TWI641835B - Electronic component operating device and its application test classification equipment - Google Patents

Abstract

An electronic component working device is provided with a carrier mechanism having at least one test carrier, wherein the test carrier carries at least one electronic component and is driven by the power source to be displaced in at least one direction, and at least the test carrier is disposed at least a first transmission member, the first end of the first transmission member is electrically connected to the electronic component, and the second end is extended beyond the bottom surface of the test carrier, and a test mechanism having a tester is disposed on the tester Having at least one second transmission member electrically connected to the first transmission member; thereby, the first transmission member of the test carrier of the carrier mechanism is electrically connected to the electronic component and the second transmission member of the testing mechanism to enable the testing mechanism The tester directly performs the test operation on the electronic components on the test stage via the first and second transmission members, thereby reducing the timing and path of the movement of the transferred electronic components, thereby achieving the practical benefit of reducing the working time and improving the production efficiency.

Description

Electronic component operating device and its application test classification equipment

The invention provides a first transmission member using a test carrier of a carrier mechanism to electrically connect the electronic component and the second transmission component of the testing mechanism, so that the tester of the testing mechanism directly tests the test device via the first and second transmission members. The electronic components on the stage perform test operations to effectively reduce the timing and path of the transfer of electronic components, thereby reducing the operating time and improving the production efficiency of the electronic component operating device.

Nowadays, after the electronic components are manufactured, the electronic components must be tested with the test equipment to eliminate the defective products; please refer to Figures 1, 2 and 3, the electronic component test equipment is configured on the machine 11 for testing. The device 12 and the transport device 13 are provided with an electrically connected circuit board 121 and a test socket 122 for testing electronic components. The transport device 13 is provided on the first side of the test device 12. The first loading stage 131 and the first discharging stage 132 are displaced in one direction (such as the X direction) to respectively carry the electronic component to be tested and the tested electronic component, and are disposed on the second side of the testing device 12 The second loading stage 133 and the second discharging stage 134 for shifting in the X direction respectively carry the electronic component to be tested and the electronic component to be tested, and two second and third are provided at the testing device 12 a first pressure shifter 135 and a second pressure shifter 136 that are displaced in a direction (eg, Y, Z direction), wherein the first pressure shifter 135 is a first Y-direction driving element 1371 and a first Z-direction driving element 1372 The drive is displaced in the YZ direction, and the second pressure shifter 136 is driven by the second Y-direction element 1381 The second Z-direction driving component 1382 is driven to be displaced in the YZ direction, so that the first pressure shifter 135 can transfer the electronic component to be tested and the tested electronic component between the test socket 122 and the first inlet and outlet loading stations 131 and 132. The second pressure shifter 136 is then The test piece 122 and the second inlet and discharge stage 133, 134 transfer the electronic component to be tested and the tested electronic component; in use, the first loading stage 131 of the conveying device 13 carries the electron to be tested The element 14 is displaced in the X direction to carry the electronic component 14 to be tested under the first pressure shifter 135, and the first Z direction driving component 1372 drives the first pressure shifter 135 to be displaced in the Z direction by the first input. The loading stage 131 takes out the electronic component 14 to be tested, and the first Y-direction driving component 1371 and the first Z-direction driving component 1372 drive the first pressure shifter 135 to shift in the YZ direction to move the electronic component 14 to be tested into the testing device 12 The test operation is performed by the seat 122. After the test is completed, the first Z-direction driving component 1372 drives the first pressure shifter 135 to be displaced in the Z direction to the test socket 122 to take out the measured electronic component 14, the first Y-direction driving component 1371. And the first Z-direction driving component 1372 drives the first pressure shifter 135 to shift in the YZ direction to move the measured electronic component 14 into the first discharging stage 132, and the X-direction displacement output is output by the first discharging stage 132. Measured electronic component 14; however, due to test stand 1 of test device 12 The 22 series is disposed on one side of the first loading stage 131, so that the test block 122 and the first loading stage 131 have a Y-direction transfer path, and when the first pressure shifter 135 is on the first loading stage 131 After the electronic component 14 to be tested is taken out, the electronic component 14 to be tested must be transferred to the test socket 122 in the Y direction to perform the test operation. In other words, the first pressure shifter 135 takes out the measured electronic component at the test socket 122. After the component 14, the Y-direction displacement must also be transferred to the first discharge stage 132 to perform the discharging operation, so that the first pressure shifter 135 is in the test socket 122 and the first inlet. The discharge stage 131 and 132 are repeatedly used to shift the electronic component 14 in the Y direction, which not only increases the multi-channel transfer timing and the transfer time, but also cannot improve the production efficiency. The conveying device 13 must also be configured to drive the first pressure shift. The 135 is the first Y-direction driving element 1371 displaced in the Y direction, so as to increase the equipment cost.

A first object of the present invention is to provide an electronic component operating device that is provided with a carrier mechanism having at least one test carrier, the test carrier carrying at least An electronic component is driven by the power source to be displaced in at least one direction, and the test carrier is provided with at least one first transmission member, the first end of the first transmission member is electrically connected to the electronic component, and the second end is worn Extending from the bottom surface of the test stage, a test mechanism having a tester, wherein the test device is provided with at least one second transmission member electrically connected to the first transmission member; thereby, the test carrier using the carrier mechanism The first transmission member is electrically connected to the electronic component and the second transmission component of the testing mechanism, so that the tester of the testing mechanism directly performs the testing operation on the electronic components on the test carrier via the first and second transmission members, thereby reducing the transfer The timing and path of the operation of electronic components can achieve practical benefits of reducing operating time and improving production efficiency.

A second object of the present invention is to provide an electronic component working device, wherein the working device is provided with at least one pick-and-place device for displacing the electronic component in the Z direction on the transfer path of the test stage for testing When the stage carries the electronic component under the pick-and-place device, the pick-up device only needs to perform the Z-direction displacement pressure to the electronic component to actually contact the first transmission component of the test carrier to perform the test operation, and after the test is completed, the take-up is performed. The device is displaced in the Z direction to the test stage to take out the tested electronic components, and is moved into another discharging stage. The operating device does not need to be separately configured to drive the pick and place device for the Y-direction displacement driving component, thereby achieving cost saving and space saving. Practical benefits of configuration.

A third object of the present invention is to provide a test classification device for applying an electronic component working device, which comprises a machine table, a feeding device, a receiving device, a working device, a material moving device and a central control device, wherein the feeding device is configured And a feeding device for accommodating the electronic component to be tested, the receiving device is disposed on the machine table, and is provided with at least one receiving device for accommodating the tested electronic component, The working device of the invention is arranged on the machine table, and is provided with a carrying mechanism and a testing mechanism, so that the testing device of the testing mechanism directly performs the testing operation on the electronic components on the test platform of the carrying mechanism, and the moving device is configured The machine is provided with at least one shifting device for transferring electronic components, and the central control device is used for controlling and integrating the operations of the devices to perform automated operations, thereby achieving practical benefits of improving work efficiency.

[study]

11‧‧‧ machine

12‧‧‧Testing device

121‧‧‧Circuit board

122‧‧‧ test seat

13‧‧‧Conveyor

131‧‧‧First feeding platform

132‧‧‧First discharge stage

133‧‧‧Second feed stage

134‧‧‧Second discharge platform

135‧‧‧First pressure shifter

136‧‧‧Second pressure shifter

1371‧‧‧First Y-direction drive element

1372‧‧‧First Z-direction drive element

1381‧‧‧Second Y-direction drive element

1382‧‧‧Second Z-direction drive element

14‧‧‧Electronic components

〔this invention〕

20‧‧‧Working device

21‧‧‧ Carriers

211‧‧‧Power source

212‧‧‧Incoming test stage

2121‧‧‧Incoming Material Undertaking

2122‧‧‧First transmission

2123‧‧‧Locator

213‧‧‧Output loading platform

2131‧‧‧Disburring Department

214‧‧‧Injection test stage

2141‧‧‧ accommodating space

2142‧‧ ‧ socket

2143‧‧‧Feeding Department

2144‧‧‧First transmission

2145‧‧ spring

2146‧‧‧ Positioner

215‧‧‧ discharging platform

2151‧‧‧Disburring Department

22‧‧‧Test institutions

221‧‧‧Tester

222‧‧‧second transmission

223‧‧‧circuit board

224‧‧‧Connector

2241‧‧‧First connector

2242‧‧‧Connecting line

2243‧‧‧Second connection

23‧‧‧ picker

30‧‧‧ machine

31‧‧‧ mouth

32, 33‧‧‧ Electronic components

40‧‧‧Transfer device

41‧‧‧First mover

42‧‧‧Second shifter

50‧‧‧Feeding device

51‧‧‧Feeder

60‧‧‧ receiving device

61‧‧‧Receipt receiver

Figure 1: Schematic diagram of a conventional electronic component test device and transport device.

Figure 2: Schematic diagram of the use of the conventional test device and transport device (1).

Figure 3: Schematic diagram of the use of conventional test devices and transport devices (2).

Fig. 4 is a layout view showing a first embodiment of the electronic component working device of the present invention.

Figure 5 is a front elevational view of a first embodiment of the working device of the present invention.

Figure 6 is a schematic view showing the use of the first embodiment of the working device of the present invention (I).

Figure 7 is a schematic view showing the use of the first embodiment of the working device of the present invention (2).

Figure 8 is a schematic view showing the use of the first embodiment of the working device of the present invention (3).

Figure 9 is a schematic view showing the use of the first embodiment of the working device of the present invention (4).

Fig. 10 is a view showing another application configuration of the first embodiment of the working device of the present invention.

Figure 11 is a layout view showing a second embodiment of the electronic component working device of the present invention.

Figure 12 is a front elevational view of a second embodiment of the working device of the present invention.

Figure 13 is a schematic view showing the use of the second embodiment of the working device of the present invention (I).

Figure 14 is a schematic view showing the use of the second embodiment of the working device of the present invention (2).

Figure 15 is a schematic view showing the use of the second embodiment of the working device of the present invention (3).

Figure 16 is a schematic view showing the use of the second embodiment of the working device of the present invention (4).

Figure 17 is a schematic view showing the application of the working device of the present invention to a test sorting device.

In order to make the present invention further understand the present invention, a preferred embodiment and a drawing will be described in detail as follows: Please refer to Figures 4 and 5, which is the first of the electronic component working device 20 of the present invention. The embodiment includes a carrier mechanism 21 and a testing mechanism 22, wherein the carrier mechanism 21 is provided with at least one test carrier carrying electronic components, the test carrier being displaced in at least one direction and provided with at least one electrical The first transmission member of the electronic component is contacted, and further, the carrier mechanism 21 is provided with at least one power source for driving the test carrier displacement, and the test carrier is provided with at least one or a plurality of mounting electronic components. The receiving portion is provided with at least one first transmitting member, and the test carrier is provided with at least one fixed mounting portion having a first transmitting member, or at least one movable Displacement and having at least one socket of the bearing portion, and is disposed at the bearing portion There is at least one first transmission member. Further, the test carrier is provided with at least one accommodating space for accommodating a seat having at least one of the receiving portions and being movable and displaceable. A transmission member is disposed through the socket and the test carrier, and the carrier mechanism 21 can be provided with at least one carrier having no first transmission member for carrying electronic components, such as a carrier capable of carrying the detected electronic In the present embodiment, the carrier mechanism 21 is provided with a power source 211 disposed in the first direction (such as the X direction) on the machine table 30 to drive the feeding test stage. 212 and the discharge loading platform 213 are arranged to be displaced in the X direction. The feeding test carrier 212 is provided with a fixed feeding receiving portion 2121, and a plurality of probes are disposed on the inner bottom surface of the feeding receiving portion 2121. The first transmission member 2122, the first end of the first transmission member 2122 can be electrically connected to the electronic component, and the second end is placed on the bottom surface of the feeding test carrier 212, because the size of the feeding receiving portion 2121 is slightly More than the size of the electronic component, the carrier mechanism 21 is provided with at least one correctable positioning electron element on the feeding test carrier 212. The positioner, in the embodiment, is provided with a positioner 2123 on the top surface of the feeding test stage 212, and the positioner 2123 is driven by a pressure cylinder to drive an L-shaped pusher displacement, so that the pusher pushes The electronic component is displaced to correct the positioning electronic component. The discharging carrier 213 is provided with a fixed discharging receiving portion 2131. The discharging receiving portion 2131 does not have the first transmitting member and carries the measured electronic component. The testing device 22 is provided with at least one tester 221 having a second transmission member 222, and is electrically connected to the first transmission member 2122 of the test carrier by a second transmission member 222, and can directly be connected to the test carrier. The electronic component on the stage performs a test operation. Further, the second transmission component 222 can be fixed and electrically connected to the first transmission component 2122 by at least one connector, or can cooperate with the first transmission component 2122 of the movable design. For the electrical connection, the second transmission member 222 can be movable to cooperate with the fixed first transmission member 2122 to electrically connect the second transmission member 222 with respect to the first transmission member 2122. Further, The tester 221 can have a second transmission member 222 that is electrically connected The circuit board is also connected to the second transmission member 222 and the circuit board. The circuit board is electrically connected to the testing machine. In this embodiment, the machine 30 is attached to the loading test stage 212. A test port 221 is disposed under the port 31, and the tester 221 is electrically connected to the second transmission member 222 and the circuit board 223. The circuit board 223 is electrically connected to the test machine. And at least one connector 224 is disposed between the second transmission member 222 and the first transmission member 2122, so that the second transmission member 222 is electrically connected to the first transmission member 2122. In this embodiment, the connector 224 is The first connecting member 2122 is electrically connected to the first connecting member 2122 of the feeding test stage 212. The first connecting member 2241 is connected to the second connecting member 2243 by a connecting wire 2242, and the second connecting member 2243 is electrically connected to the tester. The second transmission member 222 of 221 causes the first transmission member 2122 of the infeed test carrier 212 and the second transmission member 222 of the tester 221 to transmit power or test signals by using the connector 224 to perform a test operation; the operation device 20 further At least one pick-and-placer 23 is included to perform a preset operation on the electronic component. Further, the pick-and-placer 23 is disposed on the transfer path of the test stage, and the pick-and-placer 23 can perform the simple access to the electronic component. Discharge operation, for example, on the feed test stage 212 and discharge The electronic components are transferred between the 213, and the pick-up device 23 also performs the pressing operation of the crimping and pick-and-place electronic components. For example, the electronic components pressed against the feeding test carrier 212 do contact the first transmitting member 2122, and In the present embodiment, the pick-and-place device 23 is disposed above the transfer path of the feed test stage 212 and the discharge stage 213, and the transfer device 23 is disposed between the feed test stage 212 and the discharge stage 213. The Z-direction displacement can be performed, and the pressing operation of the crimping and pick-and-place electronic components is performed, and the working device 20 does not need to separately configure the Y-direction driving components, thereby achieving practical benefits of cost saving.

Referring to Figures 6 and 7, the feeding test stage 212 of the carrying mechanism 21 is adapted to be used by the first feeder 41 of a moving device to move the electronic component 32 to be tested into the feeding receiving portion 2121. The mechanism 21 uses the locator 2123 to push the calibration to correct the positioning of the electronic component 32 to be tested, so that the contact of the electronic component 32 to be tested (such as a solder ball) correctly contacts the first end of the first transmission member 2122, because the first transmission member 2122 The second end is electrically connected to the first connecting member 2241 of the connector 224, so that the first transmitting member 2122 can utilize the first connector 224 The connecting member 2241, the connecting wire 2242 and the second connecting member 2243 are electrically connected to the second transmitting member 222 of the tester 221; and after the loading test carrier 212 carries the electronic component 32 to be tested, the carrying mechanism 21 The power source 211 drives the feed test stage 212 and the discharge stage 213 to synchronously shift in the X direction, so that the feed test stage 212 is displaced below the pick-up unit 23, and the connection line 2242 of the connector 224 is followed by The feeding test stage 212 moves, and the pick-up device 23 is displaced downward in the Z direction to press against the electronic component 32 to be tested of the feeding test stage 212, so that the contact of the electronic component 32 to be tested does contact the first transmission. The component 2122 is electrically connected to the first transmission member 2122 via the circuit board 223, the second transmission member 222 and the connector 224, so that the tester 221 can be on the feeding test carrier 212. The electronic component 32 performs the test operation, and the pick-and-placer 23 does not need to shift the electronic component in the Y direction, thereby reducing the timing and path of the moving electronic component, thereby achieving the practical benefit of reducing the working time and improving the production efficiency.

Referring to Figures 7, 8, and 9, after the test operation of the electronic component 32 is completed, the positioner 2123 of the feed test stage 212 releases the measured electronic component 32, and the pick and place 23 is displaced upward in the Z direction. And taking the measured electronic component 32 on the feeding test carrier 212, the power source 211 of the carrier mechanism 21, that is, driving the feeding test carrier 212 and the discharging carrier 213, synchronously shifting in the X direction, and issuing The material loading table 213 is displaced to the lower side of the pick-up unit 23, and the pick-up unit 23 is displaced downward in the Z direction, and the measured electronic component 32 is moved into the discharging receiving portion 2131 of the discharging stage 213, and is taken and placed. The device 23 is further reset in the Z direction, and at this time, the feeding test carrier 212 is used by the first feeder 41 of the loading device to move the next electronic component 33 to be tested into the feeding receiving portion 2121. After the discharge stage 213 carries the measured electronic component 32, the power source 211 of the carrier mechanism 21, that is, the drive feed test stage 212 and the discharge stage 213 are synchronously displaced in the X direction, so that the next test is performed. The feeding test stage 212 of the electronic component 33 is displaced below the pick-and-placer 23 to continue the test operation, and the discharging stage 213 The tested electronic component 32 is carried out; therefore, the tester 221 of the testing mechanism 22 can directly perform the testing operation on the electronic components on the feeding test carrier 212 to reduce the timing and path of the moving electronic components. The device 23 transfers the electronic components between the feeding test stage 212 and the discharging stage 213, and does not need to shift the Y-direction to transfer the electronic components between the carrying mechanism 21 and the testing mechanism 22, thereby reducing the working time and improving the production efficiency. Practical benefits.

Please refer to FIGS. 5 and 10 , which are another application configuration diagram of the first embodiment of the electronic component working device 20 of the present invention. The machine 30 is provided with a plurality of carrier mechanisms 21 , a plurality of testing mechanisms 22 , and a plurality of pick-and-place devices 23, the feeding test carrier 212 and the discharging carrier 213 of the first transporting member 21 of each carrying mechanism 21 respectively carrying the electronic component to be tested and the tested electronic component, at least one testing mechanism A tester 221 can be provided. The tester can have a plurality of second transmission members 222 for performing test operations on electronic components on the load test stage 212 of the plurality of carrier mechanisms 21, or the test mechanism 22 A plurality of testers 221 having a second transport member 222 may be disposed to perform a test operation on the electronic components on the load test carrier 212 of the plurality of carrier mechanisms 21. In the present embodiment, the test mechanism 22 is configured. A plurality of testers 221 having the second transport member 222 can directly perform test operations on the electronic components on the plurality of feed test carriers 212, and the plurality of pick and placers 23 are respectively placed in the feed of the plurality of transport mechanisms 21. Load of test stage 212 and discharge stage 213 Paths to test carrier is pressed against the feeding table of the electronic component 212, and tested in the feeding stage 212 and the discharge stage practical benefits transferring electronic device 213, to improve the production efficiency.

Referring to FIGS. 11 and 12, a second embodiment of the electronic component working device 20 of the present invention includes a carrier mechanism 21 and a testing mechanism 22, which is disposed on the machine 30 in an X direction. The power source 211 is configured to drive the loading test carrier 214 and the discharge carrier 215 for X-direction displacement. The feeding test carrier 214 is provided with at least one accommodating space 2141 for accommodating one having at least one input. The bearing portion and the movable displacement seat 2142, further, the socket 2142 can be driven by a drive (such as a pressure cylinder, not shown) Actively displacement, or at least one elastic member is disposed between the accommodating space 2141 and the socket 2142, and is passively displaced after the bearing 2142 is pressed. In this embodiment, the socket 2142 is provided. The first receiving end 2144 has a first end of the first transmitting member 2144 electrically connected to the electronic component, and the second end extends through the socket 2142 and the feeding test load. A plurality of elastic members which are springs 2145 are disposed between the receiving space 2141 of the feeding test carrier 214 and the bearing 2142. After the bearing 2142 is pressed, the spring 2145 can be compressed to make the Z-direction elastic. Displacement, and the second end of the first transmission member 2144 is more convexly protruded from the bottom surface of the feeding test carrier 214, and the top surface of the socket 2142 is provided with a locator 2146 for aligning and correcting the positioning electronic component. The loading platform 215 is provided with a discharge receiving portion 2151 for carrying the output of the tested electronic component; the testing mechanism 22 is provided with at least one tester 221 having a second transmitting member 222, and the second transmitting member 222 can be Electrically connecting the first transfer member 2144 of the feed test station 214, and testing the feed test carrier 214 The electronic component is further provided with a through port 31 in the transfer path of the feeding test carrier 214, and an assembly tester 221 is fixed under the port 31, and the tester 221 is electrically connected. The second transmission member 222 and the circuit board 223 are electrically connected to the testing machine, and the working device 20 is disposed on the loading path of the feeding test carrier 214 and the discharging carrier 215. The direction shifting picker 23 performs the pressing operation of the crimping and pick-and-place electronic components, and the working device 20 does not need to separately arrange the Y-direction driving components, thereby achieving the practical benefit of cost saving.

Referring to Figures 13 and 14, the loading test carrier 214 of the carrier mechanism 21 is adapted to move the electronic component 32 to be tested into the material receiving portion 2143 of the socket 2142 by the first feeder 41 of the loading device. The carrier mechanism 21 is calibrated by the locator 2146 to correct the positioning of the electronic component 32 to be tested, so that the contact of the electronic component 32 to be tested correctly contacts the first end of the first transmission member 2144; and then carried on the loading test carrier 214. After the electronic component 32 to be tested, the power source 211 of the carrier mechanism 21 drives the feed test carrier 214 and the discharge carrier 21 5 synchronously shifting in the X direction, so that the feeding test carrier 214 is displaced below the pick-up device 23, and the pick-up device 23 is displaced downward in the Z direction to press the electronic component 32 to be tested of the feeding test carrier 214. After the electronic component 32 to be tested is pressed, the bearing 2142 is driven to be displaced downward in the Z direction, and the spring 2145 is compressed, so that the bearing 2142 drives the first transmission member 2144 to be displaced relative to the second transmission member 222 of the testing mechanism 22. The first transmission member 2144 is electrically connected to the second transmission member 222, so that the tester 221 performs a test operation on the electronic component 32 on the feeding test carrier 214.

Referring to FIGS. 15 and 16, after the test operation of the electronic component 32 is completed, the positioner 2146 of the feed test stage 214 releases the measured electronic component 32, and the pick and place 23 is displaced upward in the Z direction, and The measured electronic component 32 is taken out at the feeding test carrier 214, and the power source 211 of the carrier mechanism 21, that is, the driving feeding test carrier 214 and the discharging carrier 215 are synchronously displaced in the X direction, so that the discharging is carried out. The table 215 is displaced to the lower side of the pick-up device 23, and the pick-up device 23 is further displaced downward in the Z direction, and the measured electronic component 32 is placed in the discharge receiving portion 2151 of the discharge loading platform 215, and the pick-and-place device 23 is further reset in the Z direction, and at this time, the feeding test carrier 214 is used by the first feeder 41 of the loading device to move the next electronic component 33 to be tested into the feeding receiving portion 2143; After the discharge stage 215 carries the measured electronic component 32, the power source 211 of the carrier mechanism 21, that is, the drive feed test carrier 214 and the discharge carrier 215 are synchronously displaced in the X direction, so as to have the next electronic device to be tested. The feed test carrier 214 of the component 33 is displaced below the pick-and-placer 23, and the test operation is continued, and the discharge carrier 215 is loaded. The electronic device 32 has been measured.

Please refer to FIG. 4, FIG. 5 and FIG. 17, which are schematic diagrams of the working device 20 of the present invention applied to an electronic component testing and sorting device. The test sorting device is provided on the machine table 30 with a feeding device 50, a receiving device 60, and at least An operating device 20, a transferring device 40 and a central control device (not shown) are mounted on the machine table 30 and provided with at least one feeding device 51 for feeding trays. For accommodating at least one electronic component to be tested; the receiving device 60 is Mounted on the machine table 30, and provided with at least one receiving receptacle 61 for receiving trays for accommodating at least one tested electronic component; the working device 20 of the present invention is mounted on the machine 30 and provided The carrier mechanism 21 and the testing mechanism 22 are configured to carry and test electronic components. In the present embodiment, the carrier mechanism 21 is provided with a feeding test carrier 212 and a discharging carrier 213 having a first transmission member 2122. The test mechanism 22 is provided with a tester 221 having a second transport member 222. The second transport member 222 is electrically connected to the first transport member 2122, and a pick-and-place device 23 is disposed on the feed test carrier 212. And a carrying path of the discharging stage 213 for pressing against the electronic components on the feeding test stage 212, and transferring the electronic components on the feeding test stage 212 and the discharging stage 213, the moving device 40 The at least one shifting device for transferring electronic components is provided. In this embodiment, the first shifter 41 and the second shifter 42 are connected to the feeding device of the feeding device 50. The device 51 takes out the electronic component to be tested and transfers it to the feeding test carrier 212. When the feeding test carrier 212 carries the electronic component, the material can be loaded. The first transmission member 2122 of the test station 212 is electrically connected to the electronic component and the second transmission member 222 of the testing mechanism 22, so that the tester 221 of the testing mechanism 22 directly tests the incoming material via the first and second transmission members 2122, 222. The electronic component on the stage 212 performs a test operation. After the test is completed, the pick-and-placer 23 is taken out of the feeding test stage 212 to take out the tested electronic component, and is moved into the discharging stage 213, and the discharging stage 213 is loaded. After the electronic component is tested, the second shifter 42 of the loading device 40 takes out the tested electronic component from the discharging platform 213, and according to the test result, the measured electronic component is sent to the receiving device 60. The material receiver 61 is used for sorting and arranging; the central control device is used for controlling and integrating the operation of each device to perform an automatic operation, thereby achieving the practical benefit of improving the performance of the operation.

Claims (7)

An electronic component working device comprises: a carrying mechanism: at least one power source, at least one feeding test carrier and at least one discharging platform, wherein the feeding test carrier and the discharging carrier are respectively carried An electronic component, the feeding test carrier and the discharging carrier are driven by the power source to be displaced in at least one direction, and the feeding test carrier is provided with at least one receiving portion for receiving electronic components, The receiving portion is provided with at least one first transmitting member, wherein the first transmitting member is electrically connected to the electronic component carried by the feeding test carrier; and the testing mechanism is provided with a tester having at least one second transmitting member. The second transmission member can be electrically connected to the first transmission member and can be used for testing the electronic components on the feeding test carrier; at least one pick-and-place device is disposed on the feeding test carrier and the discharging load The transfer path of the station can be used to perform preset operations on electronic components. The electronic component working device according to claim 1, wherein the feeding test carrier of the carrying mechanism is provided with at least one fixed type of receiving portion, or at least one movable displacement and at least A seat for the mounting portion. The electronic component working device according to claim 1, wherein the feeding test carrier of the carrying mechanism is provided with at least one accommodating space and at least one movable displacement and has at least one of the receiving portions. The socket is placed in the accommodating space, and the first transmission member passes through the socket and the feeding test carrier. The electronic component working device according to claim 1, wherein the carrying mechanism is provided with at least one positioner for correcting positioning electronic components on the feeding test carrier. The electronic component working device according to claim 1, wherein the second transmitting member of the testing device is electrically connected to the first transmitting member of the feeding test carrier by at least one connector. The electronic component working device according to claim 1, wherein the second transmission member of the testing mechanism is electrically connected to the displacement of the first transmission member of the carrier mechanism Or the first transmission member of the carrier mechanism is electrically connected to the second transmission member of the testing mechanism. A test classification device for applying an electronic component working device, comprising: a machine table; a feeding device: disposed on the machine table, and provided with at least one feeding device for accommodating at least one electronic component to be tested; Receiving device: disposed on the machine, and provided with at least one receiving device for accommodating at least one tested electronic component; at least one electronic component working device according to claim 1 The system is disposed on the machine for transferring and testing the electronic component; the transferring device is disposed on the machine, and is provided with at least one shifter for transferring electronic components; and the central control device: It is used to control and integrate the various devices to perform automated operations.