CN111044839B - Electronic component testing apparatus - Google Patents
Electronic component testing apparatus Download PDFInfo
- Publication number
- CN111044839B CN111044839B CN201811183868.4A CN201811183868A CN111044839B CN 111044839 B CN111044839 B CN 111044839B CN 201811183868 A CN201811183868 A CN 201811183868A CN 111044839 B CN111044839 B CN 111044839B
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- calibration
- test
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- feeding
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
Abstract
The invention provides an electronic element test device, which comprises a feeding device, a test device and a conveying device, wherein the conveying device takes out at least one electronic element with a first surface first contact and a second surface second contact from the feeding device and moves into a test bearing device of the test device so as to enable the first contact of the electronic element to be electrically contacted with a first transmission piece of a first tester, the test device drives a second tester with a second transmission piece to move by a driving mechanism so as to enable the second transmission piece of the second tester to be electrically contacted with a second contact of the electronic element, and the first tester and the second tester are utilized to execute a plurality of preset test operations on the electronic element on the test bearing device, so that the electronic element is automatically tested, the action time sequence of transferring the electronic element is reduced, and the practical benefits of improving the test quality and the production efficiency are achieved.
Description
Technical Field
The invention relates to an electronic component testing device for automatically testing a first contact and a second contact on double surfaces so as to improve the testing quality and the production efficiency.
Background
Nowadays, electronic components (such as expansion function cards) are increasingly demanding on multi-functional applications and high storage capacity, and are configured with a plurality of memories and circuits, and are provided with a plug-in part (i.e. a gold finger) at one end for being plugged into a circuit board of another application, the plug-in part of the electronic component can utilize a first contact of a first surface to transmit power and a second contact of a second surface to transmit signals according to preset functions; since the electronic device is subjected to a plurality of processes, such as a cutting process or a wire bonding process, in order to ensure the delivery quality of the electronic device, the electronic device is tested after the electronic device is manufactured, and defective products are eliminated; referring to fig. 1, taking the expansion function card 11 as an example, it is a long board for assembling plural memories, and is provided with a plugging portion 111 at one end, a first surface of the plugging portion 111 is provided with plural first contacts 1111 for transmitting power, and a second surface is provided with plural second contacts 1112 for transmitting signals; therefore, the manufacturer will put the expansion function card 11 into a power supply testing device by manual operation, and use the first contact 1111 of the expansion function card 11 to contact with the probe of the power supply testing device to execute the power supply testing operation, after completing the test, take out the expansion function card 11 to turn over, and transport it to a signal testing device, and use the second contact 1112 of the expansion function card 11 to contact with the probe of the signal testing device to execute the signal testing operation; however, the manufacturer must manually perform the power testing operation on the various expansion function cards 11 one by one in the power testing device, and after the testing operation is completed, the manufacturer must manually replace the various expansion function cards 11 in one signal testing device one by one to perform the signal testing operation, which not only is the loading and unloading operation slow and time consuming, but also must replace the expansion function cards 11 in different testing devices to perform the testing operation, so that the production efficiency cannot be improved.
Disclosure of Invention
The invention aims to: an electronic component testing apparatus is provided to solve the above technical problems in the prior art.
In order to achieve the purpose, the invention adopts the technical scheme that:
an electronic component testing apparatus, comprising:
a machine platform;
a feeding device: the feeding and bearing device is assembled on the machine table and is provided with at least one material feeding and bearing device for bearing an electronic element, the electronic element is provided with a first contact on a first surface and a second contact on a second surface;
the testing device comprises: the test device is provided with at least one transfer driver and a transfer carrier driven by the transfer driver to move or swing in at least one direction, and the second tester is assembled on the transfer carrier of the test driving mechanism and provided with at least one second transmission piece for electrically contacting a second contact point of the electronic element;
a conveying device: the material moving device is assembled on the machine table and is provided with at least one material moving device for moving the electronic element;
the central control device: used for controlling and integrating the actions of each device to execute the automatic operation.
The electronic component testing device is characterized in that the feeding device is provided with a first feeding bearing device, a second feeding bearing device and a pusher, the first feeding bearing device bears at least one feeding disc with an electronic component to be tested, and the pusher is used for moving and carrying the feeding disc between the first feeding bearing device and the second feeding bearing device.
The electronic component testing device is characterized in that the testing bearing device of the testing device is provided with a testing bearing seat with a testing bearing groove, and the testing bearing groove is used for bearing the electronic component.
The electronic component testing device is characterized in that the first tester of the testing device is assembled in the testing bearing groove of the testing bearing seat.
The electronic component testing equipment is characterized in that the testing driving mechanism is provided with a first transfer driver on a base, the first transfer driver drives at least one second transfer driver to move in a third direction, the second transfer driver drives the transfer tool to move in a second direction, and the transfer tool is used for assembling the second tester.
The electronic component testing apparatus is characterized in that the first transfer driver of the testing driving mechanism is connected with a movable frame, and the movable frame is provided with the second transfer driver.
The electronic component testing device is characterized in that at least one slide rail set configured in a third direction is arranged between the base and the movable frame.
The electronic element test equipment is characterized by comprising at least one correction device, wherein the correction device is assembled on the machine table and is provided with at least one correction bearing device for bearing the electronic element, and at least one correction driving mechanism drives at least one correction tool to move so as to push and correct the electronic element on the correction bearing device.
The electronic component testing equipment is characterized in that the correcting and bearing device is provided with a correcting bearing seat with at least one correcting bearing groove, the correcting bearing groove is used for bearing the electronic component, the correcting and driving mechanism is provided with at least one correcting driver and a transmission device driven by the correcting driver to move in at least one direction, and the transmission device is used for assembling the correcting device.
The electronic component testing equipment is characterized by further comprising at least one material receiving device, wherein the material receiving device is assembled on the machine table and is provided with at least one material receiving and bearing device for bearing the tested electronic component.
The invention has the advantages that the invention provides an electronic element test device, which comprises a feeding device, a test device and a conveying device, wherein the conveying device takes out at least one electronic element with a first surface first contact and a second surface second contact from the feeding device and moves into a test bearing device of the test device so as to enable the first contact of the electronic element to be electrically contacted with a first transmission piece of a first tester, the test device drives a second tester with a second transmission piece to move by a driving mechanism, so that the second transmission piece of the second tester is electrically contacted with the second contact of the electronic element, and the first tester and the second tester are utilized to execute a plurality of preset test operations on the electronic element on the test bearing device, so as to automatically test the electronic element and reduce the action time sequence of transferring the electronic element, thereby achieving the practical benefits of improving the test quality and the production efficiency.
Drawings
Fig. 1 is a schematic diagram of a conventional expansion function card.
Fig. 2 is a schematic view of the electronic component testing apparatus of the present invention.
FIG. 3 is a schematic diagram (one) of the testing apparatus of the present invention.
FIG. 4 is a schematic view of the testing apparatus of the present invention (II).
FIG. 5 is a schematic view of the calibration device of the present invention.
FIG. 6 is a schematic diagram (I) of the electronic device testing apparatus according to the present invention.
Fig. 7 is a schematic view (two) of the electronic component test apparatus of the present invention.
Fig. 8 is a schematic view (iii) of the electronic component test apparatus of the present invention in use.
Fig. 9 is a schematic view (iv) of the use of the electronic component test apparatus of the present invention.
Fig. 10 is a schematic diagram (five) of the use of the electronic component test apparatus of the present invention.
Fig. 11 is a schematic diagram (six) showing the use of the electronic component testing apparatus of the present invention.
Description of reference numerals: [ Prior Art ] expansion function card 11; a plug-in part 111; a first contact 1111; a second contact 1112; [ invention ] a machine table 20; a supply device 30; a first feed receiver 31; a second feed receiver 32; a pusher jack 33; a material receiving device 40; a material receiving and holding device 41; a testing device 50; a test bearer 51; a test socket 511; a test socket 512; a first tester 52; a first circuit board 521; a first test socket 522; a first transmission member 5221; the test drive mechanism 53; a base 531; a first pressure cylinder 532; a moving frame 533; a slide rail 5341; a slider 5342; a second pressure cylinder 535; a transfer vehicle 536; a second tester 54; a second circuit board 541; a second test socket 542; a second transfer piece 5421; a conveying device 60; a material moving driving mechanism 61; a material mover 62; a correcting device 70; a calibration receiver 71; a calibration socket 712; a calibration shoe 711; the correction drive mechanism 72; the third pressure cylinder 721; a transmission 722; a correcting tool 73; a feed tray 81; an expansion function card 82; a first contact 821; a second contact 822; the material receiving tray 83.
Detailed Description
To further understand the present invention, a preferred embodiment is shown in the drawings, and the following detailed description is given:
referring to fig. 2, fig. 3, fig. 4, and fig. 5, the electronic device testing apparatus of the present invention includes a machine 20, a feeding device 30, a receiving device 40, a testing device 50, a conveying device 60, and a central control device (not shown), and further includes at least one calibration device 70; the feeding device 30 is assembled on the machine 20, and has at least one feeding holder for holding at least one electronic component to be tested having a first surface and a second surface, and further, the feeding holder can directly hold the electronic component or a tray having the electronic component, the feeding holder can be a carrier plate or a belt conveying wheel set, or comprises a holding member and a supporting member, the feeding holder can simply hold the electronic component or can hold and move the electronic component in at least one direction, in this embodiment, the feeding device 30 has a first feeding holder 31, a second feeding holder 32 and a pusher 33, the first feeding holder 31 holds at least one feeding tray 81 having the electronic component to be tested, the electronic component to be tested is an extended function card 82, the first surface of one end of which is provided with a first contact, and the second surface of which is provided with a second contact, the pusher 33 is configured to move in a first direction (e.g. X direction) between the first material holder 31 and the second material holder 32 to push the material tray 81 of the first material holder 31 to the second material holder 32, the second material holder 32 holds a material tray 81 with an expansion card 82 to be tested for the material to be delivered by the delivery device 60, however, the configuration and operation of the first material holder 31 and the second material holder 32 are not limited in this embodiment, for example, the first material holder 31 can deliver the material tray 81 with at least one electronic component to be tested upward to a second position from the first position to a second direction (e.g. Z direction), the pusher 33 pushes the material tray 81 to a third position of the second material holder 32 from the second position, the second material holder 32 holds the material tray 81 with the electronic component to be tested for the material to be delivered, the second feeding holder 32 moves the empty feeding tray 81 downward in the Z direction from the third position to the fourth position; the material receiving device 40 is assembled on the machine 20, and has at least one receiving and placing device 41 for receiving the tested electronic components, further, the receiving and placing device 41 can directly receive the electronic components or receive the tray with the electronic components, the receiving and placing device 41 can be a carrier plate or a belt conveying wheel set, or comprises a receiving member and a supporting member, the receiving and placing device can simply receive the electronic components, or receive and move the electronic components in at least one direction, in this embodiment, the receiving and placing device 41 is configured with at least one empty receiving tray 83 for receiving at least one tested expansion function card 82; the testing device 50 is assembled on the machine 20, and comprises a testing holder 51, a first tester 52, a testing driving mechanism 53 and a second tester 54, wherein the testing holder 51 holds at least one electronic component, further, the testing holder 51 is configured in a fixed manner or moves in at least one direction, in this embodiment, the testing holder 51 is fixed on the machine 20 and is provided with a testing socket 511 having a plurality of testing sockets 512, each testing socket 512 is used for holding an expansion function card 82 to be tested, the first tester 52 is assembled on the testing holder 51 and is provided with at least one first transmission member for executing a first preset testing operation on the electronic component, the first preset testing operation can be a power testing operation or a signal testing operation, and the like, in this embodiment, the first tester 52 is provided with a first circuit board 521 and a plurality of first testing sockets 522 having first transmission members 5221 which are electrically connected, the plurality of first test sockets 522 are mounted in the plurality of test sockets 512 of the test socket 511, and the first transmission member 5221 is directed upward to electrically contact the first contact of the extended function card 82 to perform a first predetermined test operation, which is a power test operation, a test driving mechanism 53 is provided with at least one transfer driver and a transfer tool driven by the transfer driver to move or swing in at least one direction, further, the transfer driver can be a cylinder or a linear motor, or also includes a motor and a transmission set, or also an angle driving source for driving the transfer tool to swing, the test driving mechanism 53 can be provided with a transfer driver for driving the transfer tool to move or swing in the Z direction, or provided with a plurality of transfer drivers for respectively driving the transfer tool to move in the Z direction and to move in a third direction (e.g. the Y direction), in this embodiment, the test driving mechanism 53 is provided with a first transferring driver disposed in the Y direction as a first pressing cylinder 532 on a base 531, the first pressing cylinder 532 drives the second transferring driver to move in the Y direction, further, a first piston rod of the first pressing cylinder 532 is connected to drive a moving frame 533, the moving frame 533 is provided with the second transferring driver, and at least one sliding rail set disposed in the third direction is disposed between the moving frame 533 and the base 531, the sliding rails 5341 of the sliding rail set are disposed on the side surface of the base 531, the sliding base 5342 is disposed on the moving frame 533, so that the first pressing cylinder 532 drives the second transferring driver to move in the Y direction via the moving frame 533, and the moving frame 533 slides along the sliding rails 5341 on the base 531 to assist the smooth movement, the second transferring driver drives at least one transferring carrier to move in the second direction, in this embodiment, the second driver is disposed on the moving frame 533, and is a second cylinder 535 and is configured in the second direction, the second piston rod of the second cylinder 535 is connected to a transfer tool 536 configured in the X direction, so that the test driving mechanism 53 uses the first cylinder 532 and the second cylinder 535 to drive the transfer tool 536 to move in the Z-Y direction, the second tester 54 is mounted on the transfer unit 536 of the test driving mechanism 53 and is provided with at least one second transmission member for performing a second predetermined test operation on the electronic device, the second predetermined test operation may be a power test operation or a signal test operation, etc. in this embodiment, the second tester 54 is mounted on the bottom surface of the transfer tool 536 of the test driving mechanism 53, and is provided with a second circuit board 541 and a plurality of second test seats 542 with second transmission members 5421, which are electrically connected, and the second transmission members 5421 are directed downward, electrically contacting the second contact of the extended function card 82 to perform a second predetermined test operation, which is a signal test operation; the conveying device 60 is mounted on the machine 20 and is provided with at least one material mover for moving electronic components, further, the conveying device 60 may be provided with a material mover for moving electronic components between the feeding device 30, the testing device 50 and the material receiving device 40, or with a plurality of material movers, one of which moves the electronic components to be tested between the feeding device 30 and the testing device 50, and the other moves the tested electronic components between the testing device 50 and the material receiving device 40, in this embodiment, the conveying device 60 is provided with a material moving driving mechanism 61 for driving one of the material movers 62 to move in the X-Y-Z direction, so as to move the extended function cards 82 to be tested and the tested extended function cards 82 between the feeding device 30, the testing device 50 and the material receiving device 40; the calibration device 70 is assembled on the machine 20, and is provided with a calibration holder 71, a calibration driving mechanism 72 and a calibration tool 73, the calibration holder 71 holds at least one electronic component, the calibration driving mechanism 72 drives the calibration tool 73 to move in at least one direction, the calibration tool 73 pushes the calibration electronic component, further, the calibration holder 71 is provided with at least one calibration receiving slot for holding the electronic component and can be fixed on the machine 20 or move in at least one direction on the machine 20, the calibration driving mechanism 72 is provided with at least one calibration driver and a transmission tool driven by the calibration driver to move in at least one direction, and the transmission tool is provided with the calibration tool 73, the calibration driver can be a pressure cylinder or a linear motor, or comprises a motor and a transmission set, and at least one connecting member (not shown) can be arranged between the transmission tool and the calibration tool 73 to adjust the assembling position of the calibration tool 73, in this embodiment, the calibration holder 71 is provided with a calibration socket 711 having a plurality of calibration receiving slots 712, and the calibration receiving slots 712 are used to hold the expansion function cards 82 to be tested, the calibration driver of the calibration driving mechanism 72 is obliquely configured and is a third pressure cylinder 721, a piston rod of the third pressure cylinder 721 is connected to drive the transmission tool 722 to make oblique displacement, a plurality of calibration tools 73 are assembled on the transmission tool 722 and respectively located at a corner of the plurality of calibration receiving slots 712, the plurality of calibration tools 73 are driven by the transmission tool 722 to synchronously make oblique displacement, so as to push and calibrate the plurality of expansion function cards 82 in the plurality of calibration receiving slots 712; the central control device (not shown) is used to control and integrate the actions of each device to perform automation operation.
Referring to fig. 6, the first feeding holder 31 of the feeding device 30 holds a feeding tray 81 with an expansion card 82 to be tested, and the pusher 33 pushes the feeding tray 81 at the first feeding holder 31 to move in the X direction to the second feeding holder 32 for temporary placement, and the conveying device 60 drives the material mover 62 to move in the X-Z-Y direction by the material moving driving mechanism 61, so that the material mover 62 takes out a plurality of expansion cards 82 to be tested from the feeding tray 81 at the second feeding holder 32.
Referring to fig. 6 and 7, in order to make the material moving device 62 accurately move the expansion function card 82 to be tested into the testing device 50, the placement and calibration operation of the expansion function card 82 to be tested is executed, i.e. the conveying device 60 uses the material moving driving mechanism 61 to drive the material moving device 62 to move in the X-Z-Y direction, so as to move the plurality of expansion function cards 82 to be tested into the plurality of calibration bearing slots 712 of the calibration bearing 711 of the calibration device 70, and uses one corner of each calibration bearing slot 712 relative to the calibration tool 73 as a reference corner, the calibration device 70 uses the third pressure cylinder 721 via the transmission tool 722 to drive the plurality of calibration tools 73 to synchronously move in an oblique direction, so that the plurality of calibration tools 73 obliquely push the plurality of expansion function cards 82 to be tested to abut against the reference corner of the calibration bearing slots 712, thereby synchronously calibrating the placement positions of the plurality of expansion function cards 82 to be tested, so that the central position of the material moving device 62 of the conveying device 60 is aligned with the central position of the expansion function card 82 to be tested, so that the material moving device 62 can accurately pick up and move the extended function card 82 to be tested.
Referring to fig. 6, fig. 7 and fig. 8, after the calibration device 70 completes the calibration operation of the expansion function card 82 to be tested, the third pressure cylinder 721 of the calibration device 70 drives the plurality of calibration tools 73 to synchronously perform an oblique reverse displacement through the transmission tool 722, so that the plurality of calibration tools 73 are separated from the plurality of expansion function cards 82 to be tested; the conveying device 60 uses the material moving driving mechanism 61 to drive the material moving device 62 to move in the X-Z-Y direction in the plurality of calibration slots 712 of the calibration device 70 to take out the plurality of extended function cards 82 to be tested and move into the plurality of test slots 512 of the test socket 511 of the test device 50, because the first contact 821 of the extended function card 82 to be tested faces downward, the first contact 821 is electrically contacted with the first transmission member 5221 of the first test socket 522 of the first tester 52, so as to perform the power test operation.
Referring to fig. 8 and 9, the first press cylinder 532 of the testing apparatus 50 drives the moving rack 533 to move forward in the Y direction, the moving rack 533 drives the second press cylinder 535, the transfer tool 536 and the second tester 54 to move forward in the Y direction synchronously, so that the second tester 54 is located above the test socket 511, and relative to the plurality of extended function cards 82 to be tested, the second press cylinder 535 drives the transfer tool 536 to move downward in the Z direction, the transfer tool 536 drives the second tester 54 to move forward in the Z direction synchronously, because the second contact 822 of the extended function card 82 to be tested faces upward, the second transmission part 5421 of the second test socket 542 of the second tester 54 presses against and actually electrically contacts the second contact 822 of the extended function card 82 to be tested, so that the extended function card 54 performs signal testing operation on the extended function card 82 to be tested, and the testing apparatus 50 drives the second transmission part 5421 of the second tester 54 to press against and electrically contact the extended function card to be tested against the extended function card 82 to be tested by the transfer tool 536 82, the expansion function card 82 to be tested is pressed against the first transmission member 5221 of the first tester 52, so that the first transmission member 5221 of the first tester 52 is electrically contacted with the first contact 821 of the expansion function card 82 to be tested, and the first tester 52 executes the power test operation on the expansion function card 82 to be tested; therefore, the testing device 50 can press the first tester 52 by the moving carrier 536, the second tester 54 and the expansion function card 82 to be tested, and the expansion function card 82 can actually perform signal testing operation and power testing operation on the testing device 50 without adding a pressing jig and time-consuming replacement and transportation on different testing devices, thereby achieving the practical benefits of improving the production efficiency and saving the cost.
Referring to fig. 10 and 11, after the signal testing operation and the power testing operation of the extended function card 82 are completed, the second cylinder 535 of the testing device 50 drives the moving rack 536 and the second tester 54 to move upwards in the Z direction for resetting so as to separate from the tested extended function card 82, the first cylinder 532 drives the moving rack 533, the second cylinder 535, the moving rack 536 and the second tester 54 to move backwards in the Y direction for resetting so as to leave the upper side of the test socket 511, the conveying device 60 drives the material mover 62 to move in the X-Z-Y direction by the material mover driving mechanism 61 so as to take out a plurality of tested extended function cards 82 from the plurality of test sockets 512 of the testing device 50, and the test results are transferred to the material receiving tray 83 of the receiver 41 of the material receiving device 40 for receiving.
Claims (9)
1. An electronic component testing apparatus, comprising:
a machine platform;
a feeding device: the feeding and bearing device is assembled on the machine table and is provided with at least one material feeding and bearing device for bearing an electronic element, the electronic element is provided with a first contact on a first surface and a second contact on a second surface;
the testing device comprises: the test driving mechanism is provided with a first load-carrying driver on a base, the first load-carrying driver is used for driving at least one second load-carrying driver to move in a third direction, the second load-carrying driver is used for driving the second load-carrying driver to move in a second direction, and the second tester is assembled on a load-carrying tool of the test driving mechanism and is provided with at least one second transmission piece to electrically contact the second contact of the electronic element;
a conveying device: the material moving device is assembled on the machine table and is provided with at least one material moving device for moving the electronic element;
the central control device: used for controlling and integrating the actions of each device to execute the automatic operation.
2. The apparatus of claim 1, wherein the feeding device comprises a first feeding holder, a second feeding holder, and a pusher, the first feeding holder holding at least one feeding tray with the electronic components to be tested, the pusher moving the feeding tray between the first feeding holder and the second feeding holder.
3. The apparatus for testing electronic components of claim 1, wherein the test carrier of the testing device has a test socket with a test socket for receiving the electronic component.
4. The electronic component testing apparatus of claim 3, wherein the first tester of the testing device is mounted in the test socket of the test socket.
5. The apparatus of claim 1, wherein the first transfer driver of the test driving mechanism is connected to a moving rack, and the moving rack is configured to mount the second transfer driver.
6. The apparatus of claim 5, wherein at least one set of slide rails is disposed between the base and the movable frame in a third direction.
7. The apparatus of claim 1, further comprising at least one calibration device mounted on the platform and having at least one calibration holder for holding the electronic device, wherein the at least one calibration driving mechanism drives the at least one calibration tool to move and calibrate the electronic device on the calibration holder.
8. The apparatus for testing electronic components of claim 7, wherein the calibration holder has a calibration socket having at least one calibration slot for holding the electronic component, the calibration driving mechanism has at least one calibration driver and a transmission device driven by the calibration driver to move in at least one direction, the transmission device is configured to mount the calibration device.
9. The apparatus of claim 1, further comprising at least one receiving device, the receiving device is mounted on the platform and has at least one receiving holder for holding the tested electronic device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811183868.4A CN111044839B (en) | 2018-10-11 | 2018-10-11 | Electronic component testing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811183868.4A CN111044839B (en) | 2018-10-11 | 2018-10-11 | Electronic component testing apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111044839A CN111044839A (en) | 2020-04-21 |
| CN111044839B true CN111044839B (en) | 2022-02-25 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201811183868.4A Active CN111044839B (en) | 2018-10-11 | 2018-10-11 | Electronic component testing apparatus |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002168910A (en) * | 2000-11-30 | 2002-06-14 | Yamaha Motor Co Ltd | Testing device for component |
| TW201111788A (en) * | 2009-09-17 | 2011-04-01 | Hon Tech Inc | Delivery device capable of calibrating position of the electronic components |
| TW201423899A (en) * | 2012-12-14 | 2014-06-16 | Hon Tech Inc | Electric component pressing mechanism and testing facility applying the same |
| CN103934207A (en) * | 2013-01-18 | 2014-07-23 | 鸿劲科技股份有限公司 | Electronic component working unit, working method and working equipment applied by same |
| TWI534435B (en) * | 2015-02-06 | 2016-05-21 | Hon Tech Inc | Electronic component testing equipment and its application of test classification equipment |
| CN105629909A (en) * | 2014-10-31 | 2016-06-01 | 群创光电股份有限公司 | Automatic detection method |
-
2018
- 2018-10-11 CN CN201811183868.4A patent/CN111044839B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002168910A (en) * | 2000-11-30 | 2002-06-14 | Yamaha Motor Co Ltd | Testing device for component |
| TW201111788A (en) * | 2009-09-17 | 2011-04-01 | Hon Tech Inc | Delivery device capable of calibrating position of the electronic components |
| TW201423899A (en) * | 2012-12-14 | 2014-06-16 | Hon Tech Inc | Electric component pressing mechanism and testing facility applying the same |
| CN103934207A (en) * | 2013-01-18 | 2014-07-23 | 鸿劲科技股份有限公司 | Electronic component working unit, working method and working equipment applied by same |
| CN105629909A (en) * | 2014-10-31 | 2016-06-01 | 群创光电股份有限公司 | Automatic detection method |
| TWI534435B (en) * | 2015-02-06 | 2016-05-21 | Hon Tech Inc | Electronic component testing equipment and its application of test classification equipment |
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| Publication number | Publication date |
|---|---|
| CN111044839A (en) | 2020-04-21 |
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