KR20180023831A - 반도체 장치의 제조 방법 - Google Patents

반도체 장치의 제조 방법 Download PDF

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KR20180023831A
KR20180023831A KR1020170105955A KR20170105955A KR20180023831A KR 20180023831 A KR20180023831 A KR 20180023831A KR 1020170105955 A KR1020170105955 A KR 1020170105955A KR 20170105955 A KR20170105955 A KR 20170105955A KR 20180023831 A KR20180023831 A KR 20180023831A
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gate electrode
film
insulating film
region
semiconductor substrate
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Korean (ko)
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다다시 야마구찌
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르네사스 일렉트로닉스 가부시키가이샤
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Publication of KR20180023831A publication Critical patent/KR20180023831A/ko
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    • H10D64/691Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes characterised by the insulator, e.g. by the gate insulator comprising metallic compounds, e.g. metal oxides or metal silicates 

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  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
KR1020170105955A 2016-08-25 2017-08-22 반도체 장치의 제조 방법 Withdrawn KR20180023831A (ko)

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JP2016164586A JP6713878B2 (ja) 2016-08-25 2016-08-25 半導体装置の製造方法
JPJP-P-2016-164586 2016-08-25

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US (1) US10186518B2 (https=)
JP (1) JP6713878B2 (https=)
KR (1) KR20180023831A (https=)
CN (1) CN107785377B (https=)
TW (1) TW201820590A (https=)

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US10872898B2 (en) * 2017-07-19 2020-12-22 Cypress Semiconductor Corporation Embedded non-volatile memory device and fabrication method of the same
JP2020155485A (ja) * 2019-03-18 2020-09-24 キオクシア株式会社 半導体装置およびその製造方法
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