TWI758091B - Testing mechanism, connecting mechanism and handler using the same - Google Patents

Abstract

The present invention reveals a testing mechanism, including an electronic tester, a plier assembly, an abutting member, and a driving unit. The electronic tester has a base board. The plier assembly includes plural pliers which has a first end electrically connected to the base board and a second end formed with a plier gap, which is adapted for connection bumps of the electronic component to be received in. The abutting member is disposed around the pliers. The driving unit has at least a driver. The driver drives the plier assembly or the driving unit to move. Therefore, the connecting mechanism can bring the RF electronic component to move and to press downwardly on connection pins of a tester without obstructing the radio signal of the RF electronic component.

Description

Test facilities, joint mechanisms and test equipment for their applications

The invention provides a test mechanism, a joint mechanism and a test equipment related to the electrical testing operation of electronic components and the wireless signal testing operation.

At present, a radio frequency electronic component with built-in antenna is widely used in the fields of mobile communication area wireless network system and wireless communication area network system. Antennas are installed on the surface. Before the radio frequency electronic components leave the factory, in addition to performing electrical testing operations, they also need to perform wireless signal testing operations to ensure quality.

The test device is equipped with an electrical tester with a probe on the machine, and an antenna tester is arranged above the electrical tester; the radio frequency electronic components are placed in the electrical tester, and the radio frequency electronic components are electrically contacted with the contacts. The probe of the tester is used to perform the electrical test operation, and the antenna is directed toward the antenna tester to send out wireless signals, and the antenna tester receives the wireless signal to perform the wireless signal test operation.

However, the contacts of the radio frequency electronic components are easily misplaced with the probes of the electrical tester, so that the contacts cannot be used as effective electrical contact probes, thereby affecting the test yield of the radio frequency electronic components. Furthermore , Some electrical testers have springs in their probes. The self-weight pressure of the radio frequency electronic components is not enough to make the contacts and probes make effective electrical contact, thus affecting the electrical test accuracy of the radio frequency electronic components. However, if the crimper is used to press down the top surface of the electronic component from top to bottom, although the contacts of the RF electronic component can indeed contact the probe of the electrical tester, it will cause the crimper to shield the antenna of the electronic component, so that Affects the accuracy of wireless signal testing of RF electronic components.

The first objective of the present invention is to provide a testing mechanism including an electrical tester and a fixture set , Pusher and drive unit, the electrical tester is provided with a circuit board, the first end of the plurality of jaws of the fixture group is electrically connected to the circuit board, and the second end surrounds a clamping opening for accommodating the connection of electronic components point, the pusher is provided with at least one pushing portion for pushing the clamp group to clamp, and the driving unit is provided with at least one driver for driving the clamp group or the pusher to displace, so that the pusher pushes the clamp The group clamps and electrically connects the contacts of the electronic components to perform the electrical test operation, thereby improving the test quality.

The second object of the present invention is to provide a testing mechanism, wherein the fixture set is located under an electronic component that is a radio frequency electronic component, so as to clamp and electrically connect the contacts of the electronic component, which can prevent the antenna on the top surface of the radio frequency electronic component from being shielded, thereby preventing the radio frequency electronic component from being shielded. Utilize antennas and antenna testers to perform wireless signal testing operations, thereby improving test quality.

The third object of the present invention is to provide a joint mechanism, which is assembled above an electrical tester with probes. The joint mechanism includes a support plate, a clamp set, a pusher and a driving unit. The support plate is used for the insertion of the electrical tester. For the probe, a plurality of clamping claws of the clamp group are arranged on the peripheral side of the probe, and the first end is fixed on the support plate, and the second end surrounds the clamping opening for accommodating the contacts of the electronic components, and the pusher is provided with At least one pushing portion is used to push the clamp group for clamping action, and the driving unit is provided with at least one driver for driving the clamp group to move along the crimping axis, and the pusher is used to push the clamp group to clamp the electronic components. The clamp set drives the electronic components to move along the crimping axis, so that the contacts of the electronic components are crimped to the probes of the electrical tester to perform electrical testing operations, thereby improving the test quality.

The fourth object of the present invention is to provide a joint mechanism, wherein the clamp set is located below an electronic component that is a radio frequency electronic component, so as to clamp and drive the electronic component to be electrically connected to an electrical tester, which can prevent shielding of the antenna on the top surface of the radio frequency electronic component, In order to facilitate the wireless signal test operation of the antenna and the antenna tester, the test quality can be improved.

The fifth object of the present invention is to provide a testing equipment, including a machine, a feeding device, a receiving device, a testing device with the testing mechanism of the present invention, a conveying device, and a central control device; the feeding device is arranged on the machine, and is provided with There is at least one feeding holder for accommodating the electronic components to be tested; the receiving device is arranged on the machine table, and there is at least one receiving and holding device for accommodating the tested electronic components; the testing device is arranged on the machine table, including At least one testing mechanism of the present invention is used for testing electronic components; the conveying device is arranged on the machine table, and is provided with at least one conveyor for conveying electronic components; the central control device is used to control and integrate the actions of each device to perform automatic operations .

The sixth object of the present invention is to provide a testing equipment, including a machine, a feeding device, a receiving device, a testing device with the joint mechanism of the present invention, a conveying device and a central control device; the feeding device is arranged on the machine, and is provided with There is at least one feeding holder for accommodating the electronic components to be tested; the receiving device is arranged on the machine table, and there is at least one receiving and holding device for accommodating the tested electronic components; the testing device is arranged on the machine table, including The electrical tester and the joint mechanism of the present invention are used for testing electronic components; the conveying device is arranged on the machine table, and is provided with at least one conveyor for conveying the electronic components; the central control device is used to control and integrate the operation of each device, and Execute automated jobs.

In order to make your examiners further understand the present invention, hereby give a preferred embodiment and cooperate with the drawings, the details are as follows:

Please refer to FIGS. 1 and 2 , the first embodiment of the testing mechanism of the present invention includes an electrical tester , At least one clamp group, at least one pusher and drive unit.

The electrical tester is provided with a circuit board 11. Further, the circuit board 11 itself may have a test program, or the circuit board 11 may be electrically connected to a test machine or a test computer with a test program; in this embodiment , the circuit board 11 is electrically connected to a test computer with a test program through a circuit.

At least one clamp group includes a plurality of clamping jaws 12, the first ends of the plurality of clamping jaws 12 are electrically connected to the circuit board 11, and the second ends of the plurality of clamping jaws 12 are free ends and form a clamping opening for accommodating Contacts of electronic components (not shown in the figure); in this embodiment, the plurality of jaws 12 of the clamp set are made of conductive materials , and has elasticity; further, the first ends of the plurality of clamping jaws 12 can be fixed to the circuit board 11 of the electrical tester, or the first ends of the plurality of clamping jaws 12 can be fixed to a support plate, and the circuit Electrically connected to the circuit board 11 of the electrical tester; in this embodiment, a plurality of clamping jaws 12 are arranged upright in the Z direction, and a clamping jaw 12 is taken as an example , its first end 121 is fixed on the circuit board 11 of the electrical tester, the gripper 12 replaces the probe of the electrical tester, and the second end 122 of the gripper 12 is a free end and is in a concave arc shape to increase the The contact area between the second end 122 and the contact can further ensure effective electrical connection; of course, the second end 122 of the clamping jaws 12 can be designed in different shapes according to operational requirements; the second ends 122 of the plurality of clamping jaws 12 A clamping opening 123 is formed around it. Before the clamping jaws 12 are actuated, the diameter of the clamping opening 123 is larger than the outer diameter of the contacts for accommodating contacts of electronic components.

At least one pusher 13 is provided with at least one push portion for the clamping action of the push clamp group. Further, the pusher 13 is arranged on the peripheral side of the clamp group, and is provided with at least one pusher toward the clamp group. department , for example, a pusher 13 may be provided with a pusher part that is placed on the peripheral side of the clamp group. For example, a pusher 13 is provided with pushers at positions corresponding to a plurality of clamping jaws 12; in this embodiment For example, the pusher 13 is disposed at an appropriate position above the circuit board 11 , the pusher 13 defines a first through hole 131 , and the inner surface of the first through hole 131 is provided with a pusher portion 132 that is outwardly inclined from bottom to top , the first through hole 131 of the pusher 13 is used for inserting the plurality of clamping jaws 12 of the clamp set, so that the pushing portion 132 is placed on the outer peripheral side of the plurality of clamping jaws 12 for guiding and pushing the plurality of clamping jaws 12 Swing in for gripping action.

In view of the above, the testing mechanism can be equipped with the same number of pushers 13 on the peripheral sides of the plurality of grippers 12 of the gripper group, and the plurality of pushers 13 push the corresponding grippers 12 respectively for clamping action. Not possible.

The driving unit is provided with at least one driver for driving the fixture group or the pusher 13 to displace, and the pusher 13 is used to push the fixture group to clamp and electrically connect the contacts of the electronic components to perform electrical testing operations. For example, the driving unit drives the clamp group to move downward along the first pushing axis A (such as the Z direction) with the driver, so that the clamp group is guided by the pusher 13 to clamp and electrically contact the contacts of the electronic components; For example, the drive unit drives the pusher 13 to displace upward along the first push axis A (eg, the Z direction) by a driver, so as to guide the clamp set to clamp and electrically contact the contacts of the electronic components.

In view of the above, when the plurality of pushers 13 are correspondingly arranged on the sides of the plurality of clamping jaws 12, the driving unit drives the plurality of pushers 13 to move along the second pusher axis (such as the X direction) with the plurality of drivers respectively. Lateral displacement, the plurality of pushers 13 use the push portion 132 to push the plurality of clamping jaws 12 to clamp and electrically contact the contacts of the electronic components.

As mentioned above, the driver can be a linear motor, a cylinder, or a motor and a transmission set. Since the clamp assembly is assembled on the circuit board 11 , the above-mentioned driver drives the clamp jaw assembly to displace, and the driver drives the circuit board 11 to displace synchronously. The driver of the driving unit can be arranged under, above or on the side of the circuit board 11 carrying the fixture set according to the operational requirements, and only needs to drive the circuit board 11 carrying the fixture set to act.

In this embodiment, the driver of the driving unit is the first driver, the first driver is the first pressure cylinder 14, the first pressure cylinder 14 is disposed under the circuit board 11 along the first thrust axis A, and is connected by a piston rod. A support plate 141 supports the circuit board 11 , so that the first pressure cylinder 14 supports the circuit board 11 and the clamp group through the support plate 141 to be displaced along the first thrust axis A (eg, the Z direction). Of course, the piston rod of the first pressure cylinder 14 can also be directly connected to drive the circuit board 11 .

Please refer to FIGS. 3 , 4 , and 5 . Taking the test of an electronic component that is an RF electronic component 20 as an example, the RF electronic component 20 has a plurality of contacts 21 on the bottom surface and an antenna 22 on the top surface. The testing device 10 is equipped with The testing mechanism of the present invention and the antenna tester, the testing mechanism of the present invention is assembled on the machine table 30 The antenna tester 15 is arranged above the testing mechanism for performing the wireless signal test operation on the radio frequency electronic element 20 .

The testing mechanism supports the bottom surface of the RF electronic component 20 with the second ends 122 of the plurality of jaws 12, so that the contacts 21 of the RF electronic component 20 are located at the jaws 123 of the plurality of jaws 12 of the fixture set. The pressure cylinder 14 has not yet driven the circuit board 11 and the plurality of clamping jaws 12 to act, and the second ends 122 of the plurality of clamping jaws 12 are not in contact with the contact 21 of the radio frequency electronic component 20; when the first pressure cylinder 14 uses the support plate 14 to carry the circuit When the plate 11 and the plurality of clamping jaws 12 are displaced downward along the first thrusting axis A (such as the Z direction), the plurality of clamping jaws 12 are pushed and guided by the pushing portion 132 of the pushing member 13 to elastically swing inward. , so as to reduce the jaws 123 and make the second ends 122 of the plurality of jaws 12 clamp and electrically contact the contacts 21 of the radio frequency electronic component 20. Since the second ends 122 of the plurality of jaws 12 are clamped and covered on the The surface of the contacts 21 of the radio frequency electronic component 20 can increase the contact area between the clamping jaws 12 and the contacts 21 for more effective electrical contact. The first ends 121 of the plurality of clamping jaws 12 are electrically connected to the circuit board 11, and the circuit The board 11 can perform electrical testing operations on the radio frequency electronic component 20 through the plurality of clamping jaws 12 ; however, the circuit board 11 and the plurality of clamping jaws 12 are disposed under the radio frequency electronic component 20 to prevent shielding of the top surface of the radio frequency electronic component 20 . The antenna 22 is used to facilitate the wireless signal test operation performed by the antenna 22 on the top surface of the radio frequency electronic component 20 and the antenna tester 15, thereby improving the test quality.

Please refer to FIGS. 2 and 6 , the second embodiment of the testing mechanism of the present invention, the same as the first embodiment includes an electrical tester, a clamp set, a pushing tool 13 and a driving unit; the second embodiment is the same as the first embodiment. The difference is that the driver of the drive unit drives the pusher 13 to displace along the first pusher axis A. In this embodiment, the driver of the drive unit is the second driver, the second driver is the second cylinder 16 , the second cylinder The piston rod of 16 is connected to the pusher 13 to drive the pusher 13 to move along the first pusher axis A (such as the Z direction). By swinging inward, the second ends 122 of the plurality of clamping jaws 12 clamp the contacts electrically contacting the RF electronic components, and the circuit board 11 can perform electrical testing operations on the RF electronic components through the plurality of clamping jaws 12 .

Please refer to FIGS. 7 and 8 , the first embodiment of the joint mechanism of the present invention is assembled above the electrical tester, and includes a support plate 41 , at least one clamp set, at least one pusher 43 and a driving unit; electrical test The device is provided with an electrically connected circuit board 51 and a test seat 52, and the test seat 52 is provided with a probe 53 for performing testing operations on electronic components.

The support plate 41 is disposed above the electrical tester, and is used for passing the probes of the electrical tester; further, the support plate 41 can be fixed or movable. For example, the support plate 41 is fixed on the machine table 30 For example, the support plate 41 is driven by the driving unit to move along the crimping axis B (eg, the Z direction); in this embodiment, the support plate 41 is provided with a second through hole 411 at the position corresponding to the probe 53 for insertion Probe 53.

At least one clamp set is disposed on the support plate 41 and is located on the peripheral side of the probe 53, the clamp set includes a plurality of clamping jaws 42, the first ends 421 of the plurality of clamping jaws 42 are fixed on the supporting plate 41, and the second ends 422 A clamping opening 423 is formed around it for accommodating the contacts of electronic components (not shown in the figure). In this embodiment, the plurality of clamping jaws 42 of the clamp group are arranged upright in the Z direction and have elasticity. The first end 421 is fixed on the peripheral side of the second through hole 411 of the support plate 41, and the second end 422 is a free end and is in the shape of a concave arc, so as to increase the contact area between the second end 422 and the contact; The second ends 422 of the claws 42 can be designed in different shapes according to operational requirements; the second ends 422 of the plurality of clamping claws 42 form a clamping opening 423 for inserting the probe 53. Before the plurality of clamping claws 42 are not actuated, The diameter of the clamping opening 423 is larger than the outer diameter of the contact for accommodating the contact of the electronic component.

At least one pusher 43 is provided with at least one push portion for the clamping action of the push clamp group. Further, the pusher 43 is arranged on the peripheral side of the clamp group, and is provided with at least one pusher toward the clamp group. department , for example, a pusher 43 can be provided with a pusher part that is placed on the peripheral side of the clamp group. For example, a pusher 43 is provided with pushers at positions corresponding to a plurality of clamping jaws 42; in this embodiment For example, the pusher 43 is disposed at a proper position above the support plate 41 , the pusher 43 defines a first through hole 431 , and the inner surface of the first through hole 431 is provided with a pusher portion 432 that is inclined outward from bottom to top , the first through hole 431 of the pusher 43 is used for inserting the plurality of clamping jaws 42 of the clamp set, so that the pushing portion 432 is placed on the outer peripheral side of the plurality of clamping jaws 42 for guiding and pushing the plurality of clamping jaws 42 swings in for gripping action.

In view of the above, the engagement mechanism can be provided with the same number of pushers 43 on the peripheral sides of the plurality of grippers 42 of the gripper group, and the plurality of pushers 43 push the corresponding grippers 42 respectively for clamping action, and there is no Not possible.

The driving unit is provided with at least one driver for driving the clamp group to displace along the crimping axis B , Use the pusher 43 to push the clamp set to clamp the contacts of the electronic components, and use the clamp set to drive the electronic components to move along the crimping axis B (such as the Z direction), so that the contacts of the electronic components are indeed crimped for electrical testing. The probe 53 of the device performs an electrical test operation. Still further, the drive may be a linear motor, a cylinder, or a motor and transmission assembly.

As mentioned above, the driving unit is provided with at least another driver for driving the pusher 43 to displace , and use the pusher 43 to push the clamp set to clamp the contacts of the electronic components. For example, the driving unit uses another driver to drive the pusher 43 to move upward along the crimping axis B (such as the Z direction), and uses the pusher 43 to push the clamp set to clamp the contacts of the electronic components; for example, the drive unit uses another driver The pusher 43 is driven to move laterally along the second push axis (eg, the X direction) to push the clamp set to clamp the contacts of the electronic components.

In this embodiment, the driver of the driving unit is a third driver, the third driver is a third pressure cylinder 44, the third pressure cylinder 44 is arranged along the crimping axis B, and is located below the pusher 43, the third pressure cylinder 44 The piston rod of 44 is connected to the support plate 41, and the support plate 41 is assembled with a clamp group, so that the third pressure cylinder 44 is displaced along the crimping axis B (eg, Z direction) through the support plate 41 to carry the clamp group.

Please refer to FIGS. 9 , 10 , and 11 . Taking the test of an electronic component that is an RF electronic component 20 as an example, the RF electronic component 20 has a plurality of contacts 21 on the bottom surface and an antenna 22 on the top surface. The testing device 10 is equipped with The electrical tester, the joint mechanism of the present invention, and the antenna tester, the electrical tester is used to hold the radio frequency electronic components 20 and perform electrical test operations on the radio frequency electronic components 20; the antenna tester 54 is arranged on the electrical tester and Above the joint mechanism is used for performing wireless signal testing operations on the radio frequency electronic components 20 .

The electrical tester uses a plurality of probes 53 to support the RF electronic component 20 , the plurality of jaws 42 of the joint mechanism are located below the RF electronic component 20 , and the contacts 21 of the RF electronic component 20 are placed in the plurality of jaws 42 Since the third pressure cylinder 44 has not yet driven the support plate 41 and the plurality of clamping jaws 42 to act, the second ends 422 of the plurality of clamping jaws 42 are not in contact with the contacts 21 of the radio frequency electronic component 20; When the cylinder 44 drives the support plate 41 and the plurality of clamping jaws 42 to move downward from the initial position to the clamping position along the crimping axis B (such as the Z direction), the plurality of clamping jaws 42 are pushed against the pushing portion 432 of the tool 43 The abutting guide swings elastically inward to reduce the clamping opening 423, so that the second ends 422 of the plurality of clamping jaws 42 clamp the contact point 21 of the RF electronic component 20; when the third pressing cylinder 44 continues to drive the support plate 41 and When the plurality of clamping jaws 42 are displaced downward from the clamping position along the crimping axis B to the crimping position, the plurality of clamping jaws 42 pull down the radio frequency electronic component 20 and move downward along the crimping axis B, so that the radio frequency electronic component is displaced downward along the crimping axis B. The contact point 21 of the 20 presses the probe 53 of the test seat 52 with a predetermined pressing force to perform the electrical test operation; however, the plurality of clamping jaws 42 of the joint mechanism are arranged under the radio frequency electronic element 20 to prevent the radio frequency electronic element from being shielded. The antenna 22 on the top surface of the 20 is convenient for the antenna 22 on the top surface of the radio frequency electronic component 20 and the antenna tester 54 to perform wireless signal testing operations, thereby improving the test quality.

Please refer to FIGS. 8 and 12 , the second embodiment of the joint mechanism of the present invention, which is the same as the first embodiment includes a support plate 41 , a clamp set, a pusher 43 and a driving unit; the difference between the second embodiment and the first embodiment The driving unit is provided with another driver, and the other driver is a fourth driver to drive the pusher 43 to move along the crimping axis B or the second pusher axis (such as the X direction); in this embodiment, the drive unit The fourth driver is the fourth pressure cylinder 45. The piston rod of the fourth pressure cylinder 45 is connected to the pusher 43 to drive the pusher 43 to move upward along the crimping axis B (such as the Z direction). The pushing portion 432 pushes against and guides the plurality of clamping jaws 42 to elastically swing inwardly, so that the second ends 422 of the plurality of clamping jaws 42 clamp the contacts of the radio frequency electronic components, and the driving unit drives the support plate 41 with the third pressure cylinder 44 The plurality of clamping jaws 42 pull down the radio frequency electronic component and move downward along the crimping axis B, so that the contact of the radio frequency electronic component presses the probe 53 of the test seat 52 with a predetermined pressing force to perform the electrical test operation.

Please refer to FIGS. 7-11 and 13 , which are schematic diagrams of the application of the joint mechanism of the present invention to testing equipment. In this embodiment, the testing equipment is used to test RF electronic components; the testing equipment includes a machine 30 , a feeding device 60 , a receiving device 70 , The testing device 10, the conveying device 80 and the central control device (not shown in the figure) are provided with the joint mechanism of the present invention; the feeding device 60 is arranged on the machine table 30, and is provided with at least one accommodating electronic component (such as a radio frequency electronic component) to be tested ) of the feeding holder 61; the receiving device 70 is arranged on the machine 30, and is provided with at least one receiving holder 71 for accommodating the tested electronic components; the testing device 10 is arranged on the machine 30, including electrical Electrical tester and joint mechanism of the present invention, electrical tester for performing electrical testing on electronic components , the joint mechanism of the present invention is used for driving the electronic components to crimp the electrical tester; in this embodiment, the first side and the second side of the machine 30 are respectively equipped with a test device 10, and the test device 10 further includes an antenna tester for The wireless signal test operation is performed on the radio frequency electronic components; the conveying device 80 is arranged on the machine table 30 and is provided with at least one conveyor for conveying the electronic components. A conveyor 81, the first conveyor 81 takes out the RF electronic components to be tested from the feeding device 60, and moves them into the second conveyor 82, which is a carrier, and a third conveyor 83 is connected to the second conveyor 82 and the test The RF electronic components to be tested and the tested RF electronic components are picked and placed between the devices 10, the first conveyor 81 takes out the tested RF electronic components from the second conveyor 82, and the tested RF electronic components are moved according to the test results. Loaded to the receiving device 70 for sorting and storage; the central control device is used to control and integrate the actions of each device to perform automatic operations and achieve the practical benefit of improving operation efficiency.

Of course, the test device of the above-mentioned test equipment can replace the joint mechanism with the test mechanism of the present invention. Another test equipment of the present invention (not shown in the figure) includes a machine, a feeding device, a receiving device, and a test mechanism of the present invention. testing device, conveying device and central control device; the feeding device is arranged on the machine table, and is provided with at least one feeding holder for accommodating the electronic components to be tested; the receiving device is arranged on the machine table, and is provided with at least one A receiving device for accommodating the tested electronic components; the testing device is arranged on the machine table, including the testing mechanism of the present invention, for testing the electronic components; the conveying device is arranged on the machine table, and is provided with at least one conveyor to Conveying electronic components; central control device for controlling and integrating the actions of various devices to perform automated operations.

10: Test device 11: circuit board 12: Gripper 121: First End 122: Second End 123: Clip 13: Pusher 131: first through hole 132: Pushing Department 14: The first cylinder 141: pallet 15: Antenna Tester 16: The second cylinder 20: RF Electronic Components 21: Contact 22: Antenna 30: Machine 41: Bearing plate 411: second through hole 42: Gripper 421: First End 422: Second End 423: Clip 43: Pusher 431: first through hole 432: Pushing Department 44: The third cylinder 45: Fourth cylinder 51: circuit board 52: Test seat 53: Probe 54: Antenna Tester A: The first push against the axial direction B: Crimp Axial 60: Feeding device 61: Feed holder 70: Receiving device 71: Receiving holder 80: Conveying device 81: First Conveyor 82: Second conveyor 83: Third Conveyor

FIG. 1 is a schematic diagram of the first embodiment of the testing mechanism of the present invention. FIG. 2 is a partial enlarged schematic view of FIG. 1 . FIG. 3 is a schematic diagram of the use of the first embodiment of the testing mechanism of the present invention. Figure 4: It is a schematic diagram (1) of the partial action of Figure 3 . Figure 5: It is a schematic diagram (2) of the partial action of Figure 3 . FIG. 6 is a schematic diagram of the second embodiment of the testing mechanism of the present invention. FIG. 7 is a schematic diagram of the first embodiment of the joint mechanism of the present invention. FIG. 8 is a partially enlarged schematic view of FIG. 7 . FIG. 9 is a schematic diagram of the use of the first embodiment of the joint mechanism of the present invention. Fig. 10 is a schematic diagram (1) of the partial action of Fig. 9 . Fig. 11: It is a schematic diagram (2) of the partial action of Fig. 9 . FIG. 12 is a schematic diagram of the second embodiment of the joint mechanism of the present invention. Fig. 13: A schematic diagram of the application of the joint mechanism of the present invention to a testing device.

10: Test device

20: RF Electronic Components

21: Contact

22: Antenna

44: The third cylinder

54: Antenna Tester

Claims (7)

A joint mechanism, which is assembled above an electrical tester with probes, comprising: a carrier plate: for penetrating the probe of the electrical tester; at least one clamp group: arranged on the carrier plate and located in the On the peripheral side of the probe, the clamp group includes a plurality of clamping jaws, the first ends of the plurality of clamping jaws are fixed on the support plate, and the second end surrounds a clamping opening, and the clamping opening is used for accommodating electronic components. Contact; at least one pusher: there is at least one push portion for pushing the clamp set for clamping action; drive unit: at least one driver is provided for driving the support plate and the clamp set to be crimped along the edge Axial displacement, so that the pusher pushes the clamp set to clamp the contact of the electronic component, and the clamp set drives the electronic component to move along the crimping axial direction to crimp the contact of the electrical tester. probe. The engaging mechanism according to claim 1, wherein the pushing device defines at least one first through hole, the pushing portion is provided on the inner surface of the first through hole, and the plurality of clamping claws are passed through, and the pushing portion is provided on the inner surface of the first through hole. The pushing portion is used for guiding the clamping action of the plurality of clamping jaws. The joint mechanism according to claim 1, wherein the support plate is provided with a second through hole for penetrating the probe and the plurality of clamping jaws. The joint mechanism according to claim 1, wherein at least one driver of the driving unit is a third driver, and the third driver is coupled to drive the support plate to displace along the crimping axis. The joint mechanism according to claim 4, wherein the driving unit is provided with at least another driver, and the other driver is a fourth driver, so as to drive the pusher to displace along the crimping axis or the second pusher axis . A test equipment, comprising: a machine; a feeding device: disposed on the machine, and provided with at least one feeding holder for accommodating electronic components to be tested; a receiving device: disposed on the machine, and set There is at least one receiver for accommodating the tested electronic components; testing device: arranged on the machine table, and provided with an electrical tester and at least one of the joint mechanisms described in claim 1, the electrical tester For performing electrical testing operations on electronic components, the joint mechanism is used for clamping and driving the electronic components to crimp the electrical testing device; conveying device: arranged on the machine table, and is provided with at least one conveyor for To convey electronic components; central control device: to control and integrate the actions of various devices to perform automated operations. The test equipment according to claim 6, wherein the test device further comprises an antenna tester, and the antenna tester is used for performing wireless signal test operations on electronic components.

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