蝉ί2; 3 4 2 sliding parts 2 4, 3 4, sliding the vertical (four) seat 2 4 3, 3 4 3, and the lifting structure is attached to the bottom surface and sucking J 2, 3 5 side with longitudinal sliding 2 5 i, 3 5 i faces; = . Lunar moving piece 2 4, 3 4 longitudinal slide 2 4 24 2 Φ - money 2. 6, 36 transverse slide 261, 3612 = liter 3 ^ Asian on the 6th, 3 6 on the other side with two longitudinal slip 2 2 2, g 2 two sets 2 6 3, 3 6 3 ' are assembled on the longitudinal 1 bone rail 3 7 and the longitudinal screw 2 8 , 3 8 respectively, and the longitudinal screw 2 2, 29 3 9 drive, and then when the traverse structure of the motor 2 3 ": rfL222 ^: 2 in the frame of the horizontal rail 21'31 and branch 200816887 2 9, 3 9:4 two: two = down structure Longitudinal slide of the motor 2 6 2? Fi ^8 day guard ~ moving bracket 26, 36 251, 351 on == 92 5, 35 longitudinal slide 3 4 longitudinal slide 2 4 3, 34 ^ : two 3 7 and slide 2 4, === Structure 5 ◦ is divided into the following: io'Ui takes 1 2, structure, with "carrier ΐ nozzle 4 2 system will be tested 载 in the loading mechanism 4 取 one of the reclaiming mechanism 2 Q The reclaimer 2 5匕, 4 1 is carried to the nozzle of the second unit 25, and the suction station of the second stage is sucked by the worker c mechanism to make the refueling line test operation, and the stage 4 is juxtaposed to the test station 1 〇中进入入料机构 to turn down-test IC to be tested; :When the square is 'the second reclaiming mechanism 3 〇2 test station 1 0 device 3 5 is located in the human body mechanism 4 5 for X-direction displacement' to reclaim The loading mechanism 5 of the loading platform 5 is above the χ, and the lateral displacement of the 205 is sent out to the J-station 51. At the same time, the first material is placed in the f=Z direction displacement, and the reclaimer 3 5 is additionally The J reclaimer 3 5 performs the test operation in 2, and the second reclaiming mechanism 3 ^^ = the test stand mechanism 1 and the second reclaiming mechanism 2. , 3. Sequentially = Since the first and second reclaiming mechanisms 2 〇., 3 〇 and 5 can only be used for the displacement of the XZ two axial directions, the retrieving, the devices 25, ϋ, and 35 are taken at the positions of 200816887 and The test position cannot be fine-tuned for the position of χ-γ-ζ^, so the displacement position of the stage 4 1 , 5 1 relative to the test stand 1 ,, and the reclaimer 2 5, 35 relative to the test stand 1Q, The displacement records of the stages 41 and 5 1 must have absolute precision in the assembly design, so that the retractor 2 5, 3 Χ Ζ Ζ Ζ Ζ Ζ Ζ , , , , , , 准确 准确 准确 准确 准确 准确 准确 准确 准确 准确 准确 准确 准确 准确 准确 准确 准确 准确Such a high-precision, production demand 'is caused by the problem of making a large increase in the production of J. Μ 5, 3 5 with L-shaped cantilever _ state placed on the test bench 1 pressure nozzle 2 5 3, 3 5 3 pressure The IC that arrives at the test may produce a poor level and affect the quality of the test. Wang You, the inventor of the inventor, has been engaged in the phase 2 for two years: a transfer handler that can be used for three-axis sliding The purpose of this article is to provide an electronic component shift: including a work station, located in the work The first feeding carrier on the station side ▲ the first receiving interception, the eighth, the second feeding carrier on the other side of the working station and the second ^;;, the Gong station t !τ has a nozzle, the lifting rod And with the slippery component chat industry 1 2, three axial, moving, so that the error between the relative positions of the 3 costs, into the easy to make and reduce, one eye f provides an electronic component transfer device and In the method, the pot cylinder is placed on the lifting rod from the special pick-and-place picker and the second transfer pick-and-place picker, and the flat element is placed above the working station of the pick-up nozzle. 7 200816887 .===== degree 'stability _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ , Output: S=9Q_ The detection result is located at the work station 8 5 A royal area 80 includes the work station 85, and the work station 8 5 other '; two; total:; one = (9), ^ one transfer pick and place 8 6 and the second shift receiving vehicle 8 4, and the first and second receiving vehicles 83: the two solid, 82 industry = 5 related position, for the first...: transfer position f relative to the left and right: 3⁄4 lose j::: palm:: homework' or Ιίί for the first and second shifts to take the position of the ft to the relevant position of the work station 8 5, to send the mechanism for the supply and receipt of the work of the delivery mechanism, the wheel output == 1, _ track "6 丄 - 8 ε,,^ίϊί 8(^8^' Horizontal panel 8 6 3, 8 7 3 Install two two 8 6 4 2j7 2 head end with 8 200816887 8 6 3, 8 7 3 to drive the nozzle 8 6 4, 8 74 滑 滑 滑 7 7 7 7 7 7 7 7 7 7 7 7 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 The first - the feeding carrier 8 1 is ready to be taken to be tested U = = 8 6 Please refer to Figure 8, when the electronic element strain! Ί J's electronic turn 1 1 1 ; 8 7 After the electronic component 完 is tested, the second transfer pick-and-place device is placed at the output end of the transport mechanism according to the test result 4, to the first-to-load pick-and-place device 8 6 Place the object to be tested = at the same time as the 9 figure. After the electronic component is read, the component 110 is placed, and the electronic component of the GSiS device is detected by the second element. With \1 transfer; the first: load ΐζτ, τ 8j. Measured by Ray early U, material carrier 81 'Because the input end transport mechanism has transported the test 3 to the first feed carrier 81, so the first -= sub-element ^ $ one for! ί vehicle 81 is ready to take the next set of electricity to be detected 8 7 respectively by the generation station = first transfer pick-and-place device 8 6 and the second transfer pick-and-place test The operation of the electronic component is carried out by the interaction of the two sides of the operation 8 5 and the inspection is performed 9 200816887 The first transfer picker 86 of the present invention and the second three-axis _, therefore The benefits of the type of supply carrier, the solid-to-received carrier, the relative fixation, the fixation to the production and the reduction of the production cost. The #差's of s and then up to May, see Figure 12, the present invention A transfer pick-and-place pick-and-place device 8 7 can be used as a two-axis #铭,1^^#敌°°86 and 苐二移载降杆8 6 2. When shifting (4) test operation, it rises 2 8 7 2 end of the nozzle 8 6 4, 874 can be quasi-mixed with you, the second generation of the square is placed in the electronic tree, and with a better level, provide a stable ^ domain = stable pressure domain sub-phase phase detection Homework, to achieve the detection of hair 3 only and reduce production costs, and effectively improve
帽產品及刊物公開，從而允符發明專辦請要件，爰依法H 【圖式簡單說明】 第1圖：係為台灣專利申請第93110783號『1C檢測裝置（二）卷 利案之配置示意圖。 』寻 第2圖··係為台灣專利申請第93110783號『1C檢測裝置（二）直 ^ 利案第一取料機構之示意圖。 』 第3圖：係為台灣專利申請第9311〇783號『IC檢測 第4圖 第5圖 第6圖 第7圖 第8圖 第9圖 利案第二取料機構之示意圖。 』 本發明配置於測試分類機之配置示意圖。 本發明之架構圖。 本發明移載取放器之示意圖。 本發明移載之動作示意圖（一）。 本發明移載之動作示意圖（二）。 ^ ，本發明移載之動作示意圖（三）。 ，10圖·本發明移載之動作示意圖（四）。 第11圖：本發明移載之動作示意圖（五）。 200816887 第12圖：本發明移載取放器下壓執行測試作業之示意圖。 【主要元件符號說明】 - 習式部份： 10 測試台 2 0 弟一取料機構 2 1 橫向滑軌 2 2 :橫向螺桿 2 3 :馬達 24 滑動件 24 ； L .螺套 2 4 2 :橫向滑座 2 4 3 :縱向滑座 2 5 :取料器 2 51 :縱向滑軌2 5 2 :橫向滑座 2 5 3 :下壓吸嘴 2 6 :支架 2 6 ： L :橫向滑軌2 6 2 :縱向滑座 2 6 3 :螺套 27 縱向滑執 2 8 :縱向螺桿 2 9 :馬達 3 0 弟一取料機構 3 1 橫向滑軌 3 2 :横向螺桿 3 3 :馬達 3 4 滑動件 34 1 :螺套 3 42 ··橫向滑座 3 4 3 :縱向滑座 ^ b : :取料器 3 51 :縱向滑軌3 5 2 :橫向滑座 3 5 3 :下壓吸嘴 3 ϋ : :支架 3 6 ] L :橫向滑軌3 6 2 :縱向滑座 3 6 3 :螺套 3 7 、縱向滑執 3 8 :縱向螺桿 3 9 :馬達 40 入料機構 4 1 ··載台 4 2 :吸嘴 5 0 出料機構 51:載台 5 2 ·•吸嘴 本發明部份： 6 0 供料機構 7 0 :輸入端輸送機構 8 0 作業區 8 1 ，一供料载具 8 2 ··第二供料載具 8 3 第一收料載具 8 4 ··第二收料載具 11 200816887 " 8 5 :作業站 8 6 :第一移載取放器 8 6 1 ··滑執組 8 6 2 8 6 3 :橫向面板 8 6 4 ^ 8 7 ··第二移載取放器 8 71 :滑軌組 8 7 2 8 7 3 :橫向面板 8 7 4 9 0 :輸出端輸送機構 10 0 :收料機構 110:電子元件 111 112:電子元件 113 =升降桿 :吸嘴 =升降桿 :吸嘴 電子元件 電子元件 12The cap products and publications are made public, so that the special requirements for inventions are allowed, 爰H according to the law [Simplified description of the drawings] Fig. 1 is a schematic diagram of the configuration of the 1C detection device (2) of the Taiwan Patent Application No. 93110783. 『2nd picture】 is a schematic diagram of the first reclaiming mechanism of the 1C detection device (2) of the Taiwan Patent Application No. 93110783. 』 Figure 3: Taiwan Patent Application No. 9311〇783 "IC Test 4th Figure 5 Figure 6 Figure 7 Figure 8 Figure 9 Diagram of the second reclaiming mechanism. The configuration of the present invention is configured on a test sorter. The architecture diagram of the present invention. A schematic diagram of the transfer handler of the present invention. Schematic diagram of the action of the transfer of the present invention (1). Schematic diagram of the action of the transfer of the present invention (2). ^, the schematic diagram of the action of the transfer of the present invention (3). 10 is a schematic diagram of the action of the transfer of the present invention (4). Figure 11: Schematic diagram of the action of the transfer of the present invention (5). 200816887 Fig. 12: Schematic diagram of the test operation of the loading and unloading device of the present invention. [Main component symbol description] - Part of the formula: 10 Test bench 2 0 Brother-removing mechanism 2 1 Horizontal slide 2 2: Transverse screw 2 3: Motor 24 Slide 24; L. Screw sleeve 2 4 2 : Landscape Slide 2 4 3 : Longitudinal slide 2 5 : Reclaimer 2 51 : Longitudinal slide 2 5 2 : Lateral slide 2 5 3 : Lower suction nozzle 2 6 : Bracket 2 6 : L : Horizontal slide 2 6 2: Longitudinal slide 2 6 3 : Screw sleeve 27 Longitudinal slide 2 8 : Longitudinal screw 2 9 : Motor 3 0 Younger pick-up mechanism 3 1 Horizontal slide 3 2 : Transverse screw 3 3 : Motor 3 4 Slide 34 1 : Screw sleeve 3 42 ··Transverse slide 3 4 3 : Longitudinal slide ^ b : : Reclaimer 3 51 : Longitudinal slide 3 5 2 : Lateral slide 3 5 3 : Lower suction nozzle 3 ϋ : : Bracket 3 6 ] L : transverse rail 3 6 2 : longitudinal slide 3 6 3 : screw sleeve 3 7 , longitudinal slip 3 8 : longitudinal screw 3 9 : motor 40 feeding mechanism 4 1 ··stage 4 2 : Nozzle 5 0 Discharge mechanism 51: Stage 5 2 ·• Nozzle Part of the invention: 6 0 Feed mechanism 7 0: Input end transport mechanism 8 0 Work area 8 1 , One feed carrier 8 2 ·· Second feeding carrier 8 3 first receiving carrier 8 4 ··Second receiving vehicle 11 200816887 " 8 5 : Work station 8 6 : First transfer picker 8 6 1 ··Slip group 8 6 2 8 6 3 : Horizontal panel 8 6 4 ^ 8 7 ··Second transfer picker 8 71 : Slide group 8 7 2 8 7 3 : Horizontal panel 8 7 4 9 0 : Output conveying mechanism 10 0 : Receiving mechanism 110 : Electronic component 111 112 : Electronic component 113 = lifting rod: nozzle = lifting rod: nozzle electronic components electronic components 12