TW202007993A - Electronic component testing apparatus and test sorting equipment applied to the same transmitting a signal to the testing machine after receiving the rays to distinguish the light emitting quality of the electronic component - Google Patents

Abstract

This invention discloses an electronic component testing apparatus. A testing mechanism of the electronic component testing apparatus is provided with at least one tester electrically connected with a testing machine above a first through hole of an erecting fixture; a carrying mechanism is provided with a turntable with at least one first bearing component below the erecting fixture; the turntable rotates to drive the first bearing component and an electronic component borne by the first bearing component and provided with a luminous body to be conveyed to the downside of the first through hole; a telex mechanism is provided with a carrier driving a teletype to displace below the first through hole of the testing mechanism to ensure that a transmission member of the teletype is in electric contact with a contact of the electronic component, so that the luminous body of the electronic component emits rays towards the tester, the tester transmits a signal to the testing machine after receiving the rays to distinguish the light-emitting quality of the electronic component, so that the practical benefit of increasing the production efficiency by automatic test is achieved.

Description

Electronic component testing device and applied test classification equipment

The invention provides an electronic component testing device for automatically testing electronic components with luminous bodies to improve production efficiency.

Nowadays, electronic components with light emitting diodes (LEDs) have been widely used in different products, such as display devices or small-sized lamps, etc. The electronic components are embedded with multiple LEDs on one side and have contacts on the other side. Electronic components must go through multiple processing processes, such as cutting processes or packaging processes. Therefore, in order to ensure product quality, after the completion of the production of electronic components, manufacturers will conduct test operations to test the luminous uniformity and brightness of electronic components. The elimination of defective products is currently testing electronic components one by one manually. However, due to the large number of electronic components, manual testing operations not only take time and effort to improve production efficiency, but also are more likely to be caused by manual operations, resulting in uneven test quality. Missing.

The first object of the present invention is to provide an electronic component testing device. The testing mechanism is equipped with at least one tester electrically connected to the testing machine above the first through hole of the mounting device. The carrying mechanism is below the mounting device. A turntable with at least one first receiving part is provided, and the turntable rotates and drives the first receiving part and the electronic component with a luminous body to be carried under the first through hole. Below the first through hole, there is a carrier that drives the displacement of the telegraph, so that the transmission part of the telegraph electrically contacts the contact of the electronic component, so that the luminous body of the electronic component projects light toward the tester, and the tester receives light After that, a signal is transmitted to the testing machine to judge the luminous quality of the electronic components, so as to achieve the practical benefits of automated testing and improving production efficiency.

The second object of the present invention is to provide an electronic component testing device, which further includes a detection mechanism. The detection mechanism is provided with an attachment seat with an exhaust component under the second through-hole of the mounting tool. When the first receiving part is in contact with the attaching base, the attaching base absorbs the electronic component on the first receiving part by the suction component. If vacuum suction is not possible, it is detected that the electronic component is not placed flat The first bearing component must be ruled out, so that the detection mechanism can detect whether the electronic component is placed flat on the first bearing component of the carrying mechanism, so as to facilitate subsequent testing operations to ensure the quality of the test, and improve the use efficiency Practical benefits.

The third object of the present invention is to provide a test classification device using an electronic component test device, which includes a machine, a feeding device, a receiving device, a testing device, a conveying device and a central control device. The feeding device is configured on the machine On the table, there is at least one feed holder for accommodating the electronic component to be tested. The receiving device is arranged on the machine table and at least one feed holder for accommodating the tested electronic component is provided. The test The device is arranged on the machine table, and is provided with a test mechanism, a carrying mechanism and a telex mechanism to perform electronic component testing operations. The conveying device is arranged on the machine table and is provided with at least one material moving unit to move With electronic components, the central control device is used to control and integrate the actions of each device to perform automated operations to achieve practical benefits of improving operating efficiency.

〔this invention〕

10‧‧‧Test device

11‧‧‧ Testing organization

111‧‧‧Mounting tool

1111‧‧‧First through hole

1112‧‧‧The second through hole

112‧‧‧Tester

12‧‧‧Carrier

121‧‧‧ First Motor

122‧‧‧Turntable

1221‧‧‧The first bearing component

1222‧‧‧Second bearing component

1223‧‧‧First punch

1224‧‧‧Second Perforation

13‧‧‧ Telex agency

131‧‧‧vehicle

132‧‧‧Second motor

133‧‧‧ transmission group

134‧‧‧ circuit board

135‧‧‧Telephone Block

1351‧‧‧Probe

1361‧‧‧Mobile

1362‧‧‧Fixed board

1363‧‧‧Slide rail set

1364‧‧‧support frame

1365‧‧‧Press cylinder

1366‧‧‧First limit piece

1367‧‧‧Second limit piece

1368‧‧‧slot rail

1369‧‧‧The third limit piece

1370‧‧‧Card holder

14‧‧‧ Inquiry agency

141‧‧‧Patch

142‧‧‧Suction parts

143‧‧‧Body

144‧‧‧Pressure parts

145‧‧‧Actuator

21‧‧‧machine

22‧‧‧Test machine

23‧‧‧Electronic components

231‧‧‧ luminous body

232‧‧‧Contact

24‧‧‧shifter

25‧‧‧Electronic components

30‧‧‧machine

40‧‧‧Feeding device

41‧‧‧ Feeding holder

50‧‧‧Receiving device

51‧‧‧ Receiver

60‧‧‧Conveying device

61‧‧‧First material moving unit

62‧‧‧Incoming carrier

621‧‧‧Incoming receiving trough

63‧‧‧Second shifting unit

631‧‧‧First Picker

632‧‧‧Second Picker

64‧‧‧ First corrector

65‧‧‧The third material transfer unit

651‧‧‧ third picker

652‧‧‧ Fourth Picker

66‧‧‧Second corrector

67‧‧‧Discharge carrier

671‧‧‧Discharge receiving trough

68‧‧‧The fourth material transfer unit

Figure 1: The configuration diagram of the electronic component testing device of the present invention.

Figure 2: Partial schematic diagram (1) of the electronic component testing device of the present invention.

Figure 3: Partial schematic diagram (2) of the electronic component testing device of the present invention.

Figure 4: Partial schematic diagram (3) of the electronic component testing device of the present invention.

Fig. 5: Schematic diagram of the electronic device testing device of the present invention (1).

Figure 6: A schematic diagram of the use of the electronic component testing device of the present invention (2).

Fig. 7: The use schematic diagram (3) of the electronic component testing device of the present invention.

Figure 8: The schematic diagram (4) of the electronic device testing device of the present invention.

Figure 9: A schematic diagram of the electronic component testing device of the present invention applied to a test sorter.

In order to make your examination committee have a better understanding of the present invention, a preferred embodiment is given in conjunction with the drawings. The details are as follows:

Please refer to FIGS. 1 to 4, the electronic component testing device 10 of the present invention includes a testing mechanism 11, a carrying mechanism 12 and a telex mechanism 13, and further includes a detection mechanism 14, the testing mechanism 11 is provided with at least one mounting device 111. The mounting device 111 defines at least one first through hole 1111, and at least one tester 112 is mounted above the at least one first through hole 1111. In this embodiment, the mounting device 111 is mounted on a machine 21, and is provided with a first through hole 1111 and a second through hole 1112, a tester 112 as an integrating sphere is assembled on the first through hole 1111, the tester 112 is electrically connected to a test machine 22, because the test machine 22 is not a necessary technical feature of this case, so it will not be described in detail; the carrying mechanism 12 is provided with at least one carrying drive source and at least one turntable driven by the carrying drive source to rotate. In this embodiment, the carrying The driving source is a first motor 121 which drives a turntable 122 to rotate. The turntable 122 is located under the mounting device 111 of the testing mechanism 11 and is provided with at least one first receiving electronic component. The receiving member 1221, in this embodiment, the turntable 122 is provided with a first receiving member 1221 and a second receiving member 1222, a bottom surface of the first receiving member 1221 is provided with a first through hole 1223, the first The bottom surface of the second receiving member 1222 is provided with a second through hole 1224. The turntable 122 rotates to drive the first receiving member 1221 and the second receiving member 1222 to sequentially move to the first through hole 1111 and the second of the testing mechanism 11 Below the through hole 1112; the teletype mechanism 13 is provided with at least one carrier 131 under the first through hole 1111 of the test mechanism 11, and further, the carrier 131 is of a fixed or mobile design, if The fixed carrier is fixed on the machine 21, if it is a mobile carrier, it is driven by a teledrive source for displacement in at least one direction. In this embodiment, the carrier 131 is a mobile carrier, It is driven by a teledrive source for displacement in the first direction (such as the Z direction). The teledrive source is equipped with a pressure cylinder or a linear motor or contains a motor and a transmission group. In this embodiment, the teledrive source is The second motor 132 is provided, and the second motor 132 drives a transmission group 133 which is a screw and screw seat group. The transmission group 133 uses the screw seat to drive the carrier 131 to move in the Z direction, and the electric transmission mechanism 13 is connected to At least one telegraph is mounted on the carrier 131, and the telegraph is provided with at least one transmission member that electrically contacts the electronic component to perform a preset operation, such as a light emitting inspection operation of the electronic component, so that the luminous body of the electronic component faces the tester 112 projects light, and the tester 112 transmits a signal to the testing machine 22 after receiving the light to judge the luminous quality of the electronic component, or to perform electrical test operations on the electronic component, for example, in this embodiment, the telegraph is The carrier 131 is provided with an electrically connected circuit board 134 and a teleconductor 135. The circuit board 134 is electrically connected to the testing machine 22, and the teleconductor 135 is provided as a probe 1351 The transmission part electrically contacts the contacts of the electronic components, and the telex mechanism 13 is provided with at least one transposition unit to control the horizontal displacement of the carrier 131 to perform the replacement and maintenance operation of the telex, the transposition The unit is provided with at least one moving member 1361 that supports a telex drive source. The moving member 1361 is horizontally displaced by an automated or manual method, and is not limited to the implementation form disclosed in the present invention. In this embodiment, The transposition unit is provided with a slide rail group 1363 between the moving part 1361 and the fixed plate 1362, and the moving part 1361 is manually displaced horizontally by the slide rail group 1363, and a supporting frame 1364 is provided on the fixed plate 1362 The support frame 1364 is provided for assembling the testing machine 22, and is provided with at least one first limiter that limits the outward displacement of the moving member 1361 and at least one second limiter that limits the inward displacement of the movable member 1361. In this embodiment, the first limiter is provided with a first limiter 1366 driven by the pressure cylinder 1365 for Z-direction displacement, and can stop movement when the first limiter 1366 is displaced downward in the Z-direction The component 1361 is displaced outwards. On the contrary, when the first limiter 1366 is displaced upwards in the Z direction, the stop can be released to allow the mobile member 1361 to be displaced outwards. The second limiter can be an independent component or formed on a support In this embodiment, the second limiter is provided with a second limiter 1367 as a baffle at one end of the support frame 1364, so as to stop the moving member 1361 from moving inward, and then change the position The unit is provided with at least a third stopper, the third stopper is provided with a groove rail 1368 in the moving part 1361 for passing through a third stopper 1369, and the third stopper 1369 is inserted Placed in a catching seat 1370 to assist in stopping the displacement of the moving member 1361; the detection mechanism 14 is configured with at least one attaching seat 141 with an exhaust component 142 under the second receiving part 1222 of the turntable 122 to extract The electronic component supported by the second receiving component 1222 is sucked. Furthermore, the attachment base 141 is mounted on a floater for floating displacement. In this embodiment, the floater is provided with a support in the body 143 The pressure member 144 is a spring or a diaphragm or an airbag. In this embodiment, the pressure member 144 is a spring, and an actuator 145 is elastically mounted on the actuator 145. The receiving base 141 makes the connecting base 141 float in the Z direction.

Please refer to FIG. 5, the carrying mechanism 12 uses a first motor 121 to drive a turntable 122 to rotate, and the turntable 122 drives the first receiving member 1221 and the second receiving member 1222 to perform horizontal rotation displacement simultaneously, so that the first bearing The positioning member 1221 is located at the second through hole 1112 of the mounting fixture 111 for a material shifter 24 to move an electronic component 23 of the illuminant 231 and the contact 232 of the tool to be tested into the first through the second through hole 1112 The receiving part 1221 is slightly higher than the first receiving part 1221 because the attachment seat 141 of the detection mechanism 14 is slightly pressed when the first receiving part 1221 rotates below the second through hole 1112 The receiving base 141 is displaced downward in the Z direction, and the attaching base 141 compresses the pressure receiving member 144 downward through the actuating member 145 so that the first receiving part 1221 is located between the mounting tool 111 and the attaching base 141 At the same time, the affixing base 141 is affixed to the bottom surface of the first receiving part 1221 by the pushing elastic force of the pressure member 144, so that the exhaust part 142 is located at the first through hole 1223 of the first receiving part 1221. The detection mechanism 14 uses the suction member 142 to suck the electronic component 23 to be tested in the first receiving member 1221. If the electronic component 23 is vacuum-absorbed, the detecting electronic component 23 is placed flat on the first receiving member 1221. The displacement can be carried in accordance with the timing of the actuation. On the contrary, if the electronic component 23 cannot be vacuum adsorbed, it is detected that the electronic component 23 is not placed flat on the first receiving part 1221, and the abnormality must be eliminated to ensure the test quality; therefore, when After the suction component 142 of the attachment base 141 vacuum suctions the electronic component 23 to be tested in the first receiving component 1221, it is confirmed that the electronic component 23 is placed flat on the first receiving component 1221, and then the suction component 142 is controlled to release the electrons The element 23 further completes the detection operation.

Please refer to FIG. 6, and then the carrying mechanism 12 is driven by the first motor 121 to rotate the turntable 122. The turntable 122 drives the first receiving part 1221 and the second receiving part 1222 of the electronic component 23 for horizontal rotation displacement. Make the first receiving part 1221 align with the first through hole 1111 of the mounting device 111, the teletype mechanism 13 drives the screw of the transmission group 133 by the second motor 132, and drives the carrier 131 through the screw seat of the transmission group 133 The circuit board 134 and the teleconductor 135 on it are displaced upward in the Z direction, so that the probe 1351 of the teleconductor 135 electrically contacts the contact 232 of the electronic component 23 to supply power, and the electronic component 23 is lifted and placed on the rack The bottom surface of the fixture 111 is placed, and the lower half of the electronic component 23 is kept in the first receiving part 1221, so that the luminous body 231 of the electronic component projects light into the tester 112 through the first through hole 1111. After receiving light, the tester 112 transmits a signal to the testing machine, and the testing machine judges the luminous quality of the electronic component 23. However, when testing the electronic component 23, since the second receiving part 1222 of the turntable 122 is located on the mounting device The second through hole 1112 of 111 can hold the next electronic component 25 to be tested.

Please refer to FIG. 7, after completing the test operation, the telex mechanism 13 drives the screw of the transmission group 133 with the second motor 132, and drives the carrier 131 and the circuit board 134 and the carrier 131 on the screw seat of the transmission group 133 The teletype base 135 is displaced downward in the Z direction, so that the probe 1351 of the teletype base 135 receives the electronic component 23 from the mounting fixture 111, and the electronic component 23 is placed flat in the first receiving part 1221, and then the probe The pin 1351 is separated from the contact 232 of the electronic component 23.

Please refer to FIG. 8, the carrying mechanism 12 uses a first motor 121 to drive a turntable 122 to rotate. The turntable 122 drives the first receiving part 1221 with the electronic component 23 under test and the second bearing with the electronic component 25 under test The positioning member 1222 horizontally rotates and displaces, so that the first receiving member 1221 faces the second through hole 1112 of the mounting fixture 111, so that a feeder 24 can be taken out of the first receiving member 1221 through the second through hole 1112. The electronic component 23 is tested, but the mounting device 111 can also open a third through hole, and the first receiving part 1221 of the turntable 122 is located in the third through hole for the feeder 24 to pass through the third through hole Take out the measured electronic components 23, and perform loading and unloading at different positions.

Please refer to FIG. 1 to FIG. 4 and FIG. 9, which is a schematic diagram of the test device 10 of the present invention applied to an electronic component test sorter. The test sorter is equipped with a feeding device 40 and a receiving device 50 on a machine 30. Testing device 10, conveying device 60 and central control device (not shown in the figure); the feeding device 40 is assembled on the machine table 30, and is provided with at least one feeding holder 41 which is a feeding tray for accommodating At least one electronic component to be tested; the receiving device 50 is mounted on the machine 30 and is provided with at least one receiving receptacle 51 as a receiving tray for accommodating at least one tested electronic component; the test The device 10 is assembled on the machine 30, and is provided with a testing mechanism 11, a carrying mechanism 12 and a telex mechanism 13 to perform electronic component testing operations; the conveying device 60 is assembled on the machine 30 and is provided with at least one A material transfer unit that transfers electronic components. In this embodiment, the conveying device 60 is provided with a first material transfer unit 61 to take out the electronic components to be tested from the feed holder 41 of the feed device 40, and It is transferred to at least one feed carrier 62, which is used for linear displacement or rotational displacement. In this embodiment, the feed carrier 62 is provided with a plurality of feed carriers for receiving electronic components The groove 621 is placed and rotated to allow the first material transfer unit 61 to move into the electronic component to be measured. A second material transfer unit 63 is provided with a first picker 631 and a second picker 632, and The picker 631 and the second picker 632 are linearly displaced to transfer the electronic components to be tested between the loading stage 62, a first corrector 64, and the testing device 10, and the first corrector 64 supports the electronic components , And calibrate and adjust the placement angle of the electronic components, and detect whether the electronic components lie flat on the first corrector 64, and the first picker 631 transfers the electronic components to be tested on the loading stage 62 to the first calibration 64, the second picker 632 moves the electronic component to be tested of the first corrector 64 into the test device 10, the test device 10 performs a test operation on the electronic component, after the test is completed, a third material removal unit 65 The third picker 651 and the fourth picker 652 are provided, and the third picker 651 and the fourth picker 652 are linearly displaced to the test device 10, a second corrector 66, and a discharge stage 67 The measured electronic components are transferred between them. The second corrector 66 supports the electronic components, and adjusts and adjusts the placement angle of the electronic components, and detects whether the electronic components lie flat on the second corrector 66. The table 67 is linearly or rotationally displaced. In this embodiment, the discharge carrier 67 is provided with a plurality of discharge receiving grooves 671 for receiving electronic components, and performs rotary displacement. The third picker 651 The measured electronic components of the testing device 10 are transferred to the second corrector 66, and the fourth picker 652 transfers the measured electronic components of the second corrector 66 to the discharge stage 67, a fourth The material unit 68 takes out the measured electronic components on the discharge platform 67, and according to the test results, sends the measured electronic components to the receiving device of the receiving device 50 The controller 51 is used for classification and storage. The central control device is used to control and integrate the actions of each device to perform automated operations, so as to achieve the practical benefits of improving operating efficiency.

10‧‧‧Test device

11‧‧‧ Testing organization

111‧‧‧Mounting tool

112‧‧‧Tester

12‧‧‧Carrier

121‧‧‧ First Motor

122‧‧‧Turntable

13‧‧‧ Telex agency

131‧‧‧vehicle

132‧‧‧Second motor

133‧‧‧ transmission group

134‧‧‧ circuit board

135‧‧‧Telephone Block

1361‧‧‧Mobile

1362‧‧‧Fixed board

1363‧‧‧Slide rail set

1364‧‧‧support frame

1365‧‧‧Press cylinder

1366‧‧‧First limit piece

14‧‧‧ Inquiry agency

141‧‧‧Patch

143‧‧‧Body

145‧‧‧Actuator

21‧‧‧machine

22‧‧‧Test machine

Claims (10)

An electronic component testing device includes: a testing mechanism: at least one mounting tool is provided, the mounting tool is provided with at least one first through hole, and a tester is assembled above the at least one first through hole; There is at least one carrying drive source, and at least one turntable driven and rotated by the carrying drive source, the turntable is provided with at least one first receiving part that receives electronic components and is located below the first through hole; Mechanism: At least one carrier is provided under the first through hole of the test mechanism, and the carrier is equipped with at least one telex, which is provided with at least one transmission member that electrically contacts the electronic component. The electronic component testing device according to item 1 of the patent application scope, wherein the testing mechanism is provided with the first through hole and the second through hole on the mounting device, and the turntable of the carrying mechanism is provided with the first A bearing component and a second bearing component. The electronic component testing device described in item 2 of the patent application scope further includes a detection mechanism, which is configured with at least one attaching seat with an exhaust component under the second receiving part of the turntable to extract The electronic component supported by the second receiving component is sucked. The electronic component testing device according to item 3 of the patent application scope, wherein the attachment base of the detection mechanism is mounted on the float for floating displacement. The electronic component testing device according to item 1 or 3 of the patent application scope, wherein the carrier of the teletype mechanism is fixed or mobile. The electronic component testing device according to item 5 of the patent application scope, wherein the teletype mechanism is provided with a teletype drive source to drive the carrier for displacement in the first direction. The electronic component testing device according to item 6 of the patent application scope, wherein the teletype mechanism is provided with at least one transposition unit to carry the carrier for horizontal displacement. The electronic component testing device according to item 7 of the patent application scope, wherein the transposition unit of the teletype mechanism is provided with a moving part supporting the teletype drive source, and a supporting frame is provided on the fixed plate, the The support frame is provided with at least one first limiter for limiting the movement of the moving part, and at least one second limiter for limiting the movement of the moving part. A test sorting machine using an electronic component testing device, comprising: a machine; a feeding device: it is arranged on the machine and is provided with at least one feeding holder for accommodating at least one electronic component to be tested; Receiving device: It is arranged on the machine and is equipped with at least one receiving receiver for accommodating at least one tested electronic component; at least one electronic component testing device according to item 1 of the scope of patent application : It is configured on the machine to perform test operations on electronic components; Conveying device: It is arranged on the machine and is equipped with at least one material transfer unit for transferring electronic components; Central control device: It is used to control And integrate actions of various devices to perform automated operations. The test sorting machine using an electronic component testing device as described in item 9 of the patent application scope, wherein the conveying device is provided with a first shifter for transferring electronic components between the feeding device and at least one feed carrier Material unit, a second material transfer unit is used to transfer electronic components between the material input stage, the first calibrator and the test device, and a third material transfer unit is provided between the test device, the second calibrator and at least Electronic components are transferred between a discharge carrier, and a fourth material transfer unit is used to transfer electronic components between the discharge carrier and the receiving device.

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