KR20000072967A - device for alignment of loading and unloading picker in sorting handler for burn-in tester - Google Patents

Abstract

PURPOSE: An alignment apparatus of a loading and unloading picker is provided to prevent abnormal loading and unloading of a device by making a gap of a picker block become identical to that of a receiving space formed at a tray or to that of a test socket. CONSTITUTION: An alignment apparatus of a loading and unloading picker comprises guide pins which are fixed to upper planes of guide blocks so as to correspond to a gap of a receiving space formed at a tray or to an installation gap of a test socket. The guide blocks are installed at a top of the test socket of a dc test part or at a top of the tray which is located at a loading and unloading position of a loading part and an unloading part. A position determining block is installed at a lower part of a picker block shifted according to the loading and unloading position so as to be fixed with a pad.

Description

Device for alignment of loading and unloading picker in sorting handler for burn-in tester}

The present invention relates to a sorting handler used when testing the electrical properties of a finished device. More specifically, a picker with a variable pitch picks up a device from a tray or frees a device in a tray. An apparatus for aligning loading and unloading pickers for burn-in tester sorting handlers that accurately aligns the position of the pickers just prior to loading or loading into a test socket.

1 is a plan view schematically illustrating the configuration of a sorting handler for a burn-in tester according to the related art, and FIG. 2 is a schematic view for explaining the operation of the transfer means in the handler for the burn-in tester according to the related art. 1) and the burn-in board loader unit 2 is placed burn-in test board is inserted into the test socket in the burn-in board loader unit 2, and the empty tray is placed in the unloader unit 3 and the sorting unit 4, respectively Will drive the equipment.

When the equipment is driven in this state, the tool 3 is transferred and the four devices that are inserted into the test socket of the burn-in board at the same time as the burn-in test are taken out and classified according to the grade according to the test result. Or the tray unloader unit 3, the tool 4 is transferred from the empty pocket portion 6 to the sorting portion 4 from the empty pocket portion 6.

When the burn-in tested device inserted into the test socket of the burn-in board exits to the unloader unit 3 or the sorting unit 4, the tool 1 is used to remove the four devices in the tray of the loader unit 1. At the same time, the device that was adsorbed and then transferred to the DC test unit 9 is loaded in the test socket of the DC test unit 9, so that the DC test of the device is performed for a set time.

The device in the DC test section 9 before the above operation is inserted into the test socket on the burn-in board by the tool 2.

In other words, the device plugged into the test socket of the burn-in board is the burn-in test is completed, and when the device is pulled out from the test socket of the burn-in board by the tool 3, the tool 2 of the tool 10 operates and the DC-tested device is DC. Since it is removed from the test unit 9 and inserted into the test socket of the burn-in board, the continuous loading and unloading of the device is possible.

In the sorting handler which handles the device by the operation as described above, the device is contained or the tray 11 is spaced in the storage space 11a so as to contain a large amount of the device in a limited area as shown in FIG. 3. (T) has a narrow arrangement.

On the contrary, the pitch t of the test socket 12 for loading the device contained in the tray 11 so that the DC test is performed or the high temperature test is performed may include a storage space formed in the tray 11 as shown in FIG. 4. It is arranged wider than the pitch T of (11a).

Therefore, the device in the tray 11 is sucked and loaded into the test socket 12 of the DC test unit 9, or the device is sucked from the test socket of the burn-in board and unloaded into the empty tray of the unloader unit 3. The first and third tools 8 and 5 should have a structure that varies the pitch of four pickers according to their positions.

However, in the conventional tools 1 and 3, the pickers 1 and 3 are lowered to the bottom dead center, and then the devices contained in the storage space 11a of the tray 11 are adsorbed to the DC test unit 9. Loading the test socket or unloading the tested device into the storage space 11a of the empty tray located in the unloader unit 3 causes the following problems.

First, if the interval between pickers is inconsistent or the position is changed according to the repetitive operation of tools 1 and 3 (8) and (5), the adsorption position of the device is changed so that the device is correctly loaded in the test socket of the DC test unit 9. When the device was loaded, the lead socket of the test socket pressed the lead of the device, and a lead vent was generated, and the tested device could not be removed from the test socket.

Second, when unloading the device that the tool 3 has adsorbed into the empty tray located in the unloader unit 3, the pitch of the narrowed picker is changed, or the device that aligns it is out of position. The device, which was not provided, could not be correctly unloaded into the storage space 11a of the tray and an error occurred.

Third, due to the above problems, frequent errors occur during the operation of the equipment, thereby reducing the operation rate of the expensive equipment.

The present invention has been made to solve such a problem in the prior art, the loading picker and the unloading picker located in the loading and unloading position of the device, just before loading and unloading the device, the pitch of the picker block is formed in the tray The purpose is to be able to exactly match the spacing of the storage spaces or the spacing of the test sockets.

According to an aspect of the present invention for achieving the above object, in a sorting handler having a loading and unloading picker having a variable pitch, the upper side or the DC test of the tray located at the loading and unloading position of the loading and unloading portion A guide block having a guide pin fixed to the upper side of the negative test socket and having an upper space corresponding to an interval of a storage space formed in the tray or an installation interval of the test socket, and a lower side of the picker block horizontally moving along the loading and unloading positions. The alignment device of the loading and unloading picker for the burn-in tester sorting handler, which is fixedly installed with the pad and has a positioning block formed with a guide hole inserted into the guide pin, is provided.

1 is a plan view schematically showing the configuration of a sorting handler for a conventional burn-in tester

Figure 2 is a schematic diagram for explaining the operation of the transfer means in the sorting handler for a burn-in tester according to the prior art

Figure 3 is a perspective view showing a part of the tray is widely used

4 is a perspective view showing a part of the burn-in board omitted

5 is a perspective view showing a partially omitted sorting handler for the burn-in tester to which the present invention is applied

6 is a front view showing a sorting handler for a burn-in tester to which the present invention is applied.

7 is a plan view of FIG.

8 is a perspective view showing one embodiment of the present invention

9A and 9B are longitudinal cross-sectional views illustrating the operation of one embodiment.

9A is a state diagram in which a loading picker is positioned directly above a tray positioned at a loading position of a loading unit;

9B is a state in which the picker block is positioned on the guide block installed in the loading unit and the pad is connected to the upper surface of the device on the tray;

10 is an exploded perspective view of a guide block according to another embodiment of the present invention;

11A and 11B are longitudinal cross-sectional views illustrating another embodiment of the present invention.

11A is a state in which the pushing block is located at the top dead center by the pressing piece

11B is a state diagram in which the pushing piece is pushed down by the positioning block and the pressing piece is lowered

Explanation of symbols for main parts of the drawings

16, 22: guide block 17, 25: guide pin

19: Picker block 20: Positioning block

20a: guide ball 21: pad

23: test socket 26: hook

Hereinafter, the present invention will be described in more detail with reference to FIGS. 5 to 11 as examples.

8 is a perspective view showing an embodiment of the present invention and Figures 9a and 9b is a longitudinal cross-sectional view for explaining an embodiment, the present invention is loading and unloading of the loading portion 13 and the unloading portion 14 The guide block 16 is fixedly installed on the guide rail 15 so as to be positioned above the tray 11 positioned at the position, and the guide block 16 is arranged on the upper surface of the guide block so as to match the interval of the storage space 11a formed in the tray. The pin 17 is fixed.

A guide is provided at the lower end of each picker block 19 for absorbing the device contained in the storage space 11a of the tray 11 or for storing the absorbed device in the test socket of the DC test unit 18 or the tray 11. A positioning block 20 having a guide hole 20a fitted to the pin 17 is provided to be fixed to the pad 21.

Therefore, as the position of the positioning block 20 is changed, the position of the pad 21 for adsorbing the device is also changed.

10 is an exploded perspective view of a guide block according to another embodiment of the present invention. The pushing block 24 presses the pressing piece 23a of the test socket 23 on the guide block 22 installed in the DC test unit 18. It is provided to be movable up and down, and a guide pin 25 to which the guide hole 20a formed in the positioning block 20 is fitted is fixed to the pushing block, and is exposed to the upper side of the guide block 22 and the pushing block. A hook 26 is formed at 24 to catch the upper surface of the pressing piece 23a of the test socket 23 and to press the pressing piece 23a when the pushing block 24 descends.

At this time, the guide pin 25 is formed with a neck portion 25a longer than the thickness B of the jaw portion 22a formed on the guide block 22 so that the pushing block 24 guides from the guide block 22. The lifting and lowering motion is performed within the neck portion 25a of the pin 25.

As described above, both sides of the DC test unit 18 are provided with seating plates 41 on which both ends of the guide block 22 are mounted, and each of the seating plates 41 supports support blocks for both ends of the guide block 22. 42 is slidably coupled to the left and right, wherein the guide block 22 is formed with a notch 22c and a positioning pin 43 is fixed to the seating plate 41.

The ball 45 is elastically installed by the spring 46 in the hole 44 formed in the seating plate 41, and is exposed to the upper surface of the seating plate. The ball 45 is disposed on the bottom surface of the support block 42. ) Is formed with two recessed grooves 42a and 42b into which the () is selectively fitted.

Positioning pins 43 are fixed to both ends of the seating plate 41, and cutouts 22c fitted to the guide pins are formed at the guide blocks 22.

5 is a perspective view showing a partially omitted sorting handler for the burn-in tester to which the present invention is applied, Figure 6 is a front view showing a sorting handler for the burn-in tester to which the present invention is applied and Figure 7 is a plan view of FIG.

For reference, the operation of the sorting handler for the burn-in tester to which the present invention is applied is as follows.

First, the tray 11 filled with the device to be tested is placed in the loading unit 13, the unloading unit 14 includes one empty tray 11b in which the tested good quality device is placed, and the sorting unit 27 ), The equipment is driven in a state where a plurality of empty trays 11c for classifying the devices determined as defective are placed.

The loading picker 28 is loaded along the X-axis spindle 29 to attract a plurality of devices from the tray 11 located in the loading unit 13 and load them into the test socket 23 of the DC test unit 18. The picker block 19 on which the pad 21 and the positioning block 20 are fixed in the process of transferring to the position is narrowed to match the interval of the storage space 11a formed in the tray 11 by the pitch interval adjusting means. Adjusted.

After the loading position is reached with the pitch of the picker block 19 varied, the picker block 19 descends to the bottom dead center by driving the picker cylinder 30 to attract the device in the tray 11. do.

When the picker block 19 is lowered by driving the picker cylinder 30, the interval of the picker block 19 is changed by a pitch interval adjusting means, so that the picker block 19 may not exactly match the storage space 11a of the tray 11. However, when the picker block 19 descends, the plurality of picker blocks 19 automatically coincide with the storage space 11a of the tray 11.

That is, when the picker block 19 descends to the bottom dead center by driving the picker cylinder 30, the picker block 19 is provided with a pad 21 and a fixed positioning block 20. The guide pin 17 fixed to the guide block 16 protrudes upward, so that the guide hole 20a formed in the positioning block 20 is fitted to the guide pin 17, as shown in FIG. 9B. Since the position of is corrected, the pad 21 fixed to the positioning block 20 is connected to the correct position of the device mounted on the storage space 11a of the tray 11.

When the vacuum pressure is applied to the pad 21 in such a state, the device mounted on the storage space 11a is adsorbed on the pad. When the picker block 19 rises due to the reactivation of the picker cylinder 30, the device is placed on each pad 21. It is in a suspended state.

After the plurality of devices are held in the loading picker 28 by the operation as described above, the loading picker 28 transfers the holding device to the DC test unit 18 and loads the held device in the test socket. Each picker block 19 is opened to coincide with the interval of the test socket 23 in the DC test section 18 between transfers.

After that, when the picker block 19 is lowered by driving the picker cylinder 30, the guide hole 20a formed in the positioning block 20 is fitted to the guide pin 25 fixed to the pushing block 24. Since the interval of the picker block 19 is aligned with the interval of the test socket 23 and the pushing block 24 is pressed, the pushing block is a neck portion of the guide pin 25 from the guide block 22. While falling within the range (25a), the hook 26 presses the pressing piece 23a of the test socket as shown in FIG. 11B, and thus the contact pins of the test socket are opened to both sides.

As described above, after the pressing piece 23a is pressed by the positioning block 20 and the contact pins are opened to both sides, the device adsorbed on the pad 21 is placed in the test socket. When the picker block 19 is raised to the top dead center by releasing the vacuum pressure and then restarting the picker cylinder 30, the force applied to the pushing block 24 is removed, and thus the pressing piece 23a pressed down on the pushing block 24 is pressed. Raised by the restoring force of this contact pin, this enables DC testing of the device loaded into the test socket.

After the DC test of the device loaded in the DC test unit 18 is performed for a predetermined time, the forking and unforking pickers 32 and 33 installed on the slider 31 are arranged along the X-axis main axis 29 of FIG. Simultaneously moving to the right, the forking picker 32 holds the device to be loaded into the test socket 34 of the burn-in board from the test socket 23 of the DC test unit 18, and the unforking picker 33 is burn-in tested. Simultaneously hold the device on the burn-in board.

Thereafter, after the forking picker 32 and the unloading picker 33 rise to the top dead center, the device in the test socket of the DC test section 18 is suspended from the forking picker 32, and the test socket of the burn-in board. The device that was in (34) is suspended from the unfortuned picker 33.

However, if any one of the DC-tested devices has a DC failure as a result of the DC test, only the unfortuning picker 33 is driven to take out the burn-in tested device from the test socket 34 of the burn-in board, and the forking picker 32 The slider 31 is held slightly further to the right in the drawing to hold the DC-tested good device placed on the loading side buffer 35.

When the DC test unit 18, which has been matched with the loading and unloading positions, is changed to match the sorting position by driving the DC test unit variable means 36 to take out the device in the DC test unit 18 during the above operation. The sorting picker 37 moves to the sorting position side along the X-Y axis 38 and then simultaneously holds a plurality of devices from the test socket of the DC test unit 18 to load the device determined to be a good DC test result. The device which is unloaded into the buffer 35 and is defective in DC is sorted into the empty tray 11c of the sorting part 27 according to the grade.

After the devices are suspended in the forking picker 32 and the unforking picker 33, the slider 31 moves along the X axis main axis 29 to the left side of FIG. 6 to burn-in the device suspended in the forking picker 32. Position the device directly above the test socket of the board, and place the device suspended from the unforking picker 33 directly above the buffer 39 and then load the device suspended from the forking picker 32 into the test socket 34 of the burn-in board. Then, the device suspended on the unforking picker 33 is placed in the buffer 39.

After the burn-in-tested device is placed in the buffer 39, the unloading picker 40 having the interval of the picker block 19 is moved along the X-axis spindle 29 to absorb the device from the buffer 39. The interval of the picker block 19 is adjusted to match the storage space 11a of the tray 11 between the transfers to the next unloading position.

In this state, when the picker block 19 descends to unload the device adsorbed on the pad 21 into the storage space 11a of the tray 11, the guide block 16 is similar to the case of loading the device. The guide hole 20a formed in the positioning block 20 is inserted into the fixed guide pin 17 to align the interval of the picker block 19, thereby unloading the device adsorbed on the pad 21. It is possible to accurately unload in the storage space (11a) of the tray (11b) located in 14).

Meanwhile, when replacing the test socket 23 from the DC test unit 18 according to the type of device, the guide block 22 installed on the upper side of the test socket should also be replaced according to the type of the test socket 23. .

To this end, if the support blocks 42, which have moved inwardly along the seating plate 41, are pushed to both sides, the balls 45, which are inserted into the recesses 42b of the outer side by the restoring force of the spring 46, are supported. When the concave groove 42a formed on the other side of the support block 42 is pressed by the bottom surface of the support 42 and reaches the other side of the support block 42, the ball 45 accommodated in the hole 44 is spring ( 46 is inserted by the restoring force to control the movement of the support block 42, so that the guide block 22 mounted between the seating plates 41 can be replaced.

In addition, after the used guide block is replaced, the support blocks 42 that are opened to both sides are pushed inward as in the initial state so that the balls 45 are fitted into the initial recessed grooves 42b, thereby supporting the two support blocks 42. Since both ends of the guide block 22 are wrapped, the interval between the picker blocks 19 can be accurately maintained during the loading and unloading of the device.

As described above, according to the present invention, the interval of the picker block 19 immediately before loading and unloading the device can be exactly coincided with the interval of the storage space 11a formed in the tray 11 or the interval of the test socket 23. Therefore, it is possible to prevent misloading and unloading of the device in advance, thereby preventing frequent errors due to misloading and unloading, thereby maximizing the utilization rate of expensive equipment.

In addition, since the guide block 22 installed in the DC test unit 18 can be easily replaced by the opening operation of the support block 42, there is also an effect that can quickly cope with the type of device to be tested. .

Claims (4)

A sorting handler having a loading and unloading picker having a variable pitch, the sorting handler comprising: an upper side of a tray positioned at a loading and unloading position of a loading part and an unloading part or an upper side of a test socket of a DC test part, the upper side of which is formed in a tray The guide pin is fixed to match the spacing of the space or the installation of the test socket, and the pad is fixed to the bottom of the picker block which is horizontally moved along the loading and unloading position. Alignment device of the loading and unloading picker for the burn-in tester sorting handler, characterized in that consisting of a positioning block formed with a guide hole. The method of claim 1, The pushing block having a hook for pressing the pressing piece to the guide block installed in the DC test unit is installed to be liftable, the push-in tester sorting handler, characterized in that the guide pin is fixed to the pushing block is exposed to the upper side of the guide block. Alignment device for loading and unloading pickers. The method of claim 1, Loading and unloading for the burn-in tester sorting handler further comprising a seating plate on which both ends of the guide blocks installed on both sides of the DC test unit are mounted, and a support block coupled to each seating plate to support both ends of the guide block. Aligning device of the loading picker. The method of claim 3, wherein The ball is elastically installed on the seating plate so as to be exposed to the upper surface, and the lower surface of the support block is provided with two recessed grooves for selectively inserting the ball into the bottom of the burn-in tester sorting handler. Device.